CN110632356B - System and method for quickly calibrating generation stage of comprehensive tester - Google Patents
System and method for quickly calibrating generation stage of comprehensive tester Download PDFInfo
- Publication number
- CN110632356B CN110632356B CN201810662435.0A CN201810662435A CN110632356B CN 110632356 B CN110632356 B CN 110632356B CN 201810662435 A CN201810662435 A CN 201810662435A CN 110632356 B CN110632356 B CN 110632356B
- Authority
- CN
- China
- Prior art keywords
- information sequence
- test information
- calibration
- test
- power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
The invention provides a system and a method for quickly calibrating a generation stage of a comprehensive tester, wherein the system comprises the following steps: the processing equipment is used for configuring a first test information sequence table and a second test information sequence table, sending the first test information sequence table to the comprehensive tester and sending the second test information sequence table to the radio frequency tester; the comprehensive tester is used for sequentially sending power signals to the radio frequency instrument according to the first test information sequence table; the radio frequency instrument is used for analyzing the power signals in sequence according to the second test information sequence table to obtain a test power value and sending the test power value to the processing equipment; the processing equipment is also used for obtaining a gain compensation value according to the measurement power value and the corresponding calibration power value, so that automatic testing is achieved, the testing process is optimized, the number of interaction times among instruments is reduced, the production efficiency of the comprehensive tester is improved, and the production cost is reduced.
Description
Technical Field
The invention relates to the technical field of generation of comprehensive testers, in particular to a system and a method for quickly calibrating a generation stage of a comprehensive tester.
Background
At present, the radio frequency device of the whole machine needs to be calibrated in the production process of the comprehensive tester, the quality of the calibration precision of the comprehensive tester can influence the subsequent use, and in order to ensure the precision of the tester in the full frequency band, more frequency points are calibrated as far as possible by reducing the density of the calibration frequency points. Among them, the negative effect is the reduction of calibration efficiency, which seriously affects the yield of the instrument, and the conflict between accuracy and efficiency is a common problem faced by various instrument manufacturers in the industry.
In order to improve the production efficiency, the factory can only solve the problem by increasing the number of the calibration systems and the labor input, the production cost rises, and the high production cost seriously influences the profits of enterprises, so that instrument research and development enterprises are searching for an optimization method to solve the problem.
Disclosure of Invention
The invention provides a system and a method for quickly calibrating a generation stage of a comprehensive tester, which are used for solving the problem that the efficiency of calibrating a frequency point of the comprehensive tester in the prior art is low.
In a first aspect, the present invention provides a system for fast calibration in a generation phase of a comprehensive tester, including a processing device, a comprehensive tester and a radio frequency meter, wherein:
the processing equipment is used for configuring a first test information sequence table and a second test information sequence table, sending the first test information sequence table to the comprehensive tester and sending the second test information sequence table to the radio frequency instrument;
the comprehensive tester is used for sequentially sending power signals to the radio frequency instrument according to the first test information sequence list, and the first test information sequence list comprises calibration frequency points and calibration power values corresponding to the calibration frequency points;
the radio frequency instrument is used for analyzing the power signals in sequence according to the second test information sequence list to obtain a test power value and sending the test power value to the processing equipment, and the second test information sequence list comprises calibration frequency points;
the processing device is further configured to obtain a gain compensation value according to the measurement power value and the corresponding calibration power value;
and the calibration frequency point in the first test information sequence list is the same as the calibration frequency point in the second test information sequence list.
Optionally, the comprehensive tester is specifically configured to:
and sequentially determining target calibration frequency points according to the sequence of the calibration frequency points in the first test information sequence table, and sequentially sending power signals to the radio frequency instrument according to the calibration power values under the target calibration frequency points.
Optionally, the radio frequency instrument is specifically configured to:
and sequentially determining target calibration frequency points according to the sequence of the calibration frequency points in the second test information sequence table, receiving power signals sent by the comprehensive tester according to each calibration power value at the target calibration frequency points, and analyzing each power signal to obtain a corresponding test power value.
