CN107870298B - Circuit parameter detection circuit and method of voltage dividing circuit and electric energy meter - Google Patents
Circuit parameter detection circuit and method of voltage dividing circuit and electric energy meter Download PDFInfo
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- CN107870298B CN107870298B CN201711222813.5A CN201711222813A CN107870298B CN 107870298 B CN107870298 B CN 107870298B CN 201711222813 A CN201711222813 A CN 201711222813A CN 107870298 B CN107870298 B CN 107870298B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
- G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
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Abstract
The application belongs to the technical field of circuit detection, and provides a circuit parameter detection circuit and method of a voltage division circuit and an electric energy meter, wherein the circuit parameter detection circuit comprises a master voltage division circuit and at least one slave voltage division circuit corresponding to the master voltage division circuit; the main voltage dividing circuit comprises a main voltage divider, and a first voltage measuring module is connected in parallel with the main voltage divider; the slave voltage dividing circuit comprises a slave voltage divider corresponding to the master voltage divider and a switch component for changing the state of the slave voltage dividing circuit; the secondary voltage divider is connected with a second voltage measurement module in parallel; the second voltage measurement module is used for detecting the voltage intensity variation of the slave voltage divider when the slave voltage divider is in different states when the voltage intensity detected by the first voltage measurement module is inconsistent with the voltage intensity detected by the second voltage measurement module, and determining whether the slave voltage divider or the master voltage divider is abnormal according to the voltage intensity variation. The application can detect the circuit parameter change caused by the voltage divider fault and the problem of inaccurate measurement result of the measurement circuit.
Description
Technical Field
The application belongs to the technical field of circuit detection, and particularly relates to a circuit parameter detection circuit and method of a voltage dividing circuit and an electric energy meter.
Background
In voltage measurement, a typical voltage measurement module has a limit on the magnitude of the input voltage, and therefore the voltage to be measured needs to be attenuated by resistor voltage division within a safe range.
In long-term use, the resistor for voltage division may be damaged, the resistance may be changed, and the like, so that the detected voltage may not truly reflect the measured voltage.
Disclosure of Invention
In view of the above, the embodiments of the present application provide a circuit parameter detection circuit and method of a voltage division circuit and an electric energy meter, so as to solve the problem in the prior art that a measurement device cannot detect that a resistor of the voltage division circuit is damaged, and a resistance value changes to change a circuit parameter, thereby causing inaccurate measurement of the measurement device.
A first aspect of an embodiment of the present application provides a circuit parameter detection circuit of a voltage division circuit, including:
a main voltage dividing circuit;
at least one slave voltage divider circuit corresponding to the master voltage divider circuit;
the master voltage dividing circuit and the slave voltage dividing circuit are respectively coupled with a signal source;
the main voltage divider of the main voltage dividing circuit is connected with a first voltage measuring module in parallel, and the first voltage measuring module is used for detecting the voltage intensity on the main voltage divider;
the slave voltage dividing circuit comprises a slave voltage divider corresponding to the master voltage divider and a switch component for changing the state of the slave voltage dividing circuit; the secondary voltage divider is connected with a second voltage measurement module in parallel;
the second voltage measurement module is used for detecting the voltage intensity variation of the slave voltage divider when the slave voltage divider is in different states when the voltage intensity detected by the first voltage measurement module is inconsistent with the voltage intensity detected by the second voltage measurement module, and determining whether the slave voltage divider or the master voltage divider is abnormal according to the voltage intensity variation.
A second aspect of the embodiment of the present application provides a circuit detection chip, where the circuit detection chip includes the circuit parameter detection circuit of the voltage division circuit, and the second voltage divider and the fourth voltage divider are disposed inside the circuit detection chip.
A third aspect of the embodiment of the present application provides an electric energy meter, where the electric energy meter includes the circuit parameter detection circuit of the voltage division circuit.
