CN106445828B

CN106445828B - A kind of product test method and device

Info

Publication number: CN106445828B
Application number: CN201610917024.2A
Authority: CN
Inventors: 沈文策
Original assignee: Fujian Cnfol Information Technology Co Ltd
Current assignee: Fujian Cnfol Information Technology Co Ltd
Priority date: 2016-10-21
Filing date: 2016-10-21
Publication date: 2019-10-29
Anticipated expiration: 2036-10-21
Also published as: CN106445828A

Abstract

The embodiment of the invention provides a kind of product test method and devices, and wherein method includes: to obtain the instruction that the system testing of product is completed by current tester, detecting product, there are the first defects after the first testing time；It generates a pair of first defect is repaired first and repairs instruction；After being repaired to the first defect, after the second testing time, obtain by current tester complete the first defect retest and the instruction of the summary system testing of product, detecting product, there are the second defects；It generates a pair of second defect is repaired second and repairs instruction；After being repaired to the second defect, within the third testing time, obtain the instruction retested that the first defect and the second defect are completed by current tester, it generates the instruction of a current tester of replacement and carries out the general instruction to be tested of product by the tester after replacing, so as to carry out summary test to product by the tester after replacing according to general instruction to be tested.

Description

A kind of product test method and device

Technical field

The present invention relates to testing fields, more particularly to a kind of product test method and device.

Background technique

In modern industry and science and technology production, various tests can be carried out to properties of product after the completion of product manufacturing, with detection The defect of product, and defect is repaired, achieve the purpose that improve product quality by repairing defect, modern society is to product Quality requirement increasingly improves, and there is an urgent need to product test methods to be capable of providing higher Defect Search rate and test accuracy.

Existing procucts test method is improved in this regard at present, and existing product test method divides test process For three phases, the first stage: the test case according to setting carries out product systems test, and record Alpha test generates Defect；Second stage: after the defect that developer repairs the first stage, first to the defect retest of first stage, then into Row product summary system testing, and record the defect that second stage test generates；Phase III: second-order is repaired in developer After the defect of section, first to the defect retest of first stage and second stage, then the summary test of product is carried out, finally recorded The defect that phase III test generates.But multiple retest stage by stage, test page, test function item, testing process It constantly repeats that the fatigue strength of tester is easy to cause to increase, so that test leakage, wrong survey etc. occurs during the test in tester Problem, or be not easy to find the potential defect of product, cause product defects lookup rate and test accuracy to reduce, and then cause Product quality reduces.

Summary of the invention

The embodiment of the present invention is designed to provide a kind of product test method and device, by replacing in multiple test Tester completes test, improves the discovery rate of product defects, improves the accuracy of product defects lookup rate and test, Jin Erti High yield quality.Specific technical solution is as follows:

In order to achieve the above objectives, the embodiment of the invention discloses a kind of product test methods, are applied to product test field, Include:

After preset first testing time, obtain and according to the system testing for completing product by current tester Instruction, detecting the product, there are the first defects；

According to first defect, generates a pair of first defect is repaired first and repair instruction；

It is instructed being repaired according to described first, after being repaired to first defect, and in preset second test After time, obtain and according to by current tester complete first defect retest and the summary system of product The instruction of test, detecting the product, there are the second defects；

According to second defect, generates a pair of second defect is repaired second and repair instruction；

It is instructed being repaired according to described second, after being repaired to second defect, in the test of preset third In, the instruction retested that simultaneously basis is completed first defect and second defect by current tester is obtained, It generates the instruction of a replacement current tester and carries out the general finger to be tested of product by the tester after replacing It enables, so as to carry out the summary survey to the product according to the general instruction to be tested by the tester after the replacement Examination；

Wherein, first testing time is respectively greater than second testing time and the third testing time, described Second testing time was greater than the third testing time.

Preferably, described obtain within the preset third testing time and complete described first according to by current tester The instruction of defect and second defect retested, the product test method further include:

It within the third testing time, gets the third repetition measurement and completes instruction, save third repetition measurement defect note Record result, wherein the third repetition measurement completes instruction and is, is lacked by current tester completion first defect and described second The sunken instruction retested, the third repetition measurement defect record result are to complete first defect by current tester And the record for the product defects of second defect retested is as a result, third repetition measurement completion instruction includes at least: sound Frequency instruction, alarm lamp and or preset window picture, the third repetition measurement defect record result include at least: table or document.

Preferably, described repairing instruction, after repairing to second defect, the production according to described second Product test method further include:

When reaching the third testing time, has not been obtained and first defect and described the are completed by current tester The instruction of two defects retested generates the prompting instruction of third time limit, extends the third according to the default extension time and test Time, and when third testing time after extension reaches, the third repetition measurement can be got by, which detecting whether, completes instruction, In, third time limit reminds instruction to include at least: audio instructions, alarm lamp and or preset window picture；

When the third testing time after extension reaches, gets the third repetition measurement and complete instruction, save the third Repetition measurement defect record result；

When the third testing time after extension reaches, the third repetition measurement has not been obtained and completes instruction, it is multiple to generate third Failure prompting instruction is surveyed, product test is stopped, so that current tester carries out malfunction elimination, wherein the third repetition measurement event Barrier remind instruction includes at least: audio instructions, alarm lamp and or preset window picture.

Preferably, described generate the instruction and carried out by the tester after replacing that one replaces the current tester After the general instruction to be tested of product, the product test method further include:

The work numerical quantity for obtaining all testers determines the smallest work numerical quantity pair in the work numerical quantity The tester answered is the tester after the replacement；

The operating position of tester after changing the replacement to the operating position of the current tester, so that The summary test of product is carried out by the tester after the replacement.

Preferably, the tester by after the replacement is according to the general instruction to be tested, to the product into After the row summary test, the product test method further include:

It is obtained after the third testing time by the tester after the replacement according to the general finger to be tested It enables, the general summary test to be tested is carried out to the product and completes instruction；

Wherein, the summary test, which is completed to instruct, includes at least: audio instructions, alarm lamp and or preset window picture.

Preferably, described after the third testing time, the product test method further include:

When reaching the third testing time, the summary test has not been obtained and completes instruction, the generation third time limit mentions Wake up instruction, wherein third time limit reminds instruction to include at least: audio instructions, alarm lamp and or preset window picture；

When reaching the third testing time, gets the summary test and complete instruction, detect whether to exist described The summary test defect for the product that summary test generates；

When there are the summary test defects for when the summary test defect, saving the product that the summary test generates for detection Summary test defect record result, wherein summary test defect record result includes at least table or document；

When detection is there is no when the summary test defect, end product test generates product test and completes instruction, In, the product test is completed instruction and is included at least: audio instructions, alarm lamp and or preset window picture.

