CN105577300A - Test method and test equipment - Google Patents
Test method and test equipment Download PDFInfo
- Publication number
- CN105577300A CN105577300A CN201610017986.2A CN201610017986A CN105577300A CN 105577300 A CN105577300 A CN 105577300A CN 201610017986 A CN201610017986 A CN 201610017986A CN 105577300 A CN105577300 A CN 105577300A
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- communication protocol
- channel signal
- under test
- frequency
- equipment
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/336—Signal-to-interference ratio [SIR] or carrier-to-interference ratio [CIR]
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- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
Abstract
The invention provides a test method. The test method comprises the following steps: transmitting a command to equipment under test according to a communication protocol; and acquiring a side channel signal executed by the equipment under test in response to the command during operation, wherein the communication protocol is configured to reduce interferences on the side channel signal. The invention further provides test equipment.
Description
Technical field
Present invention relates in general to information security field, relate to a kind of method of testing and the testing equipment that improve side channel signal signal to noise ratio particularly.
Background technology
The general principle of side channel (also claim SideChannel or limit channel) analytical technology be chip or equipment work time can consume certain energy and produce the physical signallings such as electromagnetic radiation, thermal radiation, light radiation, these signals are referred to as side channel signal, there is certain correlation in operating state and the handled data of side channel signal and chip or equipment, analyst is according to the feature Modling model of chip or equipment, sensitive information is obtained, the information such as the key of such as chip or equipment or operating state by the correlation of analysis side channel signal and model.
Summary of the invention
One aspect of the present invention provides a kind of method of testing, comprising: send order according to communication protocol to equipment under test; And gather the side channel signal of equipment under test during the operation performed in response to described order, wherein: described communication protocol is configured to the interference reducing to cause described side channel signal.By using such method of testing, effectively can eliminate the interference of communication protocol operations offside channel signal, improving the signal to noise ratio of side channel signal, thus improve the success rate of side Multiple Channel Analysis.
Another aspect provides a kind of testing equipment, comprising: for sending the device of order to equipment under test according to communication protocol; And for gathering the device of the side channel signal of equipment under test during the operation performed in response to described order, wherein: described communication protocol is configured to the interference reducing to cause described side channel signal.By using such testing equipment, effectively can eliminate the interference of communication protocol operations offside channel signal, improving the signal to noise ratio of side channel signal, thus improve the success rate of side Multiple Channel Analysis.
Accompanying drawing explanation
In order to more completely understand the present invention and advantage thereof, referring now to following description by reference to the accompanying drawings, wherein:
Fig. 1 shows the side channel signal constituent that the method testing equipment that do not adopt the present invention to propose collects.
Fig. 2 shows the general communication process between testing equipment and equipment under test.
Fig. 3 shows and performs according to the elimination communication protocol of the embodiment of the present invention noise thus the implementation of raising side channel signal signal to noise ratio that cause.
Fig. 4 shows the process communicated by the delay parameter and carrying out changing communication protocol according to the embodiment of the present invention.
Embodiment
According to by reference to the accompanying drawings to the following detailed description of exemplary embodiment of the present, other side of the present invention, advantage and prominent features will become apparent for those skilled in the art.
In this manual, the following various embodiments for describing the principle of the invention just illustrate, should not be interpreted as by any way limiting scope of invention.With reference to the following description of accompanying drawing for helping complete understanding by the exemplary embodiment of the present invention of claim and equivalents thereof.Following description comprises multiple detail and helps understand, but these details should think it is only exemplary.Therefore, those of ordinary skill in the art it should be understood that when not deviating from scope and spirit of the present invention, can carry out multiple change and amendment to embodiment described herein.In addition, for clarity and brevity, the description of known function and structure is eliminated.In addition, run through accompanying drawing, same reference numbers is used for identity function and operation.
Briefly side Multiple Channel Analysis technology is described with reference to figure 1.Fig. 1 shows the side channel signal gatherer process to crypto chip.As shown in Figure 1, testing equipment 110 adopts specific communication protocol to crypto chip 120 transmitting order to lower levels and data, the communication module 121 of crypto chip 120 sends encryption and decryption data data by after protocol analysis to crypto module 122, crypto module 122 utilizes internal key key to carry out encryption and decryption to data, by communication module 121, encryption and decryption result is returned to testing equipment 110 again, testing equipment gathers the side channel signal of crypto chip during crypto module encryption and decryption.
