CN106291006B - A kind of probe more changing device and its replacing options and test equipment - Google Patents
A kind of probe more changing device and its replacing options and test equipment Download PDFInfo
- Publication number
- CN106291006B CN106291006B CN201610602438.6A CN201610602438A CN106291006B CN 106291006 B CN106291006 B CN 106291006B CN 201610602438 A CN201610602438 A CN 201610602438A CN 106291006 B CN106291006 B CN 106291006B
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- probe
- driving portion
- replacement
- tube
- changing device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention provides a kind of probe more changing device and its replacing options and test equipment.The probe more changing device includes replacement mechanism and auxiliary body, and replacement mechanism is for replacing probe；Auxiliary body is for assisting replacement mechanism by spare probe pusher to replacement position.The probe more changing device can be realized the automatic replacement to probe, automatic more transducing makes that probe keeps cleaning in replacement process and position is put accurately, the defect that the probe location after foreign matter and replacement puts inaccuracy is stained with so as to avoid probe caused by artificial replacement manually, and then the test error of probe is reduced, improve the accuracy of probe test result；Meanwhile automatic replacement also improves the replacement efficiency of probe, to improve the testing efficiency of probe.
Description
Technical field
The present invention relates to the field of test technology, and in particular, to a kind of probe more changing device and its replacing options and test
Equipment.
Background technique
Current many display products require to carry out electric signal test in the production process, this is just inevitably used
Some signal-testing apparatus.Most of signal-testing apparatus then will by applying test signals on test probe
Test probe is plugged into corresponding test position manually and carries out signal testing.
Test probe is often damaged during the test, causes test result inaccurate, therefore, most of tests
Equipment requires frequently to replace probe.It is all at present by artificial replacement manually, artificially manually more to the replacement of probe
The probe location changed after easily causing probe to be stained with foreign matter or replacement puts inaccuracy, causes to occur when test biggish
Test error seriously affects the accuracy of test result；Meanwhile the artificial probe of replacement manually also makes testing efficiency relatively low.
Summary of the invention
The present invention is directed to the above-mentioned technical problems in the prior art, provides a kind of probe more changing device and its replacement side
Method and test equipment.The probe more changing device can be realized the automatic replacement to probe, and more transducing was replacing probe automatically
Cleaning is kept in journey and position is put accurately, after being stained with foreign matter and replacement so as to avoid probe caused by artificial replacement manually
Probe location put the defect of inaccuracy, and then reduce the test error of probe, improve the accurate of probe test result
Property；Meanwhile automatic replacement also improves the replacement efficiency of probe, to improve the testing efficiency of probe.
The present invention provides a kind of probe more changing device, including replacement mechanism and auxiliary body, and the replacement mechanism is used for pair
The probe is replaced；The auxiliary body is for assisting the replacement mechanism by spare probe pusher to replacement position.
Preferably, the replacement mechanism includes probe box, for accommodating and providing the spare probe；
Replacement portion, for closure or openness under the action of power, so that the probe is detached from the replacement portion or described
Replacement portion clamps the spare probe；
The probe box is connected to the replacement portion by the first probe tube.
Preferably, one end back to first probe tube of the probe box is provided with the second probe tube, and described second
Probe tube is connected to the probe box；
The probe box includes top cover and bottom cover, and the first opening, first probe tube and institute are offered on the bottom cover
It states bottom cover and passes through first open communication；The second opening, second probe tube and the top cover are offered on the top cover
Pass through second open communication；
First opening is corresponding with second aperture position.
Preferably, the probe box further includes the first driving portion and the chuck that is arranged in box, the peripheral region of the chuck
Domain offers multiple card slots, is used to place the spare probe in the card slot；
The center of the chuck offers hole, and first driving portion connects the hole, for driving the chuck to rotate,
So that each card slot on the chuck can be moved to position corresponding with first opening and second opening.
Preferably, the replacement portion includes clamping piece and the second driving portion, and the clamping piece is clamped in first probe
The free end of pipe, the clamping piece can be closed under the driving of second driving portion, will be located at first probe tube certainly
It is clamped by the probe held；It can also be opened under the driving of second driving portion, so as to be located at first probe tube
The probe of free end is detached from first probe tube.
