CN105676053B - A kind of touch screen defect detecting system - Google Patents
A kind of touch screen defect detecting system Download PDFInfo
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- CN105676053B CN105676053B CN201610098339.9A CN201610098339A CN105676053B CN 105676053 B CN105676053 B CN 105676053B CN 201610098339 A CN201610098339 A CN 201610098339A CN 105676053 B CN105676053 B CN 105676053B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The present invention relates to a kind of touch screen defect detecting systems, the touch screen detecting system includes that capacitance turns voltage module CV, resistance turns voltage module RV, analog-to-digital conversion module ADC and DSP＆MCU module, the one end the analog-to-digital conversion module ADC is separately connected that capacitance turns voltage module CV and resistance turns voltage module RV, the other end connects the DSP＆MCU modules, the capacitance turns voltage module CV for converting the several of sensor passage on touch screen to voltage to the capacitance of ground parasitic capacitance, resistance turns voltage module RV for converting the several of sensor passage on touch screen to voltage to the resistance of ground parasitic capacitance, the DSP＆MCU modules turn voltage module CV for controlling capacitance, resistance turns voltage module RV and handles the output result of analog-to-digital conversion module ADC.The solution of the present invention need not additionally increase hardware cost, and the detection of the defect of touch screen module can be completed using touch chip itself；The test process of the solution of the present invention is completed to realize automation, and testing efficiency is high, and testing reliability is high.
Description
Technical field
The present invention relates to a kind of touch screen defect detecting systems.
Background technology
Touch screen is widely used at present in the portable devices such as various mobile terminals, particularly smart mobile phone.It touches at present
Touching screen type mainly has capacitive touch screen, wherein being fabricated by ITO (indium tin oxide or oxide indium tin) saturating
Bright thin-film material is the critical material for manufacturing capacitive touch screen.Touch screen manufacture manufacture before, need to its electrical characteristic into
Row test, to detect touch screen as non-defective unit or defective products, to avoid defective products from putting goods on the market use.Since touch screen production is deposited
In yield issues and process deviation, also some touch screens can be damaged because of factors such as mechanical damages, therefore in order to ensure
Touch screen module is satisfactory before manufacture, needs to test touch screen module.
The test method for the touch screen that the prior art provides is stipple line to touch screen by test man to complete
, time-consuming for this kind of test method, and test result is not intuitive, and test result reliability is poor.
Invention content
In order to solve the above-mentioned technical problem, one aspect of the present invention provides a kind of touch screen defect detecting system, described to touch
It includes that capacitance turns voltage module CV, resistance turns voltage module RV, analog-to-digital conversion module ADC and DSP＆MCU mould to touch screen detecting system
Block, the one end the analog-to-digital conversion module ADC are separately connected that capacitance turns voltage module CV and resistance turns voltage module RV, and the other end connects
The DSP＆MCU modules are connect, the capacitance turns voltage module CV for the several of sensor passage on touch screen to be arrived ground parasitism
Capacitance is converted into voltage, and resistance turns voltage module RV for converting the several of sensor passage on touch screen to ground short circuit resistance
For voltage, for controlling, capacitance turns voltage module CV to the DSP＆MCU modules, resistance turns voltage module RV and processing modulus turns
Change the mold the output result of block ADC.
It includes several first switches that the capacitance, which turns voltage module, and several first switches are separately connected touch screen sensing
The several of device channel arrive ground parasitic capacitance.
It includes several second switches that the resistance, which turns voltage module, and several second switches are separately connected touch screen sensing
The several of device channel arrive ground parasitic capacitance,
It includes several second switches, resistance Rp and power supply, the power supply output reference that the resistance, which turns voltage module RV,
Voltage VREF is connect with one end of resistance Rp, and one end of the other end of resistance Rp and second switch connects, second switch it is another
End is connect with to ground parasitic capacitance, and the resistance turns the pressure drop Vx that voltage module RV output signals are resistance Rp.
It includes several second switches, amplifier, resistance Rfb and power supply, the power supply that the resistance, which turns voltage module RV,
The first input end of output reference voltage VREF and amplifier connects, one end of the second switch and the second input of amplifier
End connection, the other end of second switch are connect with to ground parasitic capacitance, the second input of one end connection amplifier of resistance Rfb
End, the output end of the other end connection amplifier of resistance Rfb, it is the defeated of amplifier that the resistance, which turns voltage module RV output signals,
Go out voltage Vx.
