CN110095088B - Method and device for detecting surface topography characteristics of curved surface splicing area based on grating identification - Google Patents
Method and device for detecting surface topography characteristics of curved surface splicing area based on grating identification Download PDFInfo
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- CN110095088B CN110095088B CN201910397291.5A CN201910397291A CN110095088B CN 110095088 B CN110095088 B CN 110095088B CN 201910397291 A CN201910397291 A CN 201910397291A CN 110095088 B CN110095088 B CN 110095088B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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Abstract
The invention discloses a method and a device for detecting surface topography characteristics of a curved surface splicing area based on grating identification, which comprises a shell and a projection light source arranged at the bottom end of the shell, and is characterized in that: the top end of the shell is fixedly connected with the base, the top end of the base is connected with the measuring head handle in an embedded mode, the bottom end of the base is fixedly connected with the lens, and the interior of the shell is fixedly connected with the grating detection device through the screw hole. The detection device is reasonable in design, can detect the surface appearance of the curved surface splicing area, and can place a workpiece to be detected into the spectroscope through the detachable shell; the grating detection device inside the shell, the embedded wireless signal generation device and the optical sensor can convert the image detected by the grating into an electric signal and transmit the electric signal to a computer by utilizing a wavelet transform theory; the amplitude condition of the surface morphology can be analyzed by the computer by utilizing the depth of the light spot; the images collected by the grating can be processed by a wavelet method, and the high-frequency and low-frequency conditions are analyzed.
Description
Technical Field
The invention relates to the field of optics and the technical field of numerical control machining on-machine measurement, in particular to a method and a device for detecting surface topography characteristics of a curved surface splicing area based on grating identification.
Background
In the prior art, the accurate measurement and evaluation of an unknown spliced curved surface with non-rotation and asymmetric characteristics are difficult, most of the surface type measurement of the spliced curved surface after processing is carried out by adopting a blue light digital three-dimensional scanner or a three-coordinate measuring machine and other contact measuring instruments, the former two measuring methods are accurate, but the process of moving and re-clamping a workpiece generates a positioning error and prolongs the measuring period because a processed part needs to be removed from a processing machine tool to the measuring instrument, so that the measuring process becomes complicated, the contact measuring method not only has requirements on the workpiece material and the workpiece steepness degree, but also needs to carry out corresponding error compensation and measuring head compensation on the measured value.
With the rapid development of aerospace, shipbuilding, automobile and mould industries, the application of the spliced curved surface becomes wider and wider, and meanwhile, the requirements on high-efficiency and high-precision measurement and evaluation are higher and higher, so that the measurement and evaluation of the smoothness (roughness) degree of the curved surface have important significance.
Disclosure of Invention
The invention mainly aims to provide a method and a device for detecting surface topography of a curved splicing area based on grating identification, which can effectively solve the problems in the background technology.
In order to achieve the purpose, the invention adopts the technical scheme that:
the surface appearance characteristic detection method and device of the curved surface splicing area based on grating identification comprise a shell and a projection light source arranged at the bottom end of the shell, wherein the top end of the shell is fixedly connected with a base, a measuring head handle is embedded and connected at the top end of the base, a lens is fixedly connected at the bottom end of the base, and a grating detection device is fixedly connected inside the shell through a screw hole;
the grating detection device comprises a grating detection device, a wireless signal generation device, a light sensor, a rotating shaft, a clamping seat, a spectroscope, a small wave generator, an adjusting knob and an opening, wherein the wireless signal generation device and the light sensor are respectively embedded at two sides of the grating detection device, a groove is arranged in the middle of the surface of the grating detection device in a penetrating mode from top to bottom, a cavity is formed in the middle of the grating detection device, the bottom end of the grating detection device is rotatably connected with the rotating shaft, one end of the rotating shaft is fixedly connected with the clamping seat, the spectroscope formed by a large number of parallel slits with equal width and equal spacing is embedded in the clamping seat;
the grating detection device comprises a fixed support, a detection mechanism, a signal collection device and an adjusting mechanism;
the fixing bracket comprises a wavelet generator and a screw hole; the detection mechanism comprises a spectroscope, a groove and a cavity; the signal collecting device comprises a wireless signal generating device and a light sensor; the adjusting mechanism comprises an adjusting knob and a rotating shaft.
