CN111006661B - Measurement method and measurement device for eliminating dead time of cold atom interferometer - Google Patents
Measurement method and measurement device for eliminating dead time of cold atom interferometer Download PDFInfo
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Abstract
The invention discloses a measuring device for eliminating cold atom interferometer dead time, which comprises an atom interferometer physical system, wherein the atom interferometer physical system comprises an atom cooling area, an atom state selection area, an atom interference area and an atom detection area, the atom cooling area comprises a first atom and a second atom, a cooling laser switch switches and controls a first cooling laser and a second cooling laser to enter the atom cooling area, a state selection laser switch switches and controls a first state selection laser and a second state selection laser to enter the atom state selection area, an interference laser switch switches and controls a first interference laser and a second interference laser to enter the atom interference area, and a detection laser switch switches and controls a first detection laser and a second detection laser to enter the atom detection area. The invention also discloses a measuring method for eliminating the dead time of the cold atom interferometer. The invention can realize the measurement without dead time and reduce the sensitivity reduction caused by crosstalk among all processes.
Description
Technical Field
The invention relates to the technical field of atomic inertia measurement, in particular to a measurement method for eliminating dead time of a cold atom interferometer and a measurement device for eliminating the dead time of the cold atom interferometer.
Background
The dead time of the cold atom interferometer has an important influence on the accuracy of inertial navigation, and the dead time can influence the accuracy of inertial navigation. The cold atom interferometer has a part of the time during the measurement process, which is called the dead time of the atom interferometer, during which the quantity to be measured cannot be measured. In the inertial navigation application, inertial information of a carrier needs to be acquired in real time, and position and attitude information required by navigation is acquired through a navigation algorithm. Dead time in the measurement process of the cold atom interferometer can cause the loss of output information of the inertial sensor and increase navigation measurement errors.
Dead time can be reduced or shortened by designing a proper interferometer configuration, the dead time of the fountain clock is eliminated by adopting two groups of interferometers to work alternately by G.W.Biedermann et al, and dead time-free interferometry is realized by adopting a butt-joint interference method by M.Meuneier et al. The two groups of interferometers increase the volume of the system, are not beneficial to the miniaturization of the interferometers, and meanwhile, the factors such as gravity, magnetic field gradient and the like influence the measurement result due to the separation of the space; the measurement is carried out by adopting a cross interference method, and the coherence of atomic interference can be destroyed in the processes of laser cooling, detection and the like, so that the measurement result of the interferometer is influenced.
Disclosure of Invention
The invention aims to solve the problems in the existing measuring method for eliminating the dead time of an atom interferometer, and provides a measuring device for eliminating the dead time of a cold atom interferometer.
The above object of the present invention is achieved by the following technical solutions:
a measuring device for eliminating cold atom interferometer dead time comprises an atom interferometer physical system, wherein the atom interferometer physical system comprises an atom cooling region, an atom state selection region, an atom interference region and an atom detection region, the atom cooling region comprises a first type of atom and a second type of atom,
the cooling laser switch switches and controls the first cooling laser and the second cooling laser to enter the atom cooling area, the state selection laser switch switches and controls the first state selection laser and the second state selection laser to enter the atom state selection area, the interference laser switch switches and controls the first interference laser and the second interference laser to enter the atom interference area, and the detection laser switch switches and controls the first detection laser and the second detection laser to enter the atom detection area.
Six cooling light fiber collimating mirrors are fixed on the outer side of the atomic cooling area, a pair of state-selecting light fiber collimating mirrors are fixed on the outer side of the atomic state-selecting area, three pairs of interference light fiber collimating mirrors are fixed on the outer side of the atomic interference area, a pair of detection light fiber collimating mirrors are fixed on the outer side of the atomic detection area,
the first cooling laser and the second cooling laser are switched by a cooling laser switch to enter a first optical splitter, and the first cooling laser or the second cooling laser enters 6 optical fibers respectively connected with 6 cooling optical fiber collimating lenses through the first optical splitter;
the first state-selection laser and the second state-selection laser are switched by a state-selection laser switch to enter a second optical splitter, and the first state-selection laser or the second state-selection laser enters 2 beams of optical fibers which are respectively connected with a pair of state-selection optical fiber collimating lenses through the second optical splitter;
the first interference laser and the second interference laser are switched by an interference laser switch to enter a third optical splitter, and the first interference laser or the second interference laser enters 6 bundles of optical fibers which are respectively connected with three pairs of interference light optical fiber collimating mirrors through the third optical splitter;
the first detection laser and the second detection laser are switched to enter the fourth optical coupler through the detection laser switch, and the first detection laser or the second detection laser enters the 2 bundles of optical fibers which are respectively connected with the pair of detection optical fiber collimating mirrors through the fourth optical coupler.
