CN105842669A - K-band radar testing system - Google Patents
K-band radar testing system Download PDFInfo
- Publication number
- CN105842669A CN105842669A CN201610183525.2A CN201610183525A CN105842669A CN 105842669 A CN105842669 A CN 105842669A CN 201610183525 A CN201610183525 A CN 201610183525A CN 105842669 A CN105842669 A CN 105842669A
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- China
- Prior art keywords
- band
- pxle
- module
- radar
- frequency variable
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
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- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Radar Systems Or Details Thereof (AREA)
Abstract
The invention discloses a K-band radar testing system which comprises a PXle cabinet and backboard, wherein a PXle system controller, a PXle bi-channel DAC module, a K-band IQ upper frequency variable module, a K-band IQ lower frequency variable module and a PXle bi-channel ADC module are in communication connection on the PXle cabinet and backboard. The output end of the PXle bi-channel DAC module is connected with the K-band IQ upper frequency variable module, the output end of the K-band IQ upper frequency variable module is connected with a K-band vector signal output interface, the output end of the K-band IQ lower frequency variable module is connected with PXle bi-channel ADC module, and the input end of the K-band IQ lower frequency variable module is connected with a K-band vector signal input interface. The K-band radar testing system is based on a PXI framework. Radar emission and reception signals can be tested on one device, time domain and frequency domain waveform of radar signals can be tested, various signal data can be analyzed, and complex radar test can be realized.
Description
Technical field
The present invention relates to a kind of radar test system, be specifically related to a kind of K-band Radar Measurement System, belong to radar technical field of measurement and test.
Background technology
When testing for K-band and above radar radiofrequency signal at present, the means of testing of employing is mostly several all purpose instruments of dependence and tests different signals and index respectively, there is cost high, test data are difficult to be uniformly processed, test interface is many, and operation complexity, common test personnel are difficult to the problems such as grasp；And the device specifications of existing employing PXI framework is on the low side, it is difficult to realize the measurement to K-band radiofrequency signal.
Summary of the invention
For solving the problems referred to above, the present invention proposes a kind of K-band Radar Measurement System, K-band Radar Measurement System is based on PXI framework, can be implemented in an equipment and realize the test to radar transmit-receive signal, time domain and the frequency-domain waveform of radar signal can be tested simultaneously, and various signal datas can be analyzed, it is achieved Complex Radar is tested.
The K-band Radar Measurement System of the present invention, including PXle cabinet and backboard, on described PXle cabinet and backboard, communication link is connected to PXle system controller, PXle dual pathways DAC module, K-band IQ up-converter module, K-band IQ down conversion module and PXle dual pathways ADC；Described PXle dual pathways DAC module outfan is connected with K-band IQ up-converter module；Described K-band IQ up-converter module outfan is connected to K-band vector signal output interface；Described K-band IQ down conversion module outfan is connected to PXle dual pathways ADC；Described K-band IQ down conversion module input is connected to K-band vector signal input interface.
Further, described K-band vector signal input interface and K-band vector signal output interface are connected respectively to radio-frequency (RF) switch；By radio-frequency (RF) switch, different tests is switched over by radio-frequency (RF) switch, needs frequent wiring to compare with all purpose instrument test, has been greatly saved the time, and has also reduced the probability because connecting-disconnecting interface causes interface to damage repeatedly.
The present invention compared with prior art, the K-band Radar Measurement System of the present invention, due to have employed high integration design, decrease testing procedure, all tests complete on an equipment, substantially reduce the testing time, can improve testing efficiency more than 50%；Method of testing is simple: use an equipment to complete all to test, and uses unified interface, easily learns, easy and simple to handle；Automaticity is high: coordinating automatic test software, inside carries test case, can complete complicated test the short time, and automatically generate test result report；Low cost: compared to the testing scheme of current all purpose instrument, cost can reduce by 40%.
Accompanying drawing explanation
Fig. 1 is the communication structure schematic diagram of the present invention.
Detailed description of the invention
K-band Radar Measurement System as shown in Figure 1, including PXle cabinet and backboard, on described PXle cabinet and backboard, communication link is connected to PXle system controller, PXle dual pathways DAC module, K-band IQ up-converter module, K-band IQ down conversion module and PXle dual pathways ADC；Described PXle dual pathways DAC module outfan is connected with K-band IQ up-converter module；Described K-band IQ up-converter module outfan is connected to K-band vector signal output interface；Described K-band IQ down conversion module outfan is connected to PXle dual pathways ADC；Described K-band IQ down conversion module input is connected to K-band vector signal input interface.
