CN109283920B - DCS system connection fault testing device and method - Google Patents
DCS system connection fault testing device and method Download PDFInfo
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- CN109283920B CN109283920B CN201811367875.XA CN201811367875A CN109283920B CN 109283920 B CN109283920 B CN 109283920B CN 201811367875 A CN201811367875 A CN 201811367875A CN 109283920 B CN109283920 B CN 109283920B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
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Abstract
The invention relates to a test device and a test method for a nuclear DCS system connection fault, and belongs to the field of nuclear power system test. The device comprises a device board card, a case and a panel, and is characterized in that the device board card comprises a Pcb (printed circuit board), a plurality of types of paired connectors and a toggle switch; the Pcb is used for welding the plurality of types of paired connectors and the toggle switch; the paired connectors are used for connecting a tested DCS system outside the testing device and the toggle switch; the toggle switch is used for connecting or disconnecting a single connecting line between the paired connectors. The invention also discloses a test method which belongs to the same conception with the device. The invention completes multiple connection fault tests by using a single device, saves test resources and test time, and improves test coverage rate.
Description
Technical Field
The invention relates to the field of nuclear power system testing, in particular to a testing device and a testing method for a DCS system connection fault.
Background
The high safety of the nuclear power station requires that the nuclear power DCS system has high reliability, and the system provides enough self-diagnosis capability, including power supply diagnosis, master-slave state diagnosis, communication diagnosis, channel diagnosis and the like of hardware modules, wherein the diagnosis is mainly realized by monitoring and judging transmission signals of various hardware, the hardware is connected and transmitted through various connectors, and the connection fault can be diagnosed by disconnecting the connection.
At present, the types of connectors are various, the number of pins included in a single connector and the amount of signals transmitted are increasing, and often, a test needs to simulate the processing and diagnosis conditions of a system when a certain signal or a plurality of signals fail to be transmitted, and generally, the purpose can be achieved by disconnecting one or more pins of the related connector.
To perform this test, the general practice is as follows:
1) the whole connector is disconnected, and all relevant signals are failed at the moment;
2) adopting a destructive method to disconnect a single connecting wire or a contact pin;
3) and manufacturing a single fault plug connector or fault connecting line aiming at the modules connected by the different types of connectors.
The existing fault simulation method has the following defects:
1) the method for disconnecting the whole connector cannot simulate single-path or multi-path connection faults, and the test coverage is insufficient;
2) the destructive method has the problem of difficult recovery, which causes resource waste;
3) making individual faulty connectors or faulty connections increases the complexity of test resource management, requiring more test preparation and execution time by the tester.
Disclosure of Invention
In view of the above analysis, the present invention aims to provide a testing apparatus and a testing method for a connection fault of a DCS system, which solve the problem of simulation of single-path or multi-path signal faults and fault recovery of multiple interfaces in the prior art, and can complete multiple connection fault tests by using a single apparatus, thereby saving test resources and test time and improving test coverage.
The purpose of the invention is mainly realized by the following technical scheme:
the embodiment of the invention provides a testing device for connection faults of a DCS (distributed control system), which comprises a device board card, a case and a panel, and is characterized in that the device board card comprises a Pcb (printed circuit board), multiple types of paired connectors and a toggle switch; the Pcb is used for welding the plurality of types of paired connectors and the toggle switch; the paired connectors are used for connecting a tested DCS system outside the testing device and the toggle switch; the toggle switch is used for connecting or disconnecting a single connecting line between the paired connectors.
Optionally, the chassis is used for mounting and fixing the device board card; the panel is used for identifying and managing the device board card.
Optionally, the specific structure comprises five types of paired connectors, wherein each paired connector and the plurality of toggle switches are welded on the same Pcb.
Optionally, the five types of the pair of connectors include:
the first type is a 64-pin European connector female head and a 64-pin European connector male head;
type two, a 110-pin high-speed connector female head and a 110-pin high-speed connector male head;
type three, DB9 connector female and DB9 connector male;
type four, DB25 connector female and DB25 connector male;
type five, two symmetric RJ45 interfaces.
Alternatively, the pair of connectors of other types than type five may have a plurality of pin connections or pins.
Optionally, the toggle switch is a single-pole two-position toggle switch, and includes a common terminal and a normally closed terminal.
Optionally, a common terminal of the single-pole two-position toggle switch is connected to one pin of the paired connectors at one end of the device board card, and a normally closed terminal is connected to the same pin of the paired connectors corresponding to the other end of the device board card.
