CN104423375B - The method and apparatus that board units are tested - Google Patents

The method and apparatus that board units are tested Download PDF

Info

Publication number
CN104423375B
CN104423375B CN201310395611.6A CN201310395611A CN104423375B CN 104423375 B CN104423375 B CN 104423375B CN 201310395611 A CN201310395611 A CN 201310395611A CN 104423375 B CN104423375 B CN 104423375B
Authority
CN
China
Prior art keywords
test
test mode
board units
line
level value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201310395611.6A
Other languages
Chinese (zh)
Other versions
CN104423375A (en
Inventor
王茜
刘洋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aisino Corp
Original Assignee
Aisino Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aisino Corp filed Critical Aisino Corp
Priority to CN201310395611.6A priority Critical patent/CN104423375B/en
Publication of CN104423375A publication Critical patent/CN104423375A/en
Application granted granted Critical
Publication of CN104423375B publication Critical patent/CN104423375B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/021Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system adopting a different treatment of each operating region or a different mode of the monitored system, e.g. transient modes; different operating configurations of monitored system

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention provides a kind of method and apparatus tested board units, the method mainly includes:Test circuit plate is connected by a plurality of data lines and board units, a plurality of data lines includes that data line and test mode set line;Test data is transferred to the board units by the test circuit plate by the data line;The level value of line is set by adjusting the test mode makes the board units enter the test mode specified, and the board units obtain the corresponding test program of the test mode specified from the test data, and perform the test program.The level value of line is set by adjusting the test mode, is coordinated with single-chip microcomputer, by a download program, it is possible to realize that test circuit plate makes board units enter into different test modes.