Preferably, it is described when reaching the third testing time, the summary test has not been obtained and completes instruction, generates After the third time limit reminds instruction, the product test method further include:

Extend the third testing time according to the default extension time, and the third testing time after extension reaches When detect whether can to get the summary test and complete instruction；

When the third testing time after extension reaches, gets the summary test and complete instruction, detect whether exist The summary test defect for the product that the summary test generates；

When there are when the summary test defect, save the summary test defect record result for detection；

When detection is there is no when the summary test defect, end product test generates the product test and completes instruction；

When the third testing time after extension reaches, the summary test has not been obtained and completes instruction, generates summary and surveys Faulting instruction is tried, and stops product test, so that tester carries out malfunction elimination, wherein the summary test failure refers to Order includes at least: audio instructions, alarm lamp and or preset window picture.

The invention also discloses a kind of product testers, comprising:

First test module, for obtaining after preset first testing time and according to complete by current tester At the instruction of the system testing of product, detecting the product, there are the first defects；

First repairs command generation module, for generating a pair of first defect and being repaired according to first defect Multiple first repairs instruction；

Second test module, for repairing instruction according to described first, after being repaired to first defect, and After preset second testing time, obtain and according to by current tester complete first defect retest with And the instruction of the summary system testing of product, detecting the product, there are the second defects；

Second repairs command generation module, for generating a pair of second defect and being repaired according to second defect Multiple second repairs instruction；

Third test module, for repairing instruction, after repairing to second defect, according to described second In the preset third testing time, obtains and complete first defect and second defect according to by current tester The instruction retested generates the instruction of a replacement current tester and carries out product by the tester after replacing General instruction to be tested so that by the tester after the replacement according to the general instruction to be tested, to the product Carry out the summary test；

Preferably, the third test module is further used for:

Preferably, the third test module further include:

The third testing time extends submodule, for having not been obtained by currently testing when reaching the third testing time Personnel complete the instruction of first defect and second defect retested, and generate the prompting instruction of third time limit, according to It is default to extend the time and extend the third testing time, and when the third testing time after extension reaches, detecting whether can It gets the third repetition measurement and completes instruction, wherein the third time limit reminds instruction to include at least: audio instructions, alarm lamp With or preset window picture；

Third repetition measurement defect record submodule when reaching for the third testing time after extension, gets described the Three repetition measurements complete instruction, save the third repetition measurement defect record result；

Third repetition measurement failure reminds instruction to generate submodule, when reaching for the third testing time after extension, does not obtain It gets the third repetition measurement and completes instruction, generate third repetition measurement failure and remind instruction, stop product test, so that current tester Member carries out malfunction elimination, wherein the third repetition measurement failure reminds instruction to include at least: audio instructions, alarm lamp and or it is default Window picture.

Preferably, the third test module further include:

Tester after replacement determines submodule, for obtaining the work numerical quantity of all testers, determines institute Stating the corresponding tester of the smallest work numerical quantity in work numerical quantity is the tester after the replacement；

Submodule is changed in operating position, for changing the operating position of the tester after the replacement to the current survey The operating position of examination personnel, so that being tested by the summary that the tester after the replacement carries out product.

Preferably, the third test module is further used for:

Preferably, the third test module further include:

The third time limit reminds instruction to generate submodule, for having not been obtained described when reaching the third testing time Instruction is completed in summary test, generates the prompting instruction of third time limit, wherein the third time limit reminds instruction to include at least: audio Instruction, alarm lamp and or preset window picture；

Summary test defect detection sub-module is surveyed for when reaching the third testing time, getting the summary Instruction is completed in examination, detects whether that there are the summary test defects that the summary tests the product generated；

Summary test defect record sub module, for saving the summary when detection is there are when the summary test defect The summary test defect for testing the summary test defect of the product generated records result, wherein the summary test defect record As a result table or document are included at least；

Product test completes instruction and generates submodule, for when there is no when the summary test defect, terminate to produce for detection Product test generates product test and completes instruction, wherein the product test is completed instruction and included at least: audio instructions, alarm lamp With or preset window picture.

Preferably, the third time limit reminds instruction to generate submodule further include:

Third testing time extension unit, for extending the third testing time according to the default extension time, and The third testing time after extension detects whether that can get the summary test completes instruction when reaching；

Summary test defect detection unit gets the summary when reaching for the third testing time after extension Instruction is completed in test, detects whether that there are the summary test defects that the summary tests the product generated；

Summary test defect recording unit, for when there are when the summary test defect, save the summary survey for detection Try defect record result；

Product test completes instruction and generates unit, for terminating product when detecting there is no when the summary test defect Test generates the product test and completes instruction；

The instruction of summary test failure generates unit, and when reaching for the third testing time after extension, institute has not been obtained It states summary test and completes instruction, generate the instruction of summary test failure, and stop product test, so that tester carries out failure Investigation, wherein summary test failure instruction includes at least: audio instructions, alarm lamp and or preset window picture.

A kind of product test method and device provided in an embodiment of the present invention, is divided into three phases, In for product test Different tests are completed to product in the preset testing time, the defect for examining each stage test to generate, and to defect generation pair The reparation instruction answered, so that product defects are repaired, is tested in next stage using the product after defect repair, and Retest is carried out to defect before first in the test in second, third stage and is conducive to product to verify defect repair rate Defect repair quality is considered, and different integrated testabilities is then carried out to product, with examine the last stage omit defect or by In last stage defect reparation and the new defect that introduces, multistage retest can be improved Defect Search rate, and Test is completed using the tester after replacement in the integrated testability of phase III, multiplicating test is avoided to cause currently to test Personnel can further increase Defect Search rate to test page, the excessively high initiation test leakage of test function item fatigue strength, wrong survey problem With the accuracy of test, and then improve product quality.Certainly, it implements any of the products of the present invention or method must be not necessarily required to Reach all the above advantage simultaneously.

Detailed description of the invention

In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with It obtains other drawings based on these drawings.

Fig. 1 is the flow chart of the product test method of the embodiment of the present invention；

Fig. 2 is the structure chart of the product tester of the embodiment of the present invention.

Specific embodiment

Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.

The embodiment of the invention discloses a kind of product test methods, are described in detail separately below.

It is the flow chart of the product test method of the embodiment of the present invention referring to Fig. 1, Fig. 1, is applied to product test, including such as Lower step:

Step 101, it after preset first testing time, obtains and is according to complete product by current tester The instruction of unified test examination, detecting product, there are the first defects.

