CN107608883B - Extraction method of software defect description key elements - Google Patents
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Abstract
The present disclosure provides a method for extracting software defect description key elements, which includes the following steps: s1, decomposing original defect data and extracting defect elements; s2, establishing an element matrix according to the extracted defect elements, and decomposing and describing original defect data according to the element matrix; s3, comparing the difference between the original defect data and the defect data described by the element matrix; and S4, optimizing the element matrix model based on the difference, screening defect elements, and determining key elements for software defect description. The present disclosure also provides a machine-readable recording medium. The extraction method of the software defect description key elements establishes a relatively standard description method, and avoids the defects that the conventional defect description method depends on the experience of testers, has strong subjectivity, incomplete description, fuzziness or difficulty in understanding, description containing various types of information, unobtrusive key problems and the like.
Description
Technical Field
The disclosure relates to the technical field of software defects, in particular to a method for extracting key elements of software defect description.
Background
The software defect description is an important attribute of the software defect and is an important basis for positioning the risk of the software system. However, the existing defect description method mainly depends on the experience of testers, has strong subjectivity, and has the defects of incomplete description, vagueness or difficulty in understanding, description containing various types of information, no emphasis on problems and the like. Therefore, how to implement the unified specification of the software defect description is a problem which needs to be solved in the field of software defects at present.
Disclosure of Invention
Technical problem to be solved
In view of the technical problems, the present disclosure provides a method for extracting key elements of software defect description, and establishes a description method with relative specifications, so as to avoid the defects that the existing defect description method relies on experience of testers, has strong subjectivity, incomplete description, fuzziness or difficulty in understanding, description containing various types of information, and no key problem is highlighted.
(II) technical scheme
According to one aspect of the present disclosure, there is provided a method for extracting software defect description key elements, including the following steps: s1, decomposing original defect data and extracting defect elements; s2, establishing an element matrix according to the extracted defect elements, and decomposing and describing original defect data according to the element matrix; s3, comparing the difference between the original defect data and the defect data described by the element matrix; and S4, optimizing the element matrix model based on the difference, screening defect elements, and determining key elements for software defect description.
In some embodiments of the present disclosure, the method for extracting software defect description key elements further includes, after the step S5, analyzing correlations between the defect elements to determine the software defect description key elements.
In some embodiments of the present disclosure, before the step S1, the method further includes: converting n original defect description data into a matrix form to obtain a matrix b:
in the formula, bi,1Representing the ith piece of original defect description data; i is 1,2,3 … … n.
In some embodiments of the present disclosure, the step S1 includes the following sub-steps: s11, extracting b from the matrix b1,1Decomposing the data according to the natural language description, and extracting a plurality of defect elements; s12, judging the plurality of defective elements one by one: if the element does not exist, newly building the element; if yes, adding 1 to the hit frequency of the element; s13, repeating the steps S11 and S12 until traversing to b in the matrix bn,1Data, extracting all defect elements x1,1，x2,1，x3,1……，xm,1Wherein m is the total number of extracted defect elements; and counting the hit times of each element.
In some embodiments of the present disclosure, the step S2 includes: s21, extracting all the defect elements x1,1，x2,1，x3,1……，xm,1Forming a matrix to obtain an element matrix x, wherein the dimension of the matrix x is dim (x), and dim (x) is m;
s22, will be composed of the original defectEach piece of data b in matrix b composed of datai,1Decomposing the description according to the elements in the x matrix to form a matrix A:
in some embodiments of the present disclosure, in the step S3, the difference between the original defect data and the defect data described by the element matrix is determined by an energy function, and the defined energy function is: e (x) | | | Ax-b | + C · dim (x); wherein C is an element x in the x matrixi,1A critical value of the number of uses in the n defect data;
which represents the difference between the defect data Ax described by the element matrix and the original defect data b if the defect data Ax described by the element matrix and the original defect data bi,1When there is a difference, then ri,1If there is no difference, r is 1i,10; i Ax-b I represents all ri,jSum of absolute value additions.
