CN104833865A - Flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and method thereof - Google Patents
Flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and method thereof Download PDFInfo
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- CN104833865A CN104833865A CN201510216825.1A CN201510216825A CN104833865A CN 104833865 A CN104833865 A CN 104833865A CN 201510216825 A CN201510216825 A CN 201510216825A CN 104833865 A CN104833865 A CN 104833865A
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Abstract
The invention discloses a flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and a method thereof. The measuring apparatus comprises a high-voltage DC power source (1), a high-voltage lead (2), an insulation self-adhesive tape (3), a high-voltage resistor (4), a first waveguide tube (5), a signal shielding case (6), a current-limiting resistor (7), a blocking capacitor (8), a coaxial cable (9), a second waveguide tube (10), a sample shielding case (11), a metal pillar (22), an electrode measuring unit (100), an amplifier (20), a digital oscilloscope (21), a high temperature drying box (24) and a laser (25). According to the invention, the high-voltage lead is led to the signal shielding case through the first waveguide tube, and the signal shielding case is connected to the sample drying box through the second waveguide tube, so that electromagnetic interference by external environment can be effectively prevented; and the middle portion of the high-voltage lead is connected to the high-voltage resistor, so that the electromagnetic interference in the environment can be coupled to a circuit, and the environment electromagnetic interference can be effectively prevented.
Description
Technical field
The present invention relates to distribution of space charge fields of measurement, particularly relate to a kind of the plane plate specimen distribution of space charge measurement mechanism and the method that prevent electromagnetic interference (EMI).
Background technology
Insulating material causes the formation of inherent vice due to the defect of its molecular structure.Under the effect of electric field, charge carrier moves along direction of an electric field, when these charge carriers run into formed defect, can be caught, define corresponding space charge by it.The Coulomb field that these space charges are formed and extra electric field will change the distribution of original electric field, thus cause the Severe distortion of material internal electric field, thus cause the development of electricity tree, cause the destruction of insulating.Therefore, space charge has a strong impact on the performance of insulating material, and the space charge test macro set up in insulating material is significant.
In existing measuring technique, based on the space charge measurement of pulse electroacoustic method, its system used only can be measured under homogenization temperature, there is limitation.Based on the plane plate specimen space charge measurement of pressure wave method, distribution of space charge signal is easily interfered, and signal attenuation is comparatively large, and particularly high-voltage connection, concentric cable easily introduce external electromagnetic interference, cause measuring system signal to noise ratio (S/N ratio) low, measure inaccurate.
Summary of the invention
The present invention proposes a kind of the plane plate specimen distribution of space charge measurement mechanism and the method that prevent electromagnetic interference (EMI), can distribution of space charge in Measurement accuracy insulating material, by being connected in series high-tension resistive in the high-voltage connection interstage, and pass through waveguide, effectively prevent external electromagnetic interference, improve the signal to noise ratio (S/N ratio) of distribution of space charge measurement mechanism, precision is high, and can achieve space charge measurement under different temperatures by corresponding heating arrangement.
Technical solution of the present invention is as follows:
Prevent a plane plate specimen distribution of space charge measurement mechanism for electromagnetic interference (EMI), comprise high-voltage DC power supply, high-voltage connection, insulating self-adhesive band, high-tension resistive, first wave conduit, signal shielding box, current-limiting resistance, capacitance, concentric cable, Second Wave conduit, sample shielding box, metal mainstay, electrode measurement unit, amplifier, digital oscilloscope, high temperature drying case, laser instrument.
Current-limiting resistance, capacitance are arranged in signal shielding box.
Electrode measurement unit is arranged in sample shielding box, and sample shielding box, metal mainstay are arranged in high temperature drying case, and sample shielding box is arranged on metal mainstay; The undesired signal ground connection that metal mainstay can will produce, meanwhile, facilitates the height of adjusting sample shielding box.
The tank wall of sample shielding box, high temperature drying case is provided with unthreaded hole, arranges laser instrument outside high temperature drying case unthreaded hole, the utilizing emitted light of laser instrument can by unthreaded hole vertical irradiation on electrode measurement unit.
High-voltage DC power supply, high-voltage connection are connected, connected by high-tension resistive after high-voltage connection blocks, high-tension resistive outer layer covers insulating self-adhesive band, the sidewall of signal shielding box arranges first wave conduit, first wave conduit communicates with signal shielding box, is connected after the sidewall of high-voltage connection through first wave conduit, signal shielding box with current-limiting resistance.
