CN109005404B

CN109005404B - Test system and method capable of detecting type of camera module

Info

Publication number: CN109005404B
Application number: CN201811021038.1A
Authority: CN
Inventors: 蒋思远; 张纪琦; 唐宝文
Original assignee: SHENZHEN DOTHINKEY TECHNOLOGY Co Ltd
Current assignee: SHENZHEN DOTHINKEY TECHNOLOGY Co Ltd
Priority date: 2018-09-03
Filing date: 2018-09-03
Publication date: 2020-02-14
Anticipated expiration: 2038-09-03
Also published as: CN109005404A

Abstract

The invention discloses a test system and a test method capable of detecting the type of a camera module. Wherein the system comprises: the camera module is respectively connected with the automatic detection circuit and the channel switching circuit, and the main control chip is respectively connected with the camera module, the automatic detection circuit and the channel switching circuit. Through the mode, the channel switching circuit can be connected to the D _ PHY channel in a closed mode to form a loop according to the control signal for connecting the D _ PHY channel in a closed mode to form the loop, or connected to the C _ PHY channel in a closed mode to form the loop according to the control signal for connecting the C _ PHY channel in a closed mode to form the loop, the C _ PHY and D _ PHY camera modules compatible with MIPI can be tested, and the testing efficiency is high.

Description

Test system and method capable of detecting type of camera module

Technical Field

The invention relates to the technical field of camera module testing, in particular to a testing system and a testing method capable of detecting the type of a camera module.

Background

At present, with the development of science and technology, in the Mobile communication era, a Mobile terminal such as a Mobile phone becomes a necessity of people's life, and people have higher and higher requirements on the image quality and pixels of a camera of the Mobile terminal, so that the testing requirements on a camera module are higher and higher, but the existing testing scheme for the camera module cannot be compatible with the testing of a C _ PHY (Physical Layer of a three-wire Interface) and a D _ PHY (Physical Layer of a D _ Physical Layer with high speed and low power consumption) camera module of a MIPI (Mobile industry processor Interface), and only the corresponding camera module can be tested by replacing testing equipment, and the testing efficiency is low.

Disclosure of Invention

In view of this, the present invention provides a testing system and method capable of detecting the type of a camera module, which can implement compatibility testing of the C _ PHY and D _ PHY camera modules of the MIPI, and has high testing efficiency.

According to an aspect of the present invention, there is provided a test system capable of detecting a camera module type, including:

the device comprises a camera module, an automatic detection circuit, a main control chip and a channel switching circuit;

the camera module is respectively connected with the automatic detection circuit and the channel switching circuit, and the main control chip is respectively connected with the camera module, the automatic detection circuit and the channel switching circuit;

the camera module comprises a Mobile Industry Processor Interface (MIPI) interface;

the automatic detection circuit samples a differential clock pin signal CLK _ P, CLK _ N of the MIPI in the camera module;

the main control chip sets the clock frequency of the camera module through the MIPI, reads the differential clock pin signals CLK _ P, CLK _ N with the preset number sampled by the automatic detection circuit, and reads the output waveforms of the differential clock pin signals CLK _ P, CLK _ N with the preset number sampled by the automatic detection circuit;

the master control chip also judges the type of the read waveform, and when the type of the read waveform is judged to be continuous periodic square waves, the camera module is determined to be of a D _ PHY type, and a control signal for controlling a channel switching circuit to close and connect the D _ PHY channel to form a loop is sent out so as to acquire the image of the camera module; when the type of the read waveform is judged to be non-connected non-periodic square waves, the camera module is confirmed to be of a C _ PHY type, and a control signal for controlling a channel switching circuit to be connected to a C _ PHY channel in a closed mode to form a loop is sent out so as to collect images of the camera module;

the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal to connect the closure to the D _ PHY channel forming loop, or connects the closure to the C _ PHY channel forming loop according to the control signal to connect the closure to the C _ PHY channel forming loop.

And the MIPI adopts a pin multiplexing mode and is compatible with the pin definitions of the C _ PHY and the D _ PHY.

Wherein the automatic detection circuit comprises: a comparator; the same-direction input end of the comparator inputs a CLK _ P path or a CLK _ N path of a differential clock pin signal, and the reverse-direction input end of the comparator inputs a CLK _ N path or a CLK _ P path of the differential clock pin signal; when the input of the same-direction input end is larger than that of the reverse-direction input end, the comparator outputs high level, otherwise, the comparator outputs low level.

