CN107064704A - Rfid tag performance test system - Google Patents
Rfid tag performance test system Download PDFInfo
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- CN107064704A CN107064704A CN201710154534.3A CN201710154534A CN107064704A CN 107064704 A CN107064704 A CN 107064704A CN 201710154534 A CN201710154534 A CN 201710154534A CN 107064704 A CN107064704 A CN 107064704A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/133—Arrangements for measuring electric power or power factor by using digital technique
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/165—Spectrum analysis; Fourier analysis using filters
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K17/00—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations
- G06K17/0022—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations arrangements or provisious for transferring data to distant stations, e.g. from a sensing device
- G06K17/0029—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations arrangements or provisious for transferring data to distant stations, e.g. from a sensing device the arrangement being specially adapted for wireless interrogation of grouped or bundled articles tagged with wireless record carriers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/0722—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips comprising an arrangement for testing the record carrier
Abstract
The invention discloses a kind of RFID tag Performance Test System.Wherein, the system includes：Comprehensive test instrument, is communicated by data-interface with host computer, receives the test instruction that host computer is sent, and the instruction of comprehensive test instrument response test sends test signal, wherein, test signal is used to indicate to test RFID tag performance；Power amplifier, is connected with comprehensive test instrument, is amplified for the power to test signal；RF switching unit, communicates with host computer, the selection instruction that response host computer is sent selection target antenna in many strip antennas, wherein, a plurality of antenna loop sends the test signal after amplification to RFID tag, to carry out performance test to RFID tag around being distributed in around RFID tag by target antenna.The present invention solves the slow-footed technical problem of performance test of RFID tag.
Description
Technical field
The present invention relates to technical field of measurement and test, in particular to a kind of RFID tag Performance Test System.
Background technology
Conventional RFID tag performance test scheme is usually according to international standard (such as ISO18046-3 or EPC global
Tag Performance) defined method of testing tested, and in order to be able to improve the accuracy of test result, testing standard will
Ask and take multiple samples to be tested one by one on tested label, then all results are counted, so as to obtain final test
As a result.When measuring the orientation tolerance of label, because the level angle and vertical angle that need to measure are more, total testing time,
And test speed is limited to rotary speed and the delay of mechanical turntable, so whole test process often will continue a few houres even
Ten a few houres.In addition, original RFID tag performance test methods are typically used as measurement mark using the recognition distance under single direction
The characteristic value of chemotaxis energy, and in practical application scene, recognition distance can not embody the overall signal reception of outgoing label.
Fig. 1 is a kind of structure chart of the system of RFID tag performance test according to correlation technique, as shown in figure 1, this is
System includes host computer (computer in Fig. 1), and RFID reader, circulator tests antenna, and measured piece (RFID tag), turntable (turns
Dynamic measured piece), spectrum analyzer, middleware (including GPIB LAN USB) etc., wherein, GPIB is general purpose interface bus, and LAN is
LAN, USB is USB.RFID reader can send interactive instruction, and to test the performance of measured piece, RFID is read
Write device by testing antenna can be sent to measured piece by interactive instruction signal, and measured piece, can be according to interaction after being activated
Command signal, sends certain reverse signal into read write line, in the content shown in the Fig. 1, spectrum analyzer can be analyzed
Go out the signal that read write line or measured piece are sent, and the numerical value such as the power by the signal frequency obtained after analysis or signal is sent to
In middleware, corresponding test result information is sent into host computer by middleware.Wherein, antenna, measured piece are tested and is turned
Platform etc. is sent in test signal arrival measured piece, the circulator can be company in a dark room conditions in order to test antenna
Output interface TX and test antenna and the spectrum analysis of RFID reader are connect, the test signal that RFID reader is exported is changed
To test antenna, the RX interfaces of RFID reader can receive the reverse signal of measured piece transmission.Optionally, the test in Fig. 1
Antenna is one, and the quilt of the angle and direction formation three-dimensional perspective of measured piece, test all angles and direction is adjusted by turntable
Survey the performance of part.
The measurement result of RFID tag performance can embody outgoing label in different operating frequency, different angles, disturbance
Under service behaviour.Led in test system by software control signals source or RFID reader with the label in screened room
Letter, and control the level angle and vertical angle of three-dimensional turntable to measure sensitivity of the label under different azimuth, finally
Obtain the sensitivity results in the whole directions of label.
It is general that the excitation set of label, survey are used as using signal source or RFID reader in traditional RFID performance tests
Examination process is completely by PC control, testing process as shown in Fig. 2 host computer is preceding to instruction and configuration frequency to signal source configuration
Power, signal source is completed after a tag access, will be accessed result and is returned to host computer, host computer carries out data analysis and display,
Host computer adjusts transmission power by the power and frequency of this access, then, and signal source can complete secondary label visit again
Ask, and result is returned into host computer, so constantly adjustment is transmitted into the access power and frequency of label, to adjust the work(of test
Rate.So, host computer is interacted every time with signal source needs the call duration time of a large amount of (such as 500-1000ms), and signal source is entered to label
Row access is also required to need constantly to adjust transmission power until that can succeed during the time of largely (such as 100ms), actual test
Label is activated, this process may need repeated multiple times (such as 10-20 times), so complete just needing total time for a tag activation
Want many times (such as 15-30s).
There are various problems in existing RFID tag performance measurement mode：Firstly, since measurement is using single antenna and three-dimensional turn
Platform is measured, and needs simultaneously to test all positions of horizontal and vertical angle one by one when measuring tag orientation,
Often change a direction be required for control turntable rotated, had when stopping due to turntable mechanical shaking it is all also need to addition
Appropriate delay just can guarantee that the precision of measurement, and one piece of labeling requirement time of measurement is very long, and tag performance test generally requires to survey
Measure great amount of samples and carry out result statistics.
