CN110348461A - A kind of Surface Flaw feature extracting method - Google Patents

A kind of Surface Flaw feature extracting method Download PDF

Info

Publication number
CN110348461A
CN110348461A CN201910607775.8A CN201910607775A CN110348461A CN 110348461 A CN110348461 A CN 110348461A CN 201910607775 A CN201910607775 A CN 201910607775A CN 110348461 A CN110348461 A CN 110348461A
Authority
CN
China
Prior art keywords
image
workpiece
gray
surface flaw
extracting method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201910607775.8A
Other languages
Chinese (zh)
Inventor
赵君爱
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu Maritime Institute
Original Assignee
Jiangsu Maritime Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangsu Maritime Institute filed Critical Jiangsu Maritime Institute
Priority to CN201910607775.8A priority Critical patent/CN110348461A/en
Publication of CN110348461A publication Critical patent/CN110348461A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/70Denoising; Smoothing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/77Retouching; Inpainting; Scratch removal
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/13Edge detection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/136Segmentation; Edge detection involving thresholding
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/40Extraction of image or video features
    • G06V10/44Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G06V10/443Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components by matching or filtering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20024Filtering details
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Analysis (AREA)

Abstract

The invention discloses a kind of Surface Flaw feature extracting methods, comprising the following steps: S1, source images acquisition;S2, source images pretreatment;S3, threshold cutting;S4, workpiece area positioning;S5, shearing;S6, filtering processing;S7, contours extract;S8, feature extraction;S9, eigenvector recognition.Advantage is: the present invention is good to the good adaptability of illumination variation, has good Negative selection and scale selection characteristic, also improves robustness while improving the accuracy differentiated relative to existing Surface Flaw feature extracting method.