The C _ PHY channel is a 3-wire single-ended signal, each 3-wire single-ended signal forms 1 unidirectional 3-wire serial data channel, and 3 unidirectional 3-wire serial data channels are provided in total.

The D _ PHY channel is 2 lines of differential signals, each 2 lines of differential signals form 1 path of differential channel, and the total number of the differential channels is 5, and the 5 paths of differential channels comprise 1 path of differential clock channel and 4 paths of differential data channels.

The main control chip is a field programmable gate array.

The test system capable of detecting the type of the camera module further comprises: the data interaction module is connected with the main control chip; and the main control chip performs data interaction with an upper computer through the data interaction module.

The data interaction module comprises an Ethernet optical fiber module and/or a USB data interface module.

According to another aspect of the present invention, there is provided a test method capable of detecting a camera module type, including:

the method comprises the following steps that an automatic detection circuit samples a differential clock pin signal CLK _ P, CLK _ N of a Mobile Industry Processor Interface (MIPI) interface in a camera module;

the main control chip judges the type of the read waveform, and when the type of the read waveform is judged to be continuous periodic square waves, the camera module is determined to be of a D _ PHY type, and a control signal for controlling a channel switching circuit to close and connect the D _ PHY channel to form a loop is sent out so as to collect the image of the sampled camera module; when the type of the read waveform is judged to be non-connected non-periodic square waves, the camera module is confirmed to be of a C _ PHY type, and a control signal for controlling a channel switching circuit to be connected to a C _ PHY channel to form a loop is sent out so as to collect the image of the sampled camera module;

the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal for connecting the closure to the D _ PHY channel forming loop or connects the closure to the C _ PHY channel forming loop according to the control signal for connecting the closure to the C _ PHY channel forming loop.

Wherein after the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal connecting the closure to the D _ PHY channel forming loop, or connects the closure to the C _ PHY channel forming loop according to the control signal connecting the closure to the C _ PHY channel forming loop, the method further comprises:

the main control chip carries out data interaction with an upper computer through a data interaction module.

It can be found that, according to the above scheme, the channel switching circuit can connect the closure to the D _ PHY channel forming loop according to the control signal for connecting the closure to the D _ PHY channel forming loop, or connect the closure to the C _ PHY channel forming loop according to the control signal for connecting the closure to the C _ PHY channel forming loop, so that the C _ PHY and D _ PHY camera modules compatible with the MIPI test can be realized, and the test efficiency is high.

Furthermore, according to the scheme, the MIPI can adopt a pin multiplexing mode, and the characteristic that a camera module needs more pins to be connected can be achieved.

Furthermore, according to the above scheme, the MIPI interface can adopt a pin multiplexing mode, is compatible with the pin definitions of the C _ PHY and the D _ PHY, can be connected to a camera module of a C _ PHY type and a camera module of a D _ PHY type, can test most camera modules on the market, and has a wide application range.

Further, above scheme, main control chip can carry out data interaction through data interaction module and host computer, and this data interaction module includes ethernet fiber module and/or USB data interface module etc. can realize carrying out data interaction with the host computer, and especially ethernet fiber transmission has the frequency bandwidth, and the interference killing feature is strong to length is unrestricted, has improved the degree of accuracy of the data in the test procedure of test camera module.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic diagram of an embodiment of a test system for detecting camera module types according to the present invention;

FIG. 2 is a schematic diagram of an exemplary automatic detection circuit in an embodiment of a camera module type detectable test system according to the present invention;

FIG. 3 is a schematic structural diagram of another embodiment of a test system for detecting the type of a camera module according to the present invention;

FIG. 4 is a flowchart illustrating an embodiment of a testing method for detecting a type of a camera module according to the present invention;

fig. 5 is a flowchart illustrating another embodiment of a testing method for detecting a type of a camera module according to the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be noted that the following examples are only illustrative of the present invention, and do not limit the scope of the present invention. Similarly, the following examples are only some but not all examples of the present invention, and all other examples obtained by those skilled in the art without any inventive work are within the scope of the present invention.

The invention provides a test system capable of detecting the type of a camera module, which can realize compatibility test of C _ PHY and D _ PHY camera modules of MIPI and has high test efficiency.

Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system for detecting a type of a camera module according to an embodiment of the invention. In this embodiment, the test system 10 capable of detecting the type of the camera module includes a camera module 11, an automatic detection circuit 12, a main control chip 13, and a channel switching circuit 14.

The camera module 11 is connected to the automatic detection circuit 12 and the channel switching circuit 14, respectively.

