CN108593779B - Phased array linear array probe wedge block with focusing characteristic - Google Patents
Phased array linear array probe wedge block with focusing characteristic Download PDFInfo
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- CN108593779B CN108593779B CN201810321046.1A CN201810321046A CN108593779B CN 108593779 B CN108593779 B CN 108593779B CN 201810321046 A CN201810321046 A CN 201810321046A CN 108593779 B CN108593779 B CN 108593779B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
Abstract
The invention relates to a phased array linear array probe wedge block with focusing characteristic, which comprises a first sub wedge block and a second sub wedge block which are sequentially arranged from top to bottom, wherein the sound velocity and the acoustic impedance of the first sub wedge block are respectively c1And Z1The sound velocity and the acoustic impedance of the second sub-wedge are respectively c2And Z2Speed of sound c of first sub-wedge1Greater than the speed of sound c of the second sub-wedge2Acoustic impedance Z of the first sub-wedge1Less than the acoustic impedance Z of the second sub-wedge2(ii) a The interface of the first sub wedge block and the second sub wedge block is an arc surface, and the horizontal position of the central axis of the arc surface is located at the horizontal center of the wedge block. The wedge block improves the ultrasonic wave transmissivity of a linear array probe wafer/first sub wedge block interface, a first sub wedge block/second sub wedge block interface and a second sub wedge block/detected workpiece interface by matching the acoustic impedances of the first sub wedge block and the second sub wedge block, and has better sound transmission effect than the traditional phased array wedge block; the contact surface of the wedge block and the surface of the workpiece to be detected is a plane, so that the coupling effect in the detection process is ensured to the maximum extent.
Description
Technical Field
The invention belongs to the field of phased array ultrasonic nondestructive testing, and particularly relates to a phased array linear array probe wedge block with focusing characteristics.
Background
The phased array probe wedge block is mainly used for being matched with a phased array probe to realize the functions of protecting the probe, delaying sound beams or deflecting sound beams and the like. When materials with large sound attenuation such as nickel-based alloy, austenitic stainless steel and the like are detected, sound beams with smaller focus sizes need to be obtained, so that the detection sensitivity and resolution are improved, and effective detection of small defects is realized.
At present, the wafer arrangement form of the phased array probe which is most widely used in field detection work is a one-dimensional linear form, which is called linear array for short. However, the linear array probe only focuses the acoustic beam parallel to the wafer arrangement direction (longitudinal direction for short), and is unfocused perpendicular to the wafer arrangement direction (lateral direction for short). To obtain a smaller focal spot size of the acoustic beam, the acoustic beam is focused perpendicular to the wafer arrangement direction.
Changing the wafer arrangement of a phased array probe (e.g., changing a linear array to a two-dimensional array) can reduce the focus size, but the two-dimensional array probe has a complex manufacturing process, is expensive, and has high requirements for a matched phased array instrument. The size of a focus can be reduced by arranging the wedge block with a geometric focusing function, but the coupling surface of the wedge block has a certain curvature, so that the coupling effect with a detected workpiece in the detection process is influenced.
Therefore, the transverse focusing wedge block which can be matched with the existing phased array linear array probe and does not influence the coupling effect is designed, and the transverse focusing wedge block has practical significance for improving the detection sensitivity and the resolution of the linear array probe.
Disclosure of Invention
The invention aims to provide a phased array linear array probe wedge block with focusing characteristics, which can obtain an ultrasonic sound beam with a smaller focus size, improve the focusing performance, detection sensitivity and resolution of a phased array linear array probe and realize effective detection of materials with larger sound attenuation, such as nickel-based alloy, austenitic stainless steel and the like.
