CN107968132A - The test method of Al-BSF and EVA adhesive film adhesion strength in a kind of photovoltaic module - Google Patents
The test method of Al-BSF and EVA adhesive film adhesion strength in a kind of photovoltaic module Download PDFInfo
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- CN107968132A CN107968132A CN201710720946.9A CN201710720946A CN107968132A CN 107968132 A CN107968132 A CN 107968132A CN 201710720946 A CN201710720946 A CN 201710720946A CN 107968132 A CN107968132 A CN 107968132A
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- Prior art keywords
- backboard
- adhesive film
- bsf
- eva
- eva adhesive
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- 239000002313 adhesive film Substances 0.000 title claims abstract description 94
- 238000010998 test method Methods 0.000 title claims abstract description 19
- 239000002390 adhesive tape Substances 0.000 claims abstract description 106
- 239000012528 membrane Substances 0.000 claims abstract description 49
- 238000000034 method Methods 0.000 claims abstract description 24
- 238000000926 separation method Methods 0.000 claims abstract description 23
- 239000011521 glass Substances 0.000 claims abstract description 20
- 238000005056 compaction Methods 0.000 claims abstract description 19
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 14
- 239000010703 silicon Substances 0.000 claims abstract description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 13
- 238000012360 testing method Methods 0.000 claims description 43
- 238000010248 power generation Methods 0.000 abstract description 2
- 230000000052 comparative effect Effects 0.000 description 29
- 238000005259 measurement Methods 0.000 description 16
- 238000007718 adhesive strength test Methods 0.000 description 11
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 9
- 229910052782 aluminium Inorganic materials 0.000 description 9
- 239000004411 aluminium Substances 0.000 description 9
- 239000002994 raw material Substances 0.000 description 8
- 230000001070 adhesive effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 238000003825 pressing Methods 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 4
- 238000005520 cutting process Methods 0.000 description 4
- 239000003292 glue Substances 0.000 description 3
- 238000006748 scratching Methods 0.000 description 3
- 230000002393 scratching effect Effects 0.000 description 3
- AZUYLZMQTIKGSC-UHFFFAOYSA-N 1-[6-[4-(5-chloro-6-methyl-1H-indazol-4-yl)-5-methyl-3-(1-methylindazol-5-yl)pyrazol-1-yl]-2-azaspiro[3.3]heptan-2-yl]prop-2-en-1-one Chemical compound ClC=1C(=C2C=NNC2=CC=1C)C=1C(=NN(C=1C)C1CC2(CN(C2)C(C=C)=O)C1)C=1C=C2C=NN(C2=CC=1)C AZUYLZMQTIKGSC-UHFFFAOYSA-N 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- -1 cell piece Substances 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Photovoltaic Devices (AREA)
Abstract
The present invention provides the test method of Al-BSF and EVA adhesive film adhesion strength in a kind of photovoltaic module, is related to field of photovoltaic power generation.Including：Backboard, the first EVA adhesive film, the cell piece, the second EVA adhesive film and the glass plate that are fitted with spaced two adhesive tapes are suppressed to obtain photovoltaic module, the first EVA adhesive film between two adhesive tapes is glued membrane to be measured, after backboard between two adhesive tapes is separated with cell piece, obtain separation backboard and be attached to the glued membrane to be measured of separation backboard, measure glued membrane to be measured with separating the peeling force between backboard；Wherein, cell piece includes silicon layer and is attached to the Al-BSF of silicon layer, and silicon layer fits with the second EVA layer, and Al-BSF is affixed merging with the first EVA adhesive film and is bonded two adhesive tapes before compaction.This method can accurately measure the adhesion strength between Al-BSF and EVA adhesive film.
Description
Technical field
The present invention relates to field of photovoltaic power generation, and Al-BSF and EVA adhesive film bond by force in more particularly to a kind of photovoltaic module
The test method of degree.
