CN107797155A - Compton backscattering detection means - Google Patents

Compton backscattering detection means Download PDF

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Publication number
CN107797155A
CN107797155A CN201610794109.6A CN201610794109A CN107797155A CN 107797155 A CN107797155 A CN 107797155A CN 201610794109 A CN201610794109 A CN 201610794109A CN 107797155 A CN107797155 A CN 107797155A
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China
Prior art keywords
ray
detection means
detector
energy
compton backscattering
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CN201610794109.6A
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Chinese (zh)
Inventor
方杰
徐春风
尹传祥
陈健
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Hefei Meyer Optoelectronic Technology Inc
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Hefei Meyer Optoelectronic Technology Inc
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Priority to CN201610794109.6A priority Critical patent/CN107797155A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

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  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention discloses a kind of compton backscattering detection means, it includes penetrating source, collimator assembly and probe assembly, the collimator assembly is arranged on this and penetrated on the emitting light path in source, this penetrate source be used for launch detect ray to the collimator assembly, the collimator assembly is used to the detection ray being collimated into spot light ray and by the spot light radiation exposure to the surface of measured object, the probe assembly is used to receive by the scattered ray of the surface scattering of the measured object, the probe assembly is used to the scattered ray being received as high-energy ray and low energy ray, and the first image is formed according to the high-energy ray, and the second image is formed according to the low energy ray.Above-mentioned compton backscattering detection means, the backscatter images of two energy can be obtained simultaneously online, so, above-mentioned compton backscattering detection means adds signal all the way, can be easily to distinguish the dangerous substance in organic matter by follow-up image procossing, and processing speed is faster, safety inspection field can be widely applied to.

Description

Compton backscattering detection means
Technical field
The present invention relates to safety inspection technical field, more specifically, is related to a kind of compton backscattering detection means.
Background technology
In recent years, with the continuous generation of terrorist incident, the use of the destructor of high-tech brings tired to safety inspection Difficulty, existing X-ray detection means are to use compton backscattering detection means, and this equipment is to utilize ray and material phase interaction Incoherent scattering effect, it is very strong to the highdensity material scattered signal of low atomic number, particularly by hydrogen, oxygen, carbon, nitrogen member The atomic number such as material, usual explosive, drugs of element composition is all relatively low, and scattered signal is strong, and metallics atomic number is high, scattering Signal is weak, so as to effectively detect to be hidden in the danger of metal surface.
Structure currently used for implementing compton backscattering, which is broadly divided into, to be based on penetrating source and putting english turning collimator structure and base Add two kinds of collimator structure in detector end.
Thick sheet of domestic fourth et al. is the backscattering device based on end of probe collimator structure development, there is two kinds of application forms, One kind is that source of penetrating is collimated device into line source, and after on radiation exposure to object, the ray of scattering is accurate by a row of detector front end Straight device receives, wherein the pixel of the corresponding sensor of each collimater, this mode collimator structure is complicated, and machining accuracy will Ask very high, cost is high;Another kind is that the collimated device in source of penetrating is collimated into point source, and detector uses energy type point probe, detector What is received is the backscattering spectrum signal of a bit, establishes model according to obtained spectrum signal, more can accurately obtain danger Species, but this mode belongs to offline inspection, it is impossible to meets the requirement of on-line checking.
Add the structure of collimater to be called flying-spot scanner structure based on source is penetrated, proposed earliest by AS&E companies in 1994, It, which penetrates source, includes two collimaters, and one of them will penetrate source and be collimated into wire, another make high speed it is rotationally constrained another Direction, the point pointwise illumination of device limitation is collimated on object, a part of ray is absorbed by object, part transmission, another portion Point it is the scattered ray that we need, the ray of back scattering is received by a detector, and all points is chronologically arranged i.e. available The backscatter images of one amplitude object.
But existing flying-spot scanner formula structure is only single at present to be detected, and energy information is less;And analytical equipment is composed offline It can not meet quickly to scan classificating requirement again.
The content of the invention
It is contemplated that at least solves one of technical problem present in prior art.Therefore, the present invention needs offer one Kind compton backscattering detection means.
