CN104730279A - Chirped pulse velocity interferometer - Google Patents
Chirped pulse velocity interferometer Download PDFInfo
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Abstract
The invention discloses a chirped pulse velocity interferometer. In the chirped pulse velocity interferometer, broadband laser pulses output by a broadband pulse laser light source are changed into linear polarization linear chirped pulses after passing through a polarizer and a pulse stretcher; polarization light S and polarization light P which are perpendicular in polarization direction are produced after the linear chirped pulses pass through a polarization splitting prism, and then the polarization light S and the polarization light P are successively emitted into the surface of a tested sample; the beat-wave interferometry is conducted on reflected light at a certain included angle, and produced beat-wave interferometric fringes are recorded through an imaging type spectrometer. A certain delay time difference exists before the polarization light S and the polarization light P are emitted into the surface of the sample, and synchronous transmission is achieved through optical path compensation after the polarization light S and the polarization light P are reflected by the surface of the sample. The oscillation penetrating direction of the polarizer is perpendicular to that of an analyzer. By means of the chirped pulse velocity interferometer, the time distinguishing of sub-picosecond scale can be achieved, the imaging type spectrometer serves as the corresponding recording system, an expensive streak camera recording system is avoided, and therefore the cost of a test system is effectively controlled.
Description
Technical field
The invention belongs to laser testing device field, be specifically related to a kind of chirped pulse velocity interferometer.
Background technology
Laser velocity interferometer is the difference frequency change procedure utilizing photomultiplier-oscillograph recording two moment laser beam, to realize the optic testing system of high-speed moving object surface (making laser beam produce the moving surface of Doppler shift) velocity survey.The appearance of velocity interferometer once solved the frequency response problems of displacement interference instrument existence well.But when measuring free surface velocity, velocity interferometer requires that sample surfaces grinding and polishing becomes minute surface, and can not differentiate acceleration-deceleration process.1972, Barker and Hollenbach established velocity interferometer (VISAR) system of any reflecting surface, and it is used to replace velocity interferometer to measure high-speed moving object superficial velocity.VISAR both can measure the sample of specularly reflecting surface, also the sample of diffuse reflection surface can be measured, acceleration-deceleration process (Laser interferometer for measuring high velocitiesof any reflecting surface can be differentiated simultaneously, J.Appl.Phys., L.M.Barker and R.E.Hollenbach).
At first, owing to being subject to the restriction of photomultiplier-oscillograph recording system, the time resolution of VISAR can only accomplish nanosecond order, can not meet the observation requirement of people in many phenomenons.In order to improve this situation, nineteen eighty-three, the light path of Bloomquist and Sheffield to VISAR is changed, and replace photomultiplier-oscillograph recording system with electronics streak camera, improved system is called as Optically recording velocity interferometer (ORVIS), and its time resolution is mainly limited to streak camera.Therefore, reach level (the Optically recording interferometer for velocity measurements withsubnanosecond resolution of Picosecond, J.Appl.Phys., D.D.Bloomquist and S.A.Sheffield).1998, the people such as Celliers utilize again the spatial resolving power of streak camera, by introducing imaging system in VISAR, construct imaging-type VISAR, and in the experiment of measuring laser-driven shock wave, the one-dimensional space simultaneously achieving Picosecond and sub-micron differentiates (Accurate measurement oflaser-driven shock trajectories with velocity interferometry, Appl.Phys.Lett., P.M.Celliers, G.W.Collins, L.B.Da Silva, D.M.Gold, and R.Cauble).After this, these technology are widely used in the middle of the Physical Experiment relevant to shock motion, as the shock wave temporal regulation experiment etc. in high pressure state equation experiment, material kinetics performance test and inertial confinement fusion.
In VISAR system, streak camera is absolutely necessary as important ingredient, and it affects the time resolution of system.But the expensive price of streak camera makes the construction cost of VISAR remain high, and strongly limit this systematic difference scope.
Summary of the invention
The invention provides a kind of chirped pulse velocity interferometer, can be applicable to the measurement of high-speed moving object superficial velocity, body surface can be any reflecting surface; Use spectrometer register system, while reaching high time resolution, effectively control system building cost.