Background technology
The environmental condition that photovoltaic module is faced during use outdoors is more complicated, as temperature change and wind speed change
Deng.In process of environmental change, photovoltaic module therewith expand with heat and contract with cold with the changes such as material deformation act on inside EVA adhesive film
Between Al-BSF.Therefore, the adhesive strength between EVA adhesive film and Al-BSF is most important.
At present, the adhesive property between EVA adhesive film and the aluminium back of the body is weighed, is by detecting peel strength between the two (i.e.
Peeling force) judge its unfailing performance.Existing method：Glass, EVA adhesive film, cell piece, EVA adhesive film and backboard are sequentially placed, so
After be laminated；After lamination, two seams of the compartment away from 10mm are drawn in backboard, then peel off the EVA adhesive film in region between two seams
And measure its peeling force.
It is bad, the above method there are the problem of be：
When backboard is drawn every two seams of 10mm, if conference of exerting oneself destroys cell piece, in its crack of brittleness cell piece
It can be extended to the cell piece between two seams, cause EVA and the Validity Test area of Al-BSF to be much smaller than 10mm, test result is tight
Weight is relatively low；If firmly smaller, it can not ensure to draw saturating backboard and EVA adhesive film, cause EVA adhesive film and the periphery of tested region
EVA adhesive film does not have completely separable, and in stripping process, since test value contains the tearout between EVA and EVA, this will lead
Cause test value very big, can not equally weigh adhesive property between EVA and Al-BSF.
As it can be seen that it is very poor using the data redundancy that current detection method detects, an exact value can not be measured, can not
Judge its adhesive property.
In addition, existing improvement, which is concentrated mainly on, thickeies EVA adhesive film, cutting firmly and cutting speed etc., by improving this
A little parameters still can not change the above problem.
The content of the invention
It is an object of the invention to provide the test method of Al-BSF and EVA adhesive film adhesion strength in a kind of photovoltaic module,
This method can accurately measure the adhesion strength between Al-BSF and EVA adhesive film.Two intervals are bonded in the Al-BSF of cell piece
The adhesive tape of setting, both avoids separation backboard and during cell piece, scratches the crack of cell piece to zone broadening to be measured to glue to be measured
Film causes to damage, and influences test result；It turn avoid and do not scratch the first EVA adhesive film fully, caused EVA adhesive film is shelled with backboard
Tear fracture is caused from during, influences test result；It also avoid directly that the first EVA adhesive film between backboard and cell piece is direct
For measuring, test result is influenced.
The present invention is solved its technical problem and is realized using following technical scheme.
The present invention proposes the test method of Al-BSF and EVA adhesive film adhesion strength in a kind of photovoltaic module, including：
To backboard, the first EVA adhesive film, cell piece, the second EVA adhesive film and the glass for being fitted with spaced two adhesive tapes
Plate is suppressed to obtain photovoltaic module, and the first EVA adhesive film between two adhesive tapes is glued membrane to be measured, by between two adhesive tapes
Backboard separated with cell piece after, obtain separation backboard and be attached to separation backboard glued membrane to be measured, measure glued membrane to be measured with point
From the peeling force between backboard；
Wherein, cell piece includes silicon layer and is attached to the Al-BSF of silicon layer, and silicon layer fits with the second EVA layer, Al-BSF
Merging, which is affixed, with the first EVA adhesive film is bonded two adhesive tapes before compaction.
The beneficial effect of the embodiment of the present invention is：
The test method of Al-BSF and EVA adhesive film adhesion strength in the photovoltaic module of the embodiment of the present invention, this method can
Adhesion strength between accurate measurement Al-BSF and EVA adhesive film.Two spaced adhesive tapes are bonded in the Al-BSF of cell piece：
On the one hand, when both avoiding separation backboard and cell piece, the crack for scratching cell piece is treated to zone broadening to be measured
Survey glued membrane to cause to damage, influence test result；It turn avoid and do not scratch the first EVA adhesive film fully, caused EVA adhesive film and the back of the body
Tear fracture is caused in plate stripping process, influences test result；It also avoid the first EVA adhesive film between backboard and cell piece directly
Measurement is directly used in, influences test result.
