CN109142913B - Automatic test system for detecting complete machine of implanted medical equipment - Google Patents
Automatic test system for detecting complete machine of implanted medical equipment Download PDFInfo
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- CN109142913B CN109142913B CN201810814788.8A CN201810814788A CN109142913B CN 109142913 B CN109142913 B CN 109142913B CN 201810814788 A CN201810814788 A CN 201810814788A CN 109142913 B CN109142913 B CN 109142913B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- A61N1/00—Electrotherapy; Circuits therefor
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Abstract
The invention provides an automatic test system for detecting a complete machine of implanted medical equipment, which comprises: the device comprises a shifting tool, a power supply and a computer; the displacement tool is provided with a charging programmer and a test board and is used for changing the relative position of the charging programmer and the implant device to be tested; the test board is provided with an element for providing load for the implanted device to be tested and an interface for connecting the implanted device to be tested; the computer is respectively connected with the test board, the charging programmer and the power supply and is used for controlling elements on the test board to provide loads for the tested implant device, controlling the charging programmer to charge the power supply through the tested implant device and obtaining working parameters of the tested implant device through the charging programmer.
Description
Technical Field
The invention relates to the technical field of medical equipment detection, in particular to an automatic test system for detecting a complete machine of implanted medical equipment.
Background
An Implantable Medical Device (IMD) is a Medical apparatus installed inside the body of a user, and the IMD has a battery, a circuit board (provided with sensors, chips, etc.), and implements corresponding therapy depending on a set program and operating parameters, which may be set differently according to the condition of the user. Because the causes and conditions of the users are different, different implantable medical devices installed in the bodies of the users generally have different operating states, and the operating states are represented in various aspects of the battery voltage, the operating time, the power, the current magnitude, the frequency and the like of the implantable medical devices.
In order to ensure the stability and the safety of the implanted part, the implanted part generally needs to be detected comprehensively, the existing scheme adopts manual work to detect the whole machine, and the efficiency of the detection mode is low.
Disclosure of Invention
The invention provides an automatic test system for detecting a complete machine of implanted medical equipment, which comprises:
the device comprises a shifting tool, a power supply and a computer;
the displacement tool is provided with a charging programmer and a test board and is used for changing the relative position of the charging programmer and the implant device to be tested;
the test board is provided with an element for providing load for the implanted device to be tested and an interface for connecting the implanted device to be tested;
the computer is respectively connected with the test board, the charging programmer and the power supply and is used for controlling elements on the test board to provide loads for the tested implant device, controlling the charging programmer to charge the power supply through the tested implant device and obtaining working parameters of the tested implant device through the charging programmer.
Optionally, the power supply is further configured to provide power to the charging programmer, the test board and the device under test, so that the device under test outputs a waveform signal according to the load provided by the test board.
Optionally, the system further includes an acquisition card, configured to acquire a waveform signal output by the implant device to be tested; and the computer acquires the waveform signal output by the implanted device to be tested through the acquisition card.
Optionally, the charging programmer is further used for reading intrinsic information of the tested implanted device; the computer determines signals for controlling elements on the test board from the intrinsic information.
Optionally, the computer is further configured to control the displacement tool to change a relative position of the implant device under test and the charging programmer during charging.
Optionally, a magnet is further arranged on the displacement tool; the computer is also used for controlling the displacement tool to change the relative position of the magnet and the tested implantation equipment and detecting the working state of an electromagnetic switch in the tested implantation equipment.
Optionally, the interface on the test board for connecting the device under test is a contact switching device; the contact switching device comprises a plurality of metal elastic sheets which are respectively used for connecting output electrodes of the tested implantation equipment, and the metal elastic sheets are respectively connected with elements which are used for providing loads and arranged on the test board through leads.
Optionally, the operating parameters include charging current, charging voltage, temperature.
Optionally, the computer is further configured to read an operating parameter of the charging programmer, and calculate the charging efficiency according to the operating parameter of the implant device to be tested and the operating parameter of the charging programmer.