Optionally, after the processing device further configures a power trigger rule and sends the power trigger rule to the radio frequency instrument, the radio frequency instrument is specifically configured to:
receiving a power signal sent by the comprehensive tester according to a first calibration power value at a first calibration frequency point, and analyzing the power signal to obtain a first test power value;
and when the first test power value is larger than the preset power value, starting to execute the second test information sequence table.
Optionally, the first test information sequence table and the second test information sequence table both include: the switching between adjacent calibration frequency points triggers the gap time.
In a second aspect, an embodiment of the present invention provides a fast calibration method based on the foregoing system, including:
the processing equipment configures a first test information sequence table and a second test information sequence table, sends the first test information sequence table to the comprehensive tester and sends the second test information sequence table to the radio frequency tester;
the comprehensive tester sends power signals to the radio frequency instrument in sequence according to the first test information sequence list, and the first test information sequence list comprises calibration frequency points and calibration power values corresponding to the calibration frequency points;
the radio frequency instrument analyzes the power signals in sequence according to the second test information sequence table to obtain a test power value, and sends the test power value to the processing equipment, wherein the second test information sequence table comprises calibration frequency points;
the processing equipment obtains a gain compensation value according to the measurement power value and the corresponding calibration power value;
and the calibration frequency point in the first test information sequence list is the same as the calibration frequency point in the second test information sequence list.
Optionally, the comprehensive tester sequentially determines target calibration frequency points according to the sequence of the calibration frequency points in the first test information sequence table, and sequentially sends power signals to the radio frequency instrument according to the calibration power values at the target calibration frequency points.
Optionally, the radio frequency instrument sequentially determines target calibration frequency points according to the calibration frequency point sequence in the second test information sequence table, receives power signals sent by the comprehensive test instrument according to each calibration power value at the target calibration frequency points, and analyzes each power signal to obtain a corresponding test power value.
Optionally, after the processing device further configures a power trigger rule and sends the power trigger rule to the radio frequency instrument, the radio frequency instrument specifically receives a power signal sent by the comprehensive tester according to a first calibration power value at a first calibration frequency point, and analyzes the power signal to obtain a first test power value; and when the first test power value is larger than the preset power value, starting to execute the second test information sequence table.
Optionally, the first test information sequence table and the second test information sequence table both include: the switching between adjacent calibration frequency points triggers the gap time.
According to the technical scheme, the rapid calibration system for the generation stage of the comprehensive tester provided by the embodiment of the invention synchronously executes the information sequence table for the frequency point power test through the comprehensive tester and the radio frequency instrument, so that the automatic test is achieved, the test flow is optimized, the interaction times among the instruments are reduced, the production efficiency of the comprehensive tester is improved, and the production cost is reduced.
Drawings
Fig. 1 is a schematic structural diagram of a rapid calibration system in a generation phase of an integrated tester according to an embodiment of the present invention;
fig. 2 is a schematic flow chart of a method for fast calibration in a generation phase of an integrated tester according to an embodiment of the present invention.
Detailed Description
The following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the invention but are not intended to limit the scope of the invention.
Fig. 1 shows that an embodiment of the present invention provides a system for fast calibration in a generation phase of an integrated tester, including a processing device 11, an integrated tester 12, and a radio frequency instrument 13, where:
the processing equipment is used for configuring a first test information sequence table and a second test information sequence table, sending the first test information sequence table to the comprehensive tester and sending the second test information sequence table to the radio frequency instrument;
the comprehensive tester is used for sequentially sending power signals to the radio frequency instrument according to the first test information sequence list, and the first test information sequence list comprises calibration frequency points and calibration power values corresponding to the calibration frequency points;
the radio frequency instrument is used for analyzing the power signals in sequence according to the second test information sequence list to obtain a test power value and sending the test power value to the processing equipment, and the second test information sequence list comprises calibration frequency points;
the processing device is further configured to obtain a gain compensation value according to the measurement power value and the corresponding calibration power value;
and the calibration frequency point in the first test information sequence list is the same as the calibration frequency point in the second test information sequence list.
