CN106290387A - The method of a kind of reflection method detection photovoltaic panel cleannes and detector - Google Patents
The method of a kind of reflection method detection photovoltaic panel cleannes and detector Download PDFInfo
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- CN106290387A CN106290387A CN201510315163.3A CN201510315163A CN106290387A CN 106290387 A CN106290387 A CN 106290387A CN 201510315163 A CN201510315163 A CN 201510315163A CN 106290387 A CN106290387 A CN 106290387A
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Abstract
The present invention relates to the cleannes detection technique of solar energy photovoltaic panel, refer in particular to method and the detector of a kind of reflection method detection photovoltaic panel cleannes.The method is to be irradiated at a certain angle on solar energy photovoltaic panel by the laser beam through periodic modulation, the cleannes of solar energy photovoltaic panel are detected by the intensity of reflected light measuring photovoltaic panel reflection laser beam, supporting detector includes laser instrument, modulation circuit, optical filter, photodetector and signal processing apparatus;Described signal processing apparatus includes D.C. regulated power supply, signal processing circuit, microprocessor and communicating circuit, mainly completes the AD conversion of the signal of telecommunication, amplifies and transmit.The present invention has certainty of measurement height, device is simple, economical and practical, easy and simple to handle, capacity of resisting disturbance strong, and easily realizes the advantages such as on-line measurement.
Description
Technical field
The present invention relates to the cleannes detection technique of solar energy photovoltaic panel, refer in particular to the side of a kind of reflection method detection photovoltaic panel cleannes
Method and detector.
Background technology
Solar radiant energy is as a kind of natural energy resources, in the case of Fossil fuel reduces increasingly, with its rich reserves and nonstaining property
Show the advantage of its uniqueness, by internationally recognized for one of the most emulative energy in future.And photovoltaic power generation technology the most by
Walk full-fledged, regenerative resource emerging, free of contamination can be produced, and be at home and abroad widely used.Expect 2030
Year, regenerative resource will account for more than 30% in total energy structure, and solar energy power generating is in world's total electricity is supplied
Accounting is also up to more than 10%.
Photovoltaic panel is placed on open air mostly, usually has dust stratification and falls in photovoltaic panel, therefore can have the generating efficiency of photovoltaic panel
Have a strong impact on.In order to make staff clear up the dust stratification in photovoltaic panel in time, the detection to photovoltaic panel cleannes is particularly important,
But in existing technology, can't quickly measure the cleannes of photovoltaic panel and accurately provide the data of real-time quantization.
Summary of the invention
Based on problems of the prior art, the present invention provides method and the detection of a kind of reflection method detection photovoltaic panel cleannes
The technical scheme of device, the cleannes data of the monitoring photovoltaic panel of the method energy real-time quantization, clean photovoltaic panel in time for staff
Important evidence is provided.
The method of a kind of reflection method detection photovoltaic panel cleannes, its principle is to irradiate at a certain angle through the laser beam of periodic modulation
Form a long and narrow oval hot spot to photovoltaic panel surface, and scatter on photovoltaic panel surface, absorb and reflect, along with light
Volt plate surface dust fall increases, scattering and influx and translocation, intensity of reflected light I (vxy) weaken, detection reflection light light intensity, by calibrating,
Calculating can record the cleannes of photovoltaic panel.
The detector of a kind of reflection method detection photovoltaic panel cleannes, including laser instrument, modulation circuit, optical filter, photodetection
Device and signal processing apparatus, described laser instrument sends and is modulated the pulse laser beam that circuit controls, shines with the angle less than 30 degree
It is mapped to photovoltaic panel surface, photovoltaic panel reflects, reflected light path is placed a bandpass filter, filter veiling glare, instead
Penetrate light to be accepted by photodetector, be converted to the signal of telecommunication, the intensity of reflection light can be recorded, be filtered through signal processing apparatus,
Calibration, calculating, i.e. can get the cleannes of photovoltaic panel.