A fourth aspect of the embodiment of the present application provides a circuit parameter detection method of a voltage division circuit, including: the voltage dividing circuit comprises a main voltage dividing circuit and a slave voltage dividing circuit corresponding to the main voltage dividing circuit, and the main voltage dividing circuit and the slave voltage dividing circuit are respectively coupled with a signal source; the main voltage dividing circuit at least comprises a main voltage divider, and a first voltage measuring module is connected in parallel with the main voltage divider; the secondary voltage dividing circuit at least comprises a secondary voltage divider corresponding to the primary voltage divider, and a second voltage measuring module is connected in parallel with the secondary voltage divider; the slave voltage divider circuit further comprises a switch assembly for changing the state of the slave voltage divider circuit, the detection method comprising,
detecting the voltage intensity on the main voltage divider through a first voltage measuring module;
detecting the voltage intensity on the slave voltage divider through a second voltage measuring module;
when the voltage intensity detected by the first voltage measuring module is inconsistent with the voltage intensity detected by the second voltage measuring module, detecting the voltage intensity variation of the slave voltage divider when the slave voltage divider is in different states by the second voltage measuring module, and determining whether the slave voltage divider or the master voltage divider is abnormal according to the voltage intensity variation.
Compared with the prior art, the embodiment of the application has the beneficial effects that: the embodiment of the application detects the same signal source through two sets of detection circuits with a master voltage dividing circuit and a slave voltage dividing circuit, when the detection results of the two sets of detection circuits are different, the circuit parameters of the slave voltage dividing circuit are changed to obtain a third detection result, and the change amount of the voltage intensity is calculated through the two detection results in the slave voltage dividing circuit, so that whether the measurement of the detection circuit is accurate or not and whether the circuit parameters of the master voltage dividing circuit and the slave voltage dividing circuit are changed or not is judged. The circuit provided by the embodiment of the application has high detection precision, and can accurately detect the problem of abnormal circuit parameters caused by the fault of the voltage divider in the voltage dividing circuit.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a circuit parameter detecting circuit of a voltage dividing circuit according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a circuit parameter detection circuit of the voltage divider circuit of FIG. 1 when the switch assembly is opened;
FIG. 3 is a schematic diagram of a circuit parameter detection circuit of the voltage divider circuit of FIG. 1 with the switch assembly closed;
FIG. 4 is a schematic diagram of a circuit parameter detecting circuit of another voltage dividing circuit according to the first embodiment of the present application;
FIG. 5 is a schematic diagram of a circuit configuration of a resistor-capacitor connection as a master voltage divider and a slave voltage divider according to a second embodiment of the present application;
fig. 6 is a schematic diagram of an implementation flow of a circuit parameter detection method of a voltage divider circuit according to a fifth embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
In order to illustrate the technical scheme of the application, the following description is made by specific examples.
Example 1
Fig. 1 shows a schematic circuit parameter detection circuit of a voltage divider circuit according to a first embodiment of the present application, and for convenience of explanation, only the parts related to the present embodiment are shown, which are described in detail below:
a circuit parameter detection circuit of a voltage divider circuit, comprising:
a main voltage dividing circuit 1;
at least one slave voltage dividing circuit 2 corresponding to the master voltage dividing circuit 1;
the master voltage dividing circuit 1 and the slave voltage dividing circuit 2 are respectively coupled with a signal source 3;
the main voltage dividing circuit 1 comprises a main voltage divider 11, wherein a first voltage measuring module 4 is connected in parallel to the main voltage divider 11, and the first voltage measuring module 4 is used for detecting the voltage intensity on the main voltage divider 11;
the slave voltage dividing circuit 2 includes a slave voltage divider 21 corresponding to the master voltage divider 11, and a switch assembly 6 for changing the state of the slave voltage dividing circuit 2; the slave voltage divider 21 is connected with a second voltage measurement module 5 in parallel;
the second voltage measurement module 5 is configured to detect a voltage intensity variation of the slave voltage divider 21 when the slave voltage divider 2 is in different states when the voltage intensity detected by the first voltage measurement module 4 and the voltage intensity detected by the second voltage measurement module 5 are inconsistent, and determine whether the slave voltage divider 2 or the master voltage divider 1 is abnormal according to the voltage intensity variation.
