CN109085443B - Power adapter rated life testing method - Google Patents
Power adapter rated life testing method Download PDFInfo
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- CN109085443B CN109085443B CN201811267470.9A CN201811267470A CN109085443B CN 109085443 B CN109085443 B CN 109085443B CN 201811267470 A CN201811267470 A CN 201811267470A CN 109085443 B CN109085443 B CN 109085443B
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Abstract
The invention discloses a method for testing the rated service life of a power adapter, which comprises the following steps: acquiring a power adapter to enable the power adapter to be in a full-load state; performing high and low temperature cycle test on the power adapter; after the high-low temperature cycle test is finished, detecting whether the power adapter fails or not; if not, performing an electromagnetic compatibility test on the power adapter; after the electromagnetic compatibility test is finished, detecting whether the power adapter fails or not; if not, carrying out average fault-free time test on the power adapter; after the mean time between failures test is carried out for a first set time, the service lives of all electrolytic capacitors in the power adapter are calculated; and taking the service life of the electrolytic capacitor with the shortest service life of all the electrolytic capacitors as the rated service life of the power adapter. By the method and the device, the rated service life of the power adapter can be effectively estimated.
Description
Technical Field
The invention relates to the technical field of automation, in particular to a method for testing rated service life of a power adapter.
Background
The power adapter, as a power supply conversion device for small portable electronic devices and electronic appliances, generally refers to a small component that converts commercial power conforming to the place of use into input voltage conforming to the electric device, and belongs to the core device of electronic products.
When the existing testing method is used for testing the reliability of the power adapter, a long-time uninterrupted work simulation experiment is carried out on the power adapter, and the working state of the power adapter is checked by observing the input and the output of the power adapter through naked eyes. The method has the following defects:
1. the whole testing process needs to be attended, the labor is occupied, and the simulation aging needs to be carried out for a long time.
2. The testing engineering can not effectively detect the components of the power adapter and can not determine the theoretical life of the core device, the core device of the power adapter mainly comprises a switching transformer, a secondary rectifier tube, an inductance coil, a power adapter fuse, a filter capacitor, a chip, a rectifier bridge, a filter capacitor and a piezoresistor, and when only an aging experiment is carried out, the components are effective in the range of the aging experiment, but the theoretical life of the core device can not be determined.
3. The simple aging experiment does not have strict scientificity, the theoretical service life of one power adapter is at least 5000h, the aging experiment cannot carry out long-time test of 5000h, generally 7 x 24h, and unqualified products pass the test at a certain probability.
Disclosure of Invention
In view of this, the present invention provides a method for testing a rated life of a power adapter, so as to effectively estimate the rated life of the power adapter.
A method of rated life testing of a power adapter, the method comprising:
obtaining a power adapter, and enabling the power adapter to be in a full-load state, wherein the power adapter comprises a primary electrolytic capacitor and a secondary electrolytic capacitor;
performing high and low temperature cycle test on the power adapter;
after the high-low temperature cycle test is finished, detecting whether the power adapter fails or not;
if not, performing an electromagnetic compatibility test on the power adapter;
after the electromagnetic compatibility test is finished, detecting whether the power adapter fails or not;
if not, carrying out average fault-free time test on the power adapter;
after the mean time without fault test is carried out for a first set time, acquiring the maximum rated temperature, the maximum ripple current, the guaranteed service life and the frequency coefficient of the primary electrolytic capacitor and the secondary electrolytic capacitor;
obtaining rated voltage and actual input voltage of the primary electrolytic capacitor;
testing to obtain actual ripple current and surface temperature of the primary electrolytic capacitor and the secondary electrolytic capacitor;
substituting the guaranteed life of the primary electrolytic capacitor, the maximum rated temperature, the maximum ripple current, the rated voltage, the actual input voltage, the frequency coefficient, the actual ripple current and the surface temperature into a first formula to obtain the life of the primary electrolytic capacitor;
substituting the maximum rated temperature, the maximum ripple current, the frequency coefficient, the actual ripple current and the surface temperature of the secondary electrolytic capacitor into a second formula to obtain the service life of the secondary electrolytic capacitor, wherein the second formula is a formula different from the first formula;
comparing the service life of the primary electrolytic capacitor with the service life of the secondary electrolytic capacitor to obtain the service life of the electrolytic capacitor with the shortest service life;
and taking the service life of the electrolytic capacitor with the shortest service life of all the electrolytic capacitors as the rated service life of the power adapter.