In some embodiments of the present disclosure, the step S4 includes the following sub-steps: s41, selecting element x from element matrix xi,1The value of i starts from 1; s42, if xi,1Hit count t of elementiIf less than C, rejecting element xi,1Subtracting 1 from the value of dim (x), and calculating E (x) | | | | Ax-b | + C · dim (x) to obtain Ei(x) Then, add 1 to the value of i, return to step S41; if tiIf the value is larger than C, directly adding 1 to the value of i, and returning to the step S41; s43, repeating the steps S41 and S42 until the value of i is m, and traversing all elements of the matrix x until x is reachedm,1(ii) a S44, comparing all Ei(x) Determining the min (E (x)) value and the element set which minimizes the value of E (x); s45, the element set for minimizing e (x) in the x matrix is output.
In some embodiments of the present disclosure, the step S5 includes the following sub-steps: s51, forming moments of original defect dataEach piece of data b in array bi,1Decomposing and describing the elements in the element set output in the step S45 to obtain a matrix A1(ii) a S52, according to the matrix A1Mapping to establish matrix Y, in matrix A1Optionally selecting the f column, wherein the value of f is from 1; if the matrix A is1Any element a in the middle f columni,f(1. ltoreq. i. ltoreq. n) is null, then let y i,f0; otherwise, let yiF is 1; i, sequentially taking integer values from 1, repeating the step until i is equal to n, and turning to the next step; s53, f adds 1, repeats step S52 until f equals m, traverses matrix a1All the elements in the array are output as a matrix Y; s54, arbitrarily selecting h and g row elements (1 is less than or equal to h, g is less than or equal to m, and h is not equal to g) from the matrix Y, calculating a function CORREL (h row element, g row element), and obtaining the correlation cor of h and g rowh,g(ii) a If correlation corh,gIf a threshold condition is met, marking and recording x matrix elements corresponding to the h-th and g-th columns; s55, taking integer values from 1, h ≠ g, and repeating steps S54 to h ═ m; and S56, analyzing all the x matrix elements recorded after the substeps S54 and S55, further analyzing and combining the elements with similar expression meanings and repeated semantics, and outputting the final elements of the x matrix.
In some embodiments of the disclosure, if corh,g>0.8, the x matrix elements corresponding to the h-th and g-th columns are marked and recorded.
According to another aspect of the present disclosure, there is also provided a machine-readable recording medium, which when executed, causes a machine to implement the method of extracting software defect description key elements.
(III) advantageous effects
According to the technical scheme, the extraction method of the key elements of the software defect description has at least one of the following beneficial effects:
(1) the method extracts common elements in the defect description by establishing a defect description model based on a matrix, and selects key elements in the defect description by using a mathematical optimization method, thereby being beneficial to realizing the standardization of the software defect description.
(2) According to the extraction method of the defect description key elements, relevance analysis is performed on the elements, applicability of the elements is improved, and repetition rate among the elements is reduced.
(3) The method for extracting the key elements for defect description provides guidance for a tester to describe software defects by extracting the key elements commonly used in the defect description, establishes a relatively standard description method, and avoids the defects that the conventional defect description method depends on the experience of the tester, has strong subjectivity, incomplete description, fuzziness or difficulty in understanding, description containing various types of information, unobtrusive key problems and the like.
Drawings
The above and other objects, features and advantages of the present disclosure will become more apparent from the accompanying drawings. Like reference numerals refer to like elements throughout the several views of the drawings. The drawings are not intended to be to scale as practical, emphasis instead being placed upon illustrating the subject matter of the present disclosure.
FIG. 1 is a flowchart illustrating a method for extracting key elements of software defect description according to an embodiment of the present disclosure
FIG. 2 is another flowchart illustrating a method for extracting key elements of a software defect description according to an embodiment of the disclosure.
Detailed Description
For the purpose of promoting a better understanding of the objects, aspects and advantages of the present disclosure, reference is made to the following detailed description taken in conjunction with the accompanying drawings.
The present disclosure provides a method for extracting software defect description key elements. FIG. 1 is a flow chart of the extraction method of the key elements of the software defect description of the present disclosure. As shown in fig. 1, the method for extracting the key elements of the software defect description includes the following steps:
s1, decomposing original defect data and extracting defect elements;
s2, establishing an element matrix according to the extracted defect elements, and decomposing and describing original defect data according to the element matrix;
s3, comparing the difference between the original defect data and the defect data described by the element matrix;
and S4, optimizing the element matrix model based on the difference, screening defect elements, and determining key elements for software defect description.