A measurement method for eliminating dead time of a cold atom interferometer comprises the following steps:
step 1, placing a measuring device for eliminating the dead time of the cold atom interferometer on a rotary table, and rotating the rotary table at a fixed rotating speed omega to facilitateRecording the measurement phase phi during interferometric measurements with atoms of the first type1Recording the measurement phase phi during interferometric measurements with atoms of the second type2Separately calculating the scale factor K1And a scale factor K2，
Wherein omega1And Ω2Respectively carrying out interference measurement on the first type of atoms and the second type of atoms;
step 2, firstly, controlling a cooling laser switch to switch a first cooling laser to enter an atom cooling area to cool a first type of atoms, then controlling the frequency of the first cooling laser, transferring the first type of atoms into an atom state selection area, controlling a state selection laser switch to switch the first state selection laser to enter the atom state selection area to select the first type of atoms, and controlling an interference laser switch to switch the first interference laser to enter the atom interference area to interfere the first type of atoms after the first type of atoms enter the atom interference area;
step 3, controlling a cooling laser switch to switch a second cooling laser to enter an atom cooling area to cool a second atom while the first atom starts to interfere, controlling the frequency of the second cooling laser after cooling, transferring the second atom to an atom state selection area, controlling a state selection laser switch to switch the second state selection laser to enter the atom state selection area to select a second atom, controlling the interference laser switch to switch the second interference laser to enter the atom interference area to interfere the second atom after the state selection is completed, and controlling the interference laser switch to switch the second interference laser to enter the atom interference area to interfere the second atom when the first atom finishes interfering;
step 4, when the second type of atoms interfere, controlling a detection laser switch to switch a first detection laser to enter an atom detection area to detect the first type of atoms to obtain a measurement phase phin1Then controlling a cooling laser switch to switch a first cooling laser into the atom cooling area for the first type of atomsCooling, controlling the frequency of a first cooling laser after cooling, transferring a first type of atoms into an atom state selection area, controlling a state selection laser switch to switch a first state selection laser to enter the atom state selection area to select a first type of atoms, controlling an interference laser switch to switch a first interference laser to enter the atom interference area to interfere the first type of atoms when a second type of atoms finishes interference, and controlling a detection laser switch to switch a second detection laser to enter the atom detection area to detect the second type of atoms when the first type of atoms interferes to obtain a measurement phase phin2N is the number of times of repeating the step 3 and the step 4;
step 5, repeating the step 3 and the step 4, always keeping the first kind of atoms or the second kind of atoms in an interference measurement state, and recording a measurement phase phi obtained by the interference measurement of the first kind of atoms in real timen1Recording the measured phase phi obtained by the interference measurement of the second kind of atoms in real timen2；
Step 6, calculating a rotation measurement value omegajWherein
Compared with the prior art, the invention has the following beneficial effects:
the invention provides a double-component atom-based interference measurement scheme, which can control atoms of two components in a same vacuum cavity in a time-sharing manner, so that dead-time-free atomic interference measurement is realized, the atom control frequencies of different components are different, the mutual influence among all processes in the measurement can be reduced, the dead-time-free measurement is realized, and the sensitivity reduction caused by crosstalk of all processes is reduced.
Drawings
FIG. 1 is a schematic diagram of a measurement apparatus for eliminating cold atom interferometer dead time;
FIG. 2 is a schematic diagram of a laser control system;
FIG. 3 is a time sequence chart of the method of the present invention without dead time measurement;
in the figure: a-an atomic interferometer physical system and b-a laser control system; a 1-atom cooling region, a 2-atom state selection region, a 3-atom interference region, a 4-atom detection region, a 5-first type atoms, a 6-second type atoms; a 7-parabolic trajectory; a 8-detection system; a 11-cooling light fiber collimating mirror, a 12-state selecting light fiber collimating mirror, a 13-interference light fiber collimating mirror, a 14-detecting light fiber collimating mirror; b 11-first cooling laser, b 12-second cooling laser, b 21-first state-selecting laser, b 22-second state-selecting laser, b 31-first interference laser, b 32-second interference laser, b 41-first detection laser and b 42-second detection laser; c 1-cooling laser switch, c 2-state-selecting laser switch, c 3-interference laser switch and c 4-detection laser switch.