Optionally, the first formula is:
Lo*2(To-Tx)/10*2(ΔTo-ΔTx)/8*(Vo/Vx)4.4where △ To is (5- (actual ripple current/maximum ripple current) frequency coefficient), △ Tx is (actual ripple current/(maximum ripple current) frequency coefficient) 5, Lo is the guaranteed lifetime, To is the maximum rated temperature, Tx is the surface temperature, Vo is the rated voltage, and Vx is the actual input voltage.
Optionally, the second formula is:
Lo*2(To-Tx)/10*2(5-ΔTx)/5where Lo is the guaranteed lifetime, To is the maximum rated temperature, Tx is the surface temperature, and △ Tx ═ 5 (actual ripple current/(maximum ripple current × frequency coefficient)).
Optionally, the causing the power adapter to be in a fully loaded state comprises:
and configuring output voltage and current corresponding to the power adapter through an electronic load, or configuring a cement resistor with nominal power to the power adapter, so that the power adapter outputs the nominal voltage and current to the cement resistor.
Optionally, before performing the high and low temperature cycle test on the power adapter, the method further includes:
performing an aging test on the power adapter;
after the aging test is finished, detecting whether the power adapter fails or not;
and if not, performing high-low temperature cycle test on the power adapter.
Optionally, before performing the burn-in test on the power adapter, the method further includes:
performing a vibration test on the power adapter;
after the vibration test is finished, detecting whether the power adapter fails or not;
and if not, carrying out an aging test on the power adapter.
Optionally, before performing the mean time between failures test on the power adapter, the method further includes:
performing a power on/off test on the power adapter;
after the startup and shutdown test is finished, detecting whether the cycle times of power-off and power-on of the power adapter are greater than or equal to the set times;
if yes, carrying out mean time between failures test on the power adapter.
Optionally, the power on/off test specifically includes:
the power adapter is powered on, the power supply of the power adapter is cut off after the power adapter is powered on for a second set time, the power supply of the power adapter is restored after the power adapter is powered off for a third set time, the power adapter is enabled to work again, and the power adapter is cycled in sequence until the cycle times of the power-off and the power-on of the power adapter are greater than or equal to the set times; the first set time is longer than the second set time, and the second set time is longer than the third set time.
Compared with the prior art, the method for testing the rated service life of the power adapter provided by the invention at least realizes the following beneficial effects:
1) according to the method for testing the rated service life of the power adapter, the theoretical service life of the power adapter is judged by adopting the combination of a plurality of test tests such as a high-low temperature cycle test, an electromagnetic compatibility test and an average fault-free time test, so that the quality of a core component of the power adapter is guaranteed in actual production.
2) The method for testing the rated service life of the power adapter provided by the invention can accurately test the service life of specific hours by adopting the mean time between failures to predict the theoretical service life, is convenient to quantify, and can ensure that other electrical equipment cannot be damaged due to the failure of the power adapter in use by combining an electromagnetic compatibility test.
3) The method for testing the rated service life of the power adapter only needs to perform a sample sealing test according to the flow before actual production, so that the production labor cost is greatly saved.
Of course, it is not necessary for any product in which the present invention is practiced to achieve all of the above-described technical effects simultaneously.
Other features of the present invention and advantages thereof will become apparent from the following detailed description of exemplary embodiments thereof, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention.
