CN106970271A - One kind digitlization Antenna testing system and method for testing - Google Patents
One kind digitlization Antenna testing system and method for testing Download PDFInfo
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- CN106970271A CN106970271A CN201710289241.6A CN201710289241A CN106970271A CN 106970271 A CN106970271 A CN 106970271A CN 201710289241 A CN201710289241 A CN 201710289241A CN 106970271 A CN106970271 A CN 106970271A
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Abstract
The invention discloses one kind digitlization Antenna testing system and corresponding method of testing, the system includes：Digitize antenna probes array, digital test equipment, data/address bus, center industrial computer；The digital test equipment is connected with the antenna structure to be tested；The digitlization antenna probes array is connected with the antenna structure to be tested by spatial wireless channels；The antenna structure to be tested, digitlization antenna probes array, digital test equipment, center industrial computer are respectively connected with the data/address bus；The digitlization antenna probes array includes N number of digitlization antenna probes, and N is natural number, and N >=2；Due to that disposably can gather whole spatial domain radiation signal simultaneously, test speed improves N times；And due to being gathered in real time to all directions radiation signal simultaneously, the antenna measurement data validity such as directional diagram, polarization characteristic is higher.
Description
Technical field
The present invention relates to antenna measurement field of engineering technology, more particularly to a kind of digitlization Antenna testing system and test side
Method.
Background technology
Radiation/reception characteristic test of the antennas such as traditional radio communication, radar (aerial array, whole set equipment), be all
The tested antenna of excitation feeding is produced by reference instrument (such as signal source or Network Analyzer), its radiation signal is by standard antenna
Reference instrument (such as frequency spectrograph, power meter, Network Analyzer) is sent into after reception by radio-frequency cable to test, test parameter is often
Importing computer is needed subsequently to carry out to obtain after Treatment Analysis.Since the new century, smart mobile phone, wireless wearable device
Radiation index etc. consumer wireless electronic product is paid close attention to by national governments and user, user to the covering power of product especially
Signal receiving performance under complex environment proposes higher and higher requirement, and 3GPP etc. organizes the radiation and reception to this kind of product
Characteristic test also proposed special test specification.
And in the field such as radar, navigation and mobile communication base station, satellite communication, the functional diversities of equipment and to day
Multiple target, multi-beam, wave beam agile, multiband (pattern) work of line (complete machine) etc. require generally existing.These tests, not only
It is required that higher measuring accuracy, test speed, test repeatability, in addition it is also necessary to which there is test system good semi-physical simulation to survey
Try authentication function.These testing requirements, are either tested, or combined using Multi probe using traditional scanning support or turntable
Switch matrix/power distributing network, also either both combinations, all in the presence of following shortcomings, especially to big spatial domain
Test environment：
1) the radio-frequency cable Insertion Loss needed for is larger, and the measuring stability difference that long-time calibration tape comes is, it is necessary to periodic calibration；
2) when Multi probe is tested, each passage demand carries out amplitude coincidence calibration, this to be temperature dependent characteristic with the time
Calibration complexity it is high；
3) traditional turntable/scanning support or Multi probe space distribution modes, motor driving and switch needed for its rear end
Matrix/power distributing network has certain hardware complexity, especially large test system；
4) traditional Multi probe test system or turntable sweep test scheme, it is impossible to realize that high-precision synchronization is surveyed in real time
Data acquisition is tried, test period length, test are repeatable poor；
5) turntable/scanning support testing scheme, test dead zone is easily influenceed by rotating mechanism, and test is repeatable poor.
The content of the invention
It is an object of the invention to provide one kind digitlization Antenna testing system and method for testing, to improve antenna measurement
Speed and precision.
In order to solve the above-mentioned technical problem, present invention employs following technical scheme：
One kind digitlization Antenna testing system, is tested for treating test antenna structure, including：Antenna is digitized to visit
Head array, digital test equipment, data/address bus, center industrial computer；The digital test equipment and the antenna to be tested
Structure is connected；The digitlization antenna probes array is connected with the antenna structure to be tested by spatial wireless channels；It is described
Antenna structure to be tested, digitlization antenna probes array, digital test equipment, center industrial computer are respectively total with the data
Line is connected；The digitlization antenna probes array includes N number of digitlization antenna probes, and N is natural number, and N >=2；Wherein：
In up test job pattern：
The center industrial computer is formulated for setting up test period, and up open is sent by the data/address bus
Moving pulse makes each equipment startup work, and sends uplink state setting signal and upstream sampling clock by the data/address bus
Synchronizing signal；
The digital test equipment is formulated for receiving the uplink state setting signal, produces a Upstream driver
Signal, and the Upstream driver signal is sent to the antenna structure to be tested；
The antenna structure to be tested is configured under the excitation of the Upstream driver signal and described up
Under the control of state setting signal, work in transmit state, to space radiation signal；
The digitlization antenna probes array is configured in the uplink state setting signal and the upstream sampling
The radiation signal sent under the control of clock sync signal from N number of spatial wireless channels to the antenna structure to be tested carries out real
When sample, analog-to-digital conversion, data processing and packing are carried out to the signal after sampling successively, and the data after packing are passed through described
Data/address bus sends into the center industrial computer, and the data after packing are collected and analyzed and processed by the center industrial computer,
Obtain the up test data of the antenna structure to be tested；
In descending test job pattern：
The center industrial computer is formulated for setting descending test period, and descending open is sent by the data/address bus
Moving pulse makes each equipment startup work, and sends downstream state setting signal and descending sampling clock by the data/address bus
Synchronizing signal；
The digitlization antenna probes array is formulated for receiving the downstream state setting signal, produces one descending
Pumping signal, and the downstream driver signal is sent to the antenna structure to be tested；And be configured under described
To space radiation test signal under the control of row state setting signal；
The antenna structure to be tested is configured under the excitation of the downstream driver signal and described descending
Reception is operated under the control of state setting signal to make under state, receives the test letter of the digitlization antenna probes array radiation
Number, and the test signal received is sent；
The digital test equipment is configured in the downstream state setting signal and the descending sampling clock
The test signal that is sent under the control of synchronizing signal to the antenna structure to be tested carries out real-time sampling, successively to sampling after
Signal carries out analog-to-digital conversion, data processing and packing, and the data after packing are sent into the center by the data/address bus
Data after packing are collected, decoded and analyzed and processed by the center industrial computer by industrial computer, obtain the day to be tested
The descending test data of cable architecture.
In one embodiment of the invention, the digitlization Antenna testing system also includes data transmission receiver, and it passes through
Wireless channel is connected with the digitlization antenna probes array and the digital test equipment respectively；The digitlization antenna
Data and the digital test equipment after the packing that linear transducer array is sent in up test job pattern are surveyed descending
Data after the packing sent in trial work operation mode form radiofrequency signal after being converted through digital-to-analogue and are radiated to the data transmission receiver；Institute
State data transmission receiver be configured as carrying out the radiation signal received successively low noise amplification, sampling, analog-to-digital conversion, at data
Reason and packing, and the data after packing are passed through into the data/address bus feeding center industrial computer.
In one embodiment of the invention, the number that the data transmission receiver includes being sequentially connected passes reception antenna, low noise
Acoustic amplifier, the first A/D circuits and the first DSP circuit, and the first A/D circuits and first DSP circuit divide equally
It is not connected with the data/address bus；Wherein：
The number passes reception antenna and is configurable for receiving the radiofrequency signal, and radiofrequency signal input is described
Low-noise amplifier；
The low-noise amplifier is configurable for being amplified the radiofrequency signal that it is received；
The first A/D circuits are configured as putting low-noise amplifier under the control of descending sampling clock synchronizing signal
Radiofrequency signal after big carries out real-time sampling, and carries out analog-to-digital conversion to the signal after sampling, forms digital sampled signal；
First DSP circuit carries out data processing and packing to the digital sampled signal, and by the data after packing
The center industrial computer is sent into by the data/address bus.