Preferably, the auxiliary body includes third driving portion and thimble, and the thimble is applied in second probe tube
In, and discrepancy movement can be done in second probe tube under the drive of the third driving portion；
The third driving portion can push the thimble to enter the probe box, described in the corresponding card slot
Spare probe pusher is to the free end of first probe tube；The third driving portion can also be by the thimble from the probe box
Interior pull-out.
Preferably, the replacement mechanism further includes control unit, and the control unit is for controlling first driving portion, described
Second driving portion and third driving portion work.
Preferably, the control unit includes switch member, detection piece and control piece, and the switch member and the detection piece connect
Connect the control piece；
The switch member can open, so that the control piece controls first driving portion, second driving portion and institute
The work of third driving portion is stated, to replace to the probe；
Whether the free end that the detection piece is used to detect first probe tube has the probe, and makes institute when no
It states control piece and controls the second driving portion work, so that second driving portion drives the clamping piece closure.
Preferably, the probe box further includes side wall, the side wall connect with the top cover and the bottom cover to be formed it is described
The shell of probe box；
The shell and the chuck are all made of insulating materials.
Preferably, first probe tube includes successively nested internal layer, middle layer and outer layer from inside to outside, the internal layer
It is all made of conductive material with the outer layer, the middle layer uses insulating materials；The structure of second probe tube and described the
One probe tube is identical；
The thimble can be in contact with the internal layer of first probe tube and second probe tube；The thimble is used and is led
Electric material.
Preferably, the probe includes probe bodies and probe set, and one end of the probe bodies is needle cap, and the other end is
Syringe needle, the probe set are set in the needle end, and the outer surface of the probe set can be with the internal layer phase of first probe tube
Contact；Needle cap with the thimble for contacting；
The outer ring of the probe set uses conductive material, and the inner ring of the probe set uses flexible insulating material；
In the free end of first probe tube, the thimble can push the relatively described probe set of the probe bodies sliding
It is dynamic, so that the syringe needle is pierced by from the probe set.
The present invention also provides a kind of test equipments, including above-mentioned probe more changing device.
The present invention also provides a kind of probe replacing options of above-mentioned probe more changing device, comprising: replacement mechanism is to the spy
Needle is replaced；Auxiliary body assists the replacement mechanism by spare probe pusher to replacement position.
Preferably, the replacement mechanism replaces the probe；Auxiliary body assists the replacement mechanism will be spare
Probe pusher to replacement position include:
Second driving portion drives clamping piece to open, and third driving portion pushes thimble to enter probe box, until will be located at first
The probe pusher of probe tube free end is to being detached from first probe tube；
When detecting the free end of first probe tube does not have the probe, second driving portion drives the clamping
Part closure；
The third driving portion pulls out the thimble out of probe box；
First driving portion drives chuck rotation, is moved to the card slot that spare probe is placed on the chuck and the
One opening and the corresponding position of the second opening；
The third driving portion pushes the thimble to enter the probe box, until by the spare spy in the card slot
Needle is pushed to the free end of first probe tube.
Beneficial effects of the present invention: probe provided by the present invention more changing device passes through setting replacement mechanism and auxiliary machine
Structure can be realized the automatic replacement to probe, automatically more transducing make probe kept in replacement process cleaning and position put standard
Really, the probe location after foreign matter and replacement is stained with so as to avoid probe caused by artificial replacement manually put lacking for inaccuracy
It falls into, and then reduces the test error of probe, improve the accuracy of probe test result；Meanwhile automatic replacement also improves
The replacement efficiency of probe, to improve the testing efficiency of probe.
Test equipment provided by the present invention, by using above-mentioned probe more changing device, realize to probe it is automatic more
It changes, to not only increase test accuracy, and improves testing efficiency.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of 1 middle probe of the embodiment of the present invention more changing device；
Fig. 2 is the structural schematic diagram of Fig. 1 middle probe cassette bottom lid；
Fig. 3 is that the structure of Fig. 1 middle probe box analyses schematic diagram；
Fig. 4 is the structural schematic diagram of chuck in Fig. 1 middle probe box；
Fig. 5 is the structural schematic diagram in replacement portion in Fig. 1；
Fig. 6 is structural schematic diagram of the probe in the first probe in-pipe；
Fig. 7 is structural schematic diagram of the probe when being moved to the free end of the first probe tube；
Fig. 8 is structure principle chart of the probe more changing device when replacing probe；
Fig. 9 is the flow chart of probe replacing options.
Description of symbols therein:
1. replacing mechanism；11. probe box；111. top cover；112. bottom cover；100. the first opening；101. the second opening；113.