Description

The method and apparatus that board units are tested
Technical field
The present invention relates to testing for electrical equipment field, more particularly to the board units in electronic charging system without parking are entered The method and apparatus of row test.
Background technology
Board units in electronic charging system without parking, as main control chip, will be entered using single-chip microcomputer before product export The substantial amounts of debugging of row, and generally be also required to do substantial amounts of test in the middle of production process.And general existing test process is all Different test programs are downloaded for different test events, such as, to survey physical layer, then download physical layer test program;Will Self-inspection is surveyed, then descends self-check program;Test cross easily, then descends transaction program.Such test process can allow tester much to be weighed The work of renaturation, reduces the operating efficiency of tester, and the human resources to enterprise cause very big waste.Therefore, design Go out the research direction that a download circuit that can improve testing efficiency is this area.
The content of the invention
To achieve the above object, the present invention provides a kind of method tested board units, it is characterised in that Including:
Test circuit plate is connected by a plurality of data lines and board units, a plurality of data lines includes data transfer Line and test mode set line;
Test data is transferred to the board units by the test circuit plate by the data line;
The level value of line is set by adjusting the test mode makes the board units enter the test mode specified, institute State board units and the corresponding test program of the test mode specified is obtained from the test data, and perform the test Program.
Before test data is transferred to the board units by the test circuit plate by the data line, also wrap Include:
The test circuit plate is connected by USB interface with host computer, the host computer passes through USB interface by the survey Examination data are transferred to the test circuit plate.
The level value that line is set by adjusting the test mode makes the board units enter the test shape specified State, including:
The quantity that the test mode sets line is a plurality of, and a plurality of test mode sets every kind of group of the level value of line A kind of test mode respectively with board units is closed uniquely to correspond to;
The unique corresponding a plurality of test mode of the test mode specified for obtaining the board units for needing test sets line The given combination of level value, the level value of line is set according to the given combination regulation a plurality of test mode.
The a plurality of test mode set every kind of combination of the level value of line respectively with a kind of test mode of board units Unique correspondence, including:
The quantity that the test mode sets line is 2, and respectively the first test mode sets line and the second test mode Line is set, and first test mode sets line and second test mode sets line by being arranged on the test circuit plate On switch adjust level value for high or low;
The level value that first test mode sets line is set to the level value that high and described second test mode sets line When being set to high, board units enter wake-up test mode;
The level value that first test mode sets line is set to the level value that high and described second test mode sets line When being set to low, board units enter physical layer test mode;
The level value that first test mode sets line is set to the level value that low and described second test mode sets line When being set to high, board units enter Autonomous test state;
The level value that first test mode sets line is set to the level value that low and described second test mode sets line When being set to low, board units enter stateful transaction.
The stateful transaction of the board units is the acquiescence original state of the board units, and the acquiescence original state is The normal operating condition of the board units.
The board units obtain the corresponding test program of the test mode specified from the test data, and hold The row test program, including:
After the board units receive the test data that the test circuit plate is transmitted, the test data is extracted In various test modes of board units for including distinguish corresponding test program, test mode and corresponding test program are closed Connection storage is in storage medium;
After the board units enter the test mode specified, it is situated between according to the test mode inquiry storage specified Matter, obtains the corresponding test program of the test mode specified, and perform the test program.
A kind of device that board units are tested, including:Board units, test circuit plate,
The test circuit plate, for being connected by a plurality of data lines and the board units, in a plurality of data lines Line is set including data line and test mode, test data is transferred to by the vehicle-mounted list by the data line Unit;The level value of line is set by adjusting the test mode makes the board units enter the test mode specified;
The board units, for obtaining the corresponding test journey of the test mode specified from the test data Sequence, and perform the test program.
Described device also includes:
Host computer, for being connected with the test circuit plate by USB interface, by USB interface by the test data It is transferred to the test circuit plate.
Described test circuit plate, when the quantity specifically for setting line when the test mode is a plurality of, sets described Every kind of combination that a plurality of test mode sets the level value of line is uniquely corresponded to a kind of test mode of board units respectively;Obtain The unique corresponding a plurality of test mode of the test mode specified of the board units of needs test sets specifying for the level value of line Combination, the level value of line is set according to the given combination regulation a plurality of test mode.
Described test circuit plate, the quantity specifically for setting line when the test mode is 2, and respectively first surveys When examination state sets line and the second test mode setting line, by being arranged on the switch on the test circuit plate by described first The level value of test mode setting line and second test mode setting line is adjusted to high or low;
The level value that first test mode sets line is set to the level that high and described second test mode sets line When value is set to high, board units enter wake-up test mode;
The level value that first test mode sets line level value is set to high and described second test mode line is set Level value when being set to low, board units enter physical layer test mode;
The level value that first test mode sets line is set to the level that low and described second test mode sets line When value is set to high, board units enter Autonomous test state;
Low and described second test mode that is set to that first test mode sets line level value is set into line level value When being set to low, board units enter stateful transaction.
Described board units, after receiving the test data that the test circuit plate is transmitted, extract Various test modes of the board units included in the test data distinguish corresponding test program, by test mode and correspondence Test program associated storage in storage medium;
After the board units enter the test mode specified, it is situated between according to the test mode inquiry storage specified Matter, obtains the corresponding test program of the test mode specified, and perform the test program.
The main object of the present invention is to provide a kind of method and apparatus tested board units, is tested by adjusting State sets the level value of line, coordinates with board units, realizes a download program, it is possible to make by test circuit plate vehicle-mounted Unit enters into different test modes, improves the operating efficiency of tester, also saves the human resources of enterprise.
