CN106705863B - A method of improving the full test distance of probe beam deflation instrument - Google Patents
A method of improving the full test distance of probe beam deflation instrument Download PDFInfo
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- CN106705863B CN106705863B CN201710030861.8A CN201710030861A CN106705863B CN 106705863 B CN106705863 B CN 106705863B CN 201710030861 A CN201710030861 A CN 201710030861A CN 106705863 B CN106705863 B CN 106705863B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
Abstract
The invention discloses a kind of methods of full test distance for improving probe beam deflation instrument, including tunable scan laser, the first coupler, triggering interferometer, stellar interferometer, data collecting card and computer.After the light source of tunable scan laser passes through the first coupler, a part of light sequentially enters the second coupler, third coupler, the device and the first photodetector for generating phase difference of triggering interferometer, and another part light enters the 4th coupler of stellar interferometer；A part of light being emitted after the 4th coupler directly reaches the second photodetector, and another part light reaches device under test after entering optical circulator again, by the reflected light of device under test by reaching the second photodetector after optical circulator.Method of the invention has many advantages, such as lossless, high-precision rapid survey, and measurement result is more accurate, and measurement method is more convenient.
Description
Technical field
The present invention relates to Fibre Optical Sensor and optical-fiber network device and system detection instrument technical fields, optical measuring technique neck
Domain, more particularly to a kind of method of full test distance for improving probe beam deflation instrument.
Background technique
Optical frequency domain reflection technology (Optical Frequency Domain Reflectometry, OFDR) is distributed light
Fibre measurement and developing direction emerging in sensing technology.More traditional optical time domain reflection method (Optical Time Domain
Reflectometry, OTDR), OFDR has the features such as signal-to-noise ratio is high, and spatial resolution is high, high sensitivity.
In OFDR system, all there is nonlinear characteristic in commodity laser in optical frequency sweep, this will result in optical frequency domain
The spatial resolution severe exacerbation of reflectometer.Currently, being used to by additional triggers interferometer in same domain space sampled signal
The nonlinear effect for solving laser, inhibits influence of the optical frequency nonlinear scanning of laser to probe beam deflation instrument.This side
Method uses the Additional interference instrument of fixed delay arm to generate sample clock pulse in real time for main interferometer, and the frequency intervals such as realization are adopted
Sample can inhibit influence of the optical frequency nonlinear scanning of laser to probe beam deflation device.But according to sampling thheorem, optical frequency
The maximum measurement distance of domain reflectometer will receive the limitation of the fixed delay arm lengths of Additional interference instrument, and the above method is simultaneously not suitable for
The probe beam deflation instrument of long range.
Summary of the invention
It is an object of the invention to propose a kind of method of full test distance that can be improved probe beam deflation instrument, with reality
The now measurement of long range.
The technical solution adopted by the invention is as follows:
A method of the full test distance of probe beam deflation instrument being improved, the system that this method is realized includes: tunable
Scan laser, the first coupler, triggering interferometer, stellar interferometer, data collecting card and computer；The triggering interferometer
Including the second coupler, third coupler, the device and the first photodetector for generating phase difference；The stellar interferometer includes
4th coupler, optical circulator and the second photodetector；First photodetector and the second photodetector respectively with
Data collecting card connection, the data collecting card are connected to computer；The light source of the tunable scan laser passes through the first coupling
After clutch, a part of light sequentially enters triggering the second coupler of interferometer, third coupler, the device for generating phase difference and the
One photodetector, another part light enter the 4th coupler of stellar interferometer；The a part being emitted after the 4th coupler
Light directly reaches the second photodetector, and another part light reaches device under test after entering optical circulator again, anti-by device under test
The light come is emitted back towards by reaching the second photodetector after optical circulator.
External clock of the triggering interferometer as stellar interferometer, trigger data acquisition stick into the acquisition of row data；It is logical
The device for generating phase difference is overregulated, to generate different phase differences and then carry out multiple data acquisition, obtains multiple adopt
Sample data are then combined with these sampled datas, reach and reduce the sampling period, improve full test distance.
Preferably, the coupling ratio of first coupler is 90:10, second coupler, third coupler and the 4th
The coupling ratio of coupler is 50:50.