First driving portion；114. chuck；102. card slot；103. hole；12. replacement portion；121. clamping piece；122. the second driving portion；13. the
One probe tube；14. the second probe tube；15. control unit；2. auxiliary body；21. third driving portion；22. thimble；3 probes；31. visiting
Needle ontology；311. needle cap；312. syringe needle；32. probe set.
Specific embodiment
To make those skilled in the art more fully understand technical solution of the present invention, with reference to the accompanying drawing and it is embodied
Mode is described in further detail a kind of probe more changing device provided by the present invention and its replacing options and test equipment.
Embodiment 1:
The present embodiment provides a kind of probe more changing devices, as shown in Figure 1, including replacement mechanism 1 and auxiliary body 2, replacement
Mechanism 1 is for replacing probe 3；Auxiliary body 2 is for assisting replacement mechanism 1 that spare probe 3 is pushed to replacement position.
Replacement position therein refers to fixation position of the probe 3 in test, when probe 3 currently in use damage, replacement
Mechanism 1 replaces the probe 3 on replacement position.
By setting replacement mechanism 1 and auxiliary body 2, the automatic replacement to probe 3 can be realized, more transducing makes to visit automatically
Needle 3 keeps cleaning in replacement process and position is put accurately, is stained with so as to avoid probe 3 caused by artificial replacement manually
The defect of inaccuracy is put in 3 position of probe after foreign matter and replacement, and then reduces the test error of probe 3, improves probe 3
The accuracy of test result；Meanwhile automatic replacement also improves the replacement efficiency of probe 3, to improve the test effect of probe 3
Rate.
Wherein, replacement mechanism 1 includes probe box 11, for accommodating and providing spare probe 3.Replacement portion 12, for dynamic
Closure or openness under the action of power, so that probe 3 is detached from replacement portion 12 or replacement portion 12 clamps spare probe 3.Probe box
11 are connected to replacement portion 12 by the first probe tube 13.The setting in replacement portion 12, can be by the probe 3 currently in use damaged
It is changed to the spare new probe 3 stored in probe box 11.
In the present embodiment, one end back to the first probe tube 13 of probe box 11 is provided with the second probe tube 14, and second visits
Needle tubing 14 is connected to probe box 11.As shown in Figures 2 and 3, probe box 11 includes top cover 111 and bottom cover 112, is opened on bottom cover 112
Equipped with the first opening 100, the first probe tube 13 is connected to bottom cover 112 by the first opening 100；Second is offered on top cover 111
Opening 101, the second probe tube 14 are connected to top cover 111 by the second opening 101.First opening 100 and the second 101 positions of opening
It is corresponding.The setting of first probe tube 13 and the second probe tube 14 be in order to replace it is currently in use damaged probe 3 after,
The spare probe 3 in probe box 11 is set to be fed to replacement position.
In the present embodiment, as shown in figure 4, it driving portion 113 and the chuck that is arranged in box that probe box 11, which further includes first,
114, the neighboring area of chuck 114 offers multiple card slots 102, is used to place spare probe 3 in card slot 102.In chuck 114
The heart offers hole 103,113 connecting hole 103 of the first driving portion, for driving chuck 114 to rotate, so that each on chuck 114
Card slot 102 can be moved to and the first opening 100 and the second 101 corresponding positions of opening.
Wherein, card slot 102 can be placed on spare probe 3 therein and block, and spare probe 3 can be in the work of external motive force
With lower disengaging card slot 102.The holding principle based on card slot 102, the fastening structure form in card slot 102 is unlimited, such as holding knot
Structure can be the resilient balls being arranged on 102 inner wall of card slot, when being placed with spare probe 3 in card slot 102, resilient balls energy
Spare probe 3 is blocked under the elastic acting force perpendicular to 102 inner wall of card slot；When spare probe 3 is acted on by external motive force
When, it can be produced relative sliding between outer surface and resilient balls, thus under the action of external motive force, spare 3 energy of probe
Enough it is detached from card slot 102.
In addition, also without limitation to the first driving portion 113, as long as being able to drive the rotation of chuck 114, the first driving portion 113
It can be driven using any way.If the first driving portion 113 uses motor, motor shaft is inserted into hole 103, and motor shaft turns
Kinetic energy drives chuck 114 to rotate.First driving portion 113 can be set in probe box 11, also can be set outside probe box 11,
Such as: if motor is arranged outside probe box 11, can be opened up open in the center of 112 corresponding aperture 103 of bottom cover of probe box 11
Mouthful, so that motor shaft can pass through the opening and enter in probe box 11, and it is connect with the hole 103 on chuck 114.
