CN106597169A - Measuring apparatus for electronic equipment - Google Patents
Measuring apparatus for electronic equipment Download PDFInfo
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- CN106597169A CN106597169A CN201611218466.4A CN201611218466A CN106597169A CN 106597169 A CN106597169 A CN 106597169A CN 201611218466 A CN201611218466 A CN 201611218466A CN 106597169 A CN106597169 A CN 106597169A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C17/00—Arrangements for transmitting signals characterised by the use of a wireless electrical link
- G08C17/02—Arrangements for transmitting signals characterised by the use of a wireless electrical link using a radio link
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a measuring apparatus for electronic equipment. The measuring apparatus comprises a plurality of test board cards provided with testing ports and male seats of connection ports, a plurality of back panels for installing all the test board cards, and a processing terminal. One end of each of the testing ports is connected with to-be-measured electronic equipment and the other end of each of the testing ports is connected with the male seat of the corresponding test board card. The back panels are provided with first communication ports and female seats of the connection ports; the female seats of all the back panels are connected mutually; all female seats are connected with the male seats of the corresponding test board bards and are connected with the first communication ports of the corresponding back panels. The processing terminal is connected with the first communication ports of the corresponding back panels.
Description
Technical field
The present invention relates to the test device of testing for electrical equipment technical field, more particularly to a kind of electronic equipment.
Background technology
With the development of technology, the species of electronic equipment is more and more, using more and more extensive.In order to ensure electronic equipment
Function, performance it is normal, needs periodically carry out effectively test to electronic equipment and safeguard, ensure electronic device works good
State.
Current test equipment part of detecting adopts integrated design, hardware board to be responsible for gathering, process with data display
Test data, carries display device and combines host computer procedure transmitting control commands, shows measurement result.However, current test
Equipment can only meet the functional test to indivedual specific model electronic products, when testing multiple products, need other tests to set
Standby cooperation can just complete test, and when user needs to detect multiple stage different type electronic equipment, it is every device configuration to need
One detecting instrument, testing cost is high.
The content of the invention
Based on this, it is necessary to for the high problem of testing cost, there is provided the test device of a kind of electronic equipment.
The measurement apparatus of a kind of electronic equipment, including：
Multiple test boards, are equipped with the male seat of test interface and docking interface in each test board, each test connects
Mouth one end is connected with electronic equipment to be measured, and the other end is connected with the male seat in corresponding test board；
For installing multiple backboards of each test board, the first communication interface and docking interface are equipped with each backboard
Female seat, the female seat on each backboard is connected with each other, each female seat respectively with the male seat docking in corresponding test board, and with it is right
The first communication interface for answering backboard is connected；
Processing terminal, is connected respectively with the first communication interface of corresponding backboard；
The processing terminal is respectively sent to each backboard, the test by first communication interface by instruction is tested
The test operation information that first identification information and correspondence test board of each test board are performed is carried in instruction；
The backboard sends the test instruction to corresponding test board according to first identification information；
The test board performs corresponding test operation according to above-mentioned test operation information, and test data is back to
The processing terminal.
The test device of above-mentioned electronic equipment, is provided with multiple test boards and multiple backboards, and each test board passes through
Test interface receives the test data of electronic equipment to be measured, and is transmitted test result by male seat to the female seat of backboard, female seat
Corresponding first communication interfaces of Jing export test result to processing terminal such that it is able to realize with an equipment to multiple to be measured
Electronic equipment is tested, and reduces testing cost.
Description of the drawings
Fig. 1 is the structural representation of the test device of the electronic equipment of first embodiment；
Fig. 2 is the workflow diagram of the test device of the electronic equipment of one embodiment；
Fig. 3 is the docking interface diagram of one embodiment；
Fig. 4 is the schematic diagram of the frame structure of the test data frame of one embodiment；
Fig. 5 is the structural representation of the test device of the electronic equipment of second embodiment；
Fig. 6 is the structural representation of the test device of the electronic equipment of 3rd embodiment；
Fig. 7 is the structural representation of the test device of the electronic equipment of fourth embodiment.