Description

A kind of Surface Flaw feature extracting method
Technical field
The present invention relates to workpiece quality detection technique field more particularly to a kind of Surface Flaw feature extracting methods.
Background technique
With the development of manufacturing technology, the requirement for being machined reliability is also higher and higher, automatic to Surface Flaw More stringent requirements are proposed for detection.The new automatic etection theory extracted for Surface Flaw of research and development and method, meet enterprise Industry there is an urgent need to also be of great significance to mechanical subject fundamental research.
At present for Surface Flaw Detection technology, the baseband signal feature for being mainly based upon workpiece surface image is organic Defect gray feature separates defect, i.e., carries out defect using the shade of gray difference of image deflects part and background area Separation, and the influence of factors such as workpiece image characteristic extraction procedure is blocked, dynamic background, visual angle and illumination variation and have There is very big challenge.
For this purpose, it is proposed that a kind of Surface Flaw feature extracting method solves the above problems.
Summary of the invention
The purpose of the present invention is to solve the problems of the prior art, and a kind of Surface Flaw feature proposed mentions Take method.
To achieve the goals above, present invention employs following technical solutions:
A kind of Surface Flaw feature extracting method, comprising the following steps:
S1, source images acquisition: workpiece surface image is collected using professional imaging device;
S2, source images pretreatment: improving image quality promotes picture contrast;
S3, threshold cutting: according to Threshold Segmentation Algorithm, to treated, image carries out threshold cutting;
S4, workpiece area positioning: regional area filling is carried out to the bianry image after Threshold segmentation and is filled out with besieged region It fills;
S5, shearing: the workpiece area outer profile of bianry image after filling is extracted, outlines workpiece area using minimum circumscribed rectangle Domain;Workpiece image is obtained using the working region of workpiece area shearing algorithm shearing source images;
S6, filtering processing: workpiece image is filtered using Gabor filter, filters out workpiece said surface On bar shaped texture, obtain multiple filtering workpiece images;
S7, contours extract: filtering workpiece image progress edge sharpening is handled and obtains edge sharpening image, at edge sharpening Self-adaption binaryzation processing is carried out after reason again and obtains contour images;
S8, feature extraction: carrying out contour detecting processing to the contour images using the patch of pre-set dimension size, from And obtain feature vector V corresponding to each patchij, and by all workpiece features vector VijSimultaneously composition characteristic is normalized Vector set Vi, wherein the subscript j is described eigenvector in described eigenvector collection and ViWithin serial number;
S9, eigenvector recognition: by all feature vector set ViIn feature vector VijBring trained point in advance into Differentiation operation is carried out in class device, wherein differentiate that result is divided into normal and two kinds of result types of defect, be identified as the feature of defect Vector is Surface Flaw feature vector.
In above-mentioned Surface Flaw feature extracting method, in the step S3, before carrying out Threshold segmentation, removal Grey level histogram is counted after noise in source images, display foreground and two maximum values of background gray scale are obtained, using gray scale stretching Algorithm obtains gray scale stretching image.
In above-mentioned Surface Flaw feature extracting method, the gray scale stretching algorithm is calculated by the following formula:
Wherein, the number of greyscale levels of source images is 0~M, and background colour is white, and foreground is black, and a is grey in 0~M/2 The corresponding gray value of histogram prospect maximum value is spent, b is the corresponding gray value of grey level histogram background maximum value in M/2~M, X, y are pixel coordinates, and f (x, y) is gray value of the source images in coordinate (x, y), and g (x, y) is the coordinate (x, y) after gray scale stretching The gray value at place, series are 0~M, and c, d are setting value.
In above-mentioned Surface Flaw feature extracting method, in the step S6, Gabor filter is to workpiece figure As the Gabor kernel function g being filtered2Formula is defined as:
It is describedIt is describedThe λ is the Gabor kernel function Wavelength, the δ are the scale size of the Gabor kernel function, and the θ is to inhibit angle, describedFor phase difference, described (x, It y) is the coordinate of the gray level image and filtered image corresponding pixel points.
In above-mentioned Surface Flaw feature extracting method, in the step S8, feature vector VijIncluding passing through Contour detecting handle profile obtained is long, profile is wide, gray average 5 of the position coordinates (x, y) of profile and the profile Characteristic value.
In above-mentioned Surface Flaw feature extracting method, in the step S8, feature vector VijIncluding passing through Contour detecting handle profile obtained is long, profile is wide, gray average 5 of the position coordinates (x, y) of profile and the profile Characteristic value.
In above-mentioned Surface Flaw feature extracting method, in step s3, Threshold Segmentation Algorithm includes following step Suddenly
The grey level histogram number of gray scale stretching image is Hist [256], and the number of pixels that gray value is i is ni=Hist [i], total pixel number of the gray value between [0~T] are N,Gray value is the probability of the pixel of i are as follows:
The sum of gray value pixel between [T+1~255] is L, thenGray value is the pixel of i Probability are as follows:
It asksThe corresponding i of maximum value max { sum [i], i ∈ [0~255] }, wherein
Obtained i is image segmentation threshold T, carries out Threshold segmentation to gray scale stretching image according to T.
Compared with prior art, the invention has the benefit that