The second voltage measurement module 5 is specifically configured to determine that the slave voltage division circuit 2 is normal and determine that the master voltage division circuit 1 is abnormal if the detected voltage intensity variation is smaller than a threshold; if the voltage intensity variation is detected to be greater than or equal to a threshold value, the slave voltage dividing circuit 2 is determined to be abnormal.
Preferably, the first voltage measurement module 4 and the second voltage measurement module 5 are further configured to convert the detected voltage intensity into a form of amplitude and phase, and calculate an amplitude variation and a phase variation of the voltage intensity according to the voltage intensity detected by the second voltage measurement module 5 in different states of the switch assembly 6.
The voltage dividing circuit 1 and the voltage dividing circuit 2 are used for reducing the voltage across the first voltage measuring module 4 and the second voltage measuring module 5 in the access circuit.
Preferably, the main voltage divider circuit 1 further comprises a first voltage divider 12 and a second voltage divider 13; the slave voltage divider circuit 2 further includes a third voltage divider 22 and a fourth voltage divider 23; the first voltage divider 12 and the second voltage divider 13 are connected in series with the main voltage divider 11; the third voltage divider 22 and the fourth voltage divider 23 are connected in series with the slave voltage divider 21; the switch assembly 6 is connected in parallel to said fourth voltage divider 23.
It can be understood that when the signal source 3 is a voltage source, the output voltage thereof may be a direct current voltage or a line voltage with a fixed frequency; the correspondence between the master voltage divider circuit 1 and the slave voltage divider circuit 2 specifically means that when the master voltage divider circuit 1 and the slave voltage divider circuit 2 are shipped, the circuit parameters of the master voltage divider circuit 11 and the slave voltage divider circuit 21 are the same, especially the set initial values of the circuit parameters of the circuit are the same, and the circuit parameters of the circuit are changed in the subsequent use process, but the first voltage divider 12 corresponds to the third voltage divider 22 due to the master-slave relationship, and even if the third voltage divider 22 is tampered, the resistance value is different from that of the first voltage divider 12, but the resistances of the two voltage dividers still correspond to each other according to the set values when the master voltage divider circuit is shipped.
The specific implementation process of the circuit provided by the embodiment is as follows: if only normal voltage detection is needed, only the main voltage dividing circuit 1 and the first voltage measuring module 4 connected in parallel with the main voltage divider 11 are used, and the voltage detection of the signal source 3 is completed by detecting the voltage intensity on the main voltage divider 11.
If the detection precision of the first voltage measurement module 4 or the second voltage measurement module 5 needs to be detected, and if the detection result is accurate, the second voltage measurement module 5 in the voltage division circuit 2 is enabled to work through an internal switch, the voltage intensity value detected by the second voltage measurement module 5 is read, and meanwhile, the voltage intensity value detected by the first voltage measurement module 4 in the main voltage division circuit 1 is read. When the voltage intensity values detected by the two voltage measurement modules are inconsistent, it is further determined that a problem occurs in the circuit parameters of the master voltage division circuit 1 or a problem occurs in the circuit parameters of the slave voltage division circuit 2, that is, the voltage intensity variation of the slave voltage division circuit 2 on the slave voltage divider 21 in different states is detected, and whether the slave voltage division circuit 2 or the master voltage division circuit 1 is abnormal is determined according to the voltage intensity variation.
