CN107131905B - Testing two or more metering assemblies - Google Patents
Testing two or more metering assemblies Download PDFInfo
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- CN107131905B CN107131905B CN201610106049.4A CN201610106049A CN107131905B CN 107131905 B CN107131905 B CN 107131905B CN 201610106049 A CN201610106049 A CN 201610106049A CN 107131905 B CN107131905 B CN 107131905B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
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Abstract
Two or more metrology assemblies are tested. A method for detecting two or more metrology assemblies is provided that includes measuring a first electrical property of a first metrology assembly and a second metrology assembly communicatively coupled with metrology electronics. The method also includes comparing the first electrical property to one or more identification values, wherein at least one of the one or more identification values corresponds to one of the first metering component and the second metering component.
Description
Technical Field
The embodiments described below relate to vibration sensors and, more particularly, to sensing two or more metrology assemblies.
Background
Vibration sensors, such as, for example, vibrating densitometers and coriolis flowmeters, are generally known and are used to measure mass flow and other information related to the material flowing through a conduit in the flowmeter. Exemplary coriolis flowmeters are disclosed in U.S. patent 4,109,524, U.S. patent 4,491,025, and reference 31,450 (re.31,450). These flow meters have a metering assembly with one or more conduits in a straight or curved configuration. For example, each conduit configuration in a coriolis mass flowmeter has a set of natural vibration modes, which may be of the simple bending, torsional, or coupled type. Each conduit may be driven to oscillate in a preferred mode. When there is no flow through the meter, the driving force applied to the conduit(s) causes all points along the conduit(s) to oscillate with the same phase or with a small "zero offset" (which is a time delay measured at zero flow).
As material begins to flow through the conduit(s), coriolis forces cause each point along the conduit(s) to have a different phase. For example, the phase at the inlet end of the flow meter lags the phase at the central driver position, while the phase at the outlet leads the phase at the central driver position. Pick-up elements (pickoff) on the catheter(s) generate sinusoidal signals representative of the motion of the catheter(s). The signals output from the pick-up elements are processed to determine the time delay between the pick-up elements. The time delay between two or more pickup elements is proportional to the mass flow rate of material flowing through the conduit(s).
Meter electronics connected to the driver generates drive signals that operate the driver and also determines the mass flow rate and/or other properties of the process material from the signals received from the pickup elements. The driver may comprise one of many well-known arrangements; however, magnets and opposing drive coils have met with great success in the flow meter industry. An alternating current is delivered to the drive coil for vibrating the conduit(s) at a desired conduit amplitude and frequency. It is also known in the art to provide the pick-up element as a magnet and coil arrangement very similar to the driver arrangement.
Many systems utilize two or more metering assemblies due to various design constraints. For example, a vehicle fueled with Liquefied Natural Gas (LNG) may utilize a first metering assembly to measure the fuel pumped from an LNG storage tank to the LNG vehicle. A second metering assembly may be used to measure the fuel returned to the LNG tank. The fuel returned to the LNG may have different flow rates, temperatures, etc. Thus, the first and second metering assemblies may be of different types. That is, the first and second metrology assemblies may have different resonant frequencies, conduit size(s) and/or shape(s), and so forth. Thus, there is a need to detect two or more metering assemblies.
Disclosure of Invention
A method for testing two or more metrology assemblies is provided. According to one embodiment, the method includes measuring a first electrical property of a first metrology assembly and a second metrology assembly communicatively coupled with metrology electronics. The method also includes comparing the first electrical property to one or more identification values, wherein at least one of the one or more identification values corresponds to one of the first metering component and the second metering component.
A method of testing two or more metrology assemblies is provided. According to one embodiment, the method includes measuring an electrical property of two or more meter components communicatively coupled to meter electronics and comparing the electrical property to an identification value, wherein the identification value corresponds to at least one of the two or more meter components. The method also includes correlating the one or more parameters with at least one of the two or more metering components based on a comparison between the electrical property and the identification value.
A dual vibration sensor system for sensing two or more metrology assemblies is provided. According to one embodiment, the dual vibration sensor system includes meter electronics, a first meter component communicatively coupled to the meter electronics, and a second meter component communicatively coupled to the meter electronics. The meter electronics is configured to measure a first electrical property of the first meter component and the second meter component and compare the first electrical property to one or more identification values, wherein each of the one or more identification values corresponds to one of the first meter component and the second meter component.
Aspect(s)。
According to one aspect, a method for detecting two or more metrology assemblies comprises: a first electrical property of a first metrology assembly and a second metrology assembly communicatively coupled with metrology electronics is measured. The method also includes comparing the first electrical property to one or more identification values, wherein at least one of the one or more identification values corresponds to one of the first metering component and the second metering component.
Preferably, the first electrical property is associated with a first connector communicatively coupled to the first metering assembly and a second connector communicatively coupled to the second metering assembly, and the second electrical property is associated with a first connector communicatively coupled to the first metering assembly and a second connector communicatively coupled to the second metering assembly.
Preferably, the method further comprises selecting the one or more parameters based on a comparison between the first electrical property and the one or more identification values.
Preferably, the first electrical property is the resistance of the temperature sensor and the second electrical property is the resistance of the resistor.
Preferably, the method further comprises detecting one of the first and second metering components based on a comparison between the electrical property and the one or more identification values.
Preferably, the method further comprises measuring a second electrical property of the first meter assembly and the second meter assembly communicatively coupled with the meter electronics, and comparing the second electrical property to the one or more identification values.
According to one aspect, a method of detecting two or more meter components includes measuring an electrical property of two or more meter components communicatively coupled to meter electronics, and comparing the electrical property to an identification value, wherein the identification value corresponds to at least one of the two or more meter components. The method also includes correlating the one or more parameters with at least one of the two or more metering components based on a comparison between the electrical property and the identification value.
Preferably, the method further comprises driving at least one of the two or more metering assemblies to determine whether the one or more parameters are correctly associated with the at least one of the two or more metering assemblies.