1, by counting grey level histogram after taking out the noise in source images, and gray scale is obtained by gray scale stretching algorithm and is drawn Image is stretched, followed by threshold cutting, can quickly and accurately extract the image of the correspondence range of the workpiece, so as to Greatly reduce the operand of subsequent processes, at the same can also be corresponded to avoid workpiece the picture material except range to differentiation at The interference of reason also improves robustness while improving the accuracy of differentiation.
2 operations for positioning and shearing by workpiece area obtain the outer profile in workpiece image region, use minimum external square Shape outlines workpiece area outer profile, and is cut into workpiece image, provides the inclination angle of workpiece image.
3, workpiece image is filtered using Gabor filter, filters out the profile and surface of workpiece itself The interference and influence that bar shaped texture extracts subsequent characteristics, further, since carrying out edge to using the image after filtering processing Contours extract is being carried out after sharpening, therefore is substantially increasing the reliability and robustness of contour feature extraction;Due to Gabor core Function is capable of providing good direction selection and scale selection characteristic for the edge sensitive of image, and for illumination variation It is insensitive, it is capable of providing to the good adaptability of illumination variation, also, due in Gabor filtering mode and human visual system The visual stimulus response of simple cell is closely similar, therefore with good in terms of the local space and frequency-domain information for extracting target Good characteristic.In addition, have operation simple by using the mode that Garbor is filtered, it can be readily appreciated that parameter is easy to adjust, and And the complexity of calculating is reduced, reduce calculation amount, improves response speed.
Specific embodiment
Following embodiment only exists in illustrative purpose, limits the scope of the invention without being intended to.
Embodiment
A kind of Surface Flaw feature extracting method, comprising the following steps:
(1) source images acquire: collecting workpiece surface image using professional imaging device;
(2) source images pre-process: improving image quality promotes picture contrast;
(3) grey level histogram is counted after removing the noise in source images, obtains display foreground and two maximums of background gray scale Value, obtains gray scale stretching image using gray scale stretching algorithm;
Gray scale stretching algorithm is calculated by the following formula:
Wherein, the number of greyscale levels of source images is 0~M, and background colour is white, and foreground is black, and a is grey in 0~M/2 The corresponding gray value of histogram prospect maximum value is spent, b is the corresponding gray value of grey level histogram background maximum value in M/2~M, X, y are pixel coordinates, and f (x, y) is gray value of the source images in coordinate (x, y), and g (x, y) is the coordinate (x, y) after gray scale stretching The gray value at place, series are 0~M, and c, d are setting value
(4) threshold cutting: according to Threshold Segmentation Algorithm, to treated, image carries out threshold cutting;
The grey level histogram number of gray scale stretching image is Hist [256], and the number of pixels that gray value is i is ni=Hist [i], total pixel number of the gray value between [0~T] are N,Gray value is the probability of the pixel of i are as follows:
The sum of gray value pixel between [T+1~255] is L, thenGray value is the pixel of i Probability are as follows:
It asksThe corresponding i of maximum value max { sum [i], i ∈ [0~255] }, wherein
Obtained i is image segmentation threshold T, carries out Threshold segmentation to gray scale stretching image according to T
(5) workpiece area positions: carrying out regional area filling to the bianry image after Threshold segmentation and fills out with besieged region It fills;
(6) it shears: extracting the workpiece area outer profile of bianry image after filling, outline workpiece area using minimum circumscribed rectangle Domain;Workpiece image is obtained using the working region of workpiece area shearing algorithm shearing source images;
(7) it is filtered: workpiece image being filtered using Gabor filter, filters out workpiece said surface On bar shaped texture, obtain multiple filtering workpiece images;
The Gabor kernel function g that Gabor filter is filtered workpiece image2Formula is defined as:
λ is the wavelength of Gabor kernel function, and δ is Gabor core The scale size of function, θ are to inhibit angle,For phase difference, (x, y) is gray level image and filtered image corresponding pixel points Coordinate
(8) contours extract: filtering workpiece image progress edge sharpening is handled and obtains edge sharpening image, at edge sharpening Self-adaption binaryzation processing is carried out after reason again and obtains contour images;
(9) feature extraction: contour detecting processing is carried out to contour images using the patch of pre-set dimension size, to obtain Obtain feature vector V corresponding to each patchij, and by all workpiece features vector VijSimultaneously composition characteristic vector is normalized Set Vi, wherein subscript j is feature vector in set of eigenvectors and ViWithin serial number;
Feature vector VijIncluding by contour detecting handle profile obtained is long, profile is wide, the position coordinates of profile (x, And 5 characteristic values of gray average of profile y);
(10) eigenvector recognition: by all feature vector set ViIn feature vector VijBring trained point in advance into Differentiation operation is carried out in class device, wherein differentiate that result is divided into normal and two kinds of result types of defect, be identified as the feature of defect Vector is Surface Flaw feature vector;
Feature vector VijIncluding by contour detecting handle profile obtained is long, profile is wide, the position coordinates of profile (x, And 5 characteristic values of gray average of profile y).
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto, Anyone skilled in the art in the technical scope disclosed by the present invention, according to the technique and scheme of the present invention and its Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.

