CN109597728B - Control method and device of test equipment and computer readable storage medium - Google Patents
Control method and device of test equipment and computer readable storage medium Download PDFInfo
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- CN109597728B CN109597728B CN201811362490.4A CN201811362490A CN109597728B CN 109597728 B CN109597728 B CN 109597728B CN 201811362490 A CN201811362490 A CN 201811362490A CN 109597728 B CN109597728 B CN 109597728B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Abstract
The invention discloses a control method of test equipment, which comprises the steps of obtaining a test result aiming at least one tested electronic equipment; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; if the test result meets a preset condition, stopping the test process of the test equipment; the preset condition means that the number of times of test failure is greater than a preset threshold value. The embodiment of the invention also discloses a control device of the test equipment and a computer readable storage medium.
Description
Technical Field
The present invention relates to the field of automated testing, and in particular, to a method for controlling a testing device, an electronic device, and a computer-readable storage medium.
Background
With the development of electronic technology, the automatic test can greatly facilitate the production activities of people; in particular, automated testing is a process that translates manual drive testing into machine execution; compared with manual testing, the automatic testing can save a large amount of human resources and time resources, and the testing efficiency is improved.
In the product development or manufacturing stage of the current mobile phone or other intelligent terminals, in order to meet the use requirements of consumers, engineers can test software and hardware of terminals before leaving factories through test equipment. However, the fault of the test equipment cannot be found in time in the current test process, and when the test equipment fails, the test equipment still continues to test and cannot actively stop testing, so that the problem of inaccurate test result is easily caused; in addition, in the prior art, whether the equipment fails or not is usually judged manually, and the judgment of the failure is influenced by artificial subjective factors, so that whether the test equipment fails or not can not be accurately and uniformly judged.
Disclosure of Invention
In order to solve the above technical problem, embodiments of the present invention provide a method and an apparatus for controlling a test device, and a computer-readable storage medium.
The embodiment of the invention provides a control method of test equipment, which comprises the following steps:
acquiring a test result aiming at least one tested electronic device; wherein the test result comprises the number of times of test failure of the at least one tested electronic device;
if the test result meets a preset condition, stopping the test process of the test equipment; the preset condition means that the number of times of test failure is greater than a preset threshold value.
In the above method, the number of test failures includes the number of continuous test failures or the number of cumulative test failures;
correspondingly, if the test result meets the preset condition, stopping the test equipment from testing, including:
and if the number of the continuous test failures is greater than a first threshold value or the number of the accumulated test failures is greater than a second threshold value, stopping the test process of the test equipment.
In the above method, when the number of tests includes a number of cumulative test failures, the method further includes:
carrying out zero clearing treatment on the accumulated test times according to a preset time interval;
or when the total number of times of the test reaches a preset number, carrying out zero clearing treatment on the accumulated test number.
In the above method, further comprising:
acquiring input decryption information;
and if the input decryption information is matched with a preset password, testing the tested electronic equipment.
In the above method, before stopping testing the electronic device to be tested if the test parameter satisfies a preset condition, the method further includes:
and acquiring the first threshold value and the second threshold value from a server based on the current test item of the test equipment.
An embodiment of the present invention further provides a control device for a test apparatus, where the control device includes:
the acquisition unit is used for acquiring a test result aiming at least one tested electronic device; wherein the test result comprises the number of times of test failure of the at least one tested electronic device;
the processing unit is used for stopping the test process of the test equipment when the test result meets a preset condition; the preset condition means that the number of times of test failure is greater than a preset threshold value.
In the above apparatus, the number of test failures may include the number of consecutive test failures or the number of cumulative test failures;
the processing unit is specifically configured to stop the test process of the test device when the number of consecutive test failures is greater than a first threshold, or the number of cumulative test failures is greater than a second threshold.
In the above apparatus, the obtaining unit is further configured to obtain the input decryption information;
and the processing unit is also used for starting to test the electronic equipment to be tested when the input decryption information is matched with a preset password.
The invention also provides a test device, which comprises a memory and a processor, wherein the memory stores a computer program capable of running on the processor, and the test device is characterized in that the processor executes the program to realize the steps in the control method of the test device.
Embodiments of the present invention also provide a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to implement the steps of any one of the above methods.
The control method and the control device for the test equipment and the computer-readable storage medium provided by the embodiment of the invention are used for acquiring a test result aiming at least one tested electronic equipment; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; if the test result meets the preset condition, stopping the test process of the test equipment; the preset condition refers to that the test failure frequency of the at least one tested electronic device is greater than a preset threshold value; therefore, whether the test equipment is abnormal or not is determined by judging the test result of the test equipment, and meanwhile, the test is actively stopped when the test equipment is abnormal; in this way, the tester can intervene in the test equipment which stops working; in addition, it is possible to uniformly and accurately control the test equipment by setting the conditions for stopping the test.
Drawings
Fig. 1 is a schematic flowchart of a control method of a test apparatus according to an exemplary embodiment of the present invention;
fig. 2 is a schematic flowchart of another control method for a test apparatus according to an exemplary embodiment of the present invention;
fig. 3 is a schematic structural diagram illustrating a control apparatus of a diagram test device according to an exemplary embodiment of the present invention;
fig. 4 is a hardware entity diagram of a testing device according to an exemplary embodiment of the present invention.
Detailed Description
So that the manner in which the features and elements of the present invention can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings.
Fig. 1 is a schematic flowchart of a control method of a test device according to an embodiment of the present invention, and as shown in fig. 1, the control method of the test device includes the following steps:
Wherein, the test result comprises the number of times of test failure of the at least one tested electronic device.
In other embodiments of the present invention, the step 101 of obtaining the test result for the at least one tested electronic device may be implemented by a testing device; here, the test device may be any type of electronic device having a test function, such as an industrial computer. The test equipment can test any type of electronic equipment; here, the electronic device to be tested may be any type of electronic device such as a mobile phone, a tablet computer, a notebook computer, a wearable device, and the like.
In practical application, one test device can only test one tested electronic device at the same time, and meanwhile, each test device can test one function of the tested electronic device in the test process; generally, the test device is connected with the test server, downloads a test case corresponding to a target function to be tested from the test server, tests the target function of the tested electronic device based on the test case with the function, and obtains a final test result.
In other embodiments of the present invention, the test results of the tested electronic device include both successful test results and failed test results. The test failure includes the following three conditions: the test equipment indicates that the test failed; the testing time length of the tested electronic equipment exceeds the preset time length; the test value of the tested electronic equipment does not conform to the test threshold range. In summary, in the process of testing the electronic device to be tested, as long as at least one of the above three conditions occurs, the test can be considered to fail.
In other embodiments of the present invention, the testing device may display the testing result in the display screen after the testing of each tested electronic device is finished; in addition, the test equipment can refresh the yield of the test in the display screen after each test is finished, namely the probability of successful test.
In other embodiments of the present invention, the test device can obtain the test failure result of each tested electronic device, and obtain the test failure times in the test process, so that the test device can effectively control the test process of the test device based on the test failure times.
And 102, if the test result meets a preset condition, stopping the test process of the test equipment.
The preset condition means that the number of times of test failure is greater than a preset threshold value.
In other embodiments of the present invention, if the test result in step 102 satisfies a preset condition, stopping the test process of the test equipment may be implemented by the test equipment. Here, the test equipment can record the test result of each tested electronic equipment and judge the test result in real time; and when the times of test failure reach a preset threshold value, the test equipment directly stops testing the tested electronic equipment. Specifically, when the test equipment detects that the number of times of test failure is greater than a preset threshold, the test equipment locks the current test program, so that the test equipment cannot continue to test the tested electronic equipment.
Furthermore, after the test equipment is locked, the test equipment can send out warning prompt to the test personnel, so that the test personnel can perform intervention treatment on the test equipment. And after the decryption information is matched with the preset password, the testing equipment is restarted to start testing the tested electronic equipment.
In other embodiments of the present invention, the number of test failures may include the number of consecutive test failures or the number of cumulative test failures. Here, when the number of consecutive test failures is greater than a first threshold, or the number of cumulative test failures is greater than a second threshold, it may be considered that the current test device has failed, and thus, the test process of the test device is stopped.
According to the control method of the test equipment provided by the embodiment of the invention, the test result aiming at least one tested electronic equipment is obtained; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; if the test result meets a preset condition, stopping the test process of the test equipment; the preset condition refers to that the test failure frequency of the at least one tested electronic device is greater than a preset threshold value; therefore, whether the test equipment is abnormal or not is determined by judging the test result of the test equipment, and meanwhile, the test is actively stopped when the test equipment is abnormal; in this way, the tester can intervene in the test equipment which stops working; in addition, it is possible to uniformly and accurately control the test equipment by setting the condition for stopping the test.
Based on the foregoing embodiment, an embodiment of the present invention further provides a flowchart illustrating a control method of a test device, and as shown in fig. 2, the control method of the test device includes the following steps:
Wherein the test result comprises the number of times of test failure of the at least one tested electronic device.
In practical application, one test device can only test one tested electronic device at the same time, and meanwhile, each test device can test one function of the tested electronic device in the test process; generally, the test device is connected with the test server, downloads a test case corresponding to a target function to be tested from the test server, tests the target function of the tested electronic device based on the test case with the function, and obtains a final test result.
In other embodiments of the present invention, the test results of the tested electronic device include both successful test results and failed test results. The test failure includes the following three conditions: the test equipment indicates that the test failed; the testing time length of the tested electronic equipment exceeds the preset time length; the test value of the tested electronic equipment does not conform to the test threshold range. In summary, in the process of testing the electronic device to be tested, as long as at least one of the above three conditions occurs, the test can be regarded as failed.
In other embodiments of the present invention, the testing device may display the testing result in the display screen after the testing of each tested electronic device is finished; in addition, the test equipment can refresh the yield of the test in the display screen after each test is finished, namely the probability of successful test.
In other embodiments of the present invention, the test device can obtain the test failure result of each tested electronic device, and obtain the test failure times in the test process, so that the test device can effectively control the test process of the test device based on the test failure times.
In other embodiments of the present invention, when the number of continuous test failures of the tested electronic device is greater than the first threshold, or the number of cumulative test failures of the tested electronic device is greater than the second threshold, it is determined that the current test device has a fault, and the test process is immediately stopped, so as to lock the test device; that is, the first threshold is the number of locks that fail the consecutive tests, and the second threshold is the cumulative number of locks that fail.
In other embodiments of the present invention, the test items are different, and the set first threshold and the set second threshold are different; that is, the first threshold and the second threshold are set according to the requirement of the test item. Generally, the first threshold value may be set to 3 to 5 times, and the second threshold value may be set to 5 to 10 times. For example, when the test item is a network connection test, the value of the first threshold may be 3 times, and the value of the second threshold may be 5 times. In practical application, before testing, the test equipment downloads the test cases of the corresponding items from the server, and simultaneously downloads the corresponding first threshold and second threshold. Specifically, the method comprises the following steps:
and acquiring the first threshold value and the second threshold value from a server based on the current test item of the test equipment.
It should be noted that the test cases, the first threshold value, and the second threshold value on the server may be periodically maintained by a tester. That is, the tester can modify the test case and the corresponding first threshold and second threshold according to the actual test condition.
In addition, when the number of the tested electronic devices is large, the number of the accumulative test failures is increased, and in order to avoid inaccuracy of calculating the number of the accumulative test failures under the condition of testing the tested electronic devices with large number, the number of the accumulative test failures needs to be cleared regularly or quantitatively so as to ensure normal operation of the testing device. Specifically, the zero clearing processing can be performed in the following two ways:
carrying out zero clearing treatment on the accumulated test times according to a preset time interval;
or when the total number of times of the test reaches a preset number of times, carrying out zero clearing treatment on the accumulated test number of times.
The preset time interval may be a fixed time interval, and may be understood as zero clearing processing performed on the accumulated test times according to a preset time period; in another embodiment, the preset time interval may be a time interval obtained according to a time algorithm, for example, the next time interval is two seconds more than the last time interval. In this way, the number of times of accumulation can be flexibly cleared.
In other embodiments of the present invention, after the test equipment is locked and cannot be tested, the test equipment may send a warning prompt to a tester, so that the tester performs an intervention process on the test equipment.
Furthermore, after the testing personnel successfully maintain the testing equipment, decryption information can be input into the testing equipment, and after the decryption information is matched with the set password, the testing equipment is restarted to start testing the tested electronic equipment. Specifically, the test equipment displays prompt information for inputting the password in a display screen, so that a tester can input decryption information. The decryption information includes digital password information, fingerprint information, iris information, and the like.
And 204, if the input decryption information is matched with a preset password, the test equipment starts to test the tested electronic equipment.
In other embodiments of the present invention, only after the decryption information input by the tester matches the preset password, the test device can continue to work to perform a normal test process.
Here, before the test device starts to test the tested electronic device, it is necessary to perform zero clearing processing on the current consecutive failure times and the cumulative failure times, and count the tested electronic device failing in the consecutive test and the tested electronic device failing in the cumulative test from the beginning.
According to the control method of the test equipment provided by the embodiment of the invention, the test result aiming at least one tested electronic equipment is obtained; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; if the test result meets a preset condition, stopping the test process of the test equipment; the preset condition refers to that the number of times of test failure of the at least one tested electronic device is greater than a preset threshold value; therefore, whether the test equipment is abnormal or not is determined by judging the test result of the test equipment, and meanwhile, the test is actively stopped when the test equipment is abnormal; in this way, the tester can intervene in the test equipment which stops working; in addition, it is possible to uniformly and accurately control the test equipment by setting the conditions for stopping the test.
In order to implement the method according to the embodiment of the present invention, an embodiment of the present invention provides a control device for a test apparatus, where the control device for the test apparatus may be applied to the test apparatus in the above method embodiment; as shown in fig. 3, the apparatus includes:
an obtaining unit 31, configured to obtain a test result for at least one tested electronic device; wherein the test result comprises the number of times of test failure of the at least one tested electronic device;
the processing unit 32 is configured to stop a test process of the test device when the test result meets a preset condition; the preset condition means that the number of times of test failure is greater than a preset threshold value.
In other embodiments of the present invention, the test device control apparatus further includes a display unit 33;
the display unit 33 can display the test result of each tested electronic device and the yield of the test.
In other embodiments of the present invention, the number of test failures includes the number of consecutive test failures or the number of cumulative test failures;
the processing unit 32 is specifically configured to stop the test process of the test device when the number of consecutive test failures is greater than a first threshold, or the number of cumulative test failures is greater than a second threshold.
In other embodiments of the present invention, the obtaining unit 31 is further configured to obtain the input decryption information;
the processing unit 32 is further configured to start testing the electronic device to be tested when the input decryption information matches a preset password.
In other embodiments of the present invention, the processing unit 32 is further configured to perform zero clearing processing on the accumulated test times according to a preset time interval;
or when the total number of times of the test reaches a preset number, carrying out zero clearing treatment on the accumulated test number.
In other embodiments of the present invention, the obtaining unit 33 is further configured to obtain the first threshold and the second threshold from a server based on a current test item of the test equipment.
The above description of the apparatus embodiments, similar to the above description of the method embodiments, has similar beneficial effects as the method embodiments. For technical details not disclosed in the embodiments of the apparatus of the present application, reference is made to the description of the embodiments of the method of the present application for understanding.
The control device of the test equipment provided by the embodiment of the invention acquires the test result aiming at least one tested electronic equipment; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; if the test result meets a preset condition, stopping the test process of the test equipment; the preset condition refers to that the number of times of test failure of the at least one tested electronic device is greater than a preset threshold value; therefore, whether the test equipment is abnormal or not is determined by judging the test result of the test equipment, and meanwhile, the test is actively stopped when the test equipment is abnormal; in this way, the tester can intervene in the test equipment which stops working; in addition, it is possible to uniformly and accurately control the test equipment by setting the condition for stopping the test.
Fig. 4 is a schematic diagram of a terminal hardware entity according to an exemplary embodiment of the present invention, and as shown in fig. 4, an exemplary embodiment of the present invention provides a testing apparatus 40, which includes:
a processor 41 and a storage medium 42 storing instructions executable by the processor 41, wherein the storage medium 42 depends on the processor 41 to perform operations through a communication bus 43, and when the instructions are executed by the processor 41, the control method of the test device according to the first embodiment is performed.
It should be noted that, in actual application, the various components in the test equipment are coupled together by a communication bus 43. It will be appreciated that the communication bus 43 is used to enable communications among the components. The communication bus 43 includes a power bus, a control bus, and a status signal bus, in addition to a data bus. But for clarity of illustration the various buses are labeled in figure 4 as communication bus 43.
Accordingly, an exemplary embodiment of the present invention provides a computer-readable storage medium on which a computer program is stored, which, when executed by a processor, implements the steps in the image encryption method provided in the above-described embodiment.
Here, it should be noted that: the above description of the storage medium and device embodiments is similar to the description of the method embodiments above, with similar advantageous effects as the method embodiments. For technical details not disclosed in the embodiments of the storage medium and the apparatus of the present application, reference is made to the description of the embodiments of the method of the present application for understanding.
It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in the various embodiments of the present application, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of the processes should be determined by the functions and the inherent logic thereof, and should not constitute any limitation to the implementation process of an exemplary embodiment of the present application. The above-mentioned serial number of an exemplary embodiment of the present application is merely for description and does not represent the advantages and disadvantages of the embodiment.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described device embodiments are merely illustrative, for example, the division of the unit is only a logical functional division, and there may be other division ways in actual implementation, such as: multiple units or components may be combined, or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the coupling, direct coupling or communication connection between the components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between the devices or units may be electrical, mechanical or in other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units; can be located in one place or distributed on a plurality of network units; some or all of the units can be selected according to actual needs to achieve the purpose of the solution of an exemplary embodiment of the present application.
In addition, all functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be separately regarded as one unit, or two or more units may be integrated into one unit; the integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.
Those of ordinary skill in the art will understand that: all or part of the steps for realizing the method embodiments can be completed by hardware related to program instructions, the program can be stored in a computer readable storage medium, and the program executes the steps comprising the method embodiments when executed; and the aforementioned storage medium includes: various media that can store program codes, such as a removable Memory device, a Read Only Memory (ROM), a magnetic disk, or an optical disk.
Alternatively, the integrated units described above in the present application may be stored in a computer-readable storage medium if they are implemented in the form of software functional modules and sold or used as independent products. Based on such understanding, the technical solutions of the exemplary embodiments of the present application may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a terminal to perform all or part of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: various media that can store program code, such as removable storage devices, ROMs, magnetic or optical disks, etc.
The above description is only for the embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (8)
1. A method of controlling a test apparatus, the method comprising:
acquiring a test result aiming at least one tested electronic device; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; the test failure times comprise accumulative test failure times;
if the test result meets a preset condition, stopping the test process of the test equipment; the preset condition means that the number of times of test failure is greater than a preset threshold value;
if the test result meets the preset condition, stopping the test process of the test equipment, including:
if the number of times of the accumulative test failure is larger than a second threshold value, stopping the test process of the test equipment;
acquiring input decryption information;
and if the input decryption information is matched with a preset password, testing the electronic equipment to be tested.
2. The method of claim 1, wherein the number of test failures further comprises a number of consecutive test failures;
correspondingly, if the test result meets the preset condition, stopping the test process of the test equipment, including:
and if the number of times of the continuous test failure is greater than a first threshold value, stopping the test process of the test equipment.
3. The method of claim 2, wherein when the number of test failures comprises the cumulative number of test failures, the method further comprises:
clearing the times of the accumulative test failure according to a preset time interval;
or when the total times of the tests reach the preset times, carrying out zero clearing treatment on the times of the accumulative tests failure.
4. The method according to claim 3, wherein before stopping the test process of the tested electronic device if the test parameter satisfies a predetermined condition, the method further comprises:
and acquiring the first threshold value and the second threshold value from a server based on the current test item of the test equipment.
5. A control apparatus of a test device, the apparatus comprising:
the acquisition unit is used for acquiring a test result aiming at least one tested electronic device; wherein the test result comprises the number of times of test failure of the at least one tested electronic device; the test failure times comprise accumulated test failure times;
the processing unit is used for stopping the test process of the test equipment if the test result meets the preset condition; the preset condition means that the number of times of test failure is greater than a preset threshold value; if the test result meets the preset condition, stopping the test process of the test equipment, including: if the number of times of the accumulative test failure is larger than a second threshold value, stopping the test process of the test equipment;
the acquisition unit is further used for acquiring the input decryption information;
and the processing unit is also used for testing the electronic equipment to be tested if the input decryption information is matched with a preset password.
6. The apparatus of claim 5, wherein the number of test failures comprises a number of consecutive test failures;
the processing unit is further configured to stop the test process of the test device when the number of times of the continuous test failures is greater than a first threshold.
7. A test apparatus comprising a memory and a processor, the memory storing a computer program operable on the processor, wherein the processor implements the steps in the control method of the test apparatus of any one of claims 1 to 4 when executing the program.
8. A computer-readable storage medium, having stored thereon a computer program for execution by a processor for performing the steps of the method of any one of claims 1 to 4.
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| CN104320793A (en) * | 2014-09-29 | 2015-01-28 | 上海斐讯数据通信技术有限公司 | Mobile phone short message automated test method and system |
| CN107894950A (en) * | 2017-10-30 | 2018-04-10 | 北京奇虎科技有限公司 | A kind of equipment detection method, device, server and storage medium |
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| CN104320793A (en) * | 2014-09-29 | 2015-01-28 | 上海斐讯数据通信技术有限公司 | Mobile phone short message automated test method and system |
| CN107894950A (en) * | 2017-10-30 | 2018-04-10 | 北京奇虎科技有限公司 | A kind of equipment detection method, device, server and storage medium |
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