The determination of whether the abnormal circuit occurs in the slave voltage dividing circuit 2 or the master voltage dividing circuit 1 is specifically:
in the slave voltage dividing circuit 2, the switching element 6 can change the circuit state of the slave voltage dividing circuit 2. When the switch component 6 is in an open state, as shown in fig. 2, the master voltage dividing circuit 1 is identical to the slave voltage dividing circuit 2, and the values detected by the two measuring modules are recorded;
when the switch assembly 6 is in the closed state, as shown in fig. 3, the main voltage dividing circuit 1 and the auxiliary voltage dividing circuit 2 differ by a resistance value of the fourth transformer 23, and at this time, the voltage intensity value detected by the second voltage measuring module 5 changes, and the changed voltage intensity value is recorded. Analyzing the two voltage intensity value changes in the second voltage measurement module 5, namely calculating the voltage intensity change amount on the slave voltage divider 21 when the switch assembly 6 is in different states, analyzing whether the degree of the change of the voltage from the voltage intensity change amount on the voltage divider 21 exceeds a threshold value according to the voltage intensity change amount, and judging that the circuit parameters in the slave voltage division circuit 2 are normal if the detected voltage intensity change amount is smaller than the threshold value, so as to determine that the circuit parameters of the master voltage division circuit 1 are abnormal; if the voltage intensity variation is detected to be greater than or equal to the threshold value, it is determined that the circuit parameter of the slave voltage dividing circuit 2 is abnormal.
Since there is only one slave voltage divider circuit in this embodiment, when the circuit parameters of the slave voltage divider circuit are abnormal, it is impossible to determine whether the circuit parameters of the master voltage divider circuit are abnormal. However, the number of the secondary voltage dividing circuits in the application can be more than one, and the number of the corresponding second voltage measuring modules can be also thought; when the circuit parameter of one of the slave voltage dividing circuits is detected to be abnormal, other slave voltage dividing circuits and the second voltage measuring module can be selected to detect the circuit parameter, so that the condition that the slave voltage dividing circuit cannot detect whether the parameter of the master voltage dividing circuit is abnormal is reduced, and the accuracy of the circuit parameter detecting circuit of the voltage dividing circuit is improved.
It should be understood that the above-mentioned voltage intensity values detected by the first voltage measurement module 4 and the second voltage measurement module 5 may be values represented by amplitude and phase, the above-mentioned voltage intensity variation may be an amplitude variation and a phase variation of the voltage intensity, and in the present embodiment, the voltage divider is a resistor, so that the phase variation thereof is 0, and the above-mentioned voltage intensity variation is represented as an amplitude variation of the voltage intensity.
Illustratively, when the second voltage measurement module 5 in the slave voltage division circuit 2 is operated, the switch assembly 6 is in an open state, and the circuit structures of the master voltage division circuit 1 and the slave voltage division circuit 2 are identical, but the voltage intensity values detected by the first voltage measurement module 4 and the second voltage measurement module 5 are different. Therefore, it is assumed that the voltage of the measured signal source 3 is Vdet; the voltage intensity value detected by the first voltage measuring module 4 on the main voltage divider 11 is Vdet1; the second voltage measurement module 5 detects a voltage strength value Vdet2 from the voltage divider 21.
Specifically:if Vdet1 is equal to Vdet2, it indicates that the detection of one voltage dividing circuit has deviation.
The switch assembly 6 is put in the closed state, the resistance of the fourth transformer 23 is absent from the circuit parameters of the voltage divider circuit 2, and the voltage strength Vdet3 detected by the second voltage measurement module 5 at the slave voltage divider 21 is recorded at this time, specifically:
the change amount of the voltage intensity on the slave voltage divider 21 in the slave voltage dividing circuit 2 is analyzed:
where the amplitude variation is known, vdet represents the voltage strength of the signal source 3; vdet1 represents the voltage strength detected by the first voltage measurement module 4 at the primary voltage divider 11; vdet2 represents the voltage strength detected by the second voltage measurement module 5 at the slave voltage divider 21 when the switch assembly 6 is open; vdet3 represents the voltage strength detected by the second voltage measurement module 5 from the voltage divider 21 when the switch assembly 6 is closed; it will be appreciated that the voltage strengths described above are each expressed in terms of amplitude and phase, with the phase change being 0. R1 represents the resistance of the first voltage divider 12; r2 represents the resistance of the main voltage divider 11; r3 represents the resistance of the second voltage divider 13; r4 represents the resistance of the third voltage divider 22; r5 represents the resistance value of the slave voltage divider 21; r6 represents the resistance of the fourth voltage divider 23.