In one embodiment of the invention, the digital test equipment includes being sequentially connected the 2nd A/D circuits, the
Two DSP circuits and the 2nd D/A circuits, and the 2nd A/D circuits, the second DSP circuit and the 2nd D/A circuits respectively with
The data/address bus connection；Wherein：
In up test job pattern, second DSP circuit is configured as in the uplink state setting signal
Control is lower to produce data signal, and the 2nd D/A circuits are configured as under the control of the upstream sampling clock sync signal
The data signal that second DSP circuit is produced carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day to be tested
Cable architecture；
In descending test job pattern, the 2nd A/D circuits the downstream state setting signal and it is described under
The test signal sent under the control of row sampling clock synchronizing signal to the antenna structure to be tested carries out real-time sampling, and right
Signal after sampling carries out analog-to-digital conversion, forms digital sampled signal；Second DSP circuit enters to the digital sampled signal
Row data processing and packing, and the data after packing are sent into the center industrial computer by the data/address bus.
In one embodiment of the invention, the digital test equipment on the first low-converter, first also including becoming
Frequency device and first frequency synthesizer, wherein first low-converter is connected with the 2nd A/D circuits, become on described first
Frequency device is connected with the 2nd D/A circuits, and the first frequency synthesizer is connected to first upconverter and described first
Between low-converter, and it is connected with the data/address bus and second DSP circuit；Wherein：
First low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by
One frequency range is converted into second frequency scope, for the 2nd A/D circuit samplings；
First upconverter is configurable for the frequency for the pumping signal for sending the 2nd D/A circuits by
Two frequency ranges are converted into first frequency scope；
The first frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and the 2nd DSP
Under the control for the uplink state setting signal that circuit is transmitted, a local oscillation signal is produced.
In one embodiment of the invention, the digital test equipment include the 2nd A/D circuits, the second DSP circuit,
2nd D/A circuits, the 3rd D/A circuits and number pass transmitting antenna, wherein the second A/D circuits, the second DSP circuit, second
D/A circuits are sequentially connected, and the 3rd D/A circuits connect the number and pass transmitting antenna and second DSP circuit, and institute respectively
The 2nd A/D circuits, the second DSP circuit, the 2nd D/A circuits and the 3rd D/A circuits is stated respectively to be connected with the data/address bus；
Wherein：
In up test job pattern, second DSP circuit is configured as in the uplink state setting signal
Control is lower to produce data signal, and the 2nd D/A circuits are configured as under the control of the upstream sampling clock sync signal
The data signal that second DSP circuit is produced carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day to be tested
Cable architecture；
In descending test job pattern, the 2nd A/D circuits the downstream state setting signal and it is described under
The test signal sent under the control of row sampling clock synchronizing signal to the antenna structure to be tested carries out real-time sampling, and right
Signal after sampling carries out analog-to-digital conversion, forms digital sampled signal；Second DSP circuit enters to the digital sampled signal
Row data processing and packing, and the data after packing are sent into the center industrial computer by the data/address bus；And described
Two DSP circuits send the data after packing to the 3rd D/A circuits simultaneously, and the 3rd D/A circuits are in descending sampling
Data after the packing received under the control of clock synchronizing signal carry out forming number biography pumping signal after digital-to-analogue conversion, described
Number passes transmitting antenna and passed in the number under the excitation of pumping signal, radiated radio frequency (RF) signal.
In one embodiment of the invention, the digital test equipment on the first low-converter, first also including becoming
Frequency device and first frequency synthesizer, wherein first low-converter is connected with the 2nd A/D circuits, become on described first
Frequency device is connected with the 2nd D/A circuits, and the first frequency synthesizer is connected to first upconverter and described first
Between low-converter, and it is connected with the data/address bus and second DSP circuit；Wherein：
First low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by
One frequency range is converted into second frequency scope, for the 2nd A/D circuit samplings；
First upconverter is configurable for the frequency for the pumping signal for sending the 2nd D/A circuits by
Two frequency ranges are converted into first frequency scope；
The first frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and the 2nd DSP
Under the control for the uplink state setting signal that circuit is transmitted, a local oscillation signal is produced.
In one embodiment of the invention, it is described digitlization antenna probes include be sequentially connected up probe antenna,
4th A/D circuits, the 4th DSP circuit, the 4th D/A circuits and descending probe antenna, and the 4th A/D circuits, the 4th DSP
Circuit and the 4th D/A circuits are respectively connected with the data/address bus；Wherein：
In up test job pattern, the up probe antenna is used to receive what the antenna structure to be tested was sent
Test signal；The 4th A/D circuits are in the uplink state setting signal and the upstream sampling clock sync signal
Real-time sampling is carried out to the test signal that the up probe antenna is received under control, and modulus turn is carried out to the signal after sampling
Change, form digital sampled signal；4th DSP circuit carries out data processing and packing to the digital sampled signal, and will
Data after packing send into the center industrial computer by the data/address bus；
In descending test job pattern, the 4th DSP circuit is configured as in the downstream state setting signal
Control is lower to produce data signal, and the 4th D/A circuits are configured as under the control of the descending sampling clock synchronizing signal
The data signal that 4th DSP circuit is produced carries out digital-to-analogue conversion, pumping signal is formed, by the descending probe antenna spoke
Penetrate to the antenna structure to be tested.
In one embodiment of the invention, the digitlization antenna probes on the second low-converter, second also including becoming
Frequency device and second frequency synthesizer, wherein second low-converter is connected with the 4th A/D circuits, become on described second
Frequency device is connected with the 4th D/A circuits, and the second frequency synthesizer is connected to second upconverter and described second
Between low-converter, and it is connected with the data/address bus and the 4th DSP circuit；Wherein：
Second low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by
One frequency range is converted into second frequency scope, for the 4th A/D circuit samplings；
Second upconverter is configurable for the frequency for the pumping signal for sending the 4th D/A circuits by
Two frequency ranges are converted into first frequency scope；
The second frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and the 4th DSP
Under the control for the uplink state setting signal that circuit is transmitted, a local oscillation signal is produced.
In one embodiment of the invention, it is described digitlization antenna probes include the 4th A/D circuits, the 4th DSP circuit,
4th D/A circuits, the 5th D/A circuits and number pass transmitting antenna, the 4th A/D circuits, the 4th DSP circuit, the 4th D/A electricity
Road is sequentially connected, and the 5th D/A is electrically connected to the number and passed between transmitting antenna and the 4th DSP circuit, and described
4th A/D circuits, the 4th DSP circuit, the 4th D/A circuits and the 5th D/A circuits are respectively connected with the data/address bus；Its
In：
In up test job pattern, the 4th A/D circuits the uplink state setting signal and it is described on
The test signal sent under the control of row sampling clock synchronizing signal to the antenna structure to be tested carries out real-time sampling, and right
Signal after sampling carries out analog-to-digital conversion, forms digital sampled signal；4th DSP circuit enters to the digital sampled signal
Row data processing and packing, and the data after packing are sent into the center industrial computer by the data/address bus；And described
Four DSP circuits send the data after packing to the 5th D/A circuits simultaneously, and the 5th D/A circuits are in upstream sampling
Data after the packing received under the control of clock synchronizing signal carry out forming number biography pumping signal after digital-to-analogue conversion, described
Number passes transmitting antenna and passed in the number under the excitation of pumping signal, radiated radio frequency (RF) signal；
In descending test job pattern, the 4th DSP circuit is configured as in the downstream state setting signal
Control is lower to produce data signal, and the 4th D/A circuits are configured as under the control of the descending sampling clock synchronizing signal
The data signal that 4th DSP circuit is produced carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day to be tested
Cable architecture.
