CN110031494A - It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device - Google Patents

It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device Download PDF

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Publication number
CN110031494A
CN110031494A CN201910412940.4A CN201910412940A CN110031494A CN 110031494 A CN110031494 A CN 110031494A CN 201910412940 A CN201910412940 A CN 201910412940A CN 110031494 A CN110031494 A CN 110031494A
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China
Prior art keywords
sample
twilight sunset
fluorescence
timer
fluorescence lifetime
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CN201910412940.4A
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Chinese (zh)
Inventor
王殳凹
陈兰花
王亚星
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Suzhou University
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Suzhou University
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Priority to CN201910412940.4A priority Critical patent/CN110031494A/en
Priority to PCT/CN2019/089406 priority patent/WO2020232741A1/en
Publication of CN110031494A publication Critical patent/CN110031494A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention discloses it is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, the device includes sample stage, X-ray source, the first optical filter, photon counter, timer, spectroscope, computer, sample stage, X-ray source and the first optical filter are set in camera bellows, when the photoluminescence spectrum intensity of test sample, sample is connect by optical fiber with spectroscope, spectroscope and X-ray source with calculating mechatronics;When the twilight sunset of test sample, sample is connect by optical fiber with photon counter, photon counter and X-ray source are electrically connected with timer, timer and calculating mechatronics, when the fluorescence lifetime of test sample, the first optical filter is set between sample and photon counter, and the first optical filter is connect by optical fiber with photon counter, photon counter and X-ray source are electrically connected with timer, timer and calculating mechatronics.The present invention has both the function of the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime.