Further, the grating detection device is integrated on the detachable tool holder, and the wireless signal generation device is used for collecting signals and then wirelessly transmitting the signals to the computer.
Furthermore, a curved surface splicing workpiece to be detected is placed below the spectroscope, and the workpiece is placed on a machine tool, so that the light transmittance is facilitated.
Further, the rotating shaft is used for adjusting the angle of the spectroscope.
Furthermore, the shell is of a spherical structure, the shell is made of metal, and the inner wall of the shell is a rough surface.
Further, the projection light source is an annular LED light source.
Further, the spectroscope is detachable through the rotating shaft.
The method and the device for detecting the surface topography of the curved surface splicing area based on grating identification comprise the following steps:
s1 detection method based on grating projection method
A light beam of a projection light source after passing through a beam expander projects a sinusoidal grating onto a reference plane, the light beam is processed by an equidistant monitor to be parallel light, and stripes projected onto the reference plane are equidistant, namely the stripes have a fixed space period, and the structure diagram of the system structure is shown in FIG. 2;
the light intensity distribution on the reference plane can be set as:
I(x,y)＝a(x,y)+b(x,y)cos2πfx
where I (x, y) represents the intensity distribution on the reference plane, a (x, y) represents the background intensity distribution, b (x, y) represents the amplitude of the fringe intensity variation, f 1/p represents the fundamental frequency of the projection grating, p is the number of pixels occupied by the fringe width on the image monitor, and 2 pi fx represents the phase distribution of the optical wavefront (the grating projection fringe is artificially made perpendicular to the horizontal direction, so the vertical cos term has no y-component).
The sinusoidal grating is projected on the surface of any object, and the light intensity distribution on the surface of the object is as follows:
I1(x,y)＝a1(x,y)+b1(x,y)cos[2πfx+Ф(x,y)]
where I1(x, y) denotes the light intensity distribution on the object surface, a1(x, y) denotes the background light intensity distribution, b1(x, y) is the amplitude of the fringe light intensity variation, and Φ (x, y) is the phase modulation caused by the object height distribution h (x, y). In the actual measurement of the telecentric projection light path, I > > h (x, y), the relationship between the height distribution of the surface of the measured object and the modulation phase is as follows:
Ф(x,y)≈2πfdlh(x,y)
the corresponding graph is 5, and the amplitude conditions of the surface topography before and after the splicing seam can be analyzed through the depth of the light spot.
S2 detection of surface topography of curved splice based on wavelet method
And processing the image acquired by the grating by using a wavelet transform method, and analyzing the high-frequency and low-frequency conditions.
The decomposition and reconstruction process of the wavelet transform decomposition filter system is shown in fig. 6, wherein y (k) is the discrete input signal, s (k) is the discrete reconstruction signal, and the Z transform of y (k) and s (k) is y (Z) s (Z); h0(Z) H1(Z) is the Z transform of the decomposed low-pass filter H0(k) and the decomposed high-pass filter H1(k), respectively, G0(Z) G1(Z) is the Z transform of the reconstructed low-pass filter G0(k) and the reconstructed high-pass filter G1(k), respectively.
The system function of the two-channel filter bank is:
according to the perfect reconstruction condition (PR condition), there are
H0(-z)G0(z)+H1(-z)G1(z)＝0
Namely:
the low pass filtered output is:
the transmission characteristics of the low-pass filter are obtained as follows:
through the related wavelet transform processing, the surface topography of the workpiece can be obtained, as shown in fig. 7.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention has reasonable design and convenient use, can realize the detection of the surface appearance of the curved surface splicing area, has integration, combines the original components such as the grating and the like with on-machine measurement, and can detect the surface appearance characteristic of the workpiece curved surface splicing area on-machine;
2. wireless transmission of signals can be realized through a grating detection device arranged in the shell, an embedded wireless signal generation device and a wireless signal receiving device arranged in the computer;
3. the grating detection device is arranged on the detachable tool holder, so that sampling points can be captured more accurately and conveniently, meanwhile, due to the design of the LED lamp ring, the detected shadow can be effectively reduced, and the error in the aspect of data acquisition is reduced;
4. based on the wavelet packet theory, noise reduction processing can be carried out on the image detected by the grating, and meanwhile, according to the depth of the detected light spot, three-dimensional analysis is carried out on the surface appearance of the workpiece splicing seam based on the time-frequency domain analysis theory;
5. the time-frequency analysis can be carried out on the surface appearance image of the workpiece splicing seam region acquired by the grating based on the continuous wavelet transform method, and the time-frequency domain signal mutation caused by vibration impact in processing is found;
6. the invention has the characteristics of light weight and small structure, and because a series of original parts are integrated, the internal structure is meticulous, the invention introduces the use of external original parts, saves the detection space and lightens the load of the main shaft on the whole.