Secondly, label in actual use, because read write line can install multiple antennas in different angles, so shadow
Ring tag reader performance is not only the sensitivity of single direction, and the total omnidirectional sensitivity of label is also to weigh tag performance
Important indicator.
Finally, performance test mainly reacts the reality of label by measuring receiving sensitivity of the label under different conditions
Border service behaviour, and space loss is to influence one of principal element of measurement result, different dark room conditions and measuring distance are all
There can be large effect to space loss value, not carry out strict calibration to space loss value in traditional testing scheme
Process, substitutes sensitivity test result using the equivalent recognition distance under 35dBm more.
For the above-mentioned slow-footed problem of the performance test for RFID tag, effective solution party is not yet proposed at present
Case.
The content of the invention
The embodiments of the invention provide a kind of RFID tag Performance Test System, surveyed with the performance at least solving RFID tag
Try slow-footed technical problem.
One side according to embodiments of the present invention there is provided a kind of RFID tag Performance Test System, including：It is comprehensive to survey
Instrument, is communicated by data-interface with host computer, receives the test instruction that the host computer is sent, and the comprehensive test instrument response is described to survey
Examination instruction sends test signal, wherein, the test signal is used to indicate to test RFID tag performance；Power amplification
Device, is connected with the comprehensive test instrument, is amplified for the power to the test signal；RF switching unit, it is and described upper
Machine communicates, the selection instruction that the response host computer is sent selection target antenna in many strip antennas, wherein, a plurality of antenna
Around being distributed in around the RFID tag, marked by the test signal after target antenna transmission amplification to the RFID
Label, to carry out performance test to the RFID tag.
Further, the system also includes：First analytic unit, is arranged on spectrum analyzer, is receiving reversely
In the case of signal, the reverse signal is analyzed, wherein, the reverse signal is to be believed by the test after the amplification
The signal returned after number activation RFID tag.
Further, the system also includes：Dispensing unit, for before the host computer sends test instruction, ringing
The configuration-direct that the host computer is sent is answered to configure the parameter of the comprehensive test instrument, wherein, the parameter includes：Send institute
State frequency, the initial power of the test signal and the power step value of test signal.
Further, the comprehensive test instrument also includes：Signal trigger element, does not swash for the test signal after the amplification
In the case of the RFID tag living, triggering generation test signal, and send the test signal to activate the RFID again
Label, wherein, the power of the test signal is target power, the target power be the power based on the test signal by
Power after being adjusted according to preset algorithm.
Further, the system also includes：Recording unit, for the anti-of the RFID tag return after activation is received
In the case of being more than default value to the success rate of signal, the power output of the comprehensive test instrument is recorded；Computing unit, according to described
The power output of comprehensive test instrument calculates the power threshold of the activation RFID tag.
Further, the preset algorithm is dichotomy.
Further, many strip antennas are distributed on the annulation of preset diameters, and the RFID tag is arranged on described
In annulation.
Further, the comprehensive test instrument includes：Signal generator, life is instructed for responding the test that the host computer is sent
Into baseband signal；First signal conditioner, is connected with the signal generator, the carrier frequency for adjusting the baseband signal
Rate；Signal amplifier, is connected with first signal conditioner, for amplifying the baseband signal after regulation, is handled
Baseband signal afterwards, regard the baseband signal after processing as the test signal.
Further, the comprehensive test instrument also includes：Secondary signal adjuster, for receiving reverse signal, and adjusts described
The carrier frequency of reverse signal, wherein, the reverse signal is to activate the RFID by the test signal after the amplification to mark
The signal returned after label；Demodulator of PM signal PM, is connected with the secondary signal adjuster, for the reverse signal after regulation
It is demodulated, obtains demodulated signal；Programmable device, is connected with the demodulator of PM signal PM, is surveyed for being generated according to the demodulated signal
Test result information, and the test result information is sent to the host computer.
Further, the system also includes：Second analytic unit, is arranged on the host computer, described receiving
After test result information, the test result information is analyzed and/or shown.
In embodiments of the present invention, comprehensive test instrument can be communicated by data-interface with host computer, receive what host computer was sent
Test instruction, comprehensive test instrument response test instruction sends test signal, and the power of test signal is put by power amplifier
Greatly, and by RF switching unit communicated with host computer, the selection instruction that response host computer is sent selects mesh in many strip antennas
Antenna is marked, so that the test signal after amplification is sent to RFID tag by target antenna, to carry out performance survey to RFID tag
Examination.According to the embodiment, correlated performance test can be carried out to RFID tag by comprehensive test instrument control, by selecting many strip antennas
In a certain strip antenna send test signal to test the performance of RFID tag, so as to test RFID by changing different antennas
The performance of label, rather than its performance is tested by rotating RFID tag, compared with original technology, RFID marks can be improved
The speed of performance test is signed, the slow-footed technical problem of performance test of RFID tag is solved.
Brief description of the drawings
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the part of the application, this hair
Bright schematic description and description is used to explain the present invention, does not constitute inappropriate limitation of the present invention.In the accompanying drawings：
Fig. 1 is a kind of structure chart of the system of RFID tag performance test according to correlation technique；
Fig. 2 is according to a kind of flow chart of RFID tag performance test in correlation technique；
Fig. 3 is a kind of schematic diagram of RFID tag Performance Test System according to embodiments of the present invention；
Fig. 4 is a kind of structure chart of the system of optional RFID tag performance test according to embodiments of the present invention；
Fig. 5 be according to embodiments of the present invention in be used for RFID tag performance test comprehensive test instrument structure chart；
Fig. 6 is adjustment tag activation power in a kind of optional RFID tag performance test according to embodiments of the present invention
Schematic diagram.