Description

It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device
Technical field
The present invention relates to it is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device.
Background technique
X-ray scintillation body is a kind of process for absorbing energy after x-ray bombardment and convert energy to low energy scintillation light, Such material is X-ray scintillation body.As radiation-sensitive medium due to its this characteristic, it is usually used in nuclear physics experiment, environment In the fields such as monitoring, nuclear industry monitoring and medical image.Scintillator material is generally divided into guest ions activation scintillator and lives certainly Change scintillator.Self-activation scintillator, which has intrinsic flashing ability as ray scintillator, can be improved the performance of scintillator.It wants Whether whether distinguishing is self-activation X-ray scintillation body, can identical by comparing the fluorescence spectrum excited under different rays.It assesses The X-ray scintillation performance of material, must photoluminescence spectrum intensity of the characterization material under the excitation of the X-ray of different capacity, twilight sunset it is strong The fluorescence lifetime of degree and material.
After so-called twilight sunset refers to that excitation stops, the duration of material emission.Make light source with X-ray currently on the market Instrument measure and monitor the growth of standing timber material twilight sunset there are three types of, the first is the Suppression of afterglow of radiation detecting apparatus company, the U.S. In Cs (Tl) by cooping with Eu2+-I:Experimental, this patent only describe the component of instrument, and to length Wave scintillation material measurement sensitivity is relatively low;It is for second a kind of GY-I type crystal twilight sunset test of Beijing the First Research Institute of Ministry of Public Security Instrument, but the instrument controlling light source exposure device turns off formula using shutter, there is very big human error;The third is main It is-the material of short persistence in test, is the dress of the test scintillation material twilight sunset of Shanghai Silicate Inst., Chinese Academy of Sciences's report It sets.But this device can not adjust the power of continuous X-rays light source, and the time recorded can not start with light source or close holding together Step.
So-called fluorescence lifetime refer to when excite stop after, when 1/e of fluorescence-intensity decay to initial strength, is required Between.Temporary useless x-ray source does the fluorescence lifetime that excitation light source carrys out test material in patent at present.
Therefore need to develop it is a kind of can simultaneously the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device.
Summary of the invention
In view of the deficiencies of the prior art, it is an object of that present invention to provide a kind of structurally reasonable, can test material simultaneously it is glimmering The device of light spectrum, twilight sunset and fluorescence lifetime.It is adopted the following technical scheme that
It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device comprising sample stage, X-ray source, First optical filter, photon counter, timer, spectroscope, computer, the sample stage, X-ray source and the first optical filter are set In in camera bellows, the sample stage is set to above sample stage for placing sample to be tested, the X-ray source;
When the photoluminescence spectrum intensity of test sample, sample is connect by optical fiber with the spectroscope, the spectroscope and X Ray source with calculate mechatronics;
When the twilight sunset of test sample, sample is connect by optical fiber with the photon counter, the photon counter and X Ray source is electrically connected with timer, the timer and calculating mechatronics;
When the fluorescence lifetime of test sample, first optical filter is set between sample and photon counter, and described the One optical filter is connect by optical fiber with the photon counter, and the photon counter and X-ray source are electrically connected with timer It connects, the timer and calculating mechatronics.
It as a further improvement of the present invention, further include the second optical filter, second optical filter is set in the camera bellows, When the fluorescence lifetime of test sample, second optical filter is set between X-ray source and sample stage.
It as a further improvement of the present invention, further include bracket, the branch is set up in the camera bellows, and the sample stage is set In on the bracket.
As a further improvement of the present invention, the bracket is height-adjustable.
As a further improvement of the present invention, the X-ray source is set to the surface of sample stage.
As a further improvement of the present invention, the X-ray source is continuous X-rays light source or pulsed X-ray light source.
As a further improvement of the present invention, when the photoluminescence spectrum intensity of test sample or twilight sunset, optical fiber passes through conduction Glue and sample bond.
As a further improvement of the present invention, the timer is HUB-A timer.
Beneficial effects of the present invention:
It is of the invention can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime apparatus structure it is simple, it is easy to operate, it is simultaneous Have the function of the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime, greatly reduces testing cost.
The above description is only an overview of the technical scheme of the present invention, in order to better understand the technical means of the present invention, And it can be implemented in accordance with the contents of the specification, and in order to allow above and other objects, features and advantages of the invention can It is clearer and more comprehensible, it is special below to lift preferred embodiment, and cooperate attached drawing, detailed description are as follows.
Detailed description of the invention
Fig. 1 be in the embodiment of the present invention can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime the structure of device show It is intended to one;
Fig. 2 be in the embodiment of the present invention can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime the structure of device show It is intended to two;
Fig. 3 be in the embodiment of the present invention can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime the structure of device show It is intended to three.
Description of symbols: 1, camera bellows;2, X-ray source;3, bracket;4, the first optical filter;5, sample stage;6, sample;7, light It is fine;8, the second optical filter;9, photon counter;10, timer;11, computer;12, spectroscope.
Specific embodiment
The present invention will be further explained below with reference to the attached drawings and specific examples, so that those skilled in the art can be with It more fully understands the present invention and can be practiced, but illustrated embodiment is not as a limitation of the invention.
As shown in Figure 1-3, in the embodiment of the present invention can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime dress It sets, which includes sample stage 5, X-ray source 2, the first optical filter 4, photon counter 9, timer 10, computer 11, divides Light instrument 12, sample stage 5, X-ray source 2 and the first optical filter 4 are set in camera bellows 1, and sample stage 5 is for placing sample to be tested 6, X Ray source 2 is set to 5 top of sample stage.
When the photoluminescence spectrum intensity of test sample, as shown in Figure 1, sample 6 is connect by optical fiber 7 with spectroscope 12, point Light instrument 12 and X-ray source 2 are electrically connected with computer 11.Computer 11 is opened and closed for controlling X-ray source 2, with And the power of X-ray source 2 is adjusted, and the fluorescence spectrum being recorded under the X-ray source 2 of different capacity.Optical fiber 7 collects sample The number of photons for the fluorescence that product 6 issue, spectroscope 12 will be collected into number of photons and be converted into spectrum analysis, and be generated by computer 11 Wavelength and photoluminescence spectrum intensity figure.
When the twilight sunset of test sample, as shown in Fig. 2, sample 6 is connect by optical fiber 7 with photon counter 9, photon counting Device 9 and X-ray source 2 are electrically connected with timer 10, and timer 10 is electrically connected with computer 11.Computer 11 is for controlling X Ray source 2, timer 10 and photon counter 9, photon counter 9 is used to identify and the number of photons in cooling water of units of measurement time, To detect discrete faint light pulse signal power.Timer 10 is opened for recording X-ray source 2, is closed, optical fiber 7 starts It receives photon and stops receiving the time of photon, stop the luminous time by measuring to close from X-ray source 2 to sample 6.I.e. Measure the twilight sunset of sample 6.
When the fluorescence lifetime of test sample, as shown in figure 3, the first optical filter 4 be set to sample 6 and photon counter 9 it Between, the first optical filter 4 is connect by optical fiber 7 with photon counter 9, photon counter 9 and X-ray source 2 with timer 10 Electrical connection, timer 10 are electrically connected with computer 11.First optical filter 4 emits light for selecting extent of fluorescence and excluding sample 6 In scattering light.Optical fiber 7 and photon counter 9, which record X-ray source 2, closes to the stopping of sample 6 and shines the light of this section of process Subnumber, timer 10 be used for record X-ray source 2 open, close, optical fiber 7 start receive photon and stop receive photon when Between.Thus the fluorescence lifetime of sample 6 can be measured.
In another embodiment of the invention, when the fluorescence lifetime of test sample, which further includes the second optical filter 8, the second optical filter 8 is set in camera bellows 1, and the second optical filter is set between X-ray source 2 and sample stage 5.Second optical filter 8 is used In the emitted luminescence intensity of limitation X-ray source 2.
In the present embodiment, which further includes bracket 3, and bracket 3 is set in camera bellows 1, bracket 3 it is height-adjustable.Sample Sample platform 5, the first optical filter 4 are set on bracket 3.
Preferably, X-ray source 2 is set to the surface of sample stage 5, it is ensured that sample 6 can obtain maximum irradiation.
In the present embodiment, X-ray source 2 is continuous X-rays light source or pulsed X-ray light source.
In the present embodiment, when the photoluminescence spectrum intensity of test sample 6 or twilight sunset, optical fiber 7 passes through conducting resinl and sample 6 Bonding.
In the present embodiment, timer 10 is HUB-A timer.
It is of the invention can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime apparatus structure it is simple, it is easy to operate, it is simultaneous Have the function of the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime, greatly reduces testing cost.
Above embodiments are only to absolutely prove preferred embodiment that is of the invention and being lifted, and protection scope of the present invention is not It is limited to this.Those skilled in the art's made equivalent substitute or transformation on the basis of the present invention, in guarantor of the invention Within the scope of shield.Protection scope of the present invention is subject to claims.