Arrange Second Wave conduit between signal shielding box, sample shielding box, and be communicated with by Second Wave conduit, concentric cable is through Second Wave conduit, and concentric cable one end connects current-limiting resistance, capacitance, other end connecting electrode measuring unit.Namely all there is perforate the both sides of the casing of high temperature drying case, sample shielding box, and a side hole is unthreaded hole, and as laser incidence channel, opposite side perforate is as cable passage.
Capacitance, amplifier, digital oscilloscope successively order are connected, and namely one end of capacitance connects current-limiting resistance, concentric cable, and the other end connects amplifier, and amplifier, digital oscilloscope are connected.
Electrode measurement unit comprises rear electrode, spring, contact electrode and front electrode.
Concentric cable connects rear electrode, and electrode, contact electrode are by arranging tested insulating material plane plate specimen between spring connection contact electrode, front electrode, and tested insulating material plane plate specimen both sides paste the first semiconducting electrode, the second semiconducting electrode respectively; First semiconducting electrode with contact electrode contact, the second semiconducting electrode with contact electrode contact.
Front electrode is fixedly installed on the unthreaded hole place of sample shielding box, and the center of front electrode is provided with perforate, and the utilizing emitted light of laser instrument can by the semiconducting electrode pasted outside perforate vertical irradiation to tested insulating material plane plate specimen.
Rear electrode is provided with groove towards the side of spring, and contact electrode is provided with convex surface towards the side of spring, and when spring is compressed, convex surface can be housed in groove.The semiconducting electrode of insulating material sample both sides is contacted with outside contact electrode, front electrode seal, uses spring assembly to clamp sample, easy to use.
Insulation column, insulator foot is provided with in sample shielding box; Electrode measurement unit is arranged on insulator foot by insulation column; Electrode measurement unit is made to be placed in sample shielding box; Sample shielding box is placed on metal mainstay, to keep ground connection; The measurement electric current of insulating electrode measuring unit is can be good at by insulation column, insulator foot.
More preferably, the material of first wave conduit, Second Wave conduit is brass, and thickness is 3-6 mm, internal diameter 20-30mm, and length-diameter ratio is 15:1-10:1, and length-diameter ratio refers to length and internal diameter ratio.
More preferably, the length of concentric cable is less than 0.5 m, and characteristic impedance is 50 Ω.
More preferably, capacitance is connected with amplifier by the BNC connector on signal shielding box.
Be connected by concentric cable between BNC connector with amplifier, the length of cable is less than 0.5m, and characteristic impedance is 50 Ω, ensures impedance matching.
The output direct current of high-voltage DC power supply is ± 120 kV, and maximum current is 2 mA, ripple factor≤0.2%.
More preferably, sample shielding box, signal shielding box are aluminium alloy.
The highest withstand voltage of capacitance is not less than 150 kV, electric capacity is not less than 0.8 nF, inductance is not more than 32 nH; Current-limiting resistance is 1 G Ω.
In signal shielding box, high-voltage connection and current-limiting resistance, current-limiting resistance and capacitance, concentric cable, capacitance is all connected by copper ring with amplifier, and copper ring is fixed in signal shielding box by insulating support rod.
