CN108319549B - Test system and test method - Google Patents

Test system and test method Download PDF

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CN108319549B
CN108319549B CN201711433314.0A CN201711433314A CN108319549B CN 108319549 B CN108319549 B CN 108319549B CN 201711433314 A CN201711433314 A CN 201711433314A CN 108319549 B CN108319549 B CN 108319549B
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test
subsystem
interface
signal
real
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CN108319549A (en
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曹文天
邹毅军
李鸿彪
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Shanghai Keliang Information Technology Co ltd
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Shanghai Keliang Information Technology Co ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3684Test management for test design, e.g. generating new test cases
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

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Abstract

The embodiment of the invention relates to the technical field of automatic control, and discloses a test system and a test method. The test system of the invention comprises: the system comprises a test host subsystem, a real-time test simulation calculation subsystem and a signal interface subsystem; the test host subsystem generates a peripheral environment model and a test code of a tested piece; the real-time test simulation calculation subsystem runs test codes and a peripheral environment model, generates test signals for the tested piece and transmits the test signals to the signal interface subsystem; the signal interface subsystem carries out signal conditioning according to the test signal and then transmits the conditioned test signal to the tested piece; and the tested piece generates actual feedback data according to the conditioned test signal, and transmits the actual feedback data to the test host subsystem, and the test host subsystem forms a test report. The test system can realize real-time dynamic closed-loop test, has universality, can automatically generate test codes without writing programs, and reduces the test time and cost.

Description

Test system and test method
Technical Field
The embodiment of the invention relates to the technical field of automatic control, in particular to a test system and a test method.
Background
Embedded controllers typically control domain-specific objects, and failure to function may result in catastrophic consequences or significant economic loss. Thus, the embedded system controller has a very high reliability requirement. This requires rigorous testing, validation and verification of the embedded controller to improve product reliability. A large amount of strict software and hardware tests are required to be carried out on the embedded controller in the production, delivery and maintenance stages. Therefore, a test system which is convenient to build and complete in function becomes a necessary condition for production, scientific research and guarantee of the embedded controller.
The inventor finds that at least the following problems exist in the prior art: an embedded controller test system used in the test of the existing embedded controller in the production, scientific research and guarantee stages is usually based on a windows system and is a non-real-time operating system, and some dynamic characteristics of the software of the embedded controller cannot be tested; the existing test system is usually a special test system developed for software of a certain type, the test software is not universal, and testers cannot modify the test software or the modification of the test software is difficult; in addition, the existing test system usually only tests a certain function, cannot achieve full coverage of the test function, and needs to use multiple sets of test equipment for testing.
Disclosure of Invention
The embodiment of the invention aims to provide a test system and a test method, which can realize real-time dynamic closed-loop test, have universality, can automatically generate test codes without writing programs, and reduce the test time and cost.
To solve the above technical problem, an embodiment of the present invention provides a test system, including: the system comprises a test host subsystem, a real-time test simulation calculation subsystem and a signal interface subsystem; the test host subsystem generates a peripheral environment model and a test code of the tested piece and transmits the peripheral environment model and the test code to the real-time test simulation calculation subsystem through the Ethernet; the real-time test simulation calculation subsystem runs a test code and a peripheral environment model, generates a test signal for the tested piece by the test code and the tested piece peripheral environment model, and transmits the test signal to the signal interface subsystem through a first input/output and bus interface; the signal interface subsystem carries out signal conditioning according to the test signal and transmits the conditioned test signal to the tested piece through a second input/output and bus interface; the tested piece receives the conditioned test signal and generates actual feedback data according to the test signal, wherein the actual feedback data is conditioned by the signal interface subsystem, collected by the real-time test simulation calculation subsystem and sent to the test host subsystem through the Ethernet; and the test host subsystem compares the actual feedback data with a set expected value to obtain a test result, and forms a test report according to the test result.