Embodiment
In order that those skilled in the art more fully understand the present invention program, below in conjunction with the embodiment of the present invention
Accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only
The embodiment of a part of the invention, rather than whole embodiments.Based on the embodiment in the present invention, ordinary skill people
The every other embodiment that member is obtained under the premise of creative work is not made, should all belong to the model that the present invention is protected
Enclose.
It should be noted that term " first " in description and claims of this specification and above-mentioned accompanying drawing, "
Two " etc. be for distinguishing similar object, without for describing specific order or precedence.It should be appreciated that so using
Data can exchange in the appropriate case, so as to embodiments of the invention described herein can with except illustrating herein or
Order beyond those of description is implemented.In addition, term " comprising " and " having " and their any deformation, it is intended that cover
Lid is non-exclusive to be included, for example, the process, method, system, product or the equipment that contain series of steps or unit are not necessarily limited to
Those steps or unit clearly listed, but may include not list clearly or for these processes, method, product
Or the intrinsic other steps of equipment or unit.
First, the part noun or term occurred during the embodiment of the present application is described is applied to following solution
Release：
RFID tag：Including coupling element and chip, each RFID tag has unique electronic code, is attached to object
Upper mark destination object, is commonly called as RFID.RFID tag operation principle：Label enters behind magnetic field, receives card reader hair
The radiofrequency signal gone out, sends out the product information of storage in the chips, or actively send out by the energy that induced-current is obtained
Send the signal of a certain frequency；After card reader reads information and decoded, deliver to CIS and carry out relevant data processing.RFID
Label is a kind of contactless automatic identification technology, and it is by card reader radiofrequency signal automatic identification destination object and obtains phase
Data are closed, identification work is operable with various adverse circumstances without manual intervention.RFID technique can recognize that high-speed moving object simultaneously
Multiple RFID tags can be recognized simultaneously.
EIRP(Effective Isotropic Radiated Power)：Equivalent isotropically radiated power is that antenna is obtained
The size for the power that power is radiated in all directions with antenna with the product of the dBi gains represented, reflection antenna.
TRP(Total Radiated Power)：Line Integral is carried out by the transmission power to whole radiation sphere and taken
Averagely obtain.It reflects the transmission power situation of mobile phone complete machine, with transmission power of the mobile phone under conduction condition and aerial radiation
Performance is relevant.
TIS(Total Isotropic Sensitivity)：It is reflected in whole radiation sphere mobile phone receiving sensitivity index
Situation.It reflects the receiving sensitivity situation of mobile phone complete machine, has with the conducted susceptibility of mobile phone and the radiance of antenna
Close.
OTA (Over-the-Air Technology) over the air.The application of OTA technologies so that mobile communication
Voice-and-data service can be not only provided, and new business download can also be provided.
TRP is tested, and equipment under test is in maximum transmission power state, selects high, normal, basic three channels to be tested, right
Need to carry out the test under the conditions of two kinds in the test equipment of retractable aerial.Also needed to for portable set as mobile phone
Tested under number of people simulated conditions.
TIS is tested, and equipment under test is in maximum transmission power state, selects high, normal, basic three channels to be tested, right
Need to carry out the test under the conditions of two kinds in the test equipment of retractable aerial.Also needed to for portable set as mobile phone
Tested under number of people simulated conditions.
CTIA：U.S.'s radio communication and internet society, are a global nonprofit organizations for being found in 1984.
CTIA (Cellular Telecommunication and Internet Association) has formulated OTA (Over The
Air relevant criterion).
Dual polarized antenna is a kind of new antenna technology, is combined with the mutually orthogonal antenna of two secondary polarised directions and simultaneously work
Make under transmission duplex pattern.
Up-conversion：Refer in the frequency spectrum frequency displacement of baseband signal to required higher carrier frequencies.Connect in superhet
In receipts machine, if the intermediate-freuqncy signal obtained after mixing is higher than primary signal, then such a mixing schemes are called up-conversion.
Down coversion：In superheterodyne receiver, if the intermediate-freuqncy signal obtained after mixing is lower than primary signal, that
Such a mixing schemes are called down coversion.
Spectrum analyzer, is the instrument for studying electric signal spectrum structure, for signal distortion, percentage modulation spectral purity, frequency
The measurement of the signal parameter such as rate stability and crosstalk, can be used to some ginsengs of the circuit systems such as measuring amplifier and wave filter
Number, is a kind of multiduty electronic measuring instrument.
The specific embodiment of the present invention is explained below.
This application provides a kind of RFID tag Performance Test System as shown in Figure 3, Fig. 3 is according to embodiments of the present invention
A kind of RFID tag Performance Test System schematic diagram.As shown in figure 3, the system includes：Comprehensive test instrument 31, passes through data-interface
Communicated with host computer, receive the test instruction that host computer is sent, the instruction of comprehensive test instrument response test sends test signal, wherein, survey
Trial signal is used to indicate to test RFID tag performance；Power amplifier 33, is connected with comprehensive test instrument, for test signal
Power be amplified；RF switching unit 35, communicates with host computer, and the selection instruction that response host computer is sent is in many strip antennas
Middle selection target antenna, wherein, a plurality of antenna loop sends the survey after amplification around being distributed in around RFID tag by target antenna
Trial signal is to RFID tag, to carry out performance test to RFID tag.
In embodiments of the present invention, comprehensive test instrument 31 can be communicated by data-interface with host computer, received host computer and sent
Test instruction, the response test of comprehensive test instrument 31 instruction send test signal, pass through power of the power amplifier 33 to test signal
It is amplified, and is communicated by RF switching unit 35 with host computer, the selection instruction that response host computer is sent is in many strip antennas
Middle selection target antenna, so that the test signal after amplification is sent to RFID tag by target antenna, to enter to RFID tag
Row performance test.According to the embodiment, it can control to carry out correlated performance test to RFID tag by comprehensive test instrument 31, pass through choosing
Select a certain strip antenna in many strip antennas and send test signal to test the performance of RFID tag, so that by switching different antennas
To test the performance of RFID tag, rather than test by rotating RFID tag its performance, compared with correlation technique, Ke Yiti
The speed of high RFID tag performance test, so that the slow-footed technical problem of the performance test for solving RFID tag.