Specific embodiment
Technical scheme is illustrated below in conjunction with the accompanying drawings.
As shown in figure 1, being the test device of the electronic equipment of the first embodiment of the present invention, it may include：
The measurement apparatus of a kind of electronic equipment, it is characterised in that include：
Multiple test boards, are equipped with the male seat of test interface and docking interface in each test board, each test connects
Mouth one end is connected with electronic equipment to be measured, and the other end is connected with the male seat in corresponding test board；
For installing multiple backboards of each test board, the first communication interface and docking interface are equipped with each backboard
Female seat, the female seat on each backboard is connected with each other, each female seat respectively with the male seat docking in corresponding test board, and with it is right
The first communication interface for answering backboard is connected；
Processing terminal, is connected respectively with the first communication interface of corresponding backboard；
The processing terminal is respectively sent to each backboard, the test by first communication interface by instruction is tested
The test operation information that first identification information and correspondence test board of each test board are performed is carried in instruction；
The backboard sends the test instruction to corresponding test board according to first identification information；
The test board performs corresponding test operation according to above-mentioned test operation information, and test data is back to
The processing terminal.
The test board can design the circuit of difference in functionality according to measurement demand, realize the survey to distinct electronic apparatuses
Examination, meets measurement demand of the user to various electronic.It is for instance possible to use following kind of test board：120MHz is received
Sender measures board, speech channel switch measurement board, antenna feeder measurement board, 550MHz transceivers measurement board, failure
Diagnostic measurement board etc..
Test board may be installed on backboard.In one embodiment, the edge of each backboard can arrange guide rail, test board
Card can be by the guide rails assembling on correspondence backboard.For the ease of installing, board both sides can reserve guide rail size.
Test board is provided with test interface, and the test interface can be by the test data in electronic equipment to be measured
Transmitting to test board carries out the data-interface of test processes.The electronic equipment is referred to by integrated circuit, transistor, electron tube
Deng electronic devices and components composition, the equipment that application electric technology (including) software plays a role, including electronic computer and by electricity
The robot of sub- computer controls, numerical control or stored program controlled etc..For example, the electronic equipment can be computer, mobile phone, flat board electricity
Brain, printer, facsimile machine, all-in-one etc..
Fig. 2 is the workflow diagram of the measurement apparatus of the electronic equipment.
In one embodiment, the processing terminal is provided with display interface, and the display interface includes that multiple display is divided
Area.The processing terminal is further used for receiving idsplay order, and the first mark letter for showing board is carried in the idsplay order
Second identification information of breath and display subregion；After the test data for receiving test board return, referred to according to the display
The first identification information and the second identification information carried in order includes the test data in corresponding display subregion.It is described aobvious
Show that interface can be display screen.The processing terminal can also include human-computer interaction device, and the idsplay order can be by user Jing
Human-computer interaction device is input into processing terminal, and Jing processing terminals are forwarded to each test board.In one embodiment, it is described
Display screen is touch screen, can both serve as display interface, and the function of man-machine interaction can be realized again.First identification information can
Being the information for each test board of unique mark such as address of test board.First identification information can be pre-assigned to
Each test board.Second identification information can be the sequence number that each shows subregion.One display interface can be according to test
The quantity of board is divided into the display subregion of varying number.For example, when board quantity is 4, show that subregion can be divided into
The display subregion of 2*2；Again for example, when board quantity is 9, show that subregion can be divided into the display subregion of 3*3.In order to just
In each information for showing subregion is watched, the processing terminal can be referred to the idsplay order of receiving user's input, the display
Portability needs the second identification information of the display subregion checked in order, and processing terminal can be according to the idsplay order to corresponding
Show that subregion is amplified display, and the display properties of other display subregions is set to hide.
Docking interface is used to provide stable power support for test board；By test board data transfer to the wireless of backboard
First communication interface, the first communication interface forwards the data to again processing terminal, while the instruction transmission that processing terminal is sent
To board；Structure Auxiliary support is provided for test board.Each backboard contains a docking interface female seat, corresponding test board
Docking is realized containing docking interface male seat.Male seat and female seat can adopt bend cutting seat.To meet data between backboard and different boards
The needs of transmission, a kind of special purpose lighter connection interface of definable, using 7+15 pin bend cutting seats, pin-pitch 1.27mm, pin function is such as
Table 1 below.
