CN107466369A - Fingerprint chip detecting method, apparatus and system - Google Patents
Fingerprint chip detecting method, apparatus and system Download PDFInfo
- Publication number
- CN107466369A CN107466369A CN201780000472.9A CN201780000472A CN107466369A CN 107466369 A CN107466369 A CN 107466369A CN 201780000472 A CN201780000472 A CN 201780000472A CN 107466369 A CN107466369 A CN 107466369A
- Authority
- CN
- China
- Prior art keywords
- fingerprint chip
- test
- testing
- result
- setting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
Abstract
The embodiments of the invention provide a kind of fingerprint chip detecting method, device, touch-screen development board and electric terminal, wherein, fingerprint chip detecting method includes：The test that control fingerprint chip repeats for testing the fingerprint chip service life instructs, until test result reaches setting exceptional condition and/or test reaches the setting testing time；According to operational factor of the fingerprint chip when test result reaches setting exceptional condition or test reaches the setting testing time, the testing result of the fingerprint chip is determined.By the embodiment of the present invention, detection efficiency is effectively improved, also, testing result is determined by corresponding operational factor so that testing result is more accurate, reduces detection error.
Description
Technical field
The present embodiments relate to chip detection technique field, more particularly to a kind of fingerprint chip detecting method, device and
System.
Background technology
The chip of living things feature recognition, such as fingerprint chip, because that can realize that the identification of terminal device user is verified,
It is widely used in terminal device.But with widely using for fingerprint chip, requirement to its product quality also more and more higher,
The service life of fingerprint chip is exactly a wherein important quality index.Because the electronic component in fingerprint chip normally makes
Its service life can be have impact on because the extraneous factor such as heating, air oxidation causes finally to damage during, therefore, needed
This quality index of life-span is used for before manufacture to be detected, it is full to determine if to meet target level of product quality
The use demand of sufficient user.
However, the quality testing to fingerprint chip is more by the way of artificial detection at present so that detection efficiency it is low and
Detection error is larger, and the production and use to fingerprint chip, which cause, to be had a strong impact on.
The content of the invention
The embodiment of the present invention provides a kind of fingerprint chip detection scheme, low to solve existing fingerprint chip detection scheme efficiency
The problem of lower and detection error is larger.
First aspect according to embodiments of the present invention, there is provided a kind of fingerprint chip detecting method, including：Control fingerprint core
The test that piece repeats for testing the fingerprint chip service life instructs, until test result reaches setting exceptional condition
And/or test reaches the setting testing time；Setting exceptional condition or test are reached in test result according to the fingerprint chip
Reach the operational factor during setting testing time, determine the testing result of the fingerprint chip.
Second aspect according to embodiments of the present invention, a kind of fingerprint chip-detecting apparatus is additionally provided, including：Test execution
Module, the test for controlling fingerprint chip to repeat for testing the fingerprint chip service life instructs, until test
As a result reach setting exceptional condition and/or test reaches the setting testing time；As a result determining module, for according to the fingerprint core
Operational factor of the piece when test result reaches setting exceptional condition or test reaches the setting testing time, determines the fingerprint
The testing result of chip.
The third aspect according to embodiments of the present invention, additionally provide a kind of fingerprint chip detecting system, including foundational development
Plate, fingerprint chip and adapter, wherein the foundational development plate is connected to the fingerprint chip, the base by the adapter
Plinth development board includes processing unit, and the fingerprint chip detecting method institute that the processing unit is used to perform as described in relation to the first aspect is right
The operation answered.
Fourth aspect according to embodiments of the present invention, a kind of computer-readable storage medium is additionally provided, it is described computer-readable
Storage medium is stored with：Test for controlling fingerprint chip to repeat for testing the fingerprint chip service life refers to
Order, until test result reaches setting exceptional condition and/or test reaches the executable instruction of setting testing time；For basis
Operational factor of the fingerprint chip when test result reaches setting exceptional condition or test reaches the setting testing time, really
The executable instruction of the testing result of the fixed fingerprint chip.
