CN110109240A - Binary channels dual wavelength phase micro imaging system and method under Non-orthogonal basis set - Google Patents
Binary channels dual wavelength phase micro imaging system and method under Non-orthogonal basis set Download PDFInfo
- Publication number
- CN110109240A CN110109240A CN201910275036.3A CN201910275036A CN110109240A CN 110109240 A CN110109240 A CN 110109240A CN 201910275036 A CN201910275036 A CN 201910275036A CN 110109240 A CN110109240 A CN 110109240A
- Authority
- CN
- China
- Prior art keywords
- light
- wave length
- sample
- mirror
- ccd camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
Abstract
The present invention provides binary channels dual wavelength phase micro imaging system and method under a kind of Non-orthogonal basis set, including light source, 2f mirror, limiting aperture diaphragm, beam-expanding collimation mirror, sample platform, object lens, first passage, second channel and computer；First passage and second channel are placed side by side；First passage includes the first diaphragm, the first collimating mirror, the first grating, the first fourier lense, the first spatial light modulator, the second fourier lense and the first CCD camera；Second channel is as the structure of first passage；Light source issues light beam and is successively divided into two bundles non-orthogonal collimated light beam after 2f mirror, limiting aperture diaphragm, beam-expanding collimation mirror, successively pass through sample platform, object lens again, respectively enter first passage and second channel, interference fringe pattern is obtained, computer progress pattern is transferred to and handles to obtain the three-dimensional configuration of sample.The present invention can carry out the micro- synchronous imaging of phase to dual wavelength, two-way light, it can get the space phase distribution of phase body according to the interference micrograph, and the three-dimensional configuration that sample can be obtained using algorithm for reconstructing, especially suitable for biological cell form transient state micro-imaging.
Description
Technical field
The invention belongs to phase micro-imaging technique fields, and in particular to the binary channels dual wavelength phase under Non-orthogonal basis set is aobvious
Micro- imaging system and method.
Background technique
Optical microscopy be biology with a kind of vital tool of medical domain because most cells and group be woven in it is aobvious
It is " transparent " that people are traditionally by making its " visible " to cell or tissue dyeing under micro mirror.A series of skills in recent years
The phase microscope past limitation of art strategic structural, which results in the appearance of quantitative micro-imaging technique (QPI).QPI is not to
The sample of label is operated, and therefore, it is the supplement to established fluorescence microscope, has lower phototoxicity, unglazed
It is Bleachability.Since image represents the Quantitatively mapping of the optical path length delay of sample introducing, QPI provides a kind of objective form
And dynamical measures, are not influenced by contrast agent.Quantitative micro-imaging technique is rapidly developed between past 10-15,
Phse sensitivity, stability and speed are improved, a kind of valuable method of research cell and tissue is had become.
There is also some shortcomings in the prior art.There is geometrical light-path spy altogether as Popescu is equal to propose for 2006
Levy the diffraction phase microtechnic (DPM) of high stability.The core concept of the technology is that phase grating and special sky is utilized
Between optical filter, 0 grade comprising sample image information and+1 grade of diffractional field can be separated, and respectively as reference field and sample
Product field, they pass through identical device, can form stable off-axis interference image on CCD.There is final images for the method
Problem of low quality.Patented technology US2014085715A1 (Diffraction phase microscopy with white
Light) white light is selected to produce corresponding white light diffraction phase microtechnic to substitute original light source in DPM technology
(wDPM) there is higher space phase sensitivity compared to original technology, in wDPM technology, air filter when they use
Wave method (being in the nature average calculating operation) and the optical path sensitivity with time Ethylmercurichlorendimide magnitude.They measure disk with the technology respectively
The phase of shape red blood cell and the relationship that changes over time of dynamic phasing and its dry mass up to 18 hours HeLa cells, thus
The growth variation of HeLa cell can be quantified.But the Image Acquisition speed of the method cannot meet some measurement fields at present
The needs of scape.Kim, which is equal to 2014, is applied to double-wavelengh technique under DPM technology, can successively generate dichromatism by one
The combination laser source of light is illuminated, and the different orders of diffraction of grating embody different wave length ingredient, and dual wavelength interference pattern can lead to
It crosses apparent striped carrier frequency and differentiates.Since it is total diameter system, the time stability of Subnano-class can be provided, and
And due to its single shot characteristic, acquisition time is Millisecond.The collected interference fringe of CCD is that two wavelength are corresponding in the method
Two kinds of different frequencies interference fringe superposition, interference will cause for information extraction.
