CN105260273B - A kind of test method and device of intelligent electronic device - Google Patents

A kind of test method and device of intelligent electronic device Download PDF

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CN105260273B
CN105260273B CN201510659154.6A CN201510659154A CN105260273B CN 105260273 B CN105260273 B CN 105260273B CN 201510659154 A CN201510659154 A CN 201510659154A CN 105260273 B CN105260273 B CN 105260273B
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test
electronic device
intelligent electronic
log
particular frame
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CN105260273A (en
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王玉秀
大卫·泰
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Hisense Group Co Ltd
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Hisense Group Co Ltd
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Abstract

The embodiment of the present application provides the test method and device of a kind of intelligent electronic device, which comprises Xiang Suoshu intelligent electronic device sends test signal;Receive the test data corresponding to the test signal;Judge whether the test data meets preset condition, if so, continuing to execute test operation;If it is not, then restarting the intelligent electronic device.Testing efficiency of the embodiment of the present application to improve intelligent electronic device.

Description

A kind of test method and device of intelligent electronic device
Technical field
This application involves multimedia technology fields, test method and a kind of intelligence more particularly to a kind of intelligent electronic device The test device of energy electronic equipment.
Background technique
With becoming increasingly popular for the intelligent operating systems such as IOS, Android, more and more conventional electronic devices also start Upgrade to intelligent electronic device, such as smart phone, smartwatch, intelligent TV set, is greatly enriched the daily of people Life.
In general, electronic equipment requires comprehensively to test it before factory, to guarantee user in use Equipment can operate normally.It is widely used due to powerful, compared to conventional electronic devices, the test of intelligent electronic device An even more complicated job.By taking intelligent TV set as an example, at present for the test of intelligent TV set mainly or using manually The method of test executes operations by remote controler indication TV machine, by the operation feelings of tester's observation television machine on duty Condition, still, this test method expend a large amount of manpower and material resources, and test effect is not significant.
Therefore, the technical problem solved at present there is an urgent need to those skilled in the art is exactly how to improve intelligent electricity The testing efficiency of sub- equipment enables tester's true cause that accurately decision problem generates.
Summary of the invention
In view of the above problems, it proposes the embodiment of the present application and overcomes the above problem or at least partly in order to provide one kind A kind of test method of the intelligent electronic device to solve the above problems and a kind of corresponding test device of intelligent electronic device.
To solve the above-mentioned problems, the embodiment of the present application discloses a kind of test method of intelligent electronic device, feature It is, comprising:
Test signal is sent to the intelligent electronic device;
Receive the test data corresponding to the test signal;
Judge whether the test data meets preset condition, if so, continuing to execute test operation;If it is not, then restarting The intelligent electronic device.
Preferably, the test data includes the test day that the intelligent electronic device is generated for the test signal Will;
It is described to judge the step of whether test data meets preset condition is whether not to judge in the test log Include preset keyword.
Preferably, the method also includes:
Before the step of restarting the intelligent electronic device, the test log is extracted, and, remove the intelligence electricity The test log formerly stored in sub- equipment.
Preferably, the test data includes the smart electronics that the intelligent electronic device is captured according to presetting rule The particular frame image of equipment output;
It is described judge the step of whether test data meets preset condition be judge the particular frame image whether with Preset key images are identical.
Preferably, the method also includes:
When reaching the preset testing time, the test operation is terminated.
The embodiment of the present application also discloses a kind of test device of intelligent electronic device, comprising:
Signal transmitting module is tested, for sending test signal to the intelligent electronic device;
Test data receiving module, for receiving the test data for corresponding to the test signal;
Test data judgment module, for judging whether the test data meets preset condition, if so, continuing to execute Test operation;If it is not, then restarting the intelligent electronic device.
Preferably, the test data includes the test day that the intelligent electronic device is generated for the test signal Will;
The test data judgment module includes test log judging submodule, for judge in the test log whether It does not include preset keyword.
Preferably, described device further include:
Test log extracts and removes submodule, for extracting institute before the step of restarting the intelligent electronic device Test log is stated, and, remove the test log formerly stored in the intelligent electronic device.