Preferably, the device for generating phase difference is LC variable wave plate.
The principle of the method for the present invention is as follows；External clock of the interferometer as stellar interferometer is triggered, sample frequency isTrigger data acquisition sticks into the acquisition of row data, in same frequency domain when meeting signal acquisition, solves Fourier transformation etc.
The sampling interval of the frequencies such as time.And there are optical path differences for the same two-arm of stellar interferometer, therefore according to sampling thheorem, triggering interference
The optical path difference of instrument two-arm is twice of stellar interferometer, therefore maximum measurement distance is limited.The present invention is tunable sharp in solution
Light device nonlinear effect proposes to apply using the device for generating phase difference additional while the sampling of frequency intervals such as meeting
It is generated on triggering interferometerPhase difference carries out multiple repairing weld, in the adjacent double sampling phase difference of domain spaceSample it
Data afterwards merge, and are equal toAndTherefore the expansion of triggering interferometer two-arm difference is twice, stellar interferometer
Expansion is twice.One is sampled when being in time physically signal zero-crossing rising edge as sampling clock due to triggering interferometer
Secondary, the present invention increases the device of a generation phase difference on triggering interferometer, so that it may generate in timePhase difference, this
Sample has just achieved the effect that domain space, increases full test distance, solves fixation of the measurement distance by Additional interference instrument
The limitation of time delay arm lengths measures distance to improve the maximum of probe beam deflation instrument.
Method compared with prior art, method of the invention have many advantages, such as lossless, high-precision, rapid survey, obtain
Measurement result is more accurate, and the measurement method is more convenient.
Detailed description of the invention
Fig. 1 is present system structural schematic diagram；
Fig. 2 is signal graph of the embodiment of the present invention in domain space；
Fig. 3 is signal graph of the embodiment of the present invention in time domain space.
Specific embodiment
The following further describes the present invention with reference to the drawings.
Such as the system structure diagram of Fig. 1 method to realize the present invention, system includes tunable laser 1,90:10 coupling
Device 2, triggering interferometer, stellar interferometer, data collecting card 10, computer 11.Wherein, triggering interferometer includes 50:50 coupler
3,50:50 coupler 4, LC variable wave plate 5, photodetector 6；Stellar interferometer includes 50:50 coupler 7, optical circulator
8, photodetector 9.
Laser 1 carries out frequency sweep, and light is by 90:10 coupler 2, wherein 10% light enters triggering interferometer, 90%
Light enters stellar interferometer.10% light splitting enters the coupler 3 of triggering interferometer, and there are optical path differences for two-arm, arrives after forming interference
Up to photodetector 6；90% light enters stellar interferometer, directly reaches photodetector 9 by 7 rear portion light of coupler,
After another part light enters optical circulator 8, then device under test 12 is reached, the reflected light of device under test 12 is again introduced into the ring of light
Shape device 8 reaches photodetector 9 after forming interference with another beam light modulation.
The modulation rate of tunable laser 1 is γ, when there are optical path difference, differential group delay τ for two-arm0, meet low modulation rate
It is approximateFormed interference, photodetector 6 convert after electric signal into U (v)=U0[1+cos(2πvτ0+ ξ)], U is
Voltage, τ0To trigger interferometer two-arm delay inequality, ν is frequency, and ξ is phase constant.Interferometer is triggered as stellar interferometer
External clock sample frequency isTrigger data acquisition card 10 carries out data acquisition.And the same two-arm of stellar interferometer is deposited
In optical path difference, therefore according to sampling thheorem, the optical path difference for triggering interferometer two-arm is twice of stellar interferometer, therefore maximum survey
Span is from limited.
The present embodiment method is divided into double sampling, and sample frequency isAs shown in Fig. 2, in domain space first time
It is poor with second of sampling phaseData are respectively N1 (n1, n2, n3, n4 ...) twice, and N2 (e1, e2, e3, e4 ...) is adopted
Data after sample merge into N3 (n1, e1, n2, e2, n3, e3), are equal toAndTrigger interferometer two-arm
Difference, which expands, to be twice, and stellar interferometer, which also expands, to be twice.
