CN104890236A - Stereo lithography rapid moulding scanning-path ordering method for 3D printing - Google Patents
Stereo lithography rapid moulding scanning-path ordering method for 3D printing Download PDFInfo
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Abstract
The invention discloses a stereo lithography rapid moulding scanning-path ordering method for 3D printing. The method is characterized in that all the scanning line segments are partitioned with a least travel principle, each block comprises the scanning segments as much as possible, after partitioning, all the blocks are ordered, so that high efficiency ordering for the scanning segments can be realized. According to the invention, the path ordering with partitioning can reduce the travel distance and increase the scan efficiency; the path ordering with partitioning can realize high integration degree of the scanning path, printing continuous degree is high, and moulding intensity can be enhanced.
Description
Technical field
The present invention relates to 3D printing technique field, especially relate to the Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method that a kind of 3D that effectively can improve scan efficiency prints.
Background technology
Print in (rapid shaping) technical field at 3D, SLA (Stereo Lithography Apparatus) technique is a kind of Layered Manufacturing Technology, computer controlled controlling laser beam scans the surface that photosensitive resin is raw material, produced photopolymerization reaction by the thin resin layer of scanning area and solidify, forming a thin layer of part.Workbench moves down the distance of a thickness, to apply the new liquid resin of one deck again at the resin surface be cured, carries out the scanning machining of lower one deck, so repeatedly, until whole raw basin is complete.
The work of SLA mainly scans photosensitive resin material, and scanning is divided into again the scanning to supporting construction, and the scanning to model silhouette and the scanning to model entity, this wherein occupies maximum workload to the scanning of model entity.Entity scanning pattern exists with the line segment form of a large amount of individual segmentation, just must carry out rational sorting to scanning pattern, avoid too much redirect when mould shapes is more complicated.Therefore most important for the operating efficiency of SLA to the sequence of model entity scanning pattern.
The mode of usual employing grid scanning obtains scan lines, after acquisition scan lines, if do not carry out effective and reasonable sequence to scan lines, then in print procedure, there will be more redirect, causes scan efficiency to reduce.
Chinese patent mandate publication number: CN104057611A, authorize publication date on September 24th, 2014, disclose a kind of 3D optimized based on scan line inclination angle and print fill path generation method, comprise the steps: step 1, require to determine suitable fill path spacing and thickness according to 3D printing device and printing precision, and obtain according to thickness the SLC file needing processing entity; Step 2, generate Contour offset path using fill path spacing as offset or dish, and innermost layer bias path is carried out biased obtain biased polygon Ω; Step 3, determine the scan line inclination angle of each layer according to working (machining) efficiency and printing precision specific requirement; Step 4, generate inner fill path according to the intersection point of scan line inclination angle and scan line and biased polygon Ω.The weak point of this invention is that scan efficiency is low.
Summary of the invention
Goal of the invention of the present invention is the deficiency that the scan efficiency in order to overcome scanning pattern generation method of the prior art is low, provides the Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method that a kind of 3D that effectively can improve scan efficiency prints.
To achieve these goals, the present invention is by the following technical solutions:
The Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method that 3D prints, comprises the steps:
(1-1) two-dimensional array of each scan lines is set up:
Horizontal grid cutting is utilized to obtain all scan lines be vertically arranged in order of object, the data structure setting each scan lines is SEGMENT, SEGMENT comprises the attribute Point characterizing scan lines left end point, characterize the attribute OtherPoint of scan lines right endpoint, characterize the attribute BIndex of scan lines place block index;
Setting scan lines horizontal direction maximum number is M, and vertical direction maximum number is N, then the m article of scan lines being positioned at vertical direction n-th line be stored as array Segments [n] [m], n ∈ N, m ∈ M;
(1-2) travel through all scan lines, according to scan lines Duplication OverlapRatio and jump distance TravelDistance, all scan lines be divided into K block BLOCK:
Setting block lists is the initial value of Blocks [K], maximum block index MaxBIndex is 0, setting minimum overlay rate MinOverlapRatio and maximum jump distance MaxTravelDistance;
(1-2-1) setting current scan lines is Segments [n] [m], the next line scan lines of current line is Segments [n-1] [:], Current Scan line segment Segments [n] [m] is mated respectively with all scan lines of next line:
In Segments [n-1] [:], n-1 represents line number, colon: represent the uncertain implication of columns: can be 1 to L, L be natural number.In Segments [n] [m], n and m characterizes the numerical value determined respectively, and Segments [n] [m] represents a scan lines determined.
