CN105445597B - A kind of ALCN user board faults test method - Google Patents
A kind of ALCN user board faults test method Download PDFInfo
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- CN105445597B CN105445597B CN201410448444.1A CN201410448444A CN105445597B CN 105445597 B CN105445597 B CN 105445597B CN 201410448444 A CN201410448444 A CN 201410448444A CN 105445597 B CN105445597 B CN 105445597B
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Abstract
The present invention relates to a kind of ALCN user board faults test method, this method includes power supply short circuit fault test and the test of user's line open fault, wherein the power supply short circuit fault test specifically includes：The fuse of the power input of ALCN user's plate or inductance are replaced with into resistance；ALCN user's plate powers on, and temperature sensing meter acquires the temperature of every piece of ESLIC chip and display in ALCN user's plate；It judges whether that the temperature of ESLIC chips exceeds given threshold, if so, power supply short circuit failure occurs for ESLIC chip of the judgement temperature beyond given threshold, judges fault-free if not；User's line open fault test specifically includes：The connection of ALCN user's plate and multiple analog subscribers is completed by programme-controlled exchange testing cassete；Judge whether the output voltage of voltmeter on programme-controlled exchange testing cassete is zero, if so, judgement user's line open circuit corresponding with the voltmeter.Compared with prior art, the present invention has many advantages, such as that troubleshooting is fast, positioning is accurate, efficient.
Description
Technical field
The present invention relates to a kind of ALCN user's plates, more particularly, to a kind of ALCN user board faults test method.
Background technology
The major function of ALCN user's plate is the module communicated between S12 programme-controlled exchanges and user.His operation
Operation is mainly made of two channels, i.e. voice channel signal and control signal data channel.
One, voice channel signal：Voice channel signal is by transmitting and receiving both direction.In sending direction, ESLIC (is used
Family controls chip) voice is sensed by the inductive reactance bridge of SBP (thick film circuit), send four-way number letter to after transformation
Number processor (4CDSP).In 4CDSP, the voice signal of simulation is converted to the 8bit digital codes of a or u rules, is serially transmitted to
Code is passed to Terminal Control Element (MCUA or MCUB plates, i.e. TCE) by DPTC (dual-port terminal control unit), DPTC again.It is connecing
Debit is to DPTC receives the serial data that Terminal Control Element transmits and is transmitted to 4CDSP, after it is changed into analog signal by 4CDSP
It is transmitted to corresponding ESLIC, ESLIC passes back to road after transformation.
Two, data channel is controlled：Control data channel is made of driving byte and two part of scanning byte.Drive byte by
TCE is transmitted to DPTC through CH16, and DPTC is transmitted to corresponding ESLIC through 4CDSP.Scanning byte is filled by ESLIC, through 4CDSP, DPTC
It is uploaded to TCE in CH16.Control data mainly complete user's off-hook detection, and overvoltage detection adjusts user's line parameter, drives relay
Device, the functions such as ESLIC dumps.
ALCN user's plate can be used XRAY and test, but when power supply short circuit failure occurs for user's plate (+5V, -5V, -
48V), the plate just can not upper spider carry out XRAY tests, test it is not comprehensive.So needing the fault test side to ALCN user's plate
Method is studied.
Invention content
It is fast, fixed that it is an object of the present invention to overcome the above-mentioned drawbacks of the prior art and provide a kind of troubleshootings
Level, efficient ALCN user board fault test methods.
The purpose of the present invention can be achieved through the following technical solutions：
A kind of ALCN user board faults test method, this method include power supply short circuit fault test and user's line open fault
Test, wherein
The power supply short circuit fault test specifically includes：
101) fuse of the power input of ALCN user's plate or inductance are replaced with into resistance, the power of the resistance is more than
0.5W；
102) ALCN user's plate powers on, and temperature sensing meter acquires the temperature of every piece of ESLIC chip in ALCN user's plate and shows
Show；
103) judge whether that the temperature of ESLIC chips exceeds given threshold, if so, judgement temperature is beyond setting threshold
Power supply short circuit failure occurs for the ESLIC chips of value, judges fault-free if not；
User's line open fault test specifically includes：
201) connection of ALCN user's plate and multiple analog subscribers is completed by programme-controlled exchange testing cassete；
202) programme-controlled exchange testing cassete starts output selector switch；
203) judge whether the output voltage of voltmeter on programme-controlled exchange testing cassete is zero, if so, judgement and the electricity
The corresponding user's line open circuit of table is pressed, if it is not, then judging fault-free.
The power supply short circuit failure includes+5V shorted to earths failure, -5V shorted to earths failure and the event of -48V shorted to earths
Barrier.
When progress+5V shorted to earth fault tests, step 101) is specially：
The inductance of+5V the input terminals of ALCN user's plate is replaced with into resistance.
When progress -5V shorted to earth fault tests, step 101) is specially：
The inductance of -5V the input terminals of ALCN user's plate is replaced with into resistance.