For achieving the above object, the invention process row provide following technical scheme:
A kind of chirped pulse velocity interferometer, the laser pulse that wideband pulse LASER Light Source exports becomes the linear-chirped-pulse of linear polarization by the polarizer and pulse stretcher, then orthogonal two bundles in polarization direction are divided into, a branch of is S polarized light, another bundle is P polarized light, S polarized light experiences a time delay device, lags behind the transmission of P polarized light.Two-beam is surperficial at testing sample by convex lens focus in the mode of co-axial propagation, collects and collimates the reflected light carrying sample surfaces movable information, compensates the time delay between two-beam, synchronizes them transmission.Projected on identical polarization direction by S, P polarized light after synchronous, and carry out beat frequency interference superposition with certain angle, interference fringe is imaged type spectrometer and receives.Spectrum unscrambling is carried out to the interference fringe obtained, obtains the speed evolutionary process of sample surfaces.
In technique scheme, described wideband pulse LASER Light Source is super continuous pulse laser or femto-second laser, the pulse spectrum scope that wherein super continuous pulse laser exports is 400nm ~ 2000nm, centre wavelength is adjustable, by using different broadband filters to carry out filtering, the laser pulse of different centre wavelength and bandwidth can be obtained.
Alternatively, described pulse stretcher is the optical dispersion such as grating stretcher, dispersive glass element, changes the parameter of stretcher, namely can realize the adjustment to chirped pulse width.
Described linear-chirped-pulse is divided into S polarized light and P polarized light to be the compensation of conveniently delay-time difference between two-beam.
Alternatively, described time delay device is the low chromatic dispersion materials such as quartz glass, adds certain thickness low chromatic dispersion material in S polarization light path, the light path making it experience increases, and produce certain delay-time difference between P polarized light, change the thickness of material, namely can realize the adjustment to time delay.
Described testing sample surface is on the focal plane of convex lens, and incident beam focus on testing sample surface, is then collected the scattered light of sample surfaces, and realized the collimation of light beam by convex lens.
Being compensated for as in P polarization light path of described time delay adds optical path compensation element, and its parameter is identical with the parameter of described time delay device, comprises material category, quality and thickness etc.; Optical path compensation element both compensate for the delay-time difference between S polarized light and P polarized light, maintained again the analogue zero path difference condition of two light beams, made this velocity interferometer can measure the speed of any reflecting surface.
Described S, P polarized light projects on identical polarization direction and realizes by placing analyzer on the transmission path that two-beam is common, the direction that thoroughly the shakes angle at 45 ° of analyzer and the described polarizer, thus make the drop shadow intensity of S, P polarized light on identical polarization direction suitable.
The interference fringe of described imaging-type spectrometer record is two dimensional image, wherein spectrum axle along stripe direction perpendicular to slit.
Alternatively, the Spectra Unfolding Methods of described interference fringe is fourier transform method and small wave converting method.
In technical scheme of the present invention, the motion of sample surfaces makes the laser beam incided on it produce Doppler shift, and the size of frequency shift amount is relevant with the speed of sample surfaces.Because S polarized light and P polarized light are linear-chirped-pulse (pulsed frequency along with linearly change), in single laser beam, the Doppler shift that different pulse frequency produces reflects not object speed in the same time; The existence of delay-time difference between S, P polarized light, make the same frequency composition in two bundle laser pulses experienced by not Doppler shift in the same time, the Doppler shift amount that the same frequency composition namely in S, P polarized light produces is different.Get the projection of S, P polarized light on equipolarization direction, make to interfere between them.Imaging-type spectrometer is recorded to the conoscope image of two dimension, it represents the beat frequency interference between two bundle laser pulses (same frequency composition) along spectrograph slit direction, represent different frequency contents along spectrum direction of principal axis, (character according to linear-chirped-pulse) is equivalent to the different moment.Spectrum unscrambling is carried out to two-dimentional conoscope image, thus obtains not sample surfaces speed in the same time.