Preferably, the test data includes the smart electronics that the intelligent electronic device is captured according to presetting rule The particular frame image of equipment output;
The test data judgment module includes particular frame image judging submodule, for judging that the particular frame image is It is no identical as preset key images.
Preferably, described device further include:
EOT end of test module, for when reaching the preset testing time, terminating the test operation.
Compared with the background art, the embodiment of the present application includes the following advantages:
In embodiments herein, by sending test signal to the intelligent electronic device, then receives and correspond to The test data of the test signal, and judge whether the test data meets preset condition, instead of by tester's hand It is dynamic that test operation is carried out to intelligent electronic device, the efficiency of test is improved, the waste of manpower and material resources is reduced.
Secondly, received test data may include the intelligent electronic device according to pre- in embodiments herein The particular frame image of the intelligent electronic device output of rule capture is set, and, the intelligent electronic device is directed to the survey The test log that trial signal generates.The particular frame image captured is compared with contrast images first, when particular frame image With contrast images identical or difference within the allowable range when, whether further judge in the test log comprising preset Keyword analyzes test result according to preset keyword, avoids being automatically repaired due to intelligent electronic device, makes The problem of having already appeared fails to show by particular frame image, by the analysis to test log, facilitates rapidly to test The middle problem is judged, the accuracy of test result is further increased.
Third, in embodiments herein, after judging that intelligent electronic device has already appeared problem in testing, clearly In addition to the test log formerly stored, restart the intelligent electronic device, then just continue to execute test operation, ensure that and continue to survey The reliability that environment is tested when examination, avoids the influence that the subsequent problem is formerly gone wrong, improves tester The accuracy of member's orientation problem.
Detailed description of the invention
Fig. 1 is a kind of step flow chart of the test method embodiment 1 of intelligent electronic device of the application;
Fig. 2 is a kind of step flow chart of the test method embodiment 2 of intelligent electronic device of the application;
Fig. 3 is a kind of structural block diagram of the test device embodiment 1 of intelligent electronic device of the application.
Specific embodiment
In order to make the above objects, features, and advantages of the present application more apparent, with reference to the accompanying drawing and it is specific real Applying mode, the present application will be further described in detail.
Referring to Fig.1, a kind of step flow chart of the test method embodiment 1 of intelligent electronic device of the application is shown, It can specifically include following steps:
Step 101, Xiang Suoshu intelligent electronic device sends test signal;
In the concrete realization, can need to intelligent electronic device to be tested be connected to a computer, by computer to Intelligent electronic device sends test signal.For example, when intelligent electronic device is intelligent TV set, can with tested intelligence A test program is set in the computer that energy television set is connected, it is electric from the test program analog telecommand device to tested intelligence Key assignments is sent depending on machine, intelligent TV set executes specific test operation according to the instruction of key assignments, and the key assignments such as sent can be The instruction of the media center circulation click play music of intelligent TV set.
Step 102, the test data corresponding to the test signal is received;
After intelligent electronic device receives the test signal of computer sending, just start to execute every test operation.? In test process, the test data of generation can be sent to computer by intelligent electronic device, the survey by computer to receiving Examination data are analyzed and processed.
Specifically, the test data can be the intelligence electricity that the intelligent electronic device is captured according to presetting rule The particular frame image of sub- equipment output, or, the test log that the intelligent electronic device is generated for the test signal.
During the test, current test whether can be judged by the particular frame image that intelligent electronic device exports Normally.Particular frame image can be the image that intelligent electronic device entirely shows screen, is also possible to intelligent electronic device and shows A certain piece or certain a part of image on screen.By taking intelligent TV set as an example, when carrying out a certain test, tester can Pass through computer program at regular intervals or testing time to be arranged and capture image on television screen.
In a preferred embodiment of the present application, during the test, intelligent electronic device can also generate test day Will.Test log can recorde the volume of data generated in test process, and the concrete operations including executing test, test is opened Begin time, end time, keyword of generation of test etc..