In the present embodiment, as shown in figure 5, replacement portion 12 includes clamping piece 121 and the second driving portion 122, clamping piece 121 is pressed from both sides
It holds in the free end of the first probe tube 13, clamping piece 121 can be closed under the driving of the second driving portion 122, will be located at first
The probe 3 of 13 free end of probe tube clamps；It can also be opened under the driving of the second driving portion 122, so as to be located at the first probe
The probe 3 of 13 free end of pipe is detached from the first probe tube 13.Wherein, the free end of the first probe tube 13 is that probe 3 replaces position,
Clamping piece 121 replaces probe 3 in this position.Clamping piece 121 can the probe 3 to unspoiled normal work press from both sides
Fixation is held, and the probe damaged can be unloaded.
In addition, also without limitation to the second driving portion 122, as long as clamping piece 121 can be driven to be closed and open, second is driven
Dynamic portion 122 can be driven using any way.As the second driving portion 122 can also use motor.
In the present embodiment, as Figure 1-Figure 5, auxiliary body 2 includes third driving portion 21 and thimble 22, and thimble 22 runs through
In the second probe tube 14, and discrepancy movement can be done in the second probe tube 14 under the drive of third driving portion 21.Third is driven
Dynamic portion 21 can push thimble 22 to enter probe box 11, and the spare probe 3 in corresponding card slot 102 is pushed to the first probe tube
13 free end；Third driving portion 21 can also pull out thimble 22 out of probe box 11.
Wherein, mainly in 3 replacement process of probe, auxiliary visits the probe 3 damaged from first for the effect of thimble 22
It releases the free end (namely probe 3 replaces position) of needle tubing 13；It can also assist pushing the spare probe 3 in probe box 11 simultaneously
To the free end of the first probe tube 13, to realize the replacement to probe 3.In addition, carrying out the process of proper testing in probe 3
In, thimble 22 can also carry out promotion support to the probe 3 for the free end for being located at the first probe tube 13, so that probe 3 can be consolidated
Surely the free end for being maintained at the first probe tube 13 carries out the signal testing of position to be tested.
In addition, also without limitation to third driving portion 21, being made in the second probe tube 14 as long as being able to drive thimble 22
Enter movement, third driving portion 21 can be driven using any way.Such as: third driving portion 21 uses electric piston or gas
Piston, piston connect thimble 22 by connecting rod, and piston motion can drive thimble 22 in the second probe tube 14 by connecting rod
Do discrepancy movement.
In the present embodiment, replacement mechanism 1 further includes control unit 15, and control unit 15 is for controlling the first driving portion 113, second
Driving portion 122 and third driving portion 21 work.
Wherein, control unit 15 includes switch member, detection piece and control piece, and switch member and detection piece are all connected with control piece.It opens
Closing part can open, so that control piece controls the first driving portion 113, the second driving portion 122 and third driving portion 21 and works, to spy
Needle 3 is replaced.In the present embodiment, control piece is control chip.The free end that detection piece is used to detect the first probe tube 13 is
It is no to have probe 3, and so that control piece is controlled the work of the second driving portion 122 when no, so that the second driving portion 122 drives clamping piece
121 closures.
In the present embodiment, switch member uses button, and button is arranged on the control panel of the probe more changing device, once hair
Probe 3 in now working has damage, can be by lower button, to start replacement operation of the Each part to probe 3.Detection piece is adopted
With sensor, the effect of sensor mainly detection makes clamping piece 121 when the free end of the first probe tube 13 does not have probe 3
Closure.The setting of sensor can fall into capable detection to whether the probe damaged is unloaded, so that it is guaranteed that not having on replacement position
Have that when having damaged probe 3, spare probe 3 can just be replaced the position, avoids having damaged probe 3 and do not uninstall also, spare spy
Needle 3 has just been moved to the position, and spare probe 3 is be easy to cause to be damaged in replacement.
In the present embodiment, probe box 11 further includes side wall, and side wall connect to form probe box 11 with top cover 111 and bottom cover 112
Shell；Shell and chuck 114 are all made of insulating materials.Since probe 3 and thimble 22 are all electric conductors, insulating materials can make to visit
Needle 3 shell and chuck 114 in replacement process will not charge, and ensure that the safety that probe 3 is replaced.