Suppose that Segments [n] [m] is SegmentA, in Segments [n-1] [:], arbitrary scan lines is SegmentB, then calculate the overlap distance OverlapDistance of SegmentA and SegmentB, and utilize following formulae discovery Duplication OverlapRatio and jump distance TravelDistance:
Setup parameter MinOverlapRatio and MaxTravelDistance;
Overlap distance OverlapDistance is the length that two scan lines overlap, SegmentA.Point and SegmentA.OtherPoint represents left end point and the right endpoint of SegmentA respectively;
SegmentB.Point and SegmentB.OtherPoint represents left end point and the right endpoint of SegmentB respectively;
OverlapRatio and TravelDistance with Segments [n] [m] is calculated in turn to L bar scan lines in Segments [n-1] [:],
If OverlapRatio > is MinOverlapRatio, be then judged to be coupling;
If OverlapRatio≤MinOverlapRatio
And TravelDistance < MaxTravelDistance, be then judged to be coupling;
If OverlapRatio≤MinOverlapRatio
And TravelDistance >=MaxTravelDistance, is judged to not mate;
When result of determination is for coupling, then the BIndex of Segments [n] [m] is set to the Bindex of that scan lines corresponding in all scan lines of lastrow, show to belong to same block, terminate the matching judgment to Segments [n] [m] simultaneously;
When result of determination is not for mating, then makes the BIndex of Segments [n] [m] increase by 1, show that this is a new block, make MaxBIndex increase by 1 simultaneously;
After all scan lines have traveled through, according to the BIndex of every bar scan lines, scan lines is distributed in block lists Block [K];
(1-3) according to block distance BlockDistance, each block is sorted:
Set up the data structure BLOCK being used for description block feature, BLOCK comprises the attribute StartSegment of the beginning scan lines characterizing block, characterize the attribute EndSegment of the end scan lines of block, characterize the attribute IsFlip whether overturn, in selected block lists Blocks [K], any one block is as original block BlockCur;
(1-3-1) by original block BlockCur stored in sequence block lists SortBlocks [K], each block respectively in calculation block list Blocks [K] and the block distance BlockDistance of BlockCur, using the block corresponding to minimum BlockDistacne as arest neighbors block BlockNearest;
(1-3-2) by BlockNearest stored in SortBlocks [K], and from block lists Blocks [K], remove BlockCur, using BlockNearest as new BlockCurt;
(1-3-3) step (1-3-1) to (1-3-2) is repeated until only have one in block lists Blocks [K];
(1-4) extract the scan lines of each block inside according to block stored in the order of SortBlocks [K] successively, so far, complete the sequence of all scan lines.
3D prints and usually adopts the mode of grid scanning to obtain scan lines, after acquisition scan lines, if do not carry out effective and reasonable sequence to scan lines, then in print procedure, there will be more redirect, causes scan efficiency to reduce.
The present invention transfers all scan lines to principle with least hops to carry out subregion, and each block comprises as far as possible many scan lines, after piecemeal, again all blocks are sorted, thus realize the efficient sequence of scan lines, and the scanning pattern redirect obtained is few, prints continuity degree high.
Therefore, the paths ordering that the present invention has blockette decreases jump distance, improves scan efficiency; The paths ordering of blockette makes scanning pattern integration degree higher, prints continuity degree high, contributes to the feature improving shaping strength.