Optionally, each pin connection or pin of each type of said pair of connectors is controlled to be connected or disconnected by one of said single pole two position toggle switches.
Optionally, the hardware of the system under test is connected by a plug-and-pull interface of pins of the pair of connectors.
Preferably, a test method based on the test device for DCS system connection failure includes the following steps:
disconnecting a tested object A and a tested object B of a tested DCS;
secondly, connecting a side connector of the test device to a connector of the object A to be tested through a prefabricated cable, and connecting a connector of the object B to be tested with the other side connector of the test device;
step three, all toggle switches in the testing device are switched to a closed position, the tested object A and the tested object B are simultaneously electrified and the working states of the tested objects A and the tested objects B are checked, and at the moment, the DCS does not have the connection fault of the tested object A, B;
step four, defining and determining a connector pin corresponding to the fault to be simulated according to the connector interface of the tested object, and finding out a toggle switch on the testing device corresponding to the connector pin as a testing switch;
step five, the selected test switch is switched to an open position, and the DCS prompts the connection fault of the corresponding pin circuit;
step six, the opened test switch is switched to a closed position, and the DCS prompts the connection fault recovery of the corresponding pin circuit;
and step seven, repeating the step four to the step six, and completing the test of the hardware connection fault diagnosis function of all the DCS systems.
The beneficial effects of the above technical scheme are as follows: the embodiment of the invention discloses a testing device and a testing method for connection faults of a DCS (distributed control system), wherein the testing device comprises a device board card, a case and a panel, and is characterized in that the device board card comprises a Pcb (printed circuit board), multiple types of paired connectors and a toggle switch; the Pcb is used for welding the plurality of types of paired connectors and the toggle switch; the paired connectors are used for connecting a tested DCS system outside the testing device and the toggle switch; the toggle switch is used for connecting or disconnecting a single connecting line between the paired connectors. Compared with the prior art, the embodiment of the invention realizes that the same device integrates various interfaces, solves the simulation problem of single-path or multi-path signal failure and failure recovery of various interfaces, can use a single device to complete various connection failure tests, saves test resources and test time, and improves test coverage.
A test method based on the test device comprises the following steps: disconnecting a tested object A and a tested object B of a tested DCS; secondly, connecting a side connector of the test device to a connector of the object A to be tested through a prefabricated cable, and connecting a connector of the object B to be tested with the other side connector of the test device; step three, all toggle switches in the testing device are switched to a closed position, the tested object A and the tested object B are simultaneously electrified and the working states of the tested objects A and the tested objects B are checked, and at the moment, the DCS does not have the connection fault of the tested object A, B; step four, defining and determining a connector pin corresponding to the fault to be simulated according to the connector interface of the tested object, and finding out a toggle switch on the testing device corresponding to the connector pin as a testing switch; step five, the selected test switch is switched to an open position, and the DCS prompts the connection fault of the corresponding pin circuit; step six, the opened test switch is switched to a closed position, and the DCS prompts the connection fault recovery of the corresponding pin circuit; and step seven, repeating the step four to the step six, and completing the test of the hardware connection fault diagnosis function of all the DCS systems. Compared with the existing testing method, the embodiment of the invention adopts the independent toggle switch to control the on-off of the single connecting wire, realizes flexible operation, can simulate single-path faults and various combined faults, improves the testing coverage rate, saves the preparation and execution time of testing personnel, and further reduces the complexity of the management of testing resources.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The drawings are only for purposes of illustrating particular embodiments and are not to be construed as limiting the invention, wherein like reference numerals are used to designate like parts throughout.
Fig. 1 is a schematic diagram of a testing apparatus for a DCS system connection fault according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a DCS connection fault testing device according to an embodiment of the present invention
FIG. 3 is a schematic diagram of a device card structure of a testing device according to an embodiment of the present invention;
FIG. 4 is a flowchart of a testing method based on a testing apparatus according to an embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a DCS system to be tested according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a testing method based on a testing apparatus according to an embodiment of the present invention.
Detailed Description
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate preferred embodiments of the invention and together with the description, serve to explain the principles of the invention and not to limit the scope of the invention.