Claims (7)

1. a kind of Surface Flaw feature extracting method, which comprises the following steps:
S1, source images acquisition: workpiece surface image is collected using professional imaging device;
S2, source images pretreatment: improving image quality promotes picture contrast;
S3, threshold cutting: according to Threshold Segmentation Algorithm, to treated, image carries out threshold cutting;
S4, workpiece area positioning: regional area filling and besieged area filling are carried out to the bianry image after Threshold segmentation;
S5, shearing: the workpiece area outer profile of bianry image after filling is extracted, outlines workpiece area using minimum circumscribed rectangle; Workpiece image is obtained using the working region of workpiece area shearing algorithm shearing source images;
S6, filtering processing: workpiece image is filtered using Gabor filter, is filtered out on workpiece said surface Bar shaped texture obtains multiple filtering workpiece images;
S7, contours extract: edge sharpening processing is carried out to filtering workpiece image and obtains edge sharpening image, edge sharpening handles it It carries out self-adaption binaryzation processing again afterwards and obtains contour images;
S8, feature extraction: contour detecting processing is carried out to the contour images using the patch of pre-set dimension size, to obtain Obtain feature vector V corresponding to each patchij, and by all workpiece features vector VijSimultaneously composition characteristic vector is normalized Set Vi, wherein the subscript j is described eigenvector in described eigenvector collection and ViWithin serial number;
S9, eigenvector recognition: by all feature vector set ViIn feature vector VijBring preparatory trained classifier into In carry out differentiation operation, wherein differentiate that result is divided into normal and two kinds of result types of defect, be identified as the feature vector of defect As Surface Flaw feature vector.
2. a kind of Surface Flaw feature extracting method according to claim 1, it is characterised in that: in the step S3 In, before carrying out Threshold segmentation, grey level histogram is counted after removing the noise in source images, obtains display foreground and background gray scale two A maximum value obtains gray scale stretching image using gray scale stretching algorithm.
3. a kind of Surface Flaw feature extracting method according to claim 2, it is characterised in that: the gray scale stretching Algorithm is calculated by the following formula:
Wherein, the number of greyscale levels of source images is 0~M, and background colour is white, and foreground is black, and a is that gray scale is straight in 0~M/2 The corresponding gray value of square figure prospect maximum value, b are the corresponding gray value of grey level histogram background maximum value, x, y in M/2~M It is pixel coordinate, f (x, y) is gray value of the source images in coordinate (x, y), and g (x, y) is at the coordinate (x, y) after gray scale stretching Gray value, series be 0~M, c, d be setting value.
4. a kind of Surface Flaw feature extracting method according to claim 2, it is characterised in that: in the step S6 In, the Gabor kernel function g that Gabor filter is filtered workpiece image2Formula is defined as:
It is describedIt is describedThe λ is the wavelength of the Gabor kernel function, The δ is the scale size of the Gabor kernel function, and the θ is to inhibit angle, describedFor phase difference, (x, y) is institute State the coordinate of gray level image Yu filtered image corresponding pixel points.
5. a kind of Surface Flaw feature extracting method according to claim 1, it is characterised in that: in the step S8 In, feature vector VijIncluding by contour detecting handle profile obtained is long, profile is wide, the position coordinates (x, y) of profile and 5 characteristic values of gray average of the profile.
6. a kind of Surface Flaw feature extracting method according to claim 1, it is characterised in that: in the step S9 In, the trained classifier is to advance with training sample to be trained to what is constructed based on neural network to training pattern The model obtained afterwards, the training sample include historic defects characteristic information and corresponding defect classification information.
7. a kind of Surface Flaw feature extracting method according to claim 2, it is characterised in that: in step s3, Threshold Segmentation Algorithm includes the following steps
The grey level histogram number of gray scale stretching image is Hist [256], and the number of pixels that gray value is i is ni=Hist [i], ash Total pixel number of the angle value between [0~T] is N,Gray value is the probability of the pixel of i are as follows:
The sum of gray value pixel between [T+1~255] is L, thenGray value is the probability of the pixel of i Are as follows:
It asksThe corresponding i of maximum value max { sum [i], i ∈ [0~255] }, wherein
Obtained i is image segmentation threshold T, carries out Threshold segmentation to gray scale stretching image according to T.
CN201910607775.8A 2019-07-05 2019-07-05 A kind of Surface Flaw feature extracting method Withdrawn CN110348461A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910607775.8A CN110348461A (en) 2019-07-05 2019-07-05 A kind of Surface Flaw feature extracting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910607775.8A CN110348461A (en) 2019-07-05 2019-07-05 A kind of Surface Flaw feature extracting method

Publications (1)

Publication Number Publication Date
CN110348461A true CN110348461A (en) 2019-10-18

Family

ID=68177941

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910607775.8A Withdrawn CN110348461A (en) 2019-07-05 2019-07-05 A kind of Surface Flaw feature extracting method

Country Status (1)