The interface pin function of table 1
Wherein, the male seat and female seat of docking interface can adopt above-mentioned pin configuration.The power supply of the docking interface female seat
Pin is connected with power supply unit, and the power pins of the docking interface male seat are connected with the power pins of docking interface female seat
Connect, the analogue signal transmission pin of the docking interface female seat is connected with the analogue signal transmission pin of the docking interface male seat
Connect, the high speed data transfer pin and slow data transmission pin of the docking interface female seat connect respectively with the corresponding first communication
Mouth is connected.Power pins are mainly test board and provide electric power support, and analogue signal transmission pin mainly realizes different tests
Analogue signal transmission between board, slow data transmission pin mainly realizes low speed number between board and the communication interface of backboard first
According to transmission, high speed data transfer pin mainly realizes high speed data transfer between board and the communication interface of backboard first.Docking connects
The schematic diagram of mouth is as shown in Figure 3.
In one embodiment, the processing terminal is further used for the electronic equipment connected according to each test board
Performance parameter and each test board performed by test operation type the data volume of the test data is carried out it is pre-
Survey；If the data volume that prediction is obtained is more than default data-quantity threshold, controls the docking interface and passed by the high-speed data
Defeated pin transmits the test data；If the data volume that prediction is obtained is less than or equal to default data-quantity threshold, control is described
Docking interface transmits the test data by the slow data transmission pin.In this way, data biography can be improved
Defeated efficiency, and then improve testing efficiency.
In one embodiment, the test board can be when test operation reaches certain progress just by current test
Data transfer all just need not transmit test data to process after execution is completed in whole test operation to processing terminal
Terminal.Specifically, running node can be arranged to test operation by processing terminal in advance, for example, can be arranged in test program
Program node.Test data, if detecting the running node, is back to described process eventually by test board when test is performed
End is shown.In this way, can avoid because program error or other uncontrollable reasons cause test result entirely without
Method shows, also allows for carrying out location of mistake testing out to stagger the time, and improves testing efficiency.
In one embodiment, the test board is further used for by described other test boards of docking interface
Test data；Test operation is performed according to the test data for receiving.During actual test, it is understood that there may be certain is to be measured
Electronic equipment on there is some, need by multiple test interfaces receive electronic equipment on test data situation,
In this case, the data interchange that can realize between each test board by docking interface, without waiting in electronic equipment
A partial test complete after, re-test other parts, and can be to various pieces concurrent testing, improve test effect
Rate.
Test data can be sent as a data frame to the processing terminal；May include in the Frame：The survey
First identification information of test plate (panel) card, redundancy check code, data frame length, data frame number and test data.One embodiment
The frame structure of test data frame can be as shown in Figure 4.The processing terminal can be according to the first of the test board the mark letter
Cease and the test data that each test board is returned is respectively stored in different memory spaces.
First communication interface can be wireline interface, or wave point.In a preferred embodiment, institute
It can be WIFI (Wireless Fidelity, Wireless Fidelity) interface to state the first communication interface.In one embodiment, may be used also
To arrange the second communication interface on processing terminal, described second communication interface one end is connected with the processing terminal, another
End is connected with first communication interface.When the first communication interface is WIFI interface, the second communication interface can also be
WIFI interface.By the first communication interface and the second communication interface, it is possible to achieve the data between processing terminal and test board
Intercommunication.
In one embodiment, the processing terminal can integrated industrial control mainboard (for example, X86 mainboards), integrated wireless WIFI
For data transfer, set of cells provides electric power support for equipment, and band carries software program to be used to process measurement data, shows that touch screen is used
Show and man-machine interaction input in measurement result.