Preferably, correlating the one or more parameters with the two or more metering assemblies comprises driving a first metering assembly of the two or more metering assemblies using the one or more parameters, and determining that the one or more parameters are properly correlated with the first metering assembly based on a response from the driven first metering assembly.
Preferably, correlating the one or more parameters with the two or more metering components comprises driving a first of the two or more metering components using the one or more parameters, determining, based on a response from the driven first metering component, that the one or more parameters are not properly correlated with the first of the two or more metering components, and driving a second of the two or more metering components using the one or more parameters.
According to one aspect, a dual vibration sensor system (5) for detecting two or more metering assemblies comprises: meter electronics (100); a first metrology assembly (10 a) communicatively coupled to the metrology electronics (100); and a second metrology assembly (10 b) communicatively coupled to the metrology electronics (100); wherein the meter electronics (100) is configured to measure a first electrical property of the first meter component (10 a) and the second meter component (10 b) and compare the first electrical property to one or more identification values, wherein each of the one or more identification values corresponds to one of the first meter component (10 a) and the second meter component (10 b).
Preferably, the first electrical property is associated with a first connector (200) and a second connector (300), and wherein the first connector (200) communicatively couples the first meter assembly (10 a) with the meter electronics (100) and the second connector (300) communicatively couples the second meter assembly (10 b) to the meter electronics (100).
Preferably, the first electrical property is a resistance of the temperature sensor (19 a) and the second electrical property is a resistance of one of the short circuit (414), the identification resistor (514) and the open circuit (614).
Preferably, the meter electronics (100) is further configured to select the one or more parameters based on a comparison between the first electrical property and the one or more identification values.
Preferably, the meter electronics (100) is further configured to correlate the one or more parameters with one of the first meter assembly (10 a) and the second meter assembly (10 b).
Preferably, the meter electronics (100) is further configured to measure a second electrical property of the first meter assembly (10 a) and the second meter assembly (10 b), and to compare the second electrical property to the one or more identification values.
Drawings
Like reference numerals refer to like elements throughout the several views. It should be understood that the drawings are not necessarily to scale.
FIG. 1 shows a dual vibration sensor system 5 including meter electronics 100 for sensing two or more meter components.
FIG. 2 illustrates a dual vibration sensor system 5 including meter electronics 100 for sensing two or more meter components.
Fig. 3 shows a block diagram of meter electronics 100.
Fig. 4 shows a first connector type 400 for testing two or more metering assemblies.
Fig. 5 shows a second connector type 500 for testing two or more metering assemblies.
Fig. 6 shows a third connector type 600 for testing two or more metering assemblies.
Fig. 7 illustrates a fourth connector type 700 for testing two or more metering assemblies.
Fig. 8 shows a fifth connector type 800 for testing two or more metering assemblies.
Fig. 9 shows a block diagram of an alternative meter electronics 900.
FIG. 10 illustrates a method 1000 for testing two or more metrology assemblies, in accordance with one embodiment.
11A and 11B illustrate a method 1100 of testing two or more metrology assemblies in accordance with another embodiment.
Detailed Description
Fig. 1-11B and the following description depict specific examples to teach those skilled in the art how to obtain and use the best mode of detecting an embodiment of two or more metrology assemblies. For the purpose of teaching inventive principles, some conventional aspects have been simplified or omitted. Those skilled in the art will recognize variations from these examples that fall within the scope of the description. Those skilled in the art will recognize that the features described below may be combined in various ways to form multiple variations that detect two or more metrology components. Accordingly, the embodiments described below are not limited to the specific examples described below, but only by the claims and their equivalents.
Detecting two or more metrology components may be performed, for example, in a dual vibration sensor system. The dual vibration sensor system may include meter electronics communicatively coupled to the first and second meter assemblies via first and second communication channels. The dual vibration sensor system may measure a first electrical property of the first and second meter assemblies. For example, the resistance of the temperature sensors in the first and second metrology assemblies may be measured. A second electrical property may also be measured, such as an ID resistor, a resistance of a short or open circuit. The first electrical property may be compared to one or more identification values.
At least one of the identification values corresponds to the first or second metering component. That is, at least one identification value may be employed to identify the first or second metering component. The dual vibration sensor system can then correlate one or more parameters with the first or second meter components, even if the first or second meter components are arbitrarily coupled to the meter electronics through the first and second communication channels. In other words, the meter electronics may be able to detect that the first and second meter components are swapped (swap) between the first and second communication channels.
Vibration sensor system。
FIG. 1 shows a dual vibration sensor system 5 including meter electronics 100 for sensing two or more meter components. As shown in fig. 1, the dual vibration sensor system 5 includes a first vibration sensor 5a and a second vibration sensor 5 b. The first and second vibration sensors 5a, 5b include meter electronics 100 and first and second meter assemblies 10a, 10b, respectively.
The meter electronics 100 is communicatively coupled to the first and second meter assemblies 10a, 10b via first and second sets of wires 11a, 11 b. The first and second sets of wires 11a, 11b are coupled (e.g., attached, glued, etc.) to first and second communication ports 27a, 27b on meter electronics 100. The first and second sets of wires 11a, 11b are also coupled to the first and second metering assemblies 10a, 10b via the first and second communication ports 7a, 7b on the first and second metering assemblies 10a, 10 b. Meter electronics 100 is configured to provide information to a host (host) via path 26. The first and second metering assemblies 10a, 10b are shown as having a housing enclosing a flow tube. The meter electronics 100 and the first and second meter assemblies 10a, 10b are described in more detail below with reference to fig. 2 and 3.
Still referring to fig. 1, the first and second vibration sensors 5a, 5b may for example be used to calculate the difference in flow rate and/or total flow between the supply line SL and the return line RL. For example, the dual vibration sensor system 5 may be employed in cryogenic applications, where fluid is supplied from a tank in a liquid state and then returned to the tank in a gaseous state. In one exemplary cryogenic application, first metering assembly 10a may be part of a supply line SL that supplies LNG to LNG dispenser LD and second metering assembly 10b may be part of a return line RL from LNG dispenser LD. The total flow through second metering assembly 10b may be subtracted from the total flow through first metering assembly 10a to determine the total amount of LNG supplied by LNG dispenser LD. This exemplary application with supply and return lines SL, RL is shown with dashed lines to illustrate that the dual vibration sensor system 5 may be employed in other applications. As can also be appreciated, in the described and other embodiments, the calculation may be performed by the meter electronics 100, which is described in more detail below.