Detailed Description
The present invention will be described in further detail with reference to examples for the purpose of facilitating understanding and practice of the invention by those of ordinary skill in the art, and it is to be understood that the present invention has been described in the illustrative embodiments and is not to be construed as limited thereto.
In the embodiment, the measuring device for eliminating the dead time of the cold atom interferometer comprises an atom interferometer physical system a and a laser control system b;
as shown in fig. 1, the physical system a of the atomic interferometer is divided into four different regions, namely an atom cooling region a1, an atom state selection region a2, an atom interference region a3 and an atom detection region a4, wherein the atom cooling region a1 contains two component atoms, in the embodiment, rubidium 85 atom is selected as a first type of atom a5 and rubidium 87 atom is selected as a second type of atom a 6.
Six cooling light fiber collimating lenses a11 are fixed on the outer side of the atomic cooling region a1, a pair of state-selecting light fiber collimating lenses a12 are fixed on the outer side of the atomic state-selecting region a2, three pairs of interference light fiber collimating lenses a13 are fixed on the outer side of the atomic interference region a3, and a pair of detection light fiber collimating lenses a14 are fixed on the outer side of the atomic detection region a 4;
as shown in fig. 2, the laser control system b includes a first cooling laser b11, a second cooling laser b12, a first state-selection laser b21, a second state-selection laser b22, a first interference laser b31, a second interference laser b32, a first probing laser b41, and a second probing laser b 42.
The first cooling laser b11 and the second cooling laser b12 are switched by a cooling laser switch c1 to enter a first optical splitter, the first cooling laser b11 or the second cooling laser b12 enters 6 optical fibers respectively connected with 6 cooling optical fiber collimating mirrors a11 through the first optical splitter, and only the first cooling laser b11 or the second cooling laser b12 enters the atomic cooling area a1 through the 6 cooling optical fiber collimating mirrors a11 at a time.
The first state-selection laser b21 and the second state-selection laser b22 are switched by a state-selection laser switch c2 to enter a second optical splitter, the first state-selection laser b21 or the second state-selection laser b22 enters 2 beams of optical fibers respectively connected with a pair of state-selection optical fiber collimating mirrors a12 through the second optical splitter, and only the first state-selection laser b21 or the second state-selection laser b22 enters the atomic state selection region a2 through the pair of state-selection optical fiber collimating mirrors a12 at a time.
The first interference laser light b31 and the second interference laser light b32 are switched by an interference laser switch c3 to enter a third optical splitter, the first interference laser light b31 or the second interference laser light b32 enters 6 beams of optical fibers respectively connected with three pairs of interference light optical fiber collimating mirrors a13 through the third optical splitter, and only the first interference laser light b31 or the second interference laser light b32 enters the atomic interference region a3 at a time.
The first detection laser b41 and the second detection laser b42 are switched to enter a fourth optical splitter through a detection laser switch c4, the first detection laser b41 or the second detection laser b42 enters 2 bundles of optical fibers respectively connected with a pair of detection optical fiber collimating mirrors a14 through the fourth optical splitter, and only the first detection laser b41 or the second detection laser b42 enters the atom detection area a4 at a time.
As shown in fig. 3, the two-component atomic measurement process in the measurement setup to eliminate the cold atom interferometer dead time is performed crosswise. The cooling laser switch c1 controls the first cooling laser b11 to cool the first type of atoms a5 in the atom cooling area a1, the frequency of the first cooling laser b11 is changed to enable the first type of atoms a5 to obtain horizontal speed, the first type of atoms move along a parabolic track a7 under the action of gravity, and the atoms sequentially enter the atom state selection area a2, the atom interference area a3 and the atom detection area a 4. When the first type of atom a5 enters the atom state selection region a2, the state selection laser switch c2 controls the first state selection laser b21 to enter the atom state selection region a2 to select the state of the first type of atom a5, and after the first type of atom a5 enters the atom interference region a3, the interference laser switch c3 controls the first interference laser b31 to enter the atom interference region a3 to control the first type of atom a5, so that atom interference is formed. Meanwhile, the cooling laser switch c1 controls the second cooling laser b12 to enter the atom cooling region a1 to cool the second type of atoms a6 and transfer the second type of atoms a6 to the atom selection region a2, the state selection laser switch c2 controls the second state selection laser b22 to enter the atom selection region a2 to select the second type of atoms a6, when the first type of atoms a5 finishes interference, the second type of atoms a6 is transferred to the atom interference region a3, and the interference laser switch c3 controls the second interference laser b32 to enter the atom interference region a3 to control the second type of atoms a6, so that atomic interference is formed. When the second type of atom a6 starts to interfere, the first type of atom a5 enters the atom detection region a4, and the detection laser switch c4 controls the first detection laser b4 to enter the atom detection region a4 to detect the first type of atom a5, so as to obtain a measurement signal.