Optionally, the computer is further configured to set an output parameter of the implant device under test by the charging programmer.
The test system provided by the invention simulates the battery of the implant equipment by using the power supply, simulates the external charge equipment by using the charge programmer, simulates the load condition of the implant equipment in a use state by using the test board, enables the implant equipment to be tested to be in an actual working environment, simultaneously changes the relative position of the coil of the charge programmer and the implant equipment by using the shifting tool to simulate the charge operation which possibly occurs in the actual use process of a user, controls the charge process by using the computer and reads the working parameters of the implant equipment, carries out a relatively strong test on the charge performance of the implant equipment, realizes automatic operation in the whole test process, and has relatively high working efficiency.
Drawings
The features and advantages of the present invention will be more clearly understood by reference to the accompanying drawings, which are illustrative and not to be construed as limiting the invention in any way, and in which:
FIG. 1 is a schematic diagram of an implanted device detection system in accordance with an embodiment of the present invention;
FIG. 2 is a schematic diagram of an implanted device detection system in accordance with another embodiment of the present invention;
FIG. 3 is a flow chart of a circuit board inspection method according to an embodiment of the present invention;
FIG. 4 is a flow chart of a circuit board inspection method in another embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a test board according to an embodiment of the present invention;
FIG. 6 is a schematic circuit diagram of a test board according to an embodiment of the present invention;
FIG. 7 is a schematic structural diagram of a connection portion of an implantable device under test according to an embodiment of the present invention;
FIG. 8 is a schematic structural diagram of a connecting portion of an implantable device under test according to another embodiment of the present invention;
fig. 9 is a schematic structural diagram of a contact adapter according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The implanted device communicates wirelessly and charges/powers the implanted battery/capacitor. The implanted device generally includes a circuit board, charging and communication coils, a battery, an output electrode, and a number of sampling resistors. The implanted device under test in embodiments of the present invention does not include a battery or capacitor.
An embodiment of the present invention provides an automatic test system for testing an implanted medical instrument, as shown in fig. 1, the system including: a shift tool 11, a power supply 12 and a computer 13. The shift tool 11 is provided with a charging programmer 14 and a test board 16, and the shift tool 11 is used for changing the relative position of the charging programmer 14 and the implanted device 15 to be tested.
The specific structure of the displacement tool 11 can be chosen from various options, for example, it can be an electric device with one or more guide rails, and the charging programmer 14 and the implanted device under test 15 can be respectively placed on two platforms capable of realizing relative movement, so that the position change between the two platforms can be realized. The charging programmer 14 in the embodiment of the present invention simulates an external charging device, and the charging programmer 14 is also provided with an induction coil inside. The relative position in this embodiment may be a relative distance, and may also include a relative angle, etc., depending on the structure of the shift tool 11.
The test board 16 is provided with a component for providing a load to the implant device 15 under test and an interface for connecting the implant device 15 under test. The components on the test board 16 may include, for example, relays, analog switches, resistors, etc., which are used to simulate the loading condition of the implanted device 15 under test when actually implanted in a human body.
The computer 13 is connected to the test board 16, the charging programmer 14 and the power supply 12 respectively, and is used for controlling the components on the test board 16 to provide loads to the device under test 15, and controlling the coils of the charging programmer 14 to charge the power supply 12 (the power supply is a battery simulator and is set as a rechargeable battery during the charging test) through the device under test 15, and acquiring the operating parameters of the device under test 15 through the charging programmer 14. These operating parameters may be communicated to charge programmer 14 by way of wireless communication.
During the charging process of the power source 12, the displacement tool 11 may change the relative position between the coil of the charging programmer 14 and the implant device 15 to be tested, and the change of the distance or the angle between the coil and the implant device 15 to be tested will affect the working parameters of the implant device 15 to be tested, which may include, for example, the charging current, the charging voltage, the temperature, and the like. The coil of the charge programmer 14 will communicate with the implant device 15 under test by wireless communication to read these parameters. For collecting the charging current, an ammeter 17 may be disposed between the power source 12 and the testing board 16 to measure the charging current, and then the computer 13 may compare the data with the charging current of the current sensor of the implant device 15 under test transmitted by wireless communication, and these operating parameters will be used as the testing result to determine whether the implant device 15 under test is qualified or not. In the non-charging state, i.e., during the period when the device under test 15 is performing a therapeutic test, the ammeter 17 may be used for reading power consumption test data of the power supply.
