CN105547945A - Discriminating method for particles in interference particle imaging system sampling area - Google Patents
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- CN105547945A CN105547945A CN201610022105.6A CN201610022105A CN105547945A CN 105547945 A CN105547945 A CN 105547945A CN 201610022105 A CN201610022105 A CN 201610022105A CN 105547945 A CN105547945 A CN 105547945A
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- 239000002245 particle Substances 0.000 title claims abstract description 117
- 238000003384 imaging method Methods 0.000 title claims abstract description 37
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000005070 sampling Methods 0.000 title claims abstract description 16
- 238000005286 illumination Methods 0.000 claims abstract description 7
- 238000004364 calculation method Methods 0.000 claims abstract description 6
- 238000002474 experimental method Methods 0.000 claims abstract description 4
- 230000009897 systematic effect Effects 0.000 claims description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 10
- 239000008367 deionised water Substances 0.000 claims description 9
- 229910021641 deionized water Inorganic materials 0.000 claims description 9
- 239000004065 semiconductor Substances 0.000 claims description 7
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 5
- 238000005259 measurement Methods 0.000 abstract description 3
- 210000004027 cell Anatomy 0.000 description 16
- 238000005516 engineering process Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229920003053 polystyrene-divinylbenzene Polymers 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0227—Investigating particle size or size distribution by optical means using imaging; using holography
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Abstract
The invention discloses a discriminating method which is used for particles in an interference particle imaging system sampling area and applied to an interference particle imaging system, and belongs to the technical field of optical measurement. The method comprises the steps that the size range phit_min-phit_max of an interference fringe pattern in a flaky laser beam illumination area is derived according to an interference fringe pattern size calculation formula; an interference particle imaging experiment system is built, an interference particle fringe image is collected at the position, g away from the focal length, of the system, the actual interference fringe pattern size phie is obtained by processing the image, whether the particles are in the sampling area or not is judged, if phit_min<phi e<phit_max, the particles are in the sampling area, and otherwise, the particles are not in the sampling area; multiple images are collected, whether all the particles are in the sampling area or not is judged, experimental results are recorded, and experimental data is counted; particle field information such as the particle number density is calculated according to the experimental results. For judging whether the particles are in the interference particle imaging system sampling area, the novel method is supplied, and a strong basis is supplied to measurement of the particle concentration and the particle number density.
Description
Technical field
The present invention relates to and a kind ofly differentiate the method for particle whether in out of focus imaging system sample region, be particularly applied to and interfere particle imaging system, belong to field of optical measuring technologies.
Background technology
Interfere particle imaging (IPI) technology to be widely used in Particle Field to measure, its ultimate principle is sheet laser beam irradiation spheroidal particle, particle generation scattering, particle out of focus image planes form interference fringe picture, the positional information of particle can being obtained by the center measuring interference fringe pattern, can particle size information be obtained by calculating interference fringe frequency.IPI system is out of focus imaging system, and image planes are positioned at out of focus position, and the point namely on object plane all can not become sharply defined image in image planes; IPI system is object plane inclination imaging system, on object plane, the enlargement ratio of diverse location is different, according to ccd image sensor as image device, the sample area of IPI system is sheet laser beam field of illumination and the object space areas imaging intersection area limited by CCD target surface size.
Particle Field is measured, the concentration, population density etc. of particle are very important information, and want to measure the sample area that first these information need to know particle, then particle is judged whether in sample region, because the particle not only had in sample region of imaging on CCD target surface, the particle outside sample region also may imaging on CCD target surface by stray light.So differentiate that the method for particle whether in IPI systematic sampling district is most important, up to the present, differentiate that the method for particle whether in IPI systematic sampling district is not also suggested.
Summary of the invention
The present invention proposes a kind ofly to differentiate particle whether in the method for interfering particle imaging systematic sampling region, utilize this method can distinguish the sample region in the particle outside sample region.The concentration that this invention is particle in calculating Particle Field, population density provide strong foundation.
