CN105157956A - Laser head thermal characteristic measuring device - Google Patents
Laser head thermal characteristic measuring device Download PDFInfo
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- CN105157956A CN105157956A CN201510638979.XA CN201510638979A CN105157956A CN 105157956 A CN105157956 A CN 105157956A CN 201510638979 A CN201510638979 A CN 201510638979A CN 105157956 A CN105157956 A CN 105157956A
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- laser head
- laser
- beam splitter
- thermal
- focus adjustable
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Abstract
A laser head thermal characteristic measuring device comprises a measured laser head, a collimated light source, a polarizer, a focal length adjustable beam expander, a reflector, a dichroic beam splitter, a focal length adjustable beam reducer, an analyzer, an attenuation piece, a wavefront detection unit, a germanium objective lens and a thermal imager. The laser head thermal characteristic measuring device is simple and practicable, has high universality, can match active media with different calibers, is suitable for measuring thermal characteristics including temperature distribution, thermal-induced birefringence depolarization and thermal-induced wavefront distortion in side-pumping and end-pumping solid-state laser devices at the same time, and is high in measurement accuracy.
Description
Technical field
The present invention relates to optical instrument, particularly a kind of measurement mechanism of laser head thermal characteristics.
Background technology
In solid laser system, due to the existence of Excited state mechanism, the pump energy part that laser-activated medium absorbs will be converted into used heat and be deposited on media interior.It is uneven that used heat is deposited on media interior distribution, and simultaneously cooling requirements cools active medium surface, and this makes laser medium inner because dispelling the heat bad and heat deposition is uneven and create temperature rise and thermograde, thus causes various thermal effect.On the one hand, the thermal effect in medium will cause as optical effects such as thermally induced birefringence depolarization, thermic wavefront distortions, the beam quality that impact exports, and reduce system-gain; When the thermal stress that another aspect heat deposition causes is excessive, medium can be caused to burst.Thermal effect is still the important bottleneck that restriction Optical Maser System develops to high power high repetition frequency, govern the various performance parameters such as the beam quality of laser system Output of laser, stability, therefore, it is the key of laser design and Performance Evaluation to the accurate measurement of thermal characteristics in laser medium, particularly for the nd glass laser amplification system of repetitive operation, particularly important especially.
At present, be all carry out under single bore to the measurement of the Temperature Distribution of active medium, thermic wavefront distortion, thermally induced birefringence depolarization, need independent test system building, complicacy and inconvenience are all also existed for design and experiment aspect.
Summary of the invention
The technical problem to be solved in the present invention is to overcome the deficiency in above-mentioned laser heat feature measurement, proposes a kind of measurement mechanism of laser head thermal characteristics, to realize the accurate measurement of laser head thermal characteristics in laser system.
Technical solution of the present invention is as follows:
A kind of measurement mechanism of laser head thermal characteristics, it is characterized in that, comprise: measured laser head, probe source, the polarizer, focus adjustable beam expander, catoptron, dichroic beam splitter, focus adjustable contracting bundle device, analyzer, attenuator, Wavefront detecting unit, germanium object lens, thermal imaging system, Laser output direction along described probe source is the described polarizer successively, focus adjustable beam expander, catoptron and dichroic beam splitter, described catoptron, dichroic beam splitter and described light path at 45 °, described focus adjustable contracting bundle device successively in the reflected light direction of described dichroic beam splitter, analyzer, attenuator and Wavefront detecting unit, described germanium object lens and thermal imaging system successively in the transmission direction of described dichroic beam splitter.
Described probe source is fiber laser, semiconductor laser or all solid state laser, and centre wavelength is consistent with the emission wavelength of measured laser head.
The described polarizer and described analyzer are polarization splitting prism.
Described focus adjustable beam expander is inverted galilean telescope system.
Described catoptron is two to dichroic reflector, along beam direction front surface plating pumping wavelength anti-reflection film, emission wavelength high-reflecting film, and rear surface plating pumping wavelength anti-reflection film.
Described dichroic beam splitter is along the plating of beam direction the front surface anti-reflection film of 8 ~ 12 μm, the high-reflecting film of 900 ~ 1060nm, and the anti-reflection film of 8 ~ 12 μm is plated in rear surface.
Described focus adjustable contracting bundle device is galilean telescope system
Described attenuator is absorption-type narrow band pass filter.
Described Wavefront detecting unit is made up of Wavefront sensor, image acquisition and processing device and display.
Described thermal imaging system is made up of CCD collector, mini-prober, image acquisition and processing device and display.
The invention has the advantages that:
1, highly versatile of the present invention, measuring accuracy are high, are applicable to the laser head thermal characteristic measurement of different size.
2, the present invention can measure the Temperature Distribution of laser head, thermal focal length, thermally induced birefringence depolarization and thermic wavefront distortion simultaneously.
Accompanying drawing explanation
Fig. 1 is apparatus of the present invention structural representations.
Fig. 2 is end pumping optical path figure of the present invention.