A measurement method for eliminating dead time of a cold atom interferometer comprises the following steps:
step 1, placing a measuring device for eliminating the dead time of the cold atom interferometer on a rotary table, wherein the rotation direction of the rotary table is consistent with the rotation measuring direction of the measuring device for eliminating the dead time of the cold atom interferometer, rotating the rotary table at a fixed rotation speed omega, and recording a measuring phase phi when carrying out interference measurement by utilizing a first type of atoms a51Recording the measurement phase phi when using the second type of atom a6 for interferometric measurement2Separately calculating the scale factor K1And a scale factor K2And the formula is used in the calculation:
wherein，Ω1And Ω2The rotating speed of the turntable when the first type of atoms a5 are subjected to interference measurement and the rotating speed of the turntable when the second type of atoms a6 are subjected to interference measurement are respectively.
Step 2, firstly, controlling a cooling laser switch c1 to switch a first cooling laser b11 to enter an atom cooling area a1 to cool a first type of atoms a5, then controlling the frequency of the first cooling laser b11 to transfer the first type of atoms a5 to enter an atom state selection area a2, controlling a state selection laser switch c2 to switch a first state selection laser b21 to enter an atom state selection area a2 to select states of the first type of atoms a5, and after the first type of atoms a5 enter an atom interference area a3, controlling an interference laser switch c3 to switch a first interference laser b31 to enter an atom interference area a3 to interfere with the first type of atoms a 5;
step 3, when the first-type atoms a5 start to interfere, controlling a cooling laser switch c1 to switch a second cooling laser b12 to enter an atom cooling area a1 to cool a second-type atoms a6, controlling the frequency of a second cooling laser b12 after cooling, transferring a second-type atom a6 to enter an atom state selection area a2, controlling a state selection laser switch c2 to switch a second state selection laser b22 to enter an atom state selection area a2 to select a second-type atom a6, after the state selection is completed, allowing a second-type atom a6 to enter an atom interference area a3, and when the first-type atom a5 finishes interfering, controlling an interference laser switch c3 to switch a second interference laser b32 to enter an atom interference area (a3) to interfere with the second-type atom a 6;
step 4, when the second type atoms a6 interfere, the detection laser switch c4 is controlled to switch the first detection laser b41 to enter the atom detection area a4 to detect the first type atoms a5, and the measurement phase phi is obtainedn1Then, a cooling laser switch c1 is controlled to switch a first cooling laser b11 to enter an atom cooling area a1 to cool a first type of atoms a5, the frequency of the first cooling laser b11 is controlled after cooling, the first type of atoms a5 are transferred to an atom state selection area a2, a state selection laser switch c2 is controlled to switch a first state selection laser b21 to enter an atom state selection area a2 to select states of the first type of atoms a5, the first type of atoms a5 after state selection enters an atom interference area a3, and interference is controlled while interference of a second type of atoms a6 is finishedThe laser switch c3 switches the first interference laser b31 to enter the atom interference area a3 to interfere with the first type of atoms a5, and when the first type of atoms a5 interfere, the detection laser switch c4 is controlled to switch the second detection laser b42 to enter the atom detection area a4 to detect the second type of atoms a6, so that the measured phase phi is obtainedn2N is the number of times of repeating the step 3 and the step 4;
step 5, repeating the step 3 and the step 4, always keeping the first type atoms a5 or the second type atoms a6 in an interference measurement state, and recording the measurement phase phi obtained by the interference measurement of the first type atoms a5 in real timen1Recording the measured phase phi obtained by the interference measurement of the second type atoms a6 in real timen2。
Step 6, calculating a rotation measurement value omegajWherein
The techniques of laser cooling of atoms in an atom interferometer, phase extraction after atom interference and the like are general techniques, and are not discussed in detail in the patent.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications or additions may be made to the described embodiments or alternatives may be employed by those skilled in the art without departing from the spirit or ambit of the invention as defined in the appended claims.