Can be a kind of test equipment for the comprehensive test instrument 31 in above-described embodiment, the comprehensive test instrument 31 can be used for pair
RFID tag performance is tested, and is instructed by the test for receiving host computer, is generated corresponding test signal, and the test is believed
The other equipment for the test system being connected with comprehensive test instrument 31 number is sent to, other equipment is based on the test signal, to RFID tag
Correlated performance tested, with obtain participate in test one or more RFID tags properties.Optionally, comprehensive test instrument
31 can also analyze the test result after the test result of RFID tag is obtained, and test result information are sent to upper
In machine, so that host computer is referred to, host computer can adjust corresponding test parameter according to the test result, so that preferably right
The performance of RFID tag is tested.
Optionally, the host computer in the embodiment of the present invention can be terminal device, for example, computer terminal, PC, mobile terminal
Deng, the host computer to comprehensive test instrument 31 by sending test instruction, to control comprehensive test instrument 31 to test the performance of RFID tag,
So as to analyze the properties of RFID tag to be tested；The parameter of test RFID tag can be pre-configured with host computer,
When sending test instruction, the FRID label information of the parameter information of test and test can be sent in comprehensive test instrument 31, with
Comprehensive test instrument 31 is enabled to show the essential information for the RFID tag that will be tested, wherein, the essential information can include RFID marks
The information such as the sequence number of label.
It should be noted that the test signal of above-described embodiment can be a kind of data signal, comprehensive test instrument 31 can pass through
Data output interface sends the test signal into power amplifier 33, to instruct external equipment to needs by the test signal
The RFID tag of test performance is tested.Wherein, comprehensive test instrument 31 can use default initial power when sending test signal
Rate is sent, and when starting test, comprehensive test instrument 31, which is not aware that, can activate the performance number of RFID tag, send test signal
Afterwards, it is necessary to adjust the output power value of test signal when not receiving the reverse signal of RFID tag return in preset time, then
It is secondary to send the test signal after adjustment power to activate RFID tag.Optionally, the activation power of each RFID tag is critical
Value is differed, and comprehensive test instrument 31 can send above-mentioned test with less initial power and believe when starting to send test signal
Number, for example, initial power is 5dB.
Another optional embodiment, during test signal is transmitted, can produce power consumption, reach RFID marks
The power of the test signal of label can be reduced gradually, in such a case, it is possible to using power amplifier 33, to amplify test signal
Power, pass through the power amplifier 33, can by send amplification after test signal reach RFID tag, to activate RFID
Label.
Optionally, in embodiments of the present invention, can by the selection target antenna of RF switching unit 35, wherein, radio frequency
Switch element 35 can connect many strip antennas.RF switching unit 35 is selected after selection instruction is received according to the selection instruction
Corresponding antenna is selected, the antenna can be considered as target antenna, by sending test signal to target antenna, target antenna will be tested
Signal is sent to RFID tag, is tested with the performance to RFID tag, and the relative position of every strip antenna and RFID tag is
Different, the adjacent locations for the test signal that RFID tag antenna is sent are also different, the speed of its response test signal
The power of degree and response test signal is also differed, and the performance of RFID tag is tested by different antennas, can be more comprehensively
Understanding RFID tag performance.Wherein, the structure of RF switching unit 35 can enter N and go out for one, wherein, N is total for antenna
Number, RF switching unit 35 can receive a test signal every time, and response test signal selects correspondence according to the test signal
Connecting line, to test the performance of RFID tag by the connecting line of selection, and transmitted test signals to pair by connecting line
In the target antenna answered, i.e., RF switching unit 35 can send a test signal into corresponding target antenna every time, many
Each strip antenna be able to can communicate with RFID tag in strip antenna, by selection target antenna, send from different directions
Test signal can only need to horizontally rotate, no to RFID tag with the rotation of less RFID tag, the turntable of such RFID tag
Vertical rotation is needed, the time of RFID tag rotation is reduced, accelerates test speed.
Wherein, RF switching unit 35 is connected with each strip antenna in many strip antennas respectively, and many strip antennas are distributed in
Around RFID tag, i.e., many strip antennas can be with distribution in a variety of shapes, with around RFID tag, so as to pass through different directions
(selecting different antennas) is tested RFID tag, optionally, and the shape of distribution can be annular, square frame etc., at this
It is not construed as limiting in application.
It is preferred that, the antenna distribution shape in the embodiment of the present invention can be annular, be distributed around RFID tag, this
Sample, the distance of each antenna distance RFID tag can be consistent, be not in the Different Effects performance test due to distance
Result.
Optionally, the antenna in the embodiment of the present invention can be dual polarized antenna.
For the dual polarized antenna of above-mentioned embodiment, it can be used for antenna complanation or verticalization for carrying out RFID tag
Test, carries out the adjustment to antenna direction, tests out the test letter that RFID tag responsive antenna is sent in all directions or angle
Number sensitivity and the response time.The dual polarized antenna can be used for the performance for testing RFID tag from many aspects.
For the test system of above-described embodiment, it can also include：First analytic unit, is arranged on spectrum analyzer
On, in the case where receiving reverse signal, reverse signal is analyzed, wherein, reverse signal is to pass through the survey after amplification
The signal returned after trial signal activation RFID tag.