A kind of compton backscattering detection means, including source, collimator assembly and probe assembly are penetrated, the collimator assembly is arranged on This is penetrated on the emitting light path in source, this penetrate source be used for launch detection ray to the collimator assembly, the collimator assembly is for this to be detected Ray is collimated into spot light ray and is used to receive by this by the spot light radiation exposure to the surface of measured object, the probe assembly The scattered ray of the surface scattering of measured object, the probe assembly is used to the scattered ray being received as high-energy ray and low energy is penetrated Line, and the first image is formed according to the high-energy ray, and the second image is formed according to the low energy ray.
Above-mentioned compton backscattering detection means, the backscatter images of two energy can be obtained simultaneously online, in this way, on State compton backscattering detection means and add signal all the way, can be organic easily to distinguish by follow-up image procossing Dangerous substance in thing, and processing speed is faster, can be widely applied to safety inspection field.
In some embodiments, the compton backscattering detection means includes low energy optical filter, and the low energy optical filter is set Put and penetrated at this in the light path between source and the collimator assembly.
In some embodiments, the probe assembly includes first single energy detector and second single energy detector, and this first It is single can detector and this second it is single can detector by this penetrate source centered on it is symmetrical, this first it is single can detector be used to receive this High-energy ray simultaneously forms first image according to the high-energy ray, and second single energy detector is used to receive the low energy ray and root Second image is formed according to the low energy ray.
In some embodiments, the light incident side of second single energy detector is provided with filtering metal piece.
In some embodiments, the probe assembly includes first single energy detector and second single energy detector, and this first List energy detector and second single energy detector are penetrated source relative to this and are placed in different angles, and first single energy detector is used for Receive the high-energy ray and first image is formed according to the high-energy ray, second single energy detector is penetrated for receiving the low energy Line simultaneously forms second image according to the low energy ray.
In some embodiments, first single angle that can be between detector and second single energy detector is more than 20 Degree.
In some embodiments, this first it is single can detector include primary scintillator and the first photomultiplier, this One scintillator and first photomultiplier are set gradually along the input path of the high-energy ray;
Second single energy detector includes secondary fluor and the second photomultiplier, the secondary fluor and second light Electric multiplier tube is set gradually along the input path of the low energy ray.
In some embodiments, the probe assembly includes photon counting detector, and the photon counting detector is used to lead to Cross setting energy threshold and the scattered ray is received as the high-energy ray and the low energy ray, and formed and be somebody's turn to do according to the high-energy ray First image, and second image is formed according to the low energy ray.
In some embodiments, the collimator assembly includes the fixed slit collimation being arranged in the light path of the detection ray Device and rotary collimator, the fixed slit collimater offer single first slit, and the rotary collimator is offered from the rotation Multiple second slits that the pivot of collimater radially distributes, the fixed slit collimater is on the rotary collimator Orthographic projection is located between adjacent two of which second slit and the two of which adjacent with this second slit separation.
In some embodiments, the rotary collimator is in the form of annular discs, and the fixed slit collimater is accurate perpendicular to the rotation The radial direction of straight device is set.
In some embodiments, the orthographic projection of the fixed slit collimater on the rotary collimator collimates with the rotation The ultimate range that the distance between center of device can reach for the distance.
In some embodiments, the width of each second slit gradually increases from the center of the rotary collimator to periphery Add.
In some embodiments, the compton backscattering detection means includes device for transporting objects, material conveying dress Put for placing and conveying the measured object to the light path of the spot light ray.
In some embodiments, the compton backscattering detection means includes image processing apparatus, image procossing dress Put for handling first image and second image to obtain composograph, and analyze the composograph to judge the measured object Whether it is danger.
The additional aspect and advantage of embodiment of the present invention will be set forth in part in the description, partly by from following Become obvious in description, or recognized by the practice of the present invention.
Brief description of the drawings
The above-mentioned and/or additional aspect and advantage of the present invention is from combining in description of the accompanying drawings below to embodiment by change Obtain substantially and be readily appreciated that, wherein:
Fig. 1 is the structural representation of the compton backscattering detection means of embodiment of the present invention.
Fig. 2 is the fixed slit collimater and rotary collimator of the compton backscattering detection means of embodiment of the present invention The top view of combination.
Fig. 3 is the partial function module diagram of the compton backscattering detection means of embodiment of the present invention.
Fig. 4 is another structural representation of the compton backscattering detection means of embodiment of the present invention.
Fig. 5 is the compton backscattering principle schematic of the compton backscattering detection means of embodiment of the present invention.
Fig. 6 is the another structural representation of the compton backscattering detection means of embodiment of the present invention.