Compared with existing velocity interferometer (as VISAR), technique scheme has the following advantages:
1, the inventive method uses spectrometer register system, and relative to the streak camera register system of the costliness that VISAR uses, price advantage is obvious, thus effectively controls the construction cost of velocity interferometer.
2, the inventive method is by changing the bandwidth of incident laser pulse or the pulsewidth of chirped pulse, can the time resolution of regulating system, the highlyest can reach femtosecond magnitude; And the time resolution of VISAR is limited to the Picosecond ability of streak camera.
Accompanying drawing explanation
Fig. 1 is the chirped pulse velocity interferometer fundamental diagram in the embodiment of the present invention 1;
Wherein: 1, super continuous pulse laser; 2, the polarizer; 3, broadband filter; 4, pulse stretcher; 5, catoptron; 6, polarization splitting prism; 7, time delay device; 8, catoptron; 9, catoptron; 10, polarization splitting prism; 11, catoptron; 12, convex lens; 13, testing sample; 14, polarization splitting prism; 15, optical path compensation element; 16, catoptron; 17, catoptron; 18, polarization splitting prism; 19, analyzer; 20, imaging-type spectrometer.
Fig. 2 is the sample surfaces speed change curves of simulation in the embodiment of the present invention 1;
Fig. 3 is the Doppler shift of simulating each wavelength of chirped pulse in the embodiment of the present invention 1;
Fig. 4 is the two-dimentional conoscope image of simulated light spectrometer record in the embodiment of the present invention 1;
Fig. 5 is the domain space distribution of simulating two-dimensional conoscope image in the embodiment of the present invention 1;
Fig. 6 is the change of move of stripe with wavelength of simulating reconstruction in the embodiment of the present invention 1.
Fig. 7 is that in the embodiment of the present invention 2, femtosecond laser drives the chirped pulse velocity interferometer fundamental diagram that in shock wave, free surface velocity is measured
Wherein: 1, femto-second laser; 2, beam splitting chip; 3, catoptron; 4, catoptron; 5, catoptron; 6, catoptron; 7, convex lens; 8, catoptron; 9, the polarizer; 10, pulse stretcher; 11, catoptron; 12, polarization splitting prism; 13, time delay device; 14, catoptron; 15, catoptron; 16, polarization splitting prism; 17, catoptron; 18, convex lens; 19, testing sample; 20, polarization splitting prism; 21, optical path compensation element; 22, catoptron; 23, catoptron; 24, polarization splitting prism; 25, analyzer; 26, imaging-type spectrometer.
Embodiment
For enabling above-mentioned purpose of the present invention, feature and advantage become apparent more, are described in detail the specific embodiment of the present invention below in conjunction with accompanying drawing.
Employ much concrete parameter in the following description so that fully understand the present invention, but these parameters are example, it should not limit the scope of protection of the invention at this.
Embodiment 1
Shown in Fig. 1, a kind of chirped pulse velocity interferometer of the present invention, super continuous pulse laser 1 exports the super continuous laser pulse of certain centre wavelength, by filtering into the laser pulse of required bandwidth after broadband filter 2, the recycling polarizer 3 and pulse stretcher 4 are become the linear-chirped-pulse of linear polarization.Chirped pulse is after catoptron 5, be polarized Amici prism 6 and be divided into the orthogonal S polarized light in polarization direction and P polarized light, wherein, S polarized light arrives polarization splitting prism 10 by time delay device 7 and catoptron 8, after P polarized light is reflected by catoptron 9, realize closing by polarization splitting prism 10 and S polarized light and restraint, the S polarized light after time delay device 7 makes conjunction bundle lags behind the transmission of P polarized light.Conjunction Shu Guang is focused on testing sample surface 13 by convex lens 12, and according to Doppler's principle, the motion of sample surfaces makes its reflected light produce Doppler shift, and how many frequency shift amounts reflects the size of superficial velocity.Convex lens 12 are collected and collimated reflected light, collimated light beam is after catoptron 11 and polarization splitting prism 14, S, P polarized light separates again, transmit respectively, wherein, S polarized light arrives polarization splitting prism 18 by catoptron 17, another road P polarized light then arrives polarization splitting prism 18 by optical path compensation element 15 and catoptron 16, optical path compensation element 15 is elements identical with time delay device 7, for compensating the delay-time difference between two-way light, makes them realize synchronous transmission.S, P polarized light is by after polarization splitting prism 18, symport is carried out with certain angle, experience analyzer 19 enters imaging-type spectrometer 20, thus be recorded to the interference image of two dimension, analyzer 19 makes S, P polarized light produce the light beam of identical polarized component, make it to carry out coherence stack, rotate analyzer 19 and make its thoroughly shake direction and the polarizer 3 angle at 45 °, interference fringe can obtain good contrast.