In the embodiment of the invention, the power of all frequency points in the comprehensive tester is better tested. And the processing equipment records the parameters of all the frequency points required in the test process in the test information sequence list. In this embodiment, a first test information sequence table may be set for sending to the integrated tester according to a difference between objects to which the sequence table is sent. And a second test information sequence table can be set and used for sending to the radio frequency instrument. The first test information sequence table at least comprises calibration frequency points and calibration power values corresponding to the calibration frequency points. And the second test information sequence table at least comprises calibration frequency points. And the calibration frequency point in the first test information sequence table is the same as the calibration frequency point in the second test information table. Meanwhile, the time synchronization of the integrated tester executing the first test information sequence list and the time synchronization of the radio frequency instrument executing the second test information sequence list are ensured. Namely: and the comprehensive tester executes the frequency points A in the information sequence list and sends each test power value under the frequency points A to the radio frequency instrument. The radio frequency instrument also needs to execute the frequency points A in the information sequence list and receive power signals of each testing power value under the corresponding frequency point A. And the radio frequency instrument executes the frequency B at the same time until the comprehensive tester starts to execute the frequency B.
In the embodiment of the invention, the comprehensive tester sends power signals to the radio frequency instrument in sequence according to the first test information sequence list. Namely: and the comprehensive tester carries out power test on each calibration frequency point according to the calibration frequency points arranged in sequence in the first test information sequence list, and a plurality of calibration power values to be tested can correspond to each calibration frequency point. After the comprehensive tester is started, the comprehensive tester can be executed in sequence according to the parameters in the sequence table, automatic execution is realized, and the test is carried out without independently setting the parameters for each calibration frequency point. When the specific execution is carried out, target calibration frequency points are sequentially determined according to the sequence of the calibration frequency points in the first test information sequence table, and power signals are sequentially sent to the radio frequency instrument according to the calibration power values under the target calibration frequency points.
And the radio frequency instrument analyzes the power signals in sequence according to the second test information sequence table to obtain a test power value, and sends the test power value to the processing equipment. Namely: and the radio frequency instrument analyzes each power signal in sequence to obtain a corresponding test power value, and sends the test power value to the processing equipment. When the test is executed, sequentially determining the target calibration frequency points according to the sequence of the calibration frequency points in the second test information sequence table, receiving power signals sent by the comprehensive tester according to each calibration power value at the target calibration frequency points, and analyzing each power signal to obtain a corresponding test power value.
And the processing equipment obtains a gain compensation value according to the measurement power value and the corresponding calibration power value.
In this embodiment of the present invention, it should be further noted that, in order to better keep the comprehensive tester and the radio frequency instrument capable of executing the sequence table synchronously, after the processing device further configures a power trigger rule and sends the power trigger rule to the radio frequency instrument, the radio frequency instrument is specifically configured to:
receiving a power signal sent by the comprehensive tester according to a first calibration power value at a first calibration frequency point, and analyzing the power signal to obtain a first test power value;
and when the first test power value is larger than the preset power value, starting to execute the second test information sequence table.
Therefore, the power triggering rule according to the embodiment of the present invention may be: and when the first test power value is larger than the preset power value, starting to execute the second test information sequence table.
In this embodiment of the present invention, it should be further noted that the first test information sequence table and the second test information sequence table both include: the switching between adjacent calibration frequency points triggers the gap time. By switching the setting of the trigger gap time, it can be ensured that all the parameters in each sequence table can be executed.
According to the rapid calibration system for the generation stage of the comprehensive tester provided by the embodiment of the invention, the comprehensive tester and the radio frequency instrument synchronously execute the information sequence table for testing the frequency point power, so that the automatic test is realized, the test flow is optimized, the interaction times among the instruments are reduced, the production efficiency of the comprehensive tester is improved, and the production cost is reduced.