Claims (3)
1. A measurement device for eliminating dead time of a cold atom interferometer, which comprises an atom interferometer physical system (a), and is characterized in that the atom interferometer physical system (a) comprises an atom cooling area (a1), an atom state selection area (a2), an atom interference area (a3) and an atom detection area (a4), wherein the atom cooling area (a1) contains a first type of atoms (a5) and a second type of atoms (a6),
a cooling laser switch (c1) controls the first cooling laser (b11) and the second cooling laser (b12) to be switched to enter an atom cooling area (a1), a state-selecting laser switch (c2) controls the first state-selecting laser (b21) and the second state-selecting laser (b22) to be switched to enter an atom state-selecting area (a2), an interference laser switch (c3) controls the first interference laser (b31) and the second interference laser (b32) to be switched to enter an atom interference area (a3), a detection laser switch (c4) controls the first detection laser (b41) and the second detection laser (b42) to be switched to enter an atom detection area (a4),
two-component atom measurement processes in a measurement device for eliminating the dead time of a cold atom interferometer are performed in a crossed manner, and specifically the method comprises the following steps: controlling a cooling laser switch (c1) to switch a first cooling laser (b11) to enter an atom cooling region (a1) to cool a first type of atoms (a5), then controlling the frequency of the first cooling laser (b11), transferring a first type of atoms (a5) to enter an atom state selection region (a2), controlling a state selection laser switch (c2) to switch a first state selection laser (b21) to enter an atom state selection region (a2) to select a state of the first type of atoms (a5), and controlling an interference laser switch (c3) to switch a first interference laser (b31) to enter an atom interference region (a3) to interfere with the first type of atoms (a5) after the first type of atoms (a5) enter the atom interference region (a 3);
controlling a cooling laser switch (c1) to switch a second cooling laser (b12) into an atom cooling region (a1) to cool a second type of atoms (a6) while a first type of atoms (a5) starts to interfere, controlling the frequency of the second cooling laser (b12) after cooling, transferring a second type of atoms (a6) into an atom state selection region (a2), controlling a state selection laser switch (c2) to switch a second state selection laser (b22) into an atom state selection region (a2) to select a second type of atoms (a6), controlling a second type of atoms (a6) after state selection into an atom interference region (a3), and controlling an interference laser switch (c3) to switch a second interference laser (b32) into an atom interference region (a3) to interfere with a second type of atoms (6) when the first type of atoms (a5) finishes interfering;
when a second type of atom (a6) interferes, the detection laser switch (c4) is controlled to switch the first detection laser (b41) into the atom detection region (a4) to detect a first type of atom (a5), a measurement phase is obtained, then the cooling laser switch (c1) is controlled to switch the first cooling laser (b11) into the atom cooling region (a1) to cool the first type of atom (a5), the frequency of the first cooling laser (b11) is controlled after cooling, the first type of atom (a5) is transferred into the atom selection region (a2), the state selection laser switch (c2) is controlled to switch the first state selection laser (b21) into the atom selection region (a 6384) to select the first type of atom (a5), the first type of atom (a5) after state selection enters the atom interference region (a3), the interference switch (c 375) controls the first type of atom switching laser (a 31) to enter the atom selection region (a2) while the interference region (a6) ends interference of the second type of atom (a), the interference switch (c 375) controls the first type of atom switching into the atom switching region (a 31) to perform interference And the son (a5) interferes, and when the first type of atom (a5) interferes, the detection laser switch (c4) is controlled to switch the second detection laser (b42) to enter the atom detection region (a4) to detect the second type of atom (a6), so that the measurement phase is obtained.
2. The cold atom interferometer dead time elimination measurement device according to claim 1, wherein six cooling light fiber collimating mirrors (a11) are fixed outside the atom cooling area (a1), a pair of state selection light fiber collimating mirrors (a12) are fixed outside the atom state selection area (a2), three pairs of interference light fiber collimating mirrors (a13) are fixed outside the atom interference area (a3), a pair of detection light fiber collimating mirrors (a14) are fixed outside the atom detection area (a4),
the first cooling laser (b11) and the second cooling laser (b12) are switched by a cooling laser switch (c1) to enter a first optical splitter, and the first cooling laser (b11) or the second cooling laser (b12) enters 6 beams of optical fibers which are respectively connected with 6 cooling light optical fiber collimating mirrors (a11) through the first optical splitter;
the first state-selection laser (b21) and the second state-selection laser (b22) are switched by a state-selection laser switch (c2) to enter a second optical splitter, and the first state-selection laser (b21) or the second state-selection laser (b22) enters 2 beams of optical fibers respectively connected with a pair of state-selection optical fiber collimating mirrors (a12) through the second optical splitter;
the first interference laser (b31) and the second interference laser (b32) are switched by an interference laser switch (c3) to enter a third optical splitter, and the first interference laser (b31) or the second interference laser (b32) enters 6 beams of optical fibers respectively connected with three pairs of interference light fiber collimating mirrors (a13) through the third optical splitter;
the first detection laser (b41) and the second detection laser (b42) are switched to enter a fourth optical splitter through a detection laser switch (c4), and the first detection laser (b41) or the second detection laser (b42) enters 2 beams of optical fibers respectively connected with a pair of detection light fiber collimating mirrors (a14) through the fourth optical splitter.