On the other hand, the size in region to be measured is determined by adhesive tape, helps to control the size of glued membrane to be measured.
Brief description of the drawings
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below will be to needed in the embodiment attached
Figure is briefly described, it will be appreciated that the following drawings illustrate only certain embodiments of the present invention, therefore be not construed as pair
The restriction of scope, for those of ordinary skill in the art, without creative efforts, can also be according to this
A little attached drawings obtain other relevant attached drawings.
Fig. 1 is the structure diagram at the first visual angle of photovoltaic module provided in an embodiment of the present invention；
Fig. 2 is the structure diagram of cell piece provided in an embodiment of the present invention；
Fig. 3 is the structure diagram of backboard provided in an embodiment of the present invention；
Fig. 4 is the structure diagram of backboard provided in an embodiment of the present invention and region disconnecting to be measured；
Fig. 5 a are the structure diagram of backboard and region disconnecting to be measured that 1b of the embodiment of the present invention is provided；
Fig. 5 b are the adhesion strength test result curve that 1b of the embodiment of the present invention is provided；
Fig. 6 a do not scratch the backboard of EVA adhesive film and the structure diagram of region disconnecting to be measured for the first prior art；
Fig. 6 b are the adhesion strength test result curve that the first prior art provides；
Fig. 7 a isolate the backboard of cell piece and the structure diagram of region disconnecting to be measured for second of prior art；
Fig. 7 b are the adhesion strength test result curve that second of prior art provides；
Icon：100- photovoltaic modulies；110- backboards；111- first ends；112- the second ends；113- separates backboard；
The first EVA adhesive films of 120-；121- glued membranes to be measured；130- cell pieces；131- silicon layers；132- Al-BSFs；133- back electrodes；134- is treated
Survey region；The second EVA adhesive films of 140-；150- glass plates；160- adhesive tapes；The first adhesive tapes of 161-；The second adhesive tapes of 162-；170- is opened
Mouthful；171- first is open；172- second is open.
Embodiment
, below will be in the embodiment of the present invention to make the purpose, technical scheme and advantage of the embodiment of the present invention clearer
Technical solution be clearly and completely described.The person that is not specified actual conditions in embodiment, builds according to normal condition or manufacturer
The condition of view carries out.Reagents or instruments used without specified manufacturer, is the conventional production that can be obtained by commercially available purchase
Product.
Have below to the test method of Al-BSF and EVA adhesive film adhesion strength in the photovoltaic module of the embodiment of the present invention
Body explanation.
The test method of Al-BSF and EVA adhesive film adhesion strength in a kind of photovoltaic module, including：
Refer to Fig. 1, backboard 110 that photovoltaic module 100 includes setting gradually, the first EVA adhesive film 120, cell piece 130,
Second EVA adhesive film 140 and glass plate 150.
Cell piece 130 include silicon layer 131, be attached to the Al-BSF 132 of silicon layer 131 and be arranged at Al-BSF 132 and with
The back electrode 133 that silicon layer 131 is electrically connected.Back electrode 133 is used to be electrically connected to photovoltaic module 100 with busbar (not illustrating in figure)
Outer output electric energy, in view of back electrode 133 and busbar are techniques well knowns, this will not be repeated here.
Wherein, silicon layer 131 fits with the second EVA adhesive film 140；Al-BSF 132 fits with the first EVA adhesive film 120.
Fig. 2 is refer to, is specially the first glue in spaced two parallel adhesive tapes 160 of fitting two of Al-BSF 132
161 and second adhesive tape 162 of band.It is region 134 to be measured between first adhesive tape 161 and the second adhesive tape 162, takes in region 134 to be measured
Glued membrane to be measured 121 be used for adhesion strength measurement.
Wherein, the distance between the first adhesive tape 161 and the second adhesive tape 162 are X1, and X1 is advisable with 10~20mm.That is, two
The distance between adhesive tape 160 is 10~20mm.