Country Link
CN (1) CN110348461A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111390578A (en) * 2020-06-08 2020-07-10 佛山市南海富大精密机械有限公司 Five-axis linkage numerical control machine tool
CN112505049A (en) * 2020-10-14 2021-03-16 上海互觉科技有限公司 Mask inhibition-based method and system for detecting surface defects of precision components
CN112907498A (en) * 2019-11-18 2021-06-04 中国商用飞机有限责任公司 Pore identification method, device, equipment and storage medium
CN113426709A (en) * 2021-07-21 2021-09-24 长沙荣业软件有限公司 Intelligent detection robot for grain material purchase and grain material classification method
CN114155241A (en) * 2022-01-28 2022-03-08 浙江华睿科技股份有限公司 Foreign matter detection method and device and electronic equipment
CN114170200A (en) * 2021-12-13 2022-03-11 沭阳鑫洪锐金属制品有限公司 Metal pitting defect degree evaluation method and system based on artificial intelligence

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112907498A (en) * 2019-11-18 2021-06-04 中国商用飞机有限责任公司 Pore identification method, device, equipment and storage medium
CN112907498B (en) * 2019-11-18 2024-04-30 中国商用飞机有限责任公司 Pore identification method, device, equipment and storage medium
CN111390578A (en) * 2020-06-08 2020-07-10 佛山市南海富大精密机械有限公司 Five-axis linkage numerical control machine tool
CN111390578B (en) * 2020-06-08 2020-09-08 佛山市南海富大精密机械有限公司 Five-axis linkage numerical control machine tool
CN112505049A (en) * 2020-10-14 2021-03-16 上海互觉科技有限公司 Mask inhibition-based method and system for detecting surface defects of precision components
CN112505049B (en) * 2020-10-14 2021-08-03 上海互觉科技有限公司 Mask inhibition-based method and system for detecting surface defects of precision components
CN113426709A (en) * 2021-07-21 2021-09-24 长沙荣业软件有限公司 Intelligent detection robot for grain material purchase and grain material classification method
CN114170200A (en) * 2021-12-13 2022-03-11 沭阳鑫洪锐金属制品有限公司 Metal pitting defect degree evaluation method and system based on artificial intelligence
CN114170200B (en) * 2021-12-13 2023-01-20 沭阳鑫洪锐金属制品有限公司 Metal pitting defect degree evaluation method and system based on artificial intelligence
CN114155241A (en) * 2022-01-28 2022-03-08 浙江华睿科技股份有限公司 Foreign matter detection method and device and electronic equipment

Similar Documents

Publication Publication Date Title
CN110348461A (en) A kind of Surface Flaw feature extracting method
CN111310558B (en) Intelligent pavement disease extraction method based on deep learning and image processing method
CN109410230B (en) Improved Canny image edge detection method capable of resisting noise
CN106548463B (en) Sea fog image automatic defogging method and system based on dark and Retinex
WO2022205525A1 (en) Binocular vision-based autonomous underwater vehicle recycling guidance false light source removal method
CN111915704A (en) Apple hierarchical identification method based on deep learning
CN110120056B (en) Blood leukocyte segmentation method based on adaptive histogram threshold and contour detection
CN105740945A (en) People counting method based on video analysis
CN104732536A (en) Sub-pixel edge detection method based on improved morphology
CN109472788B (en) Method for detecting flaw on surface of airplane rivet
CN109993099A (en) A kind of lane line drawing recognition methods based on machine vision
CN103175844A (en) Detection method for scratches and defects on surfaces of metal components
CN108921004A (en) Safety cap wears recognition methods, electronic equipment, storage medium and system
CN112907519A (en) Metal curved surface defect analysis system and method based on deep learning
CN114118144A (en) Anti-interference accurate aerial remote sensing image shadow detection method
CN103729856B (en) A kind of Fabric Defects Inspection detection method utilizing S-transformation signal extraction
CN109685766A (en) A kind of Fabric Defect detection method based on region fusion feature
CN105139391B (en) A kind of haze weather traffic image edge detection method
CN109781737B (en) Detection method and detection system for surface defects of hose
CN112614062A (en) Bacterial colony counting method and device and computer storage medium
CN112734761A (en) Industrial product image boundary contour extraction method
CN111476804A (en) Method, device and equipment for efficiently segmenting carrier roller image and storage medium
CN108090492B (en) Contour detection method based on scale clue suppression
CN112861654A (en) Famous tea picking point position information acquisition method based on machine vision
CN111768455A (en) Image-based wood region and dominant color extraction method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WW01 Invention patent application withdrawn after publication
WW01 Invention patent application withdrawn after publication

Application publication date: 20191018