Embodiment
Embodiments of the present invention are described below in detail, the example of the embodiment is shown in the drawings, wherein from beginning Same or similar element is represented to same or similar label eventually or there is the element of same or like function.Below by ginseng The embodiment for examining accompanying drawing description is exemplary, is only used for explaining the present invention, and is not considered as limiting the invention.
In the description of the invention, it is to be understood that term " first ", " second " are only used for describing purpose, and can not It is interpreted as indicating or implies relative importance or imply the quantity of the technical characteristic indicated by indicating.Thus, define " the One ", one or more feature can be expressed or be implicitly included to the feature of " second ".In description of the invention In, " multiple " are meant that two or more, unless otherwise specifically defined.
In the description of the invention, it is necessary to illustrate, unless otherwise clearly defined and limited, term " installation ", " phase Even ", " connection " should be interpreted broadly, for example, it may be being fixedly connected or being detachably connected, or be integrally connected;Can To be mechanical connection or electrical connection or can be in communication with each other;Can be joined directly together, can also be by between intermediary Connect connected, can be connection or the interaction relationship of two elements of two element internals.For the ordinary skill of this area For personnel, the concrete meaning of above-mentioned term in the present invention can be understood as the case may be.
Following disclosure provides many different embodiments or example is used for realizing the different structure of the present invention.In order to Simplify disclosure of the invention, hereinafter to the parts of specific examples and be set for describing.Certainly, they are only example, and And purpose does not lie in the limitation present invention.In addition, the present invention can in different examples repeat reference numerals and/or reference letter, This repetition is for purposes of simplicity and clarity, itself not indicate between discussed various embodiments and/or setting Relation.In addition, the invention provides various specific techniques and material examples, but those of ordinary skill in the art can be with Recognize the application of other techniques and/or the use of other materials.
It please join Fig. 1, a kind of compton backscattering detection means 100 of embodiment of the present invention, including penetrate source 1, collimation group Part 10 and probe assembly 20.
Collimator assembly 10 is arranged on the emitting light path in the source of penetrating 1, penetrate source 1 be used for launch detect ray to collimator assembly 10, Collimator assembly 10 is used to detection ray being collimated into spot light ray 41 and spot light ray 41 is irradiated to the table of measured object 5 Face.
Probe assembly 20 is used to receive by the scattered ray 42,43 of the surface scattering of measured object 5, and probe assembly 20 is used for will Scattered ray 42,43 is received as high-energy ray and low energy ray, and forms the first image according to high-energy ray, and is penetrated according to low energy Line forms the second image.
Therefore, above-mentioned compton backscattering detection means 100, the back scattering figure of two energy can be obtained simultaneously online Picture, in this way, above-mentioned compton backscattering detection means 100 adds signal all the way, can be with side by follow-up image procossing Just the dangerous substance in organic matter is distinguished, and processing speed is faster, can be widely applied to safety inspection field.
Specifically, the compton backscattering detection means 100 of embodiment of the present invention using flying-spot scanner structure and The reception scheme of dual intensity ray, the single point signals of two different-energies can be obtained at each moment, and be believed using two single-points Number the first image and the second image are formed respectively.
Subsequently in the processing procedure of the first image and the second image, the first image and the second image synthesize a width dual intensity Image, the then judgement according to gray value and R values can distinguish Hazardous organics.
In embodiments of the present invention, the first image can be regarded as high energy image, and the second image can be regarded as low energy image.
In some embodiments, Fig. 1 please be join, compton backscattering detection means 100 includes low energy optical filter 11, low energy Optical filter 11 is arranged in the light path between the source of penetrating 1 and collimator assembly 10.
In this way, coherent scattering of the measured object 5 to low energy ray can be prevented and the Compton scattering generation interference to high energy.
Specifically, low energy optical filter 11 can use the material larger to detection ray (such as X ray) absorption to be made, especially Metallics, such as aluminium, copper metal.
Penetrate after the detection ray that source 1 is sent first passes through low energy optical filter 11 and enter back into collimator assembly 10.It can so detect Before ray enters collimator assembly 10, the low energy signal for detecting ray is filtered out.
In some embodiments, Fig. 1 please be join, probe assembly 20, which includes first single list of energy detector 61 and second, to be detected Device 62, first single single energy detector 62 of energy detector 61 and second is symmetrical centered on penetrating source 1, and the first list can detector 61 For receiving high-energy ray and forming the first image according to high-energy ray, second single energy detector 62 is used to receive low energy ray simultaneously Second image is formed according to low energy ray.