It is appreciated that the first EVA adhesive film 120 between the first adhesive tape 161 and the second adhesive tape 162 is glued membrane 121 to be measured, use
In the test of adhesion strength.
Preferably, the distance between the first adhesive tape 161 and the second adhesive tape 162 X1 are advisable with 10mm.By controlling X1's
Scope, is convenient to the measurement to 121 peeling force of glued membrane to be measured.
Further, the equal length of the first adhesive tape 161 and the second adhesive tape 162, is Y1.Y1 is advisable with 100mm.Pass through
The length of adhesive tape 160 is controlled, helps to control the length in region 134 to be measured, is convenient to obtained 121 peeling force of glued membrane to be measured
Measurement and ensure measurement accuracy.
Hold above-mentioned, by distinguishing joint adhesive band 160 in the both sides in region 134 to be measured, glued membrane 121 to be measured can be precisely controlled
Size.Meanwhile by the adhesion between 120 adhesive tape 160 of the first EVA adhesive film, contribute to the first EVA adhesive film 120
Separation between cell piece 130.
In the first end face and second end face that backboard 110 includes being oppositely arranged, wherein, first end face and the first EVA adhesive film
120 fit, and second end face is the outer surface of photovoltaic module 100.
Fig. 3 is refer to, two openings are scratched in correspondence the first adhesive tape 161 of backboard 110 and the region of the second adhesive tape 162
170, respectively as first opening 171 and second opening 172.Wherein, the first opening 171 is corresponding with the first adhesive tape 161, and second
Opening 172 is corresponding with the second adhesive tape 162.
First opening 171 and the second opening the distance between 172 are X2, and X2 is advisable with 15~25mm.That is, two openings
The distance between 170 be 15~25mm.
Preferably, the first opening 171 and the second the distance between 172 X2 of opening are advisable with 20mm.By controlling X2's
Scope, is convenient to separating for backboard 110 between the first opening 171 and the second opening 172 and cell piece 130.
First opening 171 and the second opening 172 are respectively positioned at the both sides of the first adhesive tape 161 and the second adhesive tape 162.For example,
X1 is 10mm, X2 20mm, then the first opening 171 is opposite with the band body of the first adhesive tape 161, and the first adhesive tape of distance 161 leans on
The end in nearly region 134 to be measured is 5mm；Second opening 172 is opposite with the band body of the second adhesive tape 162, and the second adhesive tape of distance 162
The end in close region 134 to be measured be 5mm.
Further, the equal length of the first opening 171 and the second opening 172, is Y2.Y2 is advisable with 150mm.Y2 surpasses
The length for going out Y1 is distributed evenly over the both sides of adhesive tape 160 and is advisable, it is possible to understand that does, the side of the first opening 171 exceeds the first glue
It is 25mm with 161 length, opposite side is also 25mm beyond the length of the first adhesive tape 161.
It is appreciated that the backboard between the first opening 171 and the second opening 172 is to separate backboard 113.The separation back of the body
Plate 113 is separated with Al-BSF 132 at the same time in conjunction with the glued membrane to be measured 121 between the first adhesive tape 161 and the second adhesive tape 162, and
For embodying the bonding strong of Al-BSF 132 and the first EVA adhesive film 120 with separating the peeling force of backboard 113 by glued membrane 121 to be measured
Degree.
Hold above-mentioned, by setting two openings 170, and the width of two openings 170 is more than the width of two adhesive tapes 160
It is more than the length of two adhesive tapes 160 with the length of two openings 170, on the one hand, avoid point in backboard 110 and cell piece 130
From during, the edge of a knife shifts and damages the glued membrane to be measured 121 for being attached to backboard 110 when scratching the first EVA layer.The opposing party
Face, since the width between two openings 170 and length are all higher than width and length between two adhesive tapes 160, even if the edge of a knife
Scratch cell piece 130 and produce crack, crack can not be expanded to region 134 to be measured to be measured under the protective effect of adhesive tape 160
Glued membrane 121 causes to damage, so as to improve the accuracy of testing result.