The embodiment of the invention also provides a test method, which comprises the following steps: the test host subsystem generates a peripheral environment model and a test code of the tested piece and transmits the model and the code to the real-time test simulation calculation subsystem through the Ethernet. The real-time test simulation calculation subsystem runs a test code and a peripheral environment model, generates a test signal for the tested piece by the test code and the tested piece peripheral environment model, and transmits the test signal to the signal interface subsystem through the first input/output and bus interface. And the signal interface subsystem carries out signal conditioning according to the test signal and transmits the conditioned test signal to the tested piece through the second input/output and bus interface. And the tested piece receives the conditioned test signal and generates actual feedback data according to the test signal, wherein the actual feedback data is conditioned by the signal interface subsystem, collected by the real-time test simulation calculation subsystem and sent to the test host subsystem through the Ethernet. And the test host subsystem compares the actual feedback data with a set expected value to obtain a test result, and forms a test report according to the test result.
Compared with the prior art, the test system can dynamically test the tested piece in real time, returns the test result of the tested piece to the test host subsystem and provides the test result to a user in the form of a test report, so that the test system is a closed-loop test process. And the test code can be automatically generated in the test process, and the user does not need to program, so that the user only needs to pay attention to the test and does not need to write the code, and the test development time and the cost are greatly reduced. The user can generate the test peripheral environment model as required, tests aiming at different functions of the tested piece, and does not need to use different test equipment according to different functions, so the method has universality.
In addition, the test host subsystem includes: the test development management computer is used for generating test codes by compiling the test cases, and the test case realization computer is used for monitoring the execution of the test cases. The test codes generated by the test development management computer can be used for testing the tested piece, and the test case realization calculation can be used for monitoring the test process so as to control the whole test process in real time.
In addition, the real-time test simulation calculation subsystem comprises a plurality of real-time test simulation computers, wherein the plurality of real-time test simulation computers are connected in parallel and realize synchronous work so as to realize distributed test. The real-time test simulation calculation subsystem adopts a plurality of real-time test simulation computers, and the plurality of calculation subsystems work synchronously in the operation process, so that larger data volume can be processed simultaneously, distributed test is realized, and the operation processing capacity of the system is increased.
In addition, the signal interface subsystem adopts an interface adapter to adapt the interface of the real-time test simulation computer to the interface of the tested piece. Because the interface requirement of the tested piece is a fixed type, and the interface on the real-time test simulation computer board can be of various types, the interface from the test board needs to be converted into the same type as the tested piece through an adapter so as to facilitate the transmission of signals.
In addition, before the test host subsystem generates the peripheral environment model and the test code of the tested piece, the method further comprises the following steps: the test host subsystem defines an interface protocol and an interface control file and automatically generates an interface protocol and an interface control file program according to the test requirement document of the tested piece. The interface protocol and the interface control file program are part of a test case and are used for generating test codes and running on the real-time test simulation calculation subsystem to generate test signals.
In addition, before the signal interface subsystem is conditioned according to the test signal, the signal interface subsystem further comprises: the signal interface subsystem receives a test signal generated by the real-time test simulation calculation subsystem, and an interface adapter is adopted for interface adaptation.
Before the signal interface subsystem is conditioned according to the test signal, the test signal generated by the real-time test simulation calculation subsystem is received, and the interface of the real-time test simulation computer is adapted to the interface of the tested piece, so that the signal is transmitted conveniently.
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One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
FIG. 1 is a block diagram of a test system according to a first embodiment of the present invention;
FIG. 2 is a block diagram of a test system according to a second embodiment of the present invention;
FIG. 3 is a flow chart of a testing method according to a third embodiment of the present invention;
FIG. 4 is a flow chart of a testing method according to a fourth embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that numerous technical details are set forth in order to provide a better understanding of the present application in various embodiments of the present invention. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments.
A first embodiment of the present invention relates to a test system. The structure diagram of the test system is shown in fig. 1, and specifically includes: a test host subsystem 11, a real-time test simulation calculation subsystem 12, a signal interface subsystem 13, a tested device 14, an Ethernet 15, a first input/output and bus interface 16, and a second input/output and bus interface 17.
The test host subsystem 11 generates a tested piece peripheral environment model and a test code, and transmits the tested piece peripheral environment model and the test code to the real-time test simulation calculation subsystem 12 through the Ethernet 15; the real-time test simulation calculation subsystem 12 runs a test code, generates a test signal for the tested piece by the test code and the tested piece peripheral environment model, and transmits the test signal to the signal interface subsystem 13 through the first input/output and bus interface 16; the signal interface subsystem 13 conditions signals according to the test signals and transmits the conditioned test signals to the tested piece 14 through the second input/output and bus interface 17; the tested piece 14 receives the conditioned test signal and generates actual feedback data according to the test signal, wherein the actual feedback data is conditioned by the signal interface subsystem, collected by the real-time test simulation calculation subsystem, and sent to the test host subsystem through the Ethernet. And the test host subsystem compares the actual feedback data with a set expected value to obtain a test result, and forms a test report according to the test result.
