CN106225928A - A kind of vector beam polarisation distribution detection apparatus and method - Google Patents

A kind of vector beam polarisation distribution detection apparatus and method Download PDF

Info

Publication number
CN106225928A
CN106225928A CN201610536624.4A CN201610536624A CN106225928A CN 106225928 A CN106225928 A CN 106225928A CN 201610536624 A CN201610536624 A CN 201610536624A CN 106225928 A CN106225928 A CN 106225928A
Authority
CN
China
Prior art keywords
wave plate
quarter
image
film micro
polarisation distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610536624.4A
Other languages
Chinese (zh)
Inventor
王潇
司晓云
杨凤
吴曰超
尹建华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing University of Aeronautics and Astronautics
Original Assignee
Nanjing University of Aeronautics and Astronautics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing University of Aeronautics and Astronautics filed Critical Nanjing University of Aeronautics and Astronautics
Priority to CN201610536624.4A priority Critical patent/CN106225928A/en
Publication of CN106225928A publication Critical patent/CN106225928A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

Abstract

The invention discloses a kind of vector beam polarisation distribution detection device, including quarter-wave plate, line polarized light analyzer, rotary module, image capture module and computer.Also disclose vector beam polarisation distribution detection method, incoming parallel beam through quarter-wave plate and line polarized light analyzer, after detected by image capture module;Quarter-wave plate fast axis direction, a series of light beam images that image capture module exposure record is modulated by quarter-wave plate fast axis direction are changed by rotary module;Computer is subdivided into film micro area image, for each film micro area it is believed that its polarisation distribution is uniform, analyze its intensity curve modulated by quarter-wave plate fast axis direction, the polarization state of this film micro area can be obtained, all film micro areas are done identical process, the final polarization state distribution obtaining whole light beam.Apparatus and method of the present invention, simple in construction, the suitability are good, reliable and stable, it is possible to realize any vector beam polarisation distribution fast and automatically, detect accurately.

Description

A kind of vector beam polarisation distribution detection apparatus and method
Technical field
The present invention relates to a kind of vector beam polarisation distribution detection apparatus and method, belong to optical polarization detection technique neck Territory.
Background technology
The polarization of light and intensity, phase place are the same is a critical nature of light.And polarized light is divided into according to polarisation distribution Even polarization light and non-uniform polarisation light.Even polarization light refers on beam cross-section, and the polarization state of light is not divided with spatial variations Cloth is uniform, and such as line polarized light, circularly polarized light, elliptically polarized light and partial polarized light etc., this light beam is referred to as scalar light beam;Non-all The polarization state of even polarized light skewness on beam cross-section, changes with spatial distribution, such as radial polarisation, angularly Polarization, vortex light field and oval vector beam etc., this light beam is referred to as vector beam.
The polarization characteristic of two kinds of light beams, has important application in a lot of fields.The polarization of scalar light beam applies such as liquid crystal Display, it is simply that the modulation of optically-based polarization;In industrial micro-field, polarization can provide the detection contrast become apparent from; In biology microscope field, using the teaching of the invention it is possible to provide direction that strength parameter is not provided that and Structure Comparison degree;And vector beam is inclined due to it The inhomogeneities shaken, at a lot of aspects such as super-resolution microscope, frequency shifting, optics catches and controls, electronics accelerates, high-resolution Measure and optical tweezer technology all plays an important role.
For the Polarization Detection of scalar light beam, domestic and international research worker proposes methods and apparatus, it is achieved that scalar Light polarization automatic, quick, accurately measure.And the detection of the polarisation distribution of vector beam, study the most both at home and abroad Seldom, the most quickly, automatic testing method accurately.
Summary of the invention
The technical problem to be solved is: provide a kind of vector beam polarisation distribution detection apparatus and method, energy Enough realize any vector beam polarisation distribution fast and automatically, detect accurately.
The present invention solves above-mentioned technical problem by the following technical solutions:
A kind of vector beam polarisation distribution detection device, including quarter-wave plate, rotary module, line polarized light analyzing Device, image capture module and computer;
Described image capture module is for exposing the vector beam of parallel incidence successively through quarter-wave plate, line polarized light Image after analyzer;
Described rotary module is used for rotating quarter-wave plate fast axis direction;
Described computer connects rotary module, image capture module respectively, and computer is used for controlling rotary module and drives four / mono-wave plate rotates its quick shaft direction, is additionally operable to receive and process the image information that image capture module transmits, finally Show the polarisation distribution of whole vector beam.
As a kind of preferred version of apparatus of the present invention, described image capture module includes beam-shaping optical module and figure As sensor;
Described beam-shaping optical module is telescope optical system, for by parallel incidence and by line polarized light analyzer The vector beam bundle that carries out expanding or contract mate the imaging size of imageing sensor, then exiting parallel is to imageing sensor; Imageing sensor is ccd image sensor, for exposure image after beam-shaping optical module, and is transferred to computer.
As a kind of preferred version of apparatus of the present invention, described rotary module is the rotary stepped machine of tape controller.
As a kind of preferred version of apparatus of the present invention, described line polarized light analyzer is that the line that axis of homology direction is fixed is inclined Shake sheet or linear polarization prism.
A kind of vector beam polarisation distribution detection method, comprises the steps:
Step 1, parallel incident vector beam is through quarter-wave plate, line polarized light analyzer, beam-shaping optical module After incide on imageing sensor photosurface, by image sensor exposure;
Step 2, computer controls rotary module and drives quarter-wave plate to rotate its fast axle to different directions, schemes simultaneously As exposure sensor light beam image under each quick shaft direction, final acquisition is a series of is adjusted by quarter-wave plate fast axis direction The light beam image of system, and these light beam images are transferred to computer;
Step 3, the light beam image obtained is finely divided by computer, then process in each segmentation film micro area by four/ The intensity curve of one quick shaft direction modulation, obtains the polarization state of each film micro area, finally obtains and show whole vector beam Polarization state is distributed.
As a kind of preferred version of the inventive method, computer described in step 2 controls rotary module and drives 1/4th Wave plate rotates its fast axle to different directions, and imageing sensor exposes the fast axle light beam image when different directions simultaneously, different Direction altogether the most N number of, and N is more than or equal to 3.
As a kind of preferred version of the inventive method, the detailed process of described step 3 is:
31) according to spatial resolution and required precision, if width light beam image every in series is subdivided into by identical rule Dry film micro area, is overlapped this by light intensity corresponding for all pixels in the film micro area of every width light beam image the i-th row j row Total light intensity I of film micro areaij
32) along quarter-wave plate fast axis direction of rotation αkExtract total light of every side beam image the i-th row j row film micro area By force, the intensity curve I that the total light intensity of this film micro area is modulated by quarter-wave plate fast axis direction is obtainedijk), k=1,2 ..., N, N Represent total number in quarter-wave plate fast axis direction;
33) to above-mentioned intensity curve Iijk) process, thus obtain the polarization state of the i-th row j row film micro area inner light beam, It is embodied in and obtains azimuth angle thetaijWith the ellipse degree of biasTwo parameters:
Wherein,
34) all film micro areas are carried out above-mentioned calculating, obtain its polarization parameter azimuth and the ellipse degree of bias, and according to polarization ginseng Number draws the polarization form of each film micro area, the final polarisation distribution showing whole vector beam.
The present invention uses above technical scheme compared with prior art, has following technical effect that
1, vector beam polarisation distribution of the present invention detection apparatus and method, achieve any vector beam polarisation distribution first Quick detection.
2, vector beam polarisation distribution of the present invention detection device, simple in construction, the suitability is strong, be easily achieved.
3, vector beam polarisation distribution detection method of the present invention, it is possible to detection is any fast and automatically, intuitively, exactly vows The polarisation distribution of amount light beam, correlational study and technology for vector light provide and support Method and kit for, have important application valency Value.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of vector beam polarisation distribution of the present invention detection device.
Fig. 2 be vector beam polarisation distribution detection method Data processing imageing sensor of the present invention obtain by four/ The light beam image of one wave plate quick shaft direction modulation.
Fig. 3 is that one of them segmentation film micro area of vector beam polarisation distribution detection method Data processing of the present invention extracts Along quarter-wave plate fast axis direction light intensity changing value and the theoretical light of the polarization parameter calculating according to acquisition after the process of these data Strong curve chart.
Fig. 4 is that polarization state parameter describes schematic diagram.
Fig. 5 is the vector beam polarisation distribution schematic diagram that the embodiment of the present invention finally shows.
Wherein, 1 is quarter-wave plate, and 2 is rotary module, and 3 is line polarized light analyzer, and 4 is beam-shaping optical mould Block, 5 is imageing sensor, and 6 is computer, and the dotted line of 1 represents quarter-wave plate fast axis direction, and the dotted line of 3 represents linear polarization Light analyzer axis of homology direction.
Detailed description of the invention
Embodiments of the present invention are described below in detail, and the example of described embodiment is shown in the drawings, the most ad initio Represent same or similar element to same or similar label eventually or there is the element of same or like function.Below by ginseng The embodiment examining accompanying drawing description is exemplary, is only used for explaining the present invention, and is not construed as limiting the claims.
The present invention proposes vector beam polarisation distribution detection apparatus and method, and most basic thought is the horizontal stroke of vector beam Cross section is subdivided into a lot of film micro area, and in an independent film micro area, polarization state varies less, it is believed that is constant, therefore may be used The polarization state of this film micro area is detected with the method utilizing scalar light beam polarization to detect.Each film micro area is detected, finally real The detection of existing whole vector beam cross section polarisation distribution.The present invention utilize telescope optical system coordinate imageing sensor to realize The parallel detection of polarisation distribution, the method using parallel data processing the most equally, finally realize vector beam inclined The quick of distribution that shake detects.
The present invention provide vector beam polarisation distribution detection device as it is shown in figure 1, the vector beam of parallel incidence first Through quarter-wave plate 1, afterwards by the line polarized light analyzer 3 that the axis of homology is fixing, then by beam-shaping optical mould Block 4 mates the spot size of imageing sensor 5 photosensitive area and incident beam, is finally exposed by imageing sensor 5.Computer 6 connect and control rotary module 2 and imageing sensor 5, drive quarter-wave plate to rotate its fast axle including driving rotary module 2 Direction, receives and processes the image information that imageing sensor 5 transmission is returned, the final polarisation distribution showing whole vector beam.
Wherein, quarter-wave plate 1 selects common optics quadrant shape wave plate;Rotary apparatus 2 selects band control The rotary stepped machine of device, its frame for movement needs to ensure the installation of quarter-wave plate 1.Line polarized light analyzer 3, selects Common linear polarizer, it is also possible to be linear polarization prism, keeps its axis of homology fixed-direction constant.Beam-shaping optical module 4 Use telescope optical system, play the effect of the bundle that expands or contract, it is ensured that the beam sizes of parallel entrance beam can mate figure As the size of sensor 5 photosurface, ensure simultaneously parallel entrance beam can exiting parallel, the enlargement ratio of concrete optical system Determined by the size of incident beam and the size of imageing sensor 5 photosurface.Imageing sensor 5 is owing to being not related to coloured image Acquisition, select monochromatic ccd image sensor.
During detection, after incident parallel vector beam enters detection device, computer controls the work of whole device. Rotary apparatus is driven to drive quarter-wave plate to rotate to N number of different direction between 0 ° to 180 °, at each direction figure below As the corresponding light beam image of exposure sensor record, then it is transmitted back to computer.The result that computer obtains is as in figure 2 it is shown, be A series of intensity image modulated by quarter-wave plate fast axis direction α.Then to each image in series by identical rule Being subdivided into film micro area, the polarisation distribution change in each film micro area is little, it is believed that polarization state is identical, can use scalar light It is detected by the method for bundle detection.In segmentation process, the lateral resolution of the least last polarisation distribution of film micro area is the highest (can be single pixel), but simultaneously as impacts such as imageing sensor capture intensity noises, process the noise of rear polarizer distribution The biggest, accuracy declines, and the time that data process simultaneously needs is the most.Need to be distributed according to light beam polarization, the power of light beam Consider to make balance in resolution, noise, process between the time etc. combined factors.
For each film micro area, in superposition film micro area, the light intensity of all pixels generates total light intensity, so for each microcell The total light intensity changing value modulated by α can be extracted, along quick shaft direction α, easily in territory, and the dotted line in Fig. 3 illustrates for certain figure Some film micro area in Xiang, the value that total light intensity of extraction changes along α.
According to total light intensity along the changing value of α, process the polarization state obtaining this film micro area, this polarization state and scalar through data The random polarization state of light beam equally can be described by two parameters, and as shown in Figure 4, one of them parameter is oval azimuth θ, another is the ellipse degree of biasUtilizing the two parameter, can describe any single polarization state, liner polarization and circular polarization is all special Different elliptical polarization.Due to exist two unknown parameter θ andSo light intensity value to be passed through tries to achieve the two parameter, mathematically want Ask the value that light intensity α changes no less than three, also objective requirement is at least exposed on three different quick shaft direction α to plot of light intensity Picture, i.e. N >=3.During actually detected, when N is the biggest, it is thus achieved that data the most, accuracy is the highest, but simultaneously time-consuming the most more Long.So in actually detected, need to be balanced between accuracy in detection and detection speed, the selection of General N 10~ Between 45.
For specific film micro area, computer is by processing the light that this film micro area is modulated by quarter-wave plate fast axis direction α Strong change, can ask for polarization parameter θ andValue.Concrete Treatment Analysis principle is to utilize Jones matrix Modeling Calculation to obtain light Strong change andBetween relation, then according to light intensity change ask for θ and
Being θ to Orientation of polarized main axis, the ellipse degree of bias isPolarized light, be the quarter-wave plate of α through quick shaft direction, then Fixed its electric field intensity after the linear polarization analyzer of (being assumed to be 90 °) by axis of homology direction, utilize Jones matrix modeling as follows Shown in formula:
It is computed its light intensity I (α) as follows:
Observe it appeared that I (α) can be expressed as the fourier function form of α:
I ( α ) = Σ n = 0 ∞ ( A n cos n α + B n sin n α ) ,
Wherein, AnAnd BnIt it is all its Fourier coefficient.
Therefore, θ andCan be tried to achieve by Fourier coefficient:
In real data processes, light intensity I (α) that computer obtains according to certain film micro area, with the changing value of α, carries out Fu In leaf be calculated its Fourier coefficient, as follows:
A n = 2 N Σ k = 1 N I ( α k ) c o s ( n · α k )
B n = 2 N Σ k = 1 N I ( α k ) s i n ( n · α k ) .
Then according to θ andRelation with Fourier coefficient, it is easy to ask for this film micro area polarization parameter.The dotted line of Fig. 3 Illustrating total light intensity value under 30 different quick shaft direction α that one of them film micro area extracts, in figure, solid line illustrated is above-mentioned Data processing method obtain corresponding θ andAfter bring the computing formula of above-mentioned light intensity I (α) into after the theoretical light intensity curve that obtains, The least with actual value difference, show that the polarization parameter asked for by the method has the highest accuracy.
Film micro area all of in image is utilized above-mentioned data processing method, and it is corresponding that parallel computation obtains each film micro area Polarization parameter θ andThen the polarization state of each film micro area is drawn by elliptic function, as it is shown in figure 5, so can intuitively show Show the polarization state distribution of whole light beam.
Above example is only the technological thought that the present invention is described, it is impossible to limit protection scope of the present invention with this, every The technological thought proposed according to the present invention, any change done on the basis of technical scheme, each fall within scope Within.

Claims (7)

1. a vector beam polarisation distribution detection device, it is characterised in that include that quarter-wave plate, rotary module, line are inclined Shake light analyzer, image capture module and computer;
Described image capture module is for exposing the vector beam of parallel incidence successively through quarter-wave plate, line polarized light analyzing Image after device;
Described rotary module is used for rotating quarter-wave plate fast axis direction;
Described computer connects rotary module, image capture module respectively, computer be used for controlling rotary module drive four/ One wave plate rotates its quick shaft direction, is additionally operable to receive and process the image information that image capture module transmits, finally shows The polarisation distribution of whole vector beam.
Vector beam polarisation distribution detection device the most according to claim 1, it is characterised in that described image capture module bag Include beam-shaping optical module and imageing sensor;
Described beam-shaping optical module is telescope optical system, for by parallel incidence and by the arrow of line polarized light analyzer Amount light beam carries out expanding or contracting restrainting the imaging size mating imageing sensor, and then exiting parallel is to imageing sensor;Image Sensor is ccd image sensor, for exposure image after beam-shaping optical module, and is transferred to computer.
Vector beam polarisation distribution detection device the most according to claim 1, it is characterised in that described rotary module is band control The rotary stepped machine of device processed.
Vector beam polarisation distribution detection device the most according to claim 1, it is characterised in that described line polarized light analyzer The linear polarizer fixing for axis of homology direction or linear polarization prism.
5. a vector beam polarisation distribution detection method, it is characterised in that comprise the steps:
Step 1, parallel incident vector beam enters after quarter-wave plate, line polarized light analyzer, beam-shaping optical module It is mapped on imageing sensor photosurface, by image sensor exposure;
Step 2, computer controls rotary module and drives quarter-wave plate to rotate its fast axle to different directions, image biography simultaneously Sensor is exposed on the light beam image under each quick shaft direction, and final obtain a series of is modulated by quarter-wave plate fast axis direction Light beam image, and these light beam images are transferred to computer;
Step 3, the light beam image obtained is finely divided by computer, fast by 1/4th in then processing each segmentation film micro area The intensity curve of direction of principal axis modulation, obtains the polarization state of each film micro area, finally obtains and show the polarization of whole vector beam State is distributed.
Vector beam polarisation distribution detection method the most according to claim 5, it is characterised in that computer control described in step 2 Rotary module processed drives quarter-wave plate to rotate its fast axle to different directions, and imageing sensor exposes fast axle in difference simultaneously Light beam image during direction, different directions is the most N number of, and N is more than or equal to 3.
Vector beam polarisation distribution detection method the most according to claim 5, it is characterised in that the concrete mistake of described step 3 Cheng Wei:
31) according to spatial resolution and required precision, width light beam image every in series is subdivided into several by identical rule Film micro area, is overlapped obtaining this microcell by light intensity corresponding for all pixels in the film micro area of every width light beam image the i-th row j row Total light intensity I in territoryij
32) along quarter-wave plate fast axis direction of rotation αkExtract total light intensity of every side beam image the i-th row j row film micro area, obtain The intensity curve I that the total light intensity of this film micro area is modulated by quarter-wave plate fast axis directionijk), k=1,2 ..., N, N represent four Total number of/mono-wave plate quick shaft direction;
33) to above-mentioned intensity curve Iijk) process, thus obtain the polarization state of the i-th row j row film micro area inner light beam, specifically It is embodied in and obtains azimuth angle thetaijWith the ellipse degree of biasTwo parameters:
Wherein,
34) all film micro areas are carried out above-mentioned calculating, obtain its polarization parameter azimuth and the ellipse degree of bias, and paint according to polarization parameter Make the polarization form of each film micro area, the final polarisation distribution showing whole vector beam.
CN201610536624.4A 2016-07-08 2016-07-08 A kind of vector beam polarisation distribution detection apparatus and method Pending CN106225928A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610536624.4A CN106225928A (en) 2016-07-08 2016-07-08 A kind of vector beam polarisation distribution detection apparatus and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610536624.4A CN106225928A (en) 2016-07-08 2016-07-08 A kind of vector beam polarisation distribution detection apparatus and method

Publications (1)

Publication Number Publication Date
CN106225928A true CN106225928A (en) 2016-12-14

Family

ID=57519745

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610536624.4A Pending CN106225928A (en) 2016-07-08 2016-07-08 A kind of vector beam polarisation distribution detection apparatus and method

Country Status (1)

Country Link
CN (1) CN106225928A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108303180A (en) * 2018-03-26 2018-07-20 中山大学 A kind of vector optical measurement instrument based on optics geometric transformation
CN110207826A (en) * 2019-07-03 2019-09-06 中国电子科技集团公司第五十四研究所 A kind of vector beam polarization state detection method
CN110319935A (en) * 2019-04-09 2019-10-11 北京工业大学 A kind of device and method of knife-edge method detection radial polarisation optical purity
CN111256827A (en) * 2020-01-13 2020-06-09 中国人民解放军国防科技大学 Light wave polarization state detection method based on vector light field modulation and image processing

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141264A (en) * 2011-01-06 2012-07-26 Nec Corp Apparatus and method for measuring wavelength resolved stokes vector
US20120212742A1 (en) * 2011-02-18 2012-08-23 National Cheng Kung University Optical parameter measuring apparatus and optical parameter measuring method
CN103439001A (en) * 2013-08-20 2013-12-11 浙江大学 Method and device for measuring and evaluating inhomogeneous vector polarized light
CN105021284A (en) * 2015-06-29 2015-11-04 中国人民解放军陆军军官学院 System and method for rapidly measuring space polarization information of random space vector polarized light

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141264A (en) * 2011-01-06 2012-07-26 Nec Corp Apparatus and method for measuring wavelength resolved stokes vector
US20120212742A1 (en) * 2011-02-18 2012-08-23 National Cheng Kung University Optical parameter measuring apparatus and optical parameter measuring method
CN103439001A (en) * 2013-08-20 2013-12-11 浙江大学 Method and device for measuring and evaluating inhomogeneous vector polarized light
CN105021284A (en) * 2015-06-29 2015-11-04 中国人民解放军陆军军官学院 System and method for rapidly measuring space polarization information of random space vector polarized light

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
冯伟伟: "《光束偏振态的斯托克斯参量及偏振度的智能化测量》", 《中国优秀博硕士学位论文全文数据库基础科学辑》 *
周哲海,祝连庆: "《基于Stokes参量法测量矢量光束偏振态的方法》", 《激光与红外》 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108303180A (en) * 2018-03-26 2018-07-20 中山大学 A kind of vector optical measurement instrument based on optics geometric transformation
CN110319935A (en) * 2019-04-09 2019-10-11 北京工业大学 A kind of device and method of knife-edge method detection radial polarisation optical purity
CN110319935B (en) * 2019-04-09 2021-05-25 北京工业大学 Device and method for detecting purity of radial polarized light by knife edge method
CN110207826A (en) * 2019-07-03 2019-09-06 中国电子科技集团公司第五十四研究所 A kind of vector beam polarization state detection method
CN110207826B (en) * 2019-07-03 2021-04-20 中国电子科技集团公司第五十四研究所 Vector light beam polarization state detection method
CN111256827A (en) * 2020-01-13 2020-06-09 中国人民解放军国防科技大学 Light wave polarization state detection method based on vector light field modulation and image processing
CN111256827B (en) * 2020-01-13 2022-03-11 中国人民解放军国防科技大学 Light wave polarization state detection method based on vector light field modulation and image processing

Similar Documents

Publication Publication Date Title
US9976906B2 (en) Light polarization state modulation and detection apparatuses and detection method
CN110132420B (en) Polarization measuring device, polarization measuring method, and optical alignment method
US7769243B2 (en) Method and apparatus for image inspection
CN106225928A (en) A kind of vector beam polarisation distribution detection apparatus and method
CN103827917A (en) Method and apparatus for automatic camera calibration using one or more images of a checkerboard pattern
CN107121414A (en) A kind of non-intuitive dim light super-resolution imaging measuring system and method
US9225977B2 (en) Matrix testing targets
CN101545854A (en) Double refraction determining apparatus and double refraction determining method
CN104793343A (en) Three-channel and single-Wollaston prism polarization imaging device and polarization information detecting method
CN106525242B (en) A kind of device can be used for sun polarization Stokes vector real-time measurement
CN104501738A (en) Rapid measurement method and device for nonoscale large-area scattered field
CN103954360A (en) Spectrum polarization device based on polarization array and detection method
CN102621072A (en) Polarization and birefringence measuring system
CN106662485A (en) Measuring polarization
CN103024427B (en) Testing method of camera modulation transfer function and testing device thereof
CN106526823A (en) DNA nanosphere non-fluorescent non-visual microscopic imaging device and method
Le Sant et al. Multi-camera calibration for 3DBOS
JP2009042040A (en) Polarization analyzer utilizing polarization imaging camera
US20180136111A1 (en) Magnetophorisis measuring system for determining motion status of object and quantifying amount of magnetic particles contained therein
US7518712B2 (en) Tilted edge for optical-transfer-function measurement
CN105698751A (en) Ranging system, method and device and camera shooting device
Lesniak et al. An innovative polariscope for photoelastic stress analysis
CN101231161B (en) Method for measuring particle diameter
US20230204989A1 (en) Analyzing microtextured regions of optically anisotropic materials
Beckley et al. Pupil polarimetry using stress-engineered optical elements

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20161214

WD01 Invention patent application deemed withdrawn after publication