Backboard 110, the first EVA adhesive film 120, the cell piece 130, second for being fitted with adhesive tape 160 of opening 170 will be scratched
Photovoltaic module 100 is made in EVA adhesive film 140 and glass plate 150.
Specifically, backboard 110, the first EVA adhesive film 120, cell piece 130, the second EVA adhesive film 140 and glass plate 150 are in layer
Suppressed in press.Specifically, to being vacuumized in laminating machine, the temperature of compacting is 130~140 DEG C, the pressure of compacting
For -15~-45KPa, the time of compacting is 10~20min.
Backboard 110 is separated with cell piece 130.Backboard 110 includes the first end 111 and the second end being oppositely arranged
112, and the extending direction of opening 170 intersects with the extending direction of first end 111 and the extending direction of the second end 112.
In a kind of implementation of the present invention, compacting is scratched along the extending direction of the first opening 171 and the second opening 172
The first EVA adhesive film 120 afterwards, and the one end of the one end of the first opening 171 and the second opening 172 is extended into backboard 110
First end 111.The separation backboard 113 being located in region 134 to be measured is driven towards the second end by first end 111
112 direction movement, that is, realize that separation backboard 113 is separated with the reverse of cell piece 130.In pressed first EVA adhesive film 120
Glued membrane to be measured 112 be attached to separation backboard 113.
In another implementation of the present invention, pressure is scratched along the extending direction of the first opening 171 and the second opening 172
The first EVA adhesive film 120 and cell piece 130 after system, i.e., be able to observe that the cut of cell piece 130 through glass plate 150, and will
The one end of first opening 171 and the one end of the second opening 172 extend to the first end 111 of backboard 110.Pass through first end
Portion 111 drives the separation backboard 113 in region 134 to be measured to be moved towards the direction of the second end 112, that is, realizes the separation back of the body
Plate 113 is reversely separated with cell piece 130, and the glued membrane to be measured 121 in pressed first EVA adhesive film 120 is attached to backboard
110。
Hold it is above-mentioned, due to positioned at 134 both sides of region to be measured and after the compacting of the first adhesive tape 161 and the second adhesive tape 162
First EVA adhesive film 120 and the first adhesive tape 161 and the second adhesive tape 162 be not be bonded, avoids separation backboard 110 and cell piece 130
In separation process, glued membrane 121 to be measured is caused to damage, further ensures the accurate of measurement result.
Glued membrane 121 to be measured is measured with separating the peeling force between backboard 113.It will be treated by the one end for separating backboard 113
Glued membrane 121 is surveyed to peel off with it, and being moved to the other end direction opposite with the end according to 50~500mm/min speed,
Realize the reverse stripping of glued membrane 121 to be measured, and the peeling force surveyed in stripping process.
Specifically, by one end of glued membrane 121 to be measured using puncher punching after, using rope pass through the hole after and be fixed on
Tensiometer, the other end and separation backboard 113 of glued membrane 121 to be measured are fixed on the fixture of tensiometer.In the speed of 50~500mm/min
The lower operation tensiometer of degree, the number of degrees of tensiometer are the size of peeling force, also as adhesive strength test result.
Hold it is above-mentioned, cell piece 130 Al-BSF 132 be bonded two spaced adhesive tapes 160.On the one hand, the separation back of the body
When plate 113 and cell piece 130 separate, when scratching the first EVA adhesive film 120 along opening 170, avoid and scratch splitting for cell piece 130
Stitch and expanded to region 134 to be measured, glued membrane 121 to be measured is impacted relatively low so as to cause the measurement result of adhesive strength to occur
Situation.
On the other hand, the size in region 134 to be measured is determined by adhesive tape 160, so that the size of glued membrane 121 to be measured is controlled,
Avoiding directly to be used to measure by the first EVA adhesive film 120 between backboard 110 and cell piece 130 causes measurement result higher
Problem, it also avoid the first EVA adhesive film 120 and causes its tear to cause measurement result is higher to ask with 130 glass process of cell piece
Topic.
