CN105929290A - Test mechanism capable of automatically testing pinpoint - Google Patents
Test mechanism capable of automatically testing pinpoint Download PDFInfo
- Publication number
- CN105929290A CN105929290A CN201610541088.7A CN201610541088A CN105929290A CN 105929290 A CN105929290 A CN 105929290A CN 201610541088 A CN201610541088 A CN 201610541088A CN 105929290 A CN105929290 A CN 105929290A
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- CN
- China
- Prior art keywords
- test
- testing
- pin mark
- board
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a test mechanism capable of automatically testing a pinpoint, which is used for testing the stability of a pinpoint product. The test mechanism comprises probes, a circuit board, a circuit flexible board, a test relay control board and a test instrument, and is characterized in that one end of each probe is in conductive contact with a pinpoint product to be tested, and the other end of the probe is welded on the circuit board; the circuit flexible board acts as a connection medium and is arranged between the circuit board and the test relay control board, the test relay control board converts signals into four-wire signals through a controller, and the four-wire signals are connected to the test instrument through a cable. The test mechanism disclosed by the invention simplifies a traditional test circuit through using the circuit flexible board, and reduces switching nodes, thereby reducing the floating range of impedance, and improving the test stability; the probes and the circuit board are welded into an integral whole, so that a phenomenon that connection between the probes and the circuit board is instable, impractical and the like in the moving process is reduced; and the circuit flexible board adopts an anti-shielding design, interference of external signals is reduced, and the test accuracy is improved.
Description
Technical field
The present invention relates to a kind of mechanism for testing for pin mark series products stability test, being specifically related to one can
Automatically the mechanism for testing of pin mark is tested.
Background technology
Pin mark test is link critically important in pin mark detects, but the test of the mechanism for testing of prior art is returned
Road interior joint is too much, link shakiness, is easily caused that impedance floating range is big, test data are unstable, dropout
Etc. phenomenon；And loop do not does processed, external signal serious interference, affect test result.
Summary of the invention
In order to overcome the deficiencies in the prior art, the present invention provides one, and test process is stable, test result is accurate
The mechanism for testing of automatically testing pin mark.
To this end, the invention discloses the mechanism for testing of a kind of automatically testing pin mark, steady for pin mark product
Qualitative test, including probe, circuit board, circuit soft board, busy relay panel and test instrumentation, institute
Stating one end of probe and pin mark product conducting contact to be measured, the other end is welded on described circuit board；Described electricity
Road soft board is located between described circuit board and described busy relay panel as connecting medium, described test
Control plate converts the signal into four-wire system by controller and accesses described test instrumentation by cable.
Further, one end of described circuit soft board is connected with described circuit board, and the other end is that golden finger is direct
Insert described busy relay panel.
Preferably, described circuit soft board uses polyimide insulative resin material.
Preferably, described circuit soft board uses anti-shielding design.
Preferably, described busy relay panel uses multi-way contral, can realize different pin mark product and survey
Any switching laws between examination.
Further, described circuit soft board includes control module, communication module and capture card, by described control
Molding block controls described communication module can realize the control to test instrumentation, controls institute by described control module
State capture card and can realize the control to busy relay panel.
Further, described cable periphery is provided with anti-shielding protection set to reduce extraneous signal disturbing.
Compared with prior art, the method have the advantages that
1, test loop uses circuit soft board, simplifies traditional test loop, decrease transit node,
Thus reduce the floating range of impedance, improve measuring stability；
2, probe and welding circuit board one, reduce motor process middle probe be connected with circuit board instability and
The phenomenon such as impractical；
3, circuit soft board uses anti-shielding design, decreases the interference of outer signals, improves the accurate of test
Property.
Accompanying drawing explanation
The structural representation of the mechanism for testing of a kind of automatically testing pin mark that Fig. 1 provides for the present invention, wherein:
1-pin mark product, 2-probe, 3-circuit board, 4-circuit soft board, 5-busy relay panel, 6-
Cable, 7-test instrumentation.
Detailed description of the invention
Below in conjunction with the accompanying drawings embodiments of the invention are described in detail.
Referring to Fig. 1, the present invention provides the mechanism for testing of a kind of automatically testing pin mark, for pin mark product 1
Stability test, including probe 2, circuit board 3, circuit soft board 4, busy relay panel 5 and survey
Examination instrument 7.
One end of described probe 2 and pin mark product 1 conducting contact to be measured, the other end is welded in described circuit board 3
On, reduce the instability being connected between motor process middle probe 2 with circuit board 3 and the phenomenon such as impractical.
Described circuit soft board 4 is located at described circuit board 3 and described busy relay panel 5 as connecting medium
Between, its one end is connected with described circuit board 3, and the other end is that golden finger is inserted directly into described busy relay
Panel 5.
Described busy relay panel 5 is converted the signal into four-wire system by controller and is accessed by cable 6
Described test instrumentation 7.
Described circuit soft board 4 uses polyimide insulative resin material, and high temperature resistant, bending performance is good, and adopts
With anti-shielding design.
Described circuit soft board 4 includes control module, communication module and capture card, by described control module control
Make described communication module and can realize the control to test instrumentation 7, control described collection by described control module
Card can realize the control to busy relay panel 5.