The master voltage dividing circuit 1 and the slave voltage dividing circuit 2 in the present embodiment are used to reduce the voltage on the circuit. Because the first voltage measurement module 4 measures the voltage component on the main voltage divider 11, the resistance value of the first voltage divider 12 is far greater than the resistance values of the main voltage divider 11 and the second voltage divider 13, so that the voltages at the two ends of the main voltage divider 11 are lower, and a better voltage reduction effect is achieved; similarly, the resistance of the third voltage divider 22 is much greater than the resistances of the slave voltage divider 21 and the fourth voltage divider 23. In the present embodiment, for the convenience of calculation, and considering the master-slave relationship of the master voltage dividing circuit 1 and the slave voltage dividing circuit 2, r1=r4=1×10 is set 6 Ohm, r2=r3=r5=r6=1×10 3 Ohmic. The value of the above formulaIt will be appreciated that->Is the value obtained when the resistor is in ideal condition, and the resistor is actually produced with error, so +.>Is a standard value, and the result of the actual calculation should be within a certain threshold range around the standard value, for example +.>
If the amplitude variation detected by the second voltage measuring module 5 is not the standard value or the deviation from the standard value exceeds a threshold value, determining that the circuit parameter of the voltage dividing circuit 2 is abnormal; if the amplitude variation detected by the second voltage measuring module 5 is the standard value or the deviation from the standard value does not exceed the threshold value, the circuit parameter of the slave voltage dividing circuit 2 is judged to be normal, so that the circuit parameter of the master voltage dividing circuit 1 is determined to be abnormal.
In one embodiment, the first voltage divider 12 and the third voltage divider 22 may be connected in series as a single voltage divider in a circuit, and the specific circuit structure is shown in fig. 4.
In the above embodiment, a circuit parameter detecting circuit of a voltage dividing circuit is provided, and by detecting the same signal source by a master voltage dividing circuit and a slave voltage dividing circuit and a first voltage measuring module and a second voltage measuring module, a measurement error of the first voltage measuring module or the second voltage measuring module can be found. Further, by detecting the voltage intensity variation amount on the slave voltage divider when the slave voltage dividing circuit is in different states through the second voltage measuring module, a fault source causing measurement errors can be determined. According to the embodiment, the problem that the circuit parameters change due to the fact that the voltage divider of the voltage division circuit breaks down, so that the measurement accuracy of the measurement circuit is inaccurate can be detected, and the circuit part with the changed circuit parameters can be located.
Example two
Alternatively, the master voltage divider 11, the first voltage divider 12, the second voltage divider 13, the slave voltage divider 21, the third voltage divider 22, and the fourth voltage divider 23 may be resistors, inductors, resistor-to-inductor circuits, resistor-to-capacitor circuits, or inductor-to-capacitor circuits.
In this embodiment, circuit parts, which are not mentioned, of the first voltage measurement module 4, the second voltage measurement module 5, the signal source 3, the switch component 6, etc. are identical to those in the first embodiment, and are not described in detail.
Illustratively, fig. 5 shows a circuit configuration diagram of a resistor-to-capacitor connection as the master voltage divider 11 and the slave voltage divider 21.
The master voltage divider 11 and the slave voltage divider 21 are circuits with resistor and capacitor connected, as shown in fig. 5, two ends of the resistor in the master voltage divider 11 and two ends of the resistor in the slave voltage divider 21 are respectively connected with a capacitor to ground. The voltage intensity detected in the first voltage measuring module 4 and the second voltage measuring module 5 can be converted into the form of amplitude and phase, and the voltage intensity variation calculated by the second voltage measuring module 5 in the first embodiment is the amplitude variation and the phase variation of the voltage intensity.
Example III
A third embodiment of the present application provides a circuit detection chip, including the circuit parameter detection circuit of any one of the voltage division circuits of the above embodiments, where the second voltage divider 13 and the fourth voltage divider 23 are disposed inside the circuit detection chip.