FIG. 2 illustrates a dual vibration sensor system 5 including meter electronics 100 for sensing two or more meter components. As shown in fig. 2, the dual vibration sensor system 5 comprises a first vibration sensor 5a and a second vibration sensor 5b as described hereinbefore with reference to fig. 1. For clarity, the housing on the meter electronics 100 and the first and second meter assemblies 10a, 10b is not shown. The first and second metering assemblies 10a, 10b are responsive to the mass flow rate and density of the process material. The meter electronics 100 is connected to the first and second meter assemblies 10a, 10b via first and second sets of wires 11a, 11b to provide density, mass flow rate, and temperature information, among other information, through the path 26. A coriolis flowmeter structure is described, however it will be apparent to those skilled in the art that the present invention may be implemented as a vibrating conduit densitometer, a tuning fork densitometer, a viscometer, or the like.
The first and second metering assemblies 10a, 10b include first and second pairs of parallel conduits 13a, 13a 'and 13b, 13 b', drive mechanisms 18a, 18b, temperature sensors 19a, 19b, and left and right pick-off sensors 17al, 17ar and 17bl, 17 br. Each of the conduit pairs 13a, 13a 'and 13b, 13 b' is curved at two symmetrical positions along the length of the conduits 13a, 13a 'and 13b, 13 b' and is substantially parallel over their entire length. The conduits 13a, 13a 'and 13b, 13 b' are driven in opposite directions about their respective bending axes by first and second drive mechanisms 18a, 18b and are in a mode known as the first out of phase bending mode of the flow meter. The drive mechanism 18a, 18b may comprise any one of a number of arrangements, such as a magnet mounted to the conduits 13a ', 13 b' and an opposing coil mounted to the conduits 13a, 13b, and through which an alternating current is passed for vibrating the two conduits 13a, 13a 'and 13b, 13 b'. Appropriate drive signals are applied to the drive mechanisms 18a, 18b by meter electronics 100.
The first and second vibration sensors 5a, 5b may be initially calibrated and a flow calibration factor FCF may be generated along with a zero offset Δ T0. In use, the flow calibration factor FCF may be multiplied by the time delay Δ T measured by the pick-up element minus the zero offset Δ T0To generate a mass flow rate
. Using the flow calibration factor FCF and the zero offset Δ T is described by equation (1)0An example of a mass flow rate equation of (1):
wherein:
= Mass flow Rate
FCF = flow calibration factor
ΔTmeasured= measured time delay
ΔT0= initial zero offset.
The meter electronics 100 receives left and right sensor signals from the first and second left and right pickoff sensors 17al, 17ar and 17bl, 17br via the first and second sets of wires 11a, 11b and temperature signals from the first and second temperature sensors 19a, 19 b. The meter electronics 100 provides drive signals to the drive mechanisms 18a, 18b and vibrates the first and second pairs of conduits 13a, 13a 'and 13b, 13 b'. The meter electronics 100 processes the left and right sensor signals and the temperature signal to calculate the mass flow rate and density of the material through the first and/or second metering assemblies 10a, 10 b. This information, along with other information, is applied as a signal by meter electronics 100 via path 26.
As can be appreciated, although the dual vibration sensor system 5 shown in fig. 1 and 2 includes only two metering assemblies 10a, 10b, the dual vibration sensor system 5 may be employed in systems that include more than two metering assemblies. For example, meter electronics can be configured to communicate with three or more meter components. In such a configuration, the dual vibration sensor system 5 may be two of three or more meter assemblies and part of the meter electronics.
Meter electronics。
Fig. 3 shows a block diagram of meter electronics 100. As shown in fig. 3, meter electronics 100 is communicatively coupled to first and second meter assemblies 10a, 10 b. As previously described with reference to fig. 1, the first and second meter assemblies 10a, 10b include first and second left and right pickoff sensors 17al, 17ar and 17bl, 17br, drive mechanisms 18a, 18b, and temperature sensors 19a, 19b that are communicatively coupled to the meter electronics 100 through first and second connectors 200, 300, communication channels 112a, 112b, and I/ O ports 160a, 160b via first and second sets of wires 11a, 11 b.
The meter electronics 100 provides first and second drive signals 14a, 14b via first and second communication channels 112a, 112 b. More specifically, meter electronics 100 provides a first drive signal 14a to a first drive mechanism 18a in a first meter assembly 10 a. The meter electronics 100 is also configured to provide a second drive signal 14b to a second drive mechanism 18b in a second meter assembly 10 b. Furthermore, the first and second sensor signals 12a, 12b are provided by the first and second metering assemblies 10a, 10b, respectively. More specifically, in the illustrated embodiment, the first sensor signal 12a is provided by first left and right pickoff sensors 17al, 17ar in the first metrology assembly 10 a. The second sensor signal 12b is provided by the second left and right pickoff sensors 17bl, 17br in the second metrology assembly 10 b. As can be appreciated, the first and second sensor signals 12a, 12b are provided to the meter electronics 100 via first and second communication channels 112a, 112b, respectively.
For example, the processor 110 may receive digitized sensor signals from one or more signal processors 120. The processor 110 is also configured to provide information such as phase differences, properties of the fluid in the first or second metering assemblies 10a, 10b, and the like. Processor 110 may provide information to a host through communication port 140. The processor 110 may also be configured to communicate with the one or more memories 130 to receive information and/or to store information in the one or more memories 130. For example, the processor 110 may receive calibration factors and/or metering component zeros (e.g., phase difference when there is zero flow) from the one or more memories 130. Each of the calibration factors and/or the meter assembly zero points may be associated with the first and second vibration sensors 5a, 5b and/or the first and second meter assemblies 10a, 10b, respectively. The processor 110 may use the calibration factor to process the digitized sensor signals received from the one or more signal processors 120.