The main control chip 13 is connected to the camera module 11, the automatic detection circuit 12, and the channel switching circuit 14, respectively.

The camera module 11 includes an MIPI interface 111.

The automatic detection circuit 12 is configured to sample a differential clock pin signal CLK _ P, CLK _ N of the MIPI interface 111 in the camera module 11.

The main control chip 13 is configured to set a clock frequency of the camera module through the MIPI interface 111, read a preset number of differential clock pin signals CLK _ P, CLK _ N sampled by the automatic detection circuit 12, and read an output waveform of the preset number of differential clock pin signals CLK _ P, CLK _ N sampled by the automatic detection circuit 12.

The main control chip 13 is further configured to determine the type of the read waveform, and when it is determined that the type of the read waveform is a continuous periodic square wave, determine that the camera module 11 is of a D _ PHY type, and send a control signal for controlling the channel switching circuit 14 to close and connect the D _ PHY channel to form a loop, so as to acquire an image of the camera module 11; when the type of the read waveform is determined to be a non-connected non-periodic square wave, it is determined that the camera module 11 is of the C _ PHY type, and a control signal for closing the circuit connected to the C _ PHY channel is sent out by the control channel switching circuit 14 to collect an image of the camera module 11.

The channel switching circuit 14 is configured to connect the closure to the D _ PHY channel forming loop according to the control signal for connecting the closure to the D _ PHY channel forming loop, or connect the closure to the C _ PHY channel forming loop according to the control signal for connecting the closure to the C _ PHY channel forming loop.

Optionally, the MIPI interface 111 may adopt a pin multiplexing mode, and is compatible with the pin definitions of the C _ PHY and the D _ PHY.

Optionally, the automatic detection circuit 12 may include:

a comparator 121;

the same-direction input end of the comparator 121 inputs CLK _ P path or CLK _ N path of the differential clock pin signal, and the reverse-direction input end inputs CLK _ N path or CLK _ P path of the differential clock pin signal;

when the input of the same-direction input terminal is greater than the input of the inverted-direction input terminal, the comparator 121 outputs a high level, whereas, the comparator 121 outputs a low level.

Optionally, the main control chip 13 may be further configured to:

when it is determined that the type of the read waveform is neither a continuous periodic square wave nor a non-connected non-periodic square wave, the clock of the camera module 11 is reset.

Alternatively, the C _ PHY channel may be a 3-wire single-ended signal, and each 3-wire single-ended signal constitutes 1 Trio (unidirectional 3-wire serial data channel), for a total of 3 trios.

Alternatively, the D _ PHY channel may be 2 lines of differential signals, each 2 lines of differential signals constitute 1 Lane (differential channel), there are 5 differential channels Lane, and the 5 differential channels Lane may include 1 differential clock channel Lane and 4 differential data channels Lane.

Optionally, the main control chip 13 may be an FPGA (Field-Programmable Gate Array), or may be another type of processing chip, which is not limited in the present invention.

In this embodiment, the MIPI interface 111 may adopt a pin multiplexing mode, and can realize the characteristic that the camera module needs more pins for connection.

In this embodiment, the MIPI interface 111 may adopt a pin multiplexing mode, is compatible with the pin definitions of the C _ PHY and the D _ PHY, and can be connected to a camera module of a C _ PHY type or a camera module of a D _ PHY type, so as to test most camera modules in the market, and the application range is wide.

In this embodiment, the type of the waveform of the differential clock pin signal CLK _ P, CLK _ N of the MIPI interface 111 in the camera module 11 sampled by the automatic detection circuit 12 may be a continuous periodic square wave, a non-connected non-periodic square wave, or other waveforms without any specific rules, and the type of the waveform is not limited in the invention. When the type of the waveform of the differential clock pin signal CLK _ P, CLK _ N of the MIPI interface 111 in the camera module 11 sampled by the automatic detection circuit 12 is other waveforms without specific rules, the main control chip 13 resets the clock of the camera module 11.

It can be found that, in this embodiment, the channel switching circuit may connect the closure to the D _ PHY channel forming loop according to the control signal for connecting the closure to the D _ PHY channel forming loop, or connect the closure to the C _ PHY channel forming loop according to the control signal for connecting the closure to the C _ PHY channel forming loop, so that the C _ PHY and D _ PHY camera modules compatible with MIPI testing can be implemented, and the testing efficiency is high.

Further, in this embodiment, the MIPI interface may adopt a pin multiplexing mode, and a characteristic that the camera module needs more pins to be connected can be realized.