The technical idea of the invention aims at the following problems in the existing fault testing method: the method for disconnecting the whole connector cannot simulate single-path or multi-path connection faults, and the test coverage is insufficient; the destructive method has the problem of difficult recovery, which causes resource waste; the complexity of test resource management is increased by manufacturing an independent fault plug connector or a fault connecting line, more test preparation and execution time are required for testers, the multi-interface signal on-off testing device is provided, the simulation problem of single-path or multi-path signal fault and fault recovery of various interfaces is solved, various connection fault tests can be completed by using a single device, the test resources and the test time are saved, and the test coverage rate is improved.
Fig. 1 is a schematic diagram of a testing apparatus for DCS system connection failure according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of a DCS system connection fault testing apparatus according to an embodiment of the present invention.
A specific embodiment of the present invention, as shown in fig. 1 and fig. 2, discloses a test apparatus for a DCS system connection fault, which includes an apparatus board card, a chassis, and a panel, and in combination with the apparatus board card structure schematic diagram of the test apparatus shown in fig. 2 and fig. 3, the apparatus board card includes a Pcb printed board, a plurality of types of paired connectors, and a toggle switch; the Pcb is used for welding the plurality of types of paired connectors and the toggle switch; the paired connectors are used for connecting a tested DCS system outside the testing device and the toggle switch; the toggle switch is used for connecting or disconnecting a single connecting line between the paired connectors. As shown in fig. 1 and fig. 2, in the testing apparatus for DCS system connection failure according to the embodiment of the present invention, in order to fix and protect the device board and facilitate identification and storage of the device, the device board is installed and fixed in a special manufacturing box, and a panel is additionally installed. Compared with the prior art, the embodiment of the invention realizes that the same device integrates various interfaces, solves the simulation problem of single-path or multi-path signal failure and failure recovery of various interfaces, can use a single device to complete various connection failure tests, saves test resources and test time, and improves test coverage.
In a specific embodiment of the present invention, as shown in fig. 1 and fig. 2, the chassis is used for mounting and fixing the device board; the panel is used for identifying and managing the device board card.
It should be noted that the test apparatus mainly has the following structure and functions:
1) device board card
Pcb printed board: the welding device is used for welding the toggle switch and the connector to realize the circuit connection in the device;
a pair of each of the plurality of types of connectors: for connecting the tested objects;
toggle switch: a single wire for connecting or disconnecting a pair of connectors;
2) case and panel
The case is used for installing and fixing the device board card;
and the panel is used for identifying and keeping the device board card.
According to an embodiment of the invention, referring to fig. 1 and 2, a pair of five types of paired connectors and a plurality of toggle switches are welded on the same Pcb. In specific application, the five types of paired connectors and the plurality of toggle switches are welded on the Pcb, so that the integration of multiple interfaces in the same device is realized.
In a specific embodiment of the present invention, referring to fig. 1, the five types of the pair connectors include:
a 64-pin European connector female head (1a) and a 64-pin European connector male head (1b) in a type I;
type two, a 110-pin high-speed connector female head (2a) and a 110-pin high-speed connector male head (2 b);
type three, DB9 connector female (3a) and DB9 connector male (3 b);
type four, DB25 connector female (4a) and DB25 connector male (4 b);
type five, two symmetrical RJ45 interfaces (5).
It should be noted that the functional features of the above-mentioned various types of paired connectors are respectively: the standard connectors can be mutually inserted, and the corresponding contact pins are connected after the standard connectors are inserted. The differences between the types are: the shapes are different, and the pin numbers are different.
In one embodiment of the present invention, as shown in fig. 1 and 3, the pairs of connectors of types other than type five have a plurality of pin connections or pins.
In particular, in practice, the type one paired connector has 64 pins; the paired connectors of type two have 110 pins; the paired connector of type three has 9 pins; the type four pair connector has 25 pins.
In one embodiment of the present invention, as shown in fig. 3, the toggle switch is a single-pole two-position toggle switch, and includes a common terminal and a normally closed terminal.
The single-pole two-position switch is structurally characterized by comprising a common end and a normally closed end, wherein the common end is connected with the normally closed end when the switch is closed, and the common end is disconnected with the normally closed end when the switch is opened.
In an embodiment of the present invention, as shown in fig. 3, a common terminal of a single-pole two-position toggle switch is connected to one pin of the pair of connectors at one end of the device board card, and a normally closed terminal is connected to the same pin of the pair of connectors corresponding to the other end of the device board card.