Embodiment
Elaborate to the present invention below in conjunction with drawings and Examples, the present embodiment is implemented under premised on technical solution of the present invention, give detailed embodiment and concrete operating process, but protection scope of the present invention is not limited to following embodiment.
First refer to Fig. 2, the embodiment of the present invention comprises: measured laser 1, probe source 2, the polarizer 3, focus adjustable beam expander 4, catoptron 5, dichroic beam splitter 6, focus adjustable contracting bundle device 7, analyzer 8, attenuator 9, Wavefront detecting unit 10, germanium object lens 12, thermal imaging system 13 and pump light 14, Laser output direction along described probe source 2 is the described polarizer 3 successively, focus adjustable beam expander 4, catoptron 5 and dichroic beam splitter 6, described catoptron 5, dichroic beam splitter 6 is at 45 ° with described light path, described focus adjustable contracting bundle device 7 successively in the reflected light direction of described dichroic beam splitter 6, analyzer 8, attenuator 9 and Wavefront detecting unit 10, described germanium object lens 12 and thermal imaging system 13 successively in the transmission direction of described dichroic beam splitter 6.In the present embodiment, measured laser head is nd glass laser head.
Described probe source 2 is optical fiber continuous wave laser, and spot size is
3mm, power is 10mW, and centre wavelength is 1053nm.
The described polarizer 3 and described analyzer 8 are polarization splitting prism.
Described focus adjustable beam expander 4 is inverted galilean telescope system, and expanding multiplying power is 20 times, for the light beam that collimated probe light source 2 sends.
Described catoptron 5 is two to dichroic reflector, along beam direction front surface plating 802nm anti-reflection film, 1053nm high-reflecting film, and rear surface plating 802nm anti-reflection film.
Described dichroic beam splitter 6 is along the plating of beam direction the front surface anti-reflection film of 8 ~ 12 μm, the high-reflecting film of 900 ~ 1060nm, and the anti-reflection film of 8 ~ 12 μm is plated in rear surface.
Described focus adjustable contracting bundle device 7 is galilean telescope system, and contracting bundle multiplying power is 10 times.
Described attenuator 9 is absorption-type narrow band pass filter.
Described Wavefront detecting unit 10 is made up of Wavefront sensor, image acquisition and processing device and display.
Described thermal imaging system 13 is made up of CCD collector, mini-prober, image acquisition and processing device and display.
Embodiment as shown in Figure 2, during measurement, nd glass laser head 1 to be measured is placed in the light path between described catoptron 5 and dichroic beam splitter 6, described nd glass laser head 1 carries out face-pumping by pump light 14 from end face, pumping average power is 130W, and pump light 14 is all absorbed by neodymium glass.The clear aperture of nd glass laser head 1 is 40mm × 40mm, utilizes high speed helium to cool nd glass laser head 1.The continuous light that probe source 2 sends is after analyzer 3, focus adjustable beam expander 4, and continuous light polarization state is P light, and spot size is
60mm.Continuous light is after nd glass laser head 1, dichroic beam splitter 6, focus adjustable contracting bundle device 7, beam size becomes 4mm × 4mm, then through analyzer 8, attenuator 9 laggard enter wavefront probe unit 10, thermic wavefront distortion and the distribution of thermal depolarization birefringence depolarization of nd glass laser head 1 can be monitored on Wavefront detecting unit 10 display.Regret producing the intermediate infrared radiation 11 that wavelength is 8 ~ 12 μm because laser material is subject to pumping, and ZnSe film has very high transmitance to the mid-infrared light of 8 ~ 12 μm, therefore intermediate infrared radiation 11 enters thermal imaging system 13 through after dichroic beam splitter 6, germanium object lens 12 the direct imaging of neodymium glass active medium, the Temperature Distribution of nd glass laser head 1 can be observed over the display, from Temperature Distribution through theory calculate, obtain the thermal focal length of neodymium glass active medium.
Utilize this device, the thermic wavefront recording nd glass laser head is 6.77 λ, and thermally induced birefringence depolarization concentrates on neodymium glass four drift angles, loss >90%, the distribution of neodymium glass temperature is in the low shape of center high surrounding, and the radial surface temperature difference reaches 15 DEG C.In sum, our experiments show that, the present invention accurately can measure the thermal characteristics of neodymium glass laser amplifier.
Claims (6)
1. a measurement mechanism for laser head thermal characteristics, is characterized in that, this device comprises: measured laser head (1), probe source (2), the polarizer (3), focus adjustable beam expander (4), catoptron (4), dichroic beam splitter (6), focus adjustable contracting bundle device (7), analyzer (8), attenuator (9), Wavefront detecting unit (10), germanium object lens (12) and thermal imaging system (13), the Laser output direction along described probe source (2) is the described polarizer (3) successively, focus adjustable beam expander (4), catoptron (5) and dichroic beam splitter (6), described catoptron (5), dichroic beam splitter (6) is at 45 ° with described light path, is described focus adjustable contracting bundle device (7) in the reflected light direction of described dichroic beam splitter (6) successively, analyzer (8), attenuator (9) and Wavefront detecting unit (10) are described germanium object lens (12) and thermal imaging system (13) in the transmission direction of described dichroic beam splitter (6) successively.