In order to carry out electric power support to the test device of the present invention, the first power supply can be set on the processing terminal and connect
Mouthful, described first power supply interface one end is connected with the processing terminal, and the other end is connected with power supply unit, so as to showing
Equipment is powered.Second power supply interface can also be set respectively on each backboard, each the second power supply interface one end with it is right
The first power pins answered are connected, and the other end is connected with power supply unit, so as to power to each test board.Described first
Power supply interface and the second power supply interface can be battery interfaces, be powered for accessing battery, so that test device can
Can use in the wild or when unregulated power supply.
In one embodiment, the test device of the electronic equipment may also include draw-in groove, be provided with the draw-in groove for
Accommodate the groove position of each backboard.Draw-in groove may include single cavity position draw-in groove, double flute position draw-in groove and three groove position draw-in grooves, respectively including a groove
Position, two groove positions and three groove positions, each groove position can accommodate a backboard.Single cavity position draw-in groove can install a single cavity board, structure
Into single cavity measurement module；Double flute position draw-in groove can install two single cavity boards or a double flute board, constitute double flute measurement module；Three
Groove position draw-in groove can install three single cavity boards, or install a single cavity board and a double flute board, constitute three groove measurement modules.
Board can be arranged in draw-in groove using horizontal fixed form.Single cavity measurement module, double flute measurement mould can be set according to actual needs
The quantity of block and three groove measurement modules.Single cavity measurement module, double flute measurement module and three groove measurement modules may be connected to process eventually
End, forms test device, for example, can form 120MHz transceiver testers, speech channel switch test instrument, antenna feeder test
The test devices such as instrument, 550MHz transceiver testers, Fault Diagnosis Testing Instrument.
Test device with New function, combining wireless WIFI skills can be formed by quick collocation difference in functionality test board
Multiple test modules can be connected to processing terminal and realize the test result of distinct device in a processing terminal by art networking simultaneously
It is upper to show simultaneously.Processing terminal is maximum to support that 32 single cavity measurement modules are accessed simultaneously.
Single cavity measurement module, double flute measurement module, three groove measurement modules, processing terminal both can be used separately to form test
Device, it is also possible to form test device together by docking structural grouping, can need flexibly to select according to onsite application.It is single
Groove measurement module is with processing terminal docking as shown in figure 5, double flute measurement module and processing terminal docking are as shown in fig. 6, three grooves are surveyed
Amount module is as shown in Figure 7 with processing terminal docking.
Can securing member (for example, it may be fastening bolt) be set in docking structure, when needing to be applied in combination, survey is placed
Amount module, processing terminal and docking structure, are fixed by securing member and be capable of achieving device combination.The docking structure can arrange two
It is individual, the two ends of measurement module are separately positioned on, two securing members can be respectively set in each docking structure, by docking structure and fastening
Part can assemble amount module and processing terminal.By pulling down four securing members, docking structural member can be removed, realize processing eventually
End separates with single cavity, double flute, three groove measurement modules.
The present invention has advantages below：
(1) disclosure satisfy that user is required the function of Multiple Type distinct device, performance detection, and by the survey of distinct device
Test result is displayed in same processing terminal.
(2) disclosure satisfy that user realizes the detection to equipment performance in the case of away from equipment under test；
(3) support to realize the detection to equipment performance in the wild, under unregulated power supply situation.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope of this specification record is all considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more concrete and detailed, but and
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that for one of ordinary skill in the art comes
Say, without departing from the inventive concept of the premise, some deformations and improvement can also be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be defined by claims.
Claims (10)
1. measurement apparatus of a kind of electronic equipment, it is characterised in that include：
Multiple test boards, are equipped with the male seat of test interface and docking interface in each test board, each test interface one
End is connected with electronic equipment to be measured, and the other end is connected with the male seat in corresponding test board；
For installing multiple backboards of each test board, the mother of the first communication interface and docking interface is equipped with each backboard
Seat, the female seat on each backboard is connected with each other, each female seat respectively with the male seat docking in corresponding test board, and carry on the back with corresponding
First communication interface of plate is connected；
Processing terminal, is connected respectively with the first communication interface of corresponding backboard；
The processing terminal will test instruction and is respectively sent to each backboard, the test instruction by first communication interface
The test operation information that middle the first identification information for carrying each test board and correspondence test board are performed；
The backboard sends the test instruction to corresponding test board according to first identification information；
The test board performs corresponding test operation according to above-mentioned test operation information, and test data is back to described
Processing terminal.