Summary of the invention
In order to solve the problems in the prior art, the purpose of the present invention is to provide the binary channels dual wavelength under a kind of Non-orthogonal basis set
Phase micro imaging system and method, the system and method can carry out the micro- synchronous imaging of phase to dual wavelength, two-way light,
It can get the space phase distribution of phase body according to the interference micrograph, and carry out pattern using computer and handle to obtain sample
Three-dimensional configuration, especially suitable for biological cell form transient state micro-imaging.
The technical scheme is that the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set, including light source,
2f mirror, limiting aperture diaphragm, beam-expanding collimation mirror, sample platform, object lens, first passage, second channel and computer；The light
Source, 2f mirror, limiting aperture diaphragm, beam-expanding collimation mirror, sample platform, object lens are sequentially placed, and center is all in same optical axis；
The first passage and second channel are placed side by side, and the first passage includes the first diaphragm, the first collimating mirror, the
One grating and the first 4f system；The second channel includes the second diaphragm, the second collimating mirror, the second grating and the 2nd 4f system；
The light beam that the light source issues is divided into two bundles non-orthogonal after 2f mirror, limiting aperture diaphragm, beam-expanding collimation mirror
Collimated light beam, the nonopiate collimated light beam of two beams successively respectively enterd after sample platform and across object lens simultaneously first passage and
Second channel；Light beam into first passage passes sequentially through the first diaphragm, the first collimating mirror, generates diffraction by the first grating,
The light beam of diffraction passes through the first 4f system micro-imaging；Light beam into second channel passes sequentially through the second diaphragm, the second collimation
Mirror generates diffraction by the second grating, and the light beam of diffraction passes through the 2nd 4f system micro-imaging；
The first 4f system obtains the light wave zero order light and first order optical interferometric fringe pattern sample and second of first wave length
The light wave zero order light and first order optical interferometric fringe pattern sample of wavelength；The 2nd 4f system obtains the light wave zero order light of first wave length
With the light wave zero order light and first order optical interferometric fringe pattern sample of first order optical interferometric fringe pattern sample and second wave length；
The computer is connected with the first 4f system, the 2nd 4f system respectively.
In above scheme, the light source is white light source, and what the white light source issued is Low coherence spatial light.
In above scheme, the first 4f system includes in the first fourier lense, the first spatial light modulator, second Fu
Leaf lens and the first CCD camera, the first fourier lense, the first spatial light modulator, the second fourier lense and the first CCD phase
The center of machine is all in same optical axis；
The 2nd 4f system includes third fourier lense, second space optical modulator, the 4th fourier lense and
Two CCD cameras, third fourier lense, second space optical modulator, the 4th fourier lense and the second CCD camera center all
In same optical axis.
In above scheme, the sample platform is transparent material.
In above scheme, first spatial light modulator is filtered multi-level diffraction light, selects the light of first wave length
Wave zero order light and zero order light and first order light under first order light, second wave length, by the light wave zero of first wave length and second wave length
Grade light modulation is polarized at from the horizontal by 45 degree, by the light wave first order Light Modulation of first wave length at polarizing vertically, by the
The light wave first order Light Modulation of two wavelength is at horizontal polarization, and using zero order light as reference light, first order light is sample light；
The second space optical modulator is identical as the first spatial light modulator structure.
In above scheme, first CCD camera is equipped with the first analyzing array, and the first analyzing array includes multiple and different
Micro- polarizing film of polarization direction, micro- polarizing film ordered arrangement；First CCD camera extracts the dry of corresponding first wave length light wave
Relate to stripe, and the interference fringe pattern of corresponding second wave length light wave；
It is integrated with the second analyzing array on the sensitive chip of second CCD camera, the second CCD camera extracts corresponding the
The interference fringe pattern of one wavelength light wave, and the interference fringe pattern of corresponding second wave length light wave.