Drawings
FIG. 1 is a schematic view of the overall internal structure of the present invention;
FIG. 2 is a diagram of the structure of the grating detection device of the present invention;
FIG. 3 is a schematic diagram of the overall system of the present invention;
FIG. 4 is a block diagram of a grating system of the present invention;
FIG. 5 is a schematic view of an image acquired by a grating of the present invention;
FIG. 6 is a diagram illustrating the decomposition and reconstruction process of the wavelet transform decomposition filter system according to the present invention;
FIG. 7 is a schematic diagram of the workpiece profile measured by the detecting device of the present invention;
FIG. 8 is a flow chart of the work of the workpiece of the present invention.
In the figure: 1. a base; 2. adjusting a knob; 3. a detection device; 4. a wireless signal generating device; 5. a card holder; 6. a head measuring handle; 7. a lens; 8. a housing; 9. a light sensor; 10. a rotating shaft; 11. a beam splitter; 12. a wavelet generator; 13. an opening; 14. a cavity 15, a groove; 16. a projection light source; 17. screw holes.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the invention easy to understand, the invention is further described with the specific embodiments.
As shown in fig. 1-8, the method and device for detecting surface topography characteristics of a curved splicing region based on grating identification comprise a housing 8 and a projection light source 16 arranged at the bottom end of the housing 8, wherein the top end of the housing 8 is fixedly connected with a base 1, a measuring head handle 6 is embedded at the top end of the base 1, a lens 7 is fixedly connected at the bottom end of the base 1, and a grating detection device 3 is fixedly connected inside the housing 8 through a screw hole 17;
a wireless signal generating device 4 and a light sensor 9 are respectively embedded in two sides of the grating detection device 3, a groove 15 penetrates through the middle of the surface of the grating detection device 3 from top to bottom, a cavity 14 is formed in the middle of the grating detection device 3, a rotating shaft 10 is rotatably connected to the bottom end of the grating detection device 3, a clamping seat 5 is fixedly connected to one end of the rotating shaft 10, a large number of beam splitters 11 formed by parallel slits with equal width and equal spacing are embedded in the clamping seat 5, a small wave generator 12 is fixedly connected to the bottom end of the light sensor 9, an adjusting knob 2 is arranged at the top end of the grating detection device 3, and an opening 13 is formed in one side of the outer surface of the shell 8;
the grating detection device 3 comprises a fixed support, a detection mechanism, a signal collection device and an adjusting mechanism;
the fixing bracket comprises a wavelet generator 12 and a screw hole 17; the detection mechanism comprises a spectroscope 11, a groove 15 and a cavity 14; the signal collecting device comprises a wireless signal generating device 4 and a light sensor 9; the adjustment mechanism includes an adjustment knob 2 and a rotation shaft 10.
Wherein, the grating detection device 3 is integrated on the detachable tool holder, and the wireless signal generation device 4 is used for collecting signals and then wirelessly transmitting the signals to a computer.
Wherein, the curved surface concatenation work piece that awaits measuring is placed to spectroscope 11 below, and the work piece is placed on the lathe, the light transmissivity of being convenient for.
Wherein, the rotating shaft 10 is used for adjusting the angle of the spectroscope 11.
The housing 8 is of a spherical structure, the housing 8 is made of metal, and the inner wall of the housing 8 is a rough surface.