Wherein, the first analytic unit can analyze reverse signal, the reverse signal can be activation RFID tag after,
RFID tag response test signal, the response signal sent, wherein, the response signal can be considered as reverse signal, wherein, reversely
The information of RFID tag storage can be carried in signal, includes the coding of RFID tag, the digital information of storage.In RFID marks
Sign and issue when giving the reverse signal, the frequency of reverse signal, RFID tag response test can be analyzed by the first analytic unit and is believed
Number sensitivity etc..Wherein, test signal can be by sending multiple test signal, to activate RFID tag, here, each
RFID tag has the scope of an activation power, the critical value that there is an activation RFID tag in this scope, is facing
RFID tag can not be activated below dividing value, comprehensive test instrument 31 needs to resend test signal, exceed in the power of test signal and face
Dividing value and activation power in the range of in the case of, RFID tag can respond the test signal send reverse signal.It is optional
, the first analytic unit can analyze RFID tag and send the ginseng such as frequency, power, sensitivity or response time of reverse signal
Number information；In addition, the information such as frequency that power and test signal that the first analytic unit can also analyze test signal are sent,
And send the information analyzed into host computer, so that host computer is analyzed and is shown.
Another optional embodiment, said system can also include：Dispensing unit, for sending test in host computer
Before instruction, the configuration-direct that response host computer is sent is configured to the parameter of comprehensive test instrument 31, wherein, parameter includes：Send
The frequency of test signal, the initial power of test signal and power step value.
Optionally, the parameter information of configuration comprehensive test instrument 31 can be carried in configuration-direct, by being carried out to parameters
Configuration, to cause comprehensive test instrument 31 when sending test signal, adjustment sends information, including sends the frequency of test signal, the hair
How long send the frequency of test signal can send a test signal for interval, if being not received by within interval time
The reverse signal that RFID tag is sent, then need comprehensive test instrument 31 to send test signal again, wherein, interval time can be by upper
Position machine is set, the Time Inconsistency of setting, for example, 1 second, 1.5 seconds.Optionally, the initial power of test signal can be advance
The performance number of the activation RFID tag of setting, the performance number is a kind of preset value, and host computer does not know the activation work(of RFID tag
Rate value is, it is necessary to which repeatedly test, can just obtain the power threshold of an activation RFID tag.
Optionally, the power step value in above-mentioned embodiment can be that comprehensive test instrument 31 is not received by the given time
After the signal of RFID tag feedback, it is each test signal power that adjustment, which sends the performance number of test signal, i.e. power step value,
The increase numerical value of the test signal performance number sent relative to last time.Optionally, the power step value can be pre-set,
Such as 5db.
It should be noted that above-mentioned comprehensive test instrument 31 can also include：Signal trigger element, for test after amplification
In the case of signal un-activation RFID tag, triggering generation test signal, and send test signal to activate RFID tag again,
Wherein, the power of test signal is target power, and target power is that the power based on test signal is adjusted according to preset algorithm
Power after whole.Wherein, the preset algorithm can be dichotomy, i.e., when finding target power, what comprehensive test instrument 31 was sent every time
The power of test signal can be the performance number added up on the power level of the upper test signal once sent, the work(added every time
Rate value can be above-mentioned power step value, and after test signal can activate RFID tag, power is searched out by dichotomy
Critical value, after halving between the power of this test signal and the power of last time test signal, whether inquiry still can be with
RFID tag is activated, if can activate, according to dichotomy, constantly searches for activating the critical value of RFID tag.
Above-mentioned signal trigger element be used for send trigger signal, to activate RFID tag, RFID tag not by
, it is necessary to which trigger element informs that other units in comprehensive test instrument 31 send test signal again, to adjust transmission in the case of activation
The power of test signal, trial activates RFID tag again.
Optionally, above-mentioned system can also include：Recording unit, is returned for the RFID tag after activation is received
Reverse signal success rate be more than default value in the case of, record comprehensive test instrument 31 power output；Computing unit, according to comprehensive
The power output for surveying instrument 31 calculates the power threshold of activation RFID tag.
Wherein, default value can be the threshold value pre-set, such as 50%, being more than in the success rate of activation RFID tag should
During default value, can by recording unit records now comprehensive test instrument 31 send test signal power, for host computer analyze
Use, above-mentioned power output is the power of the test signal of comprehensive test instrument 31, can also record the corresponding antenna of test signal,
The information such as the direction of RFID tag and the time of RFID tag response test signal.
Can be the minimal power values of activation RFID tag for above-mentioned power threshold, test signal exceeds the work(
Rate critical value, can activate the label.Different antennas is in different positions, and the power threshold of activation RFID tag is different
's.
It should be noted that many strip antennas in the embodiment of the present invention are distributed on the annulation of preset diameters, RFID marks
Label are arranged in annulation.Many strip antennas can be set by an annulation, and many strip antennas may be uniformly distributed in ring
On shape thing, the distance that RFID tag is reached per strip antenna can be identical, and RFID tag can be arranged on the center of annulation.
Optionally, in the embodiment of the present invention, RFID tag is placed by a turntable, the turntable can horizontally rotate RFID tag,
The angle rotated every time can be pre-set, i.e., when test signal is sent to RFID tag, can test different angles and
Position sends the sensitivity of reverse signal in the time of activation RFID tag and RFID tag.
Another optional embodiment, comprehensive test instrument 31 can include：Signal generator, sends for responding host computer
Test instruction generation baseband signal；First signal conditioner, is connected with signal generator, the carrier frequency for adjusting baseband signal
Rate；Signal amplifier, is connected with the first signal conditioner, for amplifying the baseband signal after regulation, the base band after being handled
Signal, regard the baseband signal after processing as test signal.
Corresponding baseband signal can be generated by signal generator, the frequency of baseband signal is adjusted, and amplified after regulation
Baseband signal, to obtain corresponding test signal.