For product test, a tester is distributed as current tester, completes to produce within the first testing time The system testing of product, the defect of the product verified by system testing is as the first defect.

Wherein, product be industry, commercial product, include at least electric appliance, digital product and or computer software product.

First testing time be it is preset according to the test volume of the system testing of product, test volume includes at least: test step The quantity of rapid quantity, test data.

System testing is the detailed test to product overall performance, and the test volume of system testing is big, and test fineness is high, is produced Product Defect Search rate is high.

Wherein, the instruction that the system testing of product is completed by current tester, includes at least: audio instructions, alarm lamp With or preset window picture.

Step 102, it according to the first defect, generates a pair of first defect is repaired first and repairs instruction.

The first reparation instruction that a pair of first defect is repaired is generated according to the first defect, so that product development personnel After receiving the first reparation instruction, the first defect is repaired, the product after obtaining the first defect repair.

By the timely reparation to product defects, the test that defect is brought into the next stage is avoided, next stage survey can be reduced Test-manufacture raw defects count.

Wherein, first repair instruction includes at least: audio instructions, alarm lamp and or preset window picture.

Step 103, instruction is being repaired according to first, after repairing to the first defect, and in preset second test After time, obtain and according to by current tester complete the first defect retest and the summary system testing of product Instruction, detecting product, there are the second defects.

For the product after the first defect repair, within preset second testing time, first completed by current tester First defect retests, and to verify the repair rate of the first defect, is conducive to product development personnel's defect repair quality It considers, is conducive to improve product quality.The summary system testing of product is completed, by current tester again to examine the first stage Test leakage or the wrong defect surveyed, and can verify the new defect introduced due to the first defect repair, it can be improved defect and look into Look for the accuracy of rate and test, and then improve the quality of product, by the first defect retest and the summary system of product Unified test examination, the defect of the product verified is as the second defect.

Wherein, the second testing time be according to product, the first defect retest and the test of summary system testing Measure preset, test volume includes at least: quantity, the quantity of test data of testing procedure.

Summary system testing is also the test to product overall performance, but test volume and test fineness are surveyed lower than system Examination, the second testing time, under normal condition, the quantity of the second defect was less than the quantity of the first defect less than the first testing time.

Wherein, the instruction of the first defect retested completed by current tester, complete to produce by current tester The instruction of the summary system testing of product, includes at least: audio instructions, alarm lamp and or preset window picture.

Step 104, it according to the second defect, generates a pair of second defect is repaired second and repairs instruction.

The second reparation instruction that a pair of second defect is repaired is generated according to the second defect, so that product development personnel After receiving the second reparation instruction, the second defect is repaired, the product after obtaining the second defect repair.

By the timely reparation to product defects, the test that defect is brought into the next stage is avoided, next stage test is reduced and produces Raw defects count.

Wherein, second repair instruction includes at least: audio instructions, alarm lamp and or preset window picture.

Step 105, instruction is being repaired according to second, after repairing to the second defect, in the test of preset third In, it obtains and basis is by the instruction of current tester the first defect of completion and the second defect retested, generate one more It changes the instruction of current tester and carries out the general instruction to be tested of product by the tester after replacing, so that by replacing Tester afterwards carries out summary test according to general instruction to be tested, to product.

For the product after the second defect repair, within the preset third testing time:

Firstly, complete retesting for the first defect and the second defect by current tester, with verify the first defect and The repair rate of second defect is conducive to consider product development personnel's defect repair quality, is conducive to improve product quality.And After the first defect and after the completion of retesting of the second defect, the instruction of the one current tester of replacement of generation and by replacing Tester carry out product general instruction to be tested.

Then, it is tested by the summary that the tester after replacing completes product, to examine first stage and second stage to leak Survey or the wrong defect surveyed, and can verify the new defect introduced due to the second defect repair, it can be improved Defect Search The accuracy of rate and test, and then the quality of product is improved, and tested by the summary that the tester after replacing completes product, energy Multistage retest is enough avoided to cause current tester excessively high to test page, test function item and testing process fatigue strength Cause test leakage, wrong survey problem, the accuracy of Defect Search rate and test can be further increased, and then improve the quality of product.

By to the first defect and the second defect retest and the summary of product is tested, the defect of the product verified As third defect.

Wherein, the third testing time be according to product, the first defect and the second defect retest and summary system The test volume of test is preset, and test volume includes at least: quantity, the quantity of test data of testing procedure.

Summary test and the test to product overall performance, but test volume and test fineness are lower than system testing and generally Want system testing, the third testing time less than the first testing time and the second testing time, under normal condition, the number of third defect Amount is less than the quantity of the second defect.

Wherein, it replaces the instruction of current tester, carry out the general finger to be tested of product by the tester after replacing Order includes at least: audio instructions, alarm lamp and or preset window picture.

As it can be seen that product test is divided into three phases in the embodiment of the present invention, to product within the preset testing time Different tests are completed, the defect for examining each stage test to generate, and corresponding reparation is generated to defect and is instructed, so that product lacks It falls into and is repaired, tested in next stage using the product after defect repair, and is first in the test in second, third stage First retest is carried out to defect before to be conducive to verify defect repair rate to product development personnel's defect repair quality Consider, be conducive to improve product quality；Then different integrated testabilities is carried out, to product with the defect for examining the last stage to omit Or due to last stage defect reparation and the new defect that introduces, multistage retest can be improved Defect Search rate and Test accuracy, and test is completed using the tester after replacement in the integrated testability of phase III, avoid repeatedly weight Repetition measurement examination causes current tester to test page, test function item and the excessively high initiation test leakage of testing process fatigue strength, wrong survey Problem can further increase the accuracy of Defect Search rate and test, and then improve the quality of product.

On the basis of Fig. 1, as preferred embodiment, applied to the test of first stage, in the preset first test Between after, obtain and according to the instruction for the system testing for completing product by current tester, it is scarce to detect that product has first It falls into, the method for the embodiment of the present invention specifically includes:

The first step has not been obtained to the first test when reaching the first testing time and completes instruction, and the first time limit of generation reminds Instruction.

Second step after generating the prompting instruction of the first time limit, extended for the first testing time according to the default extension time, and The first testing time after extension detects whether that can get the first test completes instruction when reaching.

Third step when the first testing time after extension reaches, gets the first test and completes instruction, detect whether to deposit In the first defect.

4th step saves the first defect record result when detecting there are when the first defect.

