CN109979520A - Chip functions automated testing method, device and computer equipment - Google Patents
Chip functions automated testing method, device and computer equipment Download PDFInfo
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- CN109979520A CN109979520A CN201910233133.6A CN201910233133A CN109979520A CN 109979520 A CN109979520 A CN 109979520A CN 201910233133 A CN201910233133 A CN 201910233133A CN 109979520 A CN109979520 A CN 109979520A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
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Abstract
This application involves a kind of chip functions automated testing method, device, computer equipment and storage mediums, wherein this method comprises: obtaining the request of chip functions automatic test；The chip is powered on according to chip functions automatic test request and is arranged to boot starting；In the chip boot, by using the mode load test program of Uart/PCIE；It runs the test program to test chip, obtains corresponding test result；Test result is saved by script, and test result is carried out to automatically analyze generation test report.The present invention realizes the test of test program and the analysis of test report by way of automation, make entire chip test process all should not be artificial participation improve efficiency to realize full-automatic chip functions test, save human resources.
Description
Technical field
The present invention relates to solid state hard disk technical field, more particularly to a kind of chip functions automated testing method, device,
Computer equipment and storage medium.
Background technique
Currently, with the development of solid state hard disk technology, it is higher and higher for the testing efficiency requirement of chip, specifically,
It when chip is tested, needs to test chip using a variety of test programs, to generate complete chip testing report.
In the conventional technology, traditional chip testing mostly uses artificial adapter tube chip such as to use JTAG, load test program
And the mode of manual analysis test result.This test mode very relies on manual operation and manual analysis, is especially different
In the switching of test program and the analysis of test report.In entire test process, replacement test program carries out test result
Analysis requires artificial participation, this is also the key step for consuming human resources, this all can cause testing efficiency not high, to people
Power resource has great waste.
Summary of the invention
Based on this, it is necessary in view of the above technical problems, provide a kind of chip functions that chip testing efficiency can be improved
Automated testing method, device, computer equipment and storage medium.
A kind of chip functions automated testing method, which comprises
Obtain the request of chip functions automatic test；
The chip is powered on according to chip functions automatic test request and is arranged to boot starting；
In the chip boot, by using the mode load test program of Uart/PCIE；
It runs the test program to test chip, obtains corresponding test result；
Test result is saved by script, and test result is carried out to automatically analyze generation test report.
Test result is saved by script described in one of the embodiments, and test result is divided automatically
Analysis generated after the step of test report further include:
Judge whether all test programs have all been completed；
It tests and not yet completes if it exists, Run Script control program makes chip reenter boot downloading mode, and replacement is surveyed
Examination program carries out test until all test programs have all been completed；
Entire test result is sent if all test programs have all been completed.
The chip is powered on according to chip functions automatic test request described in one of the embodiments,
And before the step of being arranged to boot starting further include:
According to the corresponding test program of test request described in the chip functions automatic test request, and described
Corresponding Script controlling instruction is added in test program.
The operation test program tests chip in one of the embodiments, obtains corresponding test
As a result the step of further include:
Control instruction is sent by script to control the operation of the test program.
A kind of chip functions automatic test device, the chip functions automatic test device include:
Module is obtained, the acquisition module is for obtaining the request of chip functions automatic test；
Starting module, the starting module are used to power on the chip according to chip functions automatic test request
And it is arranged to boot starting；
Program loading module, described program loading module is used in the chip boot, by using Uart/PCIE's
Mode load test program；
Test module, the test module test chip for running the test program, obtain corresponding survey
Test result；
Analysis module, the analysis module is used to save test result by script, and is divided automatically test result
Analysis generates test report.
The chip functions automatic test device in one of the embodiments, further include:
Judgment module, the judgment module is for judging whether all test programs have all been completed；
Module is re-downloaded, the module that re-downloads not yet is completed for testing if it exists, and Run Script control program makes core
Piece reenters boot downloading mode, and replacement test program carries out test until all test programs have all been completed；
Sending module, the sending module if all test programs have all been completed for sending entire test knot
Fruit.
The chip functions automatic test device in one of the embodiments, further include:
Script loading module, the script loading module are used for according to chip functions automatic test request institute
The corresponding test program of test request is stated, and corresponding Script controlling instruction is added in the test program.
The test module is also used in one of the embodiments:
Control instruction is sent by script to control the operation of the test program.
A kind of computer equipment can be run on a memory and on a processor including memory, processor and storage
The step of computer program, the processor realizes above-mentioned any one method when executing the computer program.
A kind of computer readable storage medium, is stored thereon with computer program, and the computer program is held by processor
The step of above-mentioned any one method is realized when row.