FIG. 1 is a flow chart of a method for testing the rated life of a power adapter according to an embodiment of the present invention;
FIG. 2 is another flow chart of a method for testing the rated life of a power adapter according to an embodiment of the present invention;
FIG. 3 is a flowchart of a boot test according to an embodiment of the invention.
Detailed Description
Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
Fig. 1 is a flowchart of a method for testing a rated life of a power adapter according to an embodiment of the present invention, including the following steps:
step 100: and acquiring a power adapter to enable the power adapter to be in a full-load state.
Wherein, the power adapter includes primary electrolytic capacitor and secondary electrolytic capacitor. It should be noted that, according to the internal structure of the power adapter, the power adapter includes a primary electrolytic capacitor and a secondary electrolytic capacitor, and specifically, the power adapter has a transformer therein, the electrolytic capacitor located at the primary side of the transformer is referred to as the primary electrolytic capacitor, and the electrolytic capacitor located at the secondary side of the transformer is referred to as the secondary electrolytic capacitor.
Specifically, the causing the power adapter to be in a fully loaded state includes:
and configuring output voltage and current corresponding to the power adapter through an electronic load, or configuring a cement resistor with nominal power to the power adapter, so that the power adapter outputs the nominal voltage and current to the cement resistor.
For example, when the current power adapter has a nominal current of 1.5A and a nominal voltage of 12V (the nominal voltage and the nominal current are obtained by referring to the name plate of the power adapter and the specification of the power adapter), in one embodiment, the electronic load is connected to the power adapter and the power adapter outputs 12V1.5A power to the electronic load, or in another embodiment, a cement resistor with nominal power is connected to the power adapter to simulate the load, and the cement resistor with nominal power may be a cement resistor with P ═ UI ═ 12 ═ 1.5 ═ 18W, so that the requirement of the power adapter for full-load operation can be met.
Step 101: and carrying out high-low temperature cycle test on the power adapter.
Specifically, the low-temperature test in the high-low temperature test can refer to GB-T2423.1-2008, and the high-temperature test in the high-low temperature test can refer to GB-T2423.2-2008; specifically, the high-low temperature test process comprises the following steps: setting to carry out high-low temperature circulation every 6 hours, wherein the high temperature is 55 ℃, the low temperature is-20 ℃, the power adapter is externally connected with an electronic load, only the power adapter is placed in a high-low temperature environment to carry out the high-low temperature circulation, and generally the high-low temperature circulation needs to be carried out for 28 periods.
Step 102: after the high-low temperature cycle test is finished, detecting whether the power adapter fails or not; if yes, go to step 103; otherwise, step 104 is performed.
It should be noted that, in the embodiment of the present invention, the failure of the power adapter means that the power adapter cannot normally operate after performing a high-temperature and low-temperature cycle test.
Step 103: and (6) ending.
Step 104: and performing an electromagnetic compatibility test on the power adapter.
Specifically, electromagnetic Compatibility (EMC) refers to the ability of a device or system to operate satisfactorily in its electromagnetic environment and not to generate intolerable electromagnetic interference to any device in its environment. The surge test is one of electromagnetic compatibility tests, the surge is also called a surge, and the surge is an instantaneous overvoltage exceeding a normal working voltage. In essence, a surge is a sharp pulse that occurs in only a few millionths of a second. Surges in daily life such as lightning strikes. Further, the electromagnetic compatibility test in the present invention can be performed with reference to GB 17626.5-2008-T.
Step 105: after the electromagnetic compatibility test is finished, detecting whether the power adapter fails or not; if yes, go to step 103; otherwise, step 106 is performed.
It should be noted that, in the embodiment of the present invention, the failure of the power adapter means that the power adapter cannot normally operate after the electromagnetic compatibility test is performed.
Step 106: and carrying out mean time between failures test on the power adapter.
Mean Time Between Failures (MTBF), i.e., Mean Time Between failures. MTBF is a measure of the reliability of a product, particularly an electrical product. The unit is "hour". It reflects the time quality of the product and is a capability of embodying the function of the product to be kept in a specified time.