Above the optical path arrangement of chirped pulse velocity interferometer of the present invention is described in detail, measuring principle for a better understanding of the present invention, below the process tested the speed to chirped pulse velocity interferometer of the present invention is carried out numerical simulation.
In the present embodiment, the centre wavelength of chirped pulse is λ
0=400nm, bandwidth Delta lambda=60nm, pulsewidth τ
c=300ps; Delay-time difference between S polarized light and P polarized light is 40ps; The minimum wavelength of imaging-type spectrometer is distinguished as 0.3nm, takes the photograph spectral width 120nm.
Solid line in Fig. 2 is simulate given testing sample superficial velocity, when the linear-chirped-pulse of S polarization and P polarization is reflected by this velocity interface, according to the character (pulse wavelength and time are one-to-one relationship) of Doppler's principle and linear-chirped-pulse, produce corresponding wavelength in pulse spectrum to move, as shown in Figure 3, wherein, the centre wavelength of P polarized light is synchronous with the time zero in Fig. 2.Before arrival sample surfaces, S polarized light lags behind the transmission of P polarized light because of elapsed-time standards delayer 7, so, for identical spectral component, the latter will arrive sample surfaces prior to the former, namely the same frequency spectrum composition in S polarized light and P polarized light experienced by different Doppler shifts, shown in figure 3.P polarized light is by after optical path compensation element 15 (identical with time delay device 7), and two-beam is synchronous transmission in time.When they carry out beat frequency interference (interference in two-beam between same frequency spectrum composition) with certain angle, and during by spectrometer dispersion record, Doppler shift official post striped between S, P polarized light creates movement, and as shown in Figure 4, striped bends along spectrum direction of principal axis.
Fig. 5 is that (spectrograph slit direction) makes the result of Fourier transform to Fig. 4 along the X direction.Can find out, Fig. 5 is made up of three straight lines, and wherein, middle straight line is called direct current background signal, and it does not comprise any velocity information to be measured; The symmetrical straight line in both sides is the AC signal of a pair conjugation, and any one exchanges the full detail that item all contains speed to be measured.The AC signal of wherein leaches by Choose filtering function, and inverse fourier transform is done to it, at this moment a complex function is obtained, therefrom remove intrinsic phasic difference, then the operations such as phase extraction, position phase unwrapping and position phase fringe number conversion are carried out, finally obtain the move of stripe number with wavelength variations, as shown in Figure 6.Dotted line in Fig. 2 is the rate signal of deriving according to move of stripe rate of change, with identical fine of the given rate signal (solid line in Fig. 2) of simulation.The minimum time of the present embodiment is distinguished as
Wherein, c=300nm/fs is the light velocity.
Embodiment 2
Wideband pulse LASER Light Source in the present embodiment is femto-second laser.When measuring free surfaces of specimen speed when femtosecond laser drives shock wave unloading, femto-second laser is used to be advantageously as the wideband pulse LASER Light Source of chirped pulse velocity interferometer.The pulse that femto-second laser exports is divided into two bundles by beam splitting chip 2, wherein folded light beam is as pump light, after the optical delay circuit formed by catoptron 3,4, sample front surface is focused on by catoptron 5,6 reflection and convex lens 7, thus drive shock wave in the material, when shock motion unloads to sample rear interface, rear interface setting in motion; Another bundle, through the light beam of beam splitting chip 2, after being reflected, as the incident broad band laser pulse of chirped pulse velocity interferometer, is measured the movement velocity of sample rear interface, as shown in Figure 7 by catoptron 8.