The feature and performance of the present invention are described in further detail with reference to embodiments.
Embodiment 1
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：It is contained K6W7 and changes 1 aluminium paste.
Embodiment 1a
It is the Al-BSF 132 that the first adhesive tape 161 of 10mm and the second adhesive tape 162 are pasted onto cell piece 130 by width.Its
In, the spacing X1=10mm of the first adhesive tape 161 and the second adhesive tape 162, the length of the first adhesive tape 161 and the second adhesive tape 162 is
Y1=100mm.
Using cutter in backboard 110 to scratch the first opening 171 and the second opening 172, the first opening from X2=20mm
171 and second opening 172 length be Y2=150mm.
It is sequentially laminated in machine and is laid with glass plate 150, the second EVA adhesive film 140, the cell piece 130 for being fitted with adhesive tape 160, the
One EVA adhesive film 120 and backboard 110, wherein, adhesive tape 160 towards the first EVA120 glued membranes, the first opening 171 and with the first adhesive tape
161 positions are corresponding, and the second opening 172 is corresponding with 162 position of the second adhesive tape, after vacuumizing 6min, at a temperature of 140 DEG C
16min is suppressed with the pressure of -45KPa, obtains photovoltaic module 100.
Treat that photovoltaic module 100 is cooled to 20~25 DEG C, cut using the extending direction of cutter along the first opening 171 and opened with second
The extending direction of mouth 172 cuts backboard 110 to its first end 111, and at the same time, cutter scratches pressed first EVA for cutting
Glued membrane 120.
With the speed of 50mm/min from first end 111 by the separation backboard between the first notch 171 and the second notch 172
After 113 separate with cell piece 130.
After being punched using card punch to one end of glued membrane 121 to be measured, hole is passed through using rope, is then attached to tensiometer
One end；The other end and separation backboard 113 of glued membrane 121 to be measured are fixed in the fixture of tensiometer；Transported with the speed of 50mm/min
Row tensiometer, reads the number of degrees of tensiometer, is adhesion strength.
Embodiment 1b
Embodiment 1b is roughly the same with the operation of embodiment 1a, the two difference lies in the present embodiment using cutter along the
The extending direction of one opening 171 is cut cuts backboard 110 to its first end 111, cutting with the extending direction of the second opening 172
Meanwhile cutter scratches pressed first EVA adhesive film 120 and cell piece 130.
Comparative example 1
Comparative example 1a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 1a.
Comparative example 1b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 1b.
The separated backboards 110 of embodiment 5b such as Fig. 5 a are regarded, and the test result of its glued membrane 121 to be measured is as shown in Figure 5 b.From
Fig. 5 b can be seen that the fluctuation of its test curve is smaller, and test value is more accurate.
The separated backboards 110 of comparative example 1a such as Fig. 6 a are regarded, and the test result of its glued membrane 121 to be measured is as shown in Figure 6 b.From
Fig. 6 b can be seen that the larger and measurement result of its test curve fluctuation is integrally higher, illustrate glued membrane to be measured 121 and its week of glass
Test value caused by the first EVA adhesive film 120 enclosed is not cut open completely is bigger than normal, and therefore, measured value accuracy is poor.
The separated backboards 110 of comparative example 1b such as Fig. 7 a are regarded, and the test result of its glued membrane 121 to be measured is as shown in Figure 7b.From
Fig. 7 b can be seen that the larger and measurement result of its test curve fluctuation is integrally relatively low, illustrate that cell piece 130 is isolated splitting for generation
Seam, which influences glued membrane 121 to be measured, causes test value seriously relatively low, and therefore, measured value accuracy is poor.
Embodiment 2
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：It is contained K6W7 and changes 1 aluminium paste.