Said chip method for automatically testing functions, device, computer equipment and storage medium, by obtaining chip functions
Automatic test request；The chip is powered on according to chip functions automatic test request and is arranged to boot starting；
In the chip boot, by using the mode load test program of Uart/PCIE；Run the test program to chip into
Row test, obtains corresponding test result；Test result is saved by script, and test result is carried out to automatically analyze generation survey
Examination report.The present invention realizes the test of test program and the analysis of test report by way of automation, makes entire chip
Test process all should not be artificial participation improved efficiency to realize full-automatic chip functions test, save manpower money
Source.
Detailed description of the invention
Fig. 1 is the flow diagram of chip testing in traditional technology；
Fig. 2 is the flow diagram of chip method for automatically testing functions in one embodiment；
Fig. 3 is the flow diagram of chip method for automatically testing functions in another embodiment；
Fig. 4 is the flow diagram of chip method for automatically testing functions in further embodiment；
Fig. 5 is the flow diagram of the chip testing automated in one embodiment；
Fig. 6 is the flow diagram of detailed chip automatic test in one embodiment；
Fig. 7 is the structural block diagram of chip Function Test Automation device in one embodiment；
Fig. 8 is the structural block diagram of chip Function Test Automation device in another embodiment；
Fig. 9 is the structural block diagram of chip Function Test Automation device in further embodiment；
Figure 10 is the internal structure chart of computer equipment in one embodiment.
Specific embodiment
It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, and
It is not used in restriction the application.
The test of chip, traditional method require the participation of staff in entire test process, including load is surveyed
Examination program is simultaneously run, and artificial carries out analysis test report etc..
As shown in Figure 1, being traditional chip testing process, key step has load operating test program, generation and analyzes
Test report, and a whole set of testing process of a chip needs continuous replacement test program to repeat above-mentioned testing procedure.?
In entire test process, replacement test program carries out analysis to test result and requires artificial participation, this is also consumption manpower
The key step of resource, this makes inefficient, has great waste to human resources.
The invention proposes a kind of modes of automation to realize the replacement of test program and the analysis of test report, make whole
The test process of a chip all should not be artificial participation improve efficiency, save to realize full-automatic chip functions test
Human resources.
In one embodiment, as shown in Fig. 2, providing a kind of chip functions automated testing method, this method comprises:
Step 202, the request of chip functions automatic test is obtained；
Step 204, chip is powered on according to the request of chip functions automatic test and is arranged to boot starting；
Step 206, in chip boot, by using the mode load test program of Uart/PCIE；
Step 208, operation test program tests chip, obtains corresponding test result；
Step 210, test result is saved by script, and test result is carried out to automatically analyze generation test report.
Specifically, in conjunction with reference to automation chip testing process shown in fig. 5.It is surveyed firstly, obtaining chip functions automation
Examination request may include the information such as the project kind of test in the request.Then, according to the particular content in the request to correspondence
Chip to be measured powered on and be arranged to boot starting.Meanwhile in chip boot, loaded using the mode of Uart/PCIE
Test program；Control instruction, control test program operation are sent using script later；Then test result is saved using script,
And test result is carried out to automatically analyze generation test report.It is understood that after having carried out a test content, also
Script controlling chip can then be used, re-start boot load new test program tested until test complete；Most
Test report is sent to tester by way of mail afterwards, so that tester can efficiently understand chip in time
Comprehensive test case.
In the present embodiment, by obtaining the request of chip functions automatic test；It is asked according to chip functions automatic test
It asks and boot starting is powered on and be arranged to chip；In chip boot, by using the mode load test journey of Uart/PCIE
Sequence；Operation test program tests chip, obtains corresponding test result；Test result is saved by script, and to survey
Test result carries out automatically analyzing generation test report.The present embodiment realized by way of automation test program test and
The analysis of test report, make entire chip test process all should not be artificial participation, to realize full-automatic chip function
It can test, improve efficiency, save human resources.
In one embodiment, as shown in figure 3, providing a kind of chip functions automated testing method, this method is logical
It crosses script and saves test result, and after automatically analyze the step of generating test report to test result further include:
Step 302, judge whether all test programs have all been completed；
Step 304, it tests and not yet completes if it exists, Run Script control program makes chip reenter boot downloading mould
Formula, replacement test program carries out test until all test programs have all been completed；
Step 306, entire test result is sent if all test programs have all been completed.
Specifically, firstly, there are many kinds of test programs in actual test process, including each functional module, it is whole
Function, the test of performance etc. when load, are loaded using the boot mode of UART/PCIE.Secondly, replacement test program is automatically
An important link in chip automatic test course can make chip boot again by instruction, and guidance is reloaded.Most
Afterwards, is generated by test report, is sent out by way of email, is conducive to allow for the test result analysis of generation using script
Tester efficiently understands chip testing situation in time.
In the present embodiment, it is this script in such a way that code combines, realize the test of whole-course automation with point
Analysis, is greatly saved human resources, improves testing efficiency.
In one embodiment, as shown in figure 4, providing a kind of chip functions automated testing method, this method comprises:
Step 402, the request of chip functions automatic test is obtained；
Step 404, it according to the corresponding test program of chip functions automatic test request test request, and is testing
Corresponding Script controlling instruction is added in program；
Step 406, chip is powered on according to the request of chip functions automatic test and is arranged to boot starting；
Step 408, in chip boot, by using the mode load test program of Uart/PCIE；
Step 410, operation test program tests chip, obtains corresponding test result；
Step 412, test result is saved by script, and test result is carried out to automatically analyze generation test report.
In one embodiment, a kind of chip functions automated testing method is provided, runs test program in this method
The step of chip is tested, corresponding test result is obtained further include: control instruction is sent to control test by script
The operation of program.
Specifically, include: in conjunction with the process of the automatic test with reference to entire chip shown in fig. 6
Step 1, early-stage preparations: corresponding Script controlling instruction is added in test program.
Step 2, chip power on, and are arranged to boot starting.
Step 3, using script, test program is downloaded by way of uart/pcie.
Step 4, operation test program, generate test result.
Step 5, script automatically analyze test result and generate report.
Step 6 judges whether entire test process terminates, if test does not complete, Run Script controls program, makes chip weight
Newly enter BOOT downloading mode, replacement test program is tested, and step 3-5 is repeated；If test is completed, terminate to test, send out
Send entire test result to staff.
In the present embodiment, the replacement of test program and the analysis of test report are realized by way of automation, are made
The entirely participation that the test process of chip all should not be artificial is improved efficiency, is saved to realize full-automatic chip functions test
About human resources.
It should be understood that although each step in the flow chart of Fig. 2-6 is successively shown according to the instruction of arrow,
These steps are not that the inevitable sequence according to arrow instruction successively executes.Unless expressly stating otherwise herein, these steps
Execution there is no stringent sequences to limit, these steps can execute in other order.Moreover, at least one in Fig. 2-6
Part steps may include that perhaps these sub-steps of multiple stages or stage are not necessarily in synchronization to multiple sub-steps
Completion is executed, but can be executed at different times, the execution sequence in these sub-steps or stage is also not necessarily successively
It carries out, but can be at least part of the sub-step or stage of other steps or other steps in turn or alternately
It executes.
In one embodiment, as shown in fig. 7, providing a kind of chip functions automatic test device 700, comprising:
Module 701 is obtained, for obtaining the request of chip functions automatic test；
Starting module 702, for being powered on according to the request of chip functions automatic test to chip and being arranged to boot starting；
Program loading module 703 is used in chip boot, by using the mode load test program of Uart/PCIE；
Test module 704 tests chip for running test program, obtains corresponding test result；
Analysis module 705 for saving test result by script, and carries out test result to automatically analyze generation test
Report.
In one embodiment, as shown in figure 8, providing a kind of chip functions automatic test device 700, the device is also
Include:
Judgment module 706, for judging whether all test programs have all been completed；
Module 707 is re-downloaded, is not yet completed for testing if it exists, Run Script control program reenters chip
Boot downloading mode, replacement test program carries out test until all test programs have all been completed；
Sending module 708, for sending entire test result if all test programs have all been completed.
In one embodiment, as shown in figure 9, providing a kind of chip functions automatic test device 700, the device is also
Include:
Script loading module 709, for corresponding according to the chip functions automatic test request test request
Test program, and corresponding Script controlling instruction is added in test program.
In one embodiment, test module 704 is also used to:
Control instruction is sent by script to control the operation of test program.
Specific restriction about chip functions automatic test device may refer to automate above for chip functions
The restriction of test method, details are not described herein.
In one embodiment, a kind of computer equipment is provided, internal structure chart can be as shown in Figure 10.The calculating
Machine equipment includes processor, memory and the network interface connected by system bus.Wherein, the processing of the computer equipment
Device is for providing calculating and control ability.The memory of the computer equipment includes non-volatile memory medium, built-in storage.It should
Non-volatile memory medium is stored with operating system, computer program and database.The built-in storage is non-volatile memories Jie
The operation of operating system and computer program in matter provides environment.The network interface of the computer equipment is used for and external end
End passes through network connection communication.To realize a kind of chip functions automatic test side when the computer program is executed by processor
Method.
It will be understood by those skilled in the art that structure shown in Figure 10, only part relevant to application scheme
The block diagram of structure, does not constitute the restriction for the computer equipment being applied thereon to application scheme, and specific computer is set
Standby may include perhaps combining certain components or with different component layouts than more or fewer components as shown in the figure.
In one embodiment, a kind of computer equipment is provided, including memory, processor and storage are on a memory
And the computer program that can be run on a processor, processor are realized when executing computer program in above each embodiment of the method
The step of.
In one embodiment, a kind of computer readable storage medium is provided, computer program is stored thereon with, is calculated
The step in above each embodiment of the method is realized when machine program is executed by processor.
Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with
Relevant hardware is instructed to complete by computer program, the computer program can be stored in a non-volatile computer
In read/write memory medium, the computer program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein,
To any reference of memory, storage, database or other media used in each embodiment provided herein,
Including non-volatile and/or volatile memory.Nonvolatile memory may include read-only memory (ROM), programming ROM
(PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include
Random access memory (RAM) or external cache.By way of illustration and not limitation, RAM is available in many forms,
Such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhancing
Type SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM) etc..
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment
In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance
Shield all should be considered as described in this specification.
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the concept of this application, various modifications and improvements can be made, these belong to the protection of the application
Range.Therefore, the scope of protection shall be subject to the appended claims for the application patent.
Claims (10)
1. a kind of chip functions automated testing method, which comprises
Obtain the request of chip functions automatic test；
The chip is powered on according to chip functions automatic test request and is arranged to boot starting；
In the chip boot, by using the mode load test program of Uart/PCIE；
It runs the test program to test chip, obtains corresponding test result；
Test result is saved by script, and test result is carried out to automatically analyze generation test report.
2. chip functions automated testing method according to claim 1, which is characterized in that saved described by script
Test result, and after automatically analyze the step of generating test report to test result further include:
Judge whether all test programs have all been completed；
It tests and not yet completes if it exists, Run Script control program makes chip reenter boot downloading mode, replacement test journey
Sequence carries out test until all test programs have all been completed；
Entire test result is sent if all test programs have all been completed.
3. chip functions automated testing method according to claim 1 or 2, which is characterized in that described according to
Before the step of request of chip functions automatic test powers on the chip and is arranged to boot starting further include:
According to the corresponding test program of test request described in the chip functions automatic test request, and in the test
Corresponding Script controlling instruction is added in program.
4. chip functions automated testing method according to claim 3, which is characterized in that the operation test journey
The step of ordered pair chip is tested, obtains corresponding test result further include:
Control instruction is sent by script to control the operation of the test program.
5. a kind of chip functions automatic test device, which is characterized in that the chip functions automatic test device includes:
Module is obtained, the acquisition module is for obtaining the request of chip functions automatic test；
Starting module, the starting module are used to that the chip to be powered on and be set according to chip functions automatic test request
It is set to boot starting；
Program loading module, described program loading module is used in the chip boot, by using the mode of Uart/PCIE
Load test program；
Test module, the test module test chip for running the test program, obtain corresponding test knot
Fruit；
Analysis module, the analysis module is used to save test result by script, and carries out automatically analyzing life to test result
At test report.
6. chip functions automatic test device according to claim 5, which is characterized in that the chip functions automation
Test device further include:
Judgment module, the judgment module is for judging whether all test programs have all been completed；
Module is re-downloaded, the module that re-downloads not yet is completed for testing if it exists, and Run Script control program makes chip weight
Newly enter boot downloading mode, replacement test program carries out test until all test programs have all been completed；
Sending module, the sending module is for sending entire test result if all test programs have all been completed.
7. chip functions automatic test device according to claim 5 or 6, which is characterized in that the chip functions are certainly
Dynamicization test device further include:
Script loading module, the script loading module are used to survey according to the chip functions automatic test request
Corresponding test program is requested in examination, and corresponding Script controlling instruction is added in the test program.
8. chip functions automatic test device according to claim 7, which is characterized in that the test module is also used
In:
Control instruction is sent by script to control the operation of the test program.
9. a kind of computer equipment including memory, processor and stores the meter that can be run on a memory and on a processor
Calculation machine program, which is characterized in that the processor realizes any one of claims 1 to 4 institute when executing the computer program
The step of stating method.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of Claims 1-4 is realized when being executed by processor.
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| CN201910233133.6A CN109979520A (en) | 2019-03-26 | 2019-03-26 | Chip functions automated testing method, device and computer equipment |
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| CN201910233133.6A CN109979520A (en) | 2019-03-26 | 2019-03-26 | Chip functions automated testing method, device and computer equipment |
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| CN111596203A (en) * | 2020-05-29 | 2020-08-28 | 大连卓志创芯科技有限公司 | Chip testing device, platform and method |
| CN112596961A (en) * | 2020-12-01 | 2021-04-02 | 上海航天控制技术研究所 | Automatic testing method and system for satellite-borne computer |
| CN112858876A (en) * | 2021-01-04 | 2021-05-28 | 北京智芯微电子科技有限公司 | Self-adaptive chip automatic testing method |
| CN113049939A (en) * | 2019-12-27 | 2021-06-29 | 中移物联网有限公司 | Chip aging self-testing method and system |
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Application publication date: 20190705 |