The micro imaging method of binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set, comprising the following steps:
White light sorting: the light beam that the light source issues forms two beams by 2f mirror, limiting aperture diaphragm and beam-expanding collimation mirror
Non-orthogonal collimated light beam；
Nonopiate parallel Optical Sampling: the non-orthogonal collimated light beam of two beams is irradiated on the sample of sample platform, passes through object lens
Form two light beams for carrying sample image field information；Two light beams respectively enter first passage and second channel；
Dual wavelength diffraction light splitting modulation and imaging acquisition: into the light beam of first passage, the first diaphragm and the are passed sequentially through
One collimating mirror after changing into collimated light beam again after beam-expanding collimation, generates diffraction by the first grating, the first grating separates light beam
At multi-level diffraction light, multi-level diffraction light is irradiated after the first fourier lense to the first spatial light modulator；Described first is empty
Between optical modulator multi-level diffraction light is filtered, select the light wave zero order light and first order light, second wave length of first wave length
The light wave zero order light of first wave length and second wave length is modulated into from the horizontal by 45 degree partially by light wave zero order light and first order light
Vibration, by the light wave first order Light Modulation of first wave length at vertical polarization, by the first order Light Modulation of second wave length at level
Polarization, using zero order light as reference light, first order light is sample light；Reference light and sample light are occurred by the second fourier lense
Interfere and generate in the first CCD camera the interference fringe pattern of spatial modulation；In process and first passage in second channel
Process it is identical, in the second CCD camera generate spatial modulation interference fringe pattern；
Interferogram Analysis: the first CCD camera and the second CCD camera collect interference fringe pattern, be transferred to computer into
The processing of row pattern.
Compared with prior art, the beneficial effects of the present invention are:
1. light source uses white light.Speckle causes the spatial non-uniformity for making details fuzzy in quantitative phase images, and dissipates
The reason of spot is the reflection of various samples and surface of glass slide or the unwanted scattered optical field that dust, optical device defect are formed
Coherent superposition.White light provide 1 μm of magnitude coherence length, only optical path difference this magnitude or it is shorter when, different field components
Between superposition be only it is relevant, thus effectively inhibit noise.
2. the two channels imaging under Non-orthogonal basis set will not bring additional phase difference to two channels, axial noise is reduced,
Improve axial temporal and spatial stability.
3. the off-axis method of common path provides almost the same light path for imaging beam and reference beam, because both
It is transmitted by same component.On the one hand guarantee that Low coherence white light interferes, on the other hand significantly reduce axial aobvious
The unstability (mechanical oscillation or thermal change) of micro- noise, system does not influence obtained result.
Analyzing array, the Polarization Modulation situation of analyzing array combination spatial modulator, selectivity are integrated on 4.CCD chip
By the light wave of irradiation, two width of light wave that corresponding first wave length and second wave length are respectively formed on CCD has different stripeds
The interference fringe of frequency.It avoids interfering beam and non-coherent addition occurs, guarantee the effect of interference pattern while eliminating error.
5. it can be obtained four width interference patterns from the single shot that computer controls since binary channels dual wavelength is imaged,
On the one hand take full advantage of CCD bandwidth, on the other hand through corresponding Phase Retrieve Algorithm can fast quick-recovery quantitative phase figure, carefully
The acquisition speed of born of the same parents' information is greatly improved.
Detailed description of the invention
Fig. 1 is the light path schematic diagram of an embodiment of the present invention.
Wherein, 1. white light source, 2. 2f mirrors, 3. limiting aperture diaphragms, 4. beam-expanding collimation mirrors, 5. sample platforms, 6. objects
Mirror, 7. first diaphragms, 8. first collimating mirrors, 9. first gratings, 10. first fourier lenses, 11. first spatial modulators, 12.
Second fourier lense, 13. first analyzing arrays, 14. first CCD cameras, 15. second diaphragms, 16. second collimating mirrors, 17.
Two gratings, 18. third fourier lenses, 19. second space modulators, 20. the 4th fourier lenses, 21. second analyzing arrays,
22. the second CCD camera.
Specific embodiment
In order to be more clearly understood to the technical features, objects and effects of invention, it is of the invention now to compare Detailed description of the invention
Specific embodiment, identical label indicates the same or similar part in the various figures.Attached drawing is merely to illustrate the present invention, not generation
Table practical structures of the invention and actual proportions.