As preferably, described step (1-3-1) also comprises the steps:
Set any one block structure BLOCK and comprise scan lines StartSegment and EndSegment two line segment structures, scan lines StartSegment comprises left end point StartPoint and right endpoint StartOtherPoint, scan lines EndSegment comprise left end point EndPoint and right endpoint EndOtherPoint; Then set BlockDistance be BlockCur two terminal B lockCur.EndPoint, BlockCur.EndOtherPoint respectively with the minimum of a value of four terminal B lockOther.StartPoint of remaining block BlockOther in block lists Blocks [K], the distance of BlockOther.StartOtherPoint, BlockOther.EndPoint, BlockOther.EndOtherPoint;
The computational methods of BlockDistance are as follows:
As preferably, also comprise the steps:
If the Segment obtaining minimum BlockDistance is the EndSegment of block structure BlockNearest, namely
Then represent BlockNearest should be reversed to obtain minimum jump distance, even:
BlockNearest.IsFlip＝True；
Step (1-4) is replaced by following steps:
Extract the scan lines of each block inside successively stored in the order of SortBlocks [K] according to block, wherein, the scan lines backward with the block inside of upset mark BlockNearest.IsFlip=True is extracted, and so far, completes the sequence of all scan lines.
Normally extract scan lines in block structure BlockNearest according to the order of EndSegment after first StartSegment, when there is the upset mark of BlockNearest.IsFlip=True in block structure BlockNearest, need the scan lines extracted according to the order of StartSegment after first EndSegment in block structure BlockNearest.Such sequence can make the jump distance between block minimum.
Therefore, the present invention has following beneficial effect:
(1) paths ordering of blockette decreases jump distance, improves scan efficiency;
(2) paths ordering of blockette makes scanning pattern integration degree higher, prints continuity degree high, contributes to improving shaping strength.
Accompanying drawing explanation
Fig. 1 is a kind of structural representation of the scan lines of object of the present invention;
Fig. 2 is a kind of schematic diagram of OverlapDistance of the present invention;
Fig. 3 is a kind of schematic diagram of TravelDistance of the present invention;
A kind of flow chart of Fig. 4 to be of the present invention be embodiment.
In figure: Block1 1, Block2 2, Block3, SegmentA 4, SegmentB.
Detailed description of the invention
Below in conjunction with the drawings and specific embodiments, the present invention will be further described.
Embodiment is as shown in Figure 4 the Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method that a kind of 3D prints, and comprises the steps:
Step 100, the two-dimensional array of each scan lines is set up according to the scan lines obtained:
In advance by the profile of object input computer, utilize horizontal grid to cut the acquisition all scan lines be vertically arranged in order as shown in Figure 1, following computational process is carried out all in a computer:
The data structure setting each scan lines is that SEGMENT, SEGMENT comprise the attribute Point characterizing scan lines left end point, characterizes the attribute OtherPoint of scan lines right endpoint, characterizes the attribute BIndex of scan lines place block index;
Be provided with 3 block Block1 1, Block2 2, Block3 in Fig. 1, be provided with scan lines SEGMENT in each block, every bar line segment is equipped with left end point Point and right endpoint OtherPoint.
Setting scan lines horizontal direction maximum number is M, and vertical direction maximum number is N, then the m article of scan lines being positioned at vertical direction n-th line be stored as array Segments [n] [m], n ∈ N, m ∈ M;
Step 200, travels through all scan lines, according to scan lines Duplication OverlapRatio and jump distance TravelDistance, all scan lines is divided into K block BLOCK:
Setting block lists is the initial value of Blocks [K], maximum block index MaxBIndex is 0, setting minimum overlay rate MinOverlapRatio and maximum jump distance MaxTravelDistance;