Optionally, it can also include in comprehensive test instrument 31：Secondary signal adjuster, for receiving reverse signal, and adjusts anti-
To the carrier frequency of signal, wherein, reverse signal is to activate the signal returned after RFID tag by the test signal after amplification；
Demodulator of PM signal PM, is connected with secondary signal adjuster, for being demodulated to the reverse signal after regulation, obtains demodulated signal；
Programmable device, is connected with demodulator of PM signal PM, for generating test result information according to demodulated signal, and test result information is sent
To host computer.
Wherein, power threshold, the activation of activation RFID tag can be included in the test result information that programmable device is sent
The period of RFID tag, sensitivity of RFID tag etc..
Optionally, system also includes：Second analytic unit, is arranged on host computer, receive test result information it
Afterwards, test result information is analyzed and/or shown.
The test result information received can be converted into digital information by the second analytic unit, to show in display interface
Show that each information of RFID tag is tested in this time, include the information of the RFID tag of this test, the sequence number of such as RFID tag, in
It can also include the aerial information of this test in the information of portion's storage, the information of display, include mark (such as antenna of antenna
1) time of test, can also be included in the information of display, power threshold, the sensitivity of RFID tag of RFID tag is activated
Etc. information.
Fig. 4 is a kind of structure chart of the system of optional RFID tag performance test according to embodiments of the present invention, such as Fig. 4
Shown, the system includes RFID host computers (computer in Fig. 4), comprehensive test instrument, spectrum analyzer, power amplifier, RF switch
Case (i.e. the RF switching unit of above-described embodiment), circulator etc., wherein, test system can also include Network Analyzer, its
System calibration is only used for, test is not used in.Optionally, the equipment that can also be tested in the system, including measured piece, multiple antennas
With the big rings of OTA of test, multiple antennas be may be uniformly distributed on the big rings of OTA, and measured piece can be placed on turntable, and turntable can
To horizontally rotate, wherein, the big ring of measured piece, OTA, turntable etc. can be arranged in dark room conditions.Wherein, test system can be wrapped
Each middleware (including GPIB, LAN, USB) is included, wherein, GPIB is general purpose interface bus, and LAN is LAN, and USB is general
Universal serial bus, the carry out data friendship of the equipment such as host computer and RFID comprehensive test instruments, spectrum analyzer can be realized by the middleware
Mutually, RFID comprehensive test instruments can be sent test signal by data transmission interface and reach measured piece (the above-mentioned RFID tag of correspondence),
Amplify the power of test signal by power amplifier.Wherein, power amplifier can be connected with circulator, to pass through circulator
Data transfer is realized with spectrum analyzer etc..RFID comprehensive test instruments are the cores of test system, and host computer is by controlling RFID
Comprehensive test instrument completes the data interaction with label, and comprehensive test instrument is fed back to test result information by data-interface (i.e. middleware)
Position machine.
In the embodiment of the present invention, comprehensive test instrument can realize full protocol parameter control by host computer interface, improve test
Scope；Test core part can be completed by bottom hardware, improve test speed；It can directly pass through hardware solution simultaneously
Adjust initial data, it is to avoid the data distortion caused by filtering, Sampling, improve measurement accuracy.
Fig. 5 is the schematic diagram of signal interaction during middle RFID tag performance test according to embodiments of the present invention, such as Fig. 5 institutes
Show, RFID comprehensive test instruments can include base band generation, up-conversion, power amplification, down coversion, data demodulation, the embedded formula of bottom
Deng part, after amplification test signal, corresponding test signal can be sent by signal transmission interface, when RFID tag is returned
During reverse signal, corresponding reverse signal can be received by signal receiving interface.
Optionally, host computer is controlled by data-interface to RFID comprehensive test instruments, and comprehensive test instrument passes through the embedded journey of bottom
Formula configures the baseband signal to instruction before one or one group, after filtering, up-conversion, is sent out by signal after the processing such as power amplification
Interface is sent to send.After the interacting of completion and label, forward direction and the label reverse coupled signal of comprehensive test instrument are connect by signal
Mouth is returned in comprehensive test instrument, and comprehensive test instrument is analyzed reverse signal after being demodulated by down coversion and data, by reverse signal institute
Comprising the information such as protocol parameter, RF index, time interval returned to by data-interface in host computer, so that host computer is joined
Examine, and adjust the power and frequency of test next time.
The effect of power amplifier is to ensure that antenna end EIRP (Effective Radiated Power) can reach the requirement of test, typically
For, in order to ensure that test system can keep in communication under different azimuth angle with label, it is necessary to antenna port
EIRP reaches more than 35dBm, and the line loss of transmission path is larger, and this is accomplished by one power of addition in transmission path and put
Big device ensures that power output meets the requirement.In the embodiment of the present invention, original single antenna multiple antennas has been changed to, it is necessary to make
Path switching between carrying out antenna with RF switch case, optionally, the RF switch case in the embodiment of the present invention enters N for 1 and gone out
Structure, N is that antenna sum, the i.e. input signal of RF switch case are one, can be according to different selections from different output
Interface output signal.Spectrum analyzer is used to monitor the preceding reverse signal in measurement process.
System shown in Fig. 4 includes dark room apparatus (equipment that RF switch case is connected in Fig. 4), the dark room apparatus
Include the big rings of OTA (the black annulus of multiple triangles periphery of dark room apparatus in Fig. 4), (darkroom in Fig. 4 is set multiple antennas
The antenna shown in multiple triangles around measured piece in standby), dimensional turntable, measured piece (can be RFID tag) and by
The annexes such as part fixture are surveyed, wherein, (distance of each antenna to measured piece can phase for r for the distance of measured piece to multiple antennas
Together), according to being 840MHz-960MHz to regulation R ＞ 3 λ, RFID the test frequency ranges of minimum test distance in CTIA standards, λ is
0.357m, therefore big ring internal diameter can be more than 2m, and N group dual polarized antennas are uniformly distributed on big ring, can be to label in level pole
Change and the performance of vertical polarization directions is tested simultaneously.