As shown in figure 3, in time, because triggering interferometer is physically signal zero-crossing rising edge as sampling clock
When sampling it is primary, by increasing a LC variable wave plate 5 on triggering interferometer, generate in timePhase difference, in this way
Just achieve the effect that domain space, increases full test distance.
Claims (4)
1. a kind of method for the full test distance for improving probe beam deflation instrument, which is characterized in that the system packet that this method is realized
It includes: tunable scan laser, the first coupler, triggering interferometer, stellar interferometer, data collecting card and computer；It is described
Triggering interferometer includes the second coupler, third coupler, the device and the first photodetector for generating phase difference；The measurement
Interferometer includes the 4th coupler, optical circulator and the second photodetector；First photodetector and the second photoelectricity are visited
It surveys device to connect with data collecting card respectively, the data collecting card is connected to computer；
After the light source of the tunable scan laser passes through the first coupler, a part of light sequentially enters the of triggering interferometer
Two couplers, third coupler, the device and the first photodetector for generating phase difference, another part light enter stellar interferometer
The 4th coupler；A part of light being emitted after the 4th coupler directly reaches the second photodetector, another part light into
Device under test is reached again after entering optical circulator, is visited by the reflected light of device under test by reaching the second photoelectricity after optical circulator
Survey device.
2. a kind of method of full test distance for improving probe beam deflation instrument according to claim 1, which is characterized in that
External clock of the triggering interferometer as stellar interferometer, trigger data acquisition stick into the acquisition of row data；By adjusting institute
The device for generating phase difference is stated, to generate different phase differences and then carry out multiple data acquisition, obtains multiple sampled datas, so
After merge these sampled datas, reach reduce the sampling period, improve full test distance.
3. a kind of method of full test distance for improving probe beam deflation instrument according to claim 1, which is characterized in that
The coupling ratio of first coupler is 90:10, and the coupling ratio of second coupler, third coupler and the 4th coupler is equal
For 50:50.
4. a kind of method of full test distance for improving probe beam deflation instrument according to claim 1, which is characterized in that
The device for generating phase difference is LC variable wave plate.
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| CN110749420B (en) * | 2019-09-12 | 2022-05-06 | 芯华创(武汉)光电科技有限公司 | OFDR detection device |
| CN111928972B (en) * | 2020-08-06 | 2021-11-30 | 中国人民解放军海军工程大学 | Method and system for improving spatial resolution of distributed optical fiber temperature measurement system |
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| CN101611301A (en) * | 2007-02-28 | 2009-12-23 | 日本电信电话株式会社 | Optical refractometry measuring method and device |
| CN102322880A (en) * | 2011-08-18 | 2012-01-18 | 天津大学 | Polarization sensitive distributive optical frequency domain reflection disturbance sensor and demodulation method |
| CN102420650A (en) * | 2011-08-09 | 2012-04-18 | 天津大学 | Device and method for inhibiting nonlinear scanning of laser of optical frequency domain reflectometer |
| CN104296965A (en) * | 2014-09-20 | 2015-01-21 | 江苏骏龙电力科技股份有限公司 | OFDR experiment system |
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| WO2005069943A2 (en) * | 2004-01-15 | 2005-08-04 | Bae Systems Information And Electronic Systems Integration Inc. | Method and apparatus for calibrating a frequency domain reflectometer |
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| CN101611301A (en) * | 2007-02-28 | 2009-12-23 | 日本电信电话株式会社 | Optical refractometry measuring method and device |
| CN102420650A (en) * | 2011-08-09 | 2012-04-18 | 天津大学 | Device and method for inhibiting nonlinear scanning of laser of optical frequency domain reflectometer |
| CN102322880A (en) * | 2011-08-18 | 2012-01-18 | 天津大学 | Polarization sensitive distributive optical frequency domain reflection disturbance sensor and demodulation method |
| CN104296965A (en) * | 2014-09-20 | 2015-01-21 | 江苏骏龙电力科技股份有限公司 | OFDR experiment system |
| CN105846890A (en) * | 2016-03-25 | 2016-08-10 | 江苏骏龙电力科技股份有限公司 | Optical fiber detecting device for kilometer-grade measurement distance |
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| 《光频域反射技术中激光相位噪声影响分析》;谢玮霖 等;《光学学报》;20110710;第31卷(第7期);第0706003-4--0706003-6页 |
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