In the present embodiment, the first probe tube 13 includes successively nested internal layer, middle layer and outer layer from inside to outside, internal layer and
Outer layer is all made of conductive material, and middle layer uses insulating materials；The structure of second probe tube 14 is identical as the first probe tube 13.Top
Needle 22 can be in contact with the internal layer of the first probe tube 13 and the second probe tube 14.Thimble 22 uses conductive material.
Wherein, the test signal on probe 3 is introduced by the internal layer of the second probe tube 14, therefore, thimble 22 can by with
The internal layer of first probe tube 13 and the second probe tube 14 is in contact and will test in signal transduction to probe 3.First probe tube 13
Good shielding action can be played to the test signal being applied on its internal layer with the outer layer conductive layer of the second probe tube 14, avoid
Test signal is interfered.
In the present embodiment, as shown in Figure 6 and Figure 7, probe 3 includes probe bodies 31 and probe set 32, probe bodies 31
One end is needle cap 311, and the other end is syringe needle 312, and probe set 32 is set in 312 end of syringe needle, and the outer surface of probe set 32 can be with the
The internal layer of one probe tube 13 is in contact；Needle cap 311 with thimble 22 for contacting.The outer ring of probe set 32 uses conductive material, visits
The inner ring of needle guard 32 uses flexible insulating material；In the free end of the first probe tube 13, thimble 22 can push 31 phase of probe bodies
Probe set 32 is slided, so that syringe needle 312 is pierced by from probe set 32.In test, syringe needle 312 penetrates position to be tested,
It introduces test signals into and is tested.
Wherein, when probe 3 is mobile to the free end of the first probe tube 13, due to the flexible insulation material of 32 inner ring of probe set
Material has certain elasticity, can be with 31 flexible contact of probe bodies, so probe set 32 can play guarantor to probe bodies 31
The effect of shield；On the other hand, probe sheet is introduced test signals into since probe bodies 31 are contacted by needle cap 311 with thimble 22
Body 31, only the contacts contact face product of needle cap 311 and thimble 22 is smaller, and the outer ring of probe set 32 is conductive material, outer ring and the
The internal layer of one probe tube 13, which is in contact, is capable of increasing the contact area of 13 internal layer of probe 3 and the first probe tube, to be applied to
The test signal of second probe tube, 14 internal layer can be advantageously incorporated in probe bodies 31, and test result is made more accurately may be used
It leans on.
Based on the above structure of probe more changing device, the present embodiment also provides a kind of probe replacement of the probe more changing device
Method, comprising: replacement mechanism replaces probe；Auxiliary body's auxiliary replaces mechanism for spare probe pusher to change bit
It sets.
As shown in Figure 8 and Figure 9, which specifically includes:
The S1: the second driving portion of step 122 drives clamping piece 121 to open, and third driving portion 21 pushes thimble 22 to enter probe
Box 11 is detached from the first probe tube 13 until the probe 3 for being located at 13 free end of the first probe tube is pushed to.
In the step, when finding probe 3 currently in use damage, switch member is opened, switch button is such as pressed, controlled
Part controls the second driving portion 122 driving clamping piece 121 and opens, and the probe 3 positioned at 13 free end of the first probe tube is detached from first and visits
Needle tubing 13.Wherein, control piece is control chip, and control chip sends control signal, the second driving of control to the second driving portion 122
Portion 122 executes corresponding operating.
Step S2: when detecting the free end of the first probe tube 13 does not have probe 3, the second driving portion 122 drives clamping piece
121 closures.
In the step, when detection piece detects that the free end of the first probe tube 13 does not have probe 3, sends and detect to control piece
Signal, control piece send control signal to the second driving portion 122 according to detection signal, and the second driving portion 122 drives clamping piece 121
Closure.
Step S3: third driving portion 21 pulls out thimble 22 out of probe box 11.
In the step, control piece sends control signal to third driving portion 21, and third driving portion 21 is by thimble 22 from probe
It is pulled out in box 11.
The S4: the first driving portion of step 113 drives chuck rotation, keeps a card slot for being placed with spare probe on chuck mobile
To position corresponding with the first opening and the second opening.