3. A method for measuring the dead time of a cold atom interferometer by using the apparatus for measuring the dead time of a cold atom interferometer according to claim 1, comprising the steps of:
step 1, placing a measuring device for eliminating the dead time of a cold atom interferometer on a rotary table, rotating the rotary table at a fixed rotating speed omega, and recording a measuring phase phi when a first type of atoms (a5) is used for interference measurement1Recording the measured phase phi when using the second type of atom (a6) for interferometric measurement2Separately calculating the scale factor K1And a scale factor K2，
Wherein omega1And Ω2The rotating speed of the rotary table when the first type of atoms (a5) are subjected to interference measurement and the rotating speed of the rotary table when the second type of atoms (a6) are subjected to interference measurement respectively;
step 2, firstly, controlling a cooling laser switch (c1) to switch a first cooling laser (b11) to enter an atom cooling region (a1) to cool a first type of atoms (a5), then controlling the frequency of the first cooling laser (b11), transferring a first type of atoms (a5) into an atom state selection region (a2), controlling a state selection laser switch (c2) to switch a first state selection laser (b21) to enter an atom state selection region (a2) to select a first type of atoms (a5), and after the first type of atoms (a5) enter an atom interference region (a3), controlling an interference laser switch (c3) to switch a first interference laser (b31) to enter an atom interference region (a3) to interfere with the first type of atoms (a 5);
step 3, while the first type of atoms (a5) start to interfere, controlling a cooling laser switch (c1) to switch a second cooling laser (b12) to enter an atom cooling region (a1) to cool a second type of atoms (a6), controlling the frequency of the second cooling laser (b12) after cooling, transferring the second type of atoms (a6) into an atom state selection region (a2), controlling a state selection laser switch (c2) to switch a second state selection laser (b22) to enter an atom state selection region (a2) to select a second type of atoms (a6), controlling an interference laser switch (c3) to switch a second interference laser (b32) to enter an atom interference region (a3) to perform 68692) on the second type of atoms (a 8) when the first type of atoms (a5) finish interference;
step 4, when the second type of atoms (a6) interfere, controlling a detection laser switch (c4) to switch a first detection laser (b41) to enter an atom detection region (a4) to detect the first type of atoms (a5) to obtain a measurement phase phin1Then, a cooling laser switch (c1) is controlled to switch a first cooling laser (b11) into an atom cooling area (a1) to cool a first type of atoms (a5), the frequency of the first cooling laser (b11) is controlled after cooling, the first type of atoms (a5) are transferred into an atom state selection area (a2), a state selection laser switch (c2) is controlled to switch a first state selection laser (b21) into the atom state selection area (a2) to select states of the first type of atoms (a5), the first type of atoms (a5) after state selection enter an atom interference area (a3), the interference laser switch (c3) is controlled to switch a first interference laser (b31) into an atom interference area (a3) to interfere with the first type of atoms (a5) while the second type of atoms (a6) end interference, and a detection laser switch (c 24) is controlled to switch a detection laser switch (c4) into a second type of atoms (599) to detect the second type of atoms (a 599) and detect the second type of atoms (a 599) when the first type of atoms (a5) interfere with the first type of atoms (a) Detecting to obtain a measured phase phin2N is the number of times of repeating the step 3 and the step 4;
step 5, repeating the step 3 and the step 4, always keeping the first type atom (a5) or the second type atom (a6) in an interference measurement state, and recording the measurement phase phi obtained by the interference measurement of the first type atom (a5) in real timen1Recording in real time the measured phase phi obtained by interferometric measurement of the second type of atom (a6)n2；
Step 6, calculating a rotation measurement value omegajWhich isIn
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