Embodiment 2a
The adhesive strength test method of embodiment 2a is roughly the same with the operation of the bond strength testing method of embodiment 1a,
The two is -30KPa difference lies in the pressing pressure of the present embodiment, and the glass speed of glued membrane 121 to be measured and backboard 110 is
300mm/min。
Embodiment 2b
The adhesive strength test method of embodiment 2b is roughly the same with the operation of the bond strength testing method of embodiment 1b,
The two is -30KPa difference lies in the pressing pressure of the present embodiment, and the glass speed of glued membrane 121 to be measured and backboard 110 is
300mm/min。
Comparative example 2
Comparative example 2a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 2a.
Comparative example 2b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 2b.
Embodiment 3
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：It is contained K6W7 and changes 1 aluminium paste.
Embodiment 3a
The adhesive strength test method of embodiment 3a is roughly the same with the operation of the bond strength testing method of embodiment 1a,
The two is -15KPa difference lies in the pressing pressure of the present embodiment, and the glass speed of glued membrane 121 to be measured and backboard 110 is
500mm/min。
Embodiment 3b
The adhesive strength test method of embodiment 3b is roughly the same with the operation of the bond strength testing method of embodiment 1b,
The two is -15KPa difference lies in the pressing pressure of the present embodiment, and the glass speed of glued membrane 121 to be measured and backboard 110 is
500mm/min。
Comparative example 3
Comparative example 3a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 1a.
Comparative example 3b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 1b.
Embodiment 4
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：It is contained K6W7 and changes 1 aluminium paste.
Embodiment 4a
The adhesive strength test method of embodiment 4a is roughly the same with the operation of the bond strength testing method of embodiment 1b,
The two is -45KPa difference lies in the pressing pressure of the present embodiment, and the glass speed of glued membrane 121 to be measured and backboard 110 is
300mm/min。
Embodiment 4b
The adhesive strength test method of embodiment 4b is roughly the same with the operation of the bond strength testing method of embodiment 1a,
The two is -45KPa difference lies in the pressing pressure of the present embodiment, and the glass speed of glued membrane 121 to be measured and backboard 110 is
300mm/min。
Comparative example 4
Comparative example 4a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 4a.
Comparative example 4b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 4b.
The adhesion strength that embodiment 1~4 and comparative example 1~4 are surveyed the results are shown in Table 1.
1 adhesion strength test result of table
Embodiment 5
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：Emerging 8256 aluminium paste of scholar.
The adhesive strength test method of embodiment 5 is identical with the bond strength testing method of embodiment 1a.
Comparative example 5
Comparative example 5a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 5.
Comparative example 5b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 5.
Embodiment 6
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：Emerging 8256 aluminium paste of scholar.
The adhesive strength test method of embodiment 6 is identical with the bond strength testing method of embodiment 2a.
Comparative example 6
Comparative example 6a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 6.
Comparative example 6b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 6.
Embodiment 7
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：Emerging 8256 aluminium paste of scholar.
The adhesive strength test method of embodiment 7 is identical with the bond strength testing method of embodiment 3a.
Comparative example 7
Comparative example 7a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 7.
Comparative example 7b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 7.
Embodiment 8
Raw material selects.Backboard 110：Thickness be 0.35mm middle day KPO backboards, the first EVA adhesive film 120：Thickness is
The extra large excellent prestige EVA of 0.45mm, the Al-BSF 132 of cell piece 130：Emerging 8256 aluminium paste of scholar.
The adhesive strength test method of embodiment 8 is identical with the bond strength testing method of embodiment 4a.
Comparative example 8
Comparative example 8a
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 8.
Comparative example 8b
Before compaction, backboard 110 does not scratch the first opening 171 and the second opening 172.Meanwhile Al-BSF 132 is not fitted with
First adhesive tape 161 and the second adhesive tape 162, remaining operation is the same as embodiment 8.
The adhesion strength that embodiment 5~8 and comparative example 5~8 are surveyed the results are shown in Table 2.