In the interference particle imaging systematic sampling district that the present invention proposes, the step of the method for discrimination of particle is as follows:
1st, theory deduction sheet laser beam field of illumination internal interference bar graph range of size Φ
t_min~ Φ
t_max.Interference fringe picture Size calculation formula is as follows
Wherein, g represents out of focus distance, and w represents systematic collection angle, and β represents enlargement ratio, and Δ x represents ccd image sensor pixel dimension.
Because the enlargement ratio of diverse location on object plane is different, so the interference fringe picture size that on CCD target surface, diverse location is formed is different.
2nd, build interference particle imaging experimental system, gather interference particle stripe pattern in a certain system out of focus apart from g place, process image obtains actual interference fringe picture size Φ
e.
Experimental system is made up of semiconductor laser, spatial filter, collimation lens, post lens combination, standard spheroidal particle, imaging lens and the ccd image sensor be placed in sample cell deionized water.The light that semiconductor laser sends passes through spatial filter, remove stray light, expand simultaneously, then through collimation lens, divergent beams are collimated into directional light, parallel beam is through post lens combination, be circular light beam one dimension compression by cross section, be compressed into sheet laser beam irradiation Particle Field, particle is placed in the deionized water in sample cell.Use imaging lens to collect particle scattering light, utilize the ccd image sensor be positioned in out of focus image planes to gather particle interference fringe picture.
3rd, according to the range of size of diverse location place interference fringe picture on CCD target surface, particle is judged whether in sample region, if Φ
t_min< Φ
e< Φ
t_max, then particle is in sample region, otherwise particle is not in sample region.
4th, gather multiple image, repeat the 2nd step to the 3rd step, judge each particle whether in sample region, record experimental result, statistical experiment data.
5th, experimentally result, calculates the information of the particles field, such as population density.
Advantage of the present invention and good effect:
The present invention differentiates whether particle provides a kind of new method, for the concentration of particle, the measurement of population density provide strong foundation in interference particle imaging systematic sampling district.
Accompanying drawing explanation
Fig. 1 is algorithm flow chart of the present invention.
Fig. 2 is imaging system structural drawing of the present invention, wherein: 1 is the standard spheroidal particle be placed in sample cell in deionized water, and 2 is imaging lens, and 3 is ccd image sensors.Sample cell has 4 end faces except bottom surface, and those two end faces that sample cell surface area is large are parallel to camera lens interarea and CCD image planes, and standard spheroidal particle is placed in the deionized water in sample cell.Sheet laser beam irradiation reflects through air/glass-water termination on the end face that sample cell surface area is little, and the laser beam after refraction favours imaging system optical axis.Wherein, θ
irepresent that light is radiated at the incident angle on sample cell, θ
trepresent that light is radiated at the refraction angle on sample cell, τ represents that the scattered light of sheet laser beam central plane and optical axes crosspoint O place particle is radiated at the incident angle on sample cell, and τ ' represents that the scattered light of O place particle is radiated at the refraction angle on sample cell, θ
wrepresent the scattering angle in deionized water, θ
airrepresent of equal value to the scattering angle in air.
Fig. 3 is experimental provision of the present invention.Wherein: 1 is the standard spheroidal particle be placed in sample cell in deionized water, and 2 is imaging lens, and 3 is ccd image sensors, and 4 is semiconductor lasers, and 5 is spatial filters, and 6 is collimation lenses, and 7 is post lens combination.
Fig. 4 is interference fringe image result, wherein: (a) interferes particle stripe pattern; B () is particle mask images; C () is interference fringe image edge extracting result; D () is particle mask artwork edge extracting result; E () is the result that (c) and (d) do computing cross-correlation; F () interferes particle stripe pattern positioning result.
Fig. 5 theory that to be interference fringe picture size distribute at CCD target surface diverse location and experimental result, the range of size of particle interference fringe picture in sheet laser beam field of illumination that Range Representation theory deduction wherein between solid line and dotted line obtains, round dot represents experimental result.