The test system provided by the embodiment of the invention simulates a battery of the implant device by using a power supply, simulates an external charging device by using the charging programmer, simulates the load condition of the implant device in a use state by using the test board, enables the implant device to be tested to be in an actual working environment, changes the relative position of the coil of the charging programmer and the implant device by using the shifting tool to simulate the charging operation which possibly occurs in the actual use process of a user, controls the charging process by using a computer and reads working parameters of the implant device, performs a relatively strong test on the charging performance of the implant device, realizes automatic operation in the whole test process, and has relatively high working efficiency.
As a preferred implementation, the computer 13 in this embodiment may also read the operating parameters of the charging programmer 14, and calculate the charging efficiency according to the operating parameters of the implant device 15 to be tested and the operating parameters of the charging programmer 14. Charging efficiency is the charging current of the implant device 15 under test and the voltage of the implant device 15 under test/(charging programmer voltage charging programmer current).
The charging current and voltage of the implant device 15 and the charging programmer 14 can be sampled by themselves, and the charging efficiency can be calculated by the charging programmer 14 and then sent to the computer 13.
In another embodiment of the present invention, on the basis of the previous embodiment, as shown in fig. 2, a magnet 19 is further disposed on the displacement tool 11 of this embodiment. The implanting device is usually provided with an electromagnetic switch for resetting, a user can trigger the switch through a magnet to realize corresponding control, the magnet 19 in the embodiment is used for detecting the resetting function of the implanted device 15 to be tested, and the computer 13 can control the displacement tool 11 to change the relative position of the magnet 19 and the implanted device 15 to be tested, and detect the working state of the electromagnetic switch on the implanted device 15 to be tested.
In this embodiment, the displacement tool 11 controls the position change of two sets of devices, namely the relative position of the magnet 19 and the implant device 15 to be tested, and the relative position of the coil of the charge programmer 14 and the implant device 15 to be tested. For this purpose, the displacement tool 11 may be provided with two orthogonal guide rails, wherein the X-axis guide rail is used to change the relative position of the magnet 19 and the implantation device 15 to be tested, and the magnet 19 can laterally approach or move away from the implantation device 15 to be tested when moving along the X-axis guide rail; the Y-axis guide is used to change the relative position of the charging programmer 14 coils and the implant device 15 under test, and the charging programmer 14 may move longitudinally closer to or further away from the implant device 15 under test as it moves along the Y-axis guide.
In order to more fully test the performance of the implanted device, the system of the present embodiment also collects the output signal of the tested implanted device 15. The power source 12 in this embodiment is also used to provide power to the charging programmer 14, the test board 16 and the device under test 15, so that the device under test 15 outputs a waveform signal, such as an electrical pulse stimulation signal, according to the load provided by the test board 16.
Correspondingly, the system also comprises an acquisition card 18 for acquiring the waveform signal output by the implantation device 15 to be tested, and the computer 13 acquires the waveform signal output by the implantation device 15 to be tested through the acquisition card.
The computer 13 may also set output parameters of the implant device 15 under test via the charging programmer 14. The computer 13 controls the charging programmer to program the implant device 15 under test by wireless communication, and for example, the pulse output amplitude and frequency of the implant device 15 under test can be set according to the test requirements.
The test of the output waveform, the test of the charging process, and the test of the reset function may be performed in any order, and these detection operations do not conflict.