In the circuit detection chip provided by the embodiment of the application, the second voltage measurement module 5 detects and analyzes the circuit parameters of the voltage division circuit 2 under different states of the switch component 6, and the different states of the switch component 6 mainly refer to the existence of the resistance value of the fourth voltage divider 23; meanwhile, due to the master-slave relationship between the master voltage dividing circuit 1 and the slave voltage dividing circuit 2, the resistance of the second voltage divider 13 corresponds to the resistance of the fourth voltage divider 23, so that in order to avoid the change of element parameters caused by various external influences on the second voltage divider 13 and the fourth voltage divider 23 as much as possible, the second voltage divider 13 and the fourth voltage divider 23 are integrated inside a chip, the opportunity of direct contact with the external environment is reduced, and the possibility of influence of the external environment condition is reduced.
Example IV
A fourth embodiment of the present application provides an electric energy meter, which may include the circuit parameter detection circuit of the voltage dividing circuit of any one of the first to third embodiments.
Taking the schematic circuit structure diagram of the circuit parameter detection circuit of the voltage dividing circuit provided in the first embodiment as an example, as shown in fig. 1, the signal source 3 is a voltage source to be detected, and the master voltage dividing circuit 1, the slave voltage dividing circuit 2, the first voltage measuring module 4, the second voltage measuring module 5 and the switch component 6 are all measuring devices in the electric energy meter. In normal measurement, the second voltage measuring module 5 in the slave voltage dividing circuit 2 does not work, other circuit parts are still connected into the circuit to work, and the first voltage measuring module 4 detects the voltage on the master voltage divider 11. When the circuit parameters of the main voltage dividing circuit 1 need to be measured, the second voltage measuring module 5 is enabled to work through the internal switch, the voltage intensity values on the first voltage measuring module 4 and the second voltage measuring module 5 are read, when the detected values of the two measuring modules are different, the switch assembly 6 is closed, the second voltage intensity value of the second voltage measuring module 5 is read, the voltage intensity variation of the two voltage intensity values in the second voltage measuring module 5, namely the amplitude variation and the phase variation of the voltage intensity are calculated, whether the amplitude variation has deviation is judged, whether the circuit parameters of the auxiliary voltage dividing circuit 2 have variation is judged, and finally whether the circuit parameters of the main voltage dividing circuit 1 have variation is deduced.
In the above embodiment, an electric energy meter is provided, which can detect that an abnormality occurs in a circuit parameter of a voltage dividing circuit in the electric energy meter, thereby causing a problem of inaccurate metering of electricity consumption.
Example five
Correspondingly, the fifth embodiment of the present application further provides a circuit parameter detection method of the voltage dividing circuit, as shown in fig. 6:
the voltage dividing circuit comprises a master voltage dividing circuit and at least one slave voltage dividing circuit corresponding to the master voltage dividing circuit, and the master voltage dividing circuit and the slave voltage dividing circuit are respectively coupled with a signal source; the main voltage dividing circuit at least comprises a main voltage divider, and a first voltage measuring module is connected in parallel with the main voltage divider; the secondary voltage dividing circuit at least comprises a secondary voltage divider corresponding to the primary voltage divider, and a second voltage measuring module is connected in parallel with the secondary voltage divider; the slave voltage divider circuit further comprises a switch assembly for changing the state of the slave voltage divider circuit;
the circuit parameter detection method of the voltage division circuit comprises the following steps:
s601: the voltage intensity on the main voltage divider is detected by the first voltage measurement module.
S602: the voltage strength on the slave voltage divider is detected by the second voltage measurement module.
S603: when the voltage intensity detected by the first voltage measurement module is inconsistent with the voltage intensity detected by the second voltage measurement module, detecting the voltage intensity variation of the slave voltage divider when the slave voltage divider is in different states by the second voltage measurement module, and determining whether the slave voltage divider or the master voltage divider is abnormal according to the voltage intensity variation.
In the above step S603, the determination of whether the slave voltage dividing circuit or the master voltage dividing circuit is abnormal includes: if the voltage intensity variation is smaller than a threshold value, determining that the slave voltage dividing circuit is normal and the master voltage dividing circuit is abnormal; and if the voltage intensity variation is greater than or equal to a threshold value, determining that the slave voltage dividing circuit is abnormal.