Fig. 2 shows a fast calibration method based on the above system according to an embodiment of the present invention, which includes:
s21, configuring a first test information sequence table and a second test information sequence table by the processing equipment, sending the first test information sequence table to the comprehensive tester, and sending the second test information sequence table to the radio frequency instrument;
s22, the comprehensive tester sends power signals to the radio frequency instrument in sequence according to the first test information sequence list, and the first test information sequence list comprises calibration frequency points and calibration power values corresponding to the calibration frequency points;
s23, the radio frequency instrument sequentially analyzes the power signals according to the second test information sequence list to obtain a test power value, and sends the test power value to the processing equipment, wherein the second test information sequence list comprises calibration frequency points;
s24, the processing equipment obtains a gain compensation value according to the measurement power value and the corresponding calibration power value;
and the calibration frequency point in the first test information sequence list is the same as the calibration frequency point in the second test information sequence list.
Since the method according to the embodiment of the present invention is implemented based on the system according to the above embodiment, the execution principle is the same as the description of the system principle, and is not described herein again.
According to the method for quickly calibrating the generation stage of the comprehensive tester provided by the embodiment of the invention, the comprehensive tester and the radio frequency instrument synchronously execute the information sequence table for testing the frequency point power, so that the automatic test is realized, the test flow is optimized, the interaction times among the instruments are reduced, the production efficiency of the comprehensive tester is improved, and the production cost is reduced.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the following claims, any of the claimed embodiments may be used in any combination.
It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The usage of the words first, second and third, etcetera do not indicate any ordering. These words may be interpreted as names.
Those of ordinary skill in the art will understand that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit of the corresponding technical solutions and scope of the present invention as defined in the appended claims.
Claims (10)
1. The system for quickly calibrating the generation stage of the comprehensive tester is characterized by comprising processing equipment, the comprehensive tester and a radio frequency tester, wherein:
the processing equipment is used for configuring a first test information sequence table and a second test information sequence table, sending the first test information sequence table to the comprehensive tester and sending the second test information sequence table to the radio frequency instrument;
the comprehensive tester is used for sequentially sending power signals to the radio frequency instrument according to the first test information sequence list, and the first test information sequence list comprises calibration frequency points and calibration power values corresponding to the calibration frequency points;
the radio frequency instrument is used for analyzing the power signals in sequence according to the second test information sequence list to obtain a test power value and sending the test power value to the processing equipment, and the second test information sequence list comprises calibration frequency points;
the processing device is further configured to obtain a gain compensation value according to the test power value and the corresponding calibration power value;
and the calibration frequency point in the first test information sequence list is the same as the calibration frequency point in the second test information sequence list.
2. The system of claim 1, wherein the integrated tester is specifically configured to:
and sequentially determining target calibration frequency points according to the sequence of the calibration frequency points in the first test information sequence table, and sequentially sending power signals to the radio frequency instrument according to the calibration power values under the target calibration frequency points.
3. The system of claim 2, wherein the radio frequency meter is specifically configured to:
and sequentially determining target calibration frequency points according to the sequence of the calibration frequency points in the second test information sequence table, receiving power signals sent by the comprehensive tester according to each calibration power value at the target calibration frequency points, and analyzing each power signal to obtain a corresponding test power value.
4. The system of claim 3, wherein after the processing device further configures a power trigger rule and sends the power trigger rule to the radio frequency instrument, the radio frequency instrument is specifically configured to:
receiving a power signal sent by the comprehensive tester according to a first calibration power value at a first calibration frequency point, and analyzing the power signal to obtain a first test power value;
and when the first test power value is larger than the preset power value, starting to execute the second test information sequence table.
5. The system of claim 4, wherein the first test information sequence table and the second test information sequence table each comprise: the switching between adjacent calibration frequency points triggers the gap time.