5th step, when detection completes instruction there is no product test, generation product test when the first defect, is terminated.

6th step when the first testing time after extension reaches, has not been obtained to the first test and completes instruction, generate first Failure reminds instruction, and stops product test, so that current tester carries out malfunction elimination.

7th step gets the first test and completes instruction when reaching the first testing time, detects whether that there are first to lack It falls into.

8th step, detection save the first defect record result there are when the first defect.

9th step, when detection completes instruction there is no product test, generation product test when the first defect, is terminated.

Wherein, instruction is completed in the first test are as follows: the instruction of the system testing of product is completed by current tester, first lacks It falls into and is, the product defects generated by the system testing that current tester completes product, the first defect record result is first scarce Sunken record is as a result, instruction is completed in the first test, the first time limit reminded instruction, instruction is completed in product test, Fisrt fault is reminded Instruction includes at least: audio instructions, alarm lamp and or preset window picture, the first defect record result include at least: table or Person's document.

System testing is tested according to the test case of preset system testing, and the test case of system testing is It is preset according to product characteristic, include at least user login validation, functional status verifying, testing procedure and or test target value And test method；Product characteristic be product attributive character, including at least the capacity of product, weight, number of components and or data Quantity.

Wherein, system testing is to the detailed test of product overall performance, and test volume is big, and test fineness is high, uses system The test case of unified test examination carries out system testing, can further increase the fineness of system testing, the defect for improving product is looked into Look for the accuracy of rate and test.

Default to extend the time counted as unit of day according to the time of product characteristic and industrial requirement preset in advance, can be with Different numerical value are preset, such as 0.5 day or 1 day.It is to solve since test volume is big, the first test that the default extension time, which carries out test, Time setting is too short to lead to test the case where can not being timely completed, or solves to cause due to some bursts test can not be by When the case where completing.

On the basis of Fig. 1, as preferred embodiment, one is generated according to the first defect applied to the reparation of the first defect Instruction is repaired to the first defect is repaired first, the method for the embodiment of the present invention specifically includes:

It according to the first defect, generates one first and repairs instruction, so that product development personnel receive the first reparation instruction Afterwards, the first defect of product can be repaired.

Wherein it is possible to which generating one corresponding first respectively for each first defect repairs instruction, it is preferred that for being All first defects that unified test examination obtains, according to the first final defect record as a result, generating one corresponding first repairs instruction, It can reduce the complexity of process in this way, unique first reparation instructs and all first lacks so that product development personnel obtain Sunken complete documentation is avoided omitting, be improved as a result, so that product development personnel can repair item by item for all first defects Remediation efficiency and accuracy.

By the timely reparation to product defects, the test that defect is brought into the next stage is avoided, next stage test is reduced and produces Raw defects count, can be improved testing efficiency.

On the basis of Fig. 1, instructed applied to the test of second stage being repaired according to first as preferred embodiment, After being repaired to the first defect, and after preset second testing time, obtain and according to complete by current tester At the first defect retest and the instruction of the summary system testing of product, detecting product, there are the second defect, this hairs The method of bright embodiment specifically includes:

The first defect is retested by current tester, the repair rate of the first defect is able to verify that, is conducive to Product development personnel's defect repair quality is considered, is conducive to improve product quality.If carried out again to the first defect In test process, defect repair rate target value is not achieved in discovery defect repair rate, and product development personnel can be required to repair again. Wherein, defect repair rate target value is set according to product defects repair rate average value or industrial requirement, can be according to survey Different defect repair rate target values is arranged in the examination stage, and such as 80% or 90%.

The first step has not been obtained to the second test when reaching the second testing time and completes instruction, and the second time limit of generation reminds Instruction.

Second step after generating the prompting instruction of the second time limit, extended for the second testing time according to the default extension time, and The second testing time after extension detects whether that can get the second test completes instruction when reaching.

Third step when the second testing time after extension reaches, gets the second test and completes instruction, detect whether to deposit In the second defect.

4th step saves the second defect record result when detecting there are when the second defect.

5th step, when detection completes instruction there is no product test, generation product test when the second defect, is terminated.

6th step when the second testing time after extension reaches, has not been obtained to the second test and completes instruction, generate second Failure reminds instruction, and stops product test, so that current tester carries out malfunction elimination.

7th step gets the second test and completes instruction when reaching the second testing time, detects whether that there are second to lack It falls into.

8th step, detection save the second defect record result there are when the second defect.

9th step, when detection completes instruction there is no product test, generation product test when the second defect, is terminated.

Wherein, instruction is completed in the second test are as follows: by current tester, is completed retesting for the first defect, and is produced The instruction of the summary system testing of product, the second defect are, by current tester, the first defect of completion is retested, and The product defects that the summary system testing of product generates, the second defect record result are that the record of the second defect is as a result, second surveys Instruction is completed in examination, the second time limit reminded instruction, instruction is completed in product test, the second failure reminds instruction to include at least: audio refers to Enable, alarm lamp and or preset window picture, the second defect record result include at least: table or document.

Wherein, summary system testing is tested according to the test case of preset summary system testing, summary system Unified test examination test case be it is preset according to product characteristic, include at least functional status verifying, testing procedure and or test mesh Scale value and test method；Product characteristic be product attributive character, including at least the capacity of product, weight, number of components and or Data bulk.

System testing is carried out using the test case of summary system testing, can be improved the fineness of summary system testing, Improve the Defect Search rate of product and the accuracy of test.

Default to extend the time counted as unit of day according to the time of product characteristic and industrial requirement preset in advance, can be with Different numerical value are preset, such as 0.5 day or 1 day.It is to solve since test volume is big, the second test that the default extension time, which carries out test, Time setting is too short to lead to test the case where can not being timely completed, or solves to cause due to some bursts test can not be by When the case where completing.

On the basis of Fig. 1, as preferred embodiment, one is generated according to the second defect applied to the reparation of the second defect Instruction is repaired to the second defect is repaired second, the method for the embodiment of the present invention specifically includes:

It according to the second defect, generates one second and repairs instruction, so that product development personnel receive the second reparation instruction Afterwards, the second defect of product can be repaired.

Wherein it is possible to which generating one corresponding second respectively for each second defect repairs instruction, it is preferred that for survey All second defects obtained are tried, according to the second final defect record as a result, generating one corresponding second repairs instruction, in this way It can reduce the complexity of process, so that product development personnel, which obtain unique second, repairs instruction and all second defects Complete documentation avoids omitting, improves and repair as a result, so that product development personnel can repair item by item for all second defects Efficiency and accuracy.By the timely reparation to product defects, the test that defect is brought into the next stage is avoided, the next stage is reduced and surveys Raw defects count is test-manufactured, can be improved testing efficiency.