Embodiment 1
Fig. 1 is a kind of embodiment of binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set of the present invention,
Binary channels dual wavelength phase micro imaging system under the Non-orthogonal basis set includes light source 1,2f mirror 2, limiting aperture diaphragm 3, expands
Beam collimating mirror 4, sample platform 5, object lens 6, first passage, second channel and computer；The light source 1,2f mirror 2, limiting aperture
Diaphragm 3, beam-expanding collimation mirror 4, sample platform 5, object lens 6 are sequentially placed, and center is all in same optical axis；
The first passage and second channel are placed side by side, the first passage include the first diaphragm 7, the first collimating mirror 8,
First grating 9 and the first 4f system, the center of the first diaphragm 7, the first collimating mirror 8 and the first grating 9 is all in same optical axis；
The second channel includes the second diaphragm 15, the second collimating mirror 16, the second grating 17 and the 2nd 4f system, the second diaphragm 15, the
The center of two collimating mirrors 16 and the second grating 17 is all in same optical axis；
The light source 1 is white light source, and what the white light source issued is Low coherence spatial light, and coherence length is short, can
Inhibit noise well, improves final image quality.The limiting aperture diaphragm 3 is located on the front focal plane of beam-expanding collimation mirror 2,
The first diaphragm 7,15 planar conjugate of the second diaphragm on limiting aperture diaphragm 3 and 6 back focal plane of object lens guarantee to realize the dry of white light
It relates to.The sample platform 5 is transparent material.The limiting aperture diaphragm 3 is opened there are two aperture, the light beam that the light source 1 issues
Non-orthogonal collimated light beam, the nonopiate light beam of two beams are divided into two bundles after 2f mirror 2, limiting aperture diaphragm 3, beam-expanding collimation mirror 4
It is irradiated on the sample of sample platform 5 from two different angles, two light beams carry sample image field information by object lens 6, respectively
Into first passage and second channel.
Light beam into first passage passes sequentially through the first diaphragm 7, the first collimating mirror 8, spreads out by the generation of the first grating 9
It penetrates, the first grating 9 splits a beam into multi-level diffraction light, and multi-level diffraction light includes the light wave zero order light and the first order of first wave length
Light, the light wave zero order light of second wave length and first order light.Multi-level diffraction light passes through the first 4f system micro-imaging；It is logical into second
The light beam in road passes sequentially through the second diaphragm 15, the second collimating mirror 16, generates diffraction by the second grating 17, diffraction light passes through second
4f system micro-imaging；
The first 4f system includes the first fourier lense 10, the first spatial light modulator 11, the second fourier lense
12 and first CCD camera 14, the first fourier lense 10, the first spatial light modulator 11, the second fourier lense 12 and first
The center of CCD camera 14 is all in same optical axis；
The 2nd 4f system includes third fourier lense 18, second space optical modulator 19, the 4th fourier lense
20 and second CCD camera 22, third fourier lense 18, second space optical modulator 19, the 4th fourier lense 10 and second
The center of CCD camera 22 is all in same optical axis.
There are three apertures for the setting of first spatial light modulator 11, and different polarizing films is provided on 3 apertures；The
One spatial light modulator 11 is filtered multi-level diffraction light, selects the light wave zero order light and first order light, second of first wave length
The light wave zero order light and first order light of wavelength, by the polarizing film on 3 apertures, by the light wave zero of first wave length and second wave length
Grade light modulation is polarized at 45 degree, by the light wave first order light modulation of first wave length at polarizing vertically, by the light wave of second wave length the
Level-one light modulation is at horizontal polarization, and using zero order light as reference light, first order light is sample light；The second space optical modulator 19
As 11 structure of the first spatial light modulator.
The first 4f system obtains the light wave zero order light and first order optical interferometric fringe pattern sample and second of first wave length
The light wave zero order light and first order optical interferometric fringe pattern sample of wavelength；The 2nd 4f system obtains the light wave zero order light of first wave length
With the light wave zero order light and first order optical interferometric fringe pattern sample of first order optical interferometric fringe pattern sample and second wave length；
The sensitive chip of first CCD camera 14 is equipped with the first analyzing array 13, and the first analyzing array 13 includes more
Micro- polarizing film in a different polarization direction, micro- polarizing film ordered arrangement, avoids the non-coherent addition of two interference fringes；Described first
CCD camera 14 extracts the interference fringe pattern of corresponding first wave length, and the interference fringe of corresponding second wave length
Pattern；
The sensitive chip of second CCD camera 22 is equipped with the second analyzing array 21, and the second analyzing array 21 includes more
Micro- polarizing film in a different polarization direction, micro- polarizing film ordered arrangement, avoids the non-coherent addition of two interference fringes；Described second
CCD camera 22 extracts the interference fringe pattern of corresponding first wave length, and the interference fringe of corresponding second wave length
Pattern.
