CN105516621B - The heteropical infrared detection device of band precorrection and its pre-correction approach - Google Patents
The heteropical infrared detection device of band precorrection and its pre-correction approach Download PDFInfo
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- CN105516621B CN105516621B CN201410494322.6A CN201410494322A CN105516621B CN 105516621 B CN105516621 B CN 105516621B CN 201410494322 A CN201410494322 A CN 201410494322A CN 105516621 B CN105516621 B CN 105516621B
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Abstract
The invention discloses a kind of heteropical infrared detection device of band precorrection and its pre-correction approach, including infrared detector, FPGA, A/D and D/A；FPGA is connect respectively with infrared detector, A/D and D/A, A/D is connect respectively with infrared detector and D/A, the driving infrared detector normal works of FPGA first, infrared detector observed object output image analoging signal is transmitted to A/D sample quantizations, the D/A of FPGA drivings simultaneously, generate the waveform voltage of approximate infrared detector analog output signal, it exports again and gives reference voltages of the A/D as sampling, image analoging signal is converted to digital signal through A/D, and it is transmitted to FPGA, after image procossing, output display.It is an advantage of the current invention that correcting the heterogeneity between image line and row on hardware, the response range of infrared detector is improved.
Description
Technical field
The invention belongs to infrared thermal imaging technique, the heteropical infrared detection device of particularly a kind of band precorrection and its
Pre-correction approach.
Background technology
It is defeated to infrared detector by using modulus conversion chip A/D that the imaging of non-refrigeration type infrared detector at present, which is shown,
The image analoging signal sample quantization gone out obtains image digital signal, then exports and show through subsequent image algorithm process.Wherein A/
The reference voltage V of D samplingsREFIt is generally provided by A/D chip interiors reference voltage or is generated by external power supply chip, then VREF
It is a definite value.Assuming that VdIt is the sampled voltage range of A/D, VdIt is determined by A/D chips and a definite value, then A/D samplings
Analog input voltage range:(VREF-Vd/ 2)~(VREF+Vd/2).However, infrared detector is that have heteropical, row and row
Be also between analog signal output have it is heteropical, it is as shown in figures 1 and 3, non-homogeneous between row and row through Germicidal efficacy
Property it is very poor for 1.58V, more serious than heteropical very poor 0.42V between the column and the column, which results in infrared detectors
The maximum value of the image analoging signal of output and the difference of minimum value are excessive, in some instances it may even be possible to the sampled voltage range V more than A/Dd, i.e.,
A part for image saturation, while another part ends.At present, existing solution is that infrared detector is exported
Image analoging signal divided, export again later give A/D sampling.Simplest in this method is the shape for utilizing electric resistance partial pressure
Formula reduces the maximum value of image analoging signal and the difference of minimum value of infrared detector output, so as to meet the sampled voltage of A/D
Range Vd.Although this method meets the sampled voltage area requirement of A/D, there is the shortcomings that its is apparent：1, it reduces original
Picture quality, the partial pressure to image analoging signal are the reduction to picture contrast, are unfavorable for subsequent digital image algorithm
Processing.2, do not improve the heterogeneity of image analoging signal, image analoging signal is very poor to be still had, and has seriously affected detector
Response range, constrain the operating ambient temperature range of non-refrigeration type infrared detector.
Invention content
The purpose of the present invention is to provide a kind of heteropical infrared detection device of band precorrection and its pre-correction approach,
Improve the response range of infrared detector.