In this way, realize probe assembly 20 is received as high-energy ray and low energy ray by scattered ray.
Specifically, first single energy detector 61 and the first angle penetrated between source 1, and the second single energy detector 62 and She Yuan The second angle between 1 can be set according to the actual requirements and specifically, and the first angle is equal with the second angle.
In some embodiments, the light incident side of second single energy detector 62 is provided with filtering metal piece.
In this way, the power spectrum of ray received by first single single energy detector 62 of energy detector 61 and second is realized in the presence of poor It is different.
Specifically, the material of filtering metal piece may be selected from the materials such as copper or aluminium.When receiving scattered ray, the first list can be visited Device 61 is surveyed directly to receive scattered ray 42 as high-energy ray and form the first image.For example, high-energy ray is whole energy spectrums Ray signal.
Into second it is single can the scattered ray 43 of detector 62 first pass through filtering metal piece and be changed into low energy ray, then by the Two single energy detectors receive low energy ray and form the second image.
In some embodiments, first it is single can detector 61 include primary scintillator and the first photomultiplier, first Scintillator and the first photomultiplier are set gradually along the input path of high-energy ray;
Second single energy detector 62 includes secondary fluor and the second photomultiplier, secondary fluor and the second photoelectricity times Increase pipe to set gradually along the input path of low energy ray.
In this way, the ray received can be converted into visible ray and be received by photomultiplier by scintillator, to be formed with realizing First image and the second image.
Specifically, primary scintillator and the optional material such as cesium iodide or sodium iodide of secondary fluor are made.First is single The single energy detector 62 of energy detector 61 and second can use the single point detector of high sensitivity and large area.
In some embodiments, Fig. 1 and Fig. 2 please be join, collimator assembly 10 includes being arranged in the light path of detection ray Fixed slit collimater 2 and rotary collimator 3, fixed slit collimater 2 offer single first slit 21, rotary collimator 3 Multiple second slits 31 that the pivot O of spinning collimater 3 radially distributes are offered, fixed slit collimater 2 exists Orthographic projection on rotary collimator 3 is between adjacent the second slit of two of which 31 and narrow with adjacent two of which second The interval of seam 31.
In this way, the formation of spot light ray 41 just can be realized using better simply structure.
Specifically, in embodiments of the present invention, the emergent light of fixed slit collimater 2 and rotary collimator 3 along source of penetrating 1 Road is set gradually, that is to say, that is penetrated the detection ray that source 1 is sent and is first passed through fixed slit collimater 2, enters back into rotary collimator 3.In other embodiments, the emitting light path of rotary collimator and fixed slit collimater along source of penetrating is set gradually, that is, Say, the detection ray that the source of penetrating is sent first passes through rotary collimator, enters back into fixed slit collimater.
In the example of fig. 1, the intensity distribution of the detection ray sent by penetrating source 1 is taper, and detection ray passes through low energy After optical filter 11 filters out low energy ray, line style distribution can be collimated into by fixed slit collimater 2 first, is then collimated by rotating Device 3 is collimated into some source rays.
In one example, fixed slit collimater 2 offers the cuboid of the light-permeable of the first slit 21 for centre, long Cube internal layer is lead layer, and outer layer is stainless steel layer.
In embodiments of the present invention, multiple second slits 31 are uniformly to be opened on rotary collimator 3, that is to say, that The axis angle of arbitrary two neighboring second slit 31 is equal, and in the figure 2 example, the quantity of the second slit 31 is 6, and 6 Individual second slit 31 is uniformly opened on rotary collimator 3, and the axis angle of arbitrary two neighboring second slit 31 is 60 degree.
In one example, rotary collimator 3 can be metallic plate, and the thickness of metallic plate is more than or equal to 5mm, it is ensured that detection Ray can not penetrate.The material of metallic plate may be selected from metal material of the atomic number more than iron.
Orthographic projection of the fixed slit collimater 2 on rotary collimator 3 is spaced with adjacent the second slit of two of which 31, It ensure that non-intersect between fixed slit collimater 2 and two neighboring second slit 31 of rotary collimator 3.
In some embodiments, rotary collimator 3 is in the form of annular discs, and fixed slit collimater 2 is perpendicular to rotary collimator 3 Radial direction set.