Preferably, the first defect can will be completed by current tester in the second final defect record result The second repetition measurement defect of generation is retested, and completes the summary system testing defect point that the summary system testing of product generates It does not record, in order to which product development personnel repair for the defect of different tests, also, when the quantity of the second defect is greater than It when the quantity of the first defect, indicates that product is abnormal, generates product and do over again instruction, product is returned to exploit person by stopping product test Member develops again.

Wherein, second repair instruction, product instruction of doing over again includes at least: audio instructions, alarm lamp and or preset window draw Face.

On the basis of Fig. 1, instructed applied to the test of phase III being repaired according to second as preferred embodiment, After being repaired to the second defect, within the preset third testing time, obtains and complete the according to by current tester The instruction of one defect and the second defect retested generates the instruction of a current tester of replacement and by the survey after replacing Examination personnel carry out the general instruction to be tested of product, so that by the tester after replacing according to general instruction to be tested, to production Product carry out summary test, and the method for the embodiment of the present invention specifically includes:

The first step is instructed repairing according to second, after repairing to the second defect, in the preset third testing time It is interior, obtain the instruction retested that the first defect and the second defect are completed by current tester.

The first defect and the second defect are retested by current tester, are able to verify that the first defect and second The repair rate of defect is conducive to consider product development personnel's defect repair quality, is conducive to improve product quality.If Find that defect repair rate target value is not achieved in defect repair rate during being retested to the first defect and the second defect, it can To require product development personnel to repair again.Wherein, defect repair rate target value be according to product defects repair rate average value or The setting of person's industrial requirement, different defect repair rate target values can be set according to test phase, such as 80% or 90%.

The first step specifically includes:

It is instructed being repaired according to second, after being repaired to the second defect:

Step 1 has not been obtained third repetition measurement and completes instruction when reaching the third testing time, generates the prompting of third time limit and refers to Enable, according to default the extensions time extend the third testing time, and after extension the third testing time arrival when, detect whether energy It enough gets third repetition measurement and completes instruction.

Step 2 when the third testing time after extension reaches, gets third repetition measurement and completes instruction, it is multiple to save third Survey defect record result.

Step 3 when the third testing time after extension reaches, has not been obtained third repetition measurement and completes instruction, generate third Repetition measurement failure reminds instruction, stops product test, so that current tester carries out malfunction elimination.

Step 4 gets third repetition measurement and completes instruction, save the defect record of third repetition measurement within the third testing time As a result.

Wherein, it is that the survey again of the first defect and the second defect is completed by current tester that third repetition measurement, which completes instruction, The instruction of examination, third repetition measurement defect record result are that the survey again of the first defect and the second defect is completed by current tester The record of the product defects of examination is as a result, third repetition measurement completes instruction, the third time limit reminds instruction, third repetition measurement failure reminds instruction Include at least: audio instructions, alarm lamp and or preset window picture, third repetition measurement defect record result include at least: table or Person's document.

Second step is generated according to the instruction retested for completing the first defect and the second defect by current tester The instruction of the one current tester of replacement and the general instruction to be tested that product is carried out by the tester after replacing.Second step Include:

Step 1 generates the instruction of a current tester of replacement as replacement personnel instruction, and generates one by the survey after replacing The general instruction to be tested that examination personnel carry out product is summary test instruction.

Step 2 obtains the work numerical quantity of all testers, determines the smallest work numerical quantity in work numerical quantity Corresponding tester is the tester after replacement.It specifically includes:

The numerical quantity that works is carried out sequence from small to large, obtains work by the work numerical quantity for obtaining all testers Make numerical quantity ranking results, and by workload numerical ordering result, the corresponding tester's conduct of the smallest work numerical quantity Tester after replacement.Wherein, work numerical quantity is the work number that all testers are assigned within a preset period of time Amount.

Step 3, operating position to the operating position of current tester of the tester after change replacement, so that by Tester after replacement carries out the summary test of product.

Wherein it is possible to the operating position of the tester after replacement is exchanged with the operating position of current tester, with So that being tested by the summary that the tester after replacing carries out product.

Wherein, replacement personnel instruction and summary test instruction include at least: audio instructions, alarm lamp and or preset window Picture.

Since product is surveyed in Alpha test, second stage test and the multiplicating of the third repetition measurement of phase III Examination, current tester are easy to generate fatigue to test page, test function item and testing process, survey so as to cause test leakage, mistake Or potential defect problem is not found, lead to the reduction of Defect Search rate, test accuracy reduces, and uses the test after replacement Personnel, which carry out summary test, then can be avoided the occurrence of this kind of.

Third step carries out summary test to product by the tester after replacing according to general instruction to be tested.

Wherein, summary test is tested according to preset general test case to be tested, general test to be tested Use-case be it is preset according to product characteristic, include at least functional status verifying, testing procedure and or test target value and test side Method；Product characteristic be product attributive character, including at least the capacity of product, weight, number of components and or data bulk.

Summary test is also the test to product overall performance, is briefly tested mainly for the functional status of product, Test volume and test fineness are lower than summary system testing, the third testing time less than the second testing time, under normal condition, the The quantity for the defect that three repetition measurements and summary test generate is less than the quantity of the second defect.

After third step further include: obtain after the third testing time and tested by the tester after replacing according to summary Instruction, general summary test to be tested is carried out to product and completes instruction；

It is specifically included after third step:

Step 1 has not been obtained summary test and completes instruction, the generation third time limit reminds when reaching the third testing time Instruction.

Step 2 after generating the prompting instruction of third time limit, extends the third testing time according to the default extension time, and The third testing time after extension detects whether that can get summary test completes instruction when reaching.

Step 3 when the third testing time after extension reaches, gets summary test and completes instruction, detect whether to deposit In the summary test defect for the product that summary test generates.

Step 4, when there are when summary test defect, save summary test defect to record result for detection.

Step 5, when detection completes instruction there is no product test, generation product test when summary test defect, is terminated.

Step 6 when the third testing time after extension reaches, has not been obtained summary test and completes instruction, generate summary Test failure instruction, and stop product test, so that tester carries out malfunction elimination.

Step 7 gets summary test and completes instruction, detect whether that there are summary surveys when reaching the third testing time Test-manufacture the summary test defect of raw product.

Step 8, when there are the summary test defects for when summary test defect, saving the product that summary test generates for detection Summary test defect records result.