Described busy relay panel 5 uses multi-way contral, can realize between different pin mark product 1 test
Any switching laws.
Described cable 6 periphery is provided with anti-shielding protection set to reduce extraneous signal disturbing.
The mechanism for testing of the described automatically testing pin mark that the present invention provides, by using circuit soft board, simplifies
Traditional test loop, decreases transit node, thus reduces the floating range of impedance, improve test
Stability；Probe and welding circuit board one, reduce motor process middle probe and be connected instability with circuit board
With the phenomenon such as impractical；Circuit soft board uses anti-shielding design, decreases the interference of outer signals, improves survey
The accuracy of examination.
The above, the only present invention preferably detailed description of the invention, but protection scope of the present invention not office
Being limited to this, any those familiar with the art is in the technical scope that the invention discloses, according to this
The technical scheme of invention and inventive concept thereof in addition equivalent or change, all should contain the protection in the present invention
Within the scope of.
Claims (7)
1. a mechanism for testing for automatically testing pin mark, for the stability test of pin mark product, its feature
It is, including probe, circuit board, circuit soft board, busy relay panel and test instrumentation, described spy
One end of pin and pin mark product conducting contact to be measured, the other end is welded on described circuit board；Described circuit is soft
Plate is located between described circuit board and described busy relay panel as connecting medium, described test relay
Device panel converts the signal into four-wire system by controller and accesses described test instrumentation by cable.
The mechanism for testing of a kind of automatically testing pin mark the most according to claim 1, it is characterised in that
One end of described circuit soft board is connected with described circuit board, and the other end is that golden finger is inserted directly into described test and continues
Appliance controling plate.
The mechanism for testing of a kind of automatically testing pin mark the most according to claim 1, it is characterised in that
Described circuit soft board uses polyimide insulative resin material.
The mechanism for testing of a kind of automatically testing pin mark the most according to claim 1, it is characterised in that
Described circuit soft board uses anti-shielding design.
The mechanism for testing of a kind of automatically testing pin mark the most according to claim 1, it is characterised in that
Described busy relay panel uses multi-way contral, can realize arbitrarily cutting between different pin mark product test
Change.
The mechanism for testing of a kind of automatically testing pin mark the most according to claim 1, it is characterised in that
Described circuit soft board includes control module, communication module and capture card, is controlled described by described control module
Communication module can realize the control to test instrumentation, and controlling described capture card by described control module can realize
Control to busy relay panel.
The test structure of a kind of automatically testing pin mark the most according to claim 1, it is characterised in that
Described cable periphery is provided with anti-shielding protection set to reduce extraneous signal disturbing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610541088.7A CN105929290A (en) | 2016-07-11 | 2016-07-11 | Test mechanism capable of automatically testing pinpoint |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610541088.7A CN105929290A (en) | 2016-07-11 | 2016-07-11 | Test mechanism capable of automatically testing pinpoint |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105929290A true CN105929290A (en) | 2016-09-07 |
Family
ID=56827942
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610541088.7A Pending CN105929290A (en) | 2016-07-11 | 2016-07-11 | Test mechanism capable of automatically testing pinpoint |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105929290A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1955743A (en) * | 2005-10-24 | 2007-05-02 | 旺矽科技股份有限公司 | Probe device of probe card |
| US20130106454A1 (en) * | 2011-10-28 | 2013-05-02 | Askey Computer Corp. | Printed circuit board testing device |
| CN204116400U (en) * | 2014-08-12 | 2015-01-21 | 珠海市运泰利自动化设备有限公司 | Based on the bilayer switching pin block test structure of polymorphic type probe |
| CN204789909U (en) * | 2015-06-09 | 2015-11-18 | 昆山拓甫电子有限公司 | Automatic test platform of two segmentations of PCB board |
| CN105486970A (en) * | 2015-11-24 | 2016-04-13 | 深圳市思榕科技有限公司 | Pogopin module performance test system and method |
| CN205898919U (en) * | 2016-07-11 | 2017-01-18 | 苏州威罗达电子科技有限公司 | But accredited testing organization of automatic testing pin mark |
-
2016
- 2016-07-11 CN CN201610541088.7A patent/CN105929290A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1955743A (en) * | 2005-10-24 | 2007-05-02 | 旺矽科技股份有限公司 | Probe device of probe card |
| US20130106454A1 (en) * | 2011-10-28 | 2013-05-02 | Askey Computer Corp. | Printed circuit board testing device |
| CN204116400U (en) * | 2014-08-12 | 2015-01-21 | 珠海市运泰利自动化设备有限公司 | Based on the bilayer switching pin block test structure of polymorphic type probe |
| CN204789909U (en) * | 2015-06-09 | 2015-11-18 | 昆山拓甫电子有限公司 | Automatic test platform of two segmentations of PCB board |
| CN105486970A (en) * | 2015-11-24 | 2016-04-13 | 深圳市思榕科技有限公司 | Pogopin module performance test system and method |
| CN205898919U (en) * | 2016-07-11 | 2017-01-18 | 苏州威罗达电子科技有限公司 | But accredited testing organization of automatic testing pin mark |
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|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160907 |