In the step, control piece sends control signal to the first driving portion 113, and the first driving portion 113 drives chuck rotation,
A card slot for being placed with spare probe on chuck is set to be moved to position corresponding with the first opening and the second opening.
Step S5: third driving portion 21 pushes thimble 22 to enter probe box 11, until by the spare probe pusher in card slot
To the free end of the first probe tube 13.
In the step, control piece sends control signal to third driving portion 21, and third driving portion 21 pushes thimble 22 to enter
Probe box 11, until by the spare probe pusher in card slot to the free end of the first probe tube 13.
So far, the replacement of probe 3 finishes.
Embodiment 1 the utility model has the advantages that the probe provided in the present embodiment more changing device, pass through setting replacement mechanism and auxiliary
Mechanism can be realized the automatic replacement to probe, automatically more transducing make probe kept in replacement process cleaning and position put
Accurately, the probe location being stained with after foreign matter and replacement so as to avoid probe caused by artificial replacement manually puts inaccuracy
Defect, and then the test error of probe is reduced, improve the accuracy of probe test result；Meanwhile automatic replacement also improves
The replacement efficiency of probe, to improve the testing efficiency of probe.
Embodiment 2:
The present embodiment provides a kind of test equipments, including the more changing device of the probe in embodiment 1.
By using the more changing device of the probe in embodiment 1, so that the test equipment is can be realized probe and replace automatically, thus
Test accuracy is not only increased, and improves testing efficiency.
It is understood that the principle that embodiment of above is intended to be merely illustrative of the present and the exemplary implementation that uses
Mode, however the present invention is not limited thereto.For those skilled in the art, essence of the invention is not being departed from
In the case where mind and essence, various changes and modifications can be made therein, these variations and modifications are also considered as protection scope of the present invention.
Claims (13)
1. a kind of probe more changing device, which is characterized in that including replacement mechanism and auxiliary body, the replacement mechanism is used for institute
Probe is stated to be replaced；The auxiliary body is for assisting the replacement mechanism by spare probe pusher to replacement position；
The replacement mechanism includes probe box, for accommodating and providing the spare probe；
Replacement portion, for closure or openness under the action of power, so that the probe is detached from the replacement portion or the replacement
Portion clamps the spare probe；
The probe box is connected to the replacement portion by the first probe tube.
2. probe according to claim 1 more changing device, which is characterized in that the probe box back to first probe
One end of pipe is provided with the second probe tube, and second probe tube is connected to the probe box；
The probe box includes top cover and bottom cover, and the first opening, first probe tube and the bottom are offered on the bottom cover
Lid passes through first open communication；The second opening is offered on the top cover, second probe tube passes through with the top cover
Second open communication；
First opening is corresponding with second aperture position.
3. probe according to claim 2 more changing device, which is characterized in that the probe box further include the first driving portion and
Chuck in box is set, and the neighboring area of the chuck offers multiple card slots, is used to place in the card slot described spare
Probe；
The center of the chuck offers hole, and first driving portion connects the hole, for driving the chuck to rotate, so that
Each card slot on the chuck can be moved to position corresponding with first opening and second opening.
4. probe according to claim 3 more changing device, which is characterized in that the replacement portion includes that clamping piece and second drive
Dynamic portion, the clamping piece are clamped in the free end of first probe tube, and the clamping piece can be in the drive of second driving portion
Dynamic lower closure, the probe for being located at first probe tube free end is clamped；It can also be in second driving portion
Driving is lower to open, so that the probe for being located at first probe tube free end is detached from first probe tube.
5. probe according to claim 4 more changing device, which is characterized in that the auxiliary body include third driving portion and
Thimble, the thimble are applied in second probe tube, and can be visited under the drive of the third driving portion described second
Discrepancy movement is done in needle tubing；
The third driving portion can push the thimble to enter the probe box, will be described spare in the corresponding card slot
Probe pusher is to the free end of first probe tube；The third driving portion can also draw the thimble out of described probe box
Out.
6. probe according to claim 5 more changing device, which is characterized in that the replacement mechanism further includes control unit, institute
Control unit is stated for controlling first driving portion, second driving portion and third driving portion work.
7. probe according to claim 6 more changing device, which is characterized in that the control unit includes switch member, detection piece
And control piece, the switch member and the detection piece are all connected with the control piece；
The switch member can open, so that the control piece controls first driving portion, second driving portion and described the
Three driving portions work, to be replaced to the probe；
Whether the free end that the detection piece is used to detect first probe tube has the probe, and makes the control when no
Product controls the second driving portion work, so that second driving portion drives the clamping piece closure.