Claims (8)

1. one kind can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that penetrated including sample stage, X Linear light source, the first optical filter, photon counter, timer, spectroscope, computer, the sample stage, X-ray source and first Optical filter is set in camera bellows, and the sample stage is set to above sample stage for placing sample to be tested, the X-ray source;
When the photoluminescence spectrum intensity of test sample, sample is connect by optical fiber with the spectroscope, the spectroscope and X-ray Light source with calculate mechatronics;
When the twilight sunset of test sample, sample is connect by optical fiber with the photon counter, the photon counter and X-ray Light source is electrically connected with timer, the timer and calculating mechatronics;
When the fluorescence lifetime of test sample, first optical filter is set between sample and photon counter, first filter Mating plate is connect by optical fiber with the photon counter, and the photon counter and X-ray source are electrically connected with timer, institute It states timer and calculates mechatronics.
2. as described in claim 1 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that It further include the second optical filter, second optical filter is set in the camera bellows, when the fluorescence lifetime of test sample, described second Optical filter is set between X-ray source and sample stage.
3. as described in claim 1 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that It further include bracket, the branch is set up in the camera bellows, and the sample stage is set on the bracket.
4. as claimed in claim 3 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that The bracket it is height-adjustable.
5. as described in claim 1 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that The X-ray source is set to the surface of sample stage.
6. as described in claim 1 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that The X-ray source is continuous X-rays light source or pulsed X-ray light source.
7. as described in claim 1 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that When the photoluminescence spectrum intensity of test sample or when twilight sunset, optical fiber is bonded by conducting resinl and sample.
8. as described in claim 1 can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device, which is characterized in that The timer is HUB-A timer.
CN201910412940.4A 2019-05-17 2019-05-17 It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device Pending CN110031494A (en)

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CN201910412940.4A CN110031494A (en) 2019-05-17 2019-05-17 It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device
PCT/CN2019/089406 WO2020232741A1 (en) 2019-05-17 2019-05-31 Device capable of testing fluorescence spectrum, afterglow and fluorescence lifetime of material

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CN201910412940.4A CN110031494A (en) 2019-05-17 2019-05-17 It is a kind of can the fluorescence spectrum of test material, twilight sunset and fluorescence lifetime device

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Cited By (1)

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