First CCD camera 14 extracts the interference fringe pattern of corresponding first wave length, and corresponding second wave
Long interference fringe pattern；With second space optical modulator 19 to the amplitude of light beam, phase and polarization in second channel
State synchronizes modulation, and the second CCD camera 22 extracts the interference fringe pattern of corresponding first wave length, and corresponding the
The interference fringe pattern of two wavelength.To realize two channel dual wavelengths under white light, synchronous interference, 4 obtained width are dry off axis
Relate to stripe.
The computer is connected with the first 4f system, the 2nd 4f system respectively, and interference fringe pattern passes through the first 4f system
In the first CCD camera 14 and the 2nd 4f system in the second CCD camera 22 acquisition display on computers, by computer into
Row pattern handles to obtain the three-dimensional configuration of sample.
Embodiment 2
The imaging method of binary channels dual wavelength phase micro imaging system under a kind of Non-orthogonal basis set according to embodiment 1,
The following steps are included:
White light sorting: the light beam that the light source 1 issues is formed by 2f mirror 2, limiting aperture diaphragm 3, beam-expanding collimation mirror 4
The non-orthogonal collimated light beam of two beams；
Nonopiate parallel Optical Sampling: the non-orthogonal collimated light beam of two beams is irradiated on the sample of sample platform 5, two light beams
Sample image field information is carried by object lens 6, respectively enters first passage and second channel；
Dual wavelength diffraction light splitting modulation and imaging acquisition: into the light beam of first passage, the first diaphragm 7 and the are passed sequentially through
One collimating mirror 8 after changing into collimated light beam again after beam-expanding collimation, generates diffraction by the first grating 9, and the first grating 9 is by light beam
It is separated into multi-level diffraction light, multi-level diffraction light includes the light wave zero order light of first wave length and the light wave of first order light, second wave length
Zero order light and first order light；Multi-level diffraction light is irradiated after the first fourier lense 10 to the first spatial light modulator 11；Institute
It states the first spatial light modulator 11 to be filtered multi-level diffraction light, selects the light wave zero order light and the first order of first wave length
The light wave zero order light of first wave length and second wave length is modulated into and water by light, the light wave zero order light of second wave length and first order light
It square is polarized at 45 degree, by the light wave first order light modulation of first wave length at vertical polarization, by the light wave first of second wave length
Grade light modulation is at horizontal polarization, and using zero order light as reference light, first order light is sample light；Reference light and sample light pass through second Fu
In leaf lens 12, interfere and in the first CCD camera 14 generate spatial modulation interference fringe pattern；In second channel
Process is identical as the process in first passage, and the interference fringe pattern of spatial modulation is generated in the second CCD camera 22；
Interferogram Analysis: the first CCD camera 14 and the second CCD camera 22 collect interference fringe pattern, are transferred to calculating
Machine carries out pattern processing.
Although not each embodiment only includes an independence it should be appreciated that the present invention describes according to various embodiments
Technical solution, only for clarity, those skilled in the art should be using specification as one for this narrating mode of specification
A entirety, the technical solutions in the various embodiments may also be suitably combined, formed it will be appreciated by those skilled in the art that other
Embodiment.
A series of detailed descriptions of those listed above are only illustrating for possible embodiments of the present invention, are not used
It is all to should be included in without departing from equivalent embodiment made by technical spirit of the present invention or change to limit the scope of the invention
Within protection scope of the present invention.
Claims (7)
1. the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set, which is characterized in that including light source (1), 2f mirror
(2), limiting aperture diaphragm (3), beam-expanding collimation mirror (4), sample platform (5), object lens (6), first passage, second channel and calculating
Machine；The light source (1), 2f mirror (2), limiting aperture diaphragm (3), beam-expanding collimation mirror (4), sample platform (5), object lens (6) are successively
It places, and center is all in same optical axis；
The first passage and second channel are placed side by side, the first passage include the first diaphragm (7), the first collimating mirror (8),
First grating (9) and the first 4f system；The second channel includes the second diaphragm (15), the second collimating mirror (16), the second grating
(17) and the 2nd 4f system；
The light beam that the light source (1) issues is divided into two bundles after (4) by 2f mirror (2), limiting aperture diaphragm (3), beam-expanding collimation mirror
Non-orthogonal collimated light beam, the nonopiate collimated light beam of two beams are successively distinguished by sample platform (5) and after passing through object lens (6) simultaneously
Into first passage and second channel；Light beam into first passage passes sequentially through the first diaphragm (7), the first collimating mirror (8), warp
It crosses the first grating (9) and generates diffraction, the light beam of diffraction passes through the first 4f system micro-imaging；Into second channel light beam successively
By the second diaphragm (15), the second collimating mirror (16), diffraction is generated by the second grating (17), the light beam of diffraction passes through the 2nd 4f
System micro-imaging；
The first 4f system obtains under zero order light and first order optical interferometric fringe pattern sample and second wave length under first wave length
Zero order light and first order optical interferometric fringe pattern sample；The 2nd 4f system obtains zero order light and first order light under first wave length
Zero order light and first order optical interferometric fringe pattern sample under interference fringe pattern and second wave length；
The computer is connected with the first 4f system, the 2nd 4f system respectively.