It should be noted that fig. 3 shows a schematic connection diagram of one toggle switch and each connector, and the connection methods of the other toggle switches and the connectors are similar, that is, a pin of the paired connectors that is commonly connected to one end of the device board card is terminated, and a normally closed end is connected to the same pin of the paired connectors that is corresponding to the other end of the device board card.
In an embodiment of the present invention, referring to fig. 1, each pin connection or pin of each type of the paired connectors is controlled to be connected or disconnected by one of the single-pole two-position toggle switches. That is, a toggle switch is used to connect or disconnect a single wire between the pair of connectors. A single wire corresponds to one pin in a wire or pin connection mode.
In an embodiment of the present invention, referring to fig. 1 and fig. 3, the hardware of the system under test is connected through the pin-in-and-pull interface of the pair of connectors. That is to say, the hardware connection interfaces of the system under test all adopt the plug-in type, so that the test method is unified, the test execution efficiency is effectively improved, and the management of the test resources is facilitated.
In an embodiment of the present invention, as shown in fig. 4, a method for testing a test apparatus based on the DCS system connection fault includes the following steps:
s1, disconnecting the tested object A and the tested object B of the tested DCS system;
s2, connecting one side connector of the test device to the connector of the tested object A through the prefabricated cable, and connecting the connector of the tested object B with the other side connector of the test device;
s3, all toggle switches in the testing device are dialed to a closed position, the tested object A and the tested object B are simultaneously electrified and the working state of the tested object A and the tested object B is checked, and at the moment, the DCS does not have the connection fault of the tested object A, B;
s4, determining the connector pin corresponding to the fault to be simulated according to the connector interface definition of the tested object, and finding out the toggle switch on the testing device corresponding to the connector pin as the testing switch;
s5, the selected test switch is dialed to the open position, and the DCS prompts the connection fault of the corresponding pin circuit;
s6, the opened test switch is dialed to a closed position, and the DCS prompts the connection fault recovery of the corresponding pin circuit;
and S7, repeating the fourth step to the sixth step to complete the test of the hardware connection fault diagnosis function of all DCS systems.
Compared with the existing testing method, the embodiment of the invention adopts the independent toggle switch to control the on-off of the single connecting wire, realizes flexible operation, can simulate single-path faults and various combined faults, improves the testing coverage rate, saves the preparation and execution time of testing personnel, and further reduces the complexity of testing resource management.
It should be noted that, the tested DCS system includes a large amount of hardware, the hardware is connected through connectors, each connector has a plurality of pin lines, and the processing condition of the system when one or more lines fail is often required to be tested during testing. Fig. 5 shows a schematic structural diagram of a DCS system under test, which includes two parts, namely, a test object a and a test object B, connected by a prefabricated cable; as shown in fig. 6, a schematic diagram of a testing method based on a testing apparatus, a connector on one side (a side) of the testing apparatus is connected to a connector of a tested object a through a prefabricated cable, and a connector of a tested object B is connected to a connector on the other side (B side) of the testing apparatus. The test starts to perform the following operations: firstly, all toggle switches are closed to electrify a tested system, and the fact that the DCS does not have the connection fault of the tested object A, B is determined according to the working state of the tested system; determining a connector pin corresponding to a fault to be simulated according to the connector interface definition of the tested object, and finding out a toggle switch on the testing device corresponding to the connector pin as a testing switch; and sequentially opening the found test switches, prompting the connection fault of the corresponding pin circuit by the tested DCS, and then sequentially closing the opened test switches, and prompting the connection fault recovery of the corresponding pin circuit by the tested DCS. And repeating the steps circularly until the test of the hardware connection fault diagnosis function of all the DCS systems is completed.
In summary, the invention discloses a test device for connection faults of a DCS, which comprises a device board card, a case and a panel, wherein the device board card comprises a Pcb printed board, a plurality of types of paired connectors and a toggle switch; the Pcb is used for welding the plurality of types of paired connectors and the toggle switch; the paired connectors are used for connecting a tested DCS system outside the testing device and the toggle switch; the toggle switch is used for connecting or disconnecting a single connecting line between the paired connectors. A test method based on the test device comprises the following steps:
disconnecting a tested object A and a tested object B of a tested DCS;
secondly, connecting a side connector of the test device to a connector of the object A to be tested through a prefabricated cable, and connecting a connector of the object B to be tested with the other side connector of the test device;
step three, all toggle switches in the testing device are switched to a closed position, the tested object A and the tested object B are simultaneously electrified and the working states of the tested objects A and the tested objects B are checked, and at the moment, the DCS does not have the connection fault of the tested object A, B;
step four, defining and determining a connector pin corresponding to the fault to be simulated according to the connector interface of the tested object, and finding out a toggle switch on the testing device corresponding to the connector pin as a testing switch;
step five, the selected test switch is switched to an open position, and the DCS prompts the connection fault of the corresponding pin circuit;
step six, the opened test switch is switched to a closed position, and the DCS prompts the connection fault recovery of the corresponding pin circuit;
and step seven, repeating the step four to the step six, and completing the test of the hardware connection fault diagnosis function of all the DCS systems.