Further, in this embodiment, the MIPI interface may adopt a pin multiplexing mode, is compatible with the pin definitions of the C _ PHY and the D _ PHY, and can be connected to both a C _ PHY type camera module and a D _ PHY type camera module, so that most camera modules in the market can be tested, and the application range is wide.

The present embodiment is illustrated below:

referring to fig. 2, fig. 2 is a schematic diagram illustrating a circuit of an automatic detection circuit in an embodiment of a test system for detecting a camera module type according to the present invention. As shown in fig. 2, the comparator 121 has a non-inverting input terminal to which the CLK _ P or CLK _ N of the differential clock pin signal is input and an inverting input terminal to which the CLK _ N or CLK _ P of the differential clock pin signal is input, and when the input to the non-inverting input terminal is greater than the input to the inverting input terminal, the comparator 121 outputs a high level, whereas, the comparator 121 outputs a low level.

Referring to fig. 3, fig. 3 is a schematic structural diagram of another embodiment of a test system capable of detecting a camera module type according to the invention. Different from the previous embodiment, the test system 30 for detecting the type of the camera module according to this embodiment further includes: the data interaction module 31 is connected with the main control chip 31, and the main control chip 13 performs data interaction with an upper computer through the data interaction module 31.

Optionally, the data interaction module 31 may include an ethernet fiber module, and may also include a USB (universal serial Bus) data interface module, and the main control chip 13 performs data interaction with an upper computer through the data interaction module 31. The data interaction mode of the data interaction module 31 is not limited in the present invention.

In this embodiment, this main control chip 13 carries out data interaction with the host computer through this data interaction module 31, and this data interaction module 31 includes ethernet fiber module and/or USB data interface module etc. can realize carrying out data interaction with the host computer, and especially ethernet fiber transmission has the frequency bandwidth, and the interference killing feature is strong to length is unrestricted, has improved the degree of accuracy of the data in the testing process of test camera module.

In this embodiment, the ethernet fiber module may employ a data transmission scheme of ethernet fiber and/or a data transmission scheme of twisted pair (or copper wire) to perform data interaction with the upper computer, where the data transmission scheme of ethernet fiber includes, but is not limited to, 10GBase-LR, 10GBase-SR, 10GBase-ER, 10GBase-ZR, 10GBase-LX4 defined by ieee802.3ae, 10GBase-LRM defined by ieee802.3aq, and the like; the data transmission scheme of the twisted pair (or copper wire) includes, but is not limited to, 10GBase-T defined by IEEE802.3an, 10GBase-CX4 defined by IEEE802.3ak, 10GBase-KR defined by IEEE802.3aq, 10GBase-KX4, etc.

In this embodiment, the USB data interface module may perform data interaction with the upper computer by using a data transmission scheme of a USB interface standard, where the USB interface standard includes, but is not limited to, USB2.0, USB3.0, USB3.1gen1, USB3.1gen2, and the like.

It can be found that, in this embodiment, main control chip can carry out data interaction through data interaction module and host computer, and this data interaction module includes ethernet fiber module and/or USB data interface module etc. can realize carrying out data interaction with the host computer, and especially ethernet fiber transmission has the frequency bandwidth, and the interference killing feature is strong to length is unrestricted, has improved the degree of accuracy of the data of the test in-process of test camera module.

The invention also provides a test method capable of detecting the type of the camera module, which can realize compatibility test of the C _ PHY and D _ PHY camera modules of the MIPI and has high test efficiency.

Referring to fig. 4, fig. 4 is a flowchart illustrating a testing method for detecting a type of a camera module according to an embodiment of the invention. It should be noted that the method of the present invention is not limited to the flow sequence shown in fig. 4 if the results are substantially the same. As shown in fig. 4, the method includes the steps of:

s401: the automatic detection circuit samples a differential clock pin signal CLK _ P, CLK _ N of an MIPI interface in the camera module.

S402: the main control chip sets the clock frequency of the camera module through the MIPI, reads the differential clock pin signals CLK _ P, CLK _ N with the preset number sampled by the automatic detection circuit, and reads the output waveforms of the differential clock pin signals CLK _ P, CLK _ N with the preset number sampled by the automatic detection circuit.

S403: the main control chip judges the type of the read waveform, and when the type of the read waveform is judged to be continuous periodic square waves, the camera module is determined to be of a D _ PHY type, and a control signal for controlling the channel switching circuit to close and connect the D _ PHY channel to form a loop is sent out so as to collect the image of the sampled camera module;

and when the type of the read waveform is judged to be non-connected non-periodic square waves, confirming that the camera module is of a C _ PHY type, and sending a control signal for controlling the channel switching circuit to be connected to the C _ PHY channel in a closed mode to form a loop so as to collect the image of the sampled camera module.