Embodiment
Embodiment 1:
The present invention interferes the method for discrimination process flow diagram of particle in particle imaging systematic sampling district as shown in Figure 1.
The first, first theory deduction sheet laser beam field of illumination internal interference bar graph range of size Φ
t_min~ Φ
t_max, interference fringe picture Size calculation formula is as follows
Wherein, g represents out of focus distance, and w represents systematic collection angle, and β represents enlargement ratio, and Δ x represents ccd image sensor pixel dimension;
The second, interference particle imaging experimental system is built
Fig. 3 is the experimental system of this invention, and experimental system is made up of semiconductor laser, spatial filter, collimation lens, post lens combination, standard spheroidal particle, imaging lens and the ccd image sensor be placed in sample cell deionized water;
Wherein: the wavelength X=532nm of semiconductor laser 4, peak power P
max=2W.The light pencil that laser instrument 4 sends is expanded by spatial filter 5 and removes stray light, and the divergent beams after expanding collimate the directional light for diameter 15mm through the collimation lens 6 that focal length is 200mm.Directional light is by the sheet laser beam of post lens combination 7 boil down to thickness c=0.6mm, and wherein, the focal length of projection lens is f
1=500mm, the focal length of concave cylindrical lens is f
2=-20mm, compression factor is 25 times.Sheet laser beam irradiation Particle Field, particle is put in sample cell, and two end faces that sample cell surface area is large are parallel to camera lens interarea and CCD image planes, as shown in Figure 2.Select sheet laser beam and imaging system optical axis included angle θ
w=60 °, of equal value to the scatteringangleθ in air
air=72 °, due to refractive effect, the sheet laser beam thickness entering sample cell becomes c'=0.7mm.Imaging lens 2 is adopted to collect particle scattering light, then imaging on ccd image sensor 3.Imaging lens is PENTAX50mmf/1.4DTV tight shot.Ccd image sensor is the model that PointGrey company produces is 14 ccd image sensors of GRAS-14S5M-C, and pixel count is 1384pixels × 1036pixels, and Pixel size is 6.45 μm × 6.45 μm, and image acquisition rates is 15 frames per second.Ccd image sensor 3 is placed on one dimension displacement platform, and for adjusting image planes position, the minimum precision of translation stage is 0.01mm.Testing standard particle used is particle diameter d
pthe standard spheroidal particle of=45 μm, composition is polystyrene-divinylbenzene emulsion particle, refractive index n
2=1.57.In experimentation, beam plane and imaging lens position are fixed, and namely object distance is constant.Ccd image sensor 3 changes image distance by mobile one dimension displacement platform, and different out of focus image planes receive particle interference fringe picture.
Three, then according to the interference particle imaging experimental system that second step is built, gather interference particle stripe pattern in system out of focus apart from g place, process image obtains actual interference fringe picture size Φ
e.As shown in Figure 4, (a) is that backward out of focus is apart from g=1.68mm, center enlargement ratio β
owhen=0.1997, intercept d in CCD target surface middle position 960pixels × 960pixels visual field
pthe interference fringe picture of=45 μm of sparse Particle Field.The interference particle stripe pattern collected and particle mask images are extracted edge, as shown in Fig. 4 (a)-(d), then the image behind extraction edge is carried out related calculation, as shown in Fig. 4 (e), significantly can find out the peak that 3 correlations are larger in figure, be the center of particle interference fringe picture, thus extract the centre coordinate of particle, as shown in Fig. 4 (f), in figure, mark the centre coordinate of interference fringe picture with round dot.Then the interference fringe image of single particle is extracted according to the centre coordinate of each particle.Finally respectively each interference fringe image is processed, carry out related calculation with image after a series of particle mask plate edge extracting, using the size of particle mask plate size maximum for correlation as out of focus interference fringe picture, the size of the out of focus interference fringe picture of 1,2, No. 3 particle that can identify in Fig. 4 (f) is respectively 157pix, 159pix, 163pix.According to the range of size of diverse location place interference fringe picture on CCD target surface, judge this particle whether in sample region, if Φ
t_min< Φ
e< Φ
t_max, then particle is in sample region, otherwise particle is not in sample region.In this system, Φ
t_min=0.0278x+140.3224, Φ
t_max=0.0278x+143.0792,1,2, No. 3 particle position x on CCD target surface is respectively 520pix, 643pix, 800pix, through judging that 1,2, No. 3 particle is all in sample region.