Step 107: and after the mean time without fault test is carried out for a first set time, acquiring the maximum rated temperature, the maximum ripple current, the guaranteed service life and the frequency coefficient of the primary electrolytic capacitor and the secondary electrolytic capacitor.
It should be noted that the first set time may be determined according to the mean time between failures test calibration, for example, the first set time is 1 hour.
Step 108: and acquiring the rated voltage and the actual input voltage of the primary electrolytic capacitor.
Step 109: and testing to obtain the actual ripple current and the surface temperature of the primary electrolytic capacitor and the secondary electrolytic capacitor.
Step 110: and substituting the guaranteed service life of the primary electrolytic capacitor, the maximum rated temperature, the maximum ripple current, the rated voltage, the actual input voltage, the frequency coefficient, the actual ripple current and the surface temperature into a first formula to obtain the service life of the primary electrolytic capacitor.
Specifically, the first formula is:
Lo*2(To-Tx)/10*2(ΔTo-ΔTx)/8*(Vo/Vx)4.4where △ To is (5- (actual ripple current/maximum ripple current) frequency coefficient), △ Tx is (actual ripple current/(maximum ripple current) frequency coefficient)Rate coefficient) 5, Lo is the guaranteed lifetime, To is the maximum rated temperature, Tx is the surface temperature, Vo is the rated voltage, Vx is the actual input voltage.
Taking a 10 muF/450V primary electrolytic capacitor as an example, the service life Lo is guaranteed To be 2000h, wherein the maximum rated temperature To is 105 ℃, the mean time between failures test is carried out at a constant temperature of 25 ℃, the surface temperature of the electrolytic capacitor is detected To be 60 ℃, the maximum ripple current is 160mA, the actual ripple current is 121mA, the frequency coefficient is 1, the rated voltage Vo is 450V, the actual input voltage Vx is 360V, and the expected service life of the electrolytic capacitor is 436446h according To a first formula.
Step 111: and substituting the maximum rated temperature, the maximum ripple current, the frequency coefficient, the actual ripple current and the surface temperature of the secondary electrolytic capacitor into a second formula to obtain the service life of the secondary electrolytic capacitor, wherein the second formula is a formula different from the first formula.
Specifically, the second formula is:
Lo*2(To-Tx)/10*2(5-ΔTx)/5where Lo is the guaranteed lifetime, To is the maximum rated temperature, Tx is the surface temperature, and △ Tx ═ 5 (actual ripple current/(maximum ripple current × frequency coefficient)).
Taking a secondary electrolytic capacitor of 10 muF/50V as an example, the service life Lo is guaranteed To be 2000h, wherein the maximum rated temperature To is 105 ℃, the mean time between failures test is carried out at a constant temperature of 25 ℃, the surface temperature Tx of the electrolytic capacitor is detected To be 55 ℃, the frequency coefficient is 1, the maximum ripple current is 28mA, the actual ripple current is 120mA, and the estimated service life of the secondary electrolytic capacitor is 123260h according To a second formula.
Step 112: and comparing the service life of the primary electrolytic capacitor with the service life of the secondary electrolytic capacitor to obtain the service life of the electrolytic capacitor with the shortest service life.
Step 113: and taking the service life of the electrolytic capacitor with the shortest service life of all the electrolytic capacitors as the rated service life of the power adapter.
In the present embodiment, all the point electrolytic capacitors refer to all the primary electrolytic capacitors and the secondary electrolytic capacitors.
According to the method for testing the rated service life of the power adapter, provided by the embodiment of the invention, when the power adapter is in a full-load state, a high-low temperature cycle test and an electromagnetic compatibility test are carried out on the power adapter, the mean time without failure is carried out after the power adapter meets the high-low temperature cycle test and the electromagnetic compatibility test, and the service lives of all electrolytic capacitors in the power adapter are calculated after the mean time without failure is carried out for a first set time, so that the service life of the power adapter is obtained. The rated service life of the power adapter is related to all components based on the barrel effect, wherein the electrolytic capacitor in the power adapter is the most sensitive core component and is also a component capable of obtaining the theoretical service life value of the power adapter, and therefore the rated service life of the power adapter can be effectively determined by taking the service life of the electrolytic capacitor with the shortest service life in all the electrolytic capacitors as the rated service life of the power adapter.