The above is only optional embodiment of the present invention, not does any pro forma restriction to the present invention.
Although the present invention discloses as above with embodiment, but and be not used to limit the present invention.Any those of ordinary skill in the art, do not departing under technical solution of the present invention ambit, the Method and Technology content of above-mentioned announcement all can be utilized to make many possible variations and modification to technical solution of the present invention, or be revised as the Equivalent embodiments of equivalent variations.Therefore, every content change and modification not departing from technical solution of the present invention, all still belongs in the scope of technical solution of the present invention protection.
Claims (8)
1. a chirped pulse velocity interferometer, is characterized in that, containing following optical component:
Wideband pulse LASER Light Source, the polarizer, pulse stretcher, catoptron, polarization splitting prism, time delay device, convex lens, testing sample, optical path compensation element, analyzer and imaging-type spectrometer.
The transmitting procedure of light beam is, the laser pulse that wideband pulse LASER Light Source exports becomes linearly polarized light by the polarizer, is then linear-chirped-pulse by pulse stretcher broadening.When chirped pulse propagates through polarization splitting prism, be divided into the orthogonal S polarized light in polarization direction and P polarized light, wherein, many experience time delay device in S polarized light communication process, thus lag behind the transmission of P polarized light, two-beam is successively focused on sample surfaces by convex lens, and collects and collimation scattered light, and the P polarized light in collimated light beam realizes the synchronous transmission with S polarized light by an optical path compensation element.Finally, S, P polarized light produces the light beam of identical polarization by analyzer, and carries out beat frequency interference with certain angle, and the interference fringe of generation enters imaging-type spectrometer.
2. chirped pulse velocity interferometer according to claim 1, is characterized in that, described wideband pulse LASER Light Source is super continuous pulse laser or femto-second laser, and wherein Supercontinuum source has wider spectral range, and centre wavelength is adjustable.
3. chirped pulse velocity interferometer according to claim 1, is characterized in that, described pulse stretcher is the one in grating stretcher, dispersive glass or other optical dispersion element.
4. pulse stretcher according to claim 3, is characterized in that, changes the pulsewidth of stretcher Parameter adjustable joint chirped pulse.
5. chirped pulse velocity interferometer according to claim 1, is characterized in that, testing sample surface is on the focal plane of convex lens.
6. chirped pulse velocity interferometer according to claim 1, is characterized in that, optical path compensation element is identical with the parameter of time delay device, comprises material category, quality and thickness etc.
7. chirped pulse velocity interferometer according to claim 1, is characterized in that, the direction that thoroughly the shakes angle at 45 ° of the polarizer and analyzer.
8. chirped pulse velocity interferometer according to claim 1, is characterized in that, the image of imaging-type spectrometer record is two-dimentional interference fringe, spectrum axle along stripe direction perpendicular to slit.
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| CN109633196A (en) * | 2019-01-15 | 2019-04-16 | 中国工程物理研究院激光聚变研究中心 | A kind of all -fiber chirped pulse velocity interferometer |
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| CN109755847B (en) * | 2018-12-27 | 2020-12-25 | 中国科学技术大学 | Method for generating ultrashort laser pulse train |
| CN109633196B (en) * | 2019-01-15 | 2022-02-08 | 中国工程物理研究院激光聚变研究中心 | All-fiber chirped pulse velocity interferometer |
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| CN111521844A (en) * | 2020-04-23 | 2020-08-11 | 中国科学院西安光学精密机械研究所 | Interferometer zero-path-difference online debugging mechanism for VISAR system |
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| CN114113665A (en) * | 2021-11-25 | 2022-03-01 | 中国工程物理研究院激光聚变研究中心 | Quasi-continuous diagnostic instrument for two-dimensional shock wave velocity field |
| CN114113665B (en) * | 2021-11-25 | 2023-12-22 | 中国工程物理研究院激光聚变研究中心 | Two-dimensional shock wave speed field quasi-continuous diagnostic instrument |
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