In order to achieve the purpose, the invention adopts the following technical scheme to realize the purpose:
a phased array linear array probe wedge block with focusing characteristics comprises a first sub wedge block and a second sub wedge block which are sequentially arranged from top to bottom, wherein the sound velocity and the acoustic impedance of the first sub wedge block are respectively c1And Z1The sound velocity and the acoustic impedance of the second sub-wedge are respectively c2And Z2Speed of sound c of first sub-wedge1Greater than the speed of sound c of the second sub-wedge2Acoustic impedance Z of the first sub-wedge1Less than the acoustic impedance Z of the second sub-wedge2(ii) a The interface of the first sub wedge block and the second sub wedge block is an arc surface, and the horizontal position of the central axis of the arc surface is located at the horizontal center of the wedge block.
The invention is further improved in that the first sub-wedge block is contacted with the linear array probe wafer, and the second sub-wedge block is contacted with the detected workpiece.
Further improvements of the inventionFurther, the acoustic impedance Z of the first sub-wedge1Acoustic impedance Z with linear array probe wafer0And acoustic impedance Z of the workpiece to be inspected3Satisfies the relationship of Z1 3＝Z0 2Z3Acoustic impedance Z of the second sub-wedge2Acoustic impedance Z with linear array probe wafer0And acoustic impedance Z of the workpiece to be inspected3Satisfies the relationship of Z2 3＝Z0Z3 2。
The invention is further improved in that the distance between the arc top of the interface of the first sub-wedge and the second sub-wedge and the upper surface of the wedge is less than 0.1 mm.
The invention is further improved in that the radius of curvature R of the interface of the first sub-wedge block and the second sub-wedge block and the length l of the linear array probe wafer meet 2l/R < 0.2.
The invention has the further improvement that the width of the wedge block is more than 2 times of the length of the linear array probe wafer, and the length of the wedge block is more than 1.5 times of the length of the linear array probe.
The invention is further improved in that the lower surface of the wedge block, which is contacted with the detected workpiece, is a plane, and the upper surface of the wedge block, which is contacted with the linear array probe wafer, is an inclined plane or a horizontal plane.
The invention has the further improvement that the upper surface of the wedge block is provided with a screw hole connected with the linear array probe, and the specification of the screw hole is matched with that of the linear array probe.
Compared with the prior art, the invention has the following advantages:
the wedge block improves the ultrasonic wave transmissivity of a linear array probe wafer/first sub wedge block interface, a first sub wedge block/second sub wedge block interface and a second sub wedge block/detected workpiece interface by matching the acoustic impedances of the first sub wedge block and the second sub wedge block, and has better sound transmission effect than the traditional phased array wedge block; the contact surface of the wedge block and the surface of the workpiece to be detected is a plane, so that the coupling effect in the detection process is ensured to the maximum extent; the transverse focusing of the ultrasonic sound beam is realized, and the transverse resolution of ultrasonic detection is improved; the improvement of the sound transmission effect and the transverse focusing of the ultrasonic sound beam enable the energy of the ultrasonic sound beam entering the detected workpiece to be more concentrated, and the detection sensitivity is improved.
Drawings
Fig. 1 is a schematic structural diagram of a phased array linear array probe wedge with focusing characteristics according to the present invention.
Fig. 2 is a top view of a wedge block of a linear array probe of a phased array with focusing feature according to the present invention.
Fig. 3 is a working diagram of a phased array linear array probe wedge with focusing characteristics according to the invention.
Detailed Description
The technical solutions in the present invention will be described clearly and completely with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments of the invention, not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 and 2:
the invention relates to a phased array linear array probe wedge block with focusing characteristic, which consists of sound velocity and acoustic impedance of c1And Z1 First sub-wedge 1 and sound velocity and acoustic impedance c2And Z2The second sub-wedge 2 is made of two materials, the sound velocity c of the first sub-wedge 11Greater than the speed of sound c of the second sub-wedge 22Acoustic impedance Z of the first sub-wedge 11Less than the acoustic impedance Z of the second sub-wedge 22. The interface of the first sub wedge block 1 and the second sub wedge block 2 is an arc surface, and the horizontal position of the central axis of the arc surface is positioned at the horizontal center of the wedge block.
The first sub-wedge 1 is contacted with the linear array probe wafer, and the second sub-wedge 2 is contacted with the detected workpiece.