Step 9, when detection completes instruction there is no product test, generation product test when summary test defect, is terminated.

Wherein, it is to complete general instruction to be tested that instruction is completed in summary test；Summary test instruction, summary test are completed Instruction, third time limit remind instruction, product test completion instruction, the instruction of summary test failure to include at least: audio instructions, alarm Lamp and or preset window picture, summary test defect record result be, summary test generate product defects record as a result, Summary test defect records result and includes at least table or document.

Third repetition measurement defect record result and summary are tested and are lacked after the completion of third repetition measurement and summary are tested by the 4th step It falls into record result and merges into third defect record result.

Wherein, third repetition measurement defect record result, summary test defect record result, third defect record result are at least wrapped Include table or document.

As it can be seen that product test is divided into three phases, first stage using the product test method of the embodiment of the present invention Within the first testing time, the system testing to product is completed according to system testing use-case, obtains the first defect, is lacked according to first It falls into and generates the first reparation instruction, so that product development personnel in time repair the first defect after receiving the first reparation instruction It is multiple, the defects count in stage after reduction；Second stage first retests the first defect, connects within the second testing time Get off and summary system testing is carried out to product according to summary system testing use-case, obtains second after the completion of second stage test and lack Fall into, according to the second defect generate second repair instruct so that product development personnel receive the second reparation instruction after in time it is right Second defect is repaired, the defects count in stage after reduction；Phase III within the third testing time, first to the first defect, Second defect is retested, and generates replacement personnel instruction and summary test instruction, the work to all testers later Numerical quantity sequence, obtain with the highest tester of product test matching degree be replace after tester, and by replacing after Tester completes the summary test to product within the third testing time, obtains third defect after the completion of phase III test； The repair rate of defect is able to verify that retesting for defect, is conducive to consider product development personnel's defect repair quality, Be conducive to improve product quality, multistage different integrated testability carried out to product, defect that the last stage can be examined to omit or Person due to last stage defect reparation and the new defect that introduces, improve Defect Search rate and test accuracy, and in third Test is completed using the tester after replacement in the integrated testability in stage, multiplicating test is avoided to lead to current tester To test page, the excessively high initiation test leakage of test function item fatigue strength, wrong survey problem, Defect Search rate and survey can be further increased The accuracy of examination, and then the quality of product is improved, while the present invention considers that the testing time reaches in multistage test But the unfinished processing method of test effectively can be completed to test, improve testing efficiency to product.

The embodiment of the invention also discloses a kind of product testers, are detailed in the product test of the embodiment of the present invention of Fig. 2 The structure chart of device is applied to product test, corresponding with the flow chart of product test method of the embodiment of the present invention of Fig. 1, with Lower detailed description:

First test module 201, for obtaining after preset first testing time and according to by current tester The instruction of the system testing of product is completed, detecting product, there are the first defects.

First repairs command generation module 202, for according to the first defect, generating that a pair of first defect repaired One repairs instruction.

Second test module 203, for repairing instruction according to first, after being repaired to the first defect, and pre- If the second testing time after, obtain and according to by current tester complete first defect retest and product The instruction of summary system testing, detecting product, there are the second defects.

Second repairs command generation module 204, for according to the second defect, generating that a pair of second defect repaired Two repair instruction.

Third test module 205, for repairing instruction according to second, after being repaired to the second defect, default The third testing time in, obtain and according to the finger retested for completing the first defect and the second defect by current tester It enables, generate the instruction of a current tester of replacement and carries out the general finger to be tested of product by the tester after replacing It enables, so as to carry out summary test to product by the tester after replacing according to general instruction to be tested.

It is noted that the device of the embodiment of the present invention is the device using the said goods test method, then the said goods All embodiments of test method are suitable for the device, and can reach the same or similar beneficial effect.

As it can be seen that product test is divided into three phases in the embodiment of the present invention, to product within the preset testing time Different tests are completed, the defect for examining each stage test to generate, and corresponding reparation is generated to defect and is instructed, so that product lacks It falls into and is repaired, tested in next stage using the product after defect repair, and is first in the test in second, third stage Retest first is carried out to defect before and is conducive to considering for product defects repairing quality, then to verify defect repair rate Different integrated testabilities is carried out to product, with examine the last stage omit defect or due to last stage defect reparation and introduce New defect, multistage retest can be improved Defect Search rate and test accuracy, and whole in the phase III Tester after using replacement in body test completes test, and avoiding being repeated several times testing causes current tester to test sheets Face, the excessively high initiation test leakage of test function item fatigue strength, wrong survey problem can further increase the accurate of Defect Search rate and test Property, and then improve the quality of product.

On the basis of Fig. 2, in the product tester of further embodiment of this invention, the first test module 201, comprising:

First time limit reminded instruction to generate submodule, for when reaching the first testing time, having not been obtained to the first test Instruction is completed, the prompting instruction of the first time limit is generated.

First testing time extended submodule, after generating the prompting instruction of the first time limit, according to the default extension time Extended for the first testing time, and when the first testing time after extension reaches detects whether that the first test completion can be got Instruction.

First defects detection submodule gets first and tests when reaching for the first testing time after extension At instruction, detect whether that there are the first defects.

First defect record submodule, for saving the first defect record result when detecting there are when the first defect.

Product test completes instruction and generates submodule, for terminating product test, producing when detecting there is no when the first defect Instruction is completed in the test of production product.

Fisrt fault reminds instruction to generate submodule, when reaching for the first testing time after extension, has not been obtained Instruction is completed in first test, is generated Fisrt fault and is reminded instruction, and stops product test, so that current tester carries out failure Investigation.

First defects detection submodule completes instruction, inspection for when reaching the first testing time, getting the first test It surveys and whether there is the first defect.

First defect record submodule saves the first defect record result for detecting there are when the first defect.

In the product tester of further embodiment of this invention, first repairs command generation module 202, is further used for:

In the product tester of further embodiment of this invention, the second test module 203, comprising:

Second time limit reminded instruction to generate submodule, for when reaching the second testing time, having not been obtained to the second test Instruction is completed, the prompting instruction of the second time limit is generated.

Second testing time extended submodule, after generating the prompting instruction of the second time limit, according to the default extension time Extended for the second testing time, and when the second testing time after extension reaches detects whether that the second test completion can be got Instruction.

Second defects detection submodule gets second and tests when reaching for the second testing time after extension At instruction, detect whether that there are the second defects.

Second defect record submodule, for saving the second defect record result when detecting there are when the second defect.

Product test completes instruction and generates submodule, for terminating product test, producing when detecting there is no when the second defect Instruction is completed in the test of production product.