The fingerprint chip detection scheme provided according to embodiments of the present invention, by controlling fingerprint chip to repeat for surveying
The test instruction of fingerprint chip service life is tried, to detect the service life of fingerprint chip.If fingerprint chip is performing certain survey
During examination instruction, there is test result exception, then illustrate that exception occur in some or some electronic components of fingerprint chip, use the longevity
Life terminates, and then, by operational factor now, can further to causing fingerprint chip end of life the reason for carry out
Analysis, it is determined that final testing result；If fingerprint chip does not occur exception within the setting testing time, can be reached according to test
The operational factor during testing time is set, determines the state of fingerprint chip, assesses the service life of fingerprint chip accordingly, is obtained most
Whole testing result.It can be seen that by the scheme of the embodiment of the present invention, existing detection mode is compared to, effectively improves detection
Efficiency, also, testing result is determined by corresponding operational factor so that testing result is more accurate, reduces detection error.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
Some embodiments of invention, for those skilled in the art, without having to pay creative labor, can be with root
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the step flow chart according to a kind of fingerprint chip detecting method of the embodiment of the present invention one；
Fig. 2 is the step flow chart according to a kind of fingerprint chip detecting method of the embodiment of the present invention two；
Fig. 3 is the step flow chart according to a kind of fingerprint chip detecting method of the embodiment of the present invention three；
Fig. 4 is the environment schematic of the detection fingerprint chip in embodiment illustrated in fig. 3；
Fig. 5 is the structured flowchart according to a kind of fingerprint chip-detecting apparatus of the embodiment of the present invention four；
Fig. 6 is the structured flowchart according to a kind of fingerprint chip-detecting apparatus of the embodiment of the present invention five.
Embodiment
To enable goal of the invention, feature, the advantage of the embodiment of the present invention more obvious and understandable, below in conjunction with
Accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that retouched
The embodiment stated is only part of the embodiment of the embodiment of the present invention, and not all embodiments.Based on the embodiment in the present invention,
The every other embodiment that those of ordinary skill in the art are obtained under the premise of creative work is not made, belongs to this hair
The scope of bright embodiment protection.
Embodiment one
Reference picture 1, show a kind of step flow chart of according to embodiments of the present invention one fingerprint chip detecting method.
The fingerprint chip detecting method of the present embodiment comprises the following steps：
Step S102：Control fingerprint chip repeats the test instruction for test fingerprint chip service life, until
Test result reaches setting exceptional condition and/or test reaches the setting testing time.
In the embodiment of the present invention, fingerprint chip detecting method can be by having data in any appropriate terminal device
Manage device or the equipment realization of function, including but not limited to foundational development plate.
Wherein, the test instruction for test fingerprint chip service life can be by those skilled in the art according to actual need
Ask and be appropriately arranged with, fingerprint chip service life can be tested out.For example, upper electricity instructs, adopts figure instruction, identification instruction, dormancy
Instruction, cut-offing instruction, interruption report instruction, the instruction of write-in firmware configuration, read OTP (One Time Programable, once
Property programmable chip) instruction, ESD (Electro-Static discharge, Electro-static Driven Comb) detection instruction, chip reset indication
Etc..
Setting exceptional condition and setting testing time can also be appropriately arranged with by those skilled in the art according to actual conditions,
Such as, exceptional condition could be arranged to the operational factor of test result instruction fingerprint chip beyond corresponding standard value or normal value
Etc.；Testing time needs to meet regular hour length, so that test instruction can be performed enough numbers.
Step S104：According to fingerprint chip when test result reaches setting exceptional condition or test reaches setting test
Between when operational factor, determine the testing result of fingerprint chip.
If fingerprint chip test result exception occurs when performing certain test instruction, then illustrate fingerprint chip some
Or there is exception in some electronic components, end of life, obtain the testing result of fingerprint chip service life, and then, can
According to operational factor when occurring abnormal, to determine abnormal cause, obtain more accurate testing result；If fingerprint chip is being set
Determine do not occur exception in the testing time, then can reach the operational factor during setting testing time according to test, determine fingerprint chip
State, accordingly assess fingerprint chip service life, obtain final testing result.Wherein, operational factor includes but unlimited
In：Read parameter error (such as chip id, TCode values, check sum values) chip with firmware configuration write error, OTP and reset
Failure, upper electricity restart return mistake, chip mode handoff error or failure when fault interrupt value, interrupt report wave shape content with
Standard inconsistent etc. relevant parameter in a particular mode as defined in chip setting.
According to the present embodiment, referred to by controlling fingerprint chip to repeat for the test of test fingerprint chip service life
Order, to detect the service life of fingerprint chip.If there is test result exception when performing certain test instruction in fingerprint chip,
Then end of life, and then, can be further to causing fingerprint chip end of life by operational factor now
Reason is analyzed, it is determined that final testing result；If fingerprint chip does not occur exception within the setting testing time, can basis
Test reaches the operational factor during setting testing time, determines the state of fingerprint chip, and that assesses fingerprint chip accordingly uses the longevity
Life, obtains final testing result.It can be seen that by the scheme of the present embodiment, existing detection mode is compared to, is effectively improved
Detection efficiency, also, testing result is determined by corresponding operational factor so that testing result is more accurate, reduces detection
Error.
Embodiment two
Reference picture 2, show a kind of step flow chart of according to embodiments of the present invention two fingerprint chip detecting method.
The fingerprint chip detecting method of the present embodiment comprises the following steps：
Step S202：Control fingerprint chip repeats the survey for test fingerprint chip service life according to setpoint frequency
Examination instruction, until test result reaches setting exceptional condition and/or test reaches the setting testing time.