It so, it is possible so that the fixed slit collimater 2 between two neighboring second slit 31 reaches larger length, So that the first slit 21 has larger length, be advantageous to the formation of spot light ray 41.The radius of rotary collimator 3 can root Depending on size according to measured object 5.
In some embodiments, orthographic projection of the fixed slit collimater 2 on rotary collimator 3 and rotary collimator 3 The ultimate range that can reach for distance of the distance between center O.
The marginal position for making fixed slit collimater 2 be positioned close to rotary collimator 3 as much as possible is so, it is possible, is had Beneficial to the length for increasing the slit 21 of fixed slit collimater 2 and first.
Specifically, Fig. 2 please be join, fixed slit collimater 2 is set close proximity to the marginal position of rotary collimator 3, and far From the pivot O of rotary collimator 3, and the orthographic projection of fixed slit collimater 2 is located on rotary collimator 3, is not above Rotary collimator 3.
In some embodiments, the width of each second slit 31 gradually increases from the center O of rotary collimator 3 to periphery Add.
In this way, realize the structure function of rotary collimator 3.
Specifically, in one example, the angle of two sides of the second slit 31 is less than or equal to 3 degree.
In some embodiments, compton backscattering detection means 100 includes device for transporting objects 7, material conveying dress 7 are put to be used to place and convey measured object 5 to the light path of spot light ray 41.
In this way, realize the safety on line audit function of compton backscattering detection means 100.
In some embodiments, Fig. 3 please be join, compton backscattering detection means 100 includes image processing apparatus 8, figure As processing unit 8 for the first image of processing and the second image to obtain composograph, and composograph is analyzed to judge to be tested Whether thing 5 is danger.
In this way, realize the safety inspection to measured object 5 using image processing techniques.
Specifically, in the example of fig. 3, the single energy detector 61 and second of the connection of image processing apparatus 8 first is single to detect Device 62 is with the first image of reception and the second image.Image processing apparatus 8 can be using the associated picture treatment technology of this area come real The safety inspection of existing measured object 5, is no longer developed in details herein.
When the compton backscattering detection means 100 shown in Fig. 1 and Fig. 3 works, measured object 5 is placed on material conveying dress Put in 7 transmission belt and be transported in the light path of spot light ray 41.Penetrate the transmitting of source 1 detection ray, fixed slit collimater 2 Fixed, rotary collimator 3 rotates.In one example, the rotary speed of rotary collimator 3 is more than or equal to 500 revs/min, more Excellent, rotary speed is more than or equal to 1000 revs/min.
By rotary collimator 3 collimation after spot light ray 41 be irradiated to measured object 5 surface a little on, measured object 5 Illuminated point will send scattered ray 42,43, respectively by first it is single can detector 61 and second it is single can detector 62 receive.
Rotary collimator 3 rotates the point for be irradiated on measured object 5 and constantly moved, single for each point of irradiation, first Can detector 61 and second it is single can detector 62 detect a ray signal simultaneously, image processing apparatus 8 according to it is certain when Sequence arranges these signaling points, you can obtains a double-colored color composograph of puppet.
Then image processing apparatus 8 judges whether the organic matter of measured object 5 is dangerous material, and first step list can scatter in two steps Grey scale signal threshold decision, when grey scale signal value is more than or equal to T1, image processing apparatus 8 is judged as organic matter, second step, The back scattering ray signal of two energy is made into R values and calculates (a kind of conventional algorithm of dual-energy transmission imaging), obtains measured object 5 Low energy and high energy absorption coefficient ratio, the R values of Hazardous organics are relatively low, therefore, when R values are less than or equal to T2, image procossing Device 8 is judged as Hazardous organics.
Threshold value T1 and T2 can be set according to the actual requirements and specifically.
In some embodiments, Fig. 4 compton backscattering detection means 200 please be join, probe assembly 20 includes first The list energy detector 65 of list energy detector 64 and second, first single list energy detector 65 of energy detector 64 and second is relative to source of penetrating 1 It is placed in different angles, first single energy detector 64 is used to receive high-energy ray and forms the first image according to high-energy ray, Second single energy detector 65 is used to receive low energy ray and forms the second image according to low energy ray.
In this way, realize probe assembly 20 is received as high-energy ray and low energy ray by scattered ray 45,46.
Specifically, by the scattered signal that compton backscattering detection means 200 is detected is Compton scattering signal, and Compton scattering energy defers to formula:Wherein θ be scattering light angle, E0For incident ray Energy, EθIt is as shown in Figure 5 for the energy of scattered ray, its scattering principle figure.