As shown in Figure 1, the side channel signal composition of the crypto chip 120 that collects of testing equipment 110 can be expressed as:
S
sc＝S
com+S
crypto+S
noise(1)
Wherein, S
scfor side channel signal, S that testing equipment 110 collects
cryptofor side channel signal, S that crypto module 122 produces
comfor side channel signal, S that communication module 121 produces
noisefor the side channel signal that other functional modules and various environmental noise produce.
Analyst sets up the side channel model M of crypto module 122 to the understanding of crypto module 122 according to it
target, there is the linear or linear approximate relationship as shown in formula (2) in the side channel signal that crypto module 122 produces and model.
S
crypto∝M
target(data，key)(2)
After collecting the side channel signal of some, analyst supposes that the key in chip is key
hypoand analysis side channel signal S
scand model M
target(data, key
hypo) correlation Cov (S
sc, M
target(data, key
hypo)), if hypothesis key key
hypothen correlation identical with the true key key in chip is maximum, and analyst can recover key key according to correlation size.
The present inventor notices, due to S
sccomposition also comprise S
comand S
noiseif, S
comexcessive to such an extent as to exceed model M
targetresolution capability, then analyst cannot recover key information.If some parameter or the flow process of passing through control communication protocol are eliminated or reduce S
comto S
scimpact, the success rate of analysis can be improved.
The present inventor finds under some communication protocol (such as, usb communication agreement), and the side channel signal of chip or equipment can be subject to communication protocol operations interference, causes side channel signal generation deformation.The reason producing this interference is, chip or equipment can consume certain energy when processing the data relevant with agreement and offside channel signal has an impact, as fruit chip or equipment receive protocol data or instruction (as query statement) when carrying out sensitive data operation (as encryption and decryption operation) then can processing protocol data or instruction while carrying out sensitive data operation, cause the side channel signal side channel signal that operates at original sensitive data superposing protocol processes, if the side channel signal of protocol processes exceedes certain threshold value, side Multiple Channel Analysis failure can be caused.
In order to cancellation protocol operates the side channel signal interference caused, the present invention proposes a kind of method of testing, and the method comprises according to communication protocol to equipment under test transmission order; And gathering the side channel signal of equipment under test during the operation performed in response to described order, wherein said communication protocol is configured to the interference reducing to cause described side channel signal.
Further, the present inventor proposes do not violating on communication protocol rule-based approach, and the interference that communication protocol causes is eliminated or reduced to some parameter of amendment communication protocol and/or flow process.Its basic thought is: in the scope that communication protocol allows, changing some parameter (including but not limited to clock frequency, stand-by period) or the flow process (include but not limited to increase and wait for flow process) of agreement, making not need when carrying out sensitive operation to process and protocol-dependent operation or the impact reducing protocol operation at chip or equipment simultaneously.
The general execution process of communication protocol can be undertaken by Fig. 2, and testing equipment or controller are by data/address bus to chip or equipment transmitting order to lower levels 1, and chip or equipment are to starting after command analysis to perform related command and return state busy 2.Testing equipment receive state busy after send status poll instruction 3 and inquire about chip or whether equipment completes order.Chip judges after receiving status poll instruction 3 whether order performs end, and as do not terminated then return state busy 4, otherwise return state completes or data 5.Testing equipment or controller can constantly issue status inquiry command 3 until chip or equipment return completion status or data after receiving state busy 4.In Fig. 2, the grey operation of chip or equipment side can produce interference by offside channel signal.If the command execution time is longer, testing equipment or controller repeatedly communicate with can exist between chip or equipment, interference side channel signal.
According to following one or more embodiment of the present invention, do not affecting on the basis of communication protocol functions, by changing some parameter (including but not limited to stand-by period, clock frequency) of communication protocol or performing flow process, eliminate or reduce the impact of communication protocol offside channel signal, as shown in Figure 3.In figure 3, communicated by the communication protocol of amendment between testing equipment with equipment under test.With the function of the equipment indicated with same reference numerals in Fig. 2 and parts with to operate also be similar, repeat no more here.
One embodiment of the present of invention are included in testing equipment or controller and add delay strategy, as shown in Figure 4.Testing equipment or controller to chip under test or equipment transmitting order to lower levels, record order issues and result return between time interval T
interval, this time interval, α * T waited for by testing equipment or controller after transmitting order to lower levels as the pre-estimation command execution time
intervalafter issue querying command (α is usually between 0.8 ~ 2) again, therefore testing equipment or controller can not to its transmitting order to lower levels during fill order for chip or equipment, thus cancellation protocol operates the interference caused largely.