Acoustic impedance Z of the first sub-wedge 11Acoustic impedance Z with linear array probe wafer0And acoustic impedance Z of the workpiece to be inspected3Satisfy the relationship of
Acoustic impedance Z of second sub-wedge 22Acoustic impedance Z with linear array probe wafer0And acoustic impedance of the workpiece to be inspectedZ3Satisfy the relationship of
The distance between the arc top of the interface of the first sub-wedge 1 and the second sub-wedge 2 and the upper surface of the wedge is less than 0.1 mm.
The radius of curvature R of the interface of the first sub wedge block 1 and the second sub wedge block 2 and the length l of the linear array probe wafer meet 2l/R < 0.2.
The width of the wedge block is more than 2 times of the length of the linear array probe wafer, and the length of the wedge block is more than 1.5 times of the length of the linear array probe.
The internal acoustic impedance of the first sub-wedge 1 and the second sub-wedge 2 is uniform, and the defect that the ultrasonic wave propagation is influenced is avoided.
The lower surface of the wedge block, which is contacted with the detected workpiece, is a plane, and the upper surface of the wedge block, which is contacted with the linear array probe wafer, is an inclined plane or a horizontal plane.
The upper surface of the wedge block is provided with a screw hole connected with the linear array probe, and the specification of the screw hole is matched with that of the linear array probe.
The invention will be further explained with reference to fig. 3:
the linear array probe 9 is connected with the wedge block through the screw hole 8, the linear array probe wafer 6 is coupled with the upper surface 4 of the wedge block to form a probe wafer/wedge block interface 10, ultrasonic waves 11 emitted by the linear array probe wafer 6 are transmitted into the first sub wedge block 1 through the probe wafer/wedge block interface 10, and when the ultrasonic waves 11 pass through the first sub wedge block 1/second sub wedge block 2 interface 5, due to the speed of sound c of the ultrasonic waves in the first sub wedge block 11Is larger than the ultrasonic sound velocity c in the second sub-wedge 22The ultrasonic wave 11 is refracted in the central axis direction. The ultrasonic wave 11 entering the second sub-wedge 2 enters the workpiece 7 to be detected through the interface 12 of the second sub-wedge 2/the workpiece 7 to be detected due to the speed c of the ultrasonic wave in the second sub-wedge 22Less than the speed of sound c of the ultrasonic wave in the workpiece 7 to be inspected3The ultrasonic wave 11 is refracted in the central axis direction. The ultrasonic wave 11 entering the workpiece 7 to be detected is finally focused at a position 13 in the workpiece 7 to be detected, and the focusing of the ultrasonic sound beam is realized.
By changing the curvature radius R of the interface 5 of the first sub wedge 1/the second sub wedge 2, the ultrasonic wave 11 can be focused at the positions 13 with different depths of the detected workpiece 7, and the detection of the defects at the positions with different depths of the detected workpiece 7 is realized.
Claims (5)
1. The phased array linear array probe wedge block with the focusing characteristic is characterized by comprising a first sub wedge block (1) and a second sub wedge block (2) which are sequentially arranged from top to bottom, wherein the sound velocity and the acoustic impedance of the first sub wedge block (1) are respectively c1And Z1The sound velocity and the acoustic impedance of the second sub-wedge (2) are respectively c2And Z2Speed of sound c of first sub-wedge (1)1Greater than the speed of sound c of the second sub-wedge (2)2Acoustic impedance Z of the first sub-wedge (1)1Less than the acoustic impedance Z of the second sub-wedge (2)2(ii) a The interface (5) of the first sub wedge block (1) and the second sub wedge block (2) is an arc surface, and the horizontal position of the central axis of the arc surface is positioned at the horizontal center of the wedge block;
the first sub-wedge block (1) is contacted with the linear array probe wafer (6), and the second sub-wedge block (2) is contacted with the detected workpiece (7);
acoustic impedance Z of the first sub-wedge (1)1Acoustic impedance Z with linear probe wafer (6)0And acoustic impedance Z of the workpiece (7)3Satisfy the relationship of
Acoustic impedance Z of the second sub-wedge (2)2Acoustic impedance Z with linear probe wafer (6)0And acoustic impedance Z of the workpiece (7)3Satisfy the relationship of
The curvature radius R of the interface (5) of the first sub wedge block (1) and the second sub wedge block (2) and the length l of the linear array probe wafer (6) meet the condition that 2l/R is less than 0.2.