2. measurement apparatus of electronic equipment according to claim 1, it is characterised in that the processing terminal is provided with display
Interface, the display interface includes multiple display subregions；
The processing terminal is further used for：
Idsplay order is received, the first identification information for showing board and the second mark for showing subregion are carried in the idsplay order
Information；
Receive test board return test data after, according in the idsplay order carry the first identification information and
Second identification information includes the test data in corresponding display subregion.
3. the test device of electronic equipment according to claim 1, it is characterised in that the docking interface draws including power supply
Foot, analogue signal transmission pin, high speed data transfer pin and slow data transmission pin；
The power pins of the docking interface female seat are connected with power supply unit, the power pins of the docking interface male seat with refute
The power pins of connection interface female seat are connected, and the analogue signal transmission pin of the docking interface female seat is public with the docking interface
The analogue signal transmission pin of seat is connected, and the high speed data transfer pin and slow data transmission of the docking interface female seat draw
Foot is connected respectively with corresponding first communication interface.
4. the test device of electronic equipment according to claim 3, it is characterised in that the processing terminal is further used
In：
Test behaviour performed by the performance parameter of the electronic equipment connected according to each test board and each test board
The type of work is predicted to the data volume of the test data；
If the data volume that prediction is obtained is more than default data-quantity threshold, controls the docking interface and passed by the high-speed data
Defeated pin transmits the test data；
If the data volume that prediction is obtained is less than or equal to default data-quantity threshold, controls the docking interface and pass through the low speed
Data transfer pin transmits the test data.
5. the test device of electronic equipment according to claim 1, it is characterised in that the processing terminal is further used
In：
The running node that the test board performs test operation is set；
The test board is further used for：
During test operation is performed, if detecting the running node, test data is back to into the processing terminal
Shown.
6. the test device of electronic equipment according to claim 1, it is characterised in that the test board is further used
In：
By the test data of other test boards of the docking interface；
Test operation is performed according to the test data for receiving.
7. the test device of electronic equipment according to claim 1, it is characterised in that the test data is with Frame
Form is sent to the processing terminal；
The Frame includes：
First identification information of the test board, redundancy check code, data frame length, data frame number and test data.
8. the test device of electronic equipment according to claim 1, it is characterised in that the processing terminal is further used
In：
The test data that each test board is returned is respectively stored in by difference according to the first identification information of the test board
Memory space in.
9. the test device of electronic equipment according to claim 1, it is characterised in that also include：
Draw-in groove；
The groove position for accommodating each backboard is provided with the draw-in groove.
10. the test device of electronic equipment according to claim 9, it is characterised in that also include：
Docking structure, the docking structure is provided with securing member, the docking structure by the securing member by the draw-in groove with
Display device is fixed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611218466.4A CN106597169A (en) | 2016-12-26 | 2016-12-26 | Measuring apparatus for electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611218466.4A CN106597169A (en) | 2016-12-26 | 2016-12-26 | Measuring apparatus for electronic equipment |
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| Publication Number | Publication Date |