Second failure reminds instruction to generate submodule, when reaching for the second testing time after extension, has not been obtained Instruction is completed in second test, is generated the second failure and is reminded instruction, and stops product test, so that current tester carries out failure Investigation.

Second defects detection submodule completes instruction, inspection for when reaching the second testing time, getting the second test It surveys and whether there is the second defect.

Second defect record submodule saves the second defect record result for detecting there are when the second defect.

In the product tester of further embodiment of this invention, second repairs command generation module 204, is further used for:

In the product tester of further embodiment of this invention, third test module 205, comprising:

Third repetition measurement submodule, for repairing instruction according to second, after being repaired to the second defect, preset In the third testing time, the instruction retested that the first defect and the second defect are completed by current tester is obtained.

Third repetition measurement submodule is used to repair instruction according to second, after repairing to the second defect:

Third repetition measurement submodule specifically includes:

Third testing time extension unit completes instruction for third repetition measurement when reaching the third testing time, to have not been obtained, Generating the third time limit reminds instruction, extends the third testing time according to default the extensions time, and when third after extension is tested Between when reaching, third repetition measurement can be got by, which detecting whether, completes instruction.

Extend third repetition measurement defect record unit, when reaching for the third testing time after extension, gets third Repetition measurement completes instruction, saves third repetition measurement defect record result.

Third repetition measurement failure reminds instruction to generate unit, when reaching for the third testing time after extension, has not been obtained It completes to instruct to third repetition measurement, generates third repetition measurement failure and remind instruction, stop product test, so that current tester carries out Malfunction elimination.

Third repetition measurement defect record unit is completed instruction within the third testing time, getting third repetition measurement, is protected Deposit third repetition measurement defect record result.

Replacement instruction generates submodule, for completing the first defect and the second defect again according to by current tester The instruction of test generates the instruction of a current tester of replacement and is surveyed by the summary that the tester after replacing carries out product The instruction of examination.Replacement instruction generates submodule

Replacement instruction generates unit, for generating the instruction of a current tester of replacement as replacement personnel instruction, and produces Raw one carries out the general instruction to be tested of product by the tester after replacing as summary test instruction.

Tester's determination unit after replacement determines work for obtaining the work numerical quantity of all testers The corresponding tester of the smallest work numerical quantity is the tester after replacement in numerical quantity.Tester after replacement determines Unit is specifically used for:

Position changing unit, for changing the operating position of the tester after replacing to the working position of current tester It sets, so that being tested by the summary that the tester after replacing carries out product.

Summary tests submodule, for, according to general instruction to be tested, being carried out to product general by the tester after replacing It tests.

Summary test submodule after be also used to: after the third testing time obtain by the tester after replacing according to General instruction to be tested carries out general summary test to be tested to product and completes instruction；

It is specifically included after summary test submodule:

The third time limit reminds instruction to generate unit, for summary having not been obtained and tests when reaching the third testing time At instruction, the prompting instruction of third time limit is generated.

Third testing time extension unit prolongs after generating the prompting instruction of third time limit according to the default extension time The long third testing time, and when third testing time after extension reaches, detects whether that can get summary test completes to refer to It enables.

Summary test defect detection unit when reaching for the third testing time after extension, gets summary test Instruction is completed, detects whether that there are the summary test defects that summary tests the product generated.

Summary test defect recording unit, for when there are when summary test defect, save summary test defect note for detection Record result.

Product test completes instruction and generates unit, for terminating product test when detecting there is no when summary test defect, It generates product test and completes instruction.

The instruction of summary test failure generates unit, when reaching for the third testing time after extension, has not been obtained general Completion instruction is tested, generates the instruction of summary test failure, and stop product test, so that tester carries out failure row It looks into.

Summary test defect detection unit completes instruction for when reaching the third testing time, getting summary test, Detect whether that there are the summary test defects that summary tests the product generated.

Summary test defect recording unit, for when there are when summary test defect, save what summary test generated for detection The summary test defect of the summary test defect of product records result.

Third defect record submodule is used for after the completion of third repetition measurement and summary are tested, by third repetition measurement defect record As a result third defect record result is merged into summary test defect record result.

As it can be seen that product test is divided into three phases, the first stage is in the first testing time in the embodiment of the present invention It is interior, the system testing to product is completed according to system testing use-case, obtains the first defect, first is generated according to the first defect and repairs Instruction, so that product development personnel in time repair the first defect after receiving the first reparation instruction, the stage after reduction Defects count；Second stage first retests the first defect within the second testing time, next according to summary system Test case of uniting carries out summary system testing to product, the second defect is obtained after the completion of second stage test, according to the second defect It generates second and repairs instruction, so that product development personnel in time repair the second defect after receiving the second reparation instruction It is multiple, the defects count in stage after reduction；Phase III within the third testing time, first carries out weight to the first defect, the second defect New test, generates replacement personnel instruction later and summary test instruction obtains the workload numerical ordering of all testers With the highest tester of product test matching degree be replacement after tester, and by the tester after replacing third survey It tries to complete to test the summary of product in the time, obtains third defect after the completion of phase III test；Defect is retested It is able to verify that the repair rate of defect, is conducive to consider product development personnel's defect repair quality, be conducive to improve product matter Amount carries out multistage different integrated testability to product, can examine the defect of last stage omission or due to last stage defect Reparation and the new defect that introduces, improve Defect Search rate and test accuracy, and in the integrated testability of phase III Test is completed using the tester after replacement, avoiding being repeated several times testing causes current tester to test page, test The excessively high initiation test leakage of function items fatigue strength, wrong survey problem, can further increase the accuracy of Defect Search rate and test, in turn The quality of product is improved, while the present invention considers that the testing time reaches but tests unfinished place in multistage test Reason method effectively can be completed to test, improve testing efficiency to product.

It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that There is also other identical elements in process, method, article or equipment including element.

Each embodiment in this specification is all made of relevant mode and describes, same and similar portion between each embodiment Dividing may refer to each other, and each embodiment focuses on the differences from other embodiments.Especially for system reality For applying example, since it is substantially similar to the method embodiment, so being described relatively simple, related place is referring to embodiment of the method Part explanation.

The above is merely preferred embodiments of the present invention, it is not intended to limit the scope of the present invention.It is all in this hair Any modification, equivalent replacement, improvement and so within bright spirit and principle, are included within the scope of protection of the present invention.