The one or more signal processors 120 are shown to include first and second encoder/decoders (codecs) 122, 124 and an analog-to-digital converter (ADC) 126. The one or more signal processors 120 may condition the analog signals, digitize the conditioned analog signals, and/or provide digitized signals. The first and second codecs 122, 124 are configured to receive the first and second sensor signals 12a, 12b from the first and second left and right pickoff sensors 17al, 17ar and 17bl, 17 br. The first and second codecs 122, 124 are also configured to provide the first and second drive signals 14a, 14b to the first and second drive mechanisms 18a, 18 b. In alternative embodiments, more or fewer signal processors may be employed. For example, a single codec may be used for the first and second sensor signals 12a, 12b and the first and second drive signals 14a, 14 b.
In the illustrated embodiment, the one or more memories 130 include a Read Only Memory (ROM) 132, a Random Access Memory (RAM) 134, and a Ferroelectric Random Access Memory (FRAM) 136. However, in alternative embodiments, the one or more memories 130 may include more or less memories. Additionally or alternatively, the one or more memories 130 may include different types of memory (e.g., volatile, non-volatile, etc.). For example, a different type of non-volatile memory, such as, for example, an erasable programmable read-only memory (EPROM), etc., may be employed in place of FRAM 136.
Thus, the meter electronics 100 may be configured to convert the first and second sensor signals 12a, 12b from analog signals to digital signals. The meter electronics 100 is also configured to process the digitized sensor signals to determine properties of the fluid in the first and second meter assemblies 10a, 10 b. For example, in one embodiment, the meter electronics 100 may determine first and second phase differences between the first and second left and right pickoff sensors 17al, 17ar and 17bl, 17br in the first and second meter assemblies 10a, 10b, respectively.
In these and other embodiments, the meter electronics 100 can operate the first and second meter assemblies 10a, 10b with properly selected parameters. For example, one or more parameters (which may include a flow calibration factor, etc.) may be used to calculate a flow rate using signals from the first metering assembly 10a, even though the first metering assembly 10a is communicatively coupled to the metering electronics 100 via the second communication channel 112b, as explained below.
Sensor type。
The meter electronics 100 can be communicatively coupled to the same or different types of meter components. For example, both the first and second metering assemblies 10a, 10b may be 1 inch omega (omega) shaped dual tube coriolis flow meters. That is, the first and second metering assemblies 10a, 10b may be the same product (i.e., the same product number). However, during calibration, the first and second metrology assemblies 10a, 10b may not have the same set of parameters. For example, the first metering assembly 10a may have a different vibrating sensor zero point and flow calibration factor than the second metering assembly 10 b. The set of parameters may be determined during calibration and stored, for example, in one or more memories 130.
However, after calibration, the first and second metrology assemblies 10a, 10b may be decoupled from the metrology electronics 100 to be packaged for shipment, for example. After shipment to, for example, a customer location, the first and second metering assemblies 10a, 10b may be reassembled with the metering electronics 100. As can be appreciated, the first and second metering assemblies 10a, 10b may not be coupled to the first and second communication channels 112a, 112b, respectively. For example, the second meter assembly 10b may be communicatively coupled with the meter electronics 100 via a first communication channel 112a, and the first meter assembly 10a may be communicatively coupled with the meter electronics via a second communication channel 112 b.
Thus, to detect two or more metrology components, the metrology electronics 100 may determine whether the set of parameters is correct (e.g., correctly selected for the first and second metrology components 10a, 10 b) in addition to determining the metrology component type. The electrical properties associated with the first and second metering assemblies 10a, 10b may be used to determine a set of metering assembly types and parameters. For example, electrical properties may be associated with the first and second connectors 200, 300. Thus, the first and second connectors 200, 300 may be used to determine the metering assembly type and determine whether one or more parameters are correct, as will be explained in more detail below.
Connector type。
Fig. 4 shows a first connector type 400 for testing two or more metering assemblies. The first connector type 400 may be consistent with a type I metering component. As shown in fig. 4, the first connector type 400 includes left and right pickup sensors 17l, 17r, a drive mechanism 18, and a temperature sensor 19, which may be the first and second left and right pickup sensors 17al, 17ar and 17bl, 17br, drive mechanisms 18a, 18b, and temperature sensors 19a, 19b, respectively, described previously with respect to fig. 1-3. However, alternative pickup sensors, drive mechanisms, and temperature sensors may be employed in other embodiments.
The left and right pickup sensors 17l, 17R and the drive mechanism 18 are shown via sensor resistors RSAnd a driving resistor RDElectrically coupled to the connector body 410. The connector body 410 includes pins 412 that are electrically coupled to the left and right pickup sensors 17l, 17r, the drive mechanism 18, and the temperature sensor 19. The short 414 is between two of the pins 412 (pins P6 and P7 according to the numbering scheme shown). Due to the short 414, the difference between the pins P5 and P6 or the pin may be measuredThe electrical properties (e.g., resistance) of the temperature sensor 19 between P5 and P7. Thus, if, for example, the first connector type 400 is coupled to the first meter assembly 10a, the meter electronics 100 can measure an electrical property of the first meter assembly 10 a. Because the first connector type 400 may correspond to a type I metering assembly, the first metering assembly 10a may be a type I metering assembly.
Fig. 5 shows a second connector type 500 for testing two or more metering assemblies. The second connector type 500 may be consistent with a type II metering assembly. The second connector type 500 includes a connector body 510 having pins 512 that are electrically coupled to the left and right pickup sensors 17l, 17r and the drive mechanism 18 (which are not shown for clarity). Also shown in fig. 5 is an Identification (ID) resistor 514 used to detect the type of metering assembly. The ID resistor 514 is electrically coupled to pins P6 and P7 and the temperature sensor 19. In addition, pins P6 and P7 are not coupled with a short circuit. As can be appreciated, the electrical properties of the ID resistor 514 between pins P6 and P7 in the second connector type 500 can be measured. Thus, if, for example, the second connector type 500 is coupled to the second metering assembly 10b, the electrical property may be associated with the second metering assembly 10 b. Because the second connector type 500 may correspond to a type II metering assembly, the second metering assembly 10b may be a type II metering assembly.
Fig. 6 shows a third connector type 600 for testing two or more metering assemblies. The third connector type 600 may be consistent with a type III metering assembly. The third connector type 600 includes a connector body 610 having pins 612 that are electrically coupled to the left and right pickup sensors 17l, 17r and the drive mechanism 18 (which are not shown for clarity). An open circuit 614 between two of the pins 612 is also shown. As can be appreciated, an electrical property (e.g., resistance) may be measured between pins P6 and P7. As shown, the electrical property is that of an open circuit, which is distinguishable from the short 414 between pins P6 and P7 shown in fig. 4 and the ID resistor 514 shown in fig. 5.
As can be appreciated, there are alternative meter electronics and connector types that can be used to meter the first and second electrical properties of the assembly, as illustrated by the following discussion.
Replacement connector and meter electronics。
Fig. 7 illustrates a fourth connector type 700 for testing two or more metering assemblies. The fourth connector type 700 includes a connector body 710 having pins 712 that are electrically coupled to the left and right pickup sensors 17l, 17r and the drive mechanism 18 (which are not shown for clarity). Also shown is a short circuit 714 and a temperature sensor 19 between two of the pins 712. As can be appreciated, electrical properties (e.g., resistance) between pins P6 and P7 and between pins P5 and P6 can be measured. As shown, the electrical property between pins P6 and P7 is an electrical short (e.g., resistance of zero, etc.) that is distinguishable from the resistance of the temperature sensor 19 between pins P5 and P6.
Fig. 8 shows a fifth connector type 800 for testing two or more metering assemblies. The fifth connector type 800 includes a connector body 810 having pins 812 that are electrically coupled to the left and right pickup sensors 17l, 17r and the drive mechanism 18 (which are not shown for clarity). Also shown is a short 814 and a temperature sensor 19 between two of the pins 812. As can be appreciated, electrical properties (e.g., resistance) between pins P5 and P6 and between pins P6 and P7 can be measured. As shown, the electrical property between pins P5 and P6 is an electrical short (e.g., zero ohm resistance, etc.) that is distinguishable from the resistance of the temperature sensor 19 between pins P6 and P7.
In the fourth and fifth connector types 700, 800, the resistance between pins P5 and P6 and the resistance between pins P6 and P7 may be used to test two or more meter components. In particular, switches in alternative meter electronics, described in more detail below with reference to fig. 9, may be used to switch the resistance measurements between P5 and P6 and between P6 and P7.
Fig. 9 shows a block diagram of an alternative meter electronics 900. As shown in fig. 9, meter electronics 900 is communicatively coupled to first and second meter assemblies 10a, 10 b. As previously described with reference to fig. 1, the first and second meter assemblies 10a, 10b include first and second left and right pickoff sensors 17al, 17ar, 17bl, 17br, drive mechanisms 18a, 18b and temperature sensors 190a, 190b that are communicatively coupled to meter electronics 900 through first and second connectors 200, 300, communication channels 112a, 112b and I/ O ports 160a, 160b via first and second sets of wires 11a, 11 b.
The meter electronics 900 provides the first and second drive signals 14a, 14b via the first and second communication channels 112a, 112 b. More specifically, the meter electronics 900 provides a first drive signal 14a to a first drive mechanism 18a in a first meter assembly 10 a. The meter electronics 900 is also configured to provide a second drive signal 14b to a second drive mechanism 18b in a second meter assembly 10 b. Furthermore, the first and second sensor signals 12a, 12b are provided by the first and second metering assemblies 10a, 10b, respectively. More specifically, in the illustrated embodiment, the first sensor signal 12a is provided by first left and right pickoff sensors 17al, 17ar in the first metrology assembly 10 a. The second sensor signal 12b is provided by the second left and right pickoff sensors 17bl, 17br in the second metrology assembly 10 b. As can be appreciated, the first and second sensor signals 12a, 12b are provided to the meter electronics 900 via the first and second communication channels 112a, 112b, respectively.
The processor 110 is also communicatively coupled to the user interface 30. Processor 110 is communicatively coupled with the host through path 26 via communication port 140 and receives electrical power via power port 150. The processor 110 and the one or more memories 130 are the same as those described previously with reference to fig. 3. However, the meter electronics 900 includes one or more signal processors 920 that are different from the one or more signal processors 120 described previously. One or more signal processors 920 shown in fig. 9 are communicatively coupled to the first and second metrology assemblies 10a, 10b and the processor 110.
The one or more signal processors 920 are shown to include the first and second codecs 122, 124 and analog-to-digital converter (ADC) 126 described previously with reference to fig. 3. The one or more signal processors 920 may condition the analog signals, digitize the conditioned analog signals, and/or provide digitized signals. The first and second codecs 122, 124 are configured to receive the first and second sensor signals 12a, 12b from the first and second left and right pickoff sensors 17al, 17ar and 17bl, 17 br. The first and second codecs 122, 124 are also configured to provide the first and second drive signals 14a, 14b to the first and second drive mechanisms 18a, 18 b. In alternative embodiments, more or fewer signal processors may be employed. For example, a single codec may be used for the first and second sensor signals 12a, 12b and the first and second drive signals 14a, 14 b.
Between the ADC 126 and the first and second metering modules 10a, 10b is a switching mechanism 928 communicatively coupled to the first and second metering modules 10a, 10b and the ADC 126. The switching mechanism 928 selectively couples the first and second temperature sensors 19a, 19b to the ADC 126. The ADC 126 may convert the temperature signals from the first and second temperature sensors 19a, 19b into first and second digital values and provide the first and second digital values to the processor 110. The first and second digital values may be the resistances of the first and second temperature sensors 19a, 19 b. The switching mechanism 928 selectively communicatively couples one or more pins on the first and second connectors 200, 300 to the ADC 126, as explained in the discussion below. The processor 110 is communicatively coupled to the switching mechanism 928 and is configured to control the switching mechanism 928.
In one example, the first connector 200 may be configured as the fourth connector type 700 described previously with reference to fig. 7. The second connector 300 may be configured as the fifth connector type 800 described previously with reference to fig. 8. Accordingly, the switching mechanism 928 may communicatively couple the pins P5 and P6 in the first connector 200 and the pins P6 and P7 in the second connector 300 with the ADC 126 to measure the resistance of the first and second temperature sensors 19a, 19 b. More specifically, if the first and second metering assemblies 10a, 10b are not swapped between the first and second communication channels 112a, 112b, the switching mechanism 928 may be preconfigured to electrically couple the first and second temperature sensors 19a, 19b to the ADC 126.
However, if the first and second metering assemblies 10a, 10b are swapped between the first and second communication channels 112a, 112b, the switching mechanism 928 may couple the shorts 714, 814 shown in fig. 7 and 8 to the ADC 126. Thus, ADC 126 may digitize a resistance at or near zero ohm resistance. The digitized resistance at or near zero ohms may be provided to the processor 110. The processor 110 may use the resistance at or near zero ohms to determine that the short 714, 814 is communicatively coupled to the ADC 126. The processor 110 may then send a command to the switching mechanism 928 to switch between the two sets of pins in the first and second connectors 200, 300.
More specifically, the processor 110 may send a signal to the switching mechanism 928 to measure the resistance between pins P6 and P7 in the second connector 300 (which is coupled to the first communication channel 112 a) and the resistance between pins P5 and P6 in the first connector 200 (which is coupled to the second communication channel 112 b). Thus, the processor 110 may measure the resistance of the first and second temperature sensors 19a, 19b even though the first and second metering assemblies 10a, 10b are exchanged between the first and second communication channels 112a, 112 b.
While switching between pins in both the first and second metering assemblies 10a, 10b was discussed above, alternative embodiments may switch between pins in only one of the first and second metering assemblies 10a, 10 b. For example, in another alternative meter electronics, a switching mechanism may be coupled to or be part of one of the first and second communication channels 112a, 112 b. In this meter electronics, a switching mechanism may be coupled to the second communication channel 112b and the ADC 126. Further, the second metering assembly 10b is communicatively coupled with the second communication channel 112b via a second connector 300 (which is configured as a fifth connector type 800).
The switching mechanism may be configured to couple pins P6 and P7 in the second connector 300 with the ADC 126. Thus, the ADC 126 can digitize the resistance of the second temperature sensor 19 b. However, if the first and second metering assemblies 10a, 10b are swapped and the first metering assembly 10a (which includes the first connector 200 configured as the fourth connector type 700) is communicatively coupled to the second communication channel 112b, the switching mechanism may communicatively couple the short circuit 714 shown in fig. 7 to the ADC 126. Thus, ADC 126 may digitize a resistance at or near zero ohms. ADC 126 may provide the digitized resistance to processor 110.
Due to the resistance at or near zero ohms, the processor 110 may send commands to the switching mechanism to communicatively couple pins P5 and P6 in the second connector 300 to the ADC 126. Accordingly, the ADC 126 may receive the temperature signal from the first temperature sensor 19a and digitize the temperature signal. The digitized temperature signal may be provided to the processor 110. Thus, the processor 110 may identify the first and second metering assemblies 10a, 10b using switches coupled to only one of the first and second communication channels 112a, 112b, even though the first and second metering assemblies 10a, 10b are exchanged between the first and second communication channels 112a, 112 b.
As can be appreciated, the processor 110 may also identify the first or second metering components 10a, 10b communicatively coupled to the first communication channel 112a by any suitable means after identifying the first and second metering components 10a, 10b using the second communication channel 112 b. For example, the processor 110 may determine that the second metering component 10b must be communicatively coupled to the first communication channel 112a because the first metering component 10a is communicatively coupled to the second communication channel 112 b.
In the foregoing and alternative embodiments, the first and second electrical properties may be used by, for example, meter electronics 100, 900 to detect two or more meter components using various methods performed by meter electronics 100, 900, as illustrated by the following discussion.
Method。
FIG. 10 illustrates a method 1000 for testing two or more metrology assemblies, in accordance with one embodiment. As shown in fig. 10, method 1000 begins by measuring a first electrical property of first and second meter components communicatively coupled with meter electronics (which may be meter electronics 100 described previously). The first and second metering assemblies may be the first and second metering assemblies 10a, 10b also described hereinbefore. In step 1020, the method 1000 may compare the first electrical property to one or more identification values, wherein at least one of the identification values corresponds to one of the first and second metering components.
In step 1010, a first electrical property may be associated with a first connector communicatively coupled to a first metering component and a second connector communicatively coupled to a second metering component. For example, the first electrical property may be a resistance between a first set of two pins on first and second connectors used to communicatively couple the first and second meter assemblies to the meter electronics, respectively. In one embodiment, the first electrical property may be the resistance between pins P5 and P7 of pins 412 and 612 described previously. Thus, the first electrical property is the resistance of the temperature sensor 19. As can be appreciated, the resistance between pins P5 and P7 in the first and second connectors coupled to first and second meter assemblies 10a, 10b, respectively, may be different. For example, the first and second gauge assemblies 10a, 10b may employ different temperature sensors.
In step 1020, comparing the first electrical property to one or more identification values may, for example, include comparing a resistance between a first set of two pins in the first and second connectors 200, 300 to the one or more identification values. In this example, the one or more identification values may include measurements taken by meter electronics 100 during calibration. More specifically, during calibration, a first meter assembly 10a may be communicatively coupled to meter electronics 100 via a first communication channel 112a, and a second meter assembly 10b may be communicatively coupled to meter electronics 100 via a second communication channel 112 b. Meter electronics 100 may measure the resistance between pins P5 and P7 in first and second connectors 200, 300 and save the measured resistance as one or more identification values in one or more memories 130. Thus, if the first and second meter assemblies 10a, 10b are swapped (that is, communicatively coupled to the meter electronics 100 via the second and first communication channels 112b, 112a, respectively), the meter electronics 100 can detect the first and second meter assemblies 10a, 10 b.
Additional steps may be performed. For example, the method 100 may measure a second electrical property of first and second meter components communicatively coupled to meter electronics. The second electrical property may be associated with first and second connectors used to communicatively couple the first and second meter assemblies to meter electronics. For example, the second electrical property may be a resistance between two pins of the second set on the first and second connectors. In one embodiment, the second electrical property may be the resistance between pins P5 and P6 of pins 412 and 612 described previously. As can be appreciated, the resistance between pins P5 and P6 in the first through third connector types 400-600 may include the resistance of the short 414, the ID resistor 514, or the open 614.
Thus, if the first and second metering assemblies 10a, 10b are different types of metering assemblies (e.g., 1 inch versus 3/4 inch flow tubes), the first temperature sensor 19a in the first metering assembly 10a may have a different value than the second temperature sensor 19b in the second metering assembly 10 b. Thus, meter electronics 100 can measure the resistance between a first set of pins in first or second connector 200, 300 through, for example, first communication channel 112a to detect a first or second meter component. More specifically, if the first meter assembly 10a is communicatively coupled to the meter electronics 100 via the first communication channel 112a, the meter electronics 100 can compare the resistance of the first temperature sensor 19a in the first meter assembly 10a to the identification value stored in the one or more memories 130.
Additional steps may be employed such as those employing the second electrical property. For example, the second electrical property, which may be the resistance of the short 414, the ID resistor 514, or the open 614 in the first through third connector types 300-500, may also be used to detect two or more metering components. More specifically, if the first and second connectors 200, 300 include a short 414 and an ID resistor 514, respectively, different resistance values may be used to detect the first and second meter assemblies 10a, 10 b. Accordingly, if the first and second metering assemblies 10a, 10b are the same type of metering assembly (e.g., both are 1 inch omega-shaped flow tube coriolis meters), the second electrical property may be used to distinguish the first and second metering assemblies 10a, 10 b. More specifically, in this example, because the first and second metering assemblies 10a, 10b are the same type of metering assembly, it is not possible to distinguish the first electrical property between the first and second metering assemblies 10a, 10 b. Because the first connector 200 has the short 414 and the second connector 300 has the ID resistor 514, the first and second metering assemblies 10a, 10b will have different second electrical properties and can therefore be detected even if the first and second metering assemblies 10a, 10b are the same type of metering assembly. As can be appreciated, other approaches may be employed, as illustrated by the following discussion.
11A and 11B illustrate a method 1100 of testing two or more metrology assemblies in accordance with another embodiment. The method 1100 begins at step 1110 by measuring first and second electrical properties of first and second metrology assemblies. The first and second metrology assemblies may be first and second metrology assemblies 10a, 10b coupled to the metrology electronics 100 described previously. In the following steps 1120 to 1190, the method 1100 may select one or more parameters based on the one or more identification values and the comparison between the first and second electrical properties. Steps 1120 to 1190 may also correlate the one or more parameters to at least one of the one or more metering components based on a comparison between the first or second electrical values and the identification value. The following steps 1120 to 1190 may also verify that the correlation is correct by, for example, driving the first and second metering components and verifying that one or more parameters are correct.
In step 1120, the method 1100 determines whether the first electrical property is the same as the identification value, which may be one of the one or more identification values. The identification value may be a measurement of the first electrical property obtained during calibration of the first and second meter assemblies. If the first electrical property is not the same, the method 1100 continues to step 1160. If the first electrical property is the same, the method 1100 continues to step 1130. In step 1130, the second electrical property is compared to an identification value (which may be one of the one or more identification values). If the second electrical property is not the same, the method 1100 continues to step 1160. If the second electrical property is the same, the method 1100 continues to step 1140.
In step 1140, the method 1100 drives the first metrology assembly using one or more parameters. In step 1150, the method 1100 determines whether one or more parameters are correct. For example, the method 1100 may determine whether the one or more parameters are correct by determining whether the first and second metering components passed metering verification, correctly calculating flow rates, and so forth. If one or more parameters are correct, the method 1100 continues to step 1190, which is a determination that the metering component is detected. If the parameters are not correct, the method 1100 continues to step 1160.
In step 1160, the method 1100 drives the second metrology assembly using one or more parameters. In other words, the one or more parameters are switched from the first metering component to the second metering component. After switching the one or more parameters, the method determines in step 1170 if the one or more parameters are correct. If the one or more parameters are not correct, the method 1100 generates an error message in step 1180. If the one or more parameters are correct, the method 1100 continues to step 1190, which is a determination that the first and second metrology components are detected.
Because the metering assemblies 10a, 10b may be detected, the meter electronics 100 may be configured to communicate with the first and second metering assemblies 10a, 10 b. The meter electronics 100 may be configured to communicate with the first and second meter assemblies 10a, 10b based on the agreement between the identification value and the meter assembly. For example, once meter electronics 100 determines that first and second meter assemblies 10a, 10b are 1 and 3/4 inch conduit flow meters, respectively, meter electronics 100 may be configured with appropriate flow calibration factors, phase detection algorithms, and so forth. By being properly configured to communicate with the first and second metrology assemblies 10a, 10b, the metrology electronics 100 can accurately measure the properties of the material in the conduits 13a, 13a ', 13 b'.
The embodiments described above detect two or more metrology assemblies. As explained previously, the dual vibration sensor system 5, the meter electronics 100, and/or the methods 1000, 1100 may detect two or more meter components by measuring first and second electrical properties of the first and second meter components 10a, 10 b. Using the first and second electrical properties, the dual vibration sensor system 5, the meter electronics 100, and/or the methods 1000, 1100 may determine whether one or more parameters corresponding to the first and second meter assemblies 10a, 10b are correct. By determining whether the one or more parameters are correct, the dual vibration sensor system 5 can operate correctly, even if configured differently than during calibration.