In the concrete realization, test log can be sent to by intelligent electronic device is connected with tested intelligent electronic device Computer receives test log by computer, and is analyzed and processed to test log.
Step 103, judge whether the test data meets preset condition, if so, continuing to execute test operation;If It is no, then restart the intelligent electronic device.
In general, some Rule of judgment can be preset in a computer in advance, when the test data received meets default item When part, it is believed that test is satisfactory, and can continue to execute test operation at this time;If the test data received with Preset condition is not consistent, then it is assumed that intelligent electronic device there is a problem during the test, needs to restart the smart electronics and sets It is standby.
In general, preset condition can be the contrast images of particular frame image, or, preset keyword.
In the concrete realization, the particular frame image of intelligent electronic device under normal operating conditions can be got in advance to make For contrast images.During the test, it is exported when intelligent electronic device captures the intelligent electronic device according to presetting rule Particular frame image after, which can be compared judgement with contrast images, if the particular frame image captured with it is right Or difference more identical than image is within the allowable range, then it is assumed that current test is normally, not go wrong, can continue to hold Row test operation;If the difference between the particular frame image captured and contrast images are significantly different, or both has exceeded Allowed band can restart intelligent electronic device then it is believed that current test has already appeared problem at this time, after equipment is stablized Re-start test.
It, can be with some keywords of preset in advance, according to preset keyword in a preferred embodiment of the present application It is compared with the test log received, judges whether go wrong in test process.
In the concrete realization, which kind of type is the analysis problem belong to for convenience, can preset some error-criticals Word, such as: " stopping ", " no response ", " system mistake ", " out of service ".
When not including such preset keyword in received test log, it is believed that test process does not go wrong, Test operation can be continued to execute.
When in received test log including such preset keyword, illustrates to have had already appeared in test and ask accordingly Topic, needs to be analyzed and processed the problem by tester, at this point it is possible to which extracting test log is supplied to tester. Meanwhile in order to make test can continue to carry out, and follow-up test process not will receive the influence of the problem, in one kind of the application In preferred embodiment, the test log formerly stored in the intelligent electronic device can be removed, then restarts the intelligence electricity Sub- equipment can continue to execute test operation after intelligent electronic device is restarted.
In embodiments herein, by sending test signal to the intelligent electronic device, then receives and correspond to The test data of the test signal, and judge whether the test data meets preset condition, instead of by tester's hand It is dynamic that test operation is carried out to intelligent electronic device, the efficiency of test is improved, the waste of manpower and material resources is reduced.
Referring to Fig. 2, a kind of step flow chart of the test method embodiment 2 of intelligent electronic device of the application is shown, It can specifically include following steps:
Step 201, Xiang Suoshu intelligent electronic device sends test signal;
Step 201 is similar with step 101 in embodiment 1 in the present embodiment, and details are not described herein.
Step 202, receive what the intelligent electronic device was exported according to the intelligent electronic device that presetting rule captures Particular frame image, and, the test log that the intelligent electronic device is generated for the test signal;
In a preferred embodiment of the present application, intelligent electronic device can be received in test process simultaneously according to preset The particular frame image for the intelligent electronic device output that rule captures, and, intelligent electronic device is directed to the test signal The test log of generation.
In the concrete realization, when carrying out a certain test, tester can be set at regular intervals or test is secondary Number goes to capture the particular frame image on intelligent electronic device display screen;Meanwhile in test carries out, test log is also in reality Shi Shengcheng can receive whole test logs in time.
Step 203, judge whether the particular frame image is identical as preset key images, if so, going to step 204;
In the concrete realization, the particular frame image of intelligent electronic device under normal operating conditions can be got in advance to make For contrast images.During the test, it is exported when intelligent electronic device captures the intelligent electronic device according to presetting rule Particular frame image after, which can be compared judgement with contrast images.If the particular frame image captured with it is right Or difference more identical than image within the allowable range, then can continue to do further the test log that intelligent electronic device generates It analyzes and determines.