Another embodiment of the present invention comprises the communication process changing communication protocol, makes chip or equipment not need to respond any traffic operation during fill order.Such as, change communication process, testing equipment or controller enter wait state after chip or equipment send instruction, do not send any instruction comprising query statement to chip or equipment.After chip or equipment return execution result, testing equipment or controller issue subsequent instructions again.
Another embodiment of the present invention comprises the clock frequency changing communication protocol, makes the frequency of communication protocol frequency and chip or equipment there is not linear relationship.Particularly, change the frequency of communication protocol, the frequency of communication protocol frequency and equipment under test is not existed, and linear relationship can comprise the frequency shift of communication protocol is the frequency that its order harmonic frequencies is not equal to equipment under test.Such as, the operating frequency of chip or equipment is 36MHz, if the communication signal frequency of communication protocol is 12MHz, then the triple-frequency harmonics of signal of communication is similarly 36MHz, and the triple-frequency harmonics of signal of communication can cause interference to effective side channel signal at 36MHz place.As conditions permit, be 11MHz by the frequency shift of signal of communication, the triple-frequency harmonics that such communication protocol produces is 33MHz, four-time harmonic is 44MHz, avoid the operating frequency 36MHz of chip or equipment, and the minimum identical high order harmonic component of 11MHz with 36MHz is 396MHz, utilizes comb filter by the high order harmonic component filtering of 11MHz and integral multiple thereof, greatly can reduce the interference of communication protocol offside channel signal.
According to embodiments of the invention, provide a kind of testing equipment, comprising: for sending the device of order to equipment under test according to communication protocol; And for gathering the device of the side channel signal of equipment under test during the operation performed in response to described order, wherein: described communication protocol is configured to the interference reducing to cause described side channel signal.Such testing equipment has the preferred embodiment similar or corresponding with above-mentioned method of testing and advantage, does not repeat them here.
Various function of the present invention and modules/devices can realize by there being the electronic equipment of computing capability (such as CPU, all-purpose computer etc.) to perform the software comprising computer instruction.Now, above-mentioned each modules/devices is the functional module realizing corresponding function, and can comprise the submodule of the corresponding steps performed described in specification.Performing such instruction makes electronic equipment be configured to perform according to above-mentioned operations of the present invention.Each modules/devices of the present invention can realize in an electronic equipment, also can realize in distinct electronic apparatuses.A modules/devices or multiple identical or different modules/devices can be realized in an electronic equipment.These softwares can store in a computer-readable storage medium.Computer-readable recording medium stores one or more program (software module), described one or more program comprises instruction, when the one or more processors in electronic equipment perform described instruction, described instruction makes electronic equipment perform method of the present invention.
These softwares can be stored as the form (memory device such as such as similar ROM) of volatile memory or Nonvolatile memory devices, no matter be erasable or rewritable, or be stored as the form (such as RAM, memory chip, equipment or integrated circuit) of memory, or be stored in (such as, CD, DVD, disk or tape etc.) on light computer-readable recording medium or magnetic computer-readable recording medium.It should be appreciated that memory device and storage medium are the embodiments being suitable for the machine-readable storage device storing one or more program, a described program or multiple program comprise instruction, when executed, realize embodiments of the invention.Embodiment provides program and stores the machine-readable storage device of this program, and described program comprises the code for realizing device described in any one claim of the present invention or method.In addition, can transmit these programs via any medium (such as, the signal of communication carried via wired connection or wireless connections) incoming call, multiple embodiment suitably comprises these programs.
Each modules/devices of the present invention can also use the system on such as field programmable gate array (FPGA), programmable logic array (PLA), SOC (system on a chip), substrate, system in encapsulation, application-specific integrated circuit (ASIC) (ASIC) or can realize for the hardware such as any other rational method or firmware circuit being carried out to integrated or encapsulation, or realizes with the appropriately combined of software, hardware and firmware three kinds of implementations.When realizing in such ways, use software, hardware and/or firmware be programmed or be designed to perform according to corresponding said method of the present invention, step and/or function.Those skilled in the art can one or more according to actual needs suitably by these systems and modules/devices, or a part wherein or multiple part use different above-mentioned implementations to realize.These implementations all fall into protection scope of the present invention.
According to embodiments of the invention, do not affecting on the basis of communication protocol functions, change some parameter (including but not limited to stand-by period, clock frequency) of communication protocol or perform flow process, eliminate or reduce the impact of communication protocol offside channel signal, to improve side channel signal signal to noise ratio, increase the success rate analyzed.