2. The phased array linear array probe wedge block with focusing characteristic as claimed in claim 1, wherein the distance between the arc top of the interface (5) of the first sub wedge block (1) and the second sub wedge block (2) and the upper surface (4) of the wedge block is less than 0.1 mm.
3. The phased array linear array probe wedge block with focusing characteristics as claimed in claim 1, wherein the wedge block width is more than 2 times the length of the linear array probe wafer (6), and the wedge block length is more than 1.5 times the length of the linear array probe.
4. The phased array linear array probe wedge block with the focusing characteristic as claimed in claim 1, wherein the lower surface (3) of the wedge block, which is in contact with a workpiece (7) to be detected, is a plane, and the upper surface (4) of the wedge block, which is in contact with a linear array probe wafer (6), is an inclined surface or a horizontal surface.
5. The phased array linear array probe wedge block with the focusing characteristic as claimed in claim 1, wherein a screw hole (8) connected with the linear array probe is formed in the upper surface (4) of the wedge block, and the specification of the screw hole (8) is matched with that of the linear array probe (9).
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| CN201810321046.1A CN108593779B (en) | 2018-04-11 | 2018-04-11 | Phased array linear array probe wedge block with focusing characteristic |
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| CN201810321046.1A CN108593779B (en) | 2018-04-11 | 2018-04-11 | Phased array linear array probe wedge block with focusing characteristic |
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| CN108593779B true CN108593779B (en) | 2020-11-06 |
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| CN109765301B (en) * | 2019-03-21 | 2023-08-22 | 江苏省特种设备安全监督检验研究院 | But voussoir is used in TOFD detection of barrier |
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| WO2015077355A1 (en) * | 2013-11-19 | 2015-05-28 | Washington University | Systems and methods of grueneisen-relaxation photoacoustic microscopy and photoacoustic wavefront shaping |
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| CN102507737A (en) * | 2011-09-30 | 2012-06-20 | 哈尔滨工业大学 | Ultrasonic time-of-flight diffraction method by cylinder focusing wedge |
| CN102608216B (en) * | 2012-04-13 | 2014-03-12 | 中国计量学院 | Ultrasonic nondestructive testing wedge block |
| CN102699662A (en) * | 2012-06-18 | 2012-10-03 | 无锡市宏源弹性器材有限公司 | Pressing device for steel wire rope vibration isolator |
| CN102967659B (en) * | 2012-10-30 | 2014-11-26 | 广东电网公司电力科学研究院 | Calculation method of sound field distribution of phased array ultrasonic probe in flaw detection in multilayer medium |
| US9575034B2 (en) * | 2014-03-12 | 2017-02-21 | Siemens Energy, Inc. | Method and system for immersion ultrasound inspection including within downwardly opening cavities |
| CN104458919A (en) * | 2014-12-03 | 2015-03-25 | 北京中电龙源环保科技有限公司 | Small K-value ultrasonic flaw detection dual-crystal probe and flaw detection method thereof |
| CN104976970B (en) * | 2015-07-06 | 2017-11-10 | 中国科学院声学研究所 | A kind of ultrasonic phase array voussoir self-check system and its method |
| CN105136903B (en) * | 2015-08-13 | 2018-05-22 | 河海大学常州校区 | Cylinder Surface workpiece butt weld transverse defect detection device and method |
| CN205665203U (en) * | 2016-06-07 | 2016-10-26 | 安徽理工大学 | Measurable curved surface and planar phased array detect voussoir |
| CN106442737B (en) * | 2016-10-21 | 2023-04-25 | 中国计量大学 | Multifunctional ultrasonic flaw detection wedge block applicable to complex curved surface and provided with auxiliary rod |
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