Brief description of the drawings
Fig. 1 is a kind of method process chart tested board units provided in an embodiment of the present invention;
Fig. 2 is a kind of apparatus structure block diagram tested board units provided in an embodiment of the present invention.In figure:10 are Board units, 20 be test circuit plate, 30 be host computer, 211 be the first test mode set line, 212 be the second test mode Set line, 213 be USB interface, 214 be data line;
Specific embodiment
For ease of the understanding to the embodiment of the present invention, done by taking several specific embodiments as an example further below in conjunction with accompanying drawing Explanation, and each embodiment does not constitute the restriction to the embodiment of the present invention.
Embodiment one
This embodiment offers a kind of process chart of the method tested board units, as shown in figure 1, including Following process step:
Step S110, host computer is by USB (Universal Serial Bus, USB) interfaces and test electricity Road plate is connected;The test circuit plate is the circuit board that the common sheet materials of FR-4 are made, and can design the test circuit plate outer Shell, wire-jumper type switch can be changed to the switch of pushbutton type, and the function of realization is the same.Can also be in the test circuit Increase chip microcontroller programme-control on plate, carry out the operation of controlling switch.
Test data is transferred to test circuit plate by step S120, host computer;
Test circuit plate is connected by USB interface with host computer, be transferred to for test data by USB interface by host computer Test circuit plate.
Test data is transferred to board units by step S130, test circuit plate by data line;
A plurality of data lines includes that data line and test mode set line;
Test mode sets the quantity of line for a plurality of, a plurality of test mode every kind of combination of the level value of line is set respectively and A kind of test mode of board units is uniquely corresponded to;
The unique corresponding a plurality of test mode of the test mode specified for obtaining the board units for needing test sets line The given combination of level value, the level value that a plurality of test mode sets line is adjusted according to given combination.
Step S140, the level value that regulation test mode sets line makes board units enter the test mode specified;
The quantity that test mode sets line is 2, and respectively the first test mode sets line and the second test mode is set Line, the first test mode sets line and the second test mode is set line and is adjusted by the switch being arranged on test circuit plate Level value is high or low;Automatically adjusted by keeper's manual adjustment or program
When first test mode setting line is set to high for high and the second test mode sets line level value, board units entrance Wake up test mode;It is after high and the second test mode setting line level value is set to height, to click on that first test mode is set into line The wake-up button of host computer test program, board units buzzer rings a sound, and into wake-up states, board units etc. are to be received 14K square waves (the 14K square waves for where sending).Once 14K square waves are received, buzzer Chang Xiang.Setting the purpose of this state is In order to test the clever lightness of wake-up, to determine whether the board units meet Standard.
It is vehicle-mounted when first test mode sets line level value and is set to high and the second test mode and sets line level value and be set to low Unit enters physical layer test mode;Physical layer test mode includes transmitting 5.79G carrier waves, transmitting 5.80G carrier waves, transmitting 5.79G PN9 waveforms, transmitting 5.80G PN9 waveforms, reception state.Host computer procedure is clicked on by different buttons and set.If Whether the purpose for putting these states is to test transmission power, tranmitting frequency, transmitted bandwidth, the index of modulation, receiving sensitivity Meet Standard.The a height of 3.6v of level value, it is 0V that level value is low.
It is vehicle-mounted when first test mode sets line level value and is set to low and the second test mode setting line level value and is set to high Unit enters Autonomous test state;First test mode setting line level value is set to low and the second test mode line level value is set After being set to height, board units enter self-inspection state.Now, to test subscriber card is inserted in board units, self-inspection starts.Vehicle-mounted list Error code is returned to after the completion of first automatic detection test, 000 expression test passes through, and represents ESAM (Embedded respectively from left to right Secure Access Module, embedded safety module) card Card Reader, non-contact card Card Reader chip register read-write, noncontact The core of the card piece Card Reader;When return code in place be 1 when, represent that the functional test does not pass through.I.e. 000:Test passes through;001:ESAM cards Card Reader mistake;010:Non-contact card is not welded, and is please welded again;100:Non-contact card Card Reader mistake.The a height of 3.6v of level value, electricity It is 0V that level values are low.
It is vehicle-mounted when first test mode sets line level value and is set to low and the second test mode setting line level value and is set to low Unit enters stateful transaction.Under stateful transaction, board units function is identical with actually used situation, can enter with roadside unit Row communication, completes ETC (Electronic Toll Collection, electronic charging system without parking) process of exchange.
Assuming that it is STAG and LINK that the first test mode set line, the second test mode to set line, when TXD data wires and RXD data wires one end is connected with board units, and the other end is connected by USB interface with host computer;STAG and LINK one end and car Carrier unit is connected, and the other end can voluntarily set state on test circuit plate.
Those skilled in the art will be understood that the level value of above-mentioned test mode setting line makes board units enter what is specified The application type of test mode is only for example, and other different test modes that are existing or being likely to occur from now on set line makes car Carrier unit enters the test mode application type specified and is such as applicable to the embodiment of the present invention, should also be included in present invention protection model Within enclosing, and it is incorporated herein by reference herein.
Step S150, board units obtain the corresponding test program of the test mode specified from test data;
After board units receive the test data that test circuit plate is transmitted, what is included in extraction test data is vehicle-mounted Various test modes of unit distinguish corresponding test program, by test mode and corresponding test program associated storage in storage In medium;
After board units enter the test mode specified, storage medium is inquired about according to specified test mode, obtain and specify The corresponding test program of test mode.
Step S160, performs test program.
In practical application, software engineer to write include in a program, program and wakes up test mode, physical layer test shape State, Autonomous test state and stateful transaction.When downloading, the first test mode setting line level value is set to low or second and surveys Examination state sets line level value when being set to low, and board units are in acquiescence original state, acquiescence original state be board units just Normal running status.After the completion of download program, board units are defaulted as stateful transaction, can directly pay user and use.If desired Test, then connecting test circuit board, line and the second test are set by adjusting the first test mode on connecting test circuit board The level value switch that state sets line makes their level value be in high or low state, so that various tests of board units State distinguishes corresponding test program, it is possible to achieve different test functions.