Although illustrate and describe the present invention with reference to certain exemplary embodiments of the present invention, but those skilled in the art should understand that, when not deviating from the spirit and scope of the present invention of claims and equivalents thereof, the multiple change in form and details can be carried out to the present invention.Therefore, scope of the present invention should not be limited to above-described embodiment, but should not only be determined by claims, is also limited by the equivalent of claims.
Claims (10)
1. a method of testing, comprising:
Order is sent to equipment under test according to communication protocol; And
Gather the side channel signal of equipment under test during the operation performed in response to described order, wherein:
Described communication protocol is configured to the interference reducing to cause described side channel signal.
2. method according to claim 1, also comprises the parameter and/or flow process of revising described communication protocol.
3. method according to claim 2, wherein, parameter and/or the flow process of revising described communication protocol comprise:
The time delay sent between described order and transmission subsequent commands is set to α * T
interval, wherein:
T
intervalsend described order from testing equipment to return time execution result to equipment under test;
α is the value between 0.8 ~ 2.
4. method according to claim 3, wherein, between described time delay, testing equipment does not send any order or data to equipment under test.
5. method according to claim 2, wherein, parameter and/or the flow process of revising described communication protocol comprise:
Testing equipment, after sending described order to equipment under test, enters wait state, until equipment under test issues subsequent commands after returning execution result again.
6. method according to claim 2, wherein, parameter and/or the flow process of revising described communication protocol comprise:
Change the frequency of communication protocol, make the frequency of communication protocol frequency and equipment under test there is not linear relationship.
7. method according to claim 6, wherein, changes the frequency of communication protocol, makes the frequency of communication protocol frequency and equipment under test there is not linear relationship and comprise:
Be the frequency that its order harmonic frequencies is not equal to equipment under test by the frequency shift of communication protocol.
8. method according to claim 6, also comprises:
When gathering side channel signal, from the channel signal of side, remove the signal of the frequency of communication protocol and the order harmonic frequencies of integral multiple thereof.
9. method according to claim 8, wherein, the signal removing the frequency of communication protocol and the order harmonic frequencies of integral multiple thereof from the channel signal of side comprises the signal using comb filter to remove the frequency of communication protocol and the order harmonic frequencies of integral multiple thereof from the channel signal of side.
10. a testing equipment, comprising:
For sending the device of order to equipment under test according to communication protocol; And
For gathering the device of the side channel signal of equipment under test during the operation performed in response to described order, wherein:
Described communication protocol is configured to the interference reducing to cause described side channel signal.
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| CN201610017986.2A CN105577300B (en) | 2016-01-12 | 2016-01-12 | Test method and test equipment |
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| CN201610017986.2A CN105577300B (en) | 2016-01-12 | 2016-01-12 | Test method and test equipment |
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| CN105577300B CN105577300B (en) | 2018-06-26 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108023785A (en) * | 2016-11-04 | 2018-05-11 | 罗德施瓦兹两合股份有限公司 | Communication equipment and test method |
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| EP2711859A1 (en) * | 2012-09-19 | 2014-03-26 | Nuvoton Technology Corporation | Secured computing system with asynchronous authentication |
| CN104732076A (en) * | 2015-03-12 | 2015-06-24 | 成都信息工程学院 | Method for extracting energy trace characteristic of side channel |
| CN105095750A (en) * | 2014-05-15 | 2015-11-25 | 国民技术股份有限公司 | Method and device for analyzing attack on smart card chip |
-
2016
- 2016-01-12 CN CN201610017986.2A patent/CN105577300B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2711859A1 (en) * | 2012-09-19 | 2014-03-26 | Nuvoton Technology Corporation | Secured computing system with asynchronous authentication |
| CN105095750A (en) * | 2014-05-15 | 2015-11-25 | 国民技术股份有限公司 | Method and device for analyzing attack on smart card chip |
| CN104732076A (en) * | 2015-03-12 | 2015-06-24 | 成都信息工程学院 | Method for extracting energy trace characteristic of side channel |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108023785A (en) * | 2016-11-04 | 2018-05-11 | 罗德施瓦兹两合股份有限公司 | Communication equipment and test method |
| CN108023785B (en) * | 2016-11-04 | 2022-09-06 | 罗德施瓦兹两合股份有限公司 | Communication apparatus and test method |
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| CN105577300B (en) | 2018-06-26 |
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