2. the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set according to claim 1, which is characterized in that
The light source (1) is white light source, and what the white light source issued is Low coherence spatial light.
3. the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set according to claim 1, which is characterized in that
The first 4f system includes the first fourier lense (10), the first spatial light modulator (11), the second fourier lense (12)
With the first CCD camera (14), the first fourier lense (10), the first spatial light modulator (11), the second fourier lense (12)
Center with the first CCD camera (14) is all in same optical axis；
The 2nd 4f system includes third fourier lense (18), second space optical modulator (19), the 4th fourier lense
(20) and the second CCD camera (22), third fourier lense (18), second space optical modulator (19), the 4th fourier lense
(20) and the center of the second CCD camera (22) is all in same optical axis.
4. the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set according to claim 1, which is characterized in that
The sample platform (5) is transparent material.
5. the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set according to claim 3, which is characterized in that
First spatial light modulator (11) is filtered multi-level diffraction light, selects the zero order light and the first order under first wave length
Zero order light and first order light under light, second wave length, the zero level light wave of first wave length and second wave length is modulated into and level side
It is polarized at 45 degree, by the first order Light Modulation of first wave length at vertical polarization, by the first order Light Modulation of second wave length
At horizontal polarization, using zero order light as reference light, first order light is sample light；
The second space optical modulator (19) is identical as the first spatial light modulator (11) structure.
6. the binary channels dual wavelength phase micro imaging system under Non-orthogonal basis set according to claim 3, which is characterized in that
First CCD camera (14) is equipped with the first analyzing array (13), and the first analyzing array (13) includes multiple and different polarization sides
To micro- polarizing film, micro- polarizing film ordered arrangement；First CCD camera (14) extracts the interference of corresponding first wave length light wave
Stripe, and the interference fringe pattern of corresponding second wave length light wave；
The second analyzing array (21) is integrated on the sensitive chip of second CCD camera (22), the second CCD camera (22) is extracted
The interference fringe pattern of first wave length light wave, and the interference fringe pattern of corresponding second wave length light wave are corresponded to out.
7. a kind of binary channels dual wavelength phase micro-imaging using under Non-orthogonal basis set described in any one of claim 1-6
The micro imaging method of system, which comprises the following steps:
White light sorting: the light beam that the light source (1) issues passes through 2f mirror (2), limiting aperture diaphragm (3) and beam-expanding collimation mirror (4),
Form the non-orthogonal collimated light beam of two beams；
Nonopiate parallel Optical Sampling: the non-orthogonal collimated light beam of two beams is irradiated on the sample of sample platform (5), and two light beams are taken
Carry sample image field information respectively enters first passage and second channel by object lens (6)；
Dual wavelength diffraction light splitting modulation and imaging acquisition: into the light beam of first passage, the first diaphragm (7) and first are passed sequentially through
Collimating mirror (8) after changing into collimated light beam again after beam-expanding collimation, generates diffraction by the first grating (9), the first grating (9) will
Light beam is separated into multi-level diffraction light, and multi-level diffraction light is irradiated after the first fourier lense (10) to the first space light modulation
Device (11)；First spatial light modulator (11) is filtered multi-level diffraction light, select zero order light under first wave length and
Zero order light and first order light under first order light, second wave length, by the zero level light wave of first wave length and second wave length be modulated into
Horizontal direction is polarized at 45 degree, by the first order Light Modulation of first wave length at vertical polarization, by the first order light of second wave length
Wave is modulated into horizontal polarization, and using zero order light as reference light, first order light is sample light；Reference light and sample light pass through in second Fu