In the present embodiment, setpoint frequency can be appropriately arranged with by those skilled in the art according to test instruction so that one
In test period, test instruction can be performed completely.For example, it could be arranged to completely be performed once according to test instruction
Shortest time set or slightly longer than the shortest time time set.
But not limited to this, in actual use, can not also setpoint frequency, circulation perform test instruction.
By setting setpoint frequency so that the equipment such as foundational development plate that issues for testing instruction regularly issues test and referred to
Order, improves testing efficiency, reduces test instruction and issues cost.
Test instruction for test fingerprint chip service life can be fitted according to the actual requirements by those skilled in the art
Work as setting, fingerprint chip service life can be tested out.In a kind of feasible pattern, test instruction can be included to give an order
At least one：Indicate that fingerprint chip carries out adopting figure instruction, indicating that fingerprint chip is known to biological characteristic for physical characteristics collecting
Electric upper electricity instruction, the cut-offing instruction of instruction fingerprint powering down chips, instruction fingerprint core in other identification instruction, instruction fingerprint chip
The dormancy instruction of piece dormancy.In specific application, adopt that figure instruction can gather be empty graph or the biology that pre-sets
Feature image, such as fingerprint picture.
In the present embodiment, setting exceptional condition and setting testing time can also be by those skilled in the art according to actual feelings
Condition is appropriately arranged with, and the embodiment of the present invention is not restricted to this.Such as, exceptional condition could be arranged to test result instruction fingerprint chip
Operational factor exceed corresponding standard value or normal value etc.；Testing time needs to meet regular hour length, so that
Test instruction can be performed enough numbers.
In a kind of feasible pattern, test instruction can be sent to fingerprint chip, and obtain test result；And then judge to survey
Whether test result meets to set exceptional condition；If satisfied, then perform it is following according to fingerprint chip test result reach setting it is different
Operational factor during normal condition, the step of determining the testing result of fingerprint chip；If not satisfied, then judge to test whether to reach to set
Determine the testing time；If the not up to setting testing time, return to fingerprint chip and send test instruction, and obtain test result
Step continues executing with；Otherwise, following operational factors according to fingerprint chip when test reaches the setting testing time are performed, it is determined that
The step of testing result of fingerprint chip.
Step S204：Fingerprint chip is obtained when test result reaches setting exceptional condition or test reaches setting test
Between when operational factor.
Wherein, operational factor includes but is not limited to：When fingerprint chip performs test instruction, the terminal where fingerprint chip is set
The operational factor of the register of standby middle operation.Wherein, the register includes but is not limited to：Chip Read-write Catrol register, mould
Formula switching control register, command register, interrupt response register etc..
Step S206：According to the operational factor of acquisition, the testing result of fingerprint chip is determined.
When operational factor include step S204 in obtain register operational factor when, can in a kind of feasible pattern
With the operational factor of comparand register with setting operational factor, the testing result of fingerprint chip is determined according to comparative result.Wherein,
Setting operational factor can be operational factor corresponding to register when test instruction normally performs.By in contrastive test result
Register operational factor and the setting operational factor, can effectively determine whether fingerprint chip occurs exception, whether is service life
Terminate, determine the testing result of fingerprint chip.
In a kind of feasible pattern, setting exceptional condition can be reached in test result according to fingerprint chip or test reaches
To the operational factor during setting testing time, test report is generated；And then the detection knot of fingerprint chip is determined according to test report
Fruit.Wherein, in the test report of generation, operational factor can only be recorded；Misoperation ginseng can also be provided with setting means
Number, e.g., in a manner of overstriking or in different colors font mode；It can also be gone out according to operational factor according to certain rule judgment
There is the reason for misoperation parameter etc., the embodiment of the present invention is not restricted to the particular content in test report.
By the fingerprint chip detecting method of the present embodiment, making for fingerprint chip not only can be accurately and efficiently detected
With the life-span, can also be analyzed further according to operational factor, the reason for causing fingerprint chip end of life, after being
The maintenance and improvement of continuous fingerprint chip provide reference.
In the embodiment of the present invention, fingerprint chip detecting method can be by having data in any appropriate terminal device
Manage device or the equipment realization of function, the including but not limited to processor in touch-screen development board.
Embodiment three
Reference picture 3, show a kind of step flow chart of according to embodiments of the present invention three fingerprint chip detecting method.
In the present embodiment, using foundational development plate as executive agent, the fingerprint chip detecting method of the embodiment of the present invention is entered
Row explanation.For ease of understanding the scheme of the present embodiment, the Essential Environment for detecting fingerprint chip is illustrated first below.
Referring to Fig. 4, it is a kind of schematic diagram of embodiment of fingerprint chip detecting system provided by the invention, such as Fig. 4 institutes
Show, the fingerprint chip detecting system includes fingerprint chip 100 to be detected, interface adapter 200 and foundational development plate 300.