Claims

1. a kind of product test method characterized by comprising

After preset first testing time, obtain and according to the finger for the system testing for completing product by current tester It enables, detecting the product, there are the first defects；

It is instructed being repaired according to described first, after being repaired to first defect, and in preset second testing time Later, obtain and according to by current tester complete first defect retest and the summary system testing of product Instruction, detecting the product, there are the second defects；

It is instructed being repaired according to described second, after being repaired to second defect, within the preset third testing time, It obtains and according to the instruction retested for completing first defect and second defect by current tester, generation one It replaces the instruction of the current tester and carries out the general instruction to be tested of product by the tester after replacing, so that By the tester after the replacement according to the general instruction to be tested, the summary test is carried out to the product；

Wherein, the summary system testing is the test to product overall performance, and test volume and test fineness are surveyed lower than system Examination；The summary test is the test to product overall performance, and test volume and test fineness are lower than system testing and summary system Unified test examination；First testing time is respectively greater than second testing time and the third testing time, and described second surveys The time is tried greater than the third testing time.

2. product test method according to claim 1, which is characterized in that

It is described to be obtained within the preset third testing time and complete first defect and described according to by current tester The instruction of second defect retested, the product test method further include:

Within the third testing time, get third repetition measurement complete instruction, save the defect record of third repetition measurement as a result, its In, it is to complete first defect and second defect again by current tester that the third repetition measurement, which completes instruction, The instruction of test, the third repetition measurement defect record result be, completes first defect and described the by current tester The record for the product defects of two defects retested is as a result, third repetition measurement completion instruction includes at least: audio instructions, report Warning lamp and or preset window picture, the third repetition measurement defect record result include at least: table or document.

3. product test method according to claim 2, which is characterized in that

It is described to repair instruction, after repairing to second defect, the product test method according to described second Further include:

When reaching the third testing time, has not been obtained and lacked by current tester completion first defect and described second The sunken instruction retested generates the prompting instruction of third time limit, extends the third testing time according to the default extension time, And third testing time after extension, when reaching, the third repetition measurement can be got by, which detecting whether, completes instruction, wherein institute State the third time limit remind instruction include at least: audio instructions, alarm lamp and or preset window picture；

When the third testing time after extension reaches, the third repetition measurement has not been obtained and completes instruction, generates the event of third repetition measurement Barrier reminds instruction, stops product test, so that current tester carries out malfunction elimination, wherein the third repetition measurement failure mentions Awake instruction includes at least: audio instructions, alarm lamp and or preset window picture.

4. product test method according to claim 1, which is characterized in that

The instruction for generating a replacement current tester and the summary that product is carried out by the tester after replacing After the instruction of test, the product test method further include:

The work numerical quantity for obtaining all testers determines that the smallest work numerical quantity is corresponding in the work numerical quantity Tester is the tester after the replacement；

The operating position of tester after changing the replacement to the operating position of the current tester, so that by institute Tester after stating replacement carries out the summary test of product.

5. product test method according to claim 1, which is characterized in that

The tester by after the replacement carries out the summary survey to the product according to the general instruction to be tested After examination, the product test method further include:

It is obtained after the third testing time by the tester after the replacement according to the general instruction to be tested, it is right The product carries out the general summary test to be tested and completes instruction；

6. product test method according to claim 5, which is characterized in that

It is described after the third testing time, the product test method further include:

When reaching the third testing time, the summary test has not been obtained and completes instruction, the generation third time limit, which reminds, to be referred to Enable, wherein third time limit reminds instruction to include at least: audio instructions, alarm lamp and or preset window picture；

When reaching the third testing time, gets the summary test and complete instruction, detect whether that there are the summaries Test the summary test defect of the product generated；

When there are the general of the summary test defect for when the summary test defect, saving the product that the summary test generates for detection Test defect is wanted to record result, wherein the summary test defect record result includes at least table or document；

When detection completes instruction there is no product test, generation product test when the summary test defect, is terminated, wherein institute State product test complete instruction include at least: audio instructions, alarm lamp and or preset window picture.

7. product test method according to claim 6, which is characterized in that

Described that the summary test completion instruction has not been obtained when reaching the third testing time, the generation third time limit mentions It wakes up after instructing, the product test method further include:

Extend the third testing time according to default extension time, and when third testing time after extension reaches is examined Whether survey, which can get the summary test, is completed instruction；

When the third testing time after extension reaches, gets the summary test and complete instruction, detect whether to exist described The summary test defect for the product that summary test generates；

When the third testing time after extension reaches, the summary has not been obtained and tests completion instruction, generates summary test event Barrier instruction, and stops product test, so that tester carries out malfunction elimination, wherein the summary test failure instruct to Include: less audio instructions, alarm lamp and or preset window picture.

8. a kind of product tester characterized by comprising

First test module, for after preset first testing time, obtaining and completing to produce according to by current tester The instruction of the system testing of product, detecting the product, there are the first defects；

First repairs command generation module, for generating what a pair of first defect was repaired according to first defect First repairs instruction；

Second test module, for repairing instruction according to described first, after being repaired to first defect, and pre- If the second testing time after, obtain and according to by current tester completing retesting and producing for first defect The instruction of the summary system testing of product, detecting the product, there are the second defects；

Second repairs command generation module, for generating what a pair of second defect was repaired according to second defect Second repairs instruction；

Third test module, for repairing instruction according to described second, after being repaired to second defect, default The third testing time in, obtain and according to by current tester completing first defect and second defect again The instruction of test generates the instruction of a replacement current tester and carries out the general of product by the tester after replacing Instruction to be tested, so as to be carried out according to the general instruction to be tested to the product by the tester after the replacement The summary test；

9. product tester according to claim 8, which is characterized in that

The third test module is further used for:

10. product tester according to claim 9, which is characterized in that

The third test module further include:

The third testing time extends submodule, for having not been obtained by current tester when reaching the third testing time The instruction of first defect and second defect retested is completed, the prompting instruction of third time limit is generated, according to default Extending the time extends third testing time, and when the third testing time after extension reaches, detects whether to obtain Complete to instruct to the third repetition measurement, wherein third time limit reminds instruction to include at least: audio instructions, alarm lamp and or Preset window picture；

When reaching for the third testing time after extension, it is multiple to get the third for third repetition measurement defect record submodule It surveys and completes instruction, save the third repetition measurement defect record result；

Third repetition measurement failure reminds instruction to generate submodule, when reaching for the third testing time after extension, has not been obtained The third repetition measurement completes instruction, generates third repetition measurement failure and reminds instruction, stops product test so that current tester into Row malfunction elimination, wherein the third repetition measurement failure reminds instruction to include at least: audio instructions, alarm lamp and or preset window Picture.