2 adhesion strength test result of table
By Tables 1 and 2 can with it is further seen that, the different realization side of the test result of the adhesive strength of embodiment 1~8
Specific less floating in formula, meanwhile, do not occur that measurement structure is less than normal or higher to be showed relative to its corresponding comparative example 1~8
As testing result has higher accuracy.
In conclusion the test method of Al-BSF and EVA adhesive film adhesion strength in the photovoltaic module of the embodiment of the present invention,
The Al-BSF 132 of cell piece 130 is bonded two spaced adhesive tapes 160.
On the one hand, both avoid separation backboard 110 and during cell piece 130, scratch the crack of cell piece 130 to region to be measured
134 expansions cause to damage to glued membrane 121 to be measured, influence test result；It turn avoid and do not scratch the first EVA adhesive film 120 fully,
Caused EVA adhesive film influences test result with causing tear fracture in 110 stripping process of backboard；It also avoid 110 He of backboard directly
The first EVA adhesive film 120 between cell piece 130 is directly used in measurement, influences test result.
On the other hand, the size in region 134 to be measured is determined by adhesive tape 160, so that the size of glued membrane 121 to be measured is controlled,
Avoiding directly to be used to measure by the first EVA adhesive film 120 between backboard 110 and cell piece 130 causes measurement result higher
Problem, it also avoid the first EVA adhesive film 120 and causes its tear to cause measurement result is higher to ask with 130 glass process of cell piece
Topic.
Embodiments described above is part of the embodiment of the present invention, instead of all the embodiments.The reality of the present invention
The detailed description for applying example is not intended to limit the scope of claimed invention, but is merely representative of the selected implementation of the present invention
Example.Based on the embodiments of the present invention, those of ordinary skill in the art are obtained without creative efforts
Every other embodiment, belongs to the scope of protection of the invention.
Claims (10)
- A kind of 1. test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module, it is characterised in that including：To backboard, the first EVA adhesive film, be fitted with cell piece, the second EVA adhesive film and the glass plate of spaced two adhesive tapes into Row compacting obtains the photovoltaic module, and first EVA adhesive film between two adhesive tapes is glued membrane to be measured, by two After the backboard between the adhesive tape is separated with the cell piece, obtain separation backboard and be attached to the institute of the separation backboard Glued membrane to be measured is stated, measures the glued membrane to be measured and the peeling force separated between backboard；Wherein, the cell piece includes silicon layer and is attached to the Al-BSF of the silicon layer, the silicon layer and the second EVA layer phase Fitting, the Al-BSF are affixed merging with first EVA adhesive film and are bonded two adhesive tapes before compaction.
- 2. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 1, its feature exists In, before compacting, scratched in the region of the adhesive tape of correspondence every of the backboard two run through the backboard two sides openings.
- 3. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 2, its feature exists In the distance between adjacent two described openings are more than the distance between two described adhesive tapes.
- 4. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 3, its feature exists In two described are open are distributed in the both sides of two adhesive tapes.
- 5. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 4, its feature exists In the one end of every opening all extends to the end of the backboard, will be located at described in two along the end of the backboard The backboard between opening is separated with the cell piece.
- 6. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 2, its feature exists In every opening runs through first EVA adhesive film along the backboard to the glass plate direction.
- 7. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 2, its feature exists In every opening sequentially passes through first EVA adhesive film and the cell piece along the backboard to the glass plate direction.
- 8. the test method of Al-BSF and EVA adhesive film adhesion strength in photovoltaic module according to claim 1, its feature exists In the separation backboard is separated according to the speed of 50~500mm/min with the cell piece.
- 9. according to the test method of Al-BSF and EVA adhesive film adhesion strength in claim 1 any one of them photovoltaic module, its It is characterized in that, the glued membrane to be measured and the test for separating backboard and the peeling force being carried out under 50~500mm/min speed.
- 10. according to the test side of Al-BSF and EVA adhesive film adhesion strength in claim 2~9 any one of them photovoltaic module Method, it is characterised in that the length of the opening is more than the length of the adhesive tape.
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