Further, described signal processing apparatus includes D.C. regulated power supply, signal processing circuit, microprocessor and communication
Circuit;Described D.C. regulated power supply is that laser instrument, signal processing circuit, microprocessor and communicating circuit are powered;Described
Detector receives reflected light signal and is converted into the signal of telecommunication, and described microprocessor processes circuit by control signal and docks
The signal of telecommunication received carries out A/D conversion, signal processing and amplifying and noise filtering, and communication control circuit and carries out information transmission.
Further, described laser instrument uses the one in solid state laser or gas laser.
Further, described photodetector uses the one in silicon cell or photodiode.
Further, described optical filter uses the bandpass filter consistent with laser emission wavelength.
Further, the method for described detection cleannes comprises the following steps:
1) photovoltaic panel cleannes detector is fixed on photovoltaic panel surface, connects power supply, for system electrification;
2) system calibration: wiped clean laser-irradiated domain, opens laser instrument, puts different cleanliness factor successively in laser irradiation area
Standard reflecting plate, measures reflected light signal, to system calibration (this step only performs when first use).
3) measure: opening laser instrument, laser beam irradiation is to photovoltaic panel surface, and reflects on photovoltaic panel surface, absorb and scatter;
4) detector receives reflected light signal;
5) detector optical signal to receiving carries out opto-electronic conversion and obtains the signal of telecommunication;
6) microprocessor by control signal process circuit signal that silicon cell is exported be AD converted, processing and amplifying and noise mistake
Filter, obtains reflecting the light intensity I (v of lightxy);
7) calculate the ratio of reflective light intensity value and incident laser light intensity, according to calibration curve, obtain the cleannes of photovoltaic panel.
8), on data being uploaded onto the server by communication system, it is analyzed data processing.
The invention have the benefit that the present invention uses reflection method to measure the cleannes of photovoltaic panel, be the most directly to connect with photovoltaic panel
Touch, have and test the speed soon and without destructiveness.The present invention based on photoelectric detecting technology, also have that certainty of measurement is high, device simple,
Economical and practical, easy and simple to handle, capacity of resisting disturbance by force, and easily realizes on-line measurement.
Accompanying drawing explanation
Fig. 1 is the light path principle figure of the present invention;In figure (101) be modulation circuit, (102) be that laser instrument, (103) are for filtering
Sheet, (104) are detector.
Fig. 2 is the system and device block diagram of the present invention.
Fig. 3 is the structural representation of apparatus of the present invention;In figure (301) be laser instrument, (302) be that optical filter, (303) are for visiting
Survey device, (304) are hardware circuit.
Detailed description of the invention
Below in conjunction with Figure of description, the invention will be further described:
Fig. 1 is the light path principle figure of the present invention, and Fig. 2 is the system and device block diagram of the present invention, and Fig. 3 is the structure of apparatus of the present invention
Schematic diagram.The ultimate principle of the present invention is: first microprocessor controls modulation circuit (101) to He-Ne laser instrument (102)
Carry out periodic modulation, modulation circuit output duty cycle be 50% square-wave signal laser instrument is modulated, laser beam can be improved
Capacity of resisting disturbance to environment veiling glare.Amplitude modulation(PAM) is equivalent to make the working time of laser instrument to reduce half simultaneously, thus reduces
Laser instrument caloric value, makes light source works point more stable.He-Ne laser instrument sends pulse laser beam laser with the angle less than 30 degree
Being irradiated to photovoltaic panel surface, laser beam scatters on photovoltaic panel surface, reflect and reflects.Photovoltaic panel superficial dust is the most,
Scattering and influx and translocation, intensity of reflected light is the most weak.Filtered of light of reflection (103) is filtered and is positioned at the photodetection after optical filter
Device (104) receives, and the optical signal received is converted into the signal of telecommunication by photodetector (104).Signal processing circuit is to light electrical resistivity survey
The signal that survey device (104) exports carries out A/D conversion, processing and amplifying and noise filtering.Signal received by photodetector
It is usually quite faint, and the signal of photo-detector output is often deeply buried among noise, therefore, be to such faint
Signal processes, and typically will first carry out pretreatment, utilize the demodulated noise signal that filters of correlation intergal technology, and by faint
Signal is amplified to the voltage amplitude required by subsequent processor.Obtain reflecting light light intensity I (vxy), microprocessor is by calculating
Obtain cleannes S of photovoltaic panela.Concrete math equation is as follows:
Sa=1.546*10^ (-9) * x^5-4.005*10^ (-7) * x^4+3.363*10^ (-5) * x^3-0.0009222*x^2+0.01033*x+0.1199
Wherein x=I0/I(vxy), i.e. incident illumination and the ratio launching light.
I0=P/A, wherein P is laser power, and A is facula area.
The experimental principle step of the computing formula obtaining cleannes is as follows:
The first step, takes one piece of a size of 340*290*25, and the polysilicon solar cell plate of 17.5V/10W 1PCS, by its surface
Cleaning is clean, and the cleannes demarcating now photovoltaic panel are 100%, are positioned under normal illumination, connects circuit tester and measures this light in real time
The generating voltage amount of volt plate.
Collect a certain amount of dust, it is evenly laid out on photovoltaic panel surface.Amount of dust is from 0 increase starting a little, when sending out
When piezoelectric voltage is reduced to the most no longer change, it is believed that photovoltaic panel is the dirtiest, generating efficiency has reached minimum, demarcates at this
It is 0% that the dust of quality covers the cleannes of lower photovoltaic panel, collects and weighs the weight of the dust of use, be measured as 200g.
Second step, is divided into 20 parts by every part of 10g by dust, installs the device of the design invention in photovoltaic panel, and surveying record enters
Penetrate light and reflection light light intensity ratio.First by clean for photovoltaic panel cleaning, first data record are read, then by 1 part of dust
The uniform spreading of sample, at photovoltaic panel surface surveying record light intensity ratio, gradually increases dust sample number surveying record.
3rd step, repeatedly tests second step, the data matlab Treatment Analysis that will record, and Curve fitting simulation goes out one relatively
For curve accurately, obtaining its math equation is:
Sa=1.546*10^ (-9) * x^5-4.005*10^ (-7) * x^4+3.363*10^ (-5) * x^3-0.0009222*x^2+0.01033*x+0.1199
Below for use apparatus of the present invention for photovoltaic panel cleannes measure experimental record:
Embodiment one: the cleannes interior change in month of same place polylith photovoltaic panel
1. experimental technique
Experiment uses He-Ne laser instrument, and (wavelength, at 650nm, is launched luminous power and is typically 5mW, and energy concentrates on diameter 3mm's
In circular light spot, modulated frequency is up to 500kHz), detector uses the BWP34B silicon cell that SIEMENS company produces,
Optical filter uses the bandpass filter of 650nm, and photovoltaic panel uses polysilicon solar cell plate 17.5V/10W 1PCS, photovoltaic panel
A size of 340*290*25.Cleannes sensor is fixed on photovoltaic panel surface.Connect power supply and the peripheral circuit of device.
Experiment uses the photovoltaic panel that block-type No. 5 are identical, 5 set apparatus of the present invention, measures an interior cleannes change in month.
2. experimental result:
Measuring 5 pieces of same place photovoltaic panel, result is as shown in table 1
Photovoltaic panel one month interior cleannes in 5 pieces of same place are measured by table 1
Experimental data shows, photovoltaic panel cleannes can accurately be measured by the present invention, and measured deviation is little, also indicates that and fills with this
Put and method is measured photovoltaic panel cleannes and had the advantages that stability is high, reproducible.
Claims (7)
1. a method for reflection method detection photovoltaic panel cleannes, its principle is that modulated laser beam is irradiated to light at a certain angle
Volt plate surface forms a long and narrow oval hot spot, and scatters on photovoltaic panel surface, absorb and reflect, along with photovoltaic panel
Surface dust fall increases, scattering and influx and translocation, intensity of reflected light I (vxy) weaken, detection reflection light light intensity, by calibration, meter
Calculation can record the cleannes of photovoltaic panel.
The detector of a kind of reflection method the most according to claim 1 detection photovoltaic panel cleannes, including laser instrument, modulation electricity
Road, optical filter, photodetector and signal processing apparatus, it is characterised in that: described laser instrument sends and is modulated circuit control
Pulse laser beam, with the angular illumination less than 30 degree to photovoltaic panel surface, photovoltaic panel reflects, on reflected light path
Placing a bandpass filter, filter veiling glare, reflection light is accepted by photodetector, is converted to the signal of telecommunication, can record reflection
The intensity of light, is filtered through signal processing apparatus, calibration, calculates, i.e. can get the cleannes of photovoltaic panel.