Step 204, judge whether not comprising preset keyword in the test log, if so, going to step 206;If it is not, Go to step 205;
In the concrete realization, can be with some error-critical words of preset in advance, such as: " stopping ", " no response ", " system be wrong Accidentally ", " out of service " etc., is compared according to preset error-critical word with the test log received, further right Test process is analyzed.
When not including such preset error-critical word in received test log, it is believed that do not have during the test Problem corresponding with error-critical word was occurred, moreover, because the particular frame image captured is also shown normally, therefore, It can be seen that current test carries out in normal state always, test operation can be continued to execute.
But when in received test log including such preset keyword, illustrate to have already appeared in test carries out It may be due to intelligence that problem corresponding with the error-critical word, which is crossed, although the particular frame image captured is shown normally Electronic equipment keeps the problem not continuously display on the display screen and being automatically repaired function.Therefore, in order to the problem Seriousness is judged, needs to be analyzed and processed test log by tester.
Step 205, the test log is extracted, and, remove the test day formerly stored in the intelligent electronic device Will, and restart the intelligent electronic device;
After in the test log that judgement receives comprising one or more preset error-critical words, survey can be extracted Examination log is supplied to tester's analysis processing.Meanwhile in order to make test can continue to carry out, and follow-up test process will not be by To influence, the test log formerly stored in the intelligent electronic device can be removed, then restarts the intelligent electronic device, After intelligent electronic device is restarted, test operation can be continued to execute.
Step 206, test operation is continued to execute, when reaching the preset testing time, terminates the test operation.
When test operation reaches the preset testing time, the test operation can be terminated.
In embodiments herein, by sending test signal to the intelligent electronic device, the intelligence is then received The particular frame image for the intelligent electronic device output that energy electronic equipment is captured according to presetting rule, and, the intelligence electricity The test log that sub- equipment is generated for the test signal, first compares the particular frame image captured with contrast images Compared with, when particular frame image with contrast images identical or difference within the allowable range when, further judge in the test log Whether do not include preset keyword, test result is analyzed according to preset keyword, it can be more accurately to test As a result judged;Meanwhile the test log extracted also contribute to tester rapidly to the problem in test into Row analysis;After going wrong, the test log formerly stored is removed, intelligent electronic device is restarted, then proceedes to execute survey Examination operation ensure that the reliability for testing environment when continuing test, avoid the subsequent problem and formerly be gone wrong Influence, improve the accuracy of tester's orientation problem.
It should be noted that for simple description, therefore, it is stated as a series of action groups for embodiment of the method It closes, but those skilled in the art should understand that, the embodiment of the present application is not limited by the described action sequence, because according to According to the embodiment of the present application, some steps may be performed in other sequences or simultaneously.Secondly, those skilled in the art also should Know, the embodiments described in the specification are all preferred embodiments, and related movement not necessarily the application is implemented Necessary to example.
Referring to Fig. 3, a kind of structural block diagram of the test device embodiment of intelligent electronic device of the application is shown, specifically May include following module:
Signal transmitting module 301 is tested, for sending test signal to the intelligent electronic device;
Test data receiving module 302, for receiving the test data for corresponding to the test signal;
Test data judgment module 303, for judging whether the test data meets preset condition, if so, continuing Execute test operation;If it is not, then restarting the intelligent electronic device.
In a kind of embodiment of the application, the test data may include the intelligent electronic device for the survey The test log that trial signal generates;
The test data judgment module 303 may include:
Test log judging submodule 3031, for whether judging in the test log not comprising preset keyword.
In a kind of embodiment of the application, the test data judgment module 303 can also include:
Test log extracts and removes submodule 3032, for mentioning before the step of restarting the intelligent electronic device The test log is taken, and, remove the test log formerly stored in the intelligent electronic device.
In a kind of embodiment of the application, the test data may include the intelligent electronic device according to preset rule The particular frame image of the intelligent electronic device output then captured;
The test data judgment module 303 can also include:
Particular frame image judging submodule 3033, for judge the particular frame image whether with preset key images phase Together.