Leaf lens (12) interfere and generate on the first CCD camera (14) the interference fringe pattern of spatial modulation；In second channel
Process it is identical as the process in first passage, in the second CCD camera (22) generate spatial modulation interference fringe pattern；
Interferogram Analysis: the first CCD camera (14) and the second CCD camera (22) collect interference fringe pattern, are transferred to calculating
Machine carries out pattern processing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910275036.3A CN110109240B (en) | 2019-04-08 | 2019-04-08 | Dual-channel dual-wavelength phase microscopic imaging system and method under non-orthogonal basis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910275036.3A CN110109240B (en) | 2019-04-08 | 2019-04-08 | Dual-channel dual-wavelength phase microscopic imaging system and method under non-orthogonal basis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110109240A true CN110109240A (en) | 2019-08-09 |
| CN110109240B CN110109240B (en) | 2021-07-20 |
Family
ID=67485164
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910275036.3A Active CN110109240B (en) | 2019-04-08 | 2019-04-08 | Dual-channel dual-wavelength phase microscopic imaging system and method under non-orthogonal basis |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110109240B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110031481A (en) * | 2019-05-05 | 2019-07-19 | 苏州天准科技股份有限公司 | A kind of square wave configuration optical illumination implementation method based on polarization |
| CN110824688A (en) * | 2019-10-12 | 2020-02-21 | 江苏大学 | Rapid reconstruction method for biological cell subsurface morphology based on phase imaging |
| CN110955039A (en) * | 2019-11-15 | 2020-04-03 | 上海安翰医疗技术有限公司 | Phase contrast microscopic imaging system and imaging method thereof |
| CN112444501A (en) * | 2019-08-30 | 2021-03-05 | 香港中文大学 | Portable quantitative phase microscope for material metrology and biological imaging |
| WO2023116582A1 (en) * | 2021-12-20 | 2023-06-29 | 中国科学院深圳先进技术研究院 | X-ray phase quantitative imaging technology and measurement method |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020176076A1 (en) * | 1999-07-28 | 2002-11-28 | Ahmed Bouzid | Laser scanning fluorescence microscopy with compensation for spatial dispersion of fast laser pulses |
| CN2751299Y (en) * | 2004-09-29 | 2006-01-11 | 中国科学院上海光学精密机械研究所 | Femtosecond holographic apparatus with ultrafast high-resolution containing dispersion element |
| US8184298B2 (en) * | 2008-05-21 | 2012-05-22 | The Board Of Trustees Of The University Of Illinois | Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization |
| CN102954757A (en) * | 2012-10-30 | 2013-03-06 | 哈尔滨工程大学 | Microscopic interference detecting device based on synchronous carrier phase shift and detecting method of microscopic interference detecting device |
| US8837045B2 (en) * | 2012-09-21 | 2014-09-16 | The Board Of Trustees Of The University Of Illinois | Diffraction phase microscopy with white light |
| CN104089573A (en) * | 2014-07-03 | 2014-10-08 | 佛山市南海区欧谱曼迪科技有限责任公司 | Multi-channel white light common-channel interference microscopic chromatography system |
| KR101563810B1 (en) * | 2014-06-25 | 2015-10-28 | 한국과학기술원 | Common-path 3-dimension diffraction light microscopy and method for measuring deformabilty of sample |
| CN105068232A (en) * | 2015-08-31 | 2015-11-18 | 福建师范大学 | Dual-channel structure lighting super resolution imaging method and device |
| CN106442413A (en) * | 2016-09-29 | 2017-02-22 | 江苏大学 | Two-beam non-orthogonal phase microscopic instant imaging system and method |
-
2019
- 2019-04-08 CN CN201910275036.3A patent/CN110109240B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020176076A1 (en) * | 1999-07-28 | 2002-11-28 | Ahmed Bouzid | Laser scanning fluorescence microscopy with compensation for spatial dispersion of fast laser pulses |
| CN2751299Y (en) * | 2004-09-29 | 2006-01-11 | 中国科学院上海光学精密机械研究所 | Femtosecond holographic apparatus with ultrafast high-resolution containing dispersion element |
| US8184298B2 (en) * | 2008-05-21 | 2012-05-22 | The Board Of Trustees Of The University Of Illinois | Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization |
| US8837045B2 (en) * | 2012-09-21 | 2014-09-16 | The Board Of Trustees Of The University Of Illinois | Diffraction phase microscopy with white light |
| CN102954757A (en) * | 2012-10-30 | 2013-03-06 | 哈尔滨工程大学 | Microscopic interference detecting device based on synchronous carrier phase shift and detecting method of microscopic interference detecting device |