2. the measurement mechanism of laser head thermal characteristics according to claim 1, is characterized in that described probe source (2) is fiber laser, semiconductor laser or all solid state laser.
3. the measurement mechanism of laser head thermal characteristics according to claim 1, is characterized in that described focus adjustable beam expander (4) is inverted galilean telescope system.
4. the measurement mechanism of laser head thermal characteristics according to claim 1, is characterized in that the described polarizer (3) and described analyzer (8) are polarization splitting prism.
5. the measurement mechanism of described laser head thermal characteristics according to claim 1, is characterized in that described focus adjustable contracting bundle device (7) is galilean telescope system.
6. the measurement mechanism of the laser head thermal characteristics according to any one of claim 1 to 5, is characterized in that described attenuator (9) is absorption-type narrow band pass filter.
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| CN201510638979.XA CN105157956A (en) | 2015-09-29 | 2015-09-29 | Laser head thermal characteristic measuring device |
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| CN201510638979.XA CN105157956A (en) | 2015-09-29 | 2015-09-29 | Laser head thermal characteristic measuring device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104729717A (en) * | 2015-03-17 | 2015-06-24 | 浙江大学 | Device and method for measuring and calculating temperature of solid laser crystal |
| CN106785814A (en) * | 2016-12-13 | 2017-05-31 | 清华大学 | Laser heat effect measurement system |
| CN108007673A (en) * | 2018-01-17 | 2018-05-08 | 北京高普乐光电科技股份公司 | A kind of System and method for using thermal imaging detection high power laser multimode fibre |
| CN110548876A (en) * | 2019-10-14 | 2019-12-10 | 中国科学院重庆绿色智能技术研究院 | powder-laying type remanufacturing device and method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6373866B1 (en) * | 2000-01-26 | 2002-04-16 | Lumenis Inc. | Solid-state laser with composite prismatic gain-region |
| CN102889981A (en) * | 2012-10-15 | 2013-01-23 | 中国科学院上海光学精密机械研究所 | Device and method for measuring thermal focus of side pumped laser crystal |
| CN103730830A (en) * | 2013-11-06 | 2014-04-16 | 中国科学院上海光学精密机械研究所 | Neodymium and yttrium doped calcium fluoride laser amplifier of laser diode pumping helium cooling |
| CN104165754A (en) * | 2014-08-07 | 2014-11-26 | 江苏大学 | Measurement device and method for focal length of laser bar thermal lens |
| CN104729717A (en) * | 2015-03-17 | 2015-06-24 | 浙江大学 | Device and method for measuring and calculating temperature of solid laser crystal |
-
2015
- 2015-09-29 CN CN201510638979.XA patent/CN105157956A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6373866B1 (en) * | 2000-01-26 | 2002-04-16 | Lumenis Inc. | Solid-state laser with composite prismatic gain-region |
| CN102889981A (en) * | 2012-10-15 | 2013-01-23 | 中国科学院上海光学精密机械研究所 | Device and method for measuring thermal focus of side pumped laser crystal |
| CN103730830A (en) * | 2013-11-06 | 2014-04-16 | 中国科学院上海光学精密机械研究所 | Neodymium and yttrium doped calcium fluoride laser amplifier of laser diode pumping helium cooling |
| CN104165754A (en) * | 2014-08-07 | 2014-11-26 | 江苏大学 | Measurement device and method for focal length of laser bar thermal lens |
| CN104729717A (en) * | 2015-03-17 | 2015-06-24 | 浙江大学 | Device and method for measuring and calculating temperature of solid laser crystal |
Non-Patent Citations (2)
| Title |
|---|
| 中国科学院上海光学精密机械研究所钕玻璃热畸变研究组: "钕玻璃的光泵感应热畸变", 《物理学报》 * |
| 黄文发等: "激光二极管抽运氦气冷却钕玻璃叠片激光放大器热致波前畸变和应力双折射的数值模拟和实验研究", 《物理学报》 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104729717A (en) * | 2015-03-17 | 2015-06-24 | 浙江大学 | Device and method for measuring and calculating temperature of solid laser crystal |
| CN106785814A (en) * | 2016-12-13 | 2017-05-31 | 清华大学 | Laser heat effect measurement system |
| CN108007673A (en) * | 2018-01-17 | 2018-05-08 | 北京高普乐光电科技股份公司 | A kind of System and method for using thermal imaging detection high power laser multimode fibre |
| CN110548876A (en) * | 2019-10-14 | 2019-12-10 | 中国科学院重庆绿色智能技术研究院 | powder-laying type remanufacturing device and method |
| CN110548876B (en) * | 2019-10-14 | 2022-01-25 | 中国科学院重庆绿色智能技术研究院 | Powder-laying type remanufacturing device and method |
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