CN108802589B - Active device bias parameter determination method and device, storage medium and electronic equipment - Google Patents
Active device bias parameter determination method and device, storage medium and electronic equipment Download PDFInfo
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- CN108802589B CN108802589B CN201810555829.6A CN201810555829A CN108802589B CN 108802589 B CN108802589 B CN 108802589B CN 201810555829 A CN201810555829 A CN 201810555829A CN 108802589 B CN108802589 B CN 108802589B
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Abstract
The embodiment of the application discloses a method and a device for determining bias parameters of an active device, a storage medium and electronic equipment. The method comprises the following steps: acquiring a bias parameter range of an active device in a device to be tested in a current frequency band or frequency point, and determining at least two test bias parameters in the bias parameter range; sequentially setting an active device in the equipment to be tested according to the at least two test bias parameters, and determining a corresponding linearity test value; and determining the target offset parameters of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value. By adopting the technical scheme, the linearity of each device to be detected is tested under a plurality of test bias parameters, the target bias parameter of the active device of each device to be detected is determined according to the linearity test value fed back by the linearity test, the good performance of each device to be detected is ensured, the problem of performance difference caused by the fact that the active devices of the same device use the same group of bias parameters is solved, and the consistency of the device performance is improved.
Description
Technical Field
The embodiment of the application relates to the technical field of electronic equipment, in particular to a method and a device for determining bias parameters of an active device, a storage medium and electronic equipment.
Background
In electronic devices such as mobile phones, watches, and tablet computers, active devices such as amplifiers are provided. An active device is an electronic device with a power supply inside, and is generally used for amplifying or converting signals, and the requirement on linearity is high.
The parameters affecting the linearity of the active device are mainly bias parameters, such as bias voltage and bias current, and currently, the bias voltage and bias current for the active device are generally set by the following method: firstly, a set of bias voltage and bias current is set for each frequency band, and secondly, a set of bias voltage and bias current is set for each frequency point in the frequency band. For example, referring to fig. 1a and fig. 1b, fig. 1a is a schematic diagram illustrating setting of bias parameters for each frequency band in the related art; fig. 1b is a schematic diagram of setting a bias parameter for each frequency point in the related art. In fig. 1a, the offset parameter of the frequency band 1 is a, the offset parameter of the frequency band 2 is B, the offset parameter of the frequency band 3 is C, and the offset parameter of the frequency band 4 is D. Similarly, the offset parameters of each frequency point in fig. 1b are analogized. And the bias parameters set in fig. 1a and 1b described above apply to the corresponding active devices in all electronic devices of the same type.
The two bias parameters are set in the same way, the same set of bias parameters are set for the same active device in the same electronic equipment, but due to the difference between the active devices in the electronic equipment, the performance of the electronic equipment is different due to the same set of bias parameters, and the consistency of the performance of the electronic equipment is affected.
Disclosure of Invention
The embodiment of the application provides a method and a device for determining bias parameters of active devices, a storage medium and electronic equipment, so that accurate bias parameters of the active devices in each electronic equipment are determined in a targeted manner, and the performance consistency of the electronic equipment is improved.
In a first aspect, an embodiment of the present application provides an active device bias parameter determining method, including:
acquiring a bias parameter range of an active device in a device to be tested in a current frequency band or frequency point, and determining at least two test bias parameters in the bias parameter range;
sequentially setting an active device in the equipment to be tested according to the at least two test bias parameters, and determining a corresponding linearity test value;
and determining the target offset parameters of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value.
In a second aspect, an embodiment of the present application provides an active device bias parameter determining apparatus, including:
the device comprises a test bias parameter determining module, a bias parameter determining module and a bias parameter determining module, wherein the test bias parameter determining module is used for acquiring a bias parameter range of an active device in equipment to be tested in a current frequency band or frequency point and determining at least two test bias parameters in the bias parameter range;
the linearity test value determining module is used for setting an active device in the equipment to be tested according to the at least two test bias parameters in sequence and determining a corresponding linearity test value;
and the target offset parameter determining module is used for determining the target offset parameters of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value.
In a third aspect, embodiments of the present application provide a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements an active device bias parameter determination method according to embodiments of the present application.
In a fourth aspect, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor executes the computer program to implement the active device bias parameter determination method according to the embodiment of the present application.
The method for determining the bias parameters of the active device provided in the embodiment of the application obtains the bias parameter range of the active device in the equipment to be tested in the current frequency band or frequency point, determines at least two test bias parameters in the bias parameter range, sequentially sets the active device in the equipment to be tested according to the determined test bias parameters, determines the corresponding linearity test value, and determines the target bias parameters of the current frequency band or frequency point according to the linearity test value and the preset linearity threshold value. By adopting the scheme, the linearity test is carried out on each device to be tested under a plurality of test bias parameters, the target bias parameter of the active device of each device to be tested is determined according to the linearity test value fed back by the linearity test, the good performance of each device to be tested is ensured, the problem of performance difference caused by the same group of bias parameters applied to the same device is solved, and the consistency of the device performance is improved.
Drawings
Fig. 1a is a schematic diagram illustrating setting of offset parameters for each frequency band in the related art;
fig. 1b is a schematic diagram illustrating setting of a bias parameter for each frequency point in the related art;
fig. 2 is a schematic flowchart of a method for determining bias parameters of an active device according to an embodiment of the present disclosure;
fig. 3a is a schematic diagram illustrating setting of test bias parameters for each frequency band according to an embodiment of the present disclosure;
fig. 3b is a schematic diagram of setting a test bias parameter for each frequency point according to the embodiment of the present application;
fig. 4a is a schematic flowchart of another active device bias parameter determining method according to an embodiment of the present disclosure;
FIG. 4b is a graph of linearity test values with bias parameters according to an embodiment of the present application;
fig. 5 is a schematic flowchart of another active device bias parameter determining method according to an embodiment of the present disclosure;
fig. 6 is a schematic flowchart of another active device bias parameter determining method according to an embodiment of the present disclosure;
fig. 7 is a schematic structural diagram of an active device bias parameter determining apparatus according to an embodiment of the present disclosure;
fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure;
fig. 9 is a schematic structural diagram of another electronic device according to an embodiment of the present application.
Detailed Description
The technical scheme of the application is further explained by the specific implementation mode in combination with the attached drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures.
Before discussing exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although a flowchart may describe the steps as a sequential process, many of the steps can be performed in parallel, concurrently or simultaneously. In addition, the order of the steps may be rearranged. The process may be terminated when its operations are completed, but may have additional steps not included in the figure. The processes may correspond to methods, functions, procedures, subroutines, and the like.
Fig. 2 is a flowchart illustrating an active device bias parameter determining method according to an embodiment of the present disclosure, where the method may be performed by an active device bias parameter determining apparatus, where the apparatus may be implemented by software and/or hardware, and may be generally integrated in an electronic device. As shown in fig. 2, the method includes:
For example, the electronic device in the embodiment of the present application may include a smart device such as a mobile phone and a tablet computer.
The active device is an electronic component with a power supply arranged inside, for example, the active device may include but is not limited to an operational amplifier, a power amplifier, and the like, and the active device has a high requirement on linearity, so that different bias parameters are set at different frequency bands or frequency points to ensure the linearity of the active device at the different frequency bands or frequency points.
For example, the frequency band and frequency point of each active device for which the bias parameter needs to be set may be determined according to historical experience, or may be frequency bands or frequency points obtained by uniformly dividing the operating frequency range of the active device.
For example, the range of the bias parameter of each frequency band or frequency point may be determined according to an empirical value, or may be determined by performing a numerical range extension on the determined bias parameter of the active device in each frequency band or frequency point, for example, if the value of a certain bias parameter of the amplifier of the active device is 0.9, the range of the bias parameter of the amplifier may be determined to be (0.9-0.5, 0.9+0.5), where 0.5 is the numerical extension range. Wherein the extension range is related to the type of device under test, the active device and the bias parameter. The bias parameters of the active device include a bias voltage and a bias current. For example, the active device amplifier may be configured with a bias voltage range and a bias current range at a current frequency point or frequency band.
In this embodiment, after determining the bias parameter range of the current frequency band or frequency point, at least two values are screened from the bias parameter range as test bias parameters, where the test bias parameters are used to perform linearity test on the active device in the device to be tested, and further determine bias parameters meeting the linearity requirement of the active device in the device to be tested. It should be noted that, in this embodiment, a linearity test is performed on the active device in each device to be tested, and a bias parameter of the active device in each device to be tested is determined, where the bias parameters of the active devices in each device to be tested may be the same or different, and are not limited to this, as long as the linearity of the active device in each device to be tested is ensured.
For example, referring to fig. 3a and fig. 3b, fig. 3a is a schematic diagram of setting a test bias parameter for each frequency band according to an embodiment of the present application; fig. 3b is a schematic diagram of setting a test bias parameter for each frequency point according to the embodiment of the present application. In fig. 3a, the test bias parameters of the frequency band 1 are a1, a2 and A3, the test bias parameters of the frequency band 2 are B1, B2 and B3, the test bias parameters of the frequency band 3 are C1, C2 and C3, and the test bias parameters of the frequency band 4 are D1, D2 and D3, and similarly, the frequency points in fig. 3B and the corresponding test bias parameters are similar. Fig. 3a and fig. 3b are only an example, the number of frequency bands and frequency points of the active device in the device to be detected is not limited to 3, the number of frequency bands and frequency points of the active device may be related to the type of the device to be detected and the active device, and for example, the larger the working frequency range of the active device in the device to be detected is, the larger the number of frequency bands or frequency points of the bias parameter needs to be determined. The number of the test offset parameters of each frequency band or frequency point is not limited to 3, and can be determined according to the user requirements. The number of test bias parameters may be determined based on accuracy requirements and test workload requirements. The larger the number of the test offset parameters is, the higher the determination accuracy of the offset parameters is, and the larger the test workload is, and correspondingly, the smaller the number of the test offset parameters is, the lower the determination accuracy of the offset parameters is, and the smaller the test workload is. For example, the test bias parameter may be randomly selected and determined in a bias parameter range, or may be determined according to a preset screening rule.
In some embodiments, determining at least two test bias parameters in the bias parameter range comprises: and determining the test bias parameters according to the uniform intervals in the bias parameter range according to the number of the test bias parameters.
Illustratively, if the offset parameter has a value in the range of 0.5 to 1.5 and the number of test offset parameters is 5, the uniform spacing between the test offset parameters may be determined to be 0.25, and further the test offset parameters may be determined to be 0.5, 0.75, 1.0, 1.25, and 1.5, respectively. The test bias parameters are uniformly screened in the bias parameter range, so that the screened test bias parameters are uniformly distributed in the bias parameter range, the linearity condition of each sub-range in the bias parameter range can be determined through linearity test, and the problem of inaccurate bias parameter determination caused by omission of the test bias parameters of any sub-range is solved.
In some embodiments, determining at least two test bias parameters in the bias parameter range comprises: counting target offset parameters of the active devices of the same equipment to be tested in the current frequency band or frequency point, and determining the distribution density of the target offset parameters in each sub-range of the offset parameter range according to the counting result; and determining the test bias parameters according to the number of the test bias parameters and the distribution density of each sub-range.
Because each device to be detected is subjected to linearity test, before the current device to be detected is subjected to linearity test, the target bias parameters of the active device of other devices of the same type as the current device to be detected, which are determined according to the linearity test, are counted, wherein the target bias parameters are the bias parameters meeting the linearity requirement screened in the test bias parameters through the linearity test. For example, the bias parameter range may be divided into a plurality of sub-ranges, wherein the number of sub-ranges may be determined according to the number of test bias parameters, and the larger the number of test bias parameters is, the larger the number of sub-ranges may be. For example, a bias parameter range of 0.5-1.5, the bias parameter range may be divided into 5 sub-ranges, i.e., 0.5-0.7, 0.7-0.9, 0.9-1.1, 1.1-1.3, and 1.3-1.5. If the statistical number of the tested devices is 100 and the number of the target bias parameter distribution in the 5 sub-ranges is 10, 21, 48, 14 and 7, respectively, the distribution density of the target bias parameter in the 5 sub-ranges can be determined to be 10%, 21%, 48%, 14% and 7%, respectively. If the total number of the test bias parameters is 10, the number of the test bias parameters in each sub-range can be determined to be 1, 2, 5, 1 and 1 according to the total number of the test bias parameters and the distribution density of the sub-ranges. It should be noted that the number of the test bias parameters in each sub-range is a positive integer greater than or equal to 0, and when the number of the test bias parameters in the sub-range is a decimal number according to the total number of the test bias parameters and the distribution density of the sub-ranges, a trade-off may be made so that the sum of the number of the test bias parameters in each sub-range is equal to the total number of the test bias parameters.
After determining the number of test bias parameters for each sub-range, a uniformly spaced numerical screen may be performed in each sub-range, e.g., a number of 1 in the 0.5-0.7 sub-range may determine the test bias parameter for that sub-range to be 0.6, a number of 5 in the 0.9-1.1 sub-range may determine the test bias parameter for that sub-range to be 0.9, 0.95, 1.0, 1.05, and 1.1. Similarly, the test bias parameters for other sub-ranges may be determined in the manner described above while avoiding repeated selection of boundary values for different sub-ranges.
By counting the target offset parameters of the active device in the equipment subjected to the linearity test, a basis is provided for screening the test offset parameters in the current equipment to be tested, the accuracy of the test offset parameters is improved, and the selection precision of the target offset parameters of the active device in the current equipment to be tested is further improved.
Illustratively, the working frequency of an active device in the equipment to be tested is set according to the current frequency band or frequency point, and the active device is set according to the test bias parameter to perform linearity test. The test result of the linearity test is a linearity test value used for representing the linearity of the active device in the equipment to be tested in the current frequency band or frequency point and when the bias parameter is the test bias parameter. The linearity is represented by a linearity test value in a numerical form, and the linearity of different test bias parameters is favorably compared and screened by digital quantization.
And 203, determining a target offset parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value.
The linearity threshold is a minimum limit value that satisfies the linearity requirement, for example, a test bias parameter corresponding to a linearity test value greater than or equal to the linearity threshold satisfies the linearity requirement, and a test bias parameter corresponding to a linearity test value less than the linearity threshold does not satisfy the linearity requirement. And the linearity test value meeting the requirement and the corresponding test bias parameter can be screened out through the linearity threshold value.
In some embodiments, a test bias parameter corresponding to any linearity test value may be randomly selected from among the linearity test values that are screened out by the linearity threshold and meet the linearity requirement, and the selected test bias parameter is used as a target bias parameter of the current frequency band or frequency point.
In some embodiments, determining the target bias parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold includes: screening a linearity test value which is greater than or equal to the linearity threshold value; and determining the maximum value of the linearity test values in the screened linearity test values, and determining the test bias parameter corresponding to the maximum value of the linearity test values as a target bias parameter.
In this embodiment, the maximum value is determined in at least one linearity test value meeting the linearity requirement, that is, the corresponding test bias parameter when the linearity of the active device is optimal is determined as the target bias parameter, so that the active device can maintain the optimal linearity at the current frequency band or frequency point, and the performance of the device to be detected is improved.
It should be noted that, if there is no linearity test value greater than or equal to the linearity threshold, the bias parameter range of the current frequency band or frequency point is reset, and a new test bias parameter is determined again to perform the linearity test. The method can be adopted for determining corresponding target bias parameters for different frequency bands or frequency points, and the good performance of the active device of the equipment to be detected at different working frequencies can be ensured.
The method for determining the bias parameters of the active device provided in the embodiment of the application obtains the bias parameter range of the active device in the equipment to be tested in the current frequency band or frequency point, determines at least two test bias parameters in the bias parameter range, sequentially sets the active device in the equipment to be tested according to the determined test bias parameters, determines the corresponding linearity test value, and determines the target bias parameters of the current frequency band or frequency point according to the linearity test value and the preset linearity threshold value. By adopting the scheme, the linearity test is carried out on each device to be tested under a plurality of test bias parameters, the target bias parameter of the active device of each device to be tested is determined according to the linearity test value fed back by the linearity test, the good performance of each device to be tested is ensured, the problem of performance difference caused by the same group of bias parameters applied to the same device is solved, and the consistency of the device performance is improved.
Fig. 4a is a schematic flowchart of another method for determining bias parameters of an active device according to an embodiment of the present disclosure, and referring to fig. 4a, the method according to the present embodiment includes the following steps:
And 402, sequentially setting the active devices in the equipment to be tested according to the at least two testing bias parameters, and determining corresponding linearity testing values.
And step 403, screening the linearity test value larger than the linearity threshold value.
And step 404, generating a change curve of the linearity test value along with the offset parameter according to the screened linearity test value.
Due to the limited number of test bias parameters, each value in the bias parameter range cannot be traversed, resulting in a gap between each test bias parameter. Only the target bias parameters are selected among the test bias parameters, and there is a case where the optimum bias parameters are omitted. In this embodiment, a change curve of the linearity test value with the bias parameter is generated according to the linearity test value satisfying the linearity requirement and the corresponding bias parameter, and a change trend of the linearity test value with the bias parameter can be displayed through the change curve. For example, referring to fig. 4b, fig. 4b is a graph of a linearity test value according to the variation of the bias parameter provided by the embodiment of the present application. As can be seen from fig. 4b, the linearity test value increases with the increase of the bias parameter, and decreases with the increase of the bias parameter when the linearity test value increases to the maximum value.
Illustratively, as can be seen from fig. 4B, the test offset parameters are 0.5, 0.75, 1.0, 1.25, and 1.5, respectively, and correspond to a linearity test value, a maximum position of the linearity test value in the variation curve of fig. 4B is a, and the corresponding offset parameter is B, where the offset parameter B belongs to the offset parameter range, but is not a test offset parameter. And determining the bias parameter B as a target bias parameter, so that the active device of the equipment to be detected is in the optimal linearity at the current frequency band or frequency point.
According to the method for determining the bias parameter of the active device, the change curve of the linearity test value along with the bias parameter is formed after the linearity test value meeting the linearity requirement is screened out, the maximum value of the linearity test value is determined based on the change trend of the change curve, and the target bias parameter of the current frequency band or frequency point is further determined, so that the selection of the target bias parameter is not limited in the test bias parameter any more, the bias parameter corresponding to the optimal linearity of the active device is determined, and the performance of the equipment to be detected is improved.
Fig. 5 is a schematic flow chart of another active device bias parameter determining method provided in an embodiment of the present application, where the present embodiment is an alternative to the foregoing embodiment, and correspondingly, as shown in fig. 5, the method of the present embodiment includes the following steps:
And 503, screening the linearity test value larger than the linearity threshold value.
And 504, generating a change curve of the linearity test value along with the offset parameter according to the screened linearity test value, and determining an inflection point in the change curve of the linearity test value along with the offset parameter and two adjacent test offset parameters of the inflection point.
And based on the selection requirement of the linearity test value, the inflection point in the change curve is the point corresponding to the peak in the change curve. Illustratively, referring to fig. 4b, the inflection point in the curve of the linearity test value with the variation of the bias parameter is point a, and two test bias parameters adjacent to point a are 0.75 and 1.0, respectively.
And 505, determining a newly added test bias parameter in the range between the two adjacent test bias parameters.
The range between two adjacent test bias parameters of the inflection point is taken as the selection range of the target bias parameter, the newly added test bias parameters can be determined at even intervals in the range between the two adjacent test bias parameters, and the number of the newly added test bias parameters can be determined according to the range between the two adjacent test bias parameters, for example, the larger the range is, the larger the number of the newly added test bias parameters is, and conversely, the smaller the range is, the smaller the number of the newly added test bias parameters is.
Optionally, before determining the newly added test bias parameter, the method further includes: judging whether the difference value of the two adjacent test bias parameters is greater than a preset value, if so, executing a step of determining a newly added test bias parameter; if not, determining the target offset parameter according to the change curve of the linearity test value along with the offset parameter. Wherein, the preset value can be determined according to the type of the bias parameter.
Because the change curve corresponding to the range between the two adjacent test bias parameters is determined according to the change trend of the linearity test value, and the linearity value corresponding to each bias parameter has inaccurate condition, the linearity test value corresponding to each newly added test bias parameter in the range is accurately obtained by increasing the newly added test bias parameters in the range between the two adjacent test bias parameters, so that the change curve of the updated linearity test value along with the bias parameters is more accurate.
And 507, determining the maximum value of the linearity test value according to the updated variation curve of the linearity test value along with the bias parameter, and determining the bias parameter corresponding to the maximum value of the linearity test value as the target bias parameter.
The method for determining the bias parameters of the active device, provided by the embodiment of the application, comprises the steps of generating a change curve of a linearity test value along with a bias parameter according to the linearity test value meeting the linearity requirement, determining an inflection point in the change curve of the linearity test value along with the bias parameter and two adjacent test bias parameters of the inflection point, determining a newly added test bias parameter in a range between the two adjacent test bias parameters, determining a corresponding linearity test value, updating the change curve of the linearity test value along with the bias parameter, and determining the updated change curve of the linearity test value along with the bias parameter as a target bias parameter of the active device at the current frequency band or frequency point. The method has the advantages that two adjacent test bias parameters of the inflection point in the change curve are determined as the range of the target bias parameters, the occurrence range of the target bias parameters is narrowed, and the newly added test bias parameters for performing the linearity test are added in the narrowed range, so that the accuracy of the change curve is improved, and the selection precision of the target bias parameters is further improved.
Fig. 6 is a schematic flow chart of another active device bias parameter determining method provided in an embodiment of the present application, where the present embodiment is an alternative to the foregoing embodiment, and accordingly, as shown in fig. 6, the method of the present embodiment includes the following steps:
And step 602, sequentially setting the active devices in the device to be tested according to the at least two test bias parameters, and determining corresponding linearity test values.
And step 604, generating a variation curve of the target offset parameter along with the frequency bands or the frequency points according to the determined target offset parameter of each frequency band or frequency point.
The target offset parameters of each frequency band or frequency point are determined by the same method, and because the frequency band is a frequency band and intervals exist among the frequency points, each numerical value in the working frequency range of the active device cannot be traversed, so that the target offset parameters have selection deviation when the active device works.
In the embodiment, a change curve of the target offset parameter along with the frequency band is generated according to the determined target offset parameter of each frequency band; and similarly, generating a change curve of the target offset parameter along with the frequency band according to the determined target offset parameter of each frequency point.
For example, each frequency band may be divided evenly according to the number of frequency sub-bands, for example, one frequency band is divided into 3 frequency sub-bands. The interval frequency points are arranged between two adjacent frequency bands, and can be uniformly arranged between the two adjacent frequency bands, and the number of the interval frequency points can be one or more.
For example, the target offset parameter of the frequency band may be determined according to a variation curve of the target offset parameter with the frequency band, where the target offset parameter of the frequency band is used as the target offset parameter of the center of the frequency band, for example, if the number of the frequency bands is singular, the target offset parameter of the frequency band is used as the target offset parameter of the center frequency band, if the number of the frequency bands is even, the target offset parameter of the frequency band is used as the target offset parameter of the center frequency of the frequency band, a variation curve is formed according to a variation trend of the existing target offset parameter, and the offset parameter corresponding to the center frequency of each frequency band in the variation curve is determined as the target offset parameter corresponding to each frequency band.
Similarly, the target offset parameter of the sub-frequency band is determined according to the variation curve of the target offset parameter along with the frequency point, and the offset parameter corresponding to each interval frequency point in the variation curve of the target offset parameter along with the frequency point can be determined as the target offset parameter corresponding to each sub-frequency point.
In some embodiments, after determining the target bias parameters of the sub-bands or the spaced frequency points, the method further includes: checking the target offset parameters of the sub-frequency bands or the interval frequency points; and if the linearity test value corresponding to the target offset parameter of the sub-band or the interval frequency point is smaller than the preset linearity threshold value, discarding the target offset parameter of the sub-band or the interval frequency point.
And checking the target offset parameters of the sub-frequency bands, wherein the checking mode can be that the working frequency of an active device in the equipment to be tested is set according to the sub-frequency bands or the interval frequency points, the active device is set according to the corresponding target offset parameters, and the linearity test is carried out. If the obtained linearity test value is larger than or equal to a preset linearity threshold value, determining that the verification is successful, reserving the target bias parameters of the sub-frequency band or the interval frequency point, if the obtained linearity test value is smaller than the preset linearity threshold value, determining that the verification fails, and discarding the target bias parameters of the sub-frequency band or the interval frequency point. Optionally, after the verification fails, a bias parameter range may be set in a targeted manner for the sub-band or the spaced frequency point for which the verification fails, and the target bias parameter of the sub-band or the spaced frequency point is determined according to the bias parameter determining method provided by the present application.
According to the method for determining the offset parameters of the final active device, the change curve of the target offset parameters is determined through the target offset parameters of the determined frequency band or frequency points, the target offset parameters of the frequency bands or the interval frequency points are determined according to the offset parameters of the frequency bands or the interval frequency points corresponding to the curve, the frequency interval for setting the target offset parameters is shortened, and the working accuracy of the active device in the equipment to be detected under different frequencies is improved.
Fig. 7 is a block diagram of an active device bias parameter determining apparatus provided in an embodiment of the present application, where the apparatus may be implemented by software and/or hardware, and is generally integrated in an electronic device, and may determine a bias parameter of an active device in a device to be tested by performing an active device bias parameter determining method of the electronic device. As shown in fig. 7, the apparatus includes: a test bias parameter determination module 701, a linearity test value determination module 702, and a target bias parameter determination module 703.
A test bias parameter determining module 701, configured to obtain a bias parameter range of an active device in a device to be tested in a current frequency band or frequency point, and determine at least two test bias parameters in the bias parameter range;
a linearity test value determining module 702, configured to set an active device in the device to be tested according to the at least two test bias parameters in sequence, and determine a corresponding linearity test value;
a target offset parameter determining module 703, configured to determine a target offset parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold.
The active device bias parameter determining device provided in the embodiment of the application performs linearity test on each device to be tested under a plurality of test bias parameters, determines the target bias parameter of the active device of each device to be tested according to the linearity test value fed back by the linearity test, ensures the good performance of each device to be tested, solves the problem of performance difference caused by the same group of bias parameters applied to the same device, and improves the consistency of the device performance.
On the basis of the above embodiment, the test bias parameter determining module 701 is configured to:
determining test bias parameters according to the number of the test bias parameters and the uniform intervals in the bias parameter range; alternatively, the first and second electrodes may be,
counting target offset parameters of the active devices of the same equipment to be tested in the current frequency band or frequency point, and determining the distribution density of the target offset parameters in each sub-range of the offset parameter range according to the counting result;
and determining the test bias parameters according to the number of the test bias parameters and the distribution density of each sub-range.
On the basis of the above embodiment, the target bias parameter determining module 703 includes:
the first linearity test value screening unit is used for screening the linearity test value larger than the linearity threshold value;
and the first target offset parameter determining unit is used for determining the maximum value of the linearity test values in the screened linearity test values and determining the test offset parameter corresponding to the maximum value of the linearity test values as the target offset parameter.
On the basis of the above embodiment, the target bias parameter determining module 703 includes:
the second linearity test value screening unit is used for screening the linearity test value larger than the linearity threshold value;
the first change curve generation unit is used for generating a change curve of the linearity test value along with the offset parameter according to the screened linearity test value;
and the second target bias parameter determining unit is used for determining the maximum value of the linearity test value according to the change curve of the linearity test value along with the bias parameter, and determining the bias parameter corresponding to the maximum value of the linearity test value as the target bias parameter.
On the basis of the above embodiment, the target bias parameter determining module 703 further includes:
a curve inflection point determining unit, configured to determine an inflection point in a curve of the linearity test value with the bias parameter and two adjacent test bias parameters of the inflection point before determining a maximum value of the linearity test value according to the curve of the linearity test value with the bias parameter;
a newly-added test bias parameter determining unit, configured to determine a newly-added test bias parameter within a range between the two adjacent test bias parameters;
the change curve updating unit is used for determining a linearity test value corresponding to the newly added test bias parameter and updating a change curve of the linearity test value along with the bias parameter;
correspondingly, the second target offset parameter determining unit is used for determining the maximum value of the linearity test value according to the updated variation curve of the linearity test value along with the offset parameter.
On the basis of the above embodiment, the method further includes:
the second change curve generation module is used for generating a change curve of the target offset parameter along with the frequency bands or the frequency points according to the determined target offset parameter of each frequency band or frequency point after determining the target offset parameter of each frequency band or frequency point;
a sub-band generation module, configured to divide each frequency band into at least two sub-bands;
the interval frequency point determining module is used for determining interval frequency points among the frequency points;
and the third target offset parameter determining module is used for determining the target offset parameters of the sub-frequency bands or the interval frequency points according to the variation curve of the target offset parameters along with the frequency bands or the frequency points.
On the basis of the above embodiment, the method further includes:
the target offset parameter checking module is used for checking the target offset parameters of the sub-frequency bands or the interval frequency points after the target offset parameters of the sub-frequency bands or the interval frequency points are determined;
and the target offset parameter processing module is used for discarding the sub-frequency band or the interval frequency point and the target offset parameter of the sub-frequency band or the interval frequency point if the linearity test value corresponding to the target offset parameter of the sub-frequency band or the interval frequency point is smaller than the preset linearity threshold value.
Embodiments of the present application also provide a storage medium containing computer-executable instructions, which when executed by a computer processor, are configured to perform a method for active device bias parameter determination, the method comprising:
acquiring a bias parameter range of an active device in a device to be tested in a current frequency band or frequency point, and determining at least two test bias parameters in the bias parameter range;
sequentially setting an active device in the equipment to be tested according to the at least two test bias parameters, and determining a corresponding linearity test value;
and determining the target offset parameters of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value.
Storage medium-any of various types of memory devices or storage devices. The term "storage medium" is intended to include: mounting media such as CD-ROM, floppy disk, or tape devices; computer system memory or random access memory such as DRAM, DDRRAM, SRAM, EDORAM, Lanbas (Rambus) RAM, etc.; non-volatile memory such as flash memory, magnetic media (e.g., hard disk or optical storage); registers or other similar types of memory elements, etc. The storage medium may also include other types of memory or combinations thereof. In addition, the storage medium may be located in a first computer system in which the program is executed, or may be located in a different second computer system connected to the first computer system through a network (such as the internet). The second computer system may provide program instructions to the first computer for execution. The term "storage medium" may include two or more storage media that may reside in different locations, such as in different computer systems that are connected by a network. The storage medium may store program instructions (e.g., embodied as a computer program) that are executable by one or more processors.
Of course, the storage medium provided in this embodiment of the present application contains computer-executable instructions, and the computer-executable instructions are not limited to the active device bias parameter determination operation described above, and may also perform related operations in the active device bias parameter determination method provided in any embodiment of the present application.
The embodiment of the application provides electronic equipment, and the bias parameter determining device of the active device provided by the embodiment of the application can be integrated in the electronic equipment. Fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present application. The electronic device 800 may include: a memory 801, a processor 802 and a computer program stored on the memory 801 and executable by the processor 802, wherein the processor 802 implements the active device bias parameter determination method according to the embodiment of the present application when executing the computer program.
The electronic equipment provided by the embodiment of the application performs linearity test on each equipment to be tested under a plurality of test bias parameters, determines the target bias parameter of the active device of each equipment to be tested according to the linearity test value fed back by the linearity test, ensures the good performance of each equipment to be tested, solves the problem of performance difference caused by the application of the same set of bias parameters to the same equipment, and improves the consistency of the equipment performance.
Fig. 9 is a schematic structural diagram of another electronic device according to an embodiment of the present application. The electronic device may include: a casing (not shown), a memory 901, a Central Processing Unit (CPU) 902 (also called a processor, hereinafter referred to as CPU), a circuit board (not shown), and a power circuit (not shown). The circuit board is arranged in a space enclosed by the shell; the CPU902 and the memory 901 are disposed on the circuit board; the power supply circuit is used for supplying power to each circuit or device of the electronic equipment; the memory 901 is used for storing executable program codes; the CPU902 executes a computer program corresponding to the executable program code by reading the executable program code stored in the memory 901, so as to implement the following steps:
acquiring a bias parameter range of an active device in a device to be tested in a current frequency band or frequency point, and determining at least two test bias parameters in the bias parameter range;
sequentially setting an active device in the equipment to be tested according to the at least two test bias parameters, and determining a corresponding linearity test value;
and determining the target offset parameters of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value.
The electronic device further includes: peripheral interface 903, RF (Radio Frequency) circuitry 905, audio circuitry 906, speakers 911, power management chip 908, input/output (I/O) subsystems 909, other input/control devices 910, touch screen 912, other input/control devices 910, and external port 904, which communicate through one or more communication buses or signal lines 907.
It should be understood that the illustrated electronic device 900 is merely one example of an electronic device, and that the electronic device 900 may have more or fewer components than shown in the figures, may combine two or more components, or may have a different configuration of components. The various components shown in the figures may be implemented in hardware, software, or a combination of hardware and software, including one or more signal processing and/or application specific integrated circuits.
The following provides a detailed description of the electronic device for determining the active device bias parameter operation provided in the present embodiment, which is exemplified by a mobile phone.
A peripheral interface 903, the peripheral interface 903 may connect input and output peripherals of the device to the CPU902 and the memory 901.
An I/O subsystem 909, which I/O subsystem 909 may connect input and output peripherals on the device, such as a touch screen 912 and other input/control devices 910, to the peripheral interface 903. The I/O subsystem 909 may include a display controller 9091 and one or more input controllers 9092 for controlling other input/control devices 910. Where one or more input controllers 9092 receive electrical signals from or send electrical signals to other input/control devices 910, the other input/control devices 910 may include physical buttons (push buttons, rocker buttons, etc.), dials, slide switches, joysticks, click wheels. It is worth noting that the input controller 9092 may be connected with any one of the following: a keyboard, an infrared port, a USB interface, and a pointing device such as a mouse.
The display controller 9091 in the I/O subsystem 909 receives electrical signals from the touch screen 912 or transmits electrical signals to the touch screen 912. The touch screen 912 detects a contact on the touch screen, and the display controller 9091 converts the detected contact into an interaction with a user interface object displayed on the touch screen 912, that is, to implement a human-computer interaction, where the user interface object displayed on the touch screen 912 may be an icon for running a game, an icon networked to a corresponding network, or the like. It is worth mentioning that the device may also comprise a light mouse, which is a touch sensitive surface that does not show visual output, or an extension of the touch sensitive surface formed by the touch screen.
The RF circuit 905 is mainly used to establish communication between the mobile phone and the wireless network (i.e., network side), and implement data reception and transmission between the mobile phone and the wireless network. Such as sending and receiving short messages, e-mails, etc. In particular, RF circuitry 905 receives and transmits RF signals, also referred to as electromagnetic signals, through which RF circuitry 905 converts electrical signals to or from electromagnetic signals and communicates with a communication network and other devices. The RF circuitry 905 may include known circuitry for performing these functions including, but not limited to, an antenna system, an RF transceiver, one or more amplifiers, a tuner, one or more oscillators, a digital signal processor, a CODEC (CODEC) chipset, a Subscriber Identity Module (SIM), and so forth.
The audio circuit 906 is mainly used to receive audio data from the peripheral interface 903, convert the audio data into an electric signal, and transmit the electric signal to the speaker 911.
The speaker 911 is used to convert the voice signal received by the mobile phone from the wireless network through the RF circuit 905 into sound and play the sound to the user.
And the power management chip 908 is used for supplying power and managing power to the hardware connected with the CPU902, the I/O subsystem and the peripheral interfaces.
The active device bias parameter determining apparatus, the storage medium, and the electronic device provided in the above embodiments may perform the active device bias parameter determining method provided in any embodiment of the present application, and have corresponding functional modules and advantageous effects for performing the method. For technical details that are not described in detail in the above embodiments, reference may be made to the active device bias parameter determination method provided in any of the embodiments of the present application.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present application and the technical principles employed. It will be understood by those skilled in the art that the present application is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the application. Therefore, although the present application has been described in more detail with reference to the above embodiments, the present application is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present application, and the scope of the present application is determined by the scope of the appended claims.
Claims (9)
1. An active device bias parameter determination method, comprising:
acquiring a bias parameter range of an active device in a device to be tested in a current frequency band or frequency point, and determining at least two test bias parameters in the bias parameter range;
sequentially setting an active device in the equipment to be tested according to the at least two test bias parameters, and determining a corresponding linearity test value;
determining a target offset parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value;
determining a target bias parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold, wherein the determining comprises the following steps:
screening a linearity test value which is greater than or equal to the linearity threshold value;
and determining the maximum value of the linearity test values in the screened linearity test values, and determining the test bias parameter corresponding to the maximum value of the linearity test values as a target bias parameter.
2. The method of claim 1, wherein determining at least two test bias parameters in the bias parameter range comprises:
determining test bias parameters according to the number of the test bias parameters and the uniform intervals in the bias parameter range; alternatively, the first and second electrodes may be,
counting target offset parameters of the active devices of the same equipment to be tested in the current frequency band or frequency point, and determining the distribution density of the target offset parameters in each sub-range of the offset parameter range according to the counting result;
and determining the test bias parameters according to the number of the test bias parameters and the distribution density of each sub-range.
3. The method of claim 1, wherein determining the target bias parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold comprises:
screening a linearity test value which is greater than or equal to the linearity threshold value;
generating a change curve of the linearity test value along with the bias parameter according to the screened linearity test value;
and determining the maximum value of the linearity test value according to the change curve of the linearity test value along with the bias parameter, and determining the bias parameter corresponding to the maximum value of the linearity test value as the target bias parameter.
4. The method of claim 3, further comprising, prior to determining the maximum value of the linearity test value from the curve of the linearity test value as a function of the bias parameter:
determining an inflection point in a variation curve of the linearity test value with the bias parameter and two adjacent test bias parameters of the inflection point;
determining a newly added test bias parameter in the range between the two adjacent test bias parameters;
determining a linearity test value corresponding to the newly added test bias parameter, and updating a change curve of the linearity test value along with the bias parameter;
correspondingly, the step of determining the maximum value of the linearity test value according to the variation curve of the linearity test value along with the bias parameter comprises the following steps:
and determining the maximum value of the linearity test value according to the updated change curve of the linearity test value along with the offset parameter.
5. The method according to claim 1, further comprising, after determining the target bias parameters of the frequency bands or points:
generating a variation curve of the target offset parameter along with the frequency bands or the frequency points according to the determined target offset parameter of each frequency band or frequency point;
dividing each frequency band into at least two sub-frequency bands, or determining interval frequency points among the frequency points;
and determining the target offset parameters of the sub-frequency bands or the interval frequency points according to the variation curve of the target offset parameters along with the frequency bands or the frequency points.
6. The method of claim 5, further comprising, after determining the target bias parameters for the sub-bands or the spaced bins:
checking the target offset parameters of the sub-frequency bands or the interval frequency points;
and if the linearity test value corresponding to the target offset parameter of the sub-band or the interval frequency point is smaller than the preset linearity threshold value, discarding the target offset parameter of the sub-band or the interval frequency point.
7. An active device bias parameter determining apparatus, comprising:
the device comprises a test bias parameter determining module, a bias parameter determining module and a bias parameter determining module, wherein the test bias parameter determining module is used for acquiring a bias parameter range of an active device in equipment to be tested in a current frequency band or frequency point and determining at least two test bias parameters in the bias parameter range;
the linearity test value determining module is used for setting an active device in the equipment to be tested according to the at least two test bias parameters in sequence and determining a corresponding linearity test value;
the target offset parameter determining module is used for determining the target offset parameter of the current frequency band or frequency point according to the linearity test value and a preset linearity threshold value;
wherein the target bias parameter determination module comprises:
the first linearity test value screening unit is used for screening the linearity test value larger than the linearity threshold value;
and the first target offset parameter determining unit is used for determining the maximum value of the linearity test values in the screened linearity test values and determining the test offset parameter corresponding to the maximum value of the linearity test values as the target offset parameter.
8. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method for active device bias parameter determination according to any one of claims 1 to 6.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the active device bias parameter determination method according to any of claims 1-6 when executing the computer program.
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