The detector of a kind of reflection method the most according to claim 2 detection photovoltaic panel cleannes, it is characterised in that: described
Signal processing apparatus includes D.C. regulated power supply, signal processing circuit, microprocessor and communicating circuit;Described DC voltage-stabilizing
Power supply is that laser instrument, signal processing circuit, microprocessor and communicating circuit are powered;Described detector receives reflection light letter
Number and be converted into the signal of telecommunication, described microprocessor by control signal process the circuit signal of telecommunication to receiving carry out A/D
Conversion, signal processing and amplifying and noise filtering, and communication control circuit carry out information transmission.
The detector of a kind of reflection method the most according to claim 2 detection photovoltaic panel cleannes, it is characterised in that: described
Laser instrument uses the one in solid state laser or gas laser.
The detector of a kind of reflection method the most according to claim 2 detection photovoltaic panel cleannes, it is characterised in that: described
Photodetector uses the one in silicon cell or photodiode.
The detector of a kind of reflection method the most according to claim 2 detection photovoltaic panel cleannes, it is characterised in that: described
Optical filter uses the bandpass filter consistent with laser emission wavelength.
7. method and the detector of photovoltaic panel cleannes is detected according to a kind of reflection method described in claim 1,2, it is characterised in that:
The method of described detection cleannes comprises the following steps:
1) photovoltaic panel cleannes detector is fixed on photovoltaic panel surface, connects power supply, for system electrification;
2) system calibration: wiped clean laser-irradiated domain, opens laser instrument, puts different cleanliness factor successively in laser irradiation area
Standard reflecting plate, measures reflected light signal, to system calibration (this step only performs when first use);
3) measure: opening laser instrument, laser beam irradiation is to photovoltaic panel surface, and reflects on photovoltaic panel surface, absorb and scatter;
4) detector receives reflected light signal;
5) detector optical signal to receiving carries out opto-electronic conversion and obtains the signal of telecommunication;
6) microprocessor by control signal process circuit signal that silicon cell is exported be AD converted, processing and amplifying and noise mistake
Filter, obtains reflecting the light intensity I (v of lightxy);
7) calculate the ratio of reflective light intensity value and incident laser light intensity, according to calibration curve, obtain the cleannes of photovoltaic panel.
8), on data being uploaded onto the server by communication system, it is analyzed data processing.
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CN107202798A (en) * | 2017-06-27 | 2017-09-26 | 苏州天键衡电子信息科技有限公司 | A kind of surface dirt degree detector |
CN109226131A (en) * | 2018-10-11 | 2019-01-18 | 武汉华星光电半导体显示技术有限公司 | Clean endpoint monitoring method and monitoring device |
CN109290269A (en) * | 2018-09-12 | 2019-02-01 | 天津市捷威动力工业有限公司 | A kind of lithium battery pole slice cleaning equipment and method for cleaning |
CN109724946A (en) * | 2018-12-21 | 2019-05-07 | 吴英娜 | Cleaning vehicle cleanliness detection device and its system |
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CN109226131A (en) * | 2018-10-11 | 2019-01-18 | 武汉华星光电半导体显示技术有限公司 | Clean endpoint monitoring method and monitoring device |
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CN109764910A (en) * | 2019-01-31 | 2019-05-17 | 广州轨道交通建设监理有限公司 | A kind of distribution box and distribution box system |
CN110044913A (en) * | 2019-03-27 | 2019-07-23 | 易安基自动化设备(北京)有限公司 | A kind of method and device of the surface cleanness of detection object |
CN112213241A (en) * | 2019-07-12 | 2021-01-12 | 日新电机株式会社 | Dust accumulation detection device |
CN112213241B (en) * | 2019-07-12 | 2024-05-17 | 日新电机株式会社 | Dust accumulation detecting device |
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CN110572129A (en) * | 2019-09-12 | 2019-12-13 | 正信光电科技股份有限公司 | photovoltaic module surface dust detecting system |
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