Wherein, the label testing time can include Multiple factors：As the mechanical structure speed of service, tag access speed or
Software processing speed.Wherein the speed of service of mechanical structure can the composition of whole system structure determined, tag access
Speed can be obtained by the test speed test of RFID comprehensive test instruments, algorithm and calculating that software processing speed can be for software
Machine configuration is determined.
In the embodiment of the present invention, in order to improve test speed, measured in hardware configuration using multiple antennas, antenna
Between switch speed it is general in 10-20ms or so, and the time that turntable is rotated once is about 1-2s, when needing repeatedly adjustment
The substantial amounts of time can be saved during revolving table position.
For improve test speed, the system using RFID comprehensive test instruments substitute read write line, comprehensive test instrument as test system core
The heart, it can carry out the functions such as base band generation, reverse instruction demodulation.Testing and control part can be changed to comprehensive survey by upper computer software
Instrument is directly controlled, and key results are returned into host computer after completing tag activation, greatly reduces the logical of host computer and comprehensive test instrument
The letter time, the time for completing a tag activation test can be shortened to 1-2s.
Fig. 6 is adjustment tag activation power in a kind of optional RFID tag performance test according to embodiments of the present invention
Schematic diagram, as shown in fig. 6, initial power step value is 5dB, the power step value after being adjusted is 2.5dB etc., wherein,
The performance number that tag activation is found in original method of testing can be that gradually increase is sent out according to fixed step value (such as 0.25dB)
Power is penetrated, until label is activated, transmission power during activation label is finally obtained.When initial power with activation power difference compared with
When big, the number of times for adjusting power by method can be linearly increased, and corresponding time loss also can be linearly increasing.Due to RFID marks
Label test general test point is more (such as frequency tolerance, PT positional tolerance, TIS), and the test result of different test points typically has
Have in continuity, the system and combine the characteristics of RFID tag is tested, carried out using quick activation power search algorithmic method excellent
Change, in first one lower-wattage value of selecting test point, it is ensured that label can not be activated and then with larger step under the performance number
(being 5dB in diagram) is scanned for, again using dichotomy as principle after can activate label, reduces power stepping and reversely searches
Rope is next can not to activate the power points of label, so stop repeatedly when power stepping drops to 0.1dB.Fixed stepping and two
Power of the point-score stepping under different initial powers and activation power changes number of times, as shown in table 1 below,
Table 1
| Initial power (dBm) | Activate power (dBm) | Fixed stepping (secondary) | Dichotomy stepping (secondary) |
| -20 | 0 | 106 | 10 |
| -15 | 0 | 86 | 9 |
| -10 | 0 | 66 | 8 |
| -10 | Label can not be activated | 148 | 8 |
Power can be greatly reduced using dichotomizing search activation power change number of times as can be seen from the above table, and most
Stepping can be narrowed down to 0.1dB even lower (precision for depending on instrument) eventually, measurement accuracy can also be greatly improved.Pass through
The embodiment of the present invention, can save the time, first measurement point is because nothing when choosing the power threshold of activation RFID tag
Method is estimated to the performance of label, can only choose a relatively low performance number as starting point, and follow-up in acquisition first
When activating after performance number, then carrying out other point measurements, the initial power of each measurement point can utilize the result of last test point
As initial value, stepping is that 1dB proceeds by scanning.
By above-mentioned embodiment, the stepping number of times of power can be reduced by improving initial power point, be 7 Ru original
It is secondary, it is possible to reduce to 5 times, to have saved the testing time.
By the test system, high, normal, basic three frequencies can be chosen between 840MHz-960MHz and are surveyed in measurement
Examination.For each frequency, each antenna polarization direction can first set comprehensive test instrument parameter, and the parameter includes test frequency, starting
Power, power step value, forward direction instruction, it is then possible to set the angle of turntable, set the antenna and day of switching RF switch case
The polarised direction of line, by controlling comprehensive test instrument to enter line activating to label, comprehensive test instrument is preceding to instruction activation label by continuously transmitting,
Until the reverse signal success rate that label is returned reaches more than predetermined threshold (for example, 50%), the output of now comprehensive test instrument is recorded
Power.Optionally, by adjusting antenna, above-mentioned embodiment is repeated, the performance of different antenna activation RFID tags is tested.
Optionally, after a complete circle by antenna measurement, can rotating table again angle (mobile fixed angle every time
Can be with identical, such as 30 °), repeat above-mentioned embodiment (including the influence different antennas of test to the performance of RFID tag).
Optionally, above-mentioned calculating omnidirectional sensibility TIS can be that under polarization mode, comprehensive test instrument can be obtained by test
EIS (effective omnidirectional sensibility), the angle for setting turntable and antenna is φ, antenna and horizontal sextant angle that RF switch case is controlled
Angle be θ, in the position EUT turntables angle be θ angles and φ angles.
The effective effective omnidirectional sensibility of omnidirectional's power (EIS) calculation formula of synthesis of the position is：
Wherein, Gx,EUT(θ, φ) is the gain that x polarizes on direction (θ, φ) of EUT antennas.
Total omnidirectional sensitivity (TIS) is calculated by the EIS results under all θ angles and φ angles again：
Wherein, N is θ angular surveying point number, and M is φ angular surveying point number.
Pass through above-described embodiment, it is possible to use big ring and multiple antenna method are tested, and improve testing efficiency, the present invention
In embodiment, read write line and signal source are substituted using RFID comprehensive test instruments, testing efficiency accuracy is improved；RFID comprehensive test instruments pass through
The functions such as filtering, up-conversion, signal amplification, down coversion, the data demodulation of bottom embedded program and hardware complete label
The core of energy test process, host computer is returned to by test result by data-interface；In RFID tag performance test system
TIS test functions are added in system；Realized by quickly activating power search algorithm when RFID tag is carrying out multimetering
Activate power point search.