Realize the object of the invention technical solution be：A kind of heteropical infrared detection device of band precorrection, packet
Include infrared detector, field programmable gate array (FPGA), modulus conversion chip (A/D) and serial digital-analog conversion chip
(D/A).FPGA is connect respectively with infrared detector, A/D and D/A, and A/D is connect with infrared detector and D/A, and FPGA generates driving
Signal driving infrared detector, A/D and D/A work, and FPGA receives the image digital signal progress after A/D sample quantizations
Image procossing.The driving infrared detector normal works of FPGA first, infrared detector observed object output image analoging signal pass
Transport to A/D sample quantizations.The D/A of FPGA drivings simultaneously generates the waveform voltage of similar infrared detector analog output signal, then defeated
Go out and give reference voltages of the A/D as sampling.Image analoging signal is converted to digital signal through A/D, and is transmitted to FPGA, through image
After processing, output display.Above-mentioned D/A is serial digital-analog conversion chip.
A kind of pre-correction approach with the heteropical infrared detection device of precorrection, including infrared detector, FPGA and
A/D, FPGA are connect respectively with infrared detector and A/D, and A/D is connect with infrared detector, further include D/A, respectively again with FPGA
It is connected with A/D, the waveform voltage of approximate infrared detector analog output signal is generated, then export to A/D using FPGA controls D/A
As the reference voltage of sampling, last A/D corrects infrared detector row to infrared detector analog output signal sample quantization
Heterogeneity between row obtains more uniform picture signal, so as to increase the sample range of A/D, improves infrared spy
Survey device response range.Above-mentioned D/A is serial digital-analog conversion chip.
Compared with prior art, the present invention its remarkable advantage：(1) it is improved in the case where ensureing original image quality red
The response range of external detector；(2) according to the inconsistent of the response between detector simulation output signal row and row, change A/D
Reference voltage, the heterogeneity between image line and row is corrected on hardware, improves the quality of infrared image；(3) by
In the reference voltage of A/D be to change with detector simulation output signal in the time of a frame, so the sampled voltage model of A/D
It encloses and broadens, so as to which the response range for making the analog output signal of infrared detector becomes larger, widened the work of infrared machine system
Ambient temperature range.
Description of the drawings
Fig. 1 is the analog output signal oscillogram of the non-refrigeration type infrared detector UL03041 of oscillograph acquisition.
Fig. 2 is the structure diagram of the present invention.
Fig. 3 is the oscillogram of a line in one frame of infrared detector UL03041 analog output signals.
Fig. 4 is the sampled voltage range schematic diagram when reference voltage of A/D is constant.
Fig. 5 is the sampled voltage range schematic diagram of A/D used in the present invention.
Specific embodiment
With reference to Fig. 1, Fig. 2 and Fig. 3, a kind of heteropical infrared detection device of band precorrection and its pre-correction approach are led to
It crosses on hardware by the use of the waveform similar with infrared detector analog output signal as the reference voltage of A/D, to correct infrared spy
The heterogeneity between device row and row is surveyed, improves the response range of detector.
A kind of heteropical infrared detection device of band precorrection, including infrared detector, field programmable gate battle array
Arrange (FPGA), modulus conversion chip (A/D) and serial digital-analog conversion chip (D/A).FPGA respectively with infrared detector, A/D and
D/A connections, A/D are connect with infrared detector and D/A, and FPGA generates drive signal driving infrared detector, A/D and D/A works
Make, and FPGA receives the image digital signal progress image procossing after A/D sample quantizations.FPGA first drives infrared detector
Normal work, infrared detector observed object output image analoging signal are transmitted to A/D sample quantizations.The D/A of FPGA drivings simultaneously,
The waveform voltage of similar infrared detector analog output signal is generated, then exports and gives reference voltages of the A/D as sampling.Image mould
Intend signal and be converted to digital signal through A/D, and be transmitted to FPGA, after image procossing, output display.Above-mentioned D/A is serial number
Mould conversion chip.
A kind of pre-correction approach with the heteropical infrared detection device of precorrection, including infrared detector, FPGA and
A/D, FPGA are connect respectively with infrared detector and A/D, and A/D is connect with infrared detector, further include D/A, respectively again with FPGA
It is connected with A/D, the waveform voltage of approximate infrared detector analog output signal is generated, then export to A/D using FPGA controls D/A
As the reference voltage of sampling, last A/D corrects infrared detector row to infrared detector analog output signal sample quantization
Heterogeneity between row obtains more uniform picture signal, so as to increase the sample range of A/D, improves infrared spy
Survey device response range.Above-mentioned D/A is serial digital-analog conversion chip.