Wherein, the projection light source 16 is an annular LED light source.
Wherein, the spectroscope 11 is a detachable structure through the rotating shaft 10.
The method and the device for detecting the surface topography of the curved surface splicing area based on grating identification comprise the following steps:
s1 detection method based on grating projection method
The light beam of the projection light source after passing through the beam expander projects the sinusoidal grating onto the reference plane, the light beam is parallel light after being processed by the equidistant monitor, and the stripes projected onto the reference plane are equidistant, namely the stripes have a fixed spatial period.
The light intensity distribution on the reference plane can be set as:
I(x,y)＝a(x,y)+b(x,y)cos2πfx
where I (x, y) represents the intensity distribution on the reference plane, a (x, y) represents the background intensity distribution, b (x, y) represents the amplitude of the fringe intensity variation, f 1/p represents the fundamental frequency of the projection grating, p is the number of pixels occupied by the fringe width on the image monitor, and 2 pi fx represents the phase distribution of the optical wavefront (the grating projection fringe is artificially made perpendicular to the horizontal direction, so the vertical cos term has no y-component).
The sinusoidal grating is projected on the surface of any object, and the light intensity distribution on the surface of the object is as follows:
I1(x,y)＝a1(x,y)+b1(x,y)cos[2πfx+Ф(x,y)]
where I1(x, y) denotes the light intensity distribution on the object surface, a1(x, y) denotes the background light intensity distribution, b1(x, y) is the amplitude of the fringe light intensity variation, and Φ (x, y) is the phase modulation caused by the object height distribution h (x, y). In the actual measurement of the telecentric projection light path, I > > h (x, y), the relationship between the height distribution of the surface of the measured object and the modulation phase is as follows:
Ф(x,y)≈2πfdlh(x,y)
the amplitude conditions of the surface appearance before and after splicing and seaming can be analyzed through the depth of the light spots.
S2 detection of surface topography of curved splice based on wavelet method
And processing the image acquired by the grating by using a wavelet transform method, and analyzing the high-frequency and low-frequency conditions.
The decomposition and reconstruction process of the wavelet transform decomposition filter system is shown in fig. 6, wherein y (k) is the discrete input signal, s (k) is the discrete reconstruction signal, and the Z transform of y (k) and s (k) is y (Z) s (Z); h0(Z) H1(Z) is the Z transform of the decomposed low-pass filter H0(k) and the decomposed high-pass filter H1(k), respectively, G0(Z) G1(Z) is the Z transform of the reconstructed low-pass filter G0(k) and the reconstructed high-pass filter G1(k), respectively.
The system function of the two-channel filter bank is:
according to the perfect reconstruction condition (PR condition), there are
H0(-z)G0(z)+H1(-z)G1(z)＝0
Namely:
the low pass filtered output is:
obtaining a low-pass filterThe transmission characteristics of (a) are:
and the surface appearance graph of the workpiece can be obtained through related wavelet transform processing.
The invention relates to a method and a device for detecting the surface appearance characteristics of a curved splicing area based on grating identification, which can realize the detection of the surface appearance of the curved splicing area, and a workpiece to be detected can be placed into a spectroscope through a detachable shell; the grating detection device inside the shell, the embedded wireless signal generation device and the optical sensor can convert the image detected by the grating into an electric signal and transmit the electric signal to a computer by utilizing a wavelet transform theory; the amplitude condition of the surface morphology can be analyzed by the computer by utilizing the depth of the light spot; the image collected by the grating can be processed by a wavelet method, the high-frequency and low-frequency conditions are analyzed, and meanwhile, a workpiece to be detected is placed on a machine tool, so that the light transmittance is facilitated.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (8)
1. Surface splicing area surface topography feature detection device based on grating discernment, including shell (8) and projection light source (16) of setting in shell (8) bottom, its characterized in that: the top end of the shell (8) is fixedly connected with the base (1), the top end of the base (1) is embedded with the head measuring handle (6), the bottom end of the base (1) is fixedly connected with the lens (7), and the interior of the shell (8) is fixedly connected with the grating detection device (3) through a screw hole (17);
the grating detection device comprises a grating detection device (3), a wireless signal generation device (4) and a light sensor (9) are respectively embedded at two sides of the grating detection device (3), a groove (15) penetrates through the middle part of the surface of the grating detection device (3) from top to bottom, a cavity (14) is formed in the middle of the grating detection device (3), a rotating shaft (10) is rotatably connected to the bottom end of the grating detection device (3), a clamping seat (5) is fixedly connected to one end of the rotating shaft (10), a large number of beam splitters (11) formed by parallel slits with equal width and equal spacing are embedded in the clamping seat (5), a small wave generator (12) is fixedly connected to the bottom end of the light sensor (9), an adjusting knob (2) is arranged at the top end of the grating detection device (3), and an opening (13) is formed in;
the grating detection device (3) comprises a fixed support, a detection mechanism, a signal collection device and an adjusting mechanism;
the fixing bracket comprises a wavelet generator (12) and a screw hole (17); the detection mechanism comprises a spectroscope (11), a groove (15) and a cavity (14); the signal collecting device comprises a wireless signal generating device (4) and a light sensor (9); the adjusting mechanism comprises an adjusting knob (2) and a rotating shaft (10).