, can be from all many-sides such as hardware configuration, testing process and software algorithm to testing efficiency by above-described embodiment
Improved, can greatly reduce the testing time, meanwhile, improve overall measuring speed and survey by adding RFID comprehensive test instruments
Try accuracy.
In the above embodiment of the present invention, the description to each embodiment all emphasizes particularly on different fields, and does not have in some embodiment
The part of detailed description, may refer to the associated description of other embodiment.
In several embodiments provided herein, it should be understood that disclosed technology contents, others can be passed through
Mode is realized.Wherein, device embodiment described above is only schematical, such as division of described unit, Ke Yiwei
A kind of division of logic function, can there is other dividing mode when actually realizing, such as multiple units or component can combine or
Person is desirably integrated into another system, or some features can be ignored, or does not perform.Another, shown or discussed is mutual
Between coupling or direct-coupling or communication connection can be the INDIRECT COUPLING or communication link of unit or module by some interfaces
Connect, can be electrical or other forms.
The unit illustrated as separating component can be or may not be it is physically separate, it is aobvious as unit
The part shown can be or may not be physical location, you can with positioned at a place, or can also be distributed to multiple
On unit.Some or all of unit therein can be selected to realize the purpose of this embodiment scheme according to the actual needs.
In addition, each functional unit in each embodiment of the invention can be integrated in a processing unit, can also
That unit is individually physically present, can also two or more units it is integrated in a unit.Above-mentioned integrated list
Member can both be realized in the form of hardware, it would however also be possible to employ the form of SFU software functional unit is realized.
If the integrated unit is realized using in the form of SFU software functional unit and as independent production marketing or used
When, it can be stored in a computer read/write memory medium.Understood based on such, technical scheme is substantially
The part contributed in other words to correlation technique or all or part of the technical scheme can be in the form of software products
Embody, the computer software product is stored in a storage medium, including some instructions are to cause a computer
Equipment (can for personal computer, server or network equipment etc.) perform each embodiment methods described of the invention whole or
Part steps.And foregoing storage medium includes：USB flash disk, read-only storage (ROM, Read-OnlyMemory), arbitrary access are deposited
Reservoir (RAM, Random Access Memory), mobile hard disk, magnetic disc or CD etc. are various can be with store program codes
Medium.
Described above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (10)
1. a kind of RFID tag Performance Test System, it is characterised in that including：
Comprehensive test instrument, is communicated by data-interface with host computer, receives the test instruction that the host computer is sent, and the comprehensive test instrument rings
The test instruction is answered to send test signal, wherein, the test signal is used to indicate to test RFID tag performance；
Power amplifier, is connected with the comprehensive test instrument, is amplified for the power to the test signal；
RF switching unit, is communicated with the host computer, and the selection instruction that the response host computer is sent is selected in many strip antennas
Target antenna is selected, wherein, a plurality of antenna loop is sent by the target antenna and put around being distributed in around the RFID tag
Test signal after big is to the RFID tag, to carry out performance test to the RFID tag.
2. system according to claim 1, it is characterised in that the system also includes：
First analytic unit, is arranged on spectrum analyzer, in the case where receiving reverse signal, and the reverse signal is entered
Row analysis, wherein, the reverse signal is to activate the letter returned after the RFID tag by the test signal after the amplification
Number.
3. system according to claim 1, it is characterised in that the system also includes：
Dispensing unit, for before the host computer sends test instruction, responding the configuration-direct pair that the host computer is sent
The parameter of the comprehensive test instrument is configured, wherein, the parameter includes：Send frequency, the test letter of the test signal
Number initial power and power step value.
4. system according to claim 3, it is characterised in that the comprehensive test instrument also includes：
Signal trigger element, for RFID tag described in the test signal un-activation after the amplification in the case of, touch again
Occur into test signal, and send the test signal to activate the RFID tag, wherein, the power of the test signal is
Target power, the target power is the power after the power based on the test signal is adjusted according to preset algorithm.
5. system according to claim 4, it is characterised in that the system also includes：
Recording unit, the success rate of the reverse signal returned for the RFID tag after activation is received is more than default value
In the case of, record the power output of the comprehensive test instrument；
Computing unit, the power threshold for activating the RFID tag is calculated according to the power output of the comprehensive test instrument.
6. system according to claim 4, it is characterised in that the preset algorithm is dichotomy.
7. system according to claim 1, it is characterised in that many strip antennas are distributed in the annulation of preset diameters
On, the RFID tag is arranged in the annulation.
8. system according to claim 1, it is characterised in that the comprehensive test instrument includes：
Signal generator, for responding the test instruction generation baseband signal that the host computer is sent；
First signal conditioner, is connected with the signal generator, the carrier frequency for adjusting the baseband signal；
Signal amplifier, is connected with first signal conditioner, for amplifying the baseband signal after regulation, is handled
Baseband signal afterwards, regard the baseband signal after processing as the test signal.
9. system according to claim 1, it is characterised in that the comprehensive test instrument also includes：
Secondary signal adjuster, for receiving reverse signal, and adjusts the carrier frequency of the reverse signal, wherein, it is described anti-
It is that the signal returned after the RFID tag is activated by the test signal after the amplification to signal；
Demodulator of PM signal PM, is connected with the secondary signal adjuster, for being demodulated to the reverse signal after regulation, obtains
To demodulated signal；
Programmable device, is connected with the demodulator of PM signal PM, for generating test result information according to the demodulated signal, and will be described
Test result information is sent to the host computer.
10. system according to claim 1, it is characterised in that the system also includes：
Second analytic unit, is arranged on the host computer, after the test result information is received, and the test is tied
Fruit information is analyzed and/or shown.
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