Infrared detector be have it is heteropical.By taking non-refrigeration type infrared detector UL03041 as an example, the simulation of row and row
Between signal output and have heteropical and more serious than heterogeneity between the column and the column.Fig. 1 reflects non-brake method
Type infrared detector UL03041, with the analog output signal of oscillograph acquisition, reflects row in the uniform object of observed temperature
Heterogeneity between row, very poor is 1.58V.Fig. 3 reflects the heterogeneity that pixel responds in a line, and voltage is maximum
The difference of value and minimum value is 420mV, and intermediate two shorter horizontal signals are the invalid datas between row and row.
Embodiment 1
Experimental procedure is as follows：
Step 1) allows infrared detector (model UL03041) in face of a temperature non-uniform object, to utilize oscillograph completely
To the infrared detector analog output signal acquisition signal waveform of normal work, often the approximation of row voltage value is averaged in one frame of record
Value；
Step 2) controls serial D/A according to the waveform voltage value of infrared detector analog output signal VIDEO using FPGA
(model AD5324) generates the voltage waveform similar with infrared detector analog output signal；
Step 3) carries out voltage follow by operational amplifier to the voltage waveform that AD5324 is generated, and is exported again after filtering
Give reference voltages of the A/D (model LTC2248) as sampling；
The last LTC2248 of step 4) carries out sample quantization to infrared detector analog output signal VIDEO, obtains more uniform
Image digital signal.
In above-mentioned steps 2, according to the operation principle of AD5324 chips, Output Voltage Formula is：
Wherein N=12, VRThe reference voltage for being AD5324 chips is also definite value, and D is the binary system of 12.With each
The time of frame is loop cycle, changes the Serial output voltage value of AD5324 by changing the value of D.
The voltage waveform V generated in above-mentioned steps 3 to AD5324OUTCarry out voltage follow, post filtering export to
Reference voltages of the LTC2248 as sampling, it is assumed that VdThe sampled voltage range of A/D, then the analog input voltage model that A/D is sampled
It encloses:(VOUT-Vd/ 2)~(VOUT+Vd/2).With reference to Fig. 4 and Fig. 5, at this point, in a frame time, VOUTIt is not straight line, but with
The voltage curve the change trend of detector simulation output signal and changed, then the sample range of A/D also become above and below curve
±Vd/ 2 range.
In above-mentioned steps 4, when being sampled in LTC2248, infrared detector analog output signal VIDEO is LTC2248's
± V above and below reference voltagedIt can correctly be sampled in the range of/2.According to the operation principle of LTC2248, image analoging signal
VIDEO and A/D reference voltages are input to operational amplifier simultaneously, have done subtraction, i.e. VIDEO has subtracted the benchmark electricity of A/D
Pressure.If the reference voltage of A/D is a definite value, an each picture element signal of frame image has subtracted an identical biasing (no
Consider voltage noise), the heterogeneity of image does not improve.The reference voltage of A/D is faced with infrared detector in the present invention
What analog output signal during non-uniform object changed, then often row picture element signal has subtracted different biasings to a frame image, is equivalent to
Simple single point correction has been done, has corrected the heterogeneity between row and row in a frame image, has improved the quality of infrared image.