6. A method for fast calibration based on the system of any one of the preceding claims 1 to 5, comprising:
the processing equipment configures a first test information sequence table and a second test information sequence table, sends the first test information sequence table to the comprehensive tester and sends the second test information sequence table to the radio frequency tester;
the comprehensive tester sends power signals to the radio frequency instrument in sequence according to the first test information sequence list, and the first test information sequence list comprises calibration frequency points and calibration power values corresponding to the calibration frequency points;
the radio frequency instrument analyzes the power signals in sequence according to the second test information sequence table to obtain a test power value, and sends the test power value to the processing equipment, wherein the second test information sequence table comprises calibration frequency points;
the processing equipment obtains a gain compensation value according to the test power value and the corresponding calibration power value;
and the calibration frequency point in the first test information sequence list is the same as the calibration frequency point in the second test information sequence list.
7. The method according to claim 6, wherein the comprehensive tester determines target calibration frequency points in sequence according to the sequence of the calibration frequency points in the first test information sequence table, and sends power signals to the radio frequency instrument in sequence according to the calibration power values at the target calibration frequency points.
8. The method according to claim 7, wherein the radio frequency instrument sequentially determines target calibration frequency points according to the sequence of the calibration frequency points in the second test information sequence table, receives power signals sent by the comprehensive tester according to each calibration power value at the target calibration frequency points, and analyzes each power signal to obtain a corresponding test power value.
9. The method according to claim 8, wherein after the processing device further configures a power triggering rule and sends the power triggering rule to the radio frequency instrument, the radio frequency instrument specifically receives a power signal sent by the comprehensive tester according to a first calibration power value at a first calibration frequency point, and analyzes the power signal to obtain a first test power value; and when the first test power value is larger than the preset power value, starting to execute the second test information sequence table.
10. The method of claim 9, wherein each of the first test information sequence table and the second test information sequence table comprises: the switching between adjacent calibration frequency points triggers the gap time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810662435.0A CN110632356B (en) | 2018-06-25 | 2018-06-25 | System and method for quickly calibrating generation stage of comprehensive tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810662435.0A CN110632356B (en) | 2018-06-25 | 2018-06-25 | System and method for quickly calibrating generation stage of comprehensive tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110632356A CN110632356A (en) | 2019-12-31 |
| CN110632356B true CN110632356B (en) | 2021-10-22 |
Family
ID=68968090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810662435.0A Active CN110632356B (en) | 2018-06-25 | 2018-06-25 | System and method for quickly calibrating generation stage of comprehensive tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110632356B (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4958294A (en) * | 1988-04-01 | 1990-09-18 | Wavetek Microwave, Inc. | Swept microwave power measurement system and method |
| CN1719736A (en) * | 2005-07-19 | 2006-01-11 | 中兴通讯股份有限公司 | Method for correcting power |
| CN101047915A (en) * | 2007-04-10 | 2007-10-03 | 凯明信息科技股份有限公司 | Method and device for automatic calibration of third-generation TD-SCDMA mobile terminal |
| CN101188463A (en) * | 2007-12-20 | 2008-05-28 | 北京北方烽火科技有限公司 | A power calibration and real time correction device for CDMA receiver and its implementation method |
| CN101527604A (en) * | 2008-12-30 | 2009-09-09 | 湖北众友科技实业股份有限公司 | Method and device for automatic calibration of power for transmitter modules |
| CN101951634A (en) * | 2010-09-02 | 2011-01-19 | 湖北众友科技实业股份有限公司 | Method and system for automatic power control calibration of TD-LTE terminal |