Another aspect of the present invention additionally provides a kind of touch screen defect inspection method, the touch screen defect inspection method packet
Include resistance detection step：
It closes capacitance and turns voltage module CV, opening resistor turns voltage module RV；
Test sensor passage connection resistance turns voltage module RV, and non-test sensor passage ground connection turns voltage through resistance
Module RV conversions, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain sensor passage and other institutes
There is the parallel value of the short-circuit impedance of non-test sensor passage；
Test sensor passage connection resistance turns voltage module RV, and only there are one adjacent non-surveys for non-test sensor passage
Trying sensor passage draws ground, other non-test sensor passage floatings to turn voltage module RV conversions, analog-to-digital conversion module through resistance
ADC is sampled, DSP＆MCU resume modules and after calculating, and obtains test sensor passage and adjacent non-test sensor passage
Short-circuit impedance；
Judge touch panel sensor whether short circuit or micro-short circuit.
The touch screen defect inspection method further includes capacitance detecting step：
It opens capacitance and turns voltage module CV, close resistance and turn voltage module RV；
Non-test sensor passage ground connection, adds drive signal on test sensor passage, turns voltage module CV through capacitance
Conversion, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain the first capacitance of each sensor passage
Value；
Add drive signal on TCH test channel, opposite drive signal is added on non-test channel, turns voltage-mode through capacitance
Block C V conversion, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain the second of each sensor passage
Capacitance；
Analysis calculates the first capacitance and the second capacitance, judges sensor access with the presence or absence of open circuit.
The difference for calculating the first capacitance and the second capacitance judges sensor access with the presence or absence of open circuit according to difference.
When touch chip works normally, resistance turns voltage module RV and does not work, and only when carrying out defects detection, resistance turns
Voltage module RV can just start work.When normal work, DSP＆MCU modules can control the switch being connected with sensor passage, allow
Sensor passage is sequentially ingressed into capacitance and turns voltage module CV, and is obtained by subsequent analog-to-digital conversion module ADC and filtering each
The touch sensible data value of sensor passage.
Touch panel sensor channel due to process deviation, the problems such as yield caused defect main table in electrical characteristic
It is now：Different sensors channel（Or sensor passage with ground）Form short circuit or micro-short circuit；Sensor passage is opened a way.
The short circuit of different sensors channel, showing as interchannel, there are the resistance of a very little, generally in this case, quilt
Survey the output valve saturation that the electrical characteristic in channel can cause capacitance to turn voltage module CV and analog-to-digital conversion module ADC.At this point, passing through
The output initial data of touch chip is easy to judge that exception occurs in touch screen.There is micro-short circuit, table in different sensors channel
It is now that there are a larger resistance for interchannel, generally in this case, the output initial data performance of touch chip does not have
It is apparent abnormal.But touch screen performance can be caused in this case（Such as the linearity/coordinate precision/anti-noise jamming ability）Become
Difference.
The present invention mainly sends out order control touch chip using upper layer software (applications) and enters specific working condition；Touch chip
Data are obtained under particular job state and submit to upper layer software (applications) processing；Upper layer software (applications) is by handling data and being judged
The each channels touch screen sensor whether there is defect.The solution of the present invention need not additionally increase hardware cost, utilize touch-control
The detection of the defect of touch screen module can be completed in chip itself；The test process of the solution of the present invention is completed to realize automation,
Testing efficiency is high, and testing reliability is high.
The above-mentioned of the application and other features, aspect and advantage is more readily understood with reference to following detailed description.
Description of the drawings
Fig. 1 is the fundamental block diagram that the touch screen defect detecting system of the present invention is realized.
Fig. 2 is that the resistance of the present invention turns a kind of circuit diagrams of voltage module RV.
Fig. 3 is that the resistance of the present invention turns voltage module RV another kind circuit diagrams.
Fig. 4 is step 1 circuit diagram opened when capacitance turns voltage module CV
Fig. 5 is step 2 circuit diagram opened when capacitance turns voltage module CV
Fig. 6 is to open step 1 circuit diagram of capacitance when turning voltage module CV (there are the channels sensor to open in schematic diagram
Road)
Fig. 7 is to open step 2 circuit diagram of capacitance when turning voltage module CV (there are the channels sensor to open in schematic diagram
Road)
Specific implementation mode
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
Attached drawing, the technical solution of the embodiment of the present invention is clearly and completely described.Obviously, described embodiment is this hair
Bright a part of the embodiment, instead of all the embodiments.Based on described the embodiment of the present invention, ordinary skill
All other embodiment that personnel are obtained under the premise of without creative work, shall fall within the protection scope of the present invention.
Unless otherwise defined, the technical term or scientific term used herein should be in fields of the present invention and has
The ordinary meaning that the personage of general technical ability is understood.Used in present patent application specification and claims " the
One ", " second " and similar word are not offered as any sequence, quantity or importance, and are used only to distinguish different
Component part.Equally, the similar word such as "one" or " one " does not indicate that quantity limits yet, but indicates that there are at least one.
Such as the fundamental block diagram that the touch screen defect detecting system that Fig. 1 is the present invention is realized, which includes
Capacitance turns voltage module CV, resistance turns voltage module RV, analog-to-digital conversion module ADC and DSP＆MCU module, the analog-to-digital conversion mould
The one end block ADC is separately connected that capacitance turns voltage module CV and resistance turns voltage module RV, and the other end connects the DSP＆MCU moulds
Block, the capacitance turn voltage module CV for converting the several of sensor passage on touch screen to electricity to ground parasitic capacitance value
Pressure, resistance turns voltage module RV and is used to convert several short-circuit resistance values of sensor passage on touch screen to voltage, described
For controlling, capacitance turns voltage module CV to DSP＆MCU modules, resistance turns voltage module RV and handles analog-to-digital conversion module ADC's
Export result.It includes several first switches that the capacitance, which turns voltage module, and several first switches are separately connected touch screen biography
The several of sensor channel arrive ground parasitic capacitance.It includes several second switches that the resistance, which turns voltage module, and described several second open
Pass is separately connected the several of touch panel sensor channel and arrives ground parasitic capacitance,
Resistance as the present invention turns a kind of realization methods of voltage module RV, as shown in Fig. 2, resistance turns voltage module RV packets
Several second switches, resistance Rp and power supply are included, the power supply output reference voltage VREF is connect with one end of resistance Rp, resistance
The other end of Rp and one end of second switch connect, and the other end of second switch is connect with to ground parasitic capacitance, and the resistance turns
Voltage module RV output signals are the pressure drop Vx of resistance Rp.
If Fig. 2, Cm are tested channel to ground parasitic capacitance, Rx be the short circuit being tested between channel m and adjacency channel m+1
Resistance.Tested channel is pulled upward to voltage VREF by beginning Pm and resistance Rp, other non-test channels（Here Cm is only depicted
+1）Draw ground by switching.It is obtained according to simple electric resistance partial pressure relationship：
Resistance as the present invention turns a kind of realization methods of voltage module RV, as shown in figure 3, resistance turns voltage module RV packets
Include several second switches, amplifier, resistance Rfb and power supply, the first of the power supply output reference voltage VREF and amplifier
Input terminal connects, and the second input terminal of one end of the second switch and amplifier connects, the other end of second switch with to ground
Parasitic capacitance connects, the second input terminal of one end connection amplifier of resistance Rfb, the other end connection amplifier of resistance Rfb
Output end, the resistance turn the output voltage Vx that voltage module RV output signals are amplifier.
According to simple analysis, the Vx output voltages that can obtain Fig. 3 are：
Vx is directly connected to the input of analog-to-digital conversion module ADC, is readily available by the output result of analog-to-digital conversion module ADC
The input voltage value of analog-to-digital conversion module ADC can obtain the resistance value of Rx by the simple computation of upper layer software (applications).To
To the short-circuit impedance value of sensor passage m.
Another aspect of the present invention additionally provides a kind of touch screen defect inspection method, the touch screen defect inspection method packet
Include resistance detection step：
It closes capacitance and turns voltage module CV, opening resistor turns voltage module RV；
Test sensor passage connection resistance turns voltage module RV, and non-test sensor passage ground connection turns voltage through resistance
Module RV conversions, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain sensor passage and other institutes
There is the parallel value of the short-circuit impedance of non-test sensor passage；
Test sensor passage connection resistance turns voltage module RV, and only there are one adjacent non-surveys for non-test sensor passage
Trying sensor passage draws ground, other non-test sensor passage floatings to turn voltage module RV conversions, analog-to-digital conversion module through resistance
ADC is sampled, DSP＆MCU resume modules and after calculating, and obtains test sensor passage and adjacent non-test sensor passage
Short-circuit impedance；
Judge touch panel sensor whether short circuit or micro-short circuit.
As shown in Figure 2 or Figure 3, upper layer software (applications) sends out instruction touch chip is allowed to enter resistance test pattern, and chip passes n
The short-circuit resistance of sensor interchannel samples, and the data that sampling is obtained upload upper layer software (applications), and upper layer software (applications) is calculated each
Short-circuit resistance value between sensor passage.Under normal circumstances, the short-circuit resistance between sensor passage is infinity, if calculated
The resistance value arrived is obviously less than normal, then it is assumed that touch panel sensor short circuit or micro-short circuit.
When sensor passage m is tested, if it is to pass that ground, the Rx being calculated all are drawn in other all non-test channels
The parallel value of sensor channel m and the short-circuit impedance in other all non-test channels.When sensor passage m is tested, if its
His non-test channel only has m+1 to draw ground, other non-test channel floatings, then the Rx being calculated is between channel m and channel m+1
Short-circuit impedance.Ground is drawn to non-test channel successively and individually, measures the short-circuit impedance value that repeatedly can be obtained by interchannel two-by-two.
The touch screen defect inspection method further includes capacitance detecting step：
It opens capacitance and turns voltage module CV, close resistance and turn voltage module RV；
Non-test sensor passage ground connection, adds drive signal on test sensor passage, turns voltage module CV through capacitance
Conversion, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain the first capacitance of each sensor passage
Value；
Add drive signal on TCH test channel, opposite drive signal is added on non-test channel, turns voltage-mode through capacitance
Block C V conversion, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain the second of each sensor passage
Capacitance；
Analysis calculates the first capacitance and the second capacitance, judges sensor access with the presence or absence of open circuit.
Upper layer software (applications) control chip enters capacity measurement pattern, test point 3：1st step, non-test channel ground connection, is being surveyed
It pings and adds drive signal, through C V conversion, ADC samplings, DSP is filtered and software is analyzed after calculating, and obtains each channel
Capacitance；2nd step adds drive signal on TCH test channel, and opposite drive signal is added on non-test channel, turns through CV
It changes, ADC samplings, DSP is filtered and software is analyzed after calculating, and obtains another group of capacitance in each channel；3rd step, to this
Two groups of capacitance analyses calculate, and judge sensor access with the presence or absence of open circuit.
As shown in figure 4, when sensor passage i is tested, ground is all drawn in other non-test channels by switching.In figure, CV
CORE indicates that capacitance turns the core circuit of voltage module CV（Such as charge amplification module）.Ci indicates that sensor passage i's arrives ground
Parasitic capacitance, Cij indicate the parasitic capacitance between channel i and channel j.Fig. 4 tests to obtain capacitance：
As shown in figure 5, when sensor passage i is tested, non-test channel adds the drive signal opposite with TCH test channel.
Upper figure is tested to obtain capacitance：
Above-mentioned 2 test results are subtracted each other, obtained value is：
As shown in Fig. 6 Fig. 7, since channel i opens a way, drive signal cannot pass to Ci, while reverse drive signals cannot lead to
Parasitic capacitance passes to CV CORE between crossing sensor passage.Therefore it does not include Ci, Cij that test twice, which obtains capacitance,（j=1~n）, survey
Examination only include chip sensor channel i pin to screen body of touch screen trace portions parasitic capacitance（In above-mentioned circuit diagram
This partition capacitance is not drawn）And the parasitic capacitance between the cabling of different sensors channel（This is not drawn in above-mentioned circuit diagram
Partition capacitance）.Sensor passage cabling is generally relatively thin, therefore parasitic capacitance value is generally much smaller than touch screen between sensor passage cabling
Parasitic capacitance between sensor passage.Therefore the value that test result is subtracted each other twice when sensor passage open circuit is logical much smaller than sensor
Value when road is normal.Upper layer software (applications) can judge whether sensor access opens a way by data preparation.
The foregoing is only a preferred embodiment of the present invention, is not intended to limit the scope of the present invention.It is every
The equivalent changes and modifications done according to the content of present invention are encompassed by the scope of the claims of the present invention.
Claims (2)
1. a kind of detection touch screen defect inspection method of touch screen defect detecting system, which is characterized in that the touch screen inspection
Examining system includes that capacitance turns voltage module CV, resistance turns voltage module RV, analog-to-digital conversion module ADC and DSP＆MCU module, described
The one end analog-to-digital conversion module ADC is separately connected that capacitance turns voltage module CV and resistance turns voltage module RV, described in other end connection
DSP＆MCU modules, the capacitance turn voltage module CV for turning the several of sensor passage on touch screen to ground parasitic capacitance
Voltage is turned to, resistance turns voltage module RV and is used to convert several short-circuit resistances of sensor passage on touch screen to voltage, institute
Stating DSP＆MCU modules, capacitance turns voltage module CV, resistance turns voltage module RV and processing analog-to-digital conversion module ADC for controlling
Output as a result, it includes several second switches that the resistance, which turns voltage module, several second switches are separately connected touch screen
The several of sensor passage arrive ground parasitic capacitance, and the touch screen defect inspection method includes resistance detection step：
It closes capacitance and turns voltage module CV, opening resistor turns voltage module RV；
Test sensor passage connection resistance turns voltage module RV, and non-test sensor passage ground connection turns voltage module through resistance
RV is converted, analog-to-digital conversion module ADC samplings, and after DSP＆MCU resume modules and calculating, it is all non-with other to obtain sensor passage
Test the parallel value of the short-circuit impedance of sensor passage；
Test sensor passage connection resistance turns voltage module RV, and only there are one adjacent non-test biographies for non-test sensor passage
Ground, other non-test sensor passage floatings is drawn to turn voltage module RV conversions, analog-to-digital conversion module ADC through resistance in sensor channel
After sampling, DSP＆MCU resume modules and calculating, the short circuit of test sensor passage and adjacent non-test sensor passage is obtained
Impedance；
Judge touch panel sensor whether short circuit or micro-short circuit；
The touch screen defect inspection method further includes capacitance detecting step：
It opens capacitance and turns voltage module CV, close resistance and turn voltage module RV；
Non-test sensor passage ground connection, adds drive signal on test sensor passage, turns voltage module C V conversion through capacitance,
Analog-to-digital conversion module ADC is sampled, and after DSP＆MCU resume modules and calculating, obtains the first capacitance of each sensor passage；
Add drive signal on TCH test channel, opposite drive signal is added on non-test channel, turns voltage module CV through capacitance
Conversion, analog-to-digital conversion module ADC are sampled, and after DSP＆MCU resume modules and calculating, obtain the second capacitance of each sensor passage
Value；
Analysis calculates the first capacitance and the second capacitance, judges sensor access with the presence or absence of open circuit.
2. detection touch screen defect inspection method according to claim 1, which is characterized in that calculate the first capacitance and the
The difference of two capacitances judges sensor access with the presence or absence of open circuit according to difference.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610098339.9A CN105676053B (en) | 2016-02-23 | 2016-02-23 | A kind of touch screen defect detecting system |
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| CN201610098339.9A CN105676053B (en) | 2016-02-23 | 2016-02-23 | A kind of touch screen defect detecting system |
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| CN105676053B true CN105676053B (en) | 2018-09-25 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110678766B (en) * | 2018-03-14 | 2021-10-26 | 深圳市汇顶科技股份有限公司 | Detection method of induction module, touch chip, touch screen and assembly method of touch screen |
| CN110487803A (en) * | 2019-08-20 | 2019-11-22 | Oppo（重庆）智能科技有限公司 | The defect inspection method and device of infrared light-emitting component |
| CN113671258A (en) * | 2021-08-19 | 2021-11-19 | 苏州瀚瑞微电子有限公司 | Touch screen channel short-circuit resistance measuring circuit and method |
| CN113740771A (en) * | 2021-09-06 | 2021-12-03 | 合肥松豪电子科技有限公司 | Method for detecting open circuit of capacitive screen body channel |
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