S404: the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal to connect the closure to the D _ PHY channel forming loop, or connects the closure to the C _ PHY channel forming loop according to the control signal to connect the closure to the C _ PHY channel forming loop.

In this embodiment, after the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal for connecting the closure to the D _ PHY channel forming loop, or connects the closure to the C _ PHY channel forming loop according to the control signal for connecting the closure to the C _ PHY channel forming loop, the method may further include:

Referring to fig. 5, fig. 5 is a schematic flowchart illustrating a testing method for detecting a type of a camera module according to another embodiment of the invention. In this embodiment, the method includes the steps of:

s501: the automatic detection circuit samples a differential clock pin signal CLK _ P, CLK _ N of an MIPI interface of the camera module.

S502: the main control chip sets the clock frequency of the camera module through the MIPI, reads the differential clock pin signals CLK _ P, CLK _ N with the preset number sampled by the automatic detection circuit, and reads the output waveforms of the differential clock pin signals CLK _ P, CLK _ N with the preset number sampled by the automatic detection circuit.

S503: the main control chip judges the type of the read waveform, and when the type of the read waveform is judged to be continuous periodic square waves, the camera module is determined to be of a D _ PHY type, and a control signal for controlling the channel switching circuit to close and connect the D _ PHY channel to form a loop is sent out so as to collect the image of the sampled camera module;

S504: the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal to connect the closure to the D _ PHY channel forming loop, or connects the closure to the C _ PHY channel forming loop according to the control signal to connect the closure to the C _ PHY channel forming loop.

S505: the main control chip carries out data interaction with an upper computer through a data interaction module.

It should be noted that, in the test method for detecting a camera module type according to one embodiment and another embodiment, each functional module can respectively execute the connection relationship and the function of the corresponding functional module in the test system embodiment for detecting a camera module type, so that the description of each functional module is omitted here, and please refer to the description of the connection relationship and the function of the corresponding functional module above in detail.

In the several embodiments provided in the present invention, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of a module or a unit is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.

Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be substantially or partially implemented in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) or a processor (processor) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

The above description is only a part of the embodiments of the present invention, and not intended to limit the scope of the present invention, and all equivalent devices or equivalent processes performed by the present invention through the contents of the specification and the drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims

1. A test system capable of detecting a type of a camera module, comprising:

the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal for connecting the closure to the D _ PHY channel forming loop or connects the closure to the C _ PHY channel forming loop according to the control signal for connecting the closure to the C _ PHY channel forming loop;

2. The detectable camera module type test system of claim 1, wherein the automatic detection circuit comprises: a comparator; the same-direction input end of the comparator inputs a CLK _ P path or a CLK _ N path of a differential clock pin signal, and the reverse-direction input end of the comparator inputs a CLK _ N path or a CLK _ P path of the differential clock pin signal; when the input of the same-direction input end is larger than that of the reverse-direction input end, the comparator outputs high level, otherwise, the comparator outputs low level.

3. The system of claim 1, wherein the C _ PHY lanes are 3-wire single-ended signals, and each 3-wire single-ended signal constitutes 1 unidirectional 3-wire serial data lane for a total of 3 unidirectional 3-wire serial data lanes.

4. The detectable camera module type test system of claim 1, wherein the D _ PHY channels are 2 lines of differential signals, each 2 lines of differential signals constitute 1 path of differential channels, there are 5 paths of differential channels, and the 5 paths of differential channels include 1 path of differential clock channel and 4 paths of differential data channels.

5. The detectable camera module type test system of claim 1, wherein the master control chip is a field programmable gate array.

6. The detectable camera module type test system of any one of claims 1 to 5, further comprising: the data interaction module is connected with the main control chip; and the main control chip performs data interaction with an upper computer through the data interaction module.

7. The detectable camera module type test system of claim 6, wherein the data interaction module comprises a fiber-over-ethernet module and/or a USB data interface module.

8. A test method capable of detecting the type of a camera module is characterized by comprising the following steps:

9. The detectable camera module type testing method of claim 8, wherein after the channel switching circuit connects the closure to the D _ PHY channel forming loop according to the control signal connecting the closure to the D _ PHY channel forming loop, or connects the closure to the C _ PHY channel forming loop according to the control signal connecting the closure to the C _ PHY channel forming loop, further comprising: