CN108646206B - Electronic system checking method and device - Google Patents
Electronic system checking method and device Download PDFInfo
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- CN108646206B CN108646206B CN201810413405.6A CN201810413405A CN108646206B CN 108646206 B CN108646206 B CN 108646206B CN 201810413405 A CN201810413405 A CN 201810413405A CN 108646206 B CN108646206 B CN 108646206B
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Abstract
The embodiment of the invention provides an electronic system checking method and a device, the electronic system checking method is applied to a target electronic system with abnormal BCI test results, and the electronic system checking method comprises the following steps: connecting the tested devices in the target electronic system by using a conventional wiring harness to form a target test circuit; detecting whether the performance of the target test circuit is normal; if the detected signal is normal, the detected device is judged to be normal; if the target test circuit is abnormal, replacing the conventional wire harness with a special shielding wire, detecting whether the performance of the replaced target test circuit is normal, if so, judging that the conventional wire harness is abnormal, otherwise, judging that the tested device is abnormal; wherein the anti-interference level of the special shielded wire is higher than that of the conventional wire harness. When the scheme provided by the embodiment of the invention is applied to electronic system troubleshooting, the problem component in the abnormal electronic system can be quickly positioned, and the problem troubleshooting efficiency of the abnormal electronic system is improved.
Description
Technical Field
The invention relates to the technical field of automobile electronic and electric appliance testing, in particular to an electronic system troubleshooting method and device.
Background
Generally, most of lines in the whole automobile are formed by binding wire harnesses together, and currents flow in the wire harnesses, and based on the principle of electromagnetic induction, the wire harnesses bound together are easily affected by the coupled currents, so that signals on the wire harnesses change.
In the prior art, a BCI (Bulk current injection) test method may be used to test various electronic systems of an automobile, generally an audio/video electronic system, such as a car-backing image system. However, the BCI test can only test whether the performance of the target electronic system to be tested is normal, however, when the performance of the target electronic system is abnormal, it cannot be determined which electronic device in the electronic system has a problem only by using the BCI test, and only the electronic devices or wire harnesses in the target subsystem can be checked one by one, which is not beneficial to the problem check of the abnormal electronic system.
Disclosure of Invention
The embodiment of the invention aims to provide an electronic system troubleshooting method and device, and a problem component positioned in an abnormal electronic system in time, so that the problem troubleshooting efficiency of the abnormal electronic system is improved.
In order to achieve the above object, the embodiment of the present invention discloses an electronic system troubleshooting method, which is applied to a target electronic system with abnormal BCI test results, and the electronic system troubleshooting method includes:
connecting the tested devices in the target electronic system by using a conventional wiring harness to form a target test circuit;
detecting whether the performance of the target test circuit is normal;
if the measured voltage is normal, judging that the measured device is normal;
if the normal wire harness is abnormal, replacing the normal wire harness with a special shielding wire, detecting whether the performance of the target test circuit after replacement is normal, if so, judging that the normal wire harness is abnormal, otherwise, judging that the device to be tested is abnormal; wherein the dedicated shielded wire has a higher interference rejection level than the conventional wiring harness.
Preferably, the electronic system troubleshooting method further includes: placing a device under test of the target electronic system within a shielded room.
Preferably, the target electronic system comprises a first type of electronic system for video signals or a second type of electronic system for audio signals.
Preferably, the dedicated shielded line is a digital optical fiber video link for video signals or a digital optical fiber audio link for audio signals.
Preferably, the digital optical fiber video link is connected in the following manner:
when outputting video signals to the outside of the shielding room, connecting a video output port of the tested device with a transmitter of the digital optical fiber video link, and connecting a receiver of the digital optical fiber video link with a video analyzer or a video monitor outside the shielding room;
when video signals are input into the shielding chamber, a video output port of a video signal generating source outside the shielding chamber is connected with a transmitter of the digital optical fiber video link, and a receiver of the digital optical fiber video link is connected with a video input port of the tested device.
Preferably, the digital optical fiber audio link is connected in the following manner:
when outputting audio signals to the outside of the shielding room, connecting an audio output port of the tested device with a transmitter of the digital optical fiber audio link, and connecting a receiver of the digital optical fiber audio link with a loudspeaker outside the shielding room;
when audio signals are input into the shielding chamber, the audio output port of the audio signal generating source outside the shielding chamber is connected with the transmitter of the digital optical fiber audio link, and the receiver of the digital optical fiber audio link is connected with the audio input port of the tested device.
Preferably, before the step of detecting whether the performance of the target test circuit is normal, the electronic system troubleshooting method further includes:
obtaining a first output current of the tested device by using a current measuring probe;
performing power amplification processing on the current of the device to be tested to obtain a processed second output current;
and judging whether the performance of the target test circuit is normal or not based on the second output current.
Preferably, the conventional wire harness includes at least: power, ground, video or audio lines.
Preferably, the target electronic system with abnormal BCI test result is determined by the following method:
when the display screen of the monitor in the BCI test is detected to be darkened or appear a water ripple phenomenon, the target electronic system is determined to be abnormal.
In order to achieve the above object, an embodiment of the present invention discloses an electronic system troubleshooting apparatus, which is applied to a target electronic system with abnormal BCI test results, and the electronic system troubleshooting apparatus includes:
the test circuit construction module is used for connecting the tested devices in the target electronic system by using a conventional wiring harness to form a target test circuit;
the first circuit detection module is used for detecting whether the performance of the target test circuit is normal or not;
the first judging module is used for judging that the device under test is normal when the detection result of the first circuit detecting module is normal;
the wire harness replacing module is used for replacing the conventional wire harness with a special shielding wire and triggering the second circuit detection module when the detection result of the first circuit detection module is abnormal; wherein the interference rejection level of the dedicated shielded wire is higher than the interference rejection level of the conventional wiring harness;
the second circuit detection module is used for detecting whether the performance of the target test circuit after replacement is normal;
the second judgment module is used for judging that the conventional wire harness is abnormal when the detection result of the second circuit detection module is normal;
and the third judging module is used for judging that the device under test is abnormal when the detection result of the second circuit detection module is abnormal.
The embodiment of the invention provides an electronic system troubleshooting method and device, which are applied to a target electronic system with abnormal BCI test results.
Therefore, when the scheme provided by the embodiment of the invention is applied to electronic system troubleshooting, the electronic device in the abnormal electronic system can be determined as the tested object, and the constructed target test circuit is utilized to judge whether the performance of the electronic device and the wire harness is normal or not through two tests, so that the problem part in the abnormal electronic system can be quickly positioned, and the problem troubleshooting efficiency of the abnormal electronic system is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a flowchart illustrating an electronic system troubleshooting method according to an embodiment of the present invention;
fig. 2 is a circuit connection diagram of a troubleshooting video capture device according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an electronic system troubleshooting apparatus according to an embodiment of the present invention.
The reference numbers in the drawings:
01. shielding room
02. Device under test
03. Power supply
04. Artificial power supply network
05. Load(s)
06. Current measuring probe
07. Current injection clamp
08. Simulation and monitoring module
09. Signal source and power amplification module
10. Measuring module
11. Insulating gasket
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In order to quickly locate problem parts in an abnormal electronic system and improve the problem troubleshooting efficiency of the abnormal electronic system, the embodiment of the invention provides an electronic system troubleshooting method and device.
First, a detailed description will be given of an electronic system troubleshooting method provided by an embodiment of the present invention.
As shown in fig. 1, a flow chart of an electronic system troubleshooting method provided in an embodiment of the present invention is applied to a target electronic system with abnormal BCI test result, for example, when a display screen of a monitor in the BCI test is detected to be darkened or exhibit a water ripple phenomenon, it may be determined that the target electronic system is abnormal. It should be noted that, only one specific implementation manner for determining that the BCI test result of the target electronic system is abnormal is illustrated here, but other feasible implementation manners are also possible, and are not illustrated here one by one, and it is emphasized that, for an electronic system whose BCI test result is normal, no investigation is required.
Specifically, the electronic system troubleshooting method may include the steps of:
s101: and connecting the tested devices in the target electronic system by using a conventional wiring harness to form a target test circuit.
Specifically, the conventional wire harness includes at least: power, ground, video or audio lines. It should be noted that, only a few specific examples of the conventional wire harness are listed here, and should not be construed as limiting the embodiments of the present invention.
In particular, the target electronic system comprises a first type of electronic system for video signals or a second type of electronic system for audio signals. For example, the first type of electronic system is a car backing image system, a video player, a navigation system, etc., and the second type of electronic system is a bluetooth phone system, a car audio system, etc. It should be noted that, only a few specific examples of the first type electronic system and the second type electronic system are listed here, and this should not be construed as limiting the embodiments of the present invention.
It is emphasized that the "first type of electronic system" referred to in the present invention relates to the transmission and display of video signals, and the devices for video acquisition and video display are separate, and the two video separate devices are connected by a conventional video cable; the "electronic system of the second type" mentioned relates to the transmission and playback of audio signals, and the devices for audio acquisition and audio playback are separate, with a conventional audio line connection between the two audio-separate devices.
In one implementation, before connecting a device under test in a target electronic system using a conventional wiring harness, the electronic system troubleshooting method further includes: the device to be tested of the target electronic system is arranged in the shielding chamber and used for shielding the influence of electromagnetic induction of other electronic systems, and the accuracy of a checking result can be improved.
S102: and detecting whether the performance of the target test circuit is normal, if so, executing the step S103, otherwise, executing the step S104.
For example, whether the target test circuit is normal or not can be determined by comparing the current preset current value of the target test circuit. It should be noted that, the embodiments of the present invention do not need to limit the detection method for the performance of the target test circuit, and are not illustrated here.
S103: and judging that the tested device is normal.
S104: and replacing the conventional wire harness with a special shielding wire.
The special shielding wire is a bidirectional optical fiber link reinforced by electromagnetic compatibility, the anti-interference level of the special shielding wire is higher than that of the conventional wiring harness, and the special shielding wire is particularly suitable for monitoring anti-interference tests in a high-field-intensity environment.
It should be noted that, for the above-mentioned "first type electronic system" and "second type electronic system", the dedicated shielding line is a digital optical fiber video link for video signals or a digital optical fiber audio link for audio signals.
In one implementation, the digital fiber optic video link is connected as follows:
(11) when the video signal is output to the outside of the shielding room, the video output port of the tested device is connected with the transmitter of the digital optical fiber video link, and the receiver of the digital optical fiber video link is connected with the video analyzer or the video monitor outside the shielding room.
(12) When video signals are input into the shielding chamber, a video output port of a video signal generating source outside the shielding chamber is connected with a transmitter of the digital optical fiber video link, and a receiver of the digital optical fiber video link is connected with a video input port of the tested device.
In another implementation, the digital fiber audio link is connected as follows:
(21) when the audio signal is output to the outside of the shielding room, the audio output port of the tested device is connected with the transmitter of the digital optical fiber audio link, and the receiver of the digital optical fiber audio link is connected with the loudspeaker outside the shielding room.
(22) When audio signals are input into the shielding chamber, the audio output port of the audio signal generating source outside the shielding chamber is connected with the transmitter of the digital optical fiber audio link, and the receiver of the digital optical fiber audio link is connected with the audio input port of the tested device.
S105: and detecting whether the performance of the target test circuit after replacement is normal, if so, executing step S106, otherwise, executing step S107.
S106: and judging that the conventional wiring harness is abnormal.
S107: and judging that the tested device is abnormal.
Therefore, when the scheme provided by the embodiment of the invention is applied to electronic system troubleshooting, the electronic device in the abnormal electronic system can be determined as the tested object, and the constructed target test circuit is utilized to judge whether the performance of the electronic device and the wire harness is normal or not through two tests, so that the problem part in the abnormal electronic system can be quickly positioned, and the problem troubleshooting efficiency of the abnormal electronic system is improved.
In a specific implementation manner of the present invention, before step S102, the electronic system troubleshooting method may further include the steps of:
a. and obtaining a first output current of the tested device by using a current measuring probe.
b. And performing power amplification processing on the current of the device to be tested to obtain a processed second output current.
c. And judging whether the performance of the target test circuit is normal or not based on the second output current.
It should be noted that, here, the original current of the device under test, that is, the first output current is obtained first, and for convenience of processing, the first output current is power-amplified, and then the second output current after power amplification is used to make a corresponding determination. For example, whether the second output current is greater than the allowed current threshold value or not may be compared, and if so, the target test circuit is determined to be abnormal, otherwise, the target test circuit is determined to be normal. Of course, this is merely an example, and those skilled in the art should be able to make appropriate settings according to the specific situation in the actual application.
Referring to fig. 2, a circuit connection diagram of a troubleshooting video capture device according to an embodiment of the present invention is shown, and a troubleshooting process when a BCI test result of a reverse image system is abnormal is described below with reference to fig. 2 as an example.
It should be noted that the reverse image system belongs to a first type of electronic system for video signals, and the reverse image system includes a camera for capturing video, an MP5 host for displaying video, and a video cable for transmitting video signals.
In addition, taking a camera as an example of a device to be measured, the device to be measured 02, that is, the camera is arranged in the shielding chamber 01, after the current is introduced into the camera, the current output of the camera can be measured by using the current measuring probe 06, and the measured current is output to the measuring module 10 outside the shielding chamber, where the current is a first output current; a first output current flows through a conventional wiring harness, i.e., a video line, surrounded by an insulating spacer 11; when the first output current is amplified by the signal source and power amplification module 09, a second output current is obtained and injected into the test circuit by the injection clamp 07.
For the application scenario of video acquisition, after the current is injected, the output signal of the load 05 is subjected to digital-to-analog conversion, and then is transmitted to the analog and monitoring module 08 outside the shielding room 01 without distortion and interference through the digital-to-analog conversion, so that the video signal is monitored. Specifically, the video output of the camera is connected to the digital fiber video link transmitter TX port inside the shielded room, and the analog and monitoring module (such as a video analyzer or a video monitor) is connected to the digital fiber video link receiver RX port outside the shielded room.
Specifically, if the performance of the test circuit is normal, the camera is indicated to be normal, otherwise, the video line is replaced by a special shielding line. And further detecting whether the performance of the replaced test circuit is normal or not, if so, indicating that the conventional wiring harness is abnormal, otherwise, indicating that the tested device is abnormal, and thus finishing the inspection of the automobile reversing image system.
It should be noted that, the electronic system checking process is described only by taking the car reverse image system as an example, which should not be construed as limiting the present invention, and those skilled in the art need to make reasonable settings according to the specific situation in the practical application. In addition, the embodiment of the present invention does not need to limit the wiring manner of the device under test, and similarly, a person skilled in the art also needs to perform reasonable setting according to the specific situation in the practical application.
With reference to the method embodiment shown in fig. 1, an electronic system troubleshooting apparatus provided by the embodiment of the present invention is further described.
Fig. 3 is a schematic structural diagram of an electronic system troubleshooting apparatus according to an embodiment of the present invention, which is applied to a target electronic system with abnormal BCI test results. It should be noted that when the display screen of the monitor in the BCI test is darkened or shows a water ripple phenomenon, it indicates that the target electronic system is abnormal.
Specifically, the electronic system troubleshooting device may include the following modules: a test circuit construction module 210, a first circuit detection module 220, a first determination module 230, a harness replacement module 240, a second circuit detection module 250, a second determination module 260, and a third determination module 270.
And a test circuit constructing module 210 for connecting the devices under test in the target electronic system by using a conventional wire harness to form a target test circuit. Specifically, the conventional wire harness includes at least: power, ground, video or audio lines.
The first circuit detecting module 220 is configured to detect whether the performance of the target test circuit is normal.
A first determining module 230, configured to determine that the device under test is normal when the detection result of the first circuit detecting module 220 is normal.
And a wire harness replacement module 240, configured to replace the conventional wire harness with a dedicated shielding wire and trigger the second circuit detection module 250 when the detection result of the first circuit detection module 220 is abnormal. Wherein the dedicated shielded wire has a higher interference rejection level than the conventional wiring harness.
The second circuit detecting module 250 is configured to detect whether the performance of the replaced target test circuit is normal.
And the second determination module 260 is configured to determine that the conventional wire harness is abnormal when the detection result of the second circuit detection module 250 is normal.
A third determining module 270, configured to determine that the device under test is abnormal when the detection result of the second circuit detecting module 250 is abnormal.
Therefore, when the scheme provided by the embodiment of the invention is applied to electronic system troubleshooting, the electronic device in the abnormal electronic system can be determined as the tested object, and the constructed target test circuit is utilized to judge whether the performance of the electronic device and the wire harness is normal or not through two tests, so that the problem part in the abnormal electronic system can be quickly positioned, and the problem troubleshooting efficiency of the abnormal electronic system is improved.
In one implementation, the electronic system troubleshooting apparatus may further include a shielding chamber for disposing the device under test of the target electronic system within the shielding chamber.
In particular, the target electronic system comprises a first type of electronic system for video signals or a second type of electronic system for audio signals.
Specifically, the dedicated shielded line is a digital optical fiber video link for video signals or a digital optical fiber audio link for audio signals.
In one implementation, the digital fiber optic video link is connected as follows:
when outputting video signals to the outside of the shielding room, connecting a video output port of the tested device with a transmitter of the digital optical fiber video link, and connecting a receiver of the digital optical fiber video link with a video analyzer or a video monitor outside the shielding room;
when video signals are input into the shielding chamber, a video output port of a video signal generating source outside the shielding chamber is connected with a transmitter of the digital optical fiber video link, and a receiver of the digital optical fiber video link is connected with a video input port of the tested device.
In another implementation, the digital fiber audio link is connected as follows:
when outputting audio signals to the outside of the shielding room, connecting an audio output port of the tested device with a transmitter of the digital optical fiber audio link, and connecting a receiver of the digital optical fiber audio link with a loudspeaker outside the shielding room;
when audio signals are input into the shielding chamber, the audio output port of the audio signal generating source outside the shielding chamber is connected with the transmitter of the digital optical fiber audio link, and the receiver of the digital optical fiber audio link is connected with the audio input port of the tested device.
In one implementation, the electronic system troubleshooting apparatus further includes the following modules: the circuit comprises a first current output module, a second current output module and a circuit judgment module.
The first current output module is configured to obtain a first output current of the device under test by using a current measurement probe before the first circuit detection module 220 detects whether the performance of the target test circuit is normal.
And the second current output module is used for carrying out power amplification processing on the current of the tested device to obtain a processed second output current.
And the circuit judging module is used for judging whether the performance of the target test circuit is normal or not based on the second output current.
It should be noted that, here, the original current of the device under test, that is, the first output current is obtained first, and for convenience of processing, the first output current is power-amplified, and then the second output current after power amplification is used to make a corresponding determination. For example, whether the second output current is greater than the allowed current threshold value or not may be compared, and if so, the target test circuit is determined to be abnormal, otherwise, the target test circuit is determined to be normal. Of course, this is merely an example, and those skilled in the art should be able to make appropriate settings according to the specific situation in the actual application.
For system or apparatus embodiments, since they are substantially similar to method embodiments, they are described in relative simplicity, and reference may be made to some descriptions of method embodiments for related points.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Those skilled in the art will appreciate that all or part of the steps in the above method embodiments may be implemented by a program to instruct relevant hardware to perform the steps, and the program may be stored in a computer-readable storage medium, referred to herein as a storage medium, such as: ROM/RAM, magnetic disk, optical disk, etc.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention shall fall within the protection scope of the present invention.
Claims (5)
1. An electronic system checking method is applied to a target electronic system with abnormal BCI test results, and is characterized by comprising the following steps:
connecting the tested devices in the target electronic system by using a conventional wiring harness to form a target test circuit; the conventional wire harness includes at least: a power line, a ground line, a video line or an audio line;
detecting whether the performance of the target test circuit is normal or not, wherein the specific steps comprise: obtaining a first output current of the tested device by using a current measuring probe;
performing power amplification processing on the current of the device to be tested to obtain a processed second output current;
judging whether the performance of the target test circuit is normal or not based on the second output current;
if the measured voltage is normal, judging that the measured device is normal;
if the normal wire harness is abnormal, replacing the normal wire harness with a special shielding wire, detecting whether the performance of the target test circuit after replacement is normal, if so, judging that the normal wire harness is abnormal, otherwise, judging that the device to be tested is abnormal; wherein the interference rejection level of the dedicated shielded wire is higher than the interference rejection level of the conventional wiring harness; the special shielding wire is a digital optical fiber video link aiming at video signals or a digital optical fiber audio link aiming at audio signals;
the electronic system troubleshooting method further comprises the following steps: placing a device under test of the target electronic system within a shielded room;
the target electronic system comprises a first type of electronic system for video signals or a second type of electronic system for audio signals.
2. The electronic system troubleshooting method of claim 1, wherein the digital fiber optic video link is connected as follows:
when outputting video signals to the outside of the shielding room, connecting a video output port of the tested device with a transmitter of the digital optical fiber video link, and connecting a receiver of the digital optical fiber video link with a video analyzer or a video monitor outside the shielding room;
when video signals are input into the shielding chamber, a video output port of a video signal generating source outside the shielding chamber is connected with a transmitter of the digital optical fiber video link, and a receiver of the digital optical fiber video link is connected with a video input port of the tested device.
3. The electronic system troubleshooting method of claim 1, wherein the digital fiber audio link is connected as follows:
when outputting audio signals to the outside of the shielding room, connecting an audio output port of the tested device with a transmitter of the digital optical fiber audio link, and connecting a receiver of the digital optical fiber audio link with a loudspeaker outside the shielding room;
when audio signals are input into the shielding chamber, the audio output port of the audio signal generating source outside the shielding chamber is connected with the transmitter of the digital optical fiber audio link, and the receiver of the digital optical fiber audio link is connected with the audio input port of the tested device.
4. The electronic system troubleshooting method according to any one of claims 1-3, wherein the target electronic system for which the BCI test result is abnormal is determined by:
when the display screen of the monitor in the BCI test is detected to be darkened or appear a water ripple phenomenon, the target electronic system is determined to be abnormal.
5. An electronic system checking device is applied to a target electronic system with abnormal BCI test results, and is characterized by comprising:
the test circuit construction module is used for connecting the tested devices in the target electronic system by using a conventional wiring harness to form a target test circuit; the conventional wire harness includes at least: a power line, a ground line, a video line or an audio line;
the first circuit detection module is used for detecting whether the performance of the target test circuit is normal or not; the method comprises the following specific steps: obtaining a first output current of the tested device by using a current measuring probe;
performing power amplification processing on the current of the device to be tested to obtain a processed second output current;
judging whether the performance of the target test circuit is normal or not based on the second output current;
the first judging module is used for judging that the device under test is normal when the detection result of the first circuit detecting module is normal;
the wire harness replacing module is used for replacing the conventional wire harness with a special shielding wire and triggering the second circuit detection module when the detection result of the first circuit detection module is abnormal; wherein the interference rejection level of the dedicated shielded wire is higher than the interference rejection level of the conventional wiring harness; the special shielding wire is a digital optical fiber video link aiming at video signals or a digital optical fiber audio link aiming at audio signals;
the second circuit detection module is used for detecting whether the performance of the target test circuit after replacement is normal;
the second judgment module is used for judging that the conventional wire harness is abnormal when the detection result of the second circuit detection module is normal;
a third determination module, configured to determine that the device under test is abnormal when the detection result of the second circuit detection module is abnormal;
the target electronic system comprises a first type of electronic system for video signals or a second type of electronic system for audio signals.
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| CN113030590B (en) * | 2021-02-24 | 2023-05-09 | 中国人民解放军陆军工程大学 | High-current injection equivalent substitution irradiation test method for shielded wire coupling channel |
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