In one embodiment of the invention, the digitlization antenna probes on the second low-converter, second also including becoming
Frequency device and second frequency synthesizer, wherein second low-converter is connected with the 4th A/D circuits, become on described second
Frequency device is connected with the 4th D/A circuits, and the second frequency synthesizer is connected to second upconverter and described second
Between low-converter, and it is connected with the data/address bus and the 4th DSP circuit；Wherein：
Second low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by
One frequency range is converted into second frequency scope, for the 4th A/D circuit samplings；
Second upconverter is configurable for the frequency for the pumping signal for sending the 4th D/A circuits by
Two frequency ranges are converted into first frequency scope；
The second frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and the 4th DSP
Under the control for the uplink state setting signal that circuit is transmitted, a local oscillation signal is produced.
In one embodiment of the invention, it is described digitlization Antenna testing system also include motor and with the motor
Connected azimuth rotating platform, the antenna structure to be tested is arranged on the azimuth rotating platform, the motor and the data/address bus
Connection；The center industrial computer sends motor control pulse by the data/address bus；The motor is in the motor control arteries and veins
Stepping rotation is carried out under the control of punching, and then drives the azimuth rotating platform to be rotated along level orientation.
In one embodiment of the invention, the digitlization Antenna testing system also includes mounting bracket, for installing
State digitlization antenna probes and the data/address bus.
In one embodiment of the invention, the digitlization Antenna testing system also includes shielded anechoic chamber.
One kind digitlization antenna test method, is tested, this method bag using above-mentioned digitlization Antenna testing system
Include following steps：
S1:Up testing procedure, is specifically included：
S11：The center industrial computer sets up test period, and sending up starting impulse by the data/address bus makes
Each equipment startup work, and uplink state setting signal and upstream sampling clock synchronously letter are sent by the data/address bus
Number；
S12：The digital test equipment receives the uplink state setting signal, produces a Upstream driver signal, and
The Upstream driver signal is sent to the antenna structure to be tested；
S13：The antenna structure to be tested is under the excitation of the Upstream driver signal and the uplink state is set
Under the control of signal, work in transmit state, to space radiation signal；
S14：The digitlization antenna probes array is in the uplink state setting signal and the upstream sampling clock
The radiation signal sent under the control of synchronizing signal from N number of spatial wireless channels to the antenna structure to be tested is adopted in real time
Sample, carries out analog-to-digital conversion, data processing and packing, and the data after packing are passed through into the data to the signal after sampling successively
Bus sends into the center industrial computer；
S15：The center industrial computer is collected, decodes and analyzed and processed to the data after packing, obtains described to be measured
Try the up test data of antenna structure；
S2:Descending testing procedure, is specifically included：
S21：Center industrial computer sets descending test period, and sending descending starting impulse by the data/address bus makes respectively to set
It is standby to start work, and downstream state setting signal and descending sampling clock synchronizing signal are sent by the data/address bus；
S22：Downstream state setting signal described in the digitlization antenna probes array received, produces downstream driver letter
Number, and the downstream driver signal is sent to the antenna structure to be tested；And the digitlization antenna probes array is in institute
State under the control of downstream state setting signal to space radiation test signal；
S23：The antenna structure to be tested is under the excitation of the downstream driver signal and the downstream state is set
Reception is operated under the control of signal to make under state, receives the test signal of the digitlization antenna probes array radiation, and will
The test signal received is sent；
S24：The digital test equipment is synchronous in the downstream state setting signal and the descending sampling clock
The test signal sent under the control of signal to the antenna structure to be tested carries out real-time sampling, successively to the signal after sampling
Analog-to-digital conversion, data processing and packing are carried out, and the data after packing are sent into the center industry control by the data/address bus
Machine；
S25：The center industrial computer is collected, decodes and analyzed and processed to the data after packing, obtains described to be measured
Try the descending test data of antenna structure.
The present invention is allowed to compared with prior art, have the following advantages that and actively imitate due to using above technical scheme
Really：
1) the digitlization Antenna testing system of offer of the invention, it, which digitizes antenna probes array, includes N number of digitlization
Antenna probes, under sampling clock synchronization, the digitlization antenna probes of N number of passage gather the radiation signal of all directions in real time, are
System disposably can gather whole spatial domain radiation signal simultaneously, and test speed improves N times；And believe due to being radiated to all directions
Number collection in real time simultaneously, the test data authenticity such as directional diagram is higher；
2) the disposable synchronous high-speed AD/DA of test process completes pumping signal generation and radiation signal collection, solves survey
The problems such as real-time and repeatability, the authenticity of test data of examination；
3) test data is transmitted by bus (such as CAN) or wireless channel, reduces the hardware complexity and cost of system；
And control signal and its sequential and test data produce/focused on analysis and by bus mode by center industrial computer
(to large space test environment, it would however also be possible to employ wireless channel) transmission, the various antenna measurement data needed；
4) hardware of this digitized Antenna testing system can software programming, the redundancy of system is high, expansible, both may be used
The communication performance under various complex modulations to carry out radio communication eats dishes without rice or wine to test, and is also convenient for carrying out multiple target, anti-interference, many ripples
The semi-physical simulation validation test such as beam；
5) digital test equipment and digitlization antenna probes can carry out software programming by center industrial computer, conveniently enter
Row semi-physical simulation test checking.
6) system operatio control is simple：Background control is simple, is compared to traditional antenna test, directional diagram fitting algorithm class
Seemingly, switch switching sequence when also just being tested using synchronised clock without complicated antenna rotating platform drive control or multiple antennas；
7) system hardware complexity is not high, and hardware is also arranged in darkroom transformation on the basis of existing completely, can be saved
Cost, it is convenient to implement.
Certainly, any product for implementing the present invention it is not absolutely required to while reaching all the above advantage.
Brief description of the drawings
Fig. 1 is the composition frame chart provided in an embodiment of the present invention for digitizing Antenna testing system；
The layout for the digitlization Multi probe Antenna testing system that Fig. 2 provides for one embodiment of the invention；
Fig. 3 is the principle composition frame chart of data transmission receiver provided in an embodiment of the present invention；
Fig. 4 a-4c are the principle composition frame chart of digital test equipment provided in an embodiment of the present invention；
Fig. 5 a-5c are the principle composition frame chart provided in an embodiment of the present invention for digitizing antenna probes；
Fig. 6 is the schematic diagram that sphere any two digitizes antenna probes Beam synthesis；
Fig. 7 is the working timing figure of system in a controlling cycle in the embodiment of the present invention.
Symbol description：
In 1- antenna structures to be tested, 2- digital test equipment, 3- digitlization antenna probes, 4- data transmission receivers, 5-
Heart industrial computer, 6- data/address bus, 7- radio-frequency cables, 8- motors, 9- azimuth rotating platforms, 10- mounting brackets, 11- shielded anechoic chambers, 12- numbers
Pass reception antenna, LNA- low-noise amplifiers, the A/D circuits of A/D1- the first, the DSP circuits of DSP1- first, the A/D of A/D2- the 2nd electricity
Road, the DSP circuits of DSP2- second, the D/A circuits of D/A2- the 2nd, the D/A circuits of D/A3- the 2nd, 13- numbers pass transmitting antenna, 21- first
Low-converter, the upconverter of 22- first, 23- first frequency synthesizers, the A/D circuits of A/D4- the 4th, the DSP circuits of DSP4- the 4th,
The D/A circuits of D/A4- the 4th, the D/A circuits of D/A5- the 5th, the low-converters of 41- first, the upconverter of 42- first, 43- first frequencies
Synthesizer, the up probe antennas of 44-, the descending probe antennas of 45-, ST- starting impulses, SZ- state setting signals, AD-CLK- moulds
Number sampling clock synchronizing signal, DA-CLK- digital-to-analogue sampling clock synchronizing signals, F-SZ- set of frequency signals, SC-CLK- numbers are passed
Sampling clock synchronizing signal, F-JZ- reference frequencies, E1The electric-field intensity of-wave beam 1, E2The electric-field intensity of-wave beam 2, EH- synthesis wave beam electricity
Field intensity,The normal direction of-wave beam 1 and horizontal direction angle, θ-wave beam 1 and the normal angle of wave beam 2, CS-T- test periods believe
Number, DATA- data signal under test.