Wherein, fingerprint chip 100 can be fingerprint chip module, can normal acquisition finger print data, provided by interface adapter 200
Interface communicates with foundational development plate 300；Interface adapter 200 connects fingerprint chip 100 and foundational development plate 300, there is provided meets
The interface of chip communication agreement；Foundational development plate 300 is a kind of hardware device for running operating system software, can be used its soft
Part is communicated by interface adapter 200 with fingerprint chip 100.The He of system test software 3001 is provided with foundational development plate 300
Display screen 3002, system test software 3001 can be held by the processing unit (such as microprocessor) of foundational development plate 300
Go and realize that (e.g., the processing unit of foundational development plate 300 can perform the multiple embodiments of the method for the present invention to corresponding test function
In corresponding fingerprint chip detecting method, with the service life of test fingerprint chip 100)；Foundational development plate 300 is surveyed by system
Try software 3001 and service life test is carried out to fingerprint chip 100, the display screen 3002 in foundational development plate 300 is used for and user
Interaction, show the parameter currently tested and execution state etc..Wherein, display screen 3002 can be the common display for being used to show
Screen or touch-screen, you can also be used for inputting for showing.Above-mentioned setting forms the basic ring of detection fingerprint chip
Border.
Based on environment above, the fingerprint chip detecting method of the present embodiment comprises the following steps：
Step S302：It is electric on foundational development plate 300.
Step S304：Foundational development plate 300 runs system test software 3001 thereon.
Step S306：Foundational development plate 300 sets the testing time (when i.e. setting is tested by system test software 3001
Between).
Such as, by appropriate input equipment, such as by keyboard, mouse or when display screen 3002 is touch-screen, pass through
Touch-screen input setting etc..
Step S308：Foundational development plate 300 issues test instruction by system test software 3001 to fingerprint chip 100.
In the present embodiment, it can be upper electric instruction, cut-offing instruction that test, which instructs, it is any in figure instruction and dormancy instruction to adopt
One or more combinations.
As it was previously stated, foundational development plate 300 communicates through interface adapter 200 with fingerprint chip 100, for ease of describing, this
Step in embodiment eliminates the transmission process description of interface adapter 200 between, but those skilled in the art should
When understanding, the communication between foundational development plate 300 and fingerprint chip 100 in the present embodiment, enter via interface adapter 200
Row transmission.
Step S310：Foundational development plate 300 controls fingerprint chip 100 to perform test instruction, and obtains test result.
Step S312：Foundational development plate 300 judges whether the execution of test instruction succeeds according to test result, if performing not
Success, then perform step S314；If running succeeded, step S318 is performed.
Step S314：Foundational development plate 300 detects the current state of fingerprint chip 100.
Such as, fingerprint chip 100 is currently at power-up state or off-position or adopts figure state or dormancy shape
State.That is, with specific instruction as above electric instruction, cut-offing instruction, adopt figure instruct and the corresponding state such as dormancy instruction in
It is a kind of.
Step S316：Foundational development plate 300 records the current operating parameter of fingerprint chip 100, then performs step S322.
These current operating parameters can be such as chip Read-write Catrol register, pattern switching control register, instruction
The parameter current of register, interrupt response register etc..
Step S318：Foundational development plate 300 judges to test whether to reach the testing time, if reaching the testing time, performed
Step S320；If not reaching the testing time, return to step S308 is continued executing with.
In this step, judge to test whether to reach the testing time set in step S306.
Step S320：Foundational development plate 300 records the current operating parameter of fingerprint chip 100, then performs step S322.
It should be noted that this step is optional step, in actually performing, if test reaches the testing time, illustrate
The service life of fingerprint chip is substantially up to standard, can also directly perform step S322.
Step S322：Foundational development plate 300 generates test report.
Step S324：Stop test.
A kind of in the specific implementation, the system test software 3001 carried in foundational development plate 300 passes through interface adapter
200 control fingerprint chips 100, and the behaviour such as figure, identification, upper electricity, dormancy is adopted by issuing the execution of test instruction control fingerprint chip 100
Make.In this course, in fingerprint chip 100 various components can ceaselessly switching state and discharge and recharge, cause various members
Device has been lost in long-term this operating process.But the loss is very slow in this normal operating process,
It is difficult to quantify, therefore, the operating time that can be set in specific detection process each time, (what is set performed test at interval
The frequency of instruction, namely setpoint frequency), for example, 100 milliseconds once, constantly perform identical operation 7*24 hours (setting test
Time), after the setting testing time is finished, then to detect fingerprint chip 100 in such as picture quality, discrimination, FRR
The basic index feelings such as (False Rejection Rate, refuse sincere)/FAR (False Acceptance Rate, accuracy of system identification)
Condition.Even fingerprint chip 100 can be allowed to perform this process always, untill fingerprint chip 100 can not work.Then, remember
Record and quantitative analysis fingerprint chip 100 performs process as how many times altogether, alternatively, more fingers can also be counted simultaneously
The situation of line chip, in this, as a basic test sample data for producing and developing the reference of fingerprint chip, so as to continuous
Optimize each chip parameter and packaged type, as much as possible extend the usage time of fingerprint chip.
Test instruction can be circulated according to the testing time and issued, and can also be issued according to certain frequency, such as be set according to foregoing
The operating time interval put issues, or can also be configured simultaneously when the testing time is set.If the test issued refers to
Order, which runs succeeded, illustrates that the current state of fingerprint chip is normal, if test instruction execution is unsuccessful, illustrates current finger print chip
May due to for a long time repeatedly high intensity operating instruction occur consume, it is necessary to by test report analyze which parameter have it is different
Often.It can be directly displayed on a display screen for simple preliminary analysis (such as the operational factor of mistake) for checking；For more
Add specific analysis, test log can be exported from foundational development plate and carry out further labor.
By the present embodiment, the service life detection to fingerprint chip is realized on the basis of hardware cost is not increased,
Also, after the completion of test process, it can tentatively judge be repeatedly used for a long by the analysis to fingerprint chip operational factor
In the case of, fingerprint chip may finally normal use how long so that the quality assurance before fingerprint chip volume production more may be used
Lean on, reduce unnecessary product quality problem, the data for more accurately describing fingerprint chip service life are also provided for product,
For reference and optimizing product design and Development and Production.
Example IV
Reference picture 5, show a kind of structured flowchart of according to embodiments of the present invention four fingerprint chip-detecting apparatus.It is described
Fingerprint chip-detecting apparatus can apply the foundational development plate 300 in the fingerprint chip detecting system shown in Fig. 4, for performing phase
The fingerprint chip detection function answered.
The fingerprint chip-detecting apparatus of the present embodiment includes：Testing execution module 402, for controlling fingerprint chip to repeat to hold
Row instructs for the test of test fingerprint chip service life, until test result reaches setting exceptional condition and/or test reaches
To the setting testing time；As a result determining module 404, for according to fingerprint chip test result reach setting exceptional condition or
Test reaches the operational factor during setting testing time, determines the testing result of fingerprint chip.
According to the present embodiment, referred to by controlling fingerprint chip to repeat for the test of test fingerprint chip service life
Order, to detect the service life of fingerprint chip.If there is test result exception when performing certain test instruction in fingerprint chip,
Then end of life, and then, can be further to causing fingerprint chip end of life by operational factor now
Reason is analyzed, it is determined that final testing result；If fingerprint chip does not occur exception within the setting testing time, can basis
Test reaches the operational factor during setting testing time, determines the state of fingerprint chip, and that assesses fingerprint chip accordingly uses the longevity
Life, obtains final testing result.It can be seen that by the scheme of the present embodiment, existing detection mode is compared to, is effectively improved
Detection efficiency, also, testing result is determined by corresponding operational factor so that testing result is more accurate, reduces detection
Error.
Embodiment five
Reference picture 6, show a kind of structured flowchart of according to embodiments of the present invention five fingerprint chip-detecting apparatus.
The fingerprint chip-detecting apparatus of the present embodiment includes：Testing execution module 502, for controlling fingerprint chip to repeat to hold
Row is used for the test instruction for testing the fingerprint chip service life, until test result reaches setting exceptional condition and/or survey
Examination reaches the setting testing time；As a result determining module 504, for reaching setting exceptional condition in test result according to fingerprint chip
Or test reaches operational factor when setting the testing time, the testing result of fingerprint chip is determined.
Alternatively, test instruction is included at least one to give an order：Indicate that fingerprint chip carries out adopting for physical characteristics collecting
The identification that the biological characteristic is identified for figure instruction, instruction fingerprint chip instructs, upper electricity electric on instruction fingerprint chip refers to
Make, indicate the cut-offing instruction of fingerprint powering down chips, indicate the dormancy instruction of fingerprint chip dormancy.
Alternatively, testing execution module 502 includes：Instruction sending module 5022, refer to for sending test to fingerprint chip
Order, and obtain test result；First judge module 5024, for judging whether test result meets to set exceptional condition；First
Execution module 5026, if the judged result for the first judge module 5024 is satisfaction, implementing result determining module 504；The
Two judge modules 5028, if the judged result for the first judge module 5024 is is unsatisfactory for, judgement, which tests whether to reach, to be set
Determine the testing time；Second execution module 50210, if the judged result for the second judge module 5028 is not up to setting test
Time, then return instruction sending module 5022；Otherwise, implementing result determining module 504.
Alternatively, operational factor includes：When fingerprint chip performs test instruction, transported in the terminal device where fingerprint chip
The operational factor of capable register.