Step 210, setting current scan lines is Segments [n] [m], the next line scan lines of current line is Segments [n-1] [:], Current Scan line segment Segments [n] [m] is mated respectively with all scan lines of next line:
As shown in Figure 2, suppose that Segments [n] [m] is SegmentA, in Segments [n-1] [:], arbitrary scan lines is SegmentB, then calculate the overlap distance OverlapDistance of SegmentA and SegmentB, and utilize following formulae discovery Duplication OverlapRatio and jump distance TravelDistance:
OverlapRatio＝OverlapDistance/|SegmentB.Point-SegmentB.OtherPoint|，
As shown in Figure 3,
Setup parameter MinOverlapRatio and MaxTravelDistance;
OverlapRatio and TravelDistance with Segments [n] [m] is calculated in turn to L bar scan lines in Segments [n-1] [:],
If OverlapRatio > is MinOverlapRatio, be then judged to be coupling;
If OverlapRatio≤MinOverlapRatio
And TravelDistance < MaxTravelDistance, be then judged to be coupling;
If OverlapRatio≤MinOverlapRatio
And TravelDistance >=MaxTravelDistance, is judged to not mate;
When result of determination is for coupling, then the BIndex of Segments [n] [m] is set to the Bindex of that scan lines corresponding in all scan lines of lastrow, show to belong to same block, terminate the matching judgment to Segments [n] [m] simultaneously;
When result of determination is not for mating, then makes the BIndex of Segments [n] [m] increase by 1, show that this is a new block, make MaxBIndex increase by 1 simultaneously;
After all scan lines have traveled through, according to the BIndex of every bar scan lines, scan lines is distributed in block lists Block [K];
Step 300, sorts to each block according to block distance BlockDistance:
Set up the data structure BLOCK being used for description block feature, BLOCK comprises the attribute StartSegment of the beginning scan lines characterizing block, characterize the EndSegment of the end scan lines attribute of block, characterize the attribute IsFlip whether overturn, in selected block lists Blocks [K], any one block is as original block BlockCur;
Step 310, by original block BlockCur stored in sequence block lists SortBlocks [K], each block respectively in calculation block list Blocks [K] and the block distance BlockDistance of BlockCur, using the block corresponding to minimum BlockDistacne as arest neighbors block BlockNearest;
Set any one block structure BLOCK and comprise scan lines StartSegment and EndSegment two line segment structures, scan lines StartSegment comprises left end point StartPoint and right endpoint StartOtherPoint, scan lines EndSegment comprise left end point EndPoint and right endpoint EndOtherPoint; Then set BlockDistance be BlockCur two terminal B lockCur.EndPoint, BlockCur.EndOtherPoint respectively with the minimum of a value of four terminal B lockOther.StartPoint of remaining block BlockOther in block lists Blocks [K], the distance of BlockOther.StartOtherPoint, BlockOther.EndPoint, BlockOther.EndOtherPoint;
The computational methods of BlockDistance are as follows:
Step 320, by BlockNearest stored in SortBlocks [K], and removes BlockCur, using BlockNearest as new BlockCurt from block lists Blocks [K];
If the Segment obtaining minimum BlockDistance is the EndSegment of block structure BlockNearest, namely
Then represent BlockNearest should be reversed to obtain minimum jump distance, even:
BlockNearest.IsFlip＝True；
Step 330, repeats step 310 to 320 until only have one in block lists Blocks [K];
Step 400, extract the scan lines of each block inside successively stored in the order of SortBlocks [K] according to block, wherein, the scan lines backward with the block inside of upset mark BlockNearest.IsFlip=True is extracted, so far, the sequence of all scan lines is completed.
Should be understood that the present embodiment is only not used in for illustration of the present invention to limit the scope of the invention.In addition should be understood that those skilled in the art can make various changes or modifications the present invention, and these equivalent form of values fall within the application's appended claims limited range equally after the content of having read the present invention's instruction.