Compared with the prior art, the invention has the following obvious advantages: various interfaces are integrated in one device, so that the number of testing devices is reduced, and the management efficiency of the testing device is improved; the universal plug-in interface is convenient to access, the test method is unified, and the test execution efficiency is effectively improved; the independent toggle switch is adopted to control the on-off of the single connecting wire, the operation is flexible, single-path faults and various combined faults can be simulated, the test coverage is improved, and the actual test effect is good.
Those skilled in the art will appreciate that all or part of the processes for implementing the methods in the above embodiments may be implemented by a computer program, which is stored in a computer-readable storage medium, to instruct associated hardware. The computer readable storage medium is a magnetic disk, an optical disk, a read-only memory or a random access memory.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (7)
1. A test device for connection faults of a DCS (distributed control system) comprises a device board card, a case and a panel, and is characterized in that the device board card comprises a Pcb (printed circuit board), multiple types of paired connectors and a toggle switch;
the Pcb is used for welding the plurality of types of paired connectors and the toggle switch;
the paired connectors are used for connecting a tested DCS system outside the testing device and the toggle switch;
the hardware of the tested DCS is connected through pin plug-pull interfaces of the paired connectors;
the paired connectors are connected with a tested object A and a tested object B of the tested DCS system which are disconnected;
the toggle switch is used for connecting or disconnecting a single connecting line between the paired connectors;
the five types of paired connectors are respectively welded on the same Pcb printed board in a pair and a plurality of toggle switches;
the five types of the pair connectors include:
the first type is a 64-pin European connector female head and a 64-pin European connector male head;
type two, a 110-pin high-speed connector female head and a 110-pin high-speed connector male head;
type three, DB9 connector female and DB9 connector male;
type four, DB25 connector female and DB25 connector male;
type five, two symmetric RJ45 interfaces.
2. The test device of claim 1, wherein the chassis is configured to mount and secure the device board; the panel is used for identifying and managing the device board card.
3. The test apparatus as claimed in claim 1, wherein the pairs of connectors of types other than type five have a plurality of pin connections or pins.
4. The test device of claim 1, wherein the toggle switch is a single-pole, two-position toggle switch comprising a common terminal and a normally closed terminal.
5. The test device of claim 4, wherein a single pole, two position toggle switch is commonly terminated to one pin of the pair of connectors at one end of the device board and normally closed to the same pin of the pair of connectors at the other end of the device board.
6. The test device as claimed in claim 5, wherein each pin connection or pin of each type of said pair of connectors is controlled to be connected or disconnected by one of said single-pole two-position toggle switches.
7. A test method based on the DCS system connection fault test device of any claim 1 to 6, characterized by comprising the following steps:
disconnecting a tested object A and a tested object B of a tested DCS;
secondly, connecting a side connector of the test device to a connector of the object A to be tested through a prefabricated cable, and connecting a connector of the object B to be tested with the other side connector of the test device;
step three, all toggle switches in the testing device are switched to a closed position, the tested object A and the tested object B are simultaneously electrified and the working states of the tested objects A and the tested objects B are checked, and at the moment, the DCS does not have the connection fault of the tested object A, B;
step four, defining and determining a connector pin corresponding to the fault to be simulated according to the connector interface of the tested object, and finding out a toggle switch on the testing device corresponding to the connector pin as a testing switch;
step five, the selected test switch is switched to an open position, and the DCS prompts the connection fault of the corresponding pin circuit;
step six, the opened test switch is switched to a closed position, and the DCS prompts the connection fault recovery of the corresponding pin circuit;
and step seven, repeating the step four to the step six, and completing the test of the hardware connection fault diagnosis function of all the DCS systems.
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| CN204203760U (en) * | 2014-10-11 | 2015-03-11 | 广州汽车集团股份有限公司 | Fault simulation circuit and CAN RTA reliability test assembly |
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