Alternatively, as a result determining module 504 is used for the operational factor and setting operational factor of comparand register, according to comparing
As a result the testing result of fingerprint chip is determined.
Alternatively, testing execution module 502 refers to for controlling fingerprint chip to be repeated according to setpoint frequency for test
The test instruction of line chip service life, when test result reaches setting exceptional condition and/or test reaches setting test
Between.
Alternatively, as a result determining module 504 includes：Report generation module 5042, for being tied according to fingerprint chip in test
Fruit reach setting exceptional condition or test reach setting the testing time when operational factor, generate test report；Report result
Module 5044, for determining the testing result of fingerprint chip according to test report.
The fingerprint chip-detecting apparatus of the present embodiment is used to realize corresponding fingerprint chip in aforesaid plurality of embodiment of the method
Detection method, and the beneficial effect with corresponding embodiment of the method, will not be repeated here.
Device embodiment described above is only schematical, wherein the module illustrated as separating component can
To be or may not be physically separate, it can be as the part that module is shown or may not be physics mould
Block, you can with positioned at a place, or can also be distributed on multiple mixed-media network modules mixed-medias.It can be selected according to the actual needs
In some or all of module realize the purpose of this embodiment scheme.Those of ordinary skill in the art are not paying creativeness
Work in the case of, you can to understand and implement.
Through the above description of the embodiments, those skilled in the art can be understood that each embodiment can
Realized by the mode of software plus required general hardware platform, naturally it is also possible to pass through hardware.Based on such understanding, on
The part that technical scheme substantially in other words contributes to prior art is stated to embody in the form of software product, should
Computer software product can store in a computer-readable storage medium, the computer readable recording medium storing program for performing include be used for
The readable form storage of computer (such as computer) or any mechanism of transmission information.For example, machine readable media is included only
Read memory (ROM), random access memory (RAM), magnetic disk storage medium, optical storage media, flash medium, electricity, light,
Sound or the transmitting signal of other forms (for example, carrier wave, infrared signal, data signal etc.) etc., the computer software product includes
Some instructions are each to cause a computer equipment (can be personal computer, server, or network equipment etc.) execution
Method described in some parts of individual embodiment or embodiment.
Finally it should be noted that：Above example is only to illustrate the technical scheme of the embodiment of the present invention, rather than it is limited
System；Although the embodiment of the present invention is described in detail with reference to the foregoing embodiments, one of ordinary skill in the art should
Understand：It can still modify to the technical scheme described in foregoing embodiments, or to which part technical characteristic
Carry out equivalent substitution；And these modifications or replacement, the essence of appropriate technical solution is departed from various embodiments of the present invention skill
The spirit and scope of art scheme.
Claims (16)
1. a kind of fingerprint chip detecting method, including：
The test that control fingerprint chip repeats for testing the fingerprint chip service life instructs, until test result reaches
Reach the setting testing time to setting exceptional condition and/or test；
According to fortune of the fingerprint chip when test result reaches setting exceptional condition or test reaches the setting testing time
Row parameter, determine the testing result of the fingerprint chip.
At least one 2. the method according to claim 11, wherein, the test instruction includes giving an order：Described in instruction
Fingerprint chip carries out adopting figure instruction, indicating the knowledge that the biological characteristic is identified the fingerprint chip for physical characteristics collecting
Do not instruct, indicate electric upper electricity instruction on the fingerprint chip, the cut-offing instruction for indicating the fingerprint powering down chips, described in instruction
The dormancy instruction of fingerprint chip dormancy.
3. method according to claim 1 or 2, wherein, the control fingerprint chip is repeated for testing the finger
The test instruction of line chip service life, when test result reaches setting exceptional condition and/or test reaches setting test
Between the step of include：
The test instruction is sent to the fingerprint chip, and obtains test result；
Judge whether the test result meets to set exceptional condition；
If satisfied, the operational factor according to the fingerprint chip when test result reaches setting exceptional condition is then performed,
The step of determining the testing result of the fingerprint chip；
If not satisfied, then judge to test whether to reach the setting testing time；
If the not up to described setting testing time, return it is described send the test to the fingerprint chip and instruct, and obtain
The step of test result, continues executing with；Otherwise, perform it is described according to the fingerprint chip test reach setting the testing time when
Operational factor, the step of determining the testing result of the fingerprint chip.
4. according to the method described in claim any one of 1-3, wherein, the operational factor includes：The fingerprint chip performs
During the test instruction, the operational factor of the register run in the terminal device where the fingerprint chip.
5. according to the method for claim 4, wherein, setting exceptional condition is reached in test result according to the fingerprint chip
Or operational factor of test when reaching the setting testing time, include the step of the testing result for determining the fingerprint chip：
Compare the operational factor and setting operational factor of the register, the detection of the fingerprint chip is determined according to comparative result
As a result.