2. The device for detecting the surface topography of the curved splicing region based on the grating discrimination as claimed in claim 1, wherein: the grating detection device (3) is integrated on the detachable tool holder, and the wireless signal generation device (4) is used for collecting signals and then wirelessly transmitting the signals to a computer.
3. The device for detecting the surface topography of the curved splicing region based on the grating discrimination as claimed in claim 1, wherein: curved surface concatenation work piece that awaits measuring is placed to spectroscope (11) below, and the work piece is placed on the lathe, the light transmissivity of being convenient for.
4. The device for detecting the surface topography of the curved splicing region based on the grating discrimination as claimed in claim 1, wherein: the rotating shaft (10) is used for adjusting the angle of the spectroscope (11).
5. The device for detecting the surface topography of the curved splicing region based on the grating discrimination as claimed in claim 1, wherein: the shell (8) is of a spherical structure, the shell (8) is made of metal, and the inner wall of the shell (8) is a rough surface.
6. The device for detecting the surface topography of the curved splicing region based on the grating discrimination as claimed in claim 1, wherein: the projection light source (16) is an annular LED lamp source.
7. The device for detecting the surface topography of the curved splicing region based on the grating discrimination as claimed in claim 1, wherein: the spectroscope (11) is of a detachable structure through the rotating shaft (10).
8. The detection method of the surface topography feature detection device of the curved surface splicing region based on the grating discrimination as claimed in claim 1, characterized in that: the method comprises the following steps:
s1: the detection method based on the grating projection method comprises the steps that a light beam of a projection light source after passing through a beam expander projects a sinusoidal grating onto a reference plane, the light beam is parallel light after being processed by an equidistant monitor, and stripes projected onto the reference plane are equidistant, namely the stripes have a fixed space period; projecting the sinusoidal grating onto the surface of any object by using the light intensity distribution condition on the reference plane, so as to obtain the light intensity distribution on the surface of the object; the amplitude conditions of the surface appearance before and after the splicing seam can be analyzed through the feedback light spot depth;
s2: detection of surface appearance characteristics of curved surface splicing piece based on wavelet method
Processing the image collected by the grating by using a wavelet transform method, and analyzing the high-frequency and low-frequency conditions;
the wavelet transform decomposition filter system is used for decomposing and reconstructing processes, and y (k) is a discrete input characteristic signal, s (k) is a discrete reconstruction characteristic signal, and the Z transforms of y (k) and s (k) are respectively Y (Z) and S (Z); h0(z) and H1(z) respectively represent a low-pass filter and a high-pass filter based on wavelet transformation, and a low-pass characteristic signal H0(k) and a high-pass characteristic signal H1(k) after filtering respectively pass through a low-pass reconstruction filter G0(z) and a high-pass reconstruction filter G1(z), so as to obtain a reconstructed discrete characteristic signal s (k); and decomposing and filtering the surface morphology characteristic signals based on wavelet transformation to obtain the surface morphology graph of the workpiece after noise removal and singular value selection.
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