Embodiment
Digitlization Antenna testing system proposed by the present invention and method of testing are made below in conjunction with the drawings and specific embodiments
It is further described.According to following explanation and claims, advantages and features of the invention will become apparent from.It should be noted
It is that accompanying drawing is using very simplified form and uses non-accurately ratio, is only used for convenience, lucidly aids in illustrating this hair
The purpose of bright embodiment.
Fig. 1 is refer to, as shown in figure 1, digitlization Antenna testing system provided in an embodiment of the present invention, for to be tested
Antenna structure 1 is tested, including：Digitize antenna probes array, digital test equipment 2, data/address bus 6, center industry control
Machine 5；The digital test equipment 2 is connected with the antenna structure 1 to be tested, specifically, digital test equipment 2 with it is described
Antenna structure 1 to be tested can be connected by radio-frequency cable 7；The digitlization antenna probes array and the antenna structure to be tested
1 is connected by spatial wireless channels；The antenna structure to be tested 1, digitlization antenna probes array, digital test equipment 2,
Center industrial computer 5 is respectively connected with the data/address bus 6；The digitlization antenna probes array includes N number of digitlization antenna
3, N of probe is natural number, and N >=2；Wherein：
In up test job pattern：
The center industrial computer 5 is formulated for setting up test period, sends up by the data/address bus 6
Starting impulse makes each equipment startup work, and sends uplink state setting signal and upstream sampling by the data/address bus 6
Clock sync signal (such as including up modulus sampling clock synchronizing signal, up digital-to-analogue sampling clock synchronizing signal, upper line number
Pass sampling clock synchronizing signal etc.)；
The digital test equipment 2 is formulated for receiving the uplink state setting signal, produces one up sharp
Signal is encouraged, and the Upstream driver signal is sent to the antenna structure to be tested 1；
The antenna structure to be tested 1 is configured under the excitation of the Upstream driver signal and described up
Under the control of state setting signal, work in transmit state, to space radiation signal；
The digitlization antenna probes array is configured in the uplink state setting signal and the upstream sampling
The radiation signal sent under the control of clock sync signal from N number of spatial wireless channels to the antenna structure 1 to be tested is carried out
Real-time sampling, carries out analog-to-digital conversion, data processing and packing to the signal after sampling successively, and data processing therein is believed for amplitude
Breath is extracted with encoding, and it is the conventional treatment mode in antenna measurement field, and the data after packing are passed through into the data/address bus 6
The center industrial computer 5 is sent into, is collected, decodes and analyzed and processed by the data after described 5 pairs of packings of center industrial computer, obtained
To the up test data of the antenna structure 1 to be tested；
In descending test job pattern：
The center industrial computer 5 is formulated for setting descending test period, sends descending by the data/address bus 6
Starting impulse makes each equipment startup work, and sends downstream state setting signal and descending sampling by the data/address bus 6
Clock sync signal (such as including descending modulus sampling clock synchronizing signal, descending digital-to-analogue sampling clock synchronizing signal, lower line number
Pass sampling clock synchronizing signal etc.)；
The digitlization antenna probes array is formulated for receiving the downstream state setting signal, produces one descending
Pumping signal, and the downstream driver signal is sent to the antenna structure to be tested 1；And be configured under described
To space radiation test signal under the control of row state setting signal；
The antenna structure to be tested 1 is configured under the excitation of the downstream driver signal and described descending
Reception is operated under the control of state setting signal to make under state, receives the test letter of the digitlization antenna probes array radiation
Number, and the test signal received is sent；
The digital test equipment 2 is configured in the downstream state setting signal and the descending sampling clock
The test signal that is sent under the control of synchronizing signal to the antenna structure 1 to be tested carries out real-time sampling, successively to sampling after
Signal carry out analog-to-digital conversion, data processing and packing, data processing therein is that amplitude information is extracted with encoding, and it is antenna
The conventional treatment mode of testing field, and the data after packing are sent into the center industrial computer 5 by the data/address bus 6,
It is collected, decodes and analyzed and processed by the data after described 5 pairs of packings of center industrial computer, obtains the antenna structure to be tested
1 descending test data.
The digitlization Antenna testing system of the offer of the present invention, includes N number of numeral because it digitizes antenna probes array
Change antenna probes 3, under sampling clock synchronization, the digitlization antenna probes 3 of N number of passage gather the radiation letter of all directions in real time
Number, system disposably can gather whole spatial domain radiation signal simultaneously, and test speed improves N times；And due to all directions
Radiation signal is gathered in real time simultaneously, and the test data authenticity such as directional diagram is higher.
Embodiment 1
As shown in fig. 4 a, in the present embodiment, the digital test equipment 2 includes the 2nd A/D circuits being sequentially connected
A/D2, the second DSP circuit DSP2 and the 2nd D/A circuit D/A2, and the 2nd A/D circuits A/D2, the second DSP circuit DSP2
And the 2nd D/A circuits D/A2 be respectively connected with the data/address bus 6.As shown in Figure 5 a, in the present embodiment digitlization day
Line probe 3 includes up probe antenna 44, the 4th A/D circuits A/D4, the 4th DSP circuit DSP4, the 4th D/A electricity being sequentially connected
Road D/A4 and descending probe antenna 45, and the 4th A/D circuits A/D4, the 4th DSP circuit DSP4 and the 4th D/A circuits
D/A4 is respectively connected with the data/address bus 6.The signal stream of the present embodiment is：
In up test job pattern, controls of the second DSP circuit DSP2 in the uplink state setting signal
Lower generation data signal, the 2nd D/A circuits D/A2 is under the control of the upstream sampling clock sync signal by described
The data signal that two DSP circuit DSP2 are produced carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day knot to be tested
Structure 1；The up probe antenna 44 receives the test signal that the antenna structure to be tested 1 is sent；The 4th A/D circuits A/
D4 is under the control of the uplink state setting signal and the upstream sampling clock sync signal to the up probe day
The test signal that line 44 is received carries out real-time sampling, and carries out analog-to-digital conversion to the signal after sampling, forms digital sampled signal；
The 4th DSP circuit DSP4 carries out data processing to the digital sampled signal, by all processing in a test period
Data afterwards are packed, and the data after packing are sent into the center industrial computer 5 by the data/address bus 6；By described
Data after the 5 pairs of packings of center industrial computer are collected, decode and analyzed and processed, and obtain the upper of the antenna structure to be tested 1
Row test data.
In descending test job pattern, the 4th DSP circuit DSP4, which is configured as setting in the downstream state, to be believed
Number control under produce data signal, the 4th D/A circuits D/A4 is configured as in the descending sampling clock synchronizing signal
Control under by the 4th DSP circuit DSP4 produce data signal carry out digital-to-analogue conversion, formed pumping signal, under described
Row probe antenna 45 is radiated to the antenna structure 1 to be tested；The 2nd A/D circuits A/D2 is set in the downstream state to be believed
Number and the control of the descending sampling clock synchronizing signal under the test signal that is sent to the antenna structure 1 to be tested carry out
Real-time sampling, and analog-to-digital conversion is carried out to the signal after sampling, form digital sampled signal；DSP2 pairs of second DSP circuit
The digital sampled signal carries out data processing, and the data after all processing in a test period are packed, and will
Data after packing send into the center industrial computer 5 by the data/address bus 6.After described 5 pairs of packings of center industrial computer
Data are collected, decode and analyzed and processed, and obtain the descending test data of the antenna structure to be tested 1.