Claims (3)
1. a Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method for 3D printing, is characterized in that, comprise the steps:
(1-1) two-dimensional array of each scan lines is set up:
Horizontal grid cutting is utilized to obtain all scan lines be vertically arranged in order of object, the data structure setting each scan lines is SEGMENT, SEGMENT comprises the attribute Point characterizing scan lines left end point, characterize the attribute OtherPoint of scan lines right endpoint, characterize the attribute BIndex of scan lines place block index;
Setting scan lines horizontal direction maximum number is M, and vertical direction maximum number is N, then the m article of scan lines being positioned at vertical direction n-th line be stored as array Segments [n] [m], n ∈ N, m ∈ M;
(1-2) travel through all scan lines, according to scan lines Duplication OverlapRatio and jump distance TravelDistance, all scan lines be divided into K block BLOCK:
Setting block lists is the initial value of Blocks [K], maximum block index MaxBIndex is 0, setting minimum overlay rate MihOverlapRatio and maximum jump distance MaxTravelDistance;
(1-2-1) setting current scan lines is Segments [n] [m], the next line scan lines of current line is Segments [n-1] [:], Current Scan line segment Segments [n] [m] is mated respectively with all scan lines of next line:
Suppose that Segments [n] [m] is SegmentA, in Segments [n-1] [:], arbitrary scan lines is SegmentB, then calculate the overlap distance OverlapDistance of SegmentA and SegmentB, and utilize following formulae discovery Duplication OverlapRatio and jump distance TravelDistance:
OverlapRatio＝OverlapDistance/|SegmentB.Point-SegmentB.OtherPoint|，
TravelDistance＝Min{
|SegmentA.Point-SegmentB.Point|，
|SegmentA.Point-SegmentB.OtherPoint|，
|SegmentA.OtherPoint-SegmentB.Point|，
|SegmentA.OtherPoint-SegmentB.OtherPoint|}；
Setup parameter MihOverlapRatio and MaxTravelDistance;
OverlapRatio and TravelDistance with Segments [n] [m] is calculated in turn to L bar scan lines in Segments [n-1] [:],
If OverlapRatio > is MihOverlapRatio, be then judged to be coupling;
If OverlapRatio≤MihOverlapRatio
And TravelDistance < MaxTravelDistance, be then judged to be coupling;
If OverlapRatio≤MihOverlapRatio
And TravelDistance >=MaxTravelDistance, is judged to not mate;
When result of determination is for coupling, then the BIndex of Segments [n] [m] is set to the Bindex of that scan lines corresponding in all scan lines of lastrow, show to belong to same block, terminate the matching judgment to Segments [n] [m] simultaneously;
When result of determination is not for mating, then makes the BIndex of Segments [n] [m] increase by 1, show that this is a new block, make MaxBIndex increase by 1 simultaneously;
After all scan lines have traveled through, according to the BIndex of every bar scan lines, scan lines is distributed in block lists Block [K];
(1-3) according to block distance BlockDistance, each block is sorted:
Set up the data structure BLOCK being used for description block feature, BLOCK comprises the attribute StartSegment of the beginning scan lines characterizing block, characterize the attribute EndSegment of the end scan lines of block, characterize the attribute IsFlip whether overturn, in selected block lists Blocks [K], any one block is as original block BlockCur;
(1-3-1) by original block BlockCur stored in sequence block lists SortBlocks [K], each block respectively in calculation block list Blocks [K] and the block distance BlockDistance of BlockCur, using the block corresponding to minimum BlockDistacne as arest neighbors block BlockNearest;
(1-3-2) by BlockNearest stored in SortBlocks [K], and from block lists Blocks [K], remove BlockCur, using BlockNearest as new BlockCurt;
(1-3-3) step (1-3-1) to (1-3-2) is repeated until only have one in block lists Blocks [K];
(1-4) extract the scan lines of each block inside according to block stored in the order of SortBlocks [K] successively, so far, complete the sequence of all scan lines.
2. the Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method of 3D printing according to claim 1, it is characterized in that, described step (1-3-1) also comprises the steps:
Set any one block structure BLOCK and comprise scan lines StartSegment and EndSegment two line segment structures, scan lines StartSegment comprises left end point StartPoint and right endpoint StartOtherPoint, scan lines EndSegment comprise left end point EndPoint and right endpoint EndOtherPoint; Then set BlockDistance be BlockCur two terminal B lockCur.EndPoint, BlockCur.EndOtherPoint respectively with the minimum of a value of four terminal B lockOther.StartPoint of remaining block BlockOther in block lists Blocks [K], the distance of BlockOther.StartOtherPoint, BlockOther.EndPoint, BlockOther.EndOtherPoint;
The computational methods of BlockDistance are as follows:
BlockDistance＝Min{
|BlockCur.EndPoint-BlockOther.StartPoint|，
|BlockCur.EndPoint-BlockOther.StartOtherPoint|，
|BlockCur.EndPoint-BlockOther.EndPoint|，
|BlockCur.EndPoint-BlockOther.EndOtherPoint|，
|BlockCur.EndOtherPoint-BlockOther.StartPoint|，
|BlockCur.EndOtherPoint-BlockOther.StartOtherPoint|，
|BlockCur.EndOtherPoint-BlockOther.EndPoint|，
|BlockCur.EndOtherPoint-BlockOther.EndOtherPoint|}。
3. the Stereo Lithography Apparatus Rapid Prototyping scanning pattern sort method of 3D printing according to claim 2, is characterized in that, also comprise the steps:
If the Segment obtaining minimum BlockDistance is the EndSegment of block structure BlockNearest, namely
Max{|BlockCur.EndPoint-BlockOther.EndPoint|，
|BlockCur.EndPoint-BlockOther.EndOtherPoint|，
|BlockCur.EndOtherPoint-BlockOther.EndPoint|，
|BlockCur.EndOtherPoint-BlockOther.EndOtherPoint|}＜Min{|BlockCur.EndPoint-BlockOther.StartPoint|，
|BlockCur.EndPoint-BlockOther.StartOtherPoint|，
|BlockCur.EndOtherPoint-BlockOther.StartPoint|，|BlockCur.EndOtherPoint-BlockOther.StartOtherPoint|}；
Then represent BlockNearest should be reversed to obtain minimum jump distance, even:
BlockNearest.IsFlip＝True；
Step (1-4) is replaced by following steps:
Extract the scan lines of each block inside successively stored in the order of SortBlocks [K] according to block, wherein, the scan lines backward with the block inside of upset mark BlockNearest.IsFlip=True is extracted, and so far, completes the sequence of all scan lines.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105710370A (en) * | 2016-03-03 | 2016-06-29 | 西安铂力特激光成形技术有限公司 | Scanning method for layer-by-layer manufacture of three-dimensional object |
| CN110001066A (en) * | 2019-05-22 | 2019-07-12 | 浙江大学 | A kind of minimum subregion filling direction of 3 D-printing determines method |
| CN110312611A (en) * | 2016-12-20 | 2019-10-08 | 通用电气公司 | For implementing distributed account book manufacture historic villages and towns and system |
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| US20040100643A1 (en) * | 2002-11-22 | 2004-05-27 | Jones David Edward | Gamut description and visualization |
| CN104331555A (en) * | 2014-10-31 | 2015-02-04 | 河海大学常州校区 | Slicing processing method aiming at non-closed STL model with boundaries |
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| US20040100643A1 (en) * | 2002-11-22 | 2004-05-27 | Jones David Edward | Gamut description and visualization |
| CN104331555A (en) * | 2014-10-31 | 2015-02-04 | 河海大学常州校区 | Slicing processing method aiming at non-closed STL model with boundaries |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105710370A (en) * | 2016-03-03 | 2016-06-29 | 西安铂力特激光成形技术有限公司 | Scanning method for layer-by-layer manufacture of three-dimensional object |
| CN105710370B (en) * | 2016-03-03 | 2018-04-20 | 西安铂力特增材技术股份有限公司 | A kind of scan method for being used to successively manufacture three-dimensional body |
| CN110312611A (en) * | 2016-12-20 | 2019-10-08 | 通用电气公司 | For implementing distributed account book manufacture historic villages and towns and system |
| US11150634B2 (en) | 2016-12-20 | 2021-10-19 | General Electric Company | Methods and systems for implementing distributed ledger manufacturing history |
| CN110312611B (en) * | 2016-12-20 | 2022-03-08 | 通用电气公司 | Method and system for implementing distributed ledger manufacturing history |
| CN110001066A (en) * | 2019-05-22 | 2019-07-12 | 浙江大学 | A kind of minimum subregion filling direction of 3 D-printing determines method |
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Address after: 311258 No. 1398, Wenbin Road, Wenyan street, Xiaoshan District, Hangzhou, Zhejiang. Patentee after: First facing the three dimensional Polytron Technologies Inc Address before: 310000 layer 4899, times Avenue, Wenyan Town, Xiaoshan District, Hangzhou, Zhejiang. Patentee before: Hangzhou Shining 3D Technology Co., Ltd. |