Four, gather multiple image, repeat above-mentioned steps, record experimental result, statistical experiment data, draw the distribution situation of out of focus bar graph size at CCD target surface diverse location.And then experimentally result, calculate the information of the particles field.
It is the result to the interference fringe image process of testing 93 particles in 56 pictures that collect shown in Fig. 5.The range of size of particle interference fringe picture in sheet laser beam field of illumination that Range Representation theory deduction between solid line and dotted line obtains, t=-0.35mm represents the most left side of sheet laser beam, t=0.35mm represents the most right side of sheet laser beam, round dot represents experimental result, visible experimental result and theoretical analysis match, have 80 particles in sample region in 93 particles now measured, 13 particles are not in sample region.The sampling volume of this IPI system known is 555.1mm
3, so the population density of this IPI system is (80/56)/555.1=0.00258mm
-3.
Claims (2)
1. interfere a method of discrimination for particle in particle imaging systematic sampling district, it is characterized in that the step of the method is as follows:
1st, theory deduction sheet laser beam field of illumination internal interference bar graph range of size Φ
t_min~ Φ
t_max, interference fringe picture Size calculation formula is as follows
Wherein, g represents out of focus distance, and w represents systematic collection angle, and β represents enlargement ratio, and Δ x represents ccd image sensor pixel dimension;
2nd, build interference particle imaging experimental system, gather interference particle stripe pattern in system out of focus apart from g place, process image obtains actual interference fringe picture size Φ
e;
3rd, according to the range of size of diverse location place interference fringe picture on CCD target surface, particle is judged whether in sample region, if Φ
t_min< Φ
e< Φ
t_max, then particle is in sample region, otherwise particle is not in sample region;
4th, gather multiple image, repeat the 2nd step to the 3rd step, judge each particle whether in sample region, record experimental result, statistical experiment data;
5th, experimentally result, calculates the information of the particles field.
2. method according to claim 1, is characterized in that described experimental system is made up of semiconductor laser, spatial filter, collimation lens, post lens combination, standard spheroidal particle, imaging lens and the ccd image sensor be placed in sample cell deionized water; The light that semiconductor laser sends passes through spatial filter, remove stray light, expand simultaneously, then through collimation lens, divergent beams are collimated into directional light, parallel beam is through post lens combination, be circular light beam one dimension compression by cross section, be compressed into sheet laser beam irradiation Particle Field, particle is placed in the deionized water in sample cell; Use imaging lens to collect particle scattering light, utilize the ccd image sensor be positioned in out of focus image planes to gather particle interference fringe picture.
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Cited By (5)
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| CN106841036A (en) * | 2017-02-14 | 2017-06-13 | 天津大学 | The optimal disposing way of sample cell in laser interference imaging system |
| CN107091820A (en) * | 2017-06-27 | 2017-08-25 | 成都上甲光电科技有限公司 | Laser scattering type water turbidity measuring instrument |
| EP3260841A1 (en) * | 2016-06-22 | 2017-12-27 | Uwater Oy | Detecting microscopic objects in fluids |
| CN109060619A (en) * | 2018-08-24 | 2018-12-21 | 哈尔滨北极星科技有限公司 | A kind of low deuterium-oxide detection device and detection method |
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| CN109060619A (en) * | 2018-08-24 | 2018-12-21 | 哈尔滨北极星科技有限公司 | A kind of low deuterium-oxide detection device and detection method |
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