Embodiment 2
As shown in figure 3, in order that the present invention digitlization Antenna testing system can be suitably used for large-scale darkroom test environment,
On the basis of embodiment 1, it is described digitlization Antenna testing system also include data transmission receiver 4, its by wireless channel respectively with
The digitlization antenna probes array and the digital test equipment 2 are connected；The digitlization antenna probes array is upper
Data and the digital test equipment 2 after the packing sent in row test job pattern are in descending test job pattern
Data after the packing sent form radiofrequency signal after being converted through digital-to-analogue and are radiated to the data transmission receiver 4；The number, which is passed, to be received
Machine 4 is configured as carrying out low noise amplification, sampling, analog-to-digital conversion, data processing and packing successively to the radiation signal received,
And the data after packing are sent into the center industrial computer 5 by the data/address bus.It is used as an embodiment, the number
The number that passing receiver 4 includes being sequentially connected passes reception antenna 12, low-noise amplifier LNA, the first A/D circuits A/D1 and first
DSP circuit DSP1, and the first A/D circuits A/D1 and the first DSP circuit DSP1 respectively with the data/address bus 6
Connection；Wherein, the number passes reception antenna 12 and is configurable for receiving the radiofrequency signal, and the radiofrequency signal is inputted
The low-noise amplifier LNA；The low-noise amplifier LNA is configurable for putting the radiofrequency signal that it is received
Greatly；The first A/D circuits A/D1 is configured as putting low-noise amplifier under the control of descending sampling clock synchronizing signal
Radiofrequency signal after big carries out real-time sampling, and carries out analog-to-digital conversion to the signal after sampling, forms digital sampled signal；It is described
First DSP circuit DSP1 carries out data processing and packing to the digital sampled signal, and the data after packing is passed through described
Data/address bus 6 sends into the center industrial computer 5.
Meanwhile, as shown in Figure 4 b, the digital test equipment increases by one the 3rd D/A circuits on the basis of embodiment 1
The numbers of D/A3 and one pass transmitting antenna 13, and the 3rd D/A circuits D/A3 connects the number and passes transmitting antenna 13 and the 2nd DSP respectively
Circuit DSP2, and the 3rd D/A circuits D/A3 is connected with the data/address bus 6, wherein, in descending test job pattern,
The second DSP circuit DSP2 carries out data processing and packing to the digital sampled signal, and the data after packing are passed through
The data/address bus 6 sends into the center industrial computer 5；Meanwhile, the second DSP circuit DSP2 sends the data after packing to described
3rd D/A circuit D/A3, what the 3rd D/A circuits D/A3 was received under the control of descending sampling clock synchronizing signal
Data after packing carry out forming number biography pumping signal after digital-to-analogue conversion, and the number biography transmitting antennas 13 are passed in the number encourages letter
Number excitation under, radiated radio frequency (RF) signal.
Correspondingly, as shown in Figure 5 b, the digitlization antenna probes increase by one the 5th D/A electricity on the basis of embodiment 1
Road D/A5 and one number pass transmitting antenna 13, the 5th D/A circuits D/A5 be connected to it is described number pass transmitting antenna 13 with it is described
Between 4th DSP circuit DSP4, and the 5th D/A circuits D/A5 is connected with the data/address bus 6；Wherein, in up test
In mode of operation, the 4th DSP circuit DSP4 carries out data processing and packing to the digital sampled signal, and by after packing
Data the center industrial computer 5 is sent into by the data/address bus 6；Meanwhile, the 4th DSP circuit DSP4 is by after packing
Data send the 5th D/A circuit D/A5, controls of the 5th D/A circuits D/A5 in upstream sampling clock sync signal to
Data after the lower packing received carry out forming number biography pumping signal after digital-to-analogue conversion, and the number passes transmitting antennas 13 and existed
The number is passed under the excitation of pumping signal, radiated radio frequency (RF) signal.
In addition, the other parts of embodiment 2 are same as Example 1, will not be repeated here.
Embodiment 3
As illustrated in fig. 4 c, in order that high frequency environment can be useful in by obtaining the digitlization Antenna testing system of the invention provided
In, as optional embodiment, the digital test equipment 2 also includes first on the basis of embodiment 1 or embodiment 2
Low-converter 21, the first upconverter 22 and first frequency synthesizer 23, wherein first low-converter 21 and described the
Two A/D circuits A/D2 connections, first upconverter 22 is connected with the 2nd D/A circuits D/A2, and the first frequency is comprehensive
Clutch 23 is connected between first upconverter 22 and first low-converter 21, and with the data/address bus 6 and institute
State the second DSP circuit DSP2 connections；Wherein, first low-converter 21 is configurable for sending out antenna structure 1 to be tested
The frequency of the test signal gone out is converted into second frequency scope by first frequency scope, so that the 2nd A/D circuits A/D2 is adopted
Sample, for example, be converted to f2 ± Δs f by the frequency of test signal by f1 ± Δs f；First upconverter 22 is configurable for
The frequency of the 2nd D/A circuits D/A2 pumping signals sent is converted into first frequency scope by second frequency scope, with
The working frequency of the antenna structure to be tested is adapted to, for example, the frequency of pumping signal is converted to f1 ± Δs f by f2 ± Δs f；
The first frequency synthesizer 23 is configured as the reference frequency F-JZ transmitted in the data/address bus 6 and the 2nd DSP
Under the control for the uplink state setting signal that circuit DSP2 is transmitted, a local oscillation signal is produced, local oscillation signal is the first low-converter
21 and first upconverter 22 carry out frequency transformation frequency transformed values, i.e. f1-f2.
Correspondingly, as shown in Figure 5 c, the digitlization antenna probes 3 are gone back on the basis of embodiment 1 and/or embodiment 2
Including the second low-converter 41, the second upconverter 42 and second frequency synthesizer 43, wherein second low-converter 41
It is connected with the 4th A/D circuits A/D4, second upconverter 42 is connected with the 4th D/A circuits D/A4, described
Two frequency synthesizers 43 are connected between second upconverter 42 and second low-converter 41, and total with the data
Line 6 and the 4th DSP circuit DSP4 connections；Wherein, second low-converter 41 is configurable for antenna to be tested
The frequency for the test signal that structure 1 is sent is converted into second frequency scope by first frequency scope, for the 4th A/D circuits
A/D4 samples, for example, the frequency of test signal is converted into f2 ± Δs f by f1 ± Δs f；Second upconverter 42 is configured
For for the frequency of the 4th D/A circuits D/A4 pumping signals sent to be converted into first frequency model by second frequency scope
Enclose, to adapt to the working frequency of the antenna structure to be tested, for example by the frequency of pumping signal by f2 ± Δs f be converted to f1 ±
Δf；The second frequency synthesizer 43 is configured as the reference frequency F-JZ and the described 4th transmitted in the data/address bus 6
Under the control for the uplink state setting signal that DSP circuit DSP4 is transmitted, a local oscillation signal is produced, local oscillation signal is the second down coversion
The upconverter 42 of device 41 and second carries out the frequency transformed values of frequency transformation, i.e. f1-f2.
The system hardware complexity for the digitlization Multi probe Antenna testing system that the present invention is provided is not high, and darkroom transformation is also complete
Hardware is arranged on the basis of existing entirely, can be convenient to implement with cost-effective.For example, refer to Fig. 2, Fig. 2 is the present invention one
The layout for the digitlization Multi probe Antenna testing system that embodiment is provided, the digitlization Multi probe Antenna testing system is in Fig. 1
On the basis of may also include motor 8 and the azimuth rotating platform 9 being connected with the motor 8, the antenna structure 1 to be tested is arranged on
On the azimuth rotating platform 9, the motor 8 is connected with the data/address bus 6；The center industrial computer 5 passes through the data/address bus 6
Send motor control pulse；The motor 8 carries out stepping rotation under the control of the motor control pulse, and then drives described
Azimuth rotating platform 9 is rotated along level orientation.Also, the digitlization Antenna testing system may also include mounting bracket 10, for installing
The digitlization antenna probes 3 and the data/address bus 6, all digitlization antenna probes 3 are circumferentially distributed.Also, it is described
Digitlization Antenna testing system may also include shielded anechoic chamber 11.
In addition, the digitlization Multi probe Antenna testing system that the present invention is provided can also be as needed by partial digitized day
Line partial digitized antenna probes of popping one's head in/increase are set to target or interference simulator, carry out the tested antenna of semi physical mode
Multiple target or anti-Interference Analysis, are implemented as：Center industrial computer is set in digitlization antenna probes by data/address bus
DSP, the pumping signal of output correspondence target/jamming pattern.
In addition, covering points to increase the scanning in test spatial domain, the wave beam of adjacent cells can also be synthesized
(due to reference clock/reference frequency real-time synchronization of each antenna probes, the radiation signal of each unit can realize coherent, so that
Realize Beam synthesis).This synthesis wave beam closely can exponentially increase number of test points.As shown in fig. 6, when digitlization antenna probes are in
During circle distribution, because wave beam is directed to tested antenna (center of circle), synthesis wave beam algorithm is as follows：
Wherein,Represent：Wave beam electric field vector is synthesized,Represent：The electric field vector of wave beam 1,Represent：Ripple
The electric field vector of beam 1, E1xRepresent：The electric-field intensity x-axis component of wave beam 1, E2xRepresent：The electric-field intensity horizontal direction point of wave beam 2
Amount, E1yRepresent：The electric-field intensity vertical direction component of wave beam 1, E2yRepresent：The electric-field intensity y-axis component of wave beam 2, E1Represent：Wave beam 1
Electric field normal direction intensity,Represent：The normal direction of wave beam 1 and horizontal direction angle, E2Represent：The electric field normal direction of wave beam 1 is strong
Degree, θ is represented：Wave beam 1 and the normal direction angle of wave beam 2.
On the sequential of present system, Fig. 7 is refer to, its sequential is specially：
During up (descending) mode of operation, center industrial computer sends starting impulse ST to each unit electricity by data/address bus
Road, system completed in a period of time inside start after, center industrial computer starts test period CS-T and by work by data/address bus
Make state setting signal SZ and send to each unit circuit that (and reference frequency F-JZ is sent to digitlization antenna probes and digitlization
Test equipment), then the DA circuits in digital test equipment (digitlization antenna probes) quantification impulse CS-CLK effect under,
It is pumping signal to complete the digital-to-analogue conversion to the DSP data signals produced, and pumping signal enters tested antenna structure (digitlization
The transmitting antenna of antenna probes) after be radiated to the test space, now the descending probe antenna of each digitlization antenna probes receives spoke
Signal (tested antenna structure receives radiation signal, output to digital test equipment) is penetrated, and is adopted by AD circuits in CS-CLK
With data signal is quantified as under impulsive synchronization, then packed by the DSP processing for being responsible for data, test data DATA can pass through number
(it can also be passed according to bus in number under pulse SC-DLK synchronizations, pass signal by DA circuit conversions number is passed by counting biography aerial radiation to number
Receiver, receiver is quantified as data signal under SC-DLK synchronizations, by AD circuits and enters DSP, then by data/address bus) send extremely
Center industrial computer focuses on analysis, obtains various test datas.
Antenna test method is digitized present invention also offers one kind, is carried out using above-mentioned digitlization Antenna testing system
Test, this method comprises the following steps：
S1:Up testing procedure, is specifically included：
S11：The center industrial computer 5 sets up test period, and up starting impulse is sent by the data/address bus 6
Make each equipment startup work, and uplink state setting signal and the synchronization of upstream sampling clock are sent by the data/address bus 6
Signal；
S12：The digital test equipment 2 receives the uplink state setting signal, produces a Upstream driver signal, and
The Upstream driver signal is sent to the antenna structure to be tested 1；
S13：The antenna structure to be tested 1 is under the excitation of the Upstream driver signal and the uplink state is set
Under the control of signal, work in transmit state, to space radiation signal；
S14：The digitlization antenna probes array is in the uplink state setting signal and the upstream sampling clock
The radiation signal sent under the control of synchronizing signal from N number of spatial wireless channels to the antenna structure 1 to be tested carries out real-time
Sampling, carries out analog-to-digital conversion, data processing and packing, and the data after packing are passed through into the number to the signal after sampling successively
The center industrial computer is sent into according to bus 6；
S15：Data after described 5 pairs of packings of center industrial computer are collected and analyzed and processed, and obtain the day to be tested
The up test data of cable architecture；
S2:Descending testing procedure, is specifically included：
S21：Center industrial computer 5 sets descending test period, and sending descending starting impulse by the data/address bus 6 makes respectively
Equipment startup work, and downstream state setting signal and descending sampling clock synchronizing signal are sent by the data/address bus 6；
S22：Downstream state setting signal described in the digitlization antenna probes array received, produces downstream driver letter
Number, and the downstream driver signal is sent to the antenna structure to be tested 1；And the digitlization antenna probes array is in institute
State under the control of downstream state setting signal to space radiation test signal；
S23：The antenna structure to be tested 1 is under the excitation of the downstream driver signal and the downstream state is set
Reception is operated under the control of signal to make under state, receives the test signal of the digitlization antenna probes array radiation, and will
The test signal received is sent；
S24：The digital test equipment 2 is synchronous in the downstream state setting signal and the descending sampling clock
The test signal sent under the control of signal to the antenna structure 1 to be tested carries out real-time sampling, successively to the letter after sampling
Number analog-to-digital conversion, data processing packing are carried out, and the data after packing are sent into the center industry control by the data/address bus 6
Machine 5；
S25：Data after described 5 pairs of packings of center industrial computer are collected and analyzed and processed, and obtain the day to be tested
The descending test data of cable architecture 1.Specifically, industrial computer 5 pairs of data being collected into center are decoded and analyzed and processed, and are realized
The display of the antenna measurement information such as measurement direction figure, polarization characteristic.
Obviously, those skilled in the art can carry out the spirit of various changes and modification without departing from the present invention to invention
And scope.So, if these modifications and variations of the present invention belong to the claims in the present invention and its equivalent technologies scope it
Interior, then the present invention is also intended to comprising including these changes and modification.
Claims (15)
1. one kind digitlization Antenna testing system, is tested for treating test antenna structure, it is characterised in that including：Number
Word antenna probes array, digital test equipment, data/address bus, center industrial computer；The digital test equipment with it is described
Antenna structure connection to be tested；The digitlization antenna probes array passes through spatial wireless channels with the antenna structure to be tested
Connection；The antenna structure to be tested, digitlization antenna probes array, digital test equipment, center industrial computer respectively with
The data/address bus connection；The digitlization antenna probes array includes N number of digitlization antenna probes, and N is natural number, and N >=
2；Wherein：
In up test job pattern：
The center industrial computer is formulated for setting up test period, and up startup arteries and veins is sent by the data/address bus
Punching makes each equipment startup work, and sends uplink state setting signal and the synchronization of upstream sampling clock by the data/address bus
Signal；
The digital test equipment is formulated for receiving the uplink state setting signal, produces Upstream driver letter
Number, and the Upstream driver signal is sent to the antenna structure to be tested；
The antenna structure to be tested is configured under the excitation of the Upstream driver signal and the uplink state
Under the control of setting signal, work in transmit state, to space radiation signal；
The digitlization antenna probes array is configured in the uplink state setting signal and the upstream sampling clock
The radiation signal sent under the control of synchronizing signal from N number of spatial wireless channels to the antenna structure to be tested is adopted in real time
Sample, carries out analog-to-digital conversion, data processing and packing, and the data after packing are passed through into the data to the signal after sampling successively
Bus sends into the center industrial computer, and the data after packing are collected and analyzed and processed by the center industrial computer, are obtained
The up test data of the antenna structure to be tested；
In descending test job pattern：
The center industrial computer is formulated for setting descending test period, and descending startup arteries and veins is sent by the data/address bus
Punching makes each equipment startup work, and sends downstream state setting signal and the synchronization of descending sampling clock by the data/address bus
Signal；
The digitlization antenna probes array is formulated for receiving the downstream state setting signal, produces a downstream driver
Signal, and the downstream driver signal is sent to the antenna structure to be tested；And be configured in the descending shape
To space radiation test signal under the control of state setting signal；
The antenna structure to be tested is configured under the excitation of the downstream driver signal and the downstream state
Reception is operated under the control of setting signal to make under state, receives the test signal of the digitlization antenna probes array radiation,
And send the test signal received；
The digital test equipment is configured to synchronous in the downstream state setting signal and the descending sampling clock
The test signal sent under the control of signal to the antenna structure to be tested carries out real-time sampling, successively to the signal after sampling
Analog-to-digital conversion, data processing and packing are carried out, and the data after packing are sent into the center industry control by the data/address bus
Data after packing are collected, decoded and analyzed and processed by the center industrial computer by machine, obtain the day knot to be tested
The descending test data of structure.
2. Antenna testing system is digitized as claimed in claim 1, it is characterised in that the digitlization Antenna testing system is also
Including data transmission receiver, it is set with the digitlization antenna probes array and the digital test respectively by wireless channel
Standby connection；Data and the number after the packing that the digitlization antenna probes array is sent in up test job pattern
Data after the packing that word test equipment is sent in descending test job pattern form radiofrequency signal spoke after being converted through digital-to-analogue
It is incident upon the data transmission receiver；The data transmission receiver is configured as carrying out low noise successively to the radiation signal received putting
Greatly, sampling, analog-to-digital conversion, data processing and packing, and the data after packing are sent into the center by the data/address bus
Industrial computer.
3. Antenna testing system is digitized as claimed in claim 2, it is characterised in that the data transmission receiver includes connecting successively
The number connect pass reception antennas, low-noise amplifier, the first A/D circuits and the first DSP circuit, and the first A/D circuits with
And first DSP circuit is respectively connected with the data/address bus；Wherein：
The number passes reception antenna and is configurable for receiving the radiofrequency signal, and the radiofrequency signal is inputted into the low noise
Acoustic amplifier；
The low-noise amplifier is configurable for being amplified the radiofrequency signal that it is received；
The first A/D circuits are configured as under the control of descending sampling clock synchronizing signal after amplifying to low-noise amplifier
Radiofrequency signal carry out real-time sampling, and to after sampling signal carry out analog-to-digital conversion, formed digital sampled signal；
First DSP circuit carries out data processing and packing to the digital sampled signal, and the data after packing are passed through
The data/address bus sends into the center industrial computer.
4. as claimed in claim 1 digitlization Antenna testing system, it is characterised in that the digital test equipment include according to
Secondary connected the 2nd A/D circuits, the second DSP circuit and the 2nd D/A circuits, and the 2nd A/D circuits, the second DSP circuit
And the 2nd D/A circuits be respectively connected with the data/address bus；Wherein：
In up test job pattern, second DSP circuit is configured as the control in the uplink state setting signal
Lower generation data signal, the 2nd D/A circuits are configured as institute under the control of the upstream sampling clock sync signal
The data signal for stating the generation of the second DSP circuit carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day knot to be tested
Structure；
In descending test job pattern, the 2nd A/D circuits are in the downstream state setting signal and described descending adopt
The test signal sent under the control of sample clock sync signal to the antenna structure to be tested carries out real-time sampling, and to sampling
Signal afterwards carries out analog-to-digital conversion, forms digital sampled signal；Second DSP circuit enters line number to the digital sampled signal
Pass through the data/address bus feeding center industrial computer according to processing and packing, and by the data after packing.
5. Antenna testing system is digitized as claimed in claim 4, it is characterised in that the digital test equipment also includes
First low-converter, the first upconverter and first frequency synthesizer, wherein first low-converter and the 2nd A/D
Circuit is connected, and first upconverter is connected with the 2nd D/A circuits, and the first frequency synthesizer is connected to described the
Between one upconverter and first low-converter, and it is connected with the data/address bus and second DSP circuit；Wherein：
First low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by the first frequency
Rate scope is converted into second frequency scope, for the 2nd A/D circuit samplings；
First upconverter is configurable for the frequency for the pumping signal for sending the 2nd D/A circuits by the second frequency
Rate scope is converted into first frequency scope；
The first frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and second DSP circuit
Under the control of the uplink state setting signal transmitted, a local oscillation signal is produced.
6. Antenna testing system is digitized as claimed in claim 2 or claim 3, it is characterised in that the digital test equipment bag
Include the 2nd A/D circuits, the second DSP circuit, the 2nd D/A circuits, the 3rd D/A circuits and number and pass transmitting antenna, wherein described the
Two A/D circuits, the second DSP circuit, the 2nd D/A circuits are sequentially connected, and the 3rd D/A circuits connect the number and pass transmitting respectively
Antenna and second DSP circuit, and the 2nd A/D circuits, the second DSP circuit, the 2nd D/A circuits and the 3rd D/A electricity
Road is respectively connected with the data/address bus；Wherein：
In up test job pattern, second DSP circuit is configured as the control in the uplink state setting signal
Lower generation data signal, the 2nd D/A circuits are configured as institute under the control of the upstream sampling clock sync signal
The data signal for stating the generation of the second DSP circuit carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day knot to be tested
Structure；
In descending test job pattern, the 2nd A/D circuits are in the downstream state setting signal and described descending adopt
The test signal sent under the control of sample clock sync signal to the antenna structure to be tested carries out real-time sampling, and to sampling
Signal afterwards carries out analog-to-digital conversion, forms digital sampled signal；Second DSP circuit enters line number to the digital sampled signal
Pass through the data/address bus feeding center industrial computer according to processing and packing, and by the data after packing；And the 2nd DSP
Circuit sends the data after packing to the 3rd D/A circuits simultaneously, and the 3rd D/A circuits are synchronous in descending sampling clock
Data after the packing received under the control of signal carry out forming number biography pumping signal after digital-to-analogue conversion, and the number passes hair
Penetrate antenna to pass under the excitation of pumping signal in the number, radiated radio frequency (RF) signal.
7. Antenna testing system is digitized as claimed in claim 6, it is characterised in that the digital test equipment also includes
First low-converter, the first upconverter and first frequency synthesizer, wherein first low-converter and the 2nd A/D
Circuit is connected, and first upconverter is connected with the 2nd D/A circuits, and the first frequency synthesizer is connected to described the
Between one upconverter and first low-converter, and it is connected with the data/address bus and second DSP circuit；Wherein：
First low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by the first frequency
Rate scope is converted into second frequency scope, for the 2nd A/D circuit samplings；
First upconverter is configurable for the frequency for the pumping signal for sending the 2nd D/A circuits by the second frequency
Rate scope is converted into first frequency scope；
The first frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and second DSP circuit
Under the control of the uplink state setting signal transmitted, a local oscillation signal is produced.