Therefore, the angle of the energy of scattered ray 45,46 and scattering light has direct association.Embodiment of the present invention is exactly Based on this principle, i.e., first single single energy detector 65 of energy detector 64 and second is placed in the homonymy of the source of penetrating 1 or both sides, first is single The single energy detector 65 of energy detector 64 and second is placed in relative to source of penetrating 1 in different angles, and first single energy detector 64 is with penetrating The angle of the detection loose wire in source 1 is less than second single energy detector 65 and the angle for the detection loose wire for penetrating source 1 so that the first list can be visited It is high-energy ray to survey the scattered ray 45 that device 64 receives, and the scattered ray 46 that second single energy detector 65 receives is penetrated for low energy Line.It is preferred that the angle of detection loose wire of the first single energy detector 64 with penetrating source 1 is small as much as possible.
In one example, the angle a between first single single energy detector 65 of energy detector 64 and second is more than 20 degree, from And first single single energy detector 65 of energy detector 64 and second is caused to be collected into the scattered ray of different-energy.
It is pointed out that in the compton backscattering detection means 200 shown in Fig. 4, penetrate source 1, collimator assembly 10 and The embodiment of some increased elements and device can join to be implemented corresponding to the compton backscattering detection means 100 shown in Fig. 1 Mode, no longer it is developed in details herein.The inspection principle of compton backscattering detection means 200 shown in Fig. 4 can also join shown in Fig. 1 Embodiment compton backscattering detection means 100 corresponding to declaratives, be no longer developed in details herein.
In some embodiments, Fig. 6 compton backscattering detection means 300 please be join, probe assembly 20 includes photon Digital detector 63, photon counting detector 63 be used for by set energy threshold by scattered ray 44 be received as high-energy ray and Low energy ray, and the first image is formed according to high-energy ray, and the second image is formed according to low energy ray.
In this way, realize probe assembly 20 is received as high-energy ray and low energy ray by scattered ray 44.
Specifically, the receiving side signal formula of the compton backscattering detection means 300 of embodiment of the present invention is using single Individual attribute detector replaces two single energy detectors of aforementioned embodiments.
Photon counting detector 63 is a kind of new detector, and its general principle is that the ray of different-energy incides light When on sub-count detector 63, caused number of photons is different, by several number of photons number may know that the energy of ray, therefore The ray energy of incidence can be divided into high-energy ray part and low energy by setting energy threshold to photon counting detector 63 Ray portion to be exported and be formed the first image and the second image respectively.Photon counting detector 63 can detect single-point Scattered signal, the complete dual intensity image of object can be obtained by way of scanning.
It is pointed out that in the compton backscattering detection means 300 shown in Fig. 6, penetrate source 1, collimator assembly 10 and The embodiment of some increased elements and device can join to be implemented corresponding to the compton backscattering detection means 100 shown in Fig. 1 Mode, no longer it is developed in details herein.The inspection principle of compton backscattering detection means 300 shown in Fig. 6 can also join shown in Fig. 1 Embodiment compton backscattering detection means 100 corresponding to declaratives, be no longer developed in details herein.
In the description of this specification, reference term " embodiment ", " some embodiments ", " schematically implementation The description of mode ", " example ", " specific example " or " some examples " etc. means with reference to the embodiment or example description Specific features, structure, material or feature are contained at least one embodiment or example of the present invention.In this specification In, identical embodiment or example are not necessarily referring to the schematic representation of above-mentioned term.Moreover, the specific spy of description Sign, structure, material or feature can combine in an appropriate manner in any one or more embodiments or example.
In addition, term " first ", " second " are only used for describing purpose, and it is not intended that instruction or hint relative importance Or the implicit quantity for indicating indicated technical characteristic.Thus, define " first ", the feature of " second " can be expressed or Implicitly include at least one this feature.In the description of the invention, " multiple " are meant that at least two, such as two, three It is individual etc., unless otherwise specifically defined.
Although embodiments of the present invention have been shown and described above, it is to be understood that above-mentioned embodiment is Exemplary, it is impossible to limitation of the present invention is interpreted as, one of ordinary skill in the art within the scope of the invention can be right Above-mentioned embodiment is changed, changed, replacing and modification.