On the other hand, with the increase of non-refrigeration type infrared detector working time, the thermal losses of hardware device in itself is red
The analog output signal VIDEO voltage values of external detector can rise certain value, until between infrared detector and environment temperature
Reach balance.In addition when non-refrigeration type infrared detector is in high temperature or low-temperature working, due to focal plane temperature and environment
The double influence of temperature, the analog output signal VIDEO voltage values of infrared detector can also increase certain value or reduce certain
Value.It is inconsistent due to focal plane often row pixel response assuming that infrared detector itself normal response is unsaturated or cut-off, it deposits
In very poor, analog output signal VIDEO easily saturation or cut-offs when being sampled by A/D.Comparison diagram 4 and Fig. 5, at this time if A/
The reference voltage of D is the waveform voltage similar with analog output signal VIDEO, then Δ V becomes larger, and this improves detectors
Response range has widened the operating ambient temperature range of infrared detector.
Claims (4)
1. a kind of heteropical infrared detection device of band precorrection, it is characterised in that：Including infrared detector, FPGA, A/D and
D/A；FPGA is connect respectively with infrared detector, A/D and D/A, and A/D is connect respectively with infrared detector and D/A, and FPGA generates drive
Dynamic signal driving infrared detector, A/D and D/A work；The driving infrared detector normal works of FPGA first, infrared detector
Observed object output image analoging signal is transmitted to A/D sample quantizations, while FPGA driving D/A, generates approximate infrared detector
Image analoging signal waveform voltage, then export and give reference voltages of the A/D as sampling, image analoging signal converts through A/D
For digital signal, and FPGA is transmitted to, after image procossing, output display.
2. the heteropical infrared detection device of band precorrection according to claim 1, it is characterised in that：Above-mentioned D/A is
Serial digital-analog conversion chip.
3. it is a kind of based on the pre-correction approach described in claim 1 with the heteropical infrared detection device of precorrection, it is special
Sign is：The waveform voltage of the image analoging signal of approximate infrared detector is generated using FPGA controls D/A, then is exported to A/D
As the reference voltage of sampling, last A/D corrects infrared detector to the image analoging signal sample quantization of infrared detector
Heterogeneity between row and row, obtains more uniform picture signal, so as to increase the sample range of A/D, improves infrared
Explorer response range.
4. the pre-correction approach according to claim 3 with the heteropical infrared detection device of precorrection, feature exist
In：Above-mentioned D/A is serial digital-analog conversion chip.
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| CN109085788A (en) * | 2018-10-12 | 2018-12-25 | 湖北视拓光电科技有限公司 | A kind of low noise voltage conditioned circuit and system |
| CN112229521B (en) * | 2020-09-29 | 2022-02-22 | 中国科学院长春光学精密机械与物理研究所 | Infrared detector electronics system with temperature self-correction function and correction method |
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| US5702059A (en) * | 1994-07-26 | 1997-12-30 | Meta Holding Corp. | Extended working range dataform reader including fuzzy logic image control circuitry |
| CN101242495A (en) * | 2007-02-07 | 2008-08-13 | 南京理工大学 | Self-adapted digitalization method and its circuit for infrared plane array |
| CN102564597A (en) * | 2011-12-31 | 2012-07-11 | 南京理工大学 | Infrared analog detector and design method thereof |
| CN204145627U (en) * | 2014-09-24 | 2015-02-04 | 南京理工大学 | The heteropical infrared detection device of band precorrection |
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2014
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5702059A (en) * | 1994-07-26 | 1997-12-30 | Meta Holding Corp. | Extended working range dataform reader including fuzzy logic image control circuitry |
| CN101242495A (en) * | 2007-02-07 | 2008-08-13 | 南京理工大学 | Self-adapted digitalization method and its circuit for infrared plane array |
| CN102564597A (en) * | 2011-12-31 | 2012-07-11 | 南京理工大学 | Infrared analog detector and design method thereof |
| CN204145627U (en) * | 2014-09-24 | 2015-02-04 | 南京理工大学 | The heteropical infrared detection device of band precorrection |
Non-Patent Citations (1)
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| 非制冷红外热成像系统研究;邢素霞;《中国优秀博硕士学位论文全文数据库 (博士) 信息科技辑》;20051115(第7期);全文 * |
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