8. probe according to claim 3 more changing device, which is characterized in that the probe box further includes side wall, the side
Wall connect the shell to form the probe box with the top cover and the bottom cover；
The shell and the chuck are all made of insulating materials.
9. probe according to claim 5 more changing device, which is characterized in that first probe tube include from inside to outside according to
Internal layer, middle layer and the outer layer of secondary nesting, the internal layer and the outer layer are all made of conductive material, and the middle layer is using insulation
Material；The structure of second probe tube is identical as first probe tube；
The thimble can be in contact with the internal layer of first probe tube and second probe tube；The thimble uses conduction material
Material.
10. probe according to claim 9 more changing device, which is characterized in that the probe includes probe bodies and probe
One end of set, the probe bodies is needle cap, and the other end is syringe needle, and the probe set is set in the needle end, the probe
The outer surface of set can be in contact with the internal layer of first probe tube；Needle cap with the thimble for contacting；
The outer ring of the probe set uses conductive material, and the inner ring of the probe set uses flexible insulating material；
In the free end of first probe tube, the thimble can push the relatively described probe set sliding of the probe bodies, with
It is pierced by the syringe needle from the probe set.
11. a kind of test equipment, which is characterized in that including probe more changing device described in claim 1-10 any one.
12. a kind of probe replacing options of the probe more changing device as described in claim 1-10 any one, which is characterized in that packet
Include: replacement mechanism replaces the probe；Auxiliary body assists the replacement mechanism by spare probe pusher to change bit
It sets.
13. probe replacing options according to claim 12, which is characterized in that the replacement mechanism carries out the probe
Replacement；Auxiliary body assists the replacement mechanism to include: to position is replaced by spare probe pusher
Second driving portion drives clamping piece to open, and third driving portion pushes thimble to enter probe box, until will be located at the first probe
The probe pusher of pipe free end is to being detached from first probe tube；
When detecting the free end of first probe tube does not have the probe, second driving portion drives the clamping piece to close
It closes；
The third driving portion pulls out the thimble out of probe box；
First driving portion drives chuck rotation, is moved to a card slot for being placed with spare probe on the chuck and opens with first
Mouth and the corresponding position of the second opening；
The third driving portion pushes the thimble to enter the probe box, until the spare probe in the card slot is pushed away
It moves to the free end of first probe tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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| CN110297110B (en) * | 2018-03-21 | 2022-02-15 | 科磊股份有限公司 | Probe structure, clamp, containing box, automatic probe replacing system and method |
| CN113391101A (en) * | 2021-04-25 | 2021-09-14 | 西安交通大学 | Shell-core microprobe and preparation method thereof |
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| CN2525522Y (en) * | 2002-02-02 | 2002-12-11 | 中国科学院长春光学精密机械与物理研究所 | Electronic probe |
| CN2862044Y (en) * | 2005-11-17 | 2007-01-24 | 广辉电子股份有限公司 | Feeling spindle removing device |
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| CN101930016A (en) * | 2009-06-19 | 2010-12-29 | 旺矽科技股份有限公司 | Replaceable probe device and probe card using same |
| CN202916308U (en) * | 2012-11-08 | 2013-05-01 | 王焕平 | Programming test needle apparatus and system capable of rapid replacement |
| CN104044767A (en) * | 2013-12-19 | 2014-09-17 | 中国人民解放军第二军医大学 | Replacing head arranging and filling equipment |
| CN203850607U (en) * | 2014-04-30 | 2014-09-24 | 乔讯电子(上海)有限公司 | Inner pin detection device used for pin plugging machine |
| CN204366893U (en) * | 2014-12-05 | 2015-06-03 | 国家电网公司 | Change electric energy meter intelligent checking table to plug into the device of probe |
| CN204694732U (en) * | 2015-04-20 | 2015-10-07 | 武汉新芯集成电路制造有限公司 | Board probe more changing device |
| CN204659201U (en) * | 2015-04-30 | 2015-09-23 | 天津长荣印刷设备股份有限公司 | A kind of device of quick-replaceable roller |
| CN104932135A (en) * | 2015-05-18 | 2015-09-23 | 合肥京东方光电科技有限公司 | Device and method for changing probes |
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|---|---|
| CN106291006A (en) | 2017-01-04 |
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