6. according to the method described in claim any one of 1-4, wherein, the control fingerprint chip is repeated for testing institute
The step of test instruction for stating fingerprint chip service life, includes：
The test that control fingerprint chip is repeated for testing the fingerprint chip service life according to setpoint frequency instructs.
7. according to the method described in claim any one of 1-6, wherein, setting is reached in test result according to the fingerprint chip
Exceptional condition or test reach the operational factor during setting testing time, the step of determining the testing result of the fingerprint chip
Including：
According to fortune of the fingerprint chip when test result reaches setting exceptional condition or test reaches the setting testing time
Row parameter, generate test report；
The testing result of the fingerprint chip is determined according to the test report.
8. a kind of fingerprint chip-detecting apparatus, including：
Testing execution module, the test for controlling fingerprint chip to repeat for testing the fingerprint chip service life refer to
Order, until test result reaches setting exceptional condition and/or test reaches the setting testing time；
As a result determining module, set for reaching setting exceptional condition in test result according to the fingerprint chip or testing to reach
Determine the operational factor during testing time, determine the testing result of the fingerprint chip.
At least one 9. device according to claim 8, wherein, the test instruction includes giving an order：Described in instruction
Fingerprint chip carries out adopting figure instruction, indicating the knowledge that the biological characteristic is identified the fingerprint chip for physical characteristics collecting
Do not instruct, indicate electric upper electricity instruction on the fingerprint chip, the cut-offing instruction for indicating the fingerprint powering down chips, described in instruction
The dormancy instruction of fingerprint chip dormancy.
10. device according to claim 8 or claim 9, wherein, the testing execution module includes：
Instruction sending module, instructed for sending the test to the fingerprint chip, and obtain test result；
First judge module, for judging whether the test result meets to set exceptional condition；
First execution module, if the judged result for first judge module performs the result and determine mould to meet
Block；
Second judge module, if the judged result for first judge module is is unsatisfactory for, judgement tests whether to reach
Set the testing time；
Second execution module, if the judged result for second judge module is the not up to described setting testing time,
Return to the instruction sending module；Otherwise, the result determining module is performed.
11. according to the device described in claim any one of 8-10, wherein, the operational factor includes：The fingerprint chip is held
When the row test instructs, the operational factor of the register run in the terminal device where the fingerprint chip.
12. device according to claim 11, wherein, the result determining module, the fortune for the register
Row parameter and setting operational factor, the testing result of the fingerprint chip is determined according to comparative result.
13. according to the device described in claim any one of 8-12, wherein, the testing execution module, for controlling fingerprint core
The test that piece is repeated for testing the fingerprint chip service life according to setpoint frequency instructs, until test result reaches
Setting exceptional condition and/or test reach the setting testing time.
14. according to the device described in claim any one of 8-13, wherein, the result determining module includes：
Report generation module, set for reaching setting exceptional condition in test result according to the fingerprint chip or testing to reach
Determine the operational factor during testing time, generate test report；
Object module is reported, for determining the testing result of the fingerprint chip according to the test report.
15. a kind of fingerprint chip detecting system, it is characterised in that including foundational development plate, fingerprint chip and adapter, wherein institute
State foundational development plate and the fingerprint chip is connected to by the adapter, the foundational development plate includes processing unit, described
Processing unit is used to perform the operation corresponding to the fingerprint chip detecting method as any one of claim 1-7.