Wherein, described K-band vector signal input interface and K-band vector signal output interface are connected respectively to radio-frequency (RF) switch；By radio-frequency (RF) switch, different tests is switched over by radio-frequency (RF) switch, needs frequent wiring to compare with all purpose instrument test, has been greatly saved the time, and has also reduced the probability because connecting-disconnecting interface causes interface to damage repeatedly.
The K-band Radar Measurement System of the present invention, uses PXle cabinet and backboard, and it is the PXIe platform that industry is ripe, and is integrated with the module of maturation；PXIe platform uses PCIe Gen 4X bus, is equipped with the PXle system controller of Core2 i7；ADC and DAC module all use the PXIe module of maturation, and sampling rate is better than 625MSPS, and vertical resolution is higher than 12；K-band IQ up-conversion and down conversion module are based on GaAs MMIC technology, frequency coverage 24-26.25GHz.
With the above-mentioned desirable embodiment according to the present invention for enlightenment, by above-mentioned description, relevant staff can carry out various change and amendment completely in the range of without departing from this invention technological thought.The content that the technical scope of this invention is not limited in description, it is necessary to determine its technical scope according to right.
Claims (2)
1. a K-band Radar Measurement System, it is characterized in that: include PXle cabinet and backboard, on described PXle cabinet and backboard, communication link is connected to PXle system controller, PXle dual pathways DAC module, K-band IQ up-converter module, K-band IQ down conversion module and PXle dual pathways ADC；Described PXle dual pathways DAC module outfan is connected with K-band IQ up-converter module；Described K-band IQ up-converter module outfan is connected to K-band vector signal output interface；Described K-band IQ down conversion module outfan is connected to PXle dual pathways ADC；Described K-band IQ down conversion module input is connected to K-band vector signal input interface.
K-band Radar Measurement System the most according to claim 1, it is characterised in that: described K-band vector signal input interface and K-band vector signal output interface are connected respectively to radio-frequency (RF) switch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610183525.2A CN105842669A (en) | 2016-03-29 | 2016-03-29 | K-band radar testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610183525.2A CN105842669A (en) | 2016-03-29 | 2016-03-29 | K-band radar testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105842669A true CN105842669A (en) | 2016-08-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN201610183525.2A Pending CN105842669A (en) | 2016-03-29 | 2016-03-29 | K-band radar testing system |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102497237A (en) * | 2011-12-01 | 2012-06-13 | 北京航天测控技术有限公司 | Radio frequency and microwave synthetic instrument based on PXIe (PCI Extensions for Instrumentation) synthetic instrument architecture |
| CN102694758A (en) * | 2012-04-11 | 2012-09-26 | 上海聚星仪器有限公司 | Online calibration method for radio frequency front-end receiving-transmitting link |
| CN202503522U (en) * | 2012-01-13 | 2012-10-24 | 上海创远仪器技术股份有限公司 | Super heterodyne harmonic detection device |
| CN103248444A (en) * | 2013-05-16 | 2013-08-14 | 中国电子科技集团公司第四十一研究所 | System integration device and system integration method for test parameters based on unit combination |
| US20150161068A1 (en) * | 2013-12-05 | 2015-06-11 | National Instruments Corporation | Address Range Decomposition |
-
2016
- 2016-03-29 CN CN201610183525.2A patent/CN105842669A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102497237A (en) * | 2011-12-01 | 2012-06-13 | 北京航天测控技术有限公司 | Radio frequency and microwave synthetic instrument based on PXIe (PCI Extensions for Instrumentation) synthetic instrument architecture |
| CN202503522U (en) * | 2012-01-13 | 2012-10-24 | 上海创远仪器技术股份有限公司 | Super heterodyne harmonic detection device |
| CN102694758A (en) * | 2012-04-11 | 2012-09-26 | 上海聚星仪器有限公司 | Online calibration method for radio frequency front-end receiving-transmitting link |
| CN103248444A (en) * | 2013-05-16 | 2013-08-14 | 中国电子科技集团公司第四十一研究所 | System integration device and system integration method for test parameters based on unit combination |
| US20150161068A1 (en) * | 2013-12-05 | 2015-06-11 | National Instruments Corporation | Address Range Decomposition |
Non-Patent Citations (1)
| Title |
|---|
| 王丽英: "PXI Express将PXI平台推向新应用领域", 《今日电子》 * |
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20160810 |
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| WD01 | Invention patent application deemed withdrawn after publication |