8. the digitlization Antenna testing system as described in claim 1 or 4 or 5, it is characterised in that the digitlization antenna probes
Including the up probe antenna being sequentially connected, the 4th A/D circuits, the 4th DSP circuit, the 4th D/A circuits and descending probe day
Line, and the 4th A/D circuits, the 4th DSP circuit and the 4th D/A circuits be respectively connected with the data/address bus；Wherein：
In up test job pattern, the up probe antenna is used to receive the test that the antenna structure to be tested is sent
Signal；Control of the 4th A/D circuits in the uplink state setting signal and the upstream sampling clock sync signal
Under real-time sampling is carried out to the test signal that the up probe antenna is received, and analog-to-digital conversion is carried out to the signal after sampling,
Form digital sampled signal；4th DSP circuit carries out data processing and packing to the digital sampled signal, and will packing
Data afterwards send into the center industrial computer by the data/address bus；
In descending test job pattern, the 4th DSP circuit is configured as the control in the downstream state setting signal
Lower generation data signal, the 4th D/A circuits are configured as institute under the control of the descending sampling clock synchronizing signal
State the 4th DSP circuit generation data signal carry out digital-to-analogue conversion, formed pumping signal, by the descending probe antenna radiate to
The antenna structure to be tested.
9. Antenna testing system is digitized as claimed in claim 8, it is characterised in that the digitlization antenna probes also include
Second low-converter, the second upconverter and second frequency synthesizer, wherein second low-converter and the 4th A/D
Circuit is connected, and second upconverter is connected with the 4th D/A circuits, and the second frequency synthesizer is connected to described the
Between two upconverter and second low-converter, and it is connected with the data/address bus and the 4th DSP circuit；Wherein：
Second low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by the first frequency
Rate scope is converted into second frequency scope, for the 4th A/D circuit samplings；
Second upconverter is configurable for the frequency for the pumping signal for sending the 4th D/A circuits by the second frequency
Rate scope is converted into first frequency scope；
The second frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and the 4th DSP circuit
Under the control of the uplink state setting signal transmitted, a local oscillation signal is produced.
10. Antenna testing system is digitized as claimed in claim 2 or claim 3, it is characterised in that the digitlization antenna probes bag
Include the 4th A/D circuits, the 4th DSP circuit, the 4th D/A circuits, the 5th D/A circuits and number and pass transmitting antenna, the 4th A/D
Circuit, the 4th DSP circuit, the 4th D/A circuits are sequentially connected, the 5th D/A be electrically connected to it is described number pass transmitting antenna with
Between 4th DSP circuit, and the 4th A/D circuits, the 4th DSP circuit, the 4th D/A circuits and the 5th D/A circuits
Respectively it is connected with the data/address bus；Wherein：
In up test job pattern, the 4th A/D circuits are in the uplink state setting signal and described up adopt
The test signal sent under the control of sample clock sync signal to the antenna structure to be tested carries out real-time sampling, and to sampling
Signal afterwards carries out analog-to-digital conversion, forms digital sampled signal；4th DSP circuit enters line number to the digital sampled signal
Pass through the data/address bus feeding center industrial computer according to processing and packing, and by the data after packing；And the 4th DSP
Circuit sends the data after packing to the 5th D/A circuits simultaneously, and the 5th D/A circuits are synchronous in upstream sampling clock
Data after the packing received under the control of signal carry out forming number biography pumping signal after digital-to-analogue conversion, and the number passes hair
Penetrate antenna to pass under the excitation of pumping signal in the number, radiated radio frequency (RF) signal；
In descending test job pattern, the 4th DSP circuit is configured as the control in the downstream state setting signal
Lower generation data signal, the 4th D/A circuits are configured as institute under the control of the descending sampling clock synchronizing signal
The data signal for stating the generation of the 4th DSP circuit carries out digital-to-analogue conversion, forms pumping signal, and be sent to the day knot to be tested
Structure.
11. Antenna testing system is digitized as claimed in claim 10, it is characterised in that the digitlization antenna probes are also wrapped
The second low-converter, the second upconverter and second frequency synthesizer are included, wherein second low-converter and the described 4th
A/D circuits are connected, and second upconverter is connected with the 4th D/A circuits, and the second frequency synthesizer is connected to institute
State between the second upconverter and second low-converter, and be connected with the data/address bus and the 4th DSP circuit；Its
In：
Second low-converter is configurable for the frequency for the test signal for sending antenna structure to be tested by the first frequency
Rate scope is converted into second frequency scope, for the 4th A/D circuit samplings；
Second upconverter is configurable for the frequency for the pumping signal for sending the 4th D/A circuits by the second frequency
Rate scope is converted into first frequency scope；
The second frequency synthesizer is configured as the reference frequency transmitted in the data/address bus and the 4th DSP circuit
Under the control of the uplink state setting signal transmitted, a local oscillation signal is produced.
12. Antenna testing system is digitized as claimed in claim 1, it is characterised in that the digitlization Antenna testing system
Also include motor and the azimuth rotating platform being connected with the motor, the antenna structure to be tested is arranged on the azimuth rotating platform
On, the motor is connected with the data/address bus；The center industrial computer sends motor control pulse by the data/address bus；
The motor carries out stepping rotation under the control of the motor control pulse, and then drives the azimuth rotating platform along level orientation
Rotate.
13. Antenna testing system is digitized as claimed in claim 1, it is characterised in that the digitlization Antenna testing system
Also include mounting bracket, for installing the digitlization antenna probes and the data/address bus.
14. Antenna testing system is digitized as claimed in claim 1, it is characterised in that the digitlization Antenna testing system
Also include shielded anechoic chamber.
15. one kind digitlization antenna test method, it is characterised in that using the digitlization as described in claim any one of 1-14
Antenna testing system is tested, and this method comprises the following steps：
S1:Up testing procedure, is specifically included：
S11：The center industrial computer sets up test period, and sending up starting impulse by the data/address bus makes respectively to set
It is standby to start work, and uplink state setting signal and upstream sampling clock sync signal are sent by the data/address bus；
S12：The digital test equipment receives the uplink state setting signal, produces a Upstream driver signal, and by institute
State Upstream driver signal and be sent to the antenna structure to be tested；
S13：The antenna structure to be tested is under the excitation of the Upstream driver signal and the uplink state setting signal
Control under, work in transmit state, to space radiation signal；
S14：The digitlization antenna probes array is synchronous in the uplink state setting signal and the upstream sampling clock
The radiation signal sent under the control of signal from N number of spatial wireless channels to the antenna structure to be tested carries out real-time sampling,
Analog-to-digital conversion, data processing and packing are carried out to the signal after sampling successively, and the data after packing are total by the data
Line sends into the center industrial computer；
S15：The center industrial computer is collected and analyzed and processed to the data after packing, obtains the antenna structure to be tested
Up test data；
S2:Descending testing procedure, is specifically included：
S21：Center industrial computer sets descending test period, and sending descending starting impulse by the data/address bus opens each equipment
Start building to make, and downstream state setting signal and descending sampling clock synchronizing signal are sent by the data/address bus；
S22：Downstream state setting signal described in the digitlization antenna probes array received, produces a downstream driver signal, and
The downstream driver signal is sent to the antenna structure to be tested；And the digitlization antenna probes array is described descending
To space radiation test signal under the control of state setting signal；
S23：The antenna structure to be tested is under the excitation of the downstream driver signal and the downstream state setting signal
Control under be operated in reception and make under state, receive the test signal of the digitlization antenna probes array radiation, and will receive
To test signal send；
S24：The digital test equipment is in the downstream state setting signal and the descending sampling clock synchronizing signal
Control under the test signal that is sent to the antenna structure to be tested carry out real-time sampling, the signal after sampling is carried out successively
Analog-to-digital conversion, data processing and packing, and the data after packing are sent into the center industrial computer by the data/address bus；
S25：The center industrial computer is collected, decodes and analyzed and processed to the data after packing, obtains the day to be tested
The descending test data of cable architecture.
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| CN114280382B (en) * | 2021-12-27 | 2023-06-27 | 中国电子科技集团公司第三十八研究所 | Automatic spherical near field antenna correction test system and test method thereof |
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