Claims (14)

  1. A kind of 1. compton backscattering detection means, it is characterised in that including penetrating source, collimator assembly and probe assembly, the collimation Component is arranged on this and penetrated on the emitting light path in source, this penetrate source be used for launch detection ray to the collimator assembly, collimator assembly use In the detection ray is collimated into spot light ray and by the spot light radiation exposure to the surface of measured object, the probe assembly is used In receiving by the scattered ray of the surface scattering of the measured object, the probe assembly is used to the scattered ray being received as high-energy ray And low energy ray, and the first image is formed according to the high-energy ray, and the second image is formed according to the low energy ray.
  2. 2. compton backscattering detection means as claimed in claim 1, it is characterised in that the compton backscattering detection means Including low energy optical filter, the low energy optical filter is arranged on this and penetrated in the light path between source and the collimator assembly.
  3. 3. compton backscattering detection means as claimed in claim 1, it is characterised in that the probe assembly includes first single energy Detector and second it is single can detector, this first it is single can detector and this second it is single can detector by this penetrate source centered on symmetrically divide Cloth, first single energy detector are used to receive the high-energy ray and form first image according to the high-energy ray, second list Energy detector is used to receive the low energy ray and form second image according to the low energy ray.
  4. 4. compton backscattering detection means as claimed in claim 3, it is characterised in that the light of second single energy detector enters Penetrate end and be provided with filtering metal piece.
  5. 5. compton backscattering detection means as claimed in claim 1, it is characterised in that the probe assembly includes first single energy Detector and the second list energy detector, first single energy detector and second single energy detector penetrate source relative to this and are placed in difference Angle on, this first it is single can detector be used to receive the high-energy ray and form first image according to the high-energy ray, should Second single energy detector is used to receive the low energy ray and form second image according to the low energy ray.
  6. 6. compton backscattering detection means as claimed in claim 5, it is characterised in that this first it is single can detector and this Angle between two single energy detectors is more than 20 degree.
  7. 7. the compton backscattering detection means as described in claim 3 or 5, it is characterised in that first single energy detector bag Include primary scintillator and the first photomultiplier, the primary scintillator and the incidence of first photomultiplier along the high-energy ray Light path is set gradually;
    Second single energy detector includes secondary fluor and the second photomultiplier, the secondary fluor and second photoelectricity times Increase pipe to set gradually along the input path of the low energy ray.
  8. 8. compton backscattering detection means as claimed in claim 1, it is characterised in that the probe assembly includes photon counting Detector, the photon counting detector is for by setting, the scattered ray to be received as the high-energy ray by energy threshold and this is low Energy ray, and first image is formed according to the high-energy ray, and second image is formed according to the low energy ray.
  9. 9. the compton backscattering detection means as described in claim any one of 1-8, it is characterised in that the collimator assembly includes Fixed slit collimater and the rotary collimator being arranged in the light path of the detection ray, the fixed slit collimater offer list Individual first slit, the rotary collimator offer radially distributed from the pivot of the rotary collimator it is multiple second narrow Seam, the orthographic projection of the fixed slit collimater on the rotary collimator be located between adjacent two of which second slit and The two of which adjacent with this second slit separation.
  10. 10. compton backscattering detection means as claimed in claim 9, it is characterised in that the rotary collimator is in the form of annular discs, The fixed slit collimater is set perpendicular to the radial direction of the rotary collimator.
  11. 11. compton backscattering detection means as claimed in claim 9, it is characterised in that the fixed slit collimater is at this The ultimate range that the distance between center of orthographic projection and the rotary collimator on rotary collimator can reach for the distance.
  12. 12. compton backscattering detection means as claimed in claim 9, it is characterised in that the width of each second slit Gradually increase from the center of the rotary collimator to periphery.
  13. 13. compton backscattering detection means as claimed in claim 1, it is characterised in that compton backscattering detection dress Put including device for transporting objects, the device for transporting objects is used to place and convey the measured object to the light path of the spot light ray On.
  14. 14. compton backscattering detection means as claimed in claim 1, it is characterised in that compton backscattering detection dress Put including image processing apparatus, the image processing apparatus is used to handle first image and second image to obtain composite diagram Picture, and the composograph is analyzed to judge whether the measured object is danger.
CN201610794109.6A 2016-08-31 2016-08-31 Compton backscattering detection means Pending CN107797155A (en)

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CN111735837A (en) * 2020-06-22 2020-10-02 中国辐射防护研究院 X-ray backscatter detection device for inspecting defects in pipeline
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