Further, the method for extracting the key elements for describing the software defects may further include, in step S5, after the screening, analyzing correlations between the defect elements to determine the key elements for describing the software defects.
Referring to fig. 2, the method for extracting the software defect description key elements of the present disclosure is described in detail below, and as shown in fig. 2, the method for extracting the software defect description key elements includes:
s1, decomposing original defect data, extracting defect elements:
n pieces of original defect description data are combined into a matrix form:
in the formula, bi,1Representing the ith original defect description data, namely the ith original defect description statement; i is 1,2,3 … … n.
And decomposing the original defect data in the matrix b according to the natural language description, and extracting elements. The element extraction method comprises the following substeps:
s11, extracting b from the matrix b1,1The data is decomposed according to the description of natural languages (including English, Chinese and Japanese, wherein Chinese is mainly adopted), and is extracted and summarized into a plurality of defect elements;
s12, judging the plurality of elements one by one: if the element does not exist, a new element is created; if yes, adding 1 to the hit frequency of the element;
s13, repeating the above steps S11 and S12 until traversing to bn,1Extracting all defect elements x1,1，x2,1，x3,1……，xm,1(where m is the total number of extracted defect elements); counting the hit times of all the elements;
the following description takes financial software defect description as an example:
suppose a first defect b1,1The defect is 'opening the card on the counter, inputting 6-bit error passwords, reporting' success of opening the card ',' analyzing the defect, reproducing the defect, needing to input 6-bit error passwords, and extracting the element of newly-built 'input item'; reproducing defects requires page operations: inputting a password, and clicking to determine, thereby extracting the element of newly building a 'reproduction process'; the operation result is successful card opening, and new conclusion elements can be extracted.
Suppose a second defect b2,1The "query, start and stop time field, when the deadline is less than the start time, the system is not checked". Reproducing this defect also requires an entry: start, end time, so the number of hits for an "entry" element adds 1; the hit times of the element of the operation process, the 'recurrence process' is added with 1; the premise of inquiring record is needed for reproducing the defect at the same time, and a 'reproduction premise' element is newly established.
S2, establishing an element matrix x according to the extracted defect elements, and decomposing and describing the original defect data to obtain a matrix a, specifically, the method includes the following sub-steps:
s21, forming a matrix from all the elements extracted above, to obtain an element matrix x:
the dimension of the matrix x is dim (x), that is, the number of elements included in the matrix x, and the dimension dim (x) of the matrix x is m.
S22, forming each piece of data b in b matrix by original defect datai,1And (3) decomposing and describing according to elements in the x matrix, and forming a new matrix A by the obtained result:
continuing with the first defect and the second defect as an example, by extracting, an element matrix can be obtained:
decomposing the original defects according to the element matrix to obtain:
s3, comparing the difference between the original defect and the defect described by the element matrix:
comparing whether the defect described by the element matrix and the original defect have difference or not through an energy function, wherein the energy function is defined as: e (x) | | Ax-b | + C · dim (x), where a, x, b, dim (x) have the same meaning as described above, and Ax-b represents the difference between the defect data Ax described by the element and the original defect data b.
If the original defect data bi,1If there is a difference from the defect description consisting of Ax, then r i,11 is ═ 1; if there is no difference, r i,10. I Ax-b I represents all ri,jSum of absolute value additions. C is a certain element x in the x matrixi,1The value of C is determined by combining the tolerance of the defect element, for example, 0.5%, and the value of C may specifically be taken as 0.5% n, for example, when the total number of defects n is 1000, C is 5. When the number of hits of a defective element is less than 5, the element is considered to be negligible.
S4, based on the difference, optimizing an element matrix model, screening elements, and determining key elements of software defect description:
after the defect description elements are extracted, the model is used for optimization, the elements are screened, and the final elements with wide application range and strong applicability are determined. As seen from step S1, first, m elements are extracted from the matrix x, and dim (x) is m; and the number of hits per element is statistically known. The specific optimization process comprises the following substeps:
s41, selecting element x from matrix xi,1The value of i starts from 1;
s42, if xi,1Hit count t of elementiIf less than C, rejecting element xi,1Subtracting 1 from the value of dim (x), and calculating E (x) | | | | Ax-b | + C · dim (x) to obtain Ei(x) Then, add 1 to the value of i, return to step S41; if tiIf the value is larger than C, directly adding 1 to the value of i and returning to the step S41;
s43, repeating the steps S41 and S42 until the value of i is m, and traversing all elements of the matrix x until x is reachedm,1；
S44, comparing all Ei(x) Determining the min (E (x)) value and the element set which minimizes the value of E (x);
and S45, outputting the element set which minimizes E (x) in the x matrix, and obtaining the key elements of the software defect description.