When progress -48V shorted to earth fault tests, step 101) is specially：
The fuse of -48V the input terminals of ALCN user's plate is replaced with into resistance.
The temperature range of given threshold in the step 103) each ESLIC chips when being powered on according to normal ALCN user's plate
Section is set.
Compared with prior art, the present invention has the following advantages：
1) it connects on the line a high-power resistance, to ensure that the board that is repaired can be inserted into test chassis.
2) when the present invention carries out power supply short circuit failure, judge that user's plate has using the bad higher principle of chip surface temperature
The chip of failure, troubleshooting is fast, and localization of fault is accurate, efficient, compensates for insufficient part in existing test method.Usually
For user's plate there are when short trouble, faulty chip temperature is more much higher than trouble-free chip temperature.
3) present invention can find the chip to break down within the shortest time, effectively shorten maintenance cycle.
4) present invention finds user's line open fault using voltmeter, intuitively, effectively.
Description of the drawings
Fig. 1 is the flow diagram of the present invention.
Specific implementation mode
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.The present embodiment is with technical solution of the present invention
Premised on implemented, give detailed embodiment and specific operating process, but protection scope of the present invention is not limited to
Following embodiments.
The operation operation of ALCN user's plate is mainly made of two channels, i.e. voice channel signal and control signal data is logical
Road.
Voice channel signal is by transmitting and receiving both direction：(1) sending direction (from user line to ASM), ESLIC pass through
The inductive reactance bridge of SBP senses voice signal, sends 4CDSP (4Channal Digital Signal to after transformation
Processor).In 4CDSP, the voice signal of simulation is converted to the 8bit digital codes of a or u rules, is serially transmitted to DPTC
(Dual Port Terminal Controller), DPTC again code pass to Terminal Control Element (MCUA or MCUB plates, i.e.,
TCE(The Transcoder and Filter))。
(2) direction (from ASM to user's line) is received, DPTC receives the serial data that Terminal Control Element transmits and is transmitted to
4CDSP, 4CDSP are transmitted to corresponding ESLIC after it being changed into analog signal, and ESLIC passes back to road after transformation.
Control data channel is made of driving byte and scanning byte two parts.Driving byte is transmitted to by TCE through CH16
DPTC, DPTC are transmitted to corresponding ESLIC through 4CDSP.Scanning byte is filled by ESLIC, is uploaded in CH16 through 4CDSP, DPTC
TCE.Control data mainly complete user's off-hook detection, and overvoltage detection adjusts user's line parameter, drives relay, ESLIC power supplys
The functions such as cut-out.
The circuit composition of ALCN user's plate is specific as follows：
(1) there are 8 pieces of red thick film circuits, entitled DPF on the right side of user's plate.Each two user shares one piece of DPF, every piece
DPF contains two sets of identical protection circuits.There are two thermistors in circuit, and when current is excessive, resistance is increased to limit electricity
Stream, also contains voltage limiting diode, to prevent external high pressure from scurrying into damage user's plate.
(2) each user has one piece of SBP and three relay, SBP mainly to incude A, and the curent change on B lines is simultaneously
It is transmitted to ESLIC, ESLIC adjusts output impedance by these feedback voltages and monitors user line state.Another function of SBP is
Coordinate with three relays, completes the switching in various circuits.
(3) ESLIC is the large scale integrated circuit for using the encapsulation of PLCC44 feet, and every suit subscriber's line circuit contains a piece of
ESLIC.This user plate shares 16 ESLIC.ESLIC can be divided into analog- and digital- two large divisions.
(4) 4CDSP be use PLCC44 feet encapsulation large scale integrated circuit, can be divided into four be mutually independent it is logical
Road, each channel handles the voice signal of a user, and is connected with corresponding ESLIC.4CDSP circuits can be divided into phonological component
The control section and.
(5) DPTC uses the large scale integrated circuit of PLCC28 feet encapsulation, it connects mainly as TCE and circuit in plate
Mouthful, circuit in driving plate transmits voice messaging.Voice data is transmitted to 4CDSP by the connection of DPTC and 4CDSP.The COV feet of DPTC
Control information is passed on even number 4CDSP, COD feet pass to control information on odd number 4CDSP.
(6) TCF in the TCF of ALCN, by 4CDSP completed by linear compression function.TCF is mainly generated one by one
The charging sinusoidal signal of 16KHz is output to each ESLIC from 14 foot MSD.20 feet export MSYN signals to each 4CDSP.
ALCN user board faults test method provided in an embodiment of the present invention includes power supply short circuit fault test and user's line
Open fault is tested, and detailed process is as shown in Figure 1.
Power supply short circuit fault test specifically includes：
101) fuse of the power input of ALCN user's plate (such as 21406286BALF) or inductance are replaced with into resistance,
The power of the resistance is more than 0.5W, is high-power resistance.