It should be noted that the set of test system is mainly applied to testing the embedded controller, so the device under test 14 is generally referred to as an embedded controller.
The test host subsystem 11 defines an interface protocol and an interface control file according to an interface requirement document of a tested piece by running a test host module in automated test software, and automatically generates an interface protocol and an interface control file program to complete configuration of the interface protocol. And establishing a peripheral environment model of the tested piece, wherein the model is compiled to generate an executable program which can run on a real-time test simulation computer in real time, and the peripheral environment refers to other equipment with data interaction with the embedded controller. In order to test the functionality and performance of the embedded controller, test equipment is required to simulate the peripheral devices that are cross-linked with the embedded controller. In addition, the test host subsystem 11 compiles test cases and makes test flows according to the requirements of the test requirement documents of the tested pieces. The test case is compiled in a graphical and form-filling mode, and a test code is automatically generated according to the compiled test case.
In addition, different test cases and peripheral environment models can be designed according to different peripheral environments, multiple functions and performances of the embedded controller can be tested on one set of test system through simulating different peripheral environments, different test devices do not need to be used according to different functions of the embedded controller, and test cost is saved.
It should be noted that the real-time testing simulation computing subsystem 12 runs the test target machine module in the automated test software, and executes the test process by running the test code and the peripheral environment model.
The signal interface subsystem 13 is used to condition signals and adapt interfaces. The interface is adapted because the connector type of the embedded controller of the tested device 14 is fixed, and is generally an aviation plug, and the real-time testing simulation computing subsystem 12 is plugged with a relevant board card, and the bus interface protocol of the board card is various, for example: 1553B, an RS-422 Interface protocol, a Controller Area Network (CAN) Interface protocol, a Digital In and Out (DIO) Interface protocol, an Analog to Digital (AD) Interface protocol, a Digital to Analog (DA) Interface protocol, a 4M1553 Interface protocol, a high speed in and out (Rapid IO) Interface protocol, a Low Voltage Differential Signaling (LVDS) Interface protocol, an Inter-integrated circuit (I2C) Interface protocol, a Serial Peripheral Interface (SPI) Interface protocol, and the like. Therefore, the hardware connector of the board card may have various forms such as DB9, DB37, SCSI100, etc., so that it needs to be uniformly switched into an aviation plug through an adapter to interface with the embedded controller of the tested piece 14 for signal transmission.
It should be noted that the data interaction between the test host subsystem 11 and the real-time test simulation calculation subsystem 12 via the ethernet mainly includes data to be monitored in real time, variable values and actual feedback data generated by the tested object 14 through testing, which are generated by running test codes during the testing process.
In addition, the actual feedback data generated by the tested piece through the test is firstly transmitted to the signal interface subsystem 13, and is returned to the test host subsystem 11 through the real-time test simulation calculation subsystem 12. The expected value is preset in advance in the test master subsystem 11 according to the correct data fed back from the tested object specified in the test requirements. If the actual feedback data generated by the tested piece after the test is the same as the expected value, the tested function item of the tested piece is correct, otherwise, the tested piece software has a problem. And forming a test report according to the test result so as to be convenient for the user to check.
Compared with the prior art, the test system in the embodiment can dynamically test the tested piece in real time, and returns the actual feedback data of the tested piece to the test host subsystem, and the test host subsystem compares the actual feedback data with the set expected value to obtain the test result, and provides the test result to the user in the form of the test report, so that the test process is a closed-loop test process. And the test code can be automatically generated in the test process, and the user does not need to program, so that the user only needs to pay attention to the test and does not need to write the code, and the test development time and the cost are greatly reduced. The user can generate the test peripheral environment model as required, tests aiming at different functions of the tested piece, and does not need to use different test equipment according to different functions, so the method has universality.
A second embodiment of the invention relates to a test system. The second embodiment is substantially the same as the first embodiment, and a specific configuration diagram of the test system is shown in fig. 2. Wherein, the main improvement lies in: the second embodiment specifically describes the structures of the test host subsystem, the real-time test simulation calculation subsystem, and the signal interface subsystem in the first embodiment.
The test host subsystem 201 specifically includes a test development management computer 211 and a test case implementation computer 221, and performs data interaction with the real-time test simulation calculation subsystem 202 through an ethernet 242. The real-time testing, simulating and calculating subsystem 202 includes a first real-time testing and simulating computer 212, a second real-time testing and simulating computer 222 and a third real-time testing and simulating computer 232, and the signal interface subsystem 203 is connected to the real-time testing, simulating and calculating subsystem 202 through a first input/output and bus interface 223 and an adapter 213, and is connected to the embedded controller 204 through a second input/output and bus interface 233.
The test development management computer 211 is configured to generate test code data by writing a test case, and the test case implementation computer 221 is configured to monitor execution of the test case. The test host subsystem 201 can also realize the analysis and positioning of faults through the test development management computer 211 and the test case realization computer 221, and realize the functions of graphical monitoring, user authority management and the like through a human-computer interaction screen.
It should be noted that the real-time testing simulation computing subsystem 202 includes a plurality of real-time testing simulation computers, three of which are taken as an example, the number of the real-time testing simulation computers may be determined according to actual needs in actual testing, wherein the plurality of real-time testing simulation computers are connected in parallel and implement synchronous operation, so as to implement distributed testing. Wherein the parallel connection is implemented based on the 1394B protocol. The real-time testing simulation computing subsystem 202 adopts a plurality of real-time testing simulation computers, after the testing host subsystem 201 completes the compiling of the peripheral environment and the generation of the testing codes, the testing codes and the peripheral environment models which need to be operated are respectively transmitted to the plurality of real-time testing simulation computers, when the real-time testing simulation computing subsystem 202 receives the operation instruction, the plurality of real-time testing simulation computers simultaneously operate the distributed peripheral environment models and the testing codes, a large amount of data can be simultaneously processed, and therefore the operation processing capacity of the testing system is increased.
The real-time test simulation computer is provided with a board card, the board card is provided with an interface for transmitting signals outwards, and the interface of the board card comprises multiple types, so that the interface on the test board card needs to be converted into the same type as a tested piece through an adapter, and the signals can be transmitted conveniently.
In addition, the adapter 213 for interface adaptation used by the signal interface subsystem 203 has interface conversion equipment such as a switch matrix, and controls the switching of wiring harnesses by defining an interface configuration mode through software such as the test host subsystem 201, thereby simplifying the processes of wiring and changing wires.
Compared with the prior art, the test system in the embodiment can dynamically test the tested piece in real time, and returns the actual feedback data of the tested piece to the test host subsystem, and the test host subsystem compares the actual feedback data with the set expected value to obtain the test result, and provides the test result to the user in the form of the test report, so that the user only needs to pay attention to the test itself, codes do not need to be written, and the test development time and the cost are greatly reduced. The user can generate the test peripheral environment model as required, tests aiming at different functions of the tested piece, and does not need to use different test equipment according to different functions, so the method has universality. And the test host subsystem realizes the functions of generating test codes and monitoring in the execution of the test cases and the like by adopting a test development management computer and the test cases. The real-time test simulation calculation subsystem realizes synchronous work by adopting parallel connection of a plurality of real-time test simulation computers, and increases the operation processing capacity of the test system.
It should be noted that each module referred to in this embodiment is a logical module, and in practical applications, one logical unit may be one physical unit, may be a part of one physical unit, and may be implemented by a combination of multiple physical units. In addition, in order to highlight the innovative part of the present invention, elements that are not so closely related to solving the technical problems proposed by the present invention are not introduced in the present embodiment, but this does not indicate that other elements are not present in the present embodiment.
A third embodiment of the present invention relates to a simulation method, which is executed in the simulation system described in the first or second embodiment, and the specific flow is shown in fig. 3.
Step 301, the test host subsystem generates a peripheral environment model and a test code of the tested piece.
The test host subsystem realizes that the computer generates a tested piece peripheral environment model and a test code through a test development management computer or a test case, and transmits the peripheral environment model and the test code to the real-time test simulation calculation subsystem through the Ethernet. The peripheral environment model herein includes a device model that has data interaction with the embedded controller.