The key defect description elements with high use frequency and wide applicability are basically determined through the steps. However, in order to further improve the applicability of the elements and reduce the repetition rate among the elements, correlation analysis can be further performed on the elements.
That is, preferably, the method for extracting the software defect description key element may further include, in step S5, further analyzing the correlation between the elements, and determining the final element matrix, that is, obtaining the software defect description key element:
matrix A is paired with CORREL (array1, array2) function of WPS table1And (6) carrying out analysis. The method specifically comprises the following substeps:
s51, using element set minimizing E (x) in original defect matrix b and x matrix outputted in step S45, decomposing and describing original defect data according to step S2 to obtain new matrix A1I.e. each piece of data b in a matrix b composed of original defect datai,1Decomposing the description according to the elements in the element set output in the step S45 to obtainMatrix A1；
S52, according to the matrix A1Mapping to establish matrix Y, in matrix A1Optionally selecting the f column, wherein the value of f is from 1; if the matrix A is1Any element a in the middle f columni,f(1. ltoreq. i.ltoreq.n) is null (e.g. an element that does not require an "entry" for a deleted defect, the element does not fill anything for the defect, is null), let y bei,f0; otherwise, let y i,f1 is ═ 1; i, sequentially taking integer values from 1, repeating the step until i is equal to n, and turning to the next step;
s53, f adds 1, repeats step S52 until f equals m, traverses matrix a1All the elements in the array are output as a matrix Y;
s54, randomly selecting the h-th and g-th column elements (1 ≦ h, g ≦ m, and h ≠ g) from the matrix Y. Calculating a function CORREL (h column element, g column element) to obtain the correlation cor between h column and g columnh,g(ii) a If corh,g>0.8, marking and recording the x matrix elements corresponding to the h and g columns;
s55, taking integer values from 1, h ≠ g, and repeating steps S54 to h ═ m;
s56, analyzing the elements in the minimum element set x matrix recorded after the steps S54 and S55, and further analyzing and merging the elements with similar expression meanings and repeated semantics; and outputting a final element set x matrix.
In summary, the method for extracting the key elements of the software defect description extracts the common elements in the defect description by establishing the defect description model based on the matrix, and selects the key elements by using the mathematical optimization method, so as to provide guidance for the testers to describe the software defects, and help to establish the standardization rules for describing the software defects.
In addition, the present disclosure also provides a machine-readable recording medium, wherein the machine executable instructions, when executed, cause a machine to implement the method for extracting the software defect description key elements.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
It is to be noted that, in the attached drawings or in the description, the implementation modes not shown or described are all the modes known by the ordinary skilled person in the field of technology, and are not described in detail. Further, the above definitions of the various elements and methods are not limited to the various specific structures, shapes or arrangements of parts mentioned in the examples, which may be modified or substituted by one of ordinary skill in the art.
The above-mentioned embodiments are intended to illustrate the objects, aspects and advantages of the present disclosure in further detail, and it should be understood that the above-mentioned embodiments are only illustrative of the present disclosure and are not intended to limit the present disclosure, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present disclosure should be included in the scope of the present disclosure.