Power supply short circuit failure includes+5V shorted to earths failure, -5V shorted to earths failure and -48V shorted to earth failures, into
When row+5V shorted to earth fault tests, the inductance (L30) of+5V input terminals of ALCN user's plate is removed, and in former inductance
(L30) (5 ohm) high-power resistance is concatenated at；When progress -5V shorted to earth fault tests, by-the 5V of ALCN user's plate
The inductance (L20) of input terminal is removed, and (5 ohm) high-power resistance is concatenated at former inductance (L20)；Progress -48V is over the ground
When short trouble is tested, the fuse (F17) of -48V input terminals of ALCN user's plate is removed, and at former fuse (F17)
Concatenate (48 ohm) high-power resistance.
102) ALCN user's plate powers on, and temperature sensing meter acquires the temperature of every piece of ESLIC chip (16) in ALCN user's plate
It spends and shows.
103) judge whether that the temperature of ESLIC chips exceeds given threshold, if so, judgement temperature is beyond setting threshold
Power supply short circuit failure occurs for the ESLIC chips of value, judges fault-free if not.
The temperature range section of given threshold in step 103) each ESLIC chips when being powered on according to normal ALCN user's plate
Setting.When normal ALCN user's plate insertion test chassis powers on, for ESLIC temperature between 28~32 degrees Celsius, setting is certain
Given threshold is set as 40 degrees Celsius by surplus, the present embodiment.
The test of user's line open fault specifically includes：
201) connection of ALCN user's plate and multiple analog subscribers is completed by programme-controlled exchange testing cassete；
202) programme-controlled exchange testing cassete starts output selector switch；
203) judge whether the output voltage of voltmeter on programme-controlled exchange testing cassete is zero, if so, judgement and the electricity
The corresponding user's line open circuit of table is pressed, if it is not, then judging fault-free.
Testing cassete can also test user's ringing-current sound, for judging whether the user has ringing-current output.By telephone user
Line (16) is connected with S12 programme-controlled exchanges test pod interface respectively, starts XRAY test programs.If telephone set sends out ring
Sound illustrates that user's ringing-current is normal.Otherwise the user is problematic.Next solve the problems, such as this, until all users (16) all
Until having ringing tone.
Claims (2)
1. a kind of ALCN user board faults test method, which is characterized in that this method includes power supply short circuit fault test and user
Line open fault is tested, wherein
The power supply short circuit fault test specifically includes：
101) fuse of the power input of ALCN user's plate or inductance are replaced with into resistance, the power of the resistance is more than
0.5W；
102) ALCN user's plate powers on, and temperature sensing meter acquires the temperature of every piece of ESLIC chip and display in ALCN user's plate；
103) judge whether that the temperature of ESLIC chips exceeds given threshold, if so, judgement temperature exceeds given threshold
Power supply short circuit failure occurs for ESLIC chips, judges fault-free if not；
The power supply short circuit failure includes+5V shorted to earths failure, -5V shorted to earths failure and -48V shorted to earth failures；
When progress+5V shorted to earth fault tests, step 101) is specially：The inductance of+5V the input terminals of ALCN user's plate is replaced
It is changed to resistance；
When progress -5V shorted to earth fault tests, step 101) is specially：The inductance of -5V the input terminals of ALCN user's plate is replaced
It is changed to resistance；
When progress -48V shorted to earth fault tests, step 101) is specially：By the insurance of -48V input terminals of ALCN user's plate
Silk replaces with resistance.
2. a kind of ALCN user board faults test method according to claim 1, which is characterized in that in the step 103)
Given threshold each ESLIC chips when being powered on according to normal ALCN user's plate the setting of temperature range section.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201410448444.1A CN105445597B (en) | 2014-09-04 | 2014-09-04 | A kind of ALCN user board faults test method |
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|---|---|---|---|
| CN201410448444.1A CN105445597B (en) | 2014-09-04 | 2014-09-04 | A kind of ALCN user board faults test method |
Publications (2)
| Publication Number | Publication Date |
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| CN105445597A CN105445597A (en) | 2016-03-30 |
| CN105445597B true CN105445597B (en) | 2018-11-06 |
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Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6104149A (en) * | 1997-02-28 | 2000-08-15 | International Rectifier Corp. | Circuit and method for improving short-circuit capability of IGBTs |
| CN1112796C (en) * | 1999-01-28 | 2003-06-25 | 深圳市中兴通讯股份有限公司 | Tester and test system for user card of program controlled switch |
| CN1126324C (en) * | 2000-10-18 | 2003-10-29 | 深圳市中兴通讯股份有限公司 | Universal user board testing equipment |
| US7123037B2 (en) * | 2004-02-27 | 2006-10-17 | Wells-Cti, Llc | Integrated circuit temperature sensing device and method |
| CN101079920B (en) * | 2007-06-28 | 2011-11-23 | 中兴通讯股份有限公司 | Narrow user board with testing function and automatic testing method of user line |
| DE102007062777A1 (en) * | 2007-12-27 | 2009-07-09 | Lear Corp., Southfield | Method and system for providing overload and short circuit protection for a switched power supply |
| CN203151074U (en) * | 2013-04-01 | 2013-08-21 | 谷润雨 | Short-circuit overheat protection device of vehicle battery main switch |
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