Those skilled in the art will appreciate that manufacturers also typically provide a variety of types and models of implant devices, such as brain pacemakers, spinal cord stimulators, and the like. In order to enable the detection system provided by the present invention to detect circuit boards from different implanted devices, as a preferred embodiment, the charging programmer 14 in this embodiment is further configured to read intrinsic information of the implanted device under test 15, and the computer 13 can determine signals for controlling components on the test board 16 according to the intrinsic information. Therefore, the system can provide proper load signals for different models of implantation equipment, and has better expansibility.
The above-mentioned process of reading the inherent information should be performed before the detection is started, and in conjunction with the above-mentioned detection function, the embodiment of the present invention further provides a detection method, which is executed by the above-mentioned computer 13, as shown in fig. 3, and the method includes the following steps:
s1, acquiring, by the charging programmer 14, intrinsic information of the implanted device 15 under test of the implanted device, where the information may be recorded in the implanted device 15 under test, or may be recorded in the charging programmer 14, and specifically may be type information, model information, and the like;
S2A, determining a distance value and a charging parameter according to the inherent information, wherein the distance value represents the distance between the coil of the charging programmer 14 and the implant device 15 to be tested; the charging parameter may be, for example, a charging current. Before testing, each piece of intrinsic information and its corresponding test scheme (including distance values and charging parameters) may be stored in the computer 13, and when the test board 16 is connected to the device 15 to be tested after the start of testing, the computer 13 may obtain the intrinsic information and query the test scheme (including distance values and charging parameters) corresponding thereto.
S3A, sending the charging parameters to the charging programmer 14 and the implanted device under test 15. The charging parameters in this embodiment include power output parameters for charging programmer 14 and power receiving parameters for implant device 15 under test. These charging parameters may, for example, specify that charging programmer 14 output power at one or more charging currents, and accordingly, may also specify that implanted device under test 15 switch appropriate resistance parameters to accommodate the magnitude of the charging current. As mentioned above, the computer 13 is connected to the test board 16, and the charging parameters can be transmitted to the implanted device 15 through the test board 16.
And S4A, controlling the movable tool 11 to adjust the distance between the coil of the charging programmer 14 and the tested implant device 15 according to the distance value, setting the power supply 12 to be in a charged state by the computer 13, and controlling the charging programmer 14 to charge the power supply 12 in an incoming line mode through the tested implant device 15 based on the charging parameters. For example, the distance value can be set to be one or more, that is, the distance value and the distance value can be wirelessly charged at a fixed distance or at a plurality of different distances; at each distance, one or more corresponding charging parameters can be set, and the charging effect can be flexibly and comprehensively detected according to the requirements of products and users.
S5A, receiving the working parameters fed back by the implanted device 15 according to the charging parameters, specifically, reading the working parameters recorded by the sensor on the implanted device 15 through the testing board 16, which may include, for example, charging voltage, charging current, and temperature value;
S6A, determining whether the implanted device 15 is normal according to the operating parameters, for example, determining whether the charging voltage, the charging current, the temperature value, etc. of the implanted device 15 are expected to be normal, so as to determine whether the state is normal.
The detection method provided by the embodiment of the invention determines corresponding test parameters by automatically acquiring the inherent information of the tested implant equipment, and sends appropriate charging parameters to the charging programmer and the tested implant equipment, so that the tested implant equipment is in an actual working environment, and simultaneously, the relative position of a coil of the charging programmer and the tested implant equipment is changed by using the shifting tool to simulate the charging operation which possibly occurs in the actual use process of a user.
In order to improve convenience and accuracy, the intrinsic information is preferably stored in the implanted device under test 15, and the step S1 may specifically include the following steps:
s11, sending a start signal to the charging programmer 14, and waiting for the charging programmer 14 to communicate with the implanted device under test 15 to obtain the intrinsic information.
S12, the intrinsic information fed back by the charging programmer 14 is received.
The starting signal may be a simple digital signal, and after receiving the starting signal, the charging programmer 14 may wirelessly send a handshake signal, which may be a waveform signal, to the implanted device under test 15; the implant device under test 15 may interpret the handshake signal and respond by sending the intrinsic information to the charge programmer 14 and then to the computer 13.