In a kind of embodiment of the application, described device can also include:
EOT end of test module 304, for when reaching the preset testing time, terminating the test operation.
For device embodiment, since it is basically similar to the method embodiment, related so being described relatively simple Place illustrates referring to the part of embodiment of the method.
It should be understood by those skilled in the art that, the embodiments of the present application may be provided as method, apparatus or calculating Machine program product.Therefore, the embodiment of the present application can be used complete hardware embodiment, complete software embodiment or combine software and The form of the embodiment of hardware aspect.Moreover, the embodiment of the present application can be used one or more wherein include computer can With in the computer-usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) of program code The form of the computer program product of implementation.
The embodiment of the present application is referring to according to the method for the embodiment of the present application, terminal device (system) and computer program The flowchart and/or the block diagram of product describes.It should be understood that flowchart and/or the block diagram can be realized by computer program instructions In each flow and/or block and flowchart and/or the block diagram in process and/or box combination.It can provide these Computer program instructions are set to general purpose computer, special purpose computer, Embedded Processor or other programmable data processing terminals Standby processor is to generate a machine, so that being held by the processor of computer or other programmable data processing terminal devices Capable instruction generates for realizing in one or more flows of the flowchart and/or one or more blocks of the block diagram The device of specified function.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing terminal devices In computer-readable memory operate in a specific manner, so that instruction stored in the computer readable memory generates packet The manufacture of command device is included, which realizes in one side of one or more flows of the flowchart and/or block diagram The function of being specified in frame or multiple boxes.
These computer program instructions can also be loaded into computer or other programmable data processing terminal devices, so that Series of operation steps are executed on computer or other programmable terminal equipments to generate computer implemented processing, thus The instruction executed on computer or other programmable terminal equipments is provided for realizing in one or more flows of the flowchart And/or in one or more blocks of the block diagram specify function the step of.
Although preferred embodiments of the embodiments of the present application have been described, once a person skilled in the art knows bases This creative concept, then additional changes and modifications can be made to these embodiments.So the following claims are intended to be interpreted as Including preferred embodiment and all change and modification within the scope of the embodiments of the present application.
Finally, it is to be noted that, herein, relational terms such as first and second and the like be used merely to by One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning Covering non-exclusive inclusion, so that process, method, article or terminal device including a series of elements not only wrap Those elements are included, but also including other elements that are not explicitly listed, or further includes for this process, method, article Or the element that terminal device is intrinsic.In the absence of more restrictions, being wanted by what sentence "including a ..." limited Element, it is not excluded that there is also other identical elements in process, method, article or the terminal device for including the element.
Test method to a kind of intelligent electronic device provided herein and a kind of survey of intelligent electronic device above Trial assembly is set, and is described in detail, and specific examples are used herein to illustrate the principle and implementation manner of the present application, The description of the example is only used to help understand the method for the present application and its core ideas;Meanwhile for the one of this field As technical staff, according to the thought of the application, there will be changes in the specific implementation manner and application range, to sum up institute It states, the contents of this specification should not be construed as limiting the present application.

Claims (6)

1. a kind of test method of intelligent electronic device characterized by comprising
Test signal is sent to the intelligent electronic device;
Receive the particular frame image for the intelligent electronic device output that the intelligent electronic device is captured according to presetting rule;
Whether identical as preset key images the particular frame image is judged, if the particular frame image captured and the key Image is identical or difference within the allowable range, then continue to be further analyzed the test log that intelligent electronic device generates and sentence It is disconnected;
Wherein, continue to intelligent electronic device generate test log be further analyzed judgement the step of include:
Whether judge in the test log not comprising preset keyword;
If it is not, extracting the test log;
If the particular frame image is not identical as the key images, the intelligent electronic device is restarted.
2. the method according to claim 1, wherein further include:
Before the step of restarting the intelligent electronic device, the test log is extracted, and, it removes the smart electronics and sets The test log formerly stored in standby.
3. the method according to claim 1, wherein further include:
When reaching the preset testing time, the test operation is terminated.