Step 302, the real-time test simulation calculation subsystem runs test code data, generates a test signal, and transmits the test signal to the signal interface subsystem.
The real-time test simulation calculation subsystem runs test code data, the test code generates a test signal for the tested piece based on the tested piece peripheral environment model, and the test signal is transmitted to the signal interface subsystem through the first input/output and bus interface.
And 303, conditioning the signal by the signal interface subsystem, and transmitting the conditioned test signal to the tested piece.
The signal interface subsystem conditions signals according to the test signals and transmits the conditioned test signals to the tested piece, namely the embedded controller, through the second input/output and bus interface. The signal conditioning here refers to converting analog signals into digital signals or converting digital signals into analog signals according to actual requirements, and other forms of signal conversion.
And step 304, the tested piece is tested according to the conditioned test signal to generate actual feedback data, and the actual feedback data is transmitted to the test host subsystem.
Wherein, it specifically includes to be surveyed the piece promptly embedded controller with actual feedback data transmission to test host computer subsystem: actual feedback data is transmitted to the signal interface subsystem through the first input/output and bus interface and is conditioned by the signal interface subsystem; the conditioned actual feedback data is collected by the real-time test simulation calculation subsystem through the second input/output and bus interface and is sent to the test host subsystem through the Ethernet.
Step 305, the test host subsystem forms a test report.
In the test host subsystem, an expected value is preset in advance according to correct data fed back by a tested piece specified in test requirements. If the actual feedback data generated by the tested piece after the test is the same as the expected value, the tested function item of the tested piece is correct, otherwise, the tested piece software has a problem. And a test report is formed according to the test result, so that a user can check the test report on a host screen of the test host subsystem and can monitor the test process in real time according to the test report.
Compared with the prior art, the test system in the embodiment can dynamically test the tested piece in real time, returns the actual feedback data of the tested piece to the test host subsystem, and provides the actual feedback data to the user in the form of the test report, so that the test system is a closed-loop test process. And the test code can be automatically generated in the test process, and the user does not need to program, so that the user only needs to pay attention to the test and does not need to write the code, and the test development time and the cost are greatly reduced. The user can generate the test peripheral environment model as required, tests aiming at different functions of the tested piece, and does not need to use different test equipment according to different functions, so the method has universality.
A fourth embodiment of the present invention relates to a simulation method. The simulation method is operated in the simulation system described in the first or second embodiment, and the specific flow is shown in fig. 4. The fourth embodiment is substantially the same as the third embodiment, and mainly modified in that: before the test host subsystem generates the peripheral environment model data and the test code data of the tested piece, the method is added with the following steps: the test host subsystem defines an interface protocol and an interface control file according to a test requirement document of a tested piece: before the signal interface subsystem is conditioned, a test signal generated by the real-time test simulation calculation subsystem is received, and an interface of the real-time test simulation computer is adapted to an interface of a tested piece.
Step 401, the test host subsystem defines an interface protocol and an interface control file according to the test requirement document of the tested piece.
The test host subsystem defines an interface protocol and an interface control file and automatically generates an interface protocol and an interface control file program according to a test requirement document of a tested piece, the generated interface protocol and interface control file program are part of a test case, and finally a test code is generated and run on the real-time test simulation calculation subsystem.
After step 401, steps 402 to 403 are executed, where steps 402 to 403 are substantially the same as steps 301 to 302 in the first embodiment, and are not described herein again.
And step 404, the signal interface subsystem adapts the interface of the real-time test simulation computer to the interface of the tested piece.
The signal interface subsystem adapts an interface of the real-time test simulation computer to an interface of a tested piece. The adapter with the adaptive interface is provided with interface conversion equipment such as a switch matrix and the like, and generates a control instruction to control the wiring harness to be switched by defining an interface configuration mode through software such as a test host subsystem, so that the processes of wiring and wire changing are simplified.
After step 404, steps 405 to 407 are performed, where steps 405 to 407 are substantially the same as steps 303 to 305 in the first embodiment, and are not described herein again.
