CN109974596B - Linear displacement measuring device - Google Patents

Linear displacement measuring device Download PDF

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CN109974596B
CN109974596B CN201910349564.9A CN201910349564A CN109974596B CN 109974596 B CN109974596 B CN 109974596B CN 201910349564 A CN201910349564 A CN 201910349564A CN 109974596 B CN109974596 B CN 109974596B
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imaging
light
light generating
section
displacement
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CN109974596A (en
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王子忠
王晗
张平
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Guangdong University of Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Abstract

The invention discloses a linear displacement measuring device, which comprises a light generating part, an imaging part and a data processing part, wherein the light generating part is used for emitting linear structure light to the imaging part, the imaging part is used for receiving the linear structure light and imaging the linear structure light, and the data processing part is used for calculating the displacement between the light generating part and the imaging part according to linear structure light images formed by the imaging part before and after the displacement is generated between the light generating part and the imaging part. The linear displacement measuring device of the invention can ensure the measuring precision by imaging the linear structure light and measuring the displacement according to the line structure image change before and after the displacement, can avoid the defects of complex linear etching process, harsh production condition and higher manufacturing cost of the grating ruler compared with the prior art, and also avoids the defect of poor anti-interference capability of the magnetic grating ruler on the field magnetic signal.

Description

Linear displacement measuring device
Technical Field
The invention relates to the technical field of machine vision application, in particular to a linear displacement measuring device.
Background
In the field of equipment manufacturing, a commonly used linear displacement sensor is a grating ruler and a magnetic grating ruler, the principle of the grating ruler is that a grating code channel is engraved on a moving ruler of the grating ruler, the code channel on the moving ruler is used for distinguishing linear displacement, the code channel is divided into an absolute code channel and an incremental code channel, the absolute code channel is lines engraved on the moving ruler according to an absolute coding method, and the line pattern at each position is absolutely unique; the incremental grating scale is a scale in which uniform lines are engraved on a moving scale, and incremental displacement from a reference zero point is finely read by counting moire fringes. The magnetic grid ruler is characterized in that magnetic poles are arranged in a magnetic strip according to a specific rule according to an electromagnetic induction principle to generate magnetic signals of the specific rule, an alternating magnetic field related to displacement is converted into an alternating electric signal, and displacement measurement data are obtained according to the obtained alternating electric signal.
However, the code tracks on the moving scale and the fixed scale of the grating scale are composed of transparent lines and opaque lines with the same width as the transparent lines, once the lines are covered by dust or dipped in oil, the measurement performance of the lines can be seriously influenced, the etching process of the lines is complex, and the production conditions are harsh, so that the cost for manufacturing the grating scale is higher. And compared with a grating ruler, the magnetic grating ruler has low measurement precision, is easily interfered by magnetic signals in an industrial field, and has poor anti-interference capability on the magnetic signals.
Disclosure of Invention
In view of the above, the present invention provides a linear displacement measuring device, which can avoid the disadvantages of complex manufacturing process, harsh production conditions, and high manufacturing cost of a grating ruler, and also avoid the disadvantage of poor anti-interference capability of a magnetic grating ruler on a field magnetic signal, while ensuring the measurement accuracy.
In order to achieve the purpose, the invention provides the following technical scheme:
a linear displacement measuring device includes a light generating portion for emitting a linear structured light to the imaging portion, an imaging portion for receiving the linear structured light to image the linear structured light, and a data processing portion for calculating a displacement amount between the light generating portion and the imaging portion from linear structured light images formed by the imaging portion before and after the displacement between the light generating portion and the imaging portion.
Preferably, the data processing section is specifically configured to calculate a displacement amount between the light generating section and the imaging section according to the following formula:
ΔL=L-L0=k(l-l0);
wherein Δ L represents the displacement amount between the light generating section and the imaging section, L represents the distance between the light generating section and the imaging section after the displacement, L represents the length of the line structure light reflected by the line structure light image formed by the imaging section after the displacement, and L represents the length of the line structure light reflected by the line structure light image formed by the imaging section after the displacement0Indicates the distance between the light generating section and the image forming section before displacement occurs,/0And k represents a preset parameter, wherein k represents the linear structure light length reflected by the linear structure light image formed by the imaging part before displacement occurs.
Preferably, the method for obtaining the preset parameter k includes:
setting the distance between the light generating part and the imaging part to be a first preset value, and recording the light length of the line structure reflected by the line structure light image formed by the imaging part at the position;
moving the light generating part or the imaging part, setting the distance between the light generating part and the imaging part to be a second preset value, and recording the light length of the line structure reflected by the line structure light image formed by the imaging part at the position;
the preset parameter k is calculated according to the following formula:
Figure BDA0002043401680000021
wherein L is1Indicates a first preset value, L2Indicates a second preset value,/1Indicating the light length of the line structure measured by the imaging part when the distance between the light generating part and the imaging part is a first preset value,/2And the light length of the line structure measured by the imaging part when the distance between the light generating part and the imaging part is a second preset value.
Preferably, the light generating section and the imaging section are provided on a guide rail, and are movable along the guide rail.
Preferably, the light generating part is provided with a base and is mounted on the guide rail through the base, and the imaging part is provided with a base and is mounted on the guide rail through the base.
Preferably, the light generating part includes a laser, and the imaging part includes an image sensor.
According to the above technical solution, the linear displacement measuring device provided by the present invention includes a light generating portion, an imaging portion and a data processing portion, wherein the light generating portion is configured to emit line structure light to the imaging portion, the imaging portion is configured to receive the line structure light and image the line structure light, and the data processing portion is configured to calculate a displacement amount between the light generating portion and the imaging portion according to line structure light images formed by the imaging portion before and after the displacement occurs between the light generating portion and the imaging portion. The linear displacement measuring device can ensure the measuring precision by imaging the linear structure light and measuring the displacement according to the line structure image change before and after the displacement, can avoid the defects of complex manufacturing process, harsh production conditions and higher manufacturing cost of the grating ruler compared with the prior art, and also avoids the defect of poor anti-interference capability of the magnetic grating ruler on the field magnetic signal.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic view of a linear displacement measuring device according to an embodiment of the present invention;
fig. 2 is a flowchart of a method for obtaining the preset parameter k according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The linear displacement measuring device provided by the embodiment of the invention comprises a light generating part, an imaging part and a data processing part, wherein the light generating part is used for emitting linear structure light to the imaging part, the imaging part is used for receiving the linear structure light and imaging the linear structure light, and the data processing part is used for calculating the displacement between the light generating part and the imaging part according to linear structure light images formed by the imaging part before and after the displacement between the light generating part and the imaging part.
The linear light is the light with linear beam cross section, the length of the cross section of the linear light projected by the light generating part is constant in the measuring process, and the projected linear light has a divergence angle which is constant in the measuring process.
Before and after the light generating part and the imaging part are displaced, the imaging part respectively images the line structure light projected by the light generating part, and the data processing part calculates the displacement between the light generating part and the imaging part according to the line structure light images obtained twice by the imaging part.
Therefore, the linear displacement measuring device of the embodiment can ensure the measurement accuracy by imaging the linear structured light and measuring the displacement according to the line structure image change before and after the displacement, and compared with the prior art, the linear displacement measuring device can avoid the defects of complex manufacturing process, harsh production conditions and higher manufacturing cost of the grating ruler, and also avoid the defect of poor anti-interference capability of the magnetic grating ruler on the field magnetic signal.
The present linear displacement measuring device will be described in detail with reference to the accompanying drawings and specific embodiments. Referring to fig. 1, fig. 1 is a schematic diagram of a linear displacement measuring device according to the present embodiment, and it can be seen from the diagram that the linear displacement measuring device includes a light generating portion 10, an imaging portion 11 and a data processing portion.
The light generating unit 10 is used to emit line-structured light to the imaging unit 11, and a laser may be preferably used as the light generating unit 10. The imaging unit 11 is configured to receive the line structured light and image the line structured light to obtain a line structured light image. Alternatively, the imaging section 11 may employ an image sensor.
The data processing unit is configured to calculate a displacement amount between the light generating unit 10 and the imaging unit 11 based on the line structured light image formed by the imaging unit 11 before and after the displacement between the light generating unit 10 and the imaging unit 11. When the linear displacement measuring device is used for measuring displacement, the light generating part 10 or the imaging part 11 of the device can be connected with a measured object in a relatively static manner, when the measured object moves, the light generating part 10 or the imaging part 11 is driven to move, so that the light generating part 10 and the imaging part 11 are relatively displaced, and the measured displacement between the light generating part and the imaging part is the displacement of the measured object.
Specifically, the data processing section is specifically configured to calculate the amount of displacement between the light generating section and the imaging section according to the following formula:
ΔL=L-L0=k(l-l0);
wherein Δ L represents a displacement amount between the light generating part and the imaging part, and L represents a displacement amount between the light generating part and the imaging partL represents the linear structure light length reflected by the linear structure light image formed by the imaging section after the displacement occurs, L0Indicates the distance between the light generating section and the image forming section before displacement occurs,/0And k represents a preset parameter, wherein k represents the linear structure light length reflected by the linear structure light image formed by the imaging part before displacement occurs. In practical applications, the light generating part or the imaging part may be set to be at a zero point position before the displacement occurs, for example, the light generating part and the imaging part may be set to be at a position with a small distance therebetween as the zero point position, and the light generating part and the imaging part may be set to be at a measurement position after the relative displacement occurs.
More specifically, referring to fig. 2, the method for obtaining the preset parameter k includes the following steps:
s20: and setting the distance between the light generating part and the imaging part to be a first preset value, and recording the light length of the line structure reflected by the line structure light image formed by the imaging part at the position.
Illustratively, the light generating section 10 and the imaging section 11 may be disposed at a zero point position with a specific distance L therebetween1In practice, the distance L between the light generating part 10 and the imaging part 11 at the current position can be measured by using a precision instrument1And recording the length l of the line structure light measured at the distance according to the line structure light image formed by the imaging part1
S21: and moving the light generating part or the imaging part, setting the distance between the light generating part and the imaging part to be a second preset value, and recording the light length of the line structure reflected by the line structure light image formed by the imaging part at the position.
The light generating part 10 or the imaging part 11 is moved to a position where the distance therebetween is long, and the distance L between the light generating part 10 and the imaging part 11 at the current position is measured by a precision instrument2And recording the length l of the line structure light measured at the distance according to the line structure light image formed by the imaging part2
S22: the preset parameter k is calculated according to the following formula:
Figure BDA0002043401680000051
wherein L is1Indicates a first preset value, L2Indicates a second preset value,/1Indicating the light length of the line structure measured by the imaging part when the distance between the light generating part and the imaging part is a first preset value,/2And the light length of the line structure measured by the imaging part when the distance between the light generating part and the imaging part is a second preset value.
Optionally, in this embodiment, the light generating portion 10 and the imaging portion 11 may be disposed on the guide rail 12, and both may move along the guide rail 12, when the linear displacement measuring device is applied to measure displacement, the light generating portion 10 or the imaging portion 11 may be connected to the object to be measured in a relatively stationary manner, and when the object to be measured moves, the light generating portion 10 or the imaging portion 11 is driven to move, so as to measure the displacement of the object to be measured. More specifically, the light generating part 10 is provided with a base and is mounted on the guide rail through the base, and the imaging part 11 is provided with a base and is mounted on the guide rail through the base.
The above description describes a linear displacement measuring device provided by the present invention in detail. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.

Claims (5)

1. A linear displacement measuring device comprising a light generating section for emitting a line structured light to an imaging section, an imaging section for receiving the line structured light and imaging the line structured light, and a data processing section for calculating a displacement amount between the light generating section and the imaging section from line structured light images formed by the imaging section before and after the displacement between the light generating section and the imaging section;
the data processing section is specifically configured to calculate a displacement amount between the light generating section and the imaging section according to the following formula:
ΔL=L-L0=k(l-l0);
wherein Δ L represents the displacement amount between the light generating section and the imaging section, L represents the distance between the light generating section and the imaging section after the displacement, L represents the length of the line structure light reflected by the line structure light image formed by the imaging section after the displacement, and L represents the length of the line structure light reflected by the line structure light image formed by the imaging section after the displacement0Indicates the distance between the light generating section and the image forming section before displacement occurs,/0And k represents a preset parameter, wherein k represents the linear structure light length reflected by the linear structure light image formed by the imaging part before displacement occurs.
2. The linear displacement measuring device of claim 1, wherein the method of obtaining the preset parameter k comprises:
setting the distance between the light generating part and the imaging part to be a first preset value, and recording the light length of the line structure reflected by the line structure light image formed by the imaging part at the position;
moving the light generating part or the imaging part, setting the distance between the light generating part and the imaging part to be a second preset value, and recording the light length of the line structure reflected by the line structure light image formed by the imaging part at the position;
the preset parameter k is calculated according to the following formula:
Figure FDA0003085295100000011
wherein L is1Indicates a first preset value, L2Indicates a second preset value,/1Indicating the light length of the line structure measured by the imaging part when the distance between the light generating part and the imaging part is a first preset value,/2And the light length of the line structure measured by the imaging part when the distance between the light generating part and the imaging part is a second preset value.
3. The linear displacement measuring device of claim 1, wherein the light generating section and the imaging section are provided on a guide rail to be movable along the guide rail.
4. The linear displacement measuring device of claim 3, wherein the light generating part is provided with a base and is mounted on the guide rail through the base, and the imaging part is provided with a base and is mounted on the guide rail through the base.
5. The linear displacement measuring device of claim 1, wherein the light generating section includes a laser, and the imaging section includes an image sensor.
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DE4339710A1 (en) * 1993-11-22 1995-06-01 Univ Schiller Jena Opto-electronic displacement measuring apparatus
JP2002243447A (en) * 2001-02-16 2002-08-28 Isao Murakami Laser range finder
CN101373132A (en) * 2008-09-24 2009-02-25 北京交通大学 Apparatus and method for remotely measuring subgrade settlement by laser
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