For example, in cryogenic applications (such as the LNG fueling system shown in fig. 1), metering electronics 100 may be configured for both a first metering assembly 10a at LNG supply line SL and a second metering assembly 10b at LNG return line RL. First metering assembly 10a may be a 1 inch coriolis meter and second metering assembly 10b may be an 3/4 inch coriolis meter. The metering electronics 100 may thus detect the first and second metering assemblies 10a, 10b to accurately measure the LNG flow rate in both the supply line SL and the return line RL without human intervention by an operator. Other cryogenic fluids, such as hydrogen, and the like, may be employed.
The above detailed description of embodiments is not an exhaustive description of all embodiments contemplated by the inventors to be within the scope of the present description. Indeed, those skilled in the art will recognize that certain elements of the above-described embodiments may be variously combined or eliminated to create further embodiments, and that such further embodiments fall within the scope and teachings of the present description. It will also be apparent to those of ordinary skill in the art that the above-described embodiments may be combined in whole or in part to create additional embodiments within the scope and teachings of the present description.
Therefore, while specific embodiments have been described herein for purposes of illustration, various equivalent modifications are possible within the scope of the description, as those skilled in the relevant art will recognize. The teachings provided herein may be applied to other systems and methods of testing two or more metrology assemblies and are not limited to use with only the embodiments described above and shown in the accompanying drawings. Accordingly, the scope of the embodiments described above should be determined from the following claims.
Claims (16)
1. A method for inspecting two or more metrology assemblies, the method comprising:
measuring a first electrical property of a first metrology assembly and a second metrology assembly communicatively coupled with metrology electronics; and
comparing the first electrical property to one or more identification values,
wherein at least one of the one or more identification values corresponds to one of the first metering component and the second metering component such that a metering component type and one or more parameters of the first metering component and the second metering component may be determined using the first electrical property.
2. The method of claim 1, wherein:
the first electrical property is associated with a first connector communicatively coupled to a first metering component and a second connector communicatively coupled to a second metering component; and
the second electrical property is associated with a first connector communicatively coupled to the first metering component and a second connector communicatively coupled to the second metering component.
3. The method of one of claim 1 or claim 2, further comprising selecting one or more parameters based on a comparison between the first electrical property and one or more identification values.
4. The method of claim 1 or claim 2, wherein the first electrical property is a resistance of a temperature sensor and the second electrical property is a resistance of a resistor.
5. The method of claim 1 or claim 2, further comprising detecting one of a first metering component and a second metering component based on a comparison between the first electrical property and one or more identification values.
6. The method of claim 1 or claim 2, further comprising:
measuring a second electrical property of a first metrology assembly and a second metrology assembly communicatively coupled with metrology electronics; and
comparing the second electrical property to one or more identification values.
7. A method of testing two or more metrology assemblies, the method comprising:
measuring an electrical property of two or more meter components communicatively coupled to meter electronics;
comparing the electrical property to an identification value, wherein the identification value corresponds to at least one of the two or more metering components, such that a metering component type and one or more parameters of the two or more metering components may be determined using the first electrical property; and
correlating one or more parameters with at least one of the two or more metering components based on a comparison between the electrical property and the identification value.
8. The method of claim 7, further comprising driving at least one of the two or more metering assemblies to determine whether the one or more parameters are properly related to the at least one of the two or more metering assemblies.
9. The method of one of claim 7 or claim 8, wherein correlating one or more parameters to two or more metering components comprises:
a first metering assembly that drives the two or more metering assemblies using the one or more parameters; and
determining that the one or more parameters are properly related to the first metering assembly based on a response from the driven first metering assembly.
10. The method of claim 7 or claim 8, wherein correlating one or more parameters to two or more metering components comprises:
driving a first metering assembly of the two or more metering assemblies using one or more parameters;
determining, based on a response from the driven first metering assembly, that the one or more parameters are not correctly associated with a first metering assembly of the two or more metering assemblies; and
driving a second metering assembly of the two or more metering assemblies using the one or more parameters.
11. A dual vibration sensor system (5) for sensing two or more metrology components, the dual vibration sensor system (5) comprising:
meter electronics (100);
a first metrology assembly (10 a) communicatively coupled to the metrology electronics (100); and
a second metrology assembly (10 b) communicatively coupled to the metrology electronics (100);
wherein the meter electronics (100) is configured to:
measuring a first electrical property of the first gauge assembly (10 a) and the second gauge assembly (10 b); and
the first electrical property is compared to one or more identification values, wherein each of the one or more identification values corresponds to one of the first metering component (10 a) and the second metering component (10 b) such that the metering component type and the one or more parameters of the first metering component and the second metering component may be determined using the first electrical property.
12. The dual vibration sensor system (5) of claim 11, wherein the first electrical property is associated with a first connector (200) and a second connector (300), and wherein the first connector (200) communicatively couples the first metering assembly (10 a) with the meter electronics (100) and the second connector (300) communicatively couples the second metering assembly (10 b) to the meter electronics (100).
13. The dual vibration sensor system (5) of one of claim 11 or claim 12, wherein the first electrical property is a resistance of a temperature sensor (19 a) and the second electrical property is a resistance of one of a short circuit (414), an identification resistor (514), and an open circuit (614).
14. The dual vibration sensor system (5) of claim 11 or claim 12, wherein the meter electronics (100) is further configured to select one or more parameters based on a comparison between the first electrical property and one or more identification values.
15. The dual vibration sensor system (5) of claim 11 or claim 12, wherein the meter electronics (100) is further configured to correlate one or more parameters to one of the first meter assembly (10 a) and the second meter assembly (10 b).
16. The dual vibration sensor system (5) of claim 11 or claim 12, wherein the meter electronics (100) is further configured to:
measuring a second electrical property of the first gauge assembly (10 a) and the second gauge assembly (10 b); and
comparing the second electrical property to one or more identification values.
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