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| CN106597169A true CN106597169A (en) | 2017-04-26 |
Family
ID=58604247
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611218466.4A Pending CN106597169A (en) | 2016-12-26 | 2016-12-26 | Measuring apparatus for electronic equipment |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107703473A (en) * | 2017-10-16 | 2018-02-16 | 许继电气股份有限公司 | A kind of automatic detection device of direct current transportation OPTODYN modules |
| CN112540262A (en) * | 2020-11-18 | 2021-03-23 | 广西电网有限责任公司电力科学研究院 | Voltage time type feeder automation test system and test method thereof |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101039561A (en) * | 2006-03-15 | 2007-09-19 | 安捷伦科技有限公司 | Multiple configuration stackable instrument modules |
| CN101183243A (en) * | 2006-11-15 | 2008-05-21 | 光洋电子工业株式会社 | Function expanding method for small-sized display device |
| CN101848042A (en) * | 2010-04-20 | 2010-09-29 | 惠州Tcl移动通信有限公司 | Method and system for testing radio frequency of mobile phones |
| CN202309818U (en) * | 2011-10-26 | 2012-07-04 | 福建升龙数码通信技术有限公司 | Mobile phone terminal capable of locating extension module |
| CN102928765A (en) * | 2012-10-22 | 2013-02-13 | 上海福太隆汽车电子科技有限公司 | Equipment for testing circuit boards |
| CN103116119A (en) * | 2011-11-17 | 2013-05-22 | 上海航天测控通信研究所 | Test board based on hyper memory (HM) 276 stack-type electronic products and test method thereof |
| CN103580842A (en) * | 2013-11-04 | 2014-02-12 | 惠州Tcl移动通信有限公司 | Method and system for conducting parallel transmission through multiple types of wireless links |
| CN204291015U (en) * | 2014-04-16 | 2015-04-22 | 普联技术有限公司 | A kind of test macro of communication products |
| CN105302732A (en) * | 2015-12-10 | 2016-02-03 | 广东欧珀移动通信有限公司 | Automatic mobile terminal testing method and device |
| CN105301375A (en) * | 2014-06-06 | 2016-02-03 | 中国电子科技集团公司第三十研究所 | General testing system for module type electronic products |
| CN105445644A (en) * | 2015-11-18 | 2016-03-30 | 南昌欧菲生物识别技术有限公司 | Multi-type chip test plate, test system and test machine bench |
| CN206583981U (en) * | 2016-12-26 | 2017-10-24 | 广州山锋测控技术有限公司 | The test device of electronic equipment |
-
2016
- 2016-12-26 CN CN201611218466.4A patent/CN106597169A/en active Pending
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101039561A (en) * | 2006-03-15 | 2007-09-19 | 安捷伦科技有限公司 | Multiple configuration stackable instrument modules |
| CN101183243A (en) * | 2006-11-15 | 2008-05-21 | 光洋电子工业株式会社 | Function expanding method for small-sized display device |
| CN101848042A (en) * | 2010-04-20 | 2010-09-29 | 惠州Tcl移动通信有限公司 | Method and system for testing radio frequency of mobile phones |
| CN202309818U (en) * | 2011-10-26 | 2012-07-04 | 福建升龙数码通信技术有限公司 | Mobile phone terminal capable of locating extension module |
| CN103116119A (en) * | 2011-11-17 | 2013-05-22 | 上海航天测控通信研究所 | Test board based on hyper memory (HM) 276 stack-type electronic products and test method thereof |
| CN102928765A (en) * | 2012-10-22 | 2013-02-13 | 上海福太隆汽车电子科技有限公司 | Equipment for testing circuit boards |
| CN103580842A (en) * | 2013-11-04 | 2014-02-12 | 惠州Tcl移动通信有限公司 | Method and system for conducting parallel transmission through multiple types of wireless links |
| CN204291015U (en) * | 2014-04-16 | 2015-04-22 | 普联技术有限公司 | A kind of test macro of communication products |
| CN105301375A (en) * | 2014-06-06 | 2016-02-03 | 中国电子科技集团公司第三十研究所 | General testing system for module type electronic products |
| CN105445644A (en) * | 2015-11-18 | 2016-03-30 | 南昌欧菲生物识别技术有限公司 | Multi-type chip test plate, test system and test machine bench |
| CN105302732A (en) * | 2015-12-10 | 2016-02-03 | 广东欧珀移动通信有限公司 | Automatic mobile terminal testing method and device |
| CN206583981U (en) * | 2016-12-26 | 2017-10-24 | 广州山锋测控技术有限公司 | The test device of electronic equipment |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107703473A (en) * | 2017-10-16 | 2018-02-16 | 许继电气股份有限公司 | A kind of automatic detection device of direct current transportation OPTODYN modules |
| CN112540262A (en) * | 2020-11-18 | 2021-03-23 | 广西电网有限责任公司电力科学研究院 | Voltage time type feeder automation test system and test method thereof |
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Application publication date: 20170426 |