| KR101563810B1 (en) * | 2014-06-25 | 2015-10-28 | 한국과학기술원 | Common-path 3-dimension diffraction light microscopy and method for measuring deformabilty of sample |
| CN104089573A (en) * | 2014-07-03 | 2014-10-08 | 佛山市南海区欧谱曼迪科技有限责任公司 | Multi-channel white light common-channel interference microscopic chromatography system |
| CN105068232A (en) * | 2015-08-31 | 2015-11-18 | 福建师范大学 | Dual-channel structure lighting super resolution imaging method and device |
| CN106442413A (en) * | 2016-09-29 | 2017-02-22 | 江苏大学 | Two-beam non-orthogonal phase microscopic instant imaging system and method |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110031481A (en) * | 2019-05-05 | 2019-07-19 | 苏州天准科技股份有限公司 | A kind of square wave configuration optical illumination implementation method based on polarization |
| CN112444501A (en) * | 2019-08-30 | 2021-03-05 | 香港中文大学 | Portable quantitative phase microscope for material metrology and biological imaging |
| CN112444501B (en) * | 2019-08-30 | 2023-08-25 | 香港中文大学 | Portable quantitative phase microscope for material metering and bioimaging |
| CN110824688A (en) * | 2019-10-12 | 2020-02-21 | 江苏大学 | Rapid reconstruction method for biological cell subsurface morphology based on phase imaging |
| CN110955039A (en) * | 2019-11-15 | 2020-04-03 | 上海安翰医疗技术有限公司 | Phase contrast microscopic imaging system and imaging method thereof |
| CN110955039B (en) * | 2019-11-15 | 2022-10-14 | 上海安翰医疗技术有限公司 | Phase contrast microscopic imaging system and imaging method thereof |
| WO2023116582A1 (en) * | 2021-12-20 | 2023-06-29 | 中国科学院深圳先进技术研究院 | X-ray phase quantitative imaging technology and measurement method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110109240B (en) | 2021-07-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110109240A (en) | Binary channels dual wavelength phase micro imaging system and method under Non-orthogonal basis set | |
| EP3065001B1 (en) | Holographic microscope and data processing method for high-resolution hologram image | |
| US11644791B2 (en) | Holographic imaging device and data processing method therefor | |
| EP3102982B1 (en) | Digital holographic device | |
| EP2010885B1 (en) | Method and apparatus to measure and compute the amplitude point spread function and associated parameters of a coherent optical imaging system | |
| Huang et al. | High bandwidth‐utilization digital holographic multiplexing: an approach using Kramers–Kronig relations | |
| CN107356196B (en) | Three wavelength carrier frequency are multiplexed railway digital holographic detection device and method altogether | |
| CN104089573B (en) | Multichannel white light common path interference micro tomography system based on crossed polarized light | |
| TWI797377B (en) | Surface shape measuring device and surface shape measuring method | |
| US20190187612A1 (en) | Ellipsometry Device and Ellipsometry Method | |
| CN111273534B (en) | Dual-wavelength digital holographic microscopic imaging method and device | |
| EP3627093B1 (en) | Apparatus for parallel fourier domain optical coherence tomography imaging and imaging method using parallel fourier domain optical coherence tomography | |
| US8508746B2 (en) | Interferometric systems having reflective chambers and related methods | |
| Singh et al. | Speckle-free common-path quantitative phase imaging with high temporal phase stability using a partially spatially coherent multi-spectral light source | |
| JP5109025B2 (en) | Phase object identification apparatus and method | |
| CN114111625A (en) | Optical imaging system and method | |
| KR20180113690A (en) | Method for imaging target object within media which bring about simultaneously scattering and aberration | |
| CN102539381B (en) | Refractive index chromatography device based on micro-off-axis microscopic interference projection | |
| CN102878930A (en) | Phase object phase distribution quantitative measurement method and device as well as application of method and device | |
| CN203929011U (en) | Hyperchannel white light common path interference micro tomography system based on crossed polarized light | |
| Mirsky et al. | Dynamic three-wavelength imaging and volumetry of flowing cells with doubled field of view by six-pack holography | |
| Joglekar et al. | Compact, low cost, large field-of-view self-referencing digital holographic interference microscope | |
| CN114324245A (en) | Quantitative phase microscope device and method based on partially coherent structured light illumination | |
| JP2022162306A (en) | Surface shape measurement device and surface shape measurement method | |
| Marquet et al. | Digital holographic microscopy: a new imaging technique to quantitatively explore cell dynamics with nanometer sensitivity |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |