CN109506788A - Optical wavelength measurement system based on Fourier's mode-locked laser - Google Patents
Optical wavelength measurement system based on Fourier's mode-locked laser Download PDFInfo
- Publication number
- CN109506788A CN109506788A CN201811295587.8A CN201811295587A CN109506788A CN 109506788 A CN109506788 A CN 109506788A CN 201811295587 A CN201811295587 A CN 201811295587A CN 109506788 A CN109506788 A CN 109506788A
- Authority
- CN
- China
- Prior art keywords
- fourier
- mode
- locked laser
- coupler
- photo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 73
- 238000005259 measurement Methods 0.000 title claims abstract description 36
- 238000012545 processing Methods 0.000 claims abstract description 9
- 238000001514 detection method Methods 0.000 claims abstract description 8
- 230000008878 coupling Effects 0.000 claims abstract description 7
- 238000010168 coupling process Methods 0.000 claims abstract description 7
- 238000005859 coupling reaction Methods 0.000 claims abstract description 7
- 239000000835 fiber Substances 0.000 claims description 21
- 239000006185 dispersion Substances 0.000 claims description 20
- 230000035559 beat frequency Effects 0.000 claims description 15
- 239000004065 semiconductor Substances 0.000 claims description 12
- 239000013307 optical fiber Substances 0.000 claims description 9
- 230000000694 effects Effects 0.000 claims description 8
- 238000002955 isolation Methods 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- 230000003595 spectral effect Effects 0.000 claims description 5
- 238000002347 injection Methods 0.000 claims description 4
- 239000007924 injection Substances 0.000 claims description 4
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 claims description 3
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 230000000644 propagated effect Effects 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 238000001914 filtration Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer
Abstract
The disclosure provides a kind of optical wavelength measurement system based on Fourier's mode-locked laser, comprising: laser generating unit, Fourier's mode-locked laser signal of corresponding relationship when generating triangular form frequency；Second photo-coupler is connected with the laser generating unit, for coupling measured signal light with Fourier's mode-locked laser signal, forms combined beam light；And signal detection and processing unit, it is connected with second photo-coupler, for being detected and being handled the combined beam light formed through second photo-coupler, when by the optical wavelength measurement system based on Fourier's mode-locked laser to alleviate the wavelength for accurately measuring light using spectrometer in the prior art, its measurement accuracy is limited, there are certain error, and the technical problems such as spectrometer is expensive, and volume is larger.
Description
Technical field
This disclosure relates to Microwave photonics technical field more particularly to a kind of optical wavelength based on Fourier's mode-locked laser
Measuring system.
Background technique
Fourier's mode-locked laser (FDML) changes over time the characteristic of period output due to its spectrum, has very high grind
Study carefully value and practical value.FDML is the light source of optical coherent chromatographic imaging (OCT), has in medical system and widely answers
With.Limited FDML is then widely used in sensing technology, for detecting the variation such as extraneous stress and temperature.FDML is in optical fiber
It is also had important application in communication system.However FDML in terms of optical wavelength measurement using less, have and further grind
Study carefully value.
Accurately measuring for optical wavelength is measured using spectrometer mostly, and the resolution ratio of spectrometer measurement optical wavelength is main
Be there is its entrance slit and exit slit to determine, and in this way its resolution ratio and the luminous intensity of survey be it is conflicting,
It at this time will receive the restriction of the photoelectric detector performance built in spectrometer, the resolution ratio of spectrometer measurement optical wavelength can reach
10pm.But spectrometer volume is big, expensive, cannot be commonly utilized in the scene for needing accurate optical wavelength measurement, and its
The resolution ratio and precision of body are limited.
To sum up, when accurately measuring the wavelength of light using spectrometer, measurement accuracy is limited, there are certain error, and spectrum
Instrument it is expensive, volume is larger.FDML has more researching values in spectral measurement field.
Disclosure
(1) technical problems to be solved
Based on the above issues, present disclose provides a kind of optical wavelength measurement system based on Fourier's mode-locked laser, with
When accurately measuring the wavelength of light using spectrometer in the prior art, measurement accuracy is limited for alleviation, there are certain error, and light
Expensive, the technical problems such as volume is larger of spectrometer.
(2) technical solution
The disclosure provides a kind of optical wavelength measurement system based on Fourier's mode-locked laser, comprising: laser generating unit,
Fourier's mode-locked laser signal of corresponding relationship when generating triangular form frequency；Second photo-coupler 8, with the laser generating unit phase
Even, for coupling measured signal light with Fourier's mode-locked laser signal, combined beam light is formed；And signal detection and processing
Unit is connected with second photo-coupler 8, for by the combined beam light formed through second photo-coupler 8 carry out detection with
Processing.
In the embodiments of the present disclosure, the laser generating unit, comprising: semiconductor optical amplifier 1, electric current injection is lower to be generated
Laser and make by light obtain gain；First optoisolator 2: it is connected with the semiconductor optical amplifier 1, for guaranteeing light
One way propagation；Tunable optical filter 4: being connected with first optoisolator 2, for closing Fourier's mode-locked laser signal time-frequency
System has a generally triangular shape；Arbitrary waveform generator 3: being connected to one end of the tunable optical filter 4, any adjustable for generating
Voltage signal；Zero dispersion fiber delay line 5: it is connected to the other end of the tunable optical filter 4, the light in link is prolonged
When；First photo-coupler 6: being connected with the zero dispersion fiber delay line 5, has beam splitting effect, mixed optical signal a part
It is output to second photo-coupler 8, a part is fed back in Fourier's mode-locked laser signal link to guarantee resonance；And
Second optoisolator 7: being connected with first photo-coupler 6, guarantees that fairing hour hands are propagated.
In the embodiments of the present disclosure, the signal detection and processing unit include: photodetector 9, are used for the warp
The combined beam light and measured signal light beat frequency that second photo-coupler 8 is formed；Real-time oscilloscope 10 is used for the photodetector 9
The result data of beat frequency acquires in real time；And computer 11, Mathematical treatment is carried out to the real-time oscilloscope 10 data collected.
In the embodiments of the present disclosure, the isolation of first optoisolator 2 or the second optoisolator 7 is higher than 30dB.
In the embodiments of the present disclosure, first optoisolator 2 or the second optoisolator 7 include: spatial light isolator or
Fiber optic isolator.
In the embodiments of the present disclosure, 4 fineness of tunable optical filter is tuned up to 1000 or more, spectral region 15THz
Frequency 2kHz~2.5kHz.
In the embodiments of the present disclosure, the fast tunable optical filter 4, comprising: the light based on fabry perot cavity
Fiber filter.
In the embodiments of the present disclosure, first photo-coupler 6 or the second photo-coupler 8, comprising: coupled based on evanescent wave
Directional coupler or multi-mode interference coupler based on multimode interference effect.
In the embodiments of the present disclosure, the zero dispersion fiber delay line 5, comprising: dispersive optical fiber and dispersion compensating fiber group
At zero dispersion optical fiber.
In the embodiments of the present disclosure, the photodetector 9, it includes: germanium silicon, indium phosphide that material, which is made,.
(3) beneficial effect
It can be seen from the above technical proposal that optical wavelength measurement system of the disclosure based on Fourier's mode-locked laser is at least
Have the advantages that one of them or in which a part:
(1) a kind of new frequency measurement mode is proposed based on Fourier's mode-locked laser, reduces the quantity of device, can reduces
Volume and weight；
(2) the new survey wavelength based on Fourier's mode-locked laser, frequency measurement scheme can reach spectrometer measurement precision
Power consumption is reduced simultaneously and reduces cost.
Detailed description of the invention
Fig. 1 is the structure and link signal of optical wavelength measurement system of the embodiment of the present disclosure based on Fourier's mode-locked laser
Figure.
Fig. 2 is that Fourier's mode-locked laser class signal triangular wave time-frequency of the embodiment of the present disclosure corresponds to schematic diagram.
The measured signal light and Fourier's mode-locked laser signal light beat frequency result schematic diagram of Fig. 3 embodiment of the present disclosure.
[embodiment of the present disclosure main element symbol description in attached drawing]
1- semiconductor optical amplifier；The first optoisolator of 2-；3- arbitrary waveform generator；
4- tunable optical filter；5- zero dispersion fiber delay line；The first photo-coupler of 6-；
The second optoisolator of 7-；The second photo-coupler of 8-；9- photodetector；
10- real-time oscilloscope；11- computer.
Specific embodiment
Present disclose provides a kind of optical wavelength measurement system for being based on Fourier's mode-locked laser (FDML), the optical wavelength
Measuring system is based on microwave photon technology, using fast tunable optical filter that the time-frequency of Fourier's mode-locked laser signal is corresponding bent
Line has been adjusted to class triangle, the result of measured signal light and its beat frequency be Fourier convert in short-term available two peaks when
Between it is poor, calculate the wavelength of measured signal light.
For the purposes, technical schemes and advantages of the disclosure are more clearly understood, below in conjunction with specific embodiment, and reference
The disclosure is further described in attached drawing.
In the embodiments of the present disclosure, a kind of optical wavelength measurement system based on Fourier's mode-locked laser is provided, for surveying
Measure measured signal light wavelength, Fig. 1 be optical wavelength measurement system structure and link schematic diagram based on Fourier's mode-locked laser,
As shown in Figure 1, the optical wavelength measurement system based on Fourier's mode-locked laser, comprising:
Laser generating unit, Fourier's mode-locked laser signal of corresponding relationship when generating triangular form frequency；
Second photo-coupler 8, is connected with the laser generating unit, single for generating measured signal light and the laser
Fourier's mode-locked laser signal coupling that member generates, forms combined beam light；And
Signal detection and processing unit are connected with second photo-coupler 8, and being used for will be through second photo-coupler 8
The combined beam light of formation is detected and is handled.
The laser generating unit, including semiconductor optical amplifier 1, the first optoisolator 2, arbitrary waveform generator 3 can
Filter 4 is dimmed, zero dispersion fiber delay line 5, the first photo-coupler 6 and the second optoisolator 7, the semiconductor light are put
Big device 1, the first optoisolator 2, arbitrary waveform generator 3, tunable optical filter 4, zero dispersion fiber delay line 5, the first optocoupler
Clutch 6 and the second optoisolator 7 collectively constitute Fourier's mode-locked laser signal link, are equivalent to Fourier's mode-locked laser,
Wherein:
Semiconductor optical amplifier 1, electric current injection is lower generate laser and make by light obtain gain；
First optoisolator 2: being connected with the semiconductor optical amplifier 1, and isolation is higher than 30dB, for guaranteeing the list of light
To propagation；
Tunable optical filter 4: being connected with first optoisolator 2, for closing Fourier's mode-locked laser signal time-frequency
System has a generally triangular shape；
4 fineness of tunable optical filter up to 1000 or more, spectral region 15THz (120nm), tuned frequency 2kHz~
2.5kHz。
Arbitrary waveform generator 3: being connected to one end of the tunable optical filter 4, for generating any adjustable voltage
Signal；
Zero dispersion fiber delay line 5: it is connected to the other end of the tunable optical filter 4, the light in link is prolonged
When；
First photo-coupler 6: being connected with the zero dispersion fiber delay line 5, has beam splitting effect, mixed optical signal one
Part is output to second photo-coupler 8, and a part is fed back in Fourier's mode-locked laser signal link to guarantee resonance；
Second optoisolator 7: being connected with first photo-coupler 6, and isolation is higher than 30dB, guarantees that fairing hour hands pass
It broadcasts；
The signal detection and processing unit include:
Photodetector 9, for by the combined beam light formed through the second photo-coupler 8 and measured signal light beat frequency；
Real-time oscilloscope 10, for acquiring the result data of 9 beat frequency of photodetector in real time；
Computer 11 carries out Mathematical treatment to the real-time oscilloscope 10 data collected.
The real-time oscilloscope 10: there is big storage depth, calculated for acquiring enough data points；
The computer 11: including the program write, for obtaining the time in beat frequency result and calculating measured signal light
Wavelength.
Wherein, the semiconductor optical amplifier 1 characteristic with big bandwidth high-gain under electric current injection, plays two works
With first generates wide spectrum optical as system source, harmonic light of the second amplification wide spectrum optical after link modeling, first
Guarantee that fairing hour hands are propagated under the action of optoisolator 2 and the second optoisolator 7；Arbitrary waveform generator 3 drives fast tunable
Then the time-frequency corresponding relationship that optical filter 4 has a generally triangular shape Fourier's mode-locked laser signal output light passes through zero dispersion light
Fine delay line 5 enters the first photo-coupler 6；Second photo-coupler 8 issues measured signal light and the laser generating unit
Optical coupling closes beam and enters photodetector 9, realizes the laser beat frequency of measured signal light and laser generating unit output and in real time
Oscillograph 10 acquires, and the signal acquired later by 11 Duis of computer does the wavelength that Short Time Fourier Transform calculates light to be measured.
In the embodiments of the present disclosure, Fig. 2 is that Fourier's mode-locked laser class signal triangular wave time-frequency corresponds to schematic diagram, is such as schemed
Shown in 2, Fourier's mode-locked laser class signal triangular wave time-frequency corresponding relationship is described, abscissa is time shaft, ordinate
It is different wave length, under the variation of filter, variation that wavelength has a generally triangular shape with the time.And the wavelength constant with the time
It is then measured signal light, as shown, two intersection points can occur with Fourier's mode-locked laser signal light in measured signal light, it is described
Beat frequency can be realized in latter two intersection point place that combined beam light enters photodetector 9.
In the embodiments of the present disclosure, Fig. 3 is measured signal light and the signal of Fourier's mode-locked laser signal light beat frequency result
Figure.In conjunction with shown in Fig. 2 and Fig. 3, after the combined beam light enters photodetector, there is beat frequency in the place of two intersection points in Fig. 2.It is right
Beat frequency result carries out Short Time Fourier Transform, and abscissa is time shaft, and ordinate is normalized frequency, corresponding with Fig. 2 two
It will appear two peak powers that beat frequency obtains on a time point, as shown in Figure 3, two summits are significantly larger than ambient noise.
Thus the two time difference is obtained, the frequency of measured signal can be gone out with backstepping by the time difference.
The semiconductor optical amplifier 1, being preferably based on has big bandwidth and high-gain made of active optical waveguide device
Image intensifer, because its specific structure is well known to those skilled in the art, and therefore not to repeat here.
First optoisolator 2 and the second optoisolator 7, be preferably based on Faraday effect spatial light isolator or
Person's fiber optic isolator has high isolation, guarantees the one way propagation of light, because its specific structure is those skilled in the art
Known, and therefore not to repeat here.
First photo-coupler 6 and the second photo-coupler 8 are preferably based on the directional coupler or base of evanescent wave coupling
There is the coupler of light splitting effect in multi-mode interference coupler of multimode interference effect etc., because its specific structure is art technology
Known to personnel, and therefore not to repeat here.
The fast tunable optical filter 4, is preferably based on the optical fiber filter of fabry perot cavity, adjustability
Realize that there is superelevation fineness and super large Free Spectral Range based on controllable piezoelectric ceramics, because specific structure is art technology
Known to personnel, and therefore not to repeat here.
The zero dispersion optical fiber of the zero dispersion fiber delay line 5, preferably dispersive optical fiber and dispersion compensating fiber composition, is used
In the delay for increasing link, because specific structure is well known to those skilled in the art, and therefore not to repeat here.
The fast tunable filter 4 and zero dispersion fiber delay line 5 common guarantee Fourier's mode-locked laser signal
Normal running conditions, make the light propagation time in link integral multiple be equal to fast tunable filter period, meet Fourier
The condition of mode locking.
The photodetector 9 preferably comprises the big bandwidth of the materials such as germanium silicon, indium phosphide production, the light of high-responsivity
Electric explorer, because specific structure is well known to those skilled in the art, and therefore not to repeat here.
The real-time oscilloscope 10, it is however preferred to have the real-time oscilloscope of 15M sampling depth, because specific structure is this field
Known to technical staff, and therefore not to repeat here.
The computer 11 preferably comprises the processing routine based on MTLAB or other software programmings, for completing peak value
The wavelength of identification and light to be measured calculates.
So far, the present embodiment is finished based on the optical wavelength measurement system explanation of Fourier's mode-locked laser.On in addition,
It states and various specific structures, shape or the mode mentioned in embodiment, ability is not limited in the definition of each element and method
The those of ordinary skill in domain can replace with simply being known to its structure, such as: the semiconductor optical amplifier in link can
To replace using EDFA Erbium-Doped Fiber Amplifier, enough gains need to be only provided for link；Fast tunable filter can be replaced
At the fast tunable filter such as based on micro-ring resonant, on piece waveguide form, or using the filter of different rates；Link
In can increase the intensity that electric amplifier or image intensifer change electric signal and optical signal.Also, appended attached drawing is to simplify
And it is used as illustrating.Number of devices, shape and size shown in the drawings can modify according to actual conditions, and device
Configuration is likely more complexity.
According to above description, those skilled in the art should be surveyed the disclosure based on the optical wavelength of Fourier's mode-locked laser
Amount system has clear understanding.
In conclusion present disclose provides a kind of optical wavelength measurement system based on Fourier's mode-locked laser, the light
Wave length measuring system is based on microwave photon technology, and the optical wavelength measurement system based on Fourier's mode-locked laser utilizes fast tunable
The time-frequency homologous thread of Fourier's mode-locked laser output laser has been adjusted to class triangle, light to be measured and its bat by optical filter
The result of frequency does the time difference that Fourier converts available two peaks in short-term, calculates the wavelength of light to be measured.
It should also be noted that, the direction term mentioned in embodiment, for example, "upper", "lower", "front", "rear", " left side ",
" right side " etc. is only the direction with reference to attached drawing, not is used to limit the protection scope of the disclosure.Through attached drawing, identical element by
Same or similar appended drawing reference indicates.When may cause understanding of this disclosure and cause to obscure, conventional structure will be omitted
Or construction.
And the shape and size of each component do not reflect actual size and ratio in figure, and only illustrate the embodiment of the present disclosure
Content.In addition, in the claims, any reference symbol between parentheses should not be configured to the limit to claim
System.
It unless there are known entitled phase otherwise anticipates, the numerical parameter in this specification and appended claims is approximation, energy
Enough bases pass through the resulting required characteristic changing of content of this disclosure.Specifically, all be used in specification and claim
The middle content for indicating composition, the number of reaction condition etc., it is thus understood that repaired by the term of " about " in all situations
Decorations.Under normal circumstances, the meaning expressed refers to include by specific quantity ± 10% variation in some embodiments, some
± 5% variation in embodiment, ± 1% variation in some embodiments, in some embodiments ± 0.5% variation.
Furthermore word "comprising" does not exclude the presence of element or step not listed in the claims.It is located in front of the element
Word "a" or "an" does not exclude the presence of multiple such elements.
The word of ordinal number such as " first ", " second ", " third " etc. used in specification and claim, with modification
Corresponding element, itself is not meant to that the element has any ordinal number, does not also represent the suitable of a certain element and another element
Sequence in sequence or manufacturing method, the use of those ordinal numbers are only used to enable an element and another tool with certain name
Clear differentiation can be made by having the element of identical name.
In addition, unless specifically described or the step of must sequentially occur, there is no restriction in the above institute for the sequence of above-mentioned steps
Column, and can change or rearrange according to required design.And above-described embodiment can be based on the considerations of design and reliability, that
This mix and match is used using or with other embodiments mix and match, i.e., the technical characteristic in different embodiments can be freely combined
Form more embodiments.
Those skilled in the art will understand that can be carried out adaptively to the module in the equipment in embodiment
Change and they are arranged in one or more devices different from this embodiment.It can be the module or list in embodiment
Member or component are combined into a module or unit or component, and furthermore they can be divided into multiple submodule or subelement or
Sub-component.Other than such feature and/or at least some of process or unit exclude each other, it can use any
Combination is to all features disclosed in this specification (including adjoint claim, abstract and attached drawing) and so disclosed
All process or units of what method or apparatus are combined.Unless expressly stated otherwise, this specification is (including adjoint power
Benefit require, abstract and attached drawing) disclosed in each feature can carry out generation with an alternative feature that provides the same, equivalent, or similar purpose
It replaces.Also, in the unit claims listing several devices, several in these devices can be by same hard
Part item embodies.
Similarly, it should be understood that in order to simplify the disclosure and help to understand one or more of each open aspect,
Above in the description of the exemplary embodiment of the disclosure, each feature of the disclosure is grouped together into single implementation sometimes
In example, figure or descriptions thereof.However, the disclosed method should not be interpreted as reflecting the following intention: i.e. required to protect
The disclosure of shield requires features more more than feature expressly recited in each claim.More precisely, as following
Claims reflect as, open aspect is all features less than single embodiment disclosed above.Therefore,
Thus the claims for following specific embodiment are expressly incorporated in the specific embodiment, wherein each claim itself
All as the separate embodiments of the disclosure.
Particular embodiments described above has carried out further in detail the purpose of the disclosure, technical scheme and beneficial effects
Describe in detail it is bright, it is all it should be understood that be not limited to the disclosure the foregoing is merely the specific embodiment of the disclosure
Within the spirit and principle of the disclosure, any modification, equivalent substitution, improvement and etc. done should be included in the guarantor of the disclosure
Within the scope of shield.
Claims (10)
1. a kind of optical wavelength measurement system based on Fourier's mode-locked laser, comprising:
Laser generating unit, Fourier's mode-locked laser signal of corresponding relationship when generating triangular form frequency；
Second photo-coupler (8), is connected with the laser generating unit, for swashing measured signal light and Fourier's mode locking
Optical signal coupling, forms combined beam light；And
Signal detection and processing unit are connected with second photo-coupler (8), and being used for will be through second photo-coupler (8)
The combined beam light of formation is detected and is handled.
2. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 1, the laser generating unit, packet
It includes:
Semiconductor optical amplifier (1), electric current injection is lower generate laser and make by light obtain gain；
First optoisolator (2): it is connected with the semiconductor optical amplifier (1), for guaranteeing the one way propagation of light；
Tunable optical filter (4): being connected with first optoisolator (2), for closing Fourier's mode-locked laser signal time-frequency
System has a generally triangular shape；
Arbitrary waveform generator (3): being connected to one end of the tunable optical filter (4), for generating any adjustable voltage
Signal；
Zero dispersion fiber delay line (5): being connected to the other end of the tunable optical filter (4), prolongs to the light in link
When；
First photo-coupler (6): being connected with the zero dispersion fiber delay line (5), has beam splitting effect, mixed optical signal one
Part is output to second photo-coupler (8), and a part feeds back to humorous to guarantee in Fourier's mode-locked laser signal link
Vibration；And
Second optoisolator (7): being connected with first photo-coupler (6), guarantees that fairing hour hands are propagated.
3. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 1, the signal detection and processing
Unit includes:
Photodetector (9) is used for the combined beam light formed through the second photo-coupler (8) and measured signal light beat frequency；
Real-time oscilloscope (10), for acquiring the result data of the photodetector (9) beat frequency in real time；And
Computer (11) carries out Mathematical treatment to the real-time oscilloscope (10) data collected.
4. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, first optoisolator (2)
Or second optoisolator (7) isolation be higher than 30dB.
5. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, first optoisolator (2)
Or second optoisolator (7) include: spatial light isolator or fiber optic isolator.
6. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, the tunable optical filter (4)
Fineness is up to 1000 or more, spectral region 15THz, tuned frequency 2kHz~2.5kHz.
7. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, the fast tunable light filtering
Device (4), comprising: the optical fiber filter based on fabry perot cavity.
8. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, first photo-coupler (6)
Or second photo-coupler (8), comprising: directional coupler based on evanescent wave coupling or based on the multiple-mode interfence of multimode interference effect
Coupler.
9. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, the zero dispersion fiber delay time
Line (5), comprising: the zero dispersion optical fiber of dispersive optical fiber and dispersion compensating fiber composition.
10. the optical wavelength measurement system of Fourier's mode-locked laser according to claim 2, the photodetector (9),
It includes: germanium silicon, indium phosphide that material, which is made,.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811295587.8A CN109506788A (en) | 2018-11-01 | 2018-11-01 | Optical wavelength measurement system based on Fourier's mode-locked laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811295587.8A CN109506788A (en) | 2018-11-01 | 2018-11-01 | Optical wavelength measurement system based on Fourier's mode-locked laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109506788A true CN109506788A (en) | 2019-03-22 |
Family
ID=65747364
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811295587.8A Pending CN109506788A (en) | 2018-11-01 | 2018-11-01 | Optical wavelength measurement system based on Fourier's mode-locked laser |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109506788A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109612590A (en) * | 2018-12-27 | 2019-04-12 | 中国科学院半导体研究所 | Ultrafast optical wavelength measurement system |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101777728A (en) * | 2010-02-09 | 2010-07-14 | 浙江大学 | Sweep frequency laser light source based on hyperfine tuned filter |
| CN102969651A (en) * | 2012-11-27 | 2013-03-13 | 上海理工大学 | Rapid K-space linear frequency sweep laser source |
| CN103928834A (en) * | 2014-04-25 | 2014-07-16 | 北京交通大学 | Ultra-narrow line-width FDML ring-shaped laser based on SOA |
| CN104332817A (en) * | 2014-10-20 | 2015-02-04 | 山西大学 | Single-frequency laser wavelength comparison device and method |
| AU2013211513B2 (en) * | 2008-10-22 | 2015-03-26 | Massachusetts Institute Of Technology | Fourier domain mode locking |
| US20150192405A1 (en) * | 2007-01-10 | 2015-07-09 | Lightlab Imaging, Inc. | Methods and Apparatus for Swept-Source Optical Coherence Tomography |
| CN107689834A (en) * | 2017-09-29 | 2018-02-13 | 中国科学院半导体研究所 | Wave generator system and method based on time domain frequency domain mapping |
-
2018
- 2018-11-01 CN CN201811295587.8A patent/CN109506788A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150192405A1 (en) * | 2007-01-10 | 2015-07-09 | Lightlab Imaging, Inc. | Methods and Apparatus for Swept-Source Optical Coherence Tomography |
| AU2013211513B2 (en) * | 2008-10-22 | 2015-03-26 | Massachusetts Institute Of Technology | Fourier domain mode locking |
| CN101777728A (en) * | 2010-02-09 | 2010-07-14 | 浙江大学 | Sweep frequency laser light source based on hyperfine tuned filter |
| CN102969651A (en) * | 2012-11-27 | 2013-03-13 | 上海理工大学 | Rapid K-space linear frequency sweep laser source |
| CN103928834A (en) * | 2014-04-25 | 2014-07-16 | 北京交通大学 | Ultra-narrow line-width FDML ring-shaped laser based on SOA |
| CN104332817A (en) * | 2014-10-20 | 2015-02-04 | 山西大学 | Single-frequency laser wavelength comparison device and method |
| CN107689834A (en) * | 2017-09-29 | 2018-02-13 | 中国科学院半导体研究所 | Wave generator system and method based on time domain frequency domain mapping |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109612590A (en) * | 2018-12-27 | 2019-04-12 | 中国科学院半导体研究所 | Ultrafast optical wavelength measurement system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103712689B (en) | Continuous laser device spectral line width measurement device based on optical frequency comb | |
| US9581495B2 (en) | Spectral analysis device based on Brillouin dynamic grating and analysis method thereof | |
| US7426038B2 (en) | Detection device, optical path length measurement device, measurement instrument, optical member evaluation method, and temperature change detection method | |
| CN108614126B (en) | Angular velocity measurement device and method based on wideband adjustable optical-electronic oscillator | |
| CN100587427C (en) | Optical fiber temperature sensor based on wave length demodulation | |
| Kim et al. | Mapping of intermodal beat length distribution in an elliptical-core two-mode fiber based on Brillouin dynamic grating | |
| CN107727365B (en) | A kind of system using reflectance spectrum fineness measurement optical waveguide loss | |
| CN102829806A (en) | Optical fiber sensing system based on phase-shifted optical fiber grating | |
| JP5517228B1 (en) | Method and system for evaluating crosstalk characteristics of multi-core optical fiber | |
| RU102256U1 (en) | DEVICE FOR MEASURING PHYSICAL FIELD PARAMETERS | |
| JP2011501137A (en) | System and method for determining chromatic dispersion of short waveguides using a three-wave interference pattern and a single arm interferometer | |
| CN103674497A (en) | High accuracy measurement system of line width of narrow line width laser | |
| CN105652378B (en) | Optical circulator | |
| CN106679935B (en) | A kind of device and method of single mode optical fiber birefringence measurement | |
| CN103644991B (en) | Based on the method for measuring stress of the double optical fiber grating of Distributed Feedback Laser demodulation | |
| CN204115925U (en) | Multaxial stress photonic crystal fiber proving installation | |
| CN109506788A (en) | Optical wavelength measurement system based on Fourier's mode-locked laser | |
| CN108918466A (en) | A kind of multiple Michelson's interferometer based on beam splitter in optical fiber cable | |
| CN110319940A (en) | The laser fiber interferometer diagnostic system of high-density plasma density measure | |
| WO2019205028A1 (en) | Optical fiber laser pressure sensor and pressure measurement method therefor | |
| CN106248208A (en) | A kind of apparatus and method of the unrelated measurement of spectrum polarizing based on the depolarized structure of frequency domain | |
| Imran et al. | Measurement of the group-delay dispersion of femtosecond optics using white-light interferometry | |
| Hao et al. | A long-haul and high-accuracy fiber length measurement technology based on Mach–Zehnder and Sagnac hybrid interferometer | |
| Lucki et al. | Fiber Optic and Free Space Michelson Interferometer—Principle and Practice | |
| Konstantinov et al. | Metrological Applications of Optical Reflectometry: A Review |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20190322 |