In order to further determine the rated life of the power adapter more effectively, fig. 2 shows another flowchart of a method for testing the rated life of the power adapter according to an embodiment of the present invention, which includes the following steps:
step 200: and acquiring a power adapter to enable the power adapter to be in a full-load state, wherein the power adapter comprises a primary electrolytic capacitor and a secondary electrolytic capacitor.
Step 201: and carrying out vibration test on the power adapter.
Specifically, the vibration test is to control the power adapter to vibrate irregularly in the set scanning frequency, the set acceleration value, the set displacement and the set test time, check whether the power adapter is damaged in appearance after the irregular vibration, determine whether the power adapter has abnormal sound during shaking, determine whether the electrical performance is normal, and determine that the power adapter fails by any abnormal phenomenon.
Step 202: after the vibration test is finished, detecting whether the power adapter fails or not; if yes, go to step 203; otherwise, step 204 is performed.
It should be noted that the failure of the power adapter refers to: the appearance of the power adapter is damaged, abnormal sound is generated when the power adapter shakes, and the electrical performance of the power adapter is abnormal.
Step 203: and (6) ending.
Step 204: and carrying out aging test on the power adapter.
Specifically, the aging test refers to: and maintaining the power adapter in a full-load state for 7 x 24h, and detecting whether the power adapter fails.
Step 205: after the aging test is finished, detecting whether the power adapter fails or not; if yes, go to step 203; otherwise, step 206 is performed.
It should be noted that, in the embodiment of the present invention, the failure of the power adapter means that the power adapter cannot work normally.
Step 206: and carrying out high-low temperature cycle test on the power adapter.
Step 207: after the high-low temperature cycle test is finished, detecting whether the power adapter fails or not; if yes, go to step 203; otherwise, step 208 is performed.
Step 208: and performing an electromagnetic compatibility test on the power adapter.
Step 209: after the electromagnetic compatibility test is finished, detecting whether the power adapter fails or not; if yes, go to step 203; otherwise, step 210 is performed.
Step 210: and performing a power on/off test on the power adapter.
Specifically, the startup and shutdown test specifically includes:
the power adapter is powered on, the power supply of the power adapter is cut off after the power adapter is powered on for a second set time, the power supply of the power adapter is restored after the power adapter is powered off for a third set time, the power adapter is enabled to work again, and the power adapter is cycled in sequence until the cycle times of the power-off and the power-on of the power adapter are greater than or equal to the set times; the first set time is longer than the second set time, and the second set time is longer than the third set time.
It should be noted that the second setting time and the third setting time may be determined according to a specific switch test calibration, for example, the second setting time is 15s, and the third setting time is 5 s.
As shown in fig. 3, the specific process of the power on/off test includes the following steps:
step 2100: a counter is initialized.
Step 2101: the power adapter is powered up.
Step 2102: detecting whether the power adapter is electrified for a second set time; if yes, go to step 2103; otherwise, execution continues at step 2102.
Step 2103: powering down the power adapter.
Step 2104: detecting whether the power adapter is powered off for a third set time; if so, go to step 2105; otherwise, step 2104 is continued.
Step 2105: adding one to the counter, and detecting whether the counter is greater than or equal to a set number of times; if so, go to step 2106; otherwise, return to execute step 2101.
It should be noted that the set number of times may be determined according to the calibration of the power adapter, where the set number of times is the number of times of successful power on/off of the power adapter, and is the same as the rated number of times of power on/off of the power adapter, for example, the set number of times is 5000 times.