As a preferred implementation, the charging parameters in this embodiment include a charging time and a charging current, wherein each distance value corresponds to the same charging time and charging currents, respectively. For example, four distance values X1 … … X4, charging time t, and charging current a1 … … a4 may be preset, and these parameters may form various combinations, and S4A may include the following steps:
S4A1, controlling the movable tool 11 to respectively set the charging programmer 14 and the tested implantation equipment 15 at each distance for corresponding charging time;
and S4A2, controlling the charging programmer 14 to charge the power supply 12 through the tested implant device 15 and the tested implant device 15 respectively based on a plurality of charging currents during the stay.
For example, the charging operation corresponding to X1 can be completed by stopping at least 4 × t (four time periods with the same length) at the distance X1 and respectively charging the time periods by using a1 … … a 4; and then adjusting the distance to X2, similarly stopping for four time periods with the same length, respectively charging by adopting A1 … … A4 in each time period, and then completing the charging action corresponding to X1 … … X4 by adopting the same operation mode at the distances of X3 and X4.
S5A is synchronized with S4A, and the computer 13 collects the working parameters of the implant device 15 to be tested in the charging process in real time, so that four sets of parameters, i.e., working parameters corresponding to four different distances, can be obtained, wherein each set of parameters includes the working parameters corresponding to four charging currents.
The preferable detection scheme can accurately detect the working state of the implant device to be detected under different distances and different charging parameters, so that the reliability of the detection result is improved.
In order to further improve the reliability and convenience of the detection operation, after the step S1, the method may further include:
S1A, determining the criterion parameter according to the inherent information, and the step can be performed synchronously with S2A. The criterion parameters should correspond to the operating parameters collected in step S5A, and may include, for example, a standard charging voltage, a standard charging current, a temperature upper limit value, and the like.
In case the criterion parameter is available, step S6A may comprise the following steps:
S6A1, comparing the working parameters with the criterion parameters;
and S6A2, judging whether the tested implant device 15 is normal according to the comparison result, for example, judging whether the working parameter is consistent with the criterion parameter or whether the error of the working parameter and the criterion parameter is within an acceptable range, thereby determining whether the tested implant device 15 is normal.
The detection operation of the output waveform will be described below. After step S1, the computer 13 may control the charging programmer 14 to set the device under test 15 by wireless communication, for example, the output amplitude and frequency thereof may be set, and then perform the detection process of the output signal, specifically, as shown in fig. 4, the method may further include the following steps:
S2B, determining the load parameter and the power supply parameter according to the intrinsic information, wherein the load parameter and the power supply parameter may be part of the test scheme, and this step may be performed in synchronization with the step S2A. The load parameters and power supply parameters of various types or models of products are different, and the load parameters are 1k resistance for a nerve stimulator and 500 ohm resistance for a spinal cord stimulator, for example; the power supply parameter is, for example, a power supply voltage.
S3B, controlling the power supply 12 to supply power to the implanted device 15 to be tested according to the power supply parameters, setting the power supply 12 to be in an output power state by the computer 13, and supplying power to the implanted device 15 to be tested to simulate an actual working state;
S4B, sending load parameters to the test board 16 connected to the device 15 to be tested, wherein the test board 16 will adjust its own element state according to the received load parameters to simulate the load of the device 15 to be tested, so that the device 15 to be tested outputs waveform signals under the influence of the load parameters;
S5B, acquiring the waveform signal output by the implantation device 15 to be tested through the acquisition card 18;
and S6B, judging whether the implanted device 15 to be tested is normal or not according to the waveform signal.
The steps S3B-S6B and the steps S3A-S6A are isolated from each other and do not interfere with each other, the method carries out full-automatic detection on the output signal of the tested implantation equipment 15, and the comprehensiveness and convenience of the detection operation are further improved.
The judgment of the output waveform may further include, after step S1, similarly to step S1A:
S1B, determining a criterion signal according to the inherent information;
in this case, step S6B may include:
S6B1, comparing the waveform signal with the criterion signal;
and S6B2, judging whether the implanted device 15 to be tested is normal according to the comparison result, wherein the signal comparison method has various specific modes, and the invention is not repeated.