Since there is only one slave voltage divider circuit in this embodiment, when the circuit parameters of the slave voltage divider circuit are abnormal, it is impossible to determine whether the circuit parameters of the master voltage divider circuit are abnormal. However, the number of the secondary voltage dividing circuits in the application can be more than one, and the number of the corresponding second voltage measuring modules can be also thought; when the circuit parameter of one of the slave voltage dividing circuits is detected to be abnormal, other slave voltage dividing circuits and the second voltage measuring module can be selected to detect the circuit parameter, so that the condition that the slave voltage dividing circuit cannot detect whether the parameter of the master voltage dividing circuit is abnormal is reduced, and the accuracy of the circuit parameter detecting circuit of the voltage dividing circuit is improved.
In this embodiment, the first voltage measurement module and the second voltage measurement module are further configured to convert the detected voltage intensity into a form of amplitude and phase, and calculate an amplitude variation and a phase variation of the voltage intensity according to the voltage intensity detected by the second voltage measurement module in different states of the switch assembly.
In the above embodiments, a circuit parameter detection method for a voltage division circuit is provided, which can accurately adjust a detection circuit according to whether a deviation occurs in the detection accuracy of a circuit parameter change detection circuit of a master-slave voltage division circuit, and further deduce the reason for the deviation. The detection method provided by the embodiment is simple to operate, high in detection efficiency and capable of being widely applied to a measurement circuit.
It should be understood that the sequence number of each step in the foregoing embodiment does not mean that the execution sequence of each process should be determined by the function and the internal logic, and should not limit the implementation process of the embodiment of the present application.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal device and method may be implemented in other manners. For example, the apparatus/terminal device embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical function division, and there may be additional divisions in actual implementation, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated modules/units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiment, or may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth. It should be noted that the computer readable medium contains content that can be appropriately scaled according to the requirements of jurisdictions in which such content is subject to legislation and patent practice, such as in certain jurisdictions in which such content is subject to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.
The above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (7)
1. A circuit parameter detection circuit of a voltage dividing circuit, comprising:
a main voltage dividing circuit;
at least one slave voltage divider circuit corresponding to the master voltage divider circuit;
the master voltage dividing circuit and the slave voltage dividing circuit are respectively coupled with a signal source;
the main voltage dividing circuit comprises a main voltage divider, and a first voltage measuring module is connected in parallel to the main voltage divider and is used for detecting the voltage intensity on the main voltage divider;
the slave voltage dividing circuit comprises a slave voltage divider corresponding to the master voltage divider and a switch component for changing the state of the slave voltage dividing circuit; the slave voltage divider is connected with a second voltage measurement module in parallel;
the main voltage dividing circuit further comprises a first voltage divider and a second voltage divider; the slave voltage dividing circuit further comprises a third voltage divider and a fourth voltage divider;
the first voltage divider and the second voltage divider are respectively connected in series with the main voltage divider;
the third voltage divider and the fourth voltage divider are respectively connected with the slave voltage divider in series;
the switch component is connected in parallel with the fourth voltage divider;
the circuit parameters of the master voltage dividing circuit are the same as those of the slave voltage dividing circuit;
the second voltage measurement module is configured to calculate a voltage intensity variation of the slave voltage divider when the voltage intensity detected by the first voltage measurement module is inconsistent with the voltage intensity detected by the second voltage measurement module, and determine whether the slave voltage divider or the master voltage divider is abnormal according to the voltage intensity variation, where the voltage intensity variation is a ratio of a first difference value to a first voltage intensity value, the first difference value is a difference value between the second voltage intensity value and the first voltage intensity value, the first voltage intensity value is a voltage intensity value detected by the second voltage measurement module before the switch assembly is closed, and the second voltage intensity value is a voltage intensity value detected by the second voltage measurement module after the switch assembly is closed;
the second voltage measurement module is specifically configured to determine that the slave voltage division circuit is normal and determine that the master voltage division circuit is abnormal if the voltage intensity variation is detected to be within a threshold range; and if the voltage intensity variation is detected not to be in the threshold range, determining that the slave voltage dividing circuit is abnormal.