Prevent a plane plate specimen distribution of space charge measuring method for electromagnetic interference (EMI), comprise the following steps:
Step 1, chooses insulating material sample and semiconducting electrode: the thickness of insulating material sample is 0.5 ~ 2 mm, and diameter is 170-210mm; The thickness of semiconducting electrode is the 1/2-2/3 of insulating material sample thickness, and diameter is at least 5mm, ensure semiconducting electrode and contact electrode, front electrode contacts completely; The first semiconducting electrode and the second semiconducting electrode is pasted respectively at the center, two sides of insulating material sample, the outer edge of insulating material sample exceeds the first semiconducting electrode, the second semiconducting electrode edge at least 60-80mm, by having pasted the first semiconducting electrode, the insulating material sample of the second semiconducting electrode has been placed in sample shielding box, and be held between contact electrode and front electrode by spring clamp, sample shielding box is placed on the metal mainstay in the high temperature drying case of controllable temperature;
Step 2, start high-voltage DC power supply, the voltage that high-voltage DC power supply produces is by being input to rear electrode after high-voltage connection, high-tension resistive, current-limiting resistance and concentric cable, high-voltage electric field is added to insulating material sample two ends by contact electrode, by the first semiconducting electrode iunjected charge in insulating material sample, form space charge;
Step 3, the generation of pressure pulse: laser instrument Emission Lasers is radiated on the second semiconducting electrode and produces pressure pulse, impulse of pressure wave width is 20-50 ns, amplitude is 1-10 MPa, pressure pulse acts on insulating material specimen surface, produces an acoustical signal and propagates in insulating material sample;
Step 4, when the acoustical signal that pressure pulse produces is propagated in insulating material sample, cause the nonaffine deformation in medium to propagate in media as well with the velocity of sound, induced charge on the first semiconducting electrode, produce electric signal, electric signal is sent to electrode contact electrode, again by entering amplifier after rear electrode, concentric cable, capacitance, electric signal input digital oscilloscope, measures electric signal by digital oscilloscope, namely the distribution of space charge in sample, achieves the measurement to distribution of space charge;
Step 5, regulates high temperature drying case, repeats step 1 to step 4, and under measuring different temperatures, plane plate specimen insulating material Space-charge distributes.
The first semiconducting electrode and the second semiconducting electrode is pasted at the center, two sides of insulating material sample respectively by hot pressing, silicone oil or vaseline in step 1.
Plane plate specimen distribution of space charge measuring process of the present invention is as follows:
Measured insulating material sample pastes the first semiconducting electrode, the second semiconducting electrode, start high-voltage DC power supply, high-voltage DC power supply reaches rear electrode by high-voltage connection, current-limiting resistance and concentric cable, and high-voltage electric field is added to insulating material sample two ends by contact electrode.Laser instrument acts on the second semiconducting electrode and produces pressure pulse, and propagate with sound pulse form in insulating material sample, and on the first semiconducting electrode induced charge (i.e. electric signal), be sent to electrode contact electrode, again by rear electrode, concentric cable, capacitance and amplifier, electric signal input digital oscilloscope, is measured the distribution of current signal direct ratio space charge, just can record the distribution of space charge in sample by digital oscilloscope.
The present invention causes interference in order to prevent external electromagnetic interference to the electric signal of space charge in sample, insulating material sample and electrode measurement whole unit are positioned over and have in the sample shielding box of electromagnetic shielding action, and again sample shielding box is positioned over and has in the high temperature drying case of temperature control and electromagnetic shielding action; The measuring circuit entirety such as the pressurizing loop such as high-voltage connection, current-limiting resistance and capacitance are positioned over and have in the signal shielding box of electromagnetic shielding action.
Compared with prior art, the present invention includes following beneficial effect:
(1) present invention achieves the plane plate specimen insulating material Space-charge distribution measuring under high direct voltage; Use sample shielding box electrodes system, use signal shielding box to place the measuring circuits such as pressurizing loop and capacitance such as high-voltage connection, prevent the electromagnetic interference (EMI) of external environment; High-voltage connection is introduced signal shielding box by waveguide by the present invention, and by waveguide connection signal shielding box and samples dried case, effectively can prevent the electromagnetic interference (EMI) of external environment, simultaneously, high-voltage connection connects high-tension resistive after the interstage, electromagnetic interference (EMI) in environment, by insulating self-adhesive tape insulation, can be coupled in circuit, effectively prevent environment electromagnetics from disturbing by high-tension resistive.
(2) the present invention can realize the measurement of plane plate specimen insulating material Space-charge under different temperatures by the heating of high temperature drying case.
(3) use laser instrument to produce pressure pulse, utilize the energy stability of laser pulse to ensure that pressure pulse width is 20-50 ns, amplitude is 1-10 Mpa, guarantees that the Measurement Resolution of plane plate specimen is better than 100 μm.
(4) use the electrode system of band spring assembly, reduce difficulty of processing, ensure that sample holder is firm.