Besides the detection of the charging function and the output signal, a step of detecting the reset function of the implant device 15 to be tested may be added, where the step is performed under the condition that the power supply 12 is ensured to supply power to the implant device 15 to be tested, and the computer 13 controls the magnet on the mobile tool 11 to be close to the implant device 15 to be tested, and meanwhile, the charging programmer 14 is used to check whether the implant device 15 to be tested is reset (the initial values of various parameters are restored).
An embodiment of the present invention provides a computer device, including: at least one processor; and a memory communicatively coupled to the at least one processor; the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor, so that the at least one processor executes the method for detecting the circuit board of the implanted medical instrument.
Accordingly, an embodiment of the present invention provides a detection circuit board for an implanted medical instrument, which is used as the test board 16, and as shown in fig. 5, the test board 16 includes:
the implant device under test connection part 161 is used to connect each output electrode of the implant device under test 15, and the implant device under test connection part 161 has various specific forms, which are intended to be electrically connected to the output electrodes.
And the load unit 163 is used for simulating the load of the implant device to be tested. The unit can be provided with a plurality of load elements to simulate the load born by different tested implant devices 15, such as 1k resistor for a nerve stimulator, 500 ohm resistor for a spinal cord stimulator, and the like.
A selection unit 164 and an acquisition device connection section 165. The collecting device connecting part 165 is connected to the implant device connecting part 161 to be tested via the selecting unit 164. The selecting unit 164 controls the connection relationship between the collecting device connecting portion 165 and the output electrode connected thereto, and the collecting device connecting portion 165 is connected to an external collecting device, i.e., the collecting card 18, so that the collecting card 18 can obtain a signal sent by the connected electrode under the influence of a load.
In practice, the implanted device 15 under test usually comprises more output electrodes, for example, a brain pacemaker may have more than ten output electrodes, each of which can individually emit a stimulation signal. For accurate detection, the detection program may control only some of the output electrodes to emit signals at the same time, accordingly, the collecting device connecting portion 165 may connect all of the output electrodes through the selecting unit 164, and the selecting unit 164 may switch on only some of the electrodes from which signals are being output at the same time.
According to the detection circuit board for the implanted medical instrument, provided by the embodiment of the invention, the tested implanted equipment and the external detection equipment can be connected through the circuit board, the tested implanted equipment can simulate the actual working state through the load unit, and meanwhile, the selection unit is used for controlling the communication state of the external equipment and the output electrode, so that a signal sent by the tested implanted equipment is obtained.
As a preferred embodiment, as shown in fig. 6, the selecting unit 164 includes a plurality of analog switches, the analog switches are respectively connected to the corresponding output electrodes (including the metal casing) of the tested implant device in a one-to-one correspondence, and the connection relationship between the output electrodes and the collecting device connecting portion 165 is controlled by the open and close states of the analog switches. The collecting device connecting portion 165 outputs a waveform signal emitted by the electrode under the influence of a load to an external collecting device.
In this embodiment, the selection unit 164 is provided with two switch sets, the collection device connection portion 165 is provided with two corresponding access ports Out1 and Out2, and each access port is connected to the output electrode (including the metal shell) of the implant device 15 to be tested through a different switch set. In this embodiment, the port Out1 is connected to one end of the first switch set 1641, and the other end of the first switch set 1641 is connected to all output electrodes and the metal shell; the port Out2 is connected to one end of a second switch set 1642, and the other end of the second switch set 1642 is connected to all output electrodes and the metal housing.
The two ports Out1 and Out2 of the acquisition device connection 165 are connected to any two of the metal enclosure and all output electrodes of the implant device under test. The states of the first switch group 1641 and the second switch group 1642 can be controlled by a single chip microcomputer. Specifically, any two output electrodes are connected with a computer through an interface, a serial port chip and a single chip microcomputer, and the computer controls corresponding analog switches in the first switch group 1641 and the second switch group 1642 according to test requirements, so that the connection between the acquisition card and the electrode output end is realized.
In practical application, more access ports and more switch groups can be arranged to collect more output signals at the same time.
In a preferred embodiment, the load unit 163 may include:
a plurality of sets of load elements 1631 for simulating loads of different types of implant devices, respectively;
a plurality of analog switches, which constitute a third switch group 1632, for controlling the connection state of the plurality of groups of load elements 1631 with the collecting apparatus connecting part 165 and the output electrodes. Two ports Out1 and Out2 are connected to both ends of the load. Through the interface connected with the computer, the serial port chip and the single chip microcomputer, the computer controls the corresponding analog switches in the third switch group 1632 according to the test requirements, so that the connection between the two ports Out1 and Out2 and different loads is realized. Optional loads include DBS (deep brain stimulation), VNS (vagal nerve stimulation), SCS (Spinal cord stimulation), and SNM (Sacral nerve stimulation) loads, among others.
Therefore, loads of different product types are connected with any two output electrodes, and output waveforms of the tested implantation equipment 15 are connected to the Out1 and Out2 and fed back to the acquisition card 18 for processing.
With regard to the supply of power and the acquisition of the charging current of the test board 16, the power source 12 and the ammeter 17 can be connected to the test board 16. The power supply 12 can provide two paths of power supply, one path is a variable voltage power supply 10 (the range is 4.1V-2V), and a battery simulation power supply (a charging product is used for charging function test) is adopted to supply power for the tested implanted equipment 15; the other is a constant voltage, and the electrical elements on the test board 16 are powered through the voltage chip.
With respect to the device under test connection 161, the present invention provides two alternative embodiments.
As a first embodiment, as shown in fig. 7, the device under test connection unit 161 includes a contact adapter 1611, a gold finger plug 1612, and a gold finger socket 1613. The contact adapter 1611 and the gold finger plug 1612 are fixedly connected, for example, may be integrally provided; the golden finger plug 1612 is connected with the golden finger socket 1613 in a pluggable mode. Wherein
The contact adapter 1611 is provided with a plurality of metal spring pieces for connecting to the output electrodes of the implant device under test. For example, if there are 8 output electrodes on one output cable of the implant device under test, the contact switching device 1611 is correspondingly provided with 8 sets of metal elastic pieces, and the metal elastic pieces are electrically connected with the electrodes;
the gold finger plug 1612 is provided with a plurality of metal contact pieces which are respectively correspondingly connected with the metal elastic pieces of the contact switching device 1611, and can be electrically connected through a lead wire for example;
the gold finger socket 1613 is fixed on the circuit board body 160, for inserting the gold finger plug 1612, and connecting the selection unit 164 through a wire.
According to the embodiment, the golden finger socket is arranged on the circuit board body and is connected with the contact switching device through the golden finger plug, so that the output electrode of the tested implant equipment is connected, the golden finger socket can be connected with the whole tested implant equipment and also can be used for being connected with the core circuit board of the tested implant equipment, and the test board has certain universality and can meet different test requirements.
As a second embodiment, as shown in fig. 8, the device under test connection unit 161 includes:
the contact relay 1611 differs from the previous embodiment in that it is directly fixed to the circuit board body 160. The metal spring pieces are respectively connected with the output electrodes of the implantation equipment to be tested and are directly connected with the selection unit 164 through leads.
Compared with the former embodiment, the embodiment has the advantages of simple structure and strong pertinence, and can be specially used for meeting the test requirements of the whole machine of the tested implantation equipment.
With respect to the contact transfer device 1611, the preferred configuration of the present embodiment is provided, as shown in fig. 9, which includes a housing 16110 having a recess 16111. In this embodiment, the device has two sets of output electrodes, so the device has two corresponding grooves 16111, the pair of metal springs 16112 is disposed in the grooves 16111, and the pair of metal springs and the bottom of the grooves 16111 can clamp the output cable 151 of the device. The metal elastic sheet has certain elasticity between the pair of metal elastic sheets and is combined with the bottom of the shell, and the structure can play the effects of firm fixation and convenient plugging.
The multiple output electrodes of the implanted device under test are uniformly arranged at the end of the output cable 151, and accordingly the number of pairs of metal clips in the recess 16111 in this embodiment is the same as the number of electrodes on a single output cable 151 of the implanted device under test. As shown in fig. 9, 8 output electrodes are disposed at the end of the output cable 151 of the implant device under test in the embodiment, and 8 pairs of metal shrapnels 16112 are disposed in the two grooves 16111, respectively. The length of the recess 16111 in this embodiment is consistent with the length of the output electrodes arranged at the end of the output cable 151, and is only suitable for accommodating the end of the output cable 151, so that when the output cable 151 is inserted into the recess 16111, the end of the output cable 151 can contact the bottom of the side end of the recess 16111, and each metal spring plate pair can be just contacted with each output electrode.
In the structure, the length of the groove of the contact switching device is consistent with the arrangement length of the tail end electrodes of the output cable, and the clamping receiving point of the output cable of the tested implantation equipment is only arranged on the metal electrode.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. An automatic test system for testing a complete machine of an implanted medical device, comprising:
the device comprises a shifting tool, a power supply and a computer;
the displacement tool is provided with a charging programmer and a test board, the displacement tool is used for changing the relative position of the charging programmer and the tested implantation equipment, the displacement tool is an electric device provided with one or more guide rails, and the charging programmer and the tested implantation equipment are respectively placed on two platforms capable of realizing relative motion;
the test board is provided with an element for providing load for the implanted device to be tested and an interface for connecting the implanted device to be tested;
the computer is respectively connected with the test board, the charging programmer and the power supply and is used for controlling elements on the test board to provide loads for the tested implant device, controlling the charging programmer to charge the power supply through the tested implant device and obtaining working parameters of the tested implant device through the charging programmer.
2. The system of claim 1, wherein the power supply is further configured to provide power to the charging programmer, the test board, and the device under test to cause the device under test to output a waveform signal according to the load provided by the test board.
3. The system of claim 2, further comprising an acquisition card for acquiring the waveform signal output by the implant device under test; and the computer acquires the waveform signal output by the implanted device to be tested through the acquisition card.
4. The system of claim 1, wherein the charging programmer is further configured to read intrinsic information of the implanted device under test; the computer determines signals for controlling elements on the test board from the intrinsic information.
5. The system of claim 1, wherein the computer is further configured to control the shifting tool to change the relative position of the implant device under test and the charging programmer during charging.
6. The system of claim 1, wherein the displacement tool is further provided with a magnet; the computer is also used for controlling the displacement tool to change the relative position of the magnet and the tested implantation equipment and detecting the working state of an electromagnetic switch in the tested implantation equipment.
7. The system according to claim 1, wherein the test board is provided with contact switching means for connecting with the implanted device under test; the contact switching device comprises a plurality of metal elastic sheets for connecting output electrodes of the tested implantation equipment, and the metal elastic sheets are respectively connected with elements for providing loads on the test board through leads.
8. The system of claim 1, wherein the operating parameters include charging current, charging voltage, temperature.
9. The system of claim 1, wherein the computer is further configured to read operating parameters of the charging programmer and calculate the charging efficiency based on the operating parameters of the implant device under test and the operating parameters of the charging programmer.
10. The system of claim 1, wherein the computer is further configured to set output parameters of the implant device under test via the charging programmer.
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| CN201810814788.8A CN109142913B (en) | 2018-07-23 | 2018-07-23 | Automatic test system for detecting complete machine of implanted medical equipment |
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| CN109142913B true CN109142913B (en) | 2020-09-11 |
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| CN109143029B (en) * | 2018-07-23 | 2020-07-24 | 清华大学 | Method and equipment for automatic traversal test of active implantable medical instrument |
| CN113126596B (en) * | 2021-03-31 | 2024-01-26 | 北京品驰医疗设备有限公司 | Charging test system of external control equipment for implantable medical device |
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