4. a kind of test device of intelligent electronic device characterized by comprising
Signal transmitting module is tested, for sending test signal to the intelligent electronic device;
Test data receiving module, for receiving the test data for corresponding to the test signal;Wherein, the test data packet Include the particular frame image for the intelligent electronic device output that the intelligent electronic device is captured according to presetting rule;
Test data judgment module, for judging whether the test data meets preset condition;Wherein, the test data is sentenced Disconnected module includes particular frame image judging submodule, and, test log judging submodule;
The particular frame image judging submodule is used for judging whether the particular frame image is identical as preset key images, if The particular frame image is not identical as preset key images, then restarts the intelligent electronic device;If the particular frame captured Image is identical as the key images or difference within the allowable range, then call for whether not judging in the test log Whether the test log judging submodule comprising preset keyword judges in the test log not comprising preset pass Key word extracts the test log if including preset keyword in the test log.
5. device according to claim 4, which is characterized in that further include:
Test log extracts and removes submodule, for before the step of restarting the intelligent electronic device, extracting the survey Log is tried, and, remove the test log formerly stored in the intelligent electronic device.
6. device according to claim 4, which is characterized in that further include:
EOT end of test module, for when reaching the preset testing time, terminating the test operation.
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Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105790801B (en) * 2016-03-11 2019-08-09 青岛海信电器股份有限公司 The pairing test method and test device of a kind of electronic equipment and bluetooth equipment
CN106899846A (en) * 2017-02-23 2017-06-27 广州视源电子科技股份有限公司 Board method of testing, apparatus and system
CN108170568B (en) * 2017-12-26 2021-10-26 深圳市奇虎智能科技有限公司 Delivery test method and device of intelligent equipment and flashing package generation method and device
CN109507613A (en) * 2018-10-22 2019-03-22 惠州市华阳光电技术有限公司 A kind of test method of Intelligent lamp
CN110632500A (en) * 2019-09-24 2019-12-31 闻泰科技(无锡)有限公司 Method and system for judging electronic equipment condition through detection device
CN110677643A (en) * 2019-11-04 2020-01-10 深圳创维-Rgb电子有限公司 Touch screen television, touch screen television testing method, device and medium
CN111522701A (en) * 2020-04-16 2020-08-11 北京百度网讯科技有限公司 Test method, test system, electronic device and storage medium
CN112788332B (en) * 2021-01-07 2022-08-16 深圳市康冠科技股份有限公司 Smart television testing method and related device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010015482A (en) * 2008-07-07 2010-01-21 Yokogawa Electric Corp Debugging device for ic tester
CN103634592A (en) * 2013-12-09 2014-03-12 乐视致新电子科技(天津)有限公司 Automatic test method and system for intelligent televisions
CN103686030A (en) * 2013-12-23 2014-03-26 广东威创视讯科技股份有限公司 Method and device for detecting video signal interface applied to picture splicing display unit
CN104133749A (en) * 2014-07-23 2014-11-05 浪潮电子信息产业股份有限公司 Verification method for HDD detecting failure and HDD out-of-order defect of server
CN104331363A (en) * 2014-10-17 2015-02-04 上海斐讯数据通信技术有限公司 Automatic testing method for Android device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0206761D0 (en) * 2002-03-22 2002-05-01 Object Media Ltd Software testing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010015482A (en) * 2008-07-07 2010-01-21 Yokogawa Electric Corp Debugging device for ic tester
CN103634592A (en) * 2013-12-09 2014-03-12 乐视致新电子科技(天津)有限公司 Automatic test method and system for intelligent televisions
CN103686030A (en) * 2013-12-23 2014-03-26 广东威创视讯科技股份有限公司 Method and device for detecting video signal interface applied to picture splicing display unit
CN104133749A (en) * 2014-07-23 2014-11-05 浪潮电子信息产业股份有限公司 Verification method for HDD detecting failure and HDD out-of-order defect of server
CN104331363A (en) * 2014-10-17 2015-02-04 上海斐讯数据通信技术有限公司 Automatic testing method for Android device

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