| CN104635035A (en) * | 2015-03-03 | 2015-05-20 | 上海创远仪器技术股份有限公司 | System for quickly calibrating power of signal source based on segmenting type structure |
| CN105510852A (en) * | 2015-05-28 | 2016-04-20 | 中国电子科技集团公司第四十一研究所 | Output power calibration method of radio frequency excitation source based on linear interpolation |
| CN106788797A (en) * | 2017-02-21 | 2017-05-31 | 成都易慧通科技有限公司 | A kind of high-precision radio frequency signal source power quick calibration method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102830298B (en) * | 2012-07-27 | 2017-04-12 | 中兴通讯股份有限公司 | Method and device for testing radio frequency index and wireless index of active antenna system |
-
2018
- 2018-06-25 CN CN201810662435.0A patent/CN110632356B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4958294A (en) * | 1988-04-01 | 1990-09-18 | Wavetek Microwave, Inc. | Swept microwave power measurement system and method |
| CN1719736A (en) * | 2005-07-19 | 2006-01-11 | 中兴通讯股份有限公司 | Method for correcting power |
| CN101047915A (en) * | 2007-04-10 | 2007-10-03 | 凯明信息科技股份有限公司 | Method and device for automatic calibration of third-generation TD-SCDMA mobile terminal |
| CN101188463A (en) * | 2007-12-20 | 2008-05-28 | 北京北方烽火科技有限公司 | A power calibration and real time correction device for CDMA receiver and its implementation method |
| CN101527604A (en) * | 2008-12-30 | 2009-09-09 | 湖北众友科技实业股份有限公司 | Method and device for automatic calibration of power for transmitter modules |
| CN101951634A (en) * | 2010-09-02 | 2011-01-19 | 湖北众友科技实业股份有限公司 | Method and system for automatic power control calibration of TD-LTE terminal |
| CN104635035A (en) * | 2015-03-03 | 2015-05-20 | 上海创远仪器技术股份有限公司 | System for quickly calibrating power of signal source based on segmenting type structure |
| CN105510852A (en) * | 2015-05-28 | 2016-04-20 | 中国电子科技集团公司第四十一研究所 | Output power calibration method of radio frequency excitation source based on linear interpolation |
| CN106788797A (en) * | 2017-02-21 | 2017-05-31 | 成都易慧通科技有限公司 | A kind of high-precision radio frequency signal source power quick calibration method |
Non-Patent Citations (1)
| Title |
|---|
| LTE多模终端快速功率校准方法的研究与实现;熊富林;《中国优秀硕士学位论文全文数据库信息科技辑》;20150815(第08期);第I136-688页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110632356A (en) | 2019-12-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9755766B2 (en) | Front end module for automatic test equipment | |
| US7449876B2 (en) | Swept-frequency measurements with improved speed using synthetic instruments | |
| CN102520332B (en) | Wafer testing device and method for the same | |
| JP2005292134A (en) | Testing system involving differential signal measurement | |
| JP2019174458A (en) | Device and system for managing test measurement and method for test measurement management system | |
| US9341658B2 (en) | Fast on-chip oscillator trimming | |
| CN112526319A (en) | Chip testing method and device, processor chip and server | |
| US20120280696A1 (en) | Test chip and chip test system using the same | |
| CN1804648B (en) | Incremental generation of calibration factors for automated test equipment | |
| CN110632356B (en) | System and method for quickly calibrating generation stage of comprehensive tester | |
| CN117033251B (en) | Regression testing method and device for multi-version system of mobile electronic equipment | |
| CN107861049B (en) | Automatic circuit board adjusting and testing method and system based on LabVIEW and spectrometer complete machine platform | |
| CN109088675B (en) | Channel calibration method and device for radio frequency signal source | |
| CN103698639B (en) | Crystal oscillator waveform parameter automatic measurement system and method | |
| CN110749814A (en) | Automatic testing system and method for chip IC sample | |
| CN110784236B (en) | Method and system for enhancing accuracy and resolution of system integrated mirrors | |
| CN111863114B (en) | Chip sampling quasi-position determining method and device | |
| CN109710172B (en) | Parameter configuration method, device and system of multi-channel high-speed analog-to-digital conversion chip | |
| CN115579304A (en) | Wafer detection method and device, computer equipment and readable storage medium | |
| CN105547725A (en) | Control method for multipath test | |
| JP2015032341A (en) | Output signal calibration device of fpga board memory test device and method therefor | |
| US7680493B2 (en) | Low phase noise testing system utilizing a crystal filter | |
| US7290189B2 (en) | Compilation of calibration information for plural testflows | |
| CN210075247U (en) | Power calibration device of radio frequency equipment | |
| CN113810129A (en) | 5G NR testing method, device, terminal and storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |