CN110178020A - Improved glass checks system - Google Patents
Improved glass checks system Download PDFInfo
- Publication number
- CN110178020A CN110178020A CN201880004739.6A CN201880004739A CN110178020A CN 110178020 A CN110178020 A CN 110178020A CN 201880004739 A CN201880004739 A CN 201880004739A CN 110178020 A CN110178020 A CN 110178020A
- Authority
- CN
- China
- Prior art keywords
- glass substrate
- image
- cleaning
- specified point
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
Abstract
The present invention relates to a kind of for checking the inspection system (100) of glass substrate (S), including the means of transportation (102) for keeping the glass substrate mobile, suitable for cleaning the cleaning device (104) and First look check device (103a) on one or more surfaces of the glass substrate, the First look check device is located at the downstream of the cleaning device relative to the movement of the substrate, and the First look check device includes the rear cleaning image (I for being clean surface suitable for capturing the one or more of the glass substrateP2) optical sensor (1030), which is characterized in that the inspection system further include relative to the substrate movement be located at the cleaning device upstream the second vision inspection device (103b).
Description
Technical field
The present invention relates to a kind of for checking the inspection system regions of glass substrate.
Background technique
Currently, glass substrate quality control need automaticly inspect with check substrate whether have glass manufacture defect and with
The relevant defect of various industrial technologies.This inspection is executed using inspection system as can be seen in Figure 1.Currently, this
It is a little to check that system 1 includes the conveyer system 2 of transporting glass substrate S, such as multiple rollers that conveyer belt or substrate move on it.
Cleaning device 3 is disposed on the transmission line.This cleaning device is used for using one or more ionization or non-electrical
Dust is removed from air knife and/or static bruss or non-electrostatic brush.It is industrial vision device 4 after the cleaning device.This device
Including optical sensor, such as it is able to detect the high-resolution camera of defect.
However, these check systems have the shortcomings that it is sensitive to following pollutant: (most commonly caught by system in image
The digital picture obtained) in it can be seen that the dust that can be removed, fiber or trace.
In fact, cleaning and it is imperfect, and cleaning device intervention after there are still pollutant (dust or it is other can be clear
Clean element).The possible visual inspection device of the dust is construed to defect, causes to negate glass substrate.
Therefore, it is necessary to a kind of inspection system for providing improved defects detection and its improved operating methods.
Summary of the invention
Therefore, the present invention proposes a kind of to provide the inspection system that more effectively detects by providing and make up these disadvantages.
For this purpose, the present invention relates to a kind of for checking the inspection system of glass substrate, including for making the glass substrate
Mobile means of transportation, the cleaning device and First look check device on one or more surfaces suitable for cleaning glass substrate,
The First look check device is located at the downstream of cleaning device, the First look check device packet relative to the movement of substrate
The optical sensor for being suitable for capturing the rear cleaning image for being clean one or more surfaces of glass substrate is included, feature exists
In the inspection system further include: it is located at the second vision inspection device of cleaning device upstream relative to the movement of substrate, it is described
Second vision inspection device includes the light suitable for capturing the preceding cleaning image for being clean one or more surfaces of glass substrate
Learn sensor, and be, the inspection system include for by rear cleaning image compared with preceding cleaning image compares work
Tool.
The system according to the present invention have by check before cleaning and later glass substrate simultaneously comparison result and make
The advantages of inspection can be improved.This advantageously allows to preferably identify real defect and prevents unnecessary negative.
According to an example, each vision inspection device is adapted to detect for specified point, is cleaned and is schemed by after using these specified points
As being compared with preceding cleaning image.
According to an example, specified point is according to their positions on the glass substrate, their size and in the picture
Signature (i.e. corresponding to specified point imaging surface and for example by one group of pixel indicate reception signal) and characterize.
According to an example, each vision inspection device includes control module, and the link block including comparing tool connects
To each control module.
According to an example, vision inspection device is by including the single control module control for comparing tool.
According to an example, cleaning device includes at least one air knife and/or at least one brush.
The invention further relates to a kind of by means of inspection systems inspection glass base described in any one of preceding claims
The inspection method of plate, which is characterized in that it the following steps are included:
- the second vision inspection device captures the preceding cleaning image in the face of glass substrate；
The face of cleaning device cleaning glass substrate；
First look check device captures the rear cleaning image for being clean face on glass substrate；
Rear cleaning image is compared with preceding cleaning image.
According to an example, comparison step includes:
The specified point of image and preceding cleaning image is cleaned after identification；
According to position, corresponding signal level in size and image characterizes specified point；
Each specified point of rear cleaning image is compareed with the specified point of preceding cleaning image；And
The property of specified point is determined, so that if cleaning the positions and dimensions of the specified point of image and the spy of preceding cleaning image afterwards
The position of fixed point, size are identical with associated signal level, then the specified point corresponds to defect；Otherwise the specified point corresponds to
Impurity.
According to an example, this method is further comprising the steps of after the step of comparing: the step be according to compare knot
The glass substrate is guided continuation to processing or guided to recycling by fruit.
According to an example, this method is further comprising the steps of after the step of comparing: the step be according to compare knot
The glass substrate is guided continuation to processing or guided to recycling by fruit, the defect inspection of the step just on the glass substrate
It is executed after surveying.
Detailed description of the invention
From below by will clearly show other specific spies in non-limitative illustration and the description that is given with reference to the accompanying drawings
It seeks peace advantage, in which:
- Fig. 1 be the prior art be inspection system schematic diagram；
- Fig. 2 is the schematic diagram of inspection system according to the present invention；
- Fig. 3 is the schematic diagram of the vision inspection device of inspection system according to the present invention；
- Fig. 4 and Fig. 5 shows the configuration of inspection system according to the present invention；
- Fig. 6 is the figure for indicating the operation of inspection system according to the present invention.
Specific embodiment
It is shown in FIG. 2 according to the present invention for checking the inspection system 100 of substrate S.Substrate S is, for example, wide glass
Substrate, such as come from the flat glass plate of " huge " size (6m × 3.21m) of float glass technology.Certainly, according to the present invention
For checking that the inspection system of substrate S can be adapted for various sizes of substrate.Substrate is examined before treatment.
The inspection system 100 includes the means of transportation 102 for transporting glass substrate S.This means of transportation 102 can be adopted
With the form for two parallel orbits for being disposed with chassis thereon, which is equipped with the supporting element for glass substrate.Means of transportation
102 can also be using the form for two parallel orbits for being equipped with the wheel for enabling substrate to move thereon.Then some wheels
It is connected to motor and enables to drive substrate.
Inspection system 100 includes cleaning device 104.This cleaning device 104 for remove dust, fiber, trace or its
Its cleanable surface contaminant.For this purpose, cleaning device uses burnisher 104', these burnishers can be using not similar shape
Formula.
For this purpose, the first cleaning device uses burnisher 104', burnisher 104' that can use different form.
In the first form, burnisher 104' uses the form of air knife A.Air knife is generated by air ejector, the air
Injector includes structure, which includes the turbine for generating air jet, and the air jet is passed through and is equipped in the structure
Slit is to generate foliaceous air jet.The direction of air knife A towards glass substrate S are orientated, to drive away impurity.Air knife A can
To be ionization.
In the second form, burnisher 104' uses the form of brush.This brush includes being fixed to motor to revolve
The drum turned.The drum is equipped with multiple flexible strands.Rotation drum causes strand to be contacted with glass substrate to go ash disposal
Dirt.Strand can be ionization, to be attracted to the impurity of its such as dust, to clean substrate S.Cleaning device 104 can be with
Including one or more blades, the mixing of one or more brushes or one or more blades and brush.
Cleaning device 104 may be adapted to the surface towards means of transportation for cleaning substrate or with the surface towards means of transportation
Opposite surface.
Vision inspection device 103a is arranged near cleaning device 104.103a is relative to glass for the First look check device
The movement of glass substrate is arranged in the downstream of cleaning device 104, so that carrying out visual inspection operation after cleaning.This
One vision inspection device 103a includes optical sensor 1030, such as high-resolution camera.The optical sensor 1030 and biography
Send tool vertically arranged, so that visual field/detecting field of optical sensor corresponds to the surface of glass substrate.Therefore, optics passes
Sensor 1030 can generate the image of the glass substrate S.
Vision inspection device 103a combines optical sensor 1030 with the control module 1031 for including processor 1032,
As shown in Figure 3.The processor unit 1032 is used to analyze the image of the glass substrate generated by optical sensor.
According to the present invention, inspection system 100 dexterously further includes the second vision inspection device 103b.The vision inspection device
103b is arranged in the upstream of cleaning device 104 relative to the movement of glass substrate S, so that carrying out vision inspection after cleaning
Look into operation.The second vision inspection device 103b (also is known as similar to the vision inspection device for being arranged in cleaning device downstream
First look check device).Therefore, the second check device includes the optical sensor vertically arranged with means of transportation 102
1030(such as high-resolution camera) so that visual field/detecting field of optical sensor corresponds to the surface of glass substrate.Cause
This, optical sensor can generate the image of the glass substrate.
The presence of two vision inspection devices 103a, 103b advantageously enable to execute verification step.The verification step
For determining whether the residual impurity after cleaning is impurity or defect, in the case where being defect, by analyzed glass base
Plate is removed from production line.
For this purpose, in the first configuration, inspection system 100 is designed to make each vision inspection device 103a, 103b packet
The control module 1031 of their own is included, i.e., each vision inspection device is independently controlled.In first configuration, including compare
The link block 105 of tool 1050 is connected to each control module, as shown in Figure 4.
In the second configuration, inspection system 100 is designed to only have a control module 1031, for controlling two views
Feel check device 103a, 103b.Second configuration makes it possible for single control module to manage all vision inspection devices.
The control module 1031 includes comparing tool, as shown in Figure 5.
As shown in Figure 6, the operation for checking system includes the first step in time t1, wherein capturing the first glass substrate
Preceding cleaning image IP1.By the way that the first glass substrate S is led at the second vision inspection device 103b by means of transportation 102
Come over to generate the preceding cleaning image IP1.Then, which is captured using its optical sensor 1030
The image of first glass substrate.Optical sensor 1030 is designed to be arranged so that captured image allows to obtain about described
The existing output of defect, impurity at the surface of substrate.
After this, second step is executed.The second step is to clean the first glass substrate S.For this purpose, means of transportation 102
First glass substrate is taken at cleaning device 104.Therefore, the first glass substrate S is towards burnisher: one or more brushes
And/or one or more air knives.
In third step, means of transportation 102 takes the first glass substrate below First look check device 103a to.So
Afterwards, which captures the rear cleaning figure of the first glass substrate in time t2 using its optical sensor 1030
As IP2.Optical sensor 1030 is designed to be arranged so that captured image allows to obtain and deposits at surface about the substrate
In defect, the output of impurity.The optical sensor 1030 of First look check device 103a and the second vision inspection device 103b
Optical sensor 1030 be preferably identical and be configured to generate similar image.
It is relatively more preceding to clean image I in four stepsP1With rear cleaning image IP2.This includes: more in the first phase
For preceding cleaning image IP1, identify specified point Pi, and for rear cleaning image IP2, identify specified point P'i.These specified points
Pi, P'i are the contrast points in the image from optical sensor.These specified points Pi, P'i are examined by each vision inspection device
It measures.
In second stage, these specified points Pi, P'i are characterized, that is, identify, measure, recording the position of each specified point
Signature with size and on the image.The image signatures correspond to the reception signal for indicating the imaging surface of specified point, and
Such as it is indicated by one group of pixel.
In the phase III, by preceding cleaning image IP1With rear cleaning image IP2It is compared to each other.This compares including cleaning by after
Image IP2The specified point P'i of (that is, the image generated by First look check device) and preceding cleaning image IP1Specified point Pi into
Row compares.Here purpose is determining some things.First of all, it is necessary to determine whether cleaning has by comparing the number of specified point
Effect.If the number be it is identical if clean it is invalid or may redeposited pollutant capturing between two images.
Secondly, purpose also resides in the property of the element confirmly detected.In fact, knowing whether is element that these are detected
It is impurity or defect is useful.
For this purpose, cleaning image I by afterP2Each specified point P'i and preceding cleaning image IP1Specified point Pi be compared.
Firstly, comparing the position of specified point.This initial comparison of position is based on the assumption that the position of defect is fixed, and miscellaneous
The position of matter can change.Therefore, for each specified point P'i of rear cleaning image, by the spy of its position and preceding cleaning image
The position of fixed point Pi is compared.Therefore, in rear cleaning image IP2Above and in preceding cleaning image IP1The upper spy with same position
P'i is pinpointed, the presence of Pi indicates that, there are impurity or defect, may be not present has in rear cleaning image IP2Above and in preceding cleaning image
IP1On same position specified point expression after clean image specified point be impurity.
If cleaning image I afterwardsP2Specified point P'i have and preceding cleaning image IP1The identical position specified point Pi, then
It needs to be determined that the point corresponds to impurity and also corresponds to defect.For this purpose, considering size characteristic.In fact, thinking the ruler of defect
Very little and internal structure cannot all change after clean operation, and for impurity, this is then possible.Therefore, scheme in preceding cleaning
As IP1With rear cleaning image IP2Specified point have same position in the case where, compare the size of those specified points to determine
State property a little.
In fourth stage, synthesized by link block or by the execution of control module 1030.The synthesis is to summarize to specific
The phase III that point is compared.If synthesis highlights the presence of defect, glass substrate is placed in recirculation circuit.
If synthesis highlights the presence of impurity but not prominent defect, glass substrate continues normal process cycle.
In modification, detection process is designed to eliminate synthesis phase.For this purpose, being programmed to the phase III, so that lacking
Sunken identification, which immediately results in, is placed on glass substrate in recirculation circuit.The modification can save during time because
If the first specified point is identified as defect, glass substrate is directly entered recycling without carrying out other comparisons.
Certainly, the example the present invention is not limited to shown in, and the present invention is suitable for aobvious and easy for those skilled in the art
The various variants and modifications seen.
Claims (10)
1. one kind is for checking the inspection system (100) of glass substrate (S), including the transmission for keeping the glass substrate mobile
Tool (102), the cleaning device (104) and First look check device at least one surface suitable for cleaning the glass substrate
(103a), the First look check device are located at the downstream of the cleaning device relative to the movement of the substrate, and described the
One vision inspection device includes that at least one suitable for capturing the glass substrate is clean the rear cleaning image (I on surfaceP2)
Optical sensor (1030), which is characterized in that the inspection system further include relative to the substrate movement be located at it is described
The second vision inspection device (103b) of cleaning device upstream, second vision inspection device include being suitable for capture glass substrate
At least one be clean the preceding cleaning image (I on surfaceP1) optical sensor, and be, the inspection system includes
For by rear cleaning image compared with preceding cleaning image compares tool.
2. inspection system according to claim 1, wherein each vision inspection device (103a, 103b) is adapted to detect for spy
Fixed point described will clean afterwards image using these specified points and be compared with the preceding cleaning image.
3. inspection system according to claim 2, wherein the specified point be according to them on glass substrate (S)
Position, their size and signal level in glass image corresponding with the imaging surface of specified point and characterize.
4. inspection system according to any one of the preceding claims, wherein each vision inspection device includes control
Module (1031), the link block (150) including comparing tool (1050) are connected to each control module.
5. inspection system according to any one of the preceding claims, wherein the vision inspection device (103a,
103b) by including single control module (1031) control for comparing tool.
6. inspection system according to any one of the preceding claims, wherein the cleaning device (104) includes at least
One air knife and/or at least one brush.
7. a kind of inspection method by means of checking systems inspection glass substrate described in any one of preceding claims,
Be characterized in that, it the following steps are included:
The preceding cleaning image (I in the face of the second vision inspection device (103b) capture glass substrateP1)；
The cleaning device (104) cleans the face of the glass substrate (S)；
The First look check device (103a) captures the rear cleaning image for being clean face on the glass substrate
(IP2)；
Cleaning image is compared with the preceding cleaning image after will be described.
8. according to inspection method described in previous item claim, which is characterized in that the comparison step includes:
Image (I is cleaned after identificationP2) and preceding cleaning image (IP1) specified point (Pi, P'i)；
It is characterized according to the signal level corresponding with the imaging surface of specified point on position, size and glass image described
Specified point (Pi, P'i)；
Each specified point (P'i) of rear cleaning image is compareed with each specified point (Pi) of preceding cleaning image；And
Determine the property of specified point so that if afterwards cleaning image specified point (P'i) position, size and signal level with
The positions and dimensions of the specified point (Pi) of preceding cleaning image are identical, then the specified point corresponds to defect, and otherwise the specified point is corresponding
In impurity.
9. the inspection method according to any one of claim 7 to 8, which is characterized in that after the comparison step,
It is further comprising the steps of: the glass substrate being guided by continuation to processing according to comparison result or is guided to recycling.
10. inspection method according to claim 8, which is characterized in that further include following step after the comparison step
It is rapid: according to the comparison result, the glass substrate (S) is guided into continuation to the processing or is guided to recycling,
The step executes after the defects detection on the glass substrate just.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1762514A FR3075374A1 (en) | 2017-12-19 | 2017-12-19 | IMPROVED GLAZING INSPECTION SYSTEM |
| FR1762514 | 2017-12-19 | ||
| PCT/FR2018/053373 WO2019122689A1 (en) | 2017-12-19 | 2018-12-18 | Improved glazing inspection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110178020A true CN110178020A (en) | 2019-08-27 |
Family
ID=61599385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201880004739.6A Pending CN110178020A (en) | 2017-12-19 | 2018-12-18 | Improved glass checks system |
Country Status (3)
| Country | Link |
|---|---|
| CN (1) | CN110178020A (en) |
| FR (1) | FR3075374A1 (en) |
| WO (1) | WO2019122689A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111239163A (en) * | 2020-03-13 | 2020-06-05 | 苏州鑫睿益荣信息技术有限公司 | Windshield scratch connection detection device and detection method based on machine vision |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112246675B (en) * | 2020-08-27 | 2022-10-28 | 晟光科技股份有限公司 | LCD display screen detection device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05291225A (en) * | 1992-04-15 | 1993-11-05 | Mitsubishi Electric Corp | Evaluation method of cleaning ability |
| CN1107972A (en) * | 1993-09-09 | 1995-09-06 | 泽韦格路瓦有限公司 | Process and device for detecting foreign substances in a textile test material |
| JP2001050907A (en) * | 1999-08-16 | 2001-02-23 | Asahi Glass Co Ltd | Method for inspecting substrate |
| CN102621155A (en) * | 2011-02-01 | 2012-08-01 | 郭上鲲 | Apparatus for optical inspection |
-
2017
- 2017-12-19 FR FR1762514A patent/FR3075374A1/en not_active Withdrawn
-
2018
- 2018-12-18 CN CN201880004739.6A patent/CN110178020A/en active Pending
- 2018-12-18 WO PCT/FR2018/053373 patent/WO2019122689A1/en active Application Filing
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05291225A (en) * | 1992-04-15 | 1993-11-05 | Mitsubishi Electric Corp | Evaluation method of cleaning ability |
| CN1107972A (en) * | 1993-09-09 | 1995-09-06 | 泽韦格路瓦有限公司 | Process and device for detecting foreign substances in a textile test material |
| JP2001050907A (en) * | 1999-08-16 | 2001-02-23 | Asahi Glass Co Ltd | Method for inspecting substrate |
| CN102621155A (en) * | 2011-02-01 | 2012-08-01 | 郭上鲲 | Apparatus for optical inspection |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111239163A (en) * | 2020-03-13 | 2020-06-05 | 苏州鑫睿益荣信息技术有限公司 | Windshield scratch connection detection device and detection method based on machine vision |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2019122689A1 (en) | 2019-06-27 |
| FR3075374A1 (en) | 2019-06-21 |
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Application publication date: 20190827 |
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