Compared with the prior art, the test system in the embodiment can dynamically test the tested piece in real time, returns the test result of the tested piece to the test host subsystem, and provides the test result to the user in the form of the test report, so that the test system is a closed-loop test process. And the test code can be automatically generated in the test process, and the user does not need to program, so that the user only needs to pay attention to the test and does not need to write the code, and the test development time and the cost are greatly reduced. The user can generate the test peripheral environment model as required, tests aiming at different functions of the tested piece, and does not need to use different test equipment according to different functions, so the method has universality. And the test host subsystem defines the interface configuration mode, generates a control instruction to control the switching of the wiring harness, and simplifies the processes of wiring and wire changing.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice.

Claims (8)

1. A test system, comprising: the system comprises a test host subsystem, a real-time test simulation calculation subsystem and a signal interface subsystem; the test host subsystem defines an interface protocol and an interface control file according to a test requirement document of a tested piece, automatically generates an interface protocol and an interface control file program, and generates a peripheral environment model and a test case of the tested piece, wherein the test case comprises the interface protocol and the interface control file program, generates a test code according to the test case, and transmits the peripheral environment model and the code to the real-time test simulation calculation subsystem through Ethernet; the real-time test simulation calculation subsystem runs the test codes and the peripheral environment model, generates test signals for the tested piece by the test codes and the peripheral environment model of the tested piece, and transmits the test signals to the signal interface subsystem through a first input/output and bus interface; the signal interface subsystem carries out signal conditioning according to the test signal and transmits the conditioned test signal to the tested piece through a second input/output and bus interface; the tested piece receives the conditioned test signal and generates actual feedback data according to the test signal, wherein the actual feedback data is conditioned by the signal interface subsystem and then collected by the real-time test simulation calculation subsystem and sent to the test host subsystem through the Ethernet; and the test host subsystem compares the actual feedback data with a set expected value to obtain a test result, and forms a test report according to the test result.
2. The test system of claim 1, wherein the test host subsystem comprises: the test development management computer is used for realizing the generation of the test codes by writing the test cases, and the test case realization computer is used for monitoring the execution of the test cases.
3. The test system of claim 1, wherein the real-time test simulation computation subsystem comprises a plurality of real-time test simulation computers, wherein the plurality of real-time test simulation computers are connected in parallel and operate synchronously to perform distributed testing.
4. The test system of claim 1, wherein the signal interface subsystem adapts an interface of the real-time test simulation computer to an interface of the object under test using an interface adapter.
5. A test system according to claim 3, characterized in that said parallel connection is implemented based on the 1394B protocol.
6. A testing method applied to the testing system of any one of claims 1 to 5, the method comprising:
the test host subsystem defines an interface protocol and an interface control file according to a test requirement document of a tested piece, automatically generates an interface protocol and an interface control file program, and generates a peripheral environment model and a test case of the tested piece, wherein the test case comprises the interface protocol and the interface control file program, generates a test code according to the test case, and transmits the peripheral environment model and the code to the real-time test simulation calculation subsystem through Ethernet;
the real-time test simulation calculation subsystem runs the test codes and the peripheral environment model, generates test signals for the tested piece by the test codes and the peripheral environment model of the tested piece, and transmits the test signals to the signal interface subsystem through a first input/output and bus interface;
the signal interface subsystem carries out signal conditioning according to the test signal and transmits the conditioned test signal to the tested piece through a second input/output and bus interface;
the tested piece receives the conditioned test signal, generates actual feedback data according to the test signal, wherein the actual feedback data is conditioned by the signal interface subsystem, collected by the real-time test simulation calculation subsystem and sent to the test host subsystem through the Ethernet;
and the test host subsystem compares the actual feedback data with a set expected value to obtain a test result, and forms a test report according to the test result.
7. The method of claim 6, wherein the signal interface subsystem further comprises, prior to conditioning the test signal:
the signal interface subsystem receives the test signal generated by the real-time test simulation calculation subsystem, and an interface adapter is adopted for interface adaptation.
8. The method as claimed in claim 6, wherein the step of collecting the actual feedback data conditioned by the signal interface subsystem by the real-time testing and simulating subsystem comprises:
the actual feedback data is transmitted to the signal interface subsystem through the first input/output and bus interface and is conditioned by the signal interface subsystem;
and the conditioned actual feedback data is acquired by the real-time test simulation calculation subsystem through a second input/output and bus interface.
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