2. The circuit parameter detection circuit of the voltage divider circuit according to claim 1, wherein the first voltage measurement module and the second voltage measurement module are further configured to convert the detected voltage intensity into a form of amplitude and phase, and calculate an amplitude variation and a phase variation of the voltage intensity based on the voltage intensity detected by the second voltage measurement module in different states of the switch assembly.
3. The circuit parameter sensing circuit of the voltage divider circuit of claim 1, wherein the master voltage divider, the first voltage divider, the second voltage divider, the slave voltage divider, the third voltage divider, and the fourth voltage divider are resistors, inductors, resistor-to-inductor connected circuits, resistor-to-capacitor connected circuits, or inductor-to-capacitor connected circuits.
4. A circuit detection chip comprising the circuit parameter detection circuit of the voltage dividing circuit according to any one of claims 1 to 3, the second voltage divider and the fourth voltage divider being provided inside the circuit detection chip.
5. An electric energy meter, characterized in that the electric energy meter comprises a circuit parameter detection circuit of the voltage dividing circuit according to any one of claims 1 to 3.
6. A circuit parameter detection method of a voltage division circuit, which is characterized in that the voltage division circuit comprises a master voltage division circuit and at least one slave voltage division circuit corresponding to the master voltage division circuit, wherein the master voltage division circuit and the slave voltage division circuit are respectively coupled with a signal source; the main voltage dividing circuit at least comprises a main voltage divider, and a first voltage measuring module is connected in parallel with the main voltage divider; the secondary voltage dividing circuit at least comprises a secondary voltage divider corresponding to the primary voltage divider, and a second voltage measuring module is connected in parallel with the secondary voltage divider; the slave voltage divider circuit further comprises a switch component for changing the state of the slave voltage divider circuit, and the master voltage divider circuit further comprises a first voltage divider and a second voltage divider; the slave voltage dividing circuit further comprises a third voltage divider and a fourth voltage divider; the first voltage divider and the second voltage divider are respectively connected in series with the main voltage divider; the third voltage divider and the fourth voltage divider are respectively connected with the slave voltage divider in series; the switch component is connected in parallel with the fourth voltage divider; wherein, the circuit parameter of the main voltage division circuit is the same as the circuit parameter of the auxiliary voltage division circuit, and the detection method comprises the following steps:
detecting, by the first voltage measurement module, a voltage strength on the primary voltage divider;
detecting, by the second voltage measurement module, a voltage strength on the slave voltage divider;
when the voltage intensity detected by the first voltage measurement module is inconsistent with the voltage intensity detected by the second voltage measurement module, detecting the voltage intensity variation of the slave voltage divider when the slave voltage divider is in different states through the second voltage measurement module, and determining whether the slave voltage divider or the master voltage divider is abnormal according to the voltage intensity variation, wherein the voltage intensity variation is a ratio of a first difference value to a first voltage intensity value, the first difference value is a difference value between a second voltage intensity value and the first voltage intensity value, the first voltage intensity value is a voltage intensity value detected by the second voltage measurement module before the switch assembly is closed, and the second voltage intensity value is a voltage intensity value detected by the second voltage measurement module after the switch assembly is closed;
the determining whether the slave voltage dividing circuit or the master voltage dividing circuit is abnormal according to the voltage intensity variation includes:
if the voltage intensity variation is within a threshold range, determining that the slave voltage dividing circuit is normal and the master voltage dividing circuit is abnormal; and if the voltage intensity variation is not in the threshold range, determining that the slave voltage dividing circuit is abnormal.
7. The method of detecting circuit parameters of voltage dividing circuit according to claim 6, wherein the first voltage measuring module and the second voltage measuring module are further configured to convert the detected voltage intensity into a form of amplitude and phase, and calculate an amplitude variation and a phase variation of the voltage intensity based on the voltage intensity detected by the second voltage measuring module in different states of the switching assembly.
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