Claims (6)
1. A method for extracting software defect description key elements comprises the following steps:
step S1, decomposing original defect data and extracting defect elements;
step S2, establishing an element matrix according to the extracted defect elements, and decomposing and describing original defect data according to the element matrix;
step S3 of comparing the difference between the original defect data and the defect data described by the element matrix;
step S4, based on the difference, optimizing an element matrix model, screening defect elements, and determining key elements for software defect description;
wherein, before the step S1, the method further includes: converting n original defect description data into a matrix form to obtain a matrix b:
in the formula, bi，1Representing the ith piece of original defect description data; 1,2,3 … … n;
the step S1 includes:
step S11, extracting b from the matrix b1，1Decomposing the data according to the natural language description, and extracting a plurality of defect elements;
step S12, determining the plurality of defective elements one by one: if the element does not exist, newly building the element; if yes, adding 1 to the hit frequency of the element;
step S13, repeating steps S11 and S12 until traversing to b in matrix bn，1Data, extracting all defect elements x1，1，x2，1，x3，1......，xm，1Wherein m is the total number of extracted defect elements; counting the hit times of each element;
the step S2 includes:
step S21, all the extracted defect elements x1，1，x2，1，x3，1......，xm，1Forming a matrix to obtain an element matrix x, wherein the dimension of the matrix x is dim (x), and dim (x) is m;
step S22, each piece of data b in matrix b composed of original defect datai，1Decomposing the description according to the elements in the matrix x to form a matrix A:
in said step S3, the difference between the original defect data and the defect data described by the element matrix is determined by an energy functionThe energy function is: e (x) | | | Ax-b | + C · dim (x); wherein C is an element x in the matrix xi，1A critical value of the number of uses in the n defect data;
which represents the difference between the defect data Ax described by the element matrix and the original defect data b if the defect data Ax described by the element matrix and the original defect data bi，1When there is a difference, then ri，1If there is no difference, r is 1i，10; i Ax-b I represents all ri，jSum of absolute value additions.
2. The method for extracting software defect description key elements according to claim 1, further comprising a step S5, after screening, analyzing the correlation between the defect elements to determine the software defect description key elements.
3. The method for extracting software defect description key elements according to claim 2, wherein said step S4 includes:
step S41, selecting element x from element matrix xi，1The value of i starts from 1;
step S42, if xi，1Hit count t of elementiIf less than C, rejecting element xi，1Subtracting 1 from the value of dim (x), and calculating E (x) | | | | Ax-b | + C · dim (x) to obtain Ei(x) Then, add 1 to the value of i, return to step S41; if tiIf the value is larger than C, directly adding 1 to the value of i, and returning to the step S41;
and S43, repeating the steps S41 and S42 until the value of i is m, and traversing all elements of the matrix x until xm，1；
Step S44, compare all Ei(x) Determining the min (E (x)) value and the element set which minimizes the value of E (x);
step S45 is to output the element set that minimizes e (x) in the matrix x.
4. The method for extracting software defect description key elements according to claim 3, wherein said step S5 includes:
step S51, forming each piece of data b in matrix b of original defect datai，1Decomposing and describing the elements in the element set output in the step S45 to obtain a matrix A1；
Step S52, according to the matrix A1Mapping to establish matrix Y, in matrix A1Optionally selecting the f column, wherein the value of f is from 1; if the matrix A is1Any element a in the middle f columni，fIf it is null, i is greater than or equal to 1 and less than or equal to n, then let yi，f0; otherwise, let yi，f1 is ═ 1; i, sequentially taking integer values from 1, repeating the step until i is equal to n, and turning to the next step;
step S53, adding 1 to f, repeating step S52 until f equals m, traversing the matrix a1All the elements in the array are output as a matrix Y;
step S54, arbitrarily taking the h and g row elements from the matrix Y, wherein h is more than or equal to 1, g is more than or equal to m, and h is not equal to g, calculating a function CORREL, and obtaining the correlation cor between the h and the g rowh，g(ii) a If correlation corh，gIf a threshold condition is met, marking and recording x matrix elements corresponding to the h-th and g-th columns;
step S55, taking integer values in sequence from 1, and repeating steps S54 to m, where h is not equal to g;
and step S56, analyzing all the x matrix elements recorded after the steps S54 and S55, further analyzing and combining the elements with similar expression meanings and repeated semantics, and outputting the final elements of the x matrix.
5. The method for extracting key elements in software defect description according to claim 4, wherein if cor ish，gIf > 0.8, the x matrix element corresponding to the h-th and g-th columns is marked and recorded.
6. A machine-readable recording medium having stored thereon executable instructions, wherein the executable instructions, when executed, cause a machine to perform the method of any one of claims 1 to 5.
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| CN106570513A (en) * | 2015-10-13 | 2017-04-19 | 华为技术有限公司 | Fault diagnosis method and apparatus for big data network system |
| CN105718801A (en) * | 2016-01-26 | 2016-06-29 | 国家信息技术安全研究中心 | Loophole clustering method based on programming mode and mode matching |
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