In this embodiment, in each on period, when the value of the counter +1 is greater than or equal to 5000, we can choose to count this experiment, it is not necessary to completely disable the power supply, 5000 times is already a very large value, and if the failure occurs below 5000 times, the actual successful on/off times is taken as the final on/off times.
Step 2106: and (6) ending.
Step 211: after the startup and shutdown test is finished, detecting whether the cycle times of power-off and power-on of the power adapter are greater than or equal to the set times; if so, go to step 212; otherwise, step 203 is executed.
It should be noted that the set number may be determined according to the power adapter calibration, for example, the set number is 5000 times.
Step 212: and carrying out mean time between failures test on the power adapter.
Step 213: and after the mean time without fault test is carried out for a first set time, acquiring the maximum rated temperature, the maximum ripple current, the guaranteed service life and the frequency coefficient of the primary electrolytic capacitor and the secondary electrolytic capacitor.
Step 214: and acquiring the rated voltage and the actual input voltage of the primary electrolytic capacitor.
Step 215: and testing to obtain the actual ripple current and the surface temperature of the primary electrolytic capacitor and the secondary electrolytic capacitor.
Step 216: and substituting the guaranteed service life of the primary electrolytic capacitor, the maximum rated temperature, the maximum ripple current, the rated voltage, the actual input voltage, the frequency coefficient, the actual ripple current and the surface temperature into a first formula to obtain the service life of the primary electrolytic capacitor.
Step 217: and substituting the maximum rated temperature, the maximum ripple current, the frequency coefficient, the actual ripple current and the surface temperature of the secondary electrolytic capacitor into a second formula to obtain the service life of the secondary electrolytic capacitor, wherein the second formula is a formula different from the first formula.
Step 218: and comparing the service life of the primary electrolytic capacitor with the service life of the secondary electrolytic capacitor to obtain the service life of the electrolytic capacitor with the shortest service life.
Step 219: and taking the service life of the electrolytic capacitor with the shortest service life of all the electrolytic capacitors as the rated service life of the power adapter.
According to the method for testing the rated service life of the power adapter, the vibration test, the aging test and the on-off test are added before the mean time between failures test, the EMC test and the MTBF test are combined to estimate the service life of the power adapter, the service life of the power adapter is estimated scientifically, and the service life of the power adapter is not estimated simply by a single method; through EMC experiments, people can know whether the complete machine can resist large surge under the condition of lightning stroke. Vibration tests can determine whether the ship can resist large-amplitude vibration falling or not in transportation. Through high and low temperature circulation and aging tests, whether the continuous operation has failure or not can be simulated. We can see from MTBF experiments whether the core components can continue to operate over long periods of continuous operation. The power adapter generates certain loss every time the power adapter is turned on and turned off, and through conducting a power on and off experiment, the power adapter can estimate the on-off service life of a power supply, so that the performance of the power adapter is more stable, and the rated service life of the obtained power adapter is more effective.
According to the embodiment, the method for testing the rated service life of the power adapter provided by the invention at least has the following beneficial effects:
1) according to the method for testing the rated service life of the power adapter, the theoretical service life of the power adapter is judged by adopting the combination of a plurality of test tests such as a high-low temperature cycle test, an electromagnetic compatibility test and an average fault-free time test, so that the quality of a core component of the power adapter is guaranteed in actual production.
2) The method for testing the rated service life of the power adapter provided by the invention can accurately test the service life of specific hours by adopting the mean time between failures to predict the theoretical service life, is convenient to quantify, and can ensure that other electrical equipment cannot be damaged due to the failure of the power adapter in use by combining an electromagnetic compatibility test.
3) The method for testing the rated service life of the power adapter only needs to perform a sample sealing test according to the flow before actual production, so that the production labor cost is greatly saved.
Although some specific embodiments of the present invention have been described in detail by way of examples, it should be understood by those skilled in the art that the above examples are for illustrative purposes only and are not intended to limit the scope of the present invention. It will be appreciated by those skilled in the art that modifications may be made to the above embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.