Accompanying drawing explanation
Fig. 1 is a kind of structural representation preventing the plane plate specimen distribution of space charge measurement mechanism of electromagnetic interference (EMI) of the present invention;
Fig. 2 is sample shielding box inner assembly structural representation of the present invention;
Fig. 3 is high-voltage connection, insulating self-adhesive band, high-tension resistive, first wave guide pipe connecting structure detailed schematic.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
As shown in Figure 1, prevent a plane plate specimen distribution of space charge measurement mechanism for electromagnetic interference (EMI), comprise high-voltage DC power supply 1, high-voltage connection 2, insulating self-adhesive band 3, high-tension resistive 4, first wave conduit 5, signal shielding box 6, current-limiting resistance 7, capacitance 8, concentric cable 9, Second Wave conduit 10, sample shielding box 11, metal mainstay 22, electrode measurement unit 100, amplifier 20, digital oscilloscope 21, high temperature drying case 24, laser instrument 25.
Current-limiting resistance 7, capacitance 8 are arranged in signal shielding box 6.
Electrode measurement unit 100 is arranged in sample shielding box 11, and sample shielding box 11, metal mainstay 22 are arranged in high temperature drying case 24, and sample shielding box 11 is arranged on metal mainstay 22; The undesired signal ground connection that metal mainstay 22 can will produce, meanwhile, facilitates the height of adjusting sample shielding box 11.
The tank wall of sample shielding box 11, high temperature drying case 24 is provided with unthreaded hole, arranges laser instrument 25 outside high temperature drying case 24 unthreaded hole, the utilizing emitted light of laser instrument 25 can by unthreaded hole vertical irradiation on electrode measurement unit 100.
As shown in Figure 3, high-voltage DC power supply 1, high-voltage connection 2 are connected, connected by high-tension resistive 4 after high-voltage connection 2 blocks, high-tension resistive 4 outer layer covers insulating self-adhesive band 3, the sidewall of signal shielding box 6 arranges first wave conduit 5, first wave conduit 5 communicates with signal shielding box 6, is connected after the sidewall of high-voltage connection 2 through first wave conduit 5, signal shielding box 6 with current-limiting resistance 7, capacitance 8.
Between signal shielding box 6, sample shielding box 11, Second Wave conduit 10 is set, and be communicated with by Second Wave conduit 10, concentric cable 9 is through Second Wave conduit 10, and concentric cable 9 one end connects current-limiting resistance 7, capacitance 8, other end connecting electrode measuring unit 100.Namely all there is perforate the both sides of the casing of high temperature drying case 24, sample shielding box 11, and a side hole is unthreaded hole, and as laser incidence channel, opposite side perforate is as cable passage.
Capacitance 8, amplifier 20, digital oscilloscope 21 successively order are connected, and namely one end of capacitance 8 connects current-limiting resistance 7, concentric cable 9, and the other end connects amplifier 20, and amplifier 20, digital oscilloscope 21 are connected.
As shown in Figure 2, electrode measurement unit 100 comprises rear electrode 13, spring 14, contact electrode 15 and front electrode 19.
Concentric cable 9 connects rear electrode 13, electrode 13, contact electrode 15 are connected by spring 14, as shown in Figure 1, arrange tested insulating material plane plate specimen 17 between contact electrode 15, front electrode 19, tested insulating material plane plate specimen 17 both sides paste the first semiconducting electrode 16, second semiconducting electrode 18 respectively; First semiconducting electrode 16 with contact electrode 15 and contact, the second semiconducting electrode 18 with contact electrode 19 and contact.
Front electrode 19 is fixedly installed on the unthreaded hole place of sample shielding box 11, the center of front electrode 19 is provided with perforate, and the utilizing emitted light of laser instrument 25 can be irradiated to (semiconducting electrode pasted outside tested insulating material plane plate specimen 17) on the second conductive electrode 18 by perforate.
Rear electrode 13 is provided with groove towards the side of spring 14, and contact electrode 15 is provided with convex surface towards the side of spring 14, and when spring 14 is by compression, convex surface can be housed in groove.Make the semiconducting electrode of insulating material sample 17 both sides and outside contact electrode 15, front electrode 19 close contact, use spring assembly to clamp sample, easy to use.
Insulation column 12, insulator foot 23 is provided with in sample shielding box 11; Electrode measurement unit 100 is arranged on insulator foot 23 by insulation column 12; Electrode measurement unit 100 is made to be placed in sample shielding box 11; Sample shielding box 11 is placed on metal mainstay 22, to keep ground connection; The measurement electric current of insulating electrode measuring unit 100 is can be good at by insulation column 12, insulator foot 23.
The material of first wave conduit 5, Second Wave conduit 10 is brass, and thickness is 3-6 mm, internal diameter 20-30mm, and length-diameter ratio is 15:1-10:1.
The length of concentric cable 9 is less than 0.5 m, and characteristic impedance is 50 Ω.
Capacitance 8 is connected with amplifier 20 by the BNC connector on signal shielding box 6.
Be connected by cable between BNC connector with amplifier 20, the length of cable is less than 0.5 m, and characteristic impedance is 50 Ω, ensures impedance matching.
The output direct current of high-voltage DC power supply 1 is ± 120 kV, and maximum current is 2 mA, ripple factor≤0.2%.
Sample shielding box, signal shielding box are aluminum alloy material.
The highest withstand voltage of capacitance 8 is not less than 150 kV, electric capacity is not less than 0.8 nF, inductance is not more than 32 nH; Current-limiting resistance is 1 G Ω.
In signal shielding box 6, high-voltage connection 2 and current-limiting resistance 7, current-limiting resistance 7 and capacitance 8, concentric cable 9, capacitance 8 is all connected by copper ring 30 with amplifier 20, and copper ring 30 is fixed in signal shielding box 6 by insulating support rod.Namely at the tie point of high-voltage connection 2 with current-limiting resistance 7, the tie point of current-limiting resistance 7, capacitance 8, concentric cable 9 three, capacitance 8 all arranges copper ring 30 with the tie point place of amplifier 20.
Prevent a plane plate specimen distribution of space charge measuring method for electromagnetic interference (EMI), comprise the following steps:
Step 1, chooses insulating material sample and semiconducting electrode: the thickness of insulating material sample is 0.5 ~ 2 mm, and diameter is 170-210mm; The thickness of semiconducting electrode is the 1/2-2/3 of insulating material sample thickness, and diameter is at least 5mm, ensure semiconducting electrode and contact electrode 14, front electrode 19 contacts completely; The first semiconducting electrode 16 and the second semiconducting electrode 18 is pasted respectively at the center, two sides of insulating material sample, the outer edge of insulating material sample 17 exceeds the first semiconducting electrode 16, second semiconducting electrode 18 edge at least 60-80mm, the insulating material sample 17 having pasted the first semiconducting electrode 16, second semiconducting electrode 18 is placed in sample shielding box 11, and be clamped between contact electrode 15 and front electrode 19 by spring 14, sample shielding box 11 is placed on the metal mainstay 22 in the high temperature drying case 24 of controllable temperature;
Step 2, start high-voltage DC power supply 1, the voltage that high-voltage DC power supply 1 produces is by being input to rear electrode 13 after high-voltage connection 2, high-tension resistive 4, current-limiting resistance 7 and concentric cable 9, high-voltage electric field is added to insulating material sample 17 two ends by contact electrode 15, by the first semiconducting electrode 16 iunjected charge in insulating material sample 17, form space charge;
Step 3, the generation of pressure pulse: laser instrument 25 Emission Lasers is radiated on the second semiconducting electrode 18 and produces pressure pulse, impulse of pressure wave width is 20-50 ns, amplitude is 1-10 MPa, pressure pulse acts on insulating material sample 17 on the surface, produces an acoustical signal and propagates in insulating material sample 17;
Step 4, when the acoustical signal that pressure pulse produces is propagated in insulating material sample 17, the nonaffine deformation in medium is caused to propagate in media as well with the velocity of sound, induced charge on the first semiconducting electrode 16, produce electric signal, electric signal is sent to electrode contact electrode 15, again by entering amplifier 20 after rear electrode 13, concentric cable 9, capacitance 8, electric signal input digital oscilloscope 21, electric signal is measured by digital oscilloscope 20, namely the distribution of space charge in sample, achieves the measurement to distribution of space charge;
Step 5, regulates high temperature drying case 24, repeats step 1 to step 4, and under measuring different temperatures, plane plate specimen insulating material Space-charge distributes.
The first semiconducting electrode 16 and the second semiconducting electrode 18 is pasted at the center, two sides of insulating material sample respectively by hot pressing, silicone oil or vaseline in step 1.Step 5, regulates high temperature drying case 24, repeats step 1 to step 4, and under measuring different temperatures, plane plate specimen insulating material Space-charge distributes.
Namely plane plate specimen distribution of space charge measuring process of the present invention is as follows:
The first semiconducting electrode 16, second semiconducting electrode 18 pasted by measured insulating material sample 17, start high-voltage DC power supply 1, high-voltage DC power supply 1 reaches rear electrode 13 by high-voltage connection 2, current-limiting resistance 7 and concentric cable 9, and high-voltage electric field is added to insulating material sample 17 two ends by contact electrode 15.Laser instrument 25 acts on the second semiconducting electrode 18 and produces pressure pulse, and propagate with sound pulse form in insulating material sample 17, and on the first semiconducting electrode 16 induced charge (i.e. electric signal), be sent to electrode contact electrode 15, again by rear electrode 13, concentric cable 9, capacitance 8 and amplifier 20, electric signal input digital oscilloscope 21, is measured the distribution of current signal direct ratio space charge, just can record the distribution of space charge in sample by digital oscilloscope 20.
The present invention causes interference in order to prevent external electromagnetic interference to the electric signal of space charge in sample, insulating material sample 17 and electrode measurement whole unit are positioned over and have in the sample shielding box 11 of electromagnetic shielding action, and again sample shielding box 11 is positioned over and has in the high temperature drying case 24 of temperature control and electromagnetic shielding action; The measuring circuit entirety such as the pressurizing loop such as high-voltage connection, current-limiting resistance and capacitance are positioned over and have in the signal shielding box 6 of electromagnetic shielding action.
Those skilled in the art can change the present invention or modification design but do not depart from thought of the present invention and scope.Therefore, if these amendments of the present invention and modification belong within the claims in the present invention and equivalent technical scope thereof, then the present invention is also intended to comprise these change and modification.
Claims (10)
1. one kind prevents the plane plate specimen distribution of space charge measurement mechanism of electromagnetic interference (EMI), it is characterized in that, comprise high-voltage DC power supply (1), high-voltage connection (2), insulating self-adhesive band (3), high-tension resistive (4), first wave conduit (5), signal shielding box (6), current-limiting resistance (7), capacitance (8), concentric cable (9), Second Wave conduit (10), sample shielding box (11), metal mainstay (22), electrode measurement unit (100), amplifier (20), digital oscilloscope (21), high temperature drying case (24), laser instrument (25);
Described current-limiting resistance (7), capacitance (8) are arranged in signal shielding box (6);
Electrode measurement unit (100) is arranged in sample shielding box (11), and sample shielding box (11), metal mainstay (22) are arranged in high temperature drying case (24), and sample shielding box (11) is arranged on metal mainstay (22);
The tank wall of described sample shielding box (11), high temperature drying case (24) is provided with unthreaded hole, arrange laser instrument (25) outside described high temperature drying case (24) unthreaded hole, the utilizing emitted light of laser instrument (25) can by unthreaded hole vertical irradiation on described electrode measurement unit (100);
Described high-voltage DC power supply (1), high-voltage connection (2) are connected, connected by high-tension resistive (4) after high-voltage connection (2) blocks, described high-tension resistive (4) outer layer covers insulating self-adhesive band (3), the sidewall of described signal shielding box (6) arranges first wave conduit (5), (6 communicate, and are connected after the sidewall of described high-voltage connection (2) through first wave conduit (5), signal shielding box (6) with current-limiting resistance (7) for first wave conduit (5) and described signal shielding box;
Between described signal shielding box (6), sample shielding box (11), Second Wave conduit (10) is set, and be communicated with by Second Wave conduit (10), described concentric cable (9) is through Second Wave conduit (10), concentric cable (9) one end connects current-limiting resistance (7), capacitance (8), other end connecting electrode measuring unit (100);
Described capacitance (8), amplifier (20), digital oscilloscope (21) successively order are connected.
2. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
Described electrode measurement unit (100) comprises rear electrode (13), spring (14), contact electrode (15) and front electrode (19);
Concentric cable (9) connects described rear electrode (13), and electrode (13), contact electrode (15) are connected by spring (14), arrange tested insulating material plane plate specimen (17) between contact electrode (15), front electrode (19),
Front electrode (19) is fixedly installed on the unthreaded hole place of sample shielding box (11), the center of front electrode (19) is provided with perforate, and the utilizing emitted light of laser instrument (25) can by described perforate vertical irradiation on the semiconducting electrode of tested insulating material plane plate specimen (17) outside stickup.
3. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
Described rear electrode (13) is provided with groove towards the side of spring (14), and described contact electrode (15) is provided with convex surface towards the side of spring (14), and when described spring (14) is by compression, described convex surface can be housed in described groove.
4. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
Insulation column (12), insulator foot (23) is provided with in described sample shielding box (11); Electrode measurement unit (100) is arranged on insulator foot (23) by insulation column (12); (100 are placed in sample shielding box (11) to make electrode measurement unit; Sample shielding box (11) is placed on metal mainstay (22), to keep ground connection.
5. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
The material of described first wave conduit (5), Second Wave conduit (10) is brass, and thickness is 3-6 mm, internal diameter 20-30mm, and length-diameter ratio is 15:1-10:1.
6. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
Described capacitance (8) is connected with amplifier 20 by the BNC connector on signal shielding box (6).
7. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
The length of described concentric cable (9) is less than 0.5 m, and characteristic impedance is 50 Ω;
The output direct current of described high-voltage DC power supply (1) is ± 120 kV, and maximum current is 2 mA, ripple factor≤0.2%;
The highest withstand voltage is not less than 150 kV to described capacitance (8), electric capacity is not less than 0.8 nF, inductance is not more than 32 nH; Current-limiting resistance is 1 G Ω.
8. the plane plate specimen distribution of space charge measurement mechanism preventing electromagnetic interference (EMI) according to claim 1, is characterized in that,
In signal shielding box (6), high-voltage connection (2) and current-limiting resistance (7), current-limiting resistance (7) and capacitance (8), concentric cable (9), capacitance (8) is all connected by copper ring (30) with amplifier (20), and copper ring (30) is fixed in signal shielding box (6) by insulating support rod.
9. prevent a plane plate specimen distribution of space charge measuring method for electromagnetic interference (EMI), it is characterized in that, comprise the following steps:
Step 1, chooses insulating material sample and semiconducting electrode: the thickness of insulating material sample is 0.5 ~ 2 mm, and diameter is 170-210mm, the thickness of semiconducting electrode is the 1/2-2/3 of insulating material sample thickness, and diameter is at least 5mm, ensure semiconducting electrode and contact electrode (14), front electrode (19) contacts completely, the first semiconducting electrode (16) and the second semiconducting electrode (18) is pasted respectively at the center, two sides of insulating material sample, the outer edge of insulating material sample 17 exceeds the first semiconducting electrode (16), second semiconducting electrode (18) edge at least 60-80mm, the first semiconducting electrode (16) will have been pasted, the insulating material sample (17) of the second semiconducting electrode (18) is placed in sample shielding box (11), and be clamped between contact electrode (15) and front electrode (19) by spring (14), sample shielding box (11) is placed on the metal mainstay (22) in the high temperature drying case (24) of controllable temperature,
Step 2, start high-voltage DC power supply (1), the voltage that high-voltage DC power supply (1) produces is by being input to rear electrode (13) after high-voltage connection (2), high-tension resistive (4), current-limiting resistance (7) and concentric cable (9), high-voltage electric field is added to insulating material sample (17) two ends by contact electrode (15), by the first semiconducting electrode (16) iunjected charge in insulating material sample (17), form space charge;
Step 3, the generation of pressure pulse: laser instrument (25) Emission Lasers is radiated on the second semiconducting electrode (18) and produces pressure pulse, impulse of pressure wave width is 20-50 ns, amplitude is 1-10 MPa, described pressure pulse acts on insulating material sample (17) on the surface, produces an acoustical signal and propagates in insulating material sample (17);
Step 4, when the acoustical signal that pressure pulse produces is propagated in insulating material sample (17), the nonaffine deformation in medium is caused to propagate in media as well with the velocity of sound, at the upper induced charge of the first semiconducting electrode (16), produce electric signal, described electric signal is sent to electrode contact electrode (15), again by rear electrode (13), concentric cable (9), amplifier (20) is entered after capacitance (8), electric signal input digital oscilloscope (21), electric signal is measured by digital oscilloscope (20), namely the distribution of space charge in sample, achieve the measurement to distribution of space charge,
Step 5, regulates high temperature drying case (24), repeats step 1 to step 4, and under measuring different temperatures, plane plate specimen insulating material Space-charge distributes.
10. a kind of plane plate specimen distribution of space charge measuring method preventing electromagnetic interference (EMI) according to claim 9, is characterized in that,
The first semiconducting electrode (16) and the second semiconducting electrode (18) is pasted at the center, two sides of insulating material sample respectively by hot pressing, silicone oil or vaseline in described step 1.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108089069A (en) * | 2018-01-09 | 2018-05-29 | 南京南瑞集团公司 | A kind of combined electromagnetic signal shielding device of automobile applied to the long cable Space-charge distribution measuring of DC ultra-high-voltage |
| CN108490277A (en) * | 2018-04-02 | 2018-09-04 | 西安交通大学 | Space charge measurement device and its measurement method suitable for interfacial effect research |
| CN109142894A (en) * | 2018-07-05 | 2019-01-04 | 清华大学 | The test method of DC wire corona space charge distribution based on coupling principle of equipotentiality |
| CN110058093A (en) * | 2018-01-19 | 2019-07-26 | 上海交通大学 | For solid insulating material space charge detection system under vacuum, varying temperature environment |
| CN111537854A (en) * | 2020-05-14 | 2020-08-14 | 哈尔滨理工大学 | Temperature-variable multifunctional sample chamber |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0720181A (en) * | 1993-06-30 | 1995-01-24 | Fujikura Ltd | Method for measuring space charge |
| JP2000046884A (en) * | 1998-07-28 | 2000-02-18 | Showa Electric Wire & Cable Co Ltd | Method for correcting charge density in space charge measurement |
| CN101738546A (en) * | 2009-12-18 | 2010-06-16 | 西安交通大学 | Device, system and method for measuring space charges by using electro-acoustic (PEA) method |
| CN103529255A (en) * | 2013-09-16 | 2014-01-22 | 华北电力大学 | High-voltage pulse power supply for measuring space charge under alternating-current electric field |
| CN103605008A (en) * | 2013-11-20 | 2014-02-26 | 上海电力学院 | System and method for measuring high voltage cable space charges based on electroacoustic pulse method |
| CN204882728U (en) * | 2015-04-30 | 2015-12-16 | 南京南瑞集团公司 | Prevent electromagnetic interference's dull and stereotyped sample space charge distribution measuring device |
-
2015
- 2015-04-30 CN CN201510216825.1A patent/CN104833865B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0720181A (en) * | 1993-06-30 | 1995-01-24 | Fujikura Ltd | Method for measuring space charge |
| JP2000046884A (en) * | 1998-07-28 | 2000-02-18 | Showa Electric Wire & Cable Co Ltd | Method for correcting charge density in space charge measurement |
| CN101738546A (en) * | 2009-12-18 | 2010-06-16 | 西安交通大学 | Device, system and method for measuring space charges by using electro-acoustic (PEA) method |
| CN103529255A (en) * | 2013-09-16 | 2014-01-22 | 华北电力大学 | High-voltage pulse power supply for measuring space charge under alternating-current electric field |
| CN103605008A (en) * | 2013-11-20 | 2014-02-26 | 上海电力学院 | System and method for measuring high voltage cable space charges based on electroacoustic pulse method |
| CN204882728U (en) * | 2015-04-30 | 2015-12-16 | 南京南瑞集团公司 | Prevent electromagnetic interference's dull and stereotyped sample space charge distribution measuring device |
Non-Patent Citations (2)
| Title |
|---|
| ZHU ZHI"EN 等: "Comparison Between Thermally Stimulated Discharge Method and Photo-stimulated Discharge Method for Measuring Space Charge Traps Energy", 《高电压技术》 * |
| 刘君 等: "基于电声脉冲法的空间电荷测量装置", 《高电压技术》 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108089069A (en) * | 2018-01-09 | 2018-05-29 | 南京南瑞集团公司 | A kind of combined electromagnetic signal shielding device of automobile applied to the long cable Space-charge distribution measuring of DC ultra-high-voltage |
| CN110058093A (en) * | 2018-01-19 | 2019-07-26 | 上海交通大学 | For solid insulating material space charge detection system under vacuum, varying temperature environment |
| CN108490277A (en) * | 2018-04-02 | 2018-09-04 | 西安交通大学 | Space charge measurement device and its measurement method suitable for interfacial effect research |
| CN109142894A (en) * | 2018-07-05 | 2019-01-04 | 清华大学 | The test method of DC wire corona space charge distribution based on coupling principle of equipotentiality |
| CN111537854A (en) * | 2020-05-14 | 2020-08-14 | 哈尔滨理工大学 | Temperature-variable multifunctional sample chamber |
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