16. a kind of computer-readable storage medium, the computer-readable recording medium storage has：For controlling fingerprint chip to repeat to hold
Row is used for the test instruction for testing the fingerprint chip service life, until test result reaches setting exceptional condition and/or survey
Examination reaches the executable instruction of setting testing time；For reaching setting exceptional condition in test result according to the fingerprint chip
Or test reaches operational factor when setting the testing time, the executable instruction of the testing result of the fingerprint chip is determined.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2017/088447 WO2018227475A1 (en) | 2017-06-15 | 2017-06-15 | Fingerprint chip detection method, device and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107466369A true CN107466369A (en) | 2017-12-12 |
Family
ID=60554121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201780000472.9A Pending CN107466369A (en) | 2017-06-15 | 2017-06-15 | Fingerprint chip detecting method, apparatus and system |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN107466369A (en) |
| WO (1) | WO2018227475A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109633299A (en) * | 2018-11-26 | 2019-04-16 | 大唐微电子技术有限公司 | A kind of test device and method of fingerprint mould group |
| CN109709471A (en) * | 2019-01-16 | 2019-05-03 | 昆山丘钛微电子科技有限公司 | A kind of test fixture, the test method and device of fingerprint mould group |
| CN110119752A (en) * | 2018-02-06 | 2019-08-13 | 南昌欧菲生物识别技术有限公司 | The test macro and test method of fingerprint recognition mould group |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201096847Y (en) * | 2007-08-22 | 2008-08-06 | 比亚迪股份有限公司 | A chip aging testing system |
| CN103018594A (en) * | 2012-11-30 | 2013-04-03 | 深圳市汇顶科技股份有限公司 | Capacitive touch screen testing method and system, and electronic equipment |
| CN105934681A (en) * | 2016-04-27 | 2016-09-07 | 深圳市汇顶科技股份有限公司 | Chip test method and device |
| CN106681906A (en) * | 2016-06-24 | 2017-05-17 | 乐视控股（北京）有限公司 | Method and device for detecting abnormal operation of fingerprint module and terminal device |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101196553A (en) * | 2006-12-04 | 2008-06-11 | 上海华虹Nec电子有限公司 | Method for improving SOC chip testing efficiency |
| CN101672878B (en) * | 2008-09-12 | 2013-07-03 | 晨星软件研发(深圳)有限公司 | Chip testing device and chip testing method |
| CN105319494A (en) * | 2014-11-26 | 2016-02-10 | 北京同方微电子有限公司 | Automatic aging testing device of integrated circuit chip |
| CN105652179B (en) * | 2014-11-28 | 2018-10-19 | 珠海艾派克微电子有限公司 | A kind of detection method and device of consumable chip |
| CN206114849U (en) * | 2016-10-10 | 2017-04-19 | 上海灵动微电子股份有限公司 | Batch test system of chip |
-
2017
- 2017-06-15 WO PCT/CN2017/088447 patent/WO2018227475A1/en active Application Filing
- 2017-06-15 CN CN201780000472.9A patent/CN107466369A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201096847Y (en) * | 2007-08-22 | 2008-08-06 | 比亚迪股份有限公司 | A chip aging testing system |
| CN103018594A (en) * | 2012-11-30 | 2013-04-03 | 深圳市汇顶科技股份有限公司 | Capacitive touch screen testing method and system, and electronic equipment |
| CN105934681A (en) * | 2016-04-27 | 2016-09-07 | 深圳市汇顶科技股份有限公司 | Chip test method and device |
| CN106681906A (en) * | 2016-06-24 | 2017-05-17 | 乐视控股（北京）有限公司 | Method and device for detecting abnormal operation of fingerprint module and terminal device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110119752A (en) * | 2018-02-06 | 2019-08-13 | 南昌欧菲生物识别技术有限公司 | The test macro and test method of fingerprint recognition mould group |
| CN109633299A (en) * | 2018-11-26 | 2019-04-16 | 大唐微电子技术有限公司 | A kind of test device and method of fingerprint mould group |
| CN109709471A (en) * | 2019-01-16 | 2019-05-03 | 昆山丘钛微电子科技有限公司 | A kind of test fixture, the test method and device of fingerprint mould group |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2018227475A1 (en) | 2018-12-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103578568B (en) | The performance test methods of solid state hard disc and device | |
| CN107391379A (en) | Interface automatic test approach and device | |
| CN108717393A (en) | A kind of applied program testing method and mobile terminal | |
| US20030200483A1 (en) | Electronic test program that can distinguish results | |
| CN109726107A (en) | Test method, device, equipment and storage medium | |
| CN107466369A (en) | Fingerprint chip detecting method, apparatus and system | |
| CN111240973B (en) | Equipment testing method and system based on simulation and readable storage medium | |
| CN104246714A (en) | Software defect verification | |
| CN111401722B (en) | Intelligent decision method and intelligent decision system | |
| CN110244256A (en) | A kind of intelligent electric energy meter fault recognition method, device and equipment | |
| CN104335056A (en) | Interposer between a tester and material handling equipment to separate and control different requests of multiple entities in a test cell operation | |
| CN104077192A (en) | Test system and method | |
| CN115718450A (en) | Equipment wire-stopping monitoring method and device, electronic equipment and system | |
| CN104364664A (en) | An algorithm and structure for creation, definition, and execution of an SPC rule decision tree | |
| CN112015609A (en) | Hot plug test method, device and equipment | |
| CN111522725A (en) | SSD performance automatic evaluation method, device, equipment and medium | |
| CN112633731A (en) | Method and device for detecting whether product is qualified or not, processor and electronic equipment | |
| CN112269697A (en) | Equipment storage performance testing method, system and related device | |
| CN115248782B (en) | Automatic testing method and device and computer equipment | |
| CN116955071A (en) | Fault classification method, device, equipment and storage medium | |
| CN111312326A (en) | Flash memory life testing method and device, power acquisition terminal and storage medium | |
| CN115575793A (en) | Multi-channel free combination test method, device and system | |
| CN115480948A (en) | Hard disk failure prediction method and related equipment | |
| CN113140217B (en) | Voice instruction testing method, testing device and readable storage medium | |
| CN108959006A (en) | A kind of hardware detection method and its tool |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20171212 |