Claims (6)
1. A method for testing rated life of a power adapter, the method comprising:
obtaining a power adapter, and enabling the power adapter to be in a full-load state, wherein the power adapter comprises a primary electrolytic capacitor and a secondary electrolytic capacitor;
performing high and low temperature cycle test on the power adapter;
after the high-low temperature cycle test is finished, detecting whether the power adapter fails or not;
if not, performing an electromagnetic compatibility test on the power adapter;
after the electromagnetic compatibility test is finished, detecting whether the power adapter fails or not;
if not, carrying out average fault-free time test on the power adapter;
after the mean time without fault test is carried out for a first set time, acquiring the maximum rated temperature, the maximum ripple current, the guaranteed service life and the frequency coefficient of the primary electrolytic capacitor and the secondary electrolytic capacitor;
obtaining rated voltage and actual input voltage of the primary electrolytic capacitor;
testing to obtain actual ripple current and surface temperature of the primary electrolytic capacitor and the secondary electrolytic capacitor;
substituting the guaranteed life of the primary electrolytic capacitor, the maximum rated temperature, the maximum ripple current, the rated voltage, the actual input voltage, the frequency coefficient, the actual ripple current and the surface temperature into a first formula to obtain the life of the primary electrolytic capacitor; the first formula is:
Lo*2(To-Tx)/10*2(ΔTo-ΔTx)/8*(Vo/Vx)4.4wherein △ To is (5- (actual ripple current/maximum ripple current) frequency coefficient), △ Tx is (actual ripple current/(maximum ripple current) frequency coefficient) 5, Lo is the guaranteed lifetime, To is the maximum rated temperature, Tx is the surface temperature, Vo is the rated voltage, Vx is the actual input voltage;
substituting the guaranteed life of the secondary electrolytic capacitor, the maximum rated temperature, the maximum ripple current, the frequency coefficient, the actual ripple current and the surface temperature into a second formula to obtain the life of the secondary electrolytic capacitor, wherein the second formula is as follows:
Lo*2(To-Tx)/10*2(5-ΔTx)/5lo is the guaranteed life, To is the maximum rated temperature, Tx is the surface temperature, △ Tx (actual ripple current/(maximum ripple current) frequency coefficient) 5;
and taking the service life of the electrolytic capacitor with the shortest service life of all the electrolytic capacitors as the rated service life of the power adapter.
2. The power adapter rated life test method of claim 1, wherein said placing the power adapter in a fully loaded state comprises:
configuring the power adapter with an output voltage, current, or
And configuring a cement resistor with nominal power for the power adapter, so that the power adapter outputs nominal voltage and current to the cement resistor.
3. The method of claim 2, wherein prior to performing the high and low temperature cycling test on the power adapter, the method further comprises:
performing an aging test on the power adapter;
after the aging test is finished, detecting whether the power adapter fails or not;
and if not, performing high-low temperature cycle test on the power adapter.
4. The method of claim 3, wherein prior to performing a burn-in test on the power adapter, the method further comprises:
performing a vibration test on the power adapter;
after the vibration test is finished, detecting whether the power adapter fails or not;
and if not, carrying out an aging test on the power adapter.
5. The method of claim 4, wherein prior to performing the mean time between failures test on the power adapter, the method further comprises:
performing a power on/off test on the power adapter;
after the startup and shutdown test is finished, detecting whether the cycle times of power-off and power-on of the power adapter are greater than or equal to the set times;
if yes, carrying out mean time between failures test on the power adapter.
6. The power adapter rated life test method according to claim 5, wherein the power on/off test specifically comprises:
the power adapter is powered on, the power supply of the power adapter is cut off after the power adapter is powered on for a second set time, the power supply of the power adapter is restored after the power adapter is powered off for a third set time, the power adapter is enabled to work again, and the power adapter is cycled in sequence until the cycle times of the power-off and the power-on of the power adapter are greater than or equal to the set times; the first set time is longer than the second set time, and the second set time is longer than the third set time.
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