By above description as can be seen that setting the level value of line by adjusting test mode, coordinate with board units, realize Download program, it is possible to make board units enter into different test modes by test circuit plate, improve tester The operating efficiency of member, also saves the human resources of enterprise.
Embodiment two
This embodiment offers a kind of apparatus structure block diagram tested board units, it implements structure such as Shown in Fig. 2, can specifically include:Test circuit plate 20, board units 10 and host computer 30.
The test circuit plate 20, for being connected by a plurality of data lines and the board units 10, many datas Line includes that data line 214 and test mode set line, and host computer 30 is by the data line 214 by test data It is transferred to the board units 10;Enter the board units 10 by the level value for adjusting the test mode setting line to refer to Fixed test mode;
The board units 10, for obtaining the corresponding test journey of the test mode specified from the test data Sequence, and perform the test program.
Described host computer 30, for being connected with the test circuit plate 20 by USB interface 213, by USB interface The test data is transferred to the test circuit plate 20 by 213.
Described test circuit plate 20, when the quantity specifically for setting line when the test mode is a plurality of, sets institute The every kind of combination for stating the level value that a plurality of test mode sets line is uniquely corresponded to a kind of test mode of board units 10 respectively; The unique corresponding a plurality of test mode of the test mode specified for obtaining the board units 10 for needing test sets the level value of line Given combination, the level value of line is set according to the given combination regulation a plurality of test mode.
Described test circuit plate 20, the quantity specifically for setting line when the test mode is 2, respectively first When test mode sets the test mode of line 211 and second setting line 212, by the switch being arranged on the test circuit plate 20 The level value that first test mode setting line 211 and second test mode set line 212 is adjusted to high or low;
The level value that first test mode sets line 211 is set to high and described second test mode line 212 is set Level value when being set to high, board units 10 enter and wake up test mode;
The level value that first test mode sets the level value of line 211 is set into high and described second test mode to set When the level value of line 212 is set to low, board units 10 enter physical layer test mode;
The level value that first test mode sets line 211 is set to low and described second test mode line 212 is set Level value when being set to high, board units 10 enter Autonomous test state;
Low and described second test mode that is set to that first test mode sets the level value of line 211 is set into line 212 When level value is set to low, board units 10 enter stateful transaction.
Described board units 10, after receiving the test data that the test circuit plate 20 is transmitted, The various test modes for extracting the board units 10 included in the test data distinguish corresponding test program, by test mode With corresponding test program associated storage in storage medium;
After the board units 10 enter the test mode specified, the storage is inquired about according to the test mode specified Medium, obtains the corresponding test program of the test mode specified, and perform the test program.
In actual applications, the quantity that above-mentioned test mode sets line can be 2, as shown in Fig. 2 respectively first surveys Examination state sets the test mode of line 211 and second and sets line 212, in fig. 2, also including USB interface 213, data line 214.Wherein the first test mode sets line, the second test mode and sets line for adjusting level value, enters board units 10 To different test modes, data line can be divided into TXD data wires and RXD data wires be host computer 30 and board units 10 it Between data transmission media, it is assumed that the first test mode set line, the second test mode set line be STAG and LINK, work as TXD Data wire and RXD data wires one end are connected with board units 10, and the other end is connected by USB interface with host computer 30;STAG and LINK one end is connected with board units 10, and the other end can voluntarily set state on test circuit plate 20.
In described test circuit plate 20, STAG and LINK can use switch selection incoming level on test circuit plate 20 It is worth for high or level value is low, can be so combined into four kinds of states, be i.e. STAG current potentials is high, and LINK current potentials are high;STAG current potentials are high, LINK current potentials are low;STAG current potentials are low, and LINK current potentials are high;STAG current potentials are low, and LINK current potentials are low.Board units 10 are by detecting this Tetra- kinds of different states of STAG and LINK, realize controlling to program.Only need to next secondary program, it is possible to by described in connection USB is downloaded and is entered into different test modes from test circuit.
In sum, the embodiment of the present invention sets the level value of line by adjusting test mode, coordinates with board units 10, Realize a download program, it is possible to board units 10 is entered into different test modes by test circuit plate 20, improve The operating efficiency of tester, also saves the human resources of enterprise.
One of ordinary skill in the art will appreciate that:Accompanying drawing is the schematic diagram of one embodiment, module in accompanying drawing or Flow is not necessarily implemented necessary to the present invention.
As seen through the above description of the embodiments, those skilled in the art can be understood that the present invention can Realized by the mode of software plus required general hardware platform.Based on such understanding, technical scheme essence On the part that is contributed to prior art in other words can be embodied in the form of software product, the computer software product Can store in storage medium, such as ROM/RAM, magnetic disc, CD, including some instructions are used to so that a computer equipment (can be personal computer, server, or network equipment etc.) performs some of each embodiment of the invention or embodiment Method described in part.
Each embodiment in this specification is described by the way of progressive, identical similar portion between each embodiment Divide mutually referring to what each embodiment was stressed is the difference with other embodiment.Especially for device or For system embodiment, because it is substantially similar to embodiment of the method, so describing fairly simple, related part is referring to method The part explanation of embodiment.Apparatus and system embodiment described above is only schematical, wherein the conduct Separating component explanation unit can be or may not be it is physically separate, the part shown as unit can be or Person may not be physical location, you can with positioned at a place, or can also be distributed on multiple NEs.Can be with root Some or all of module therein is factually selected the need for border to realize the purpose of this embodiment scheme.Ordinary skill Personnel are without creative efforts, you can to understand and implement.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto, Any one skilled in the art the invention discloses technical scope in, the change or replacement that can be readily occurred in, Should all be included within the scope of the present invention.Therefore, protection scope of the present invention should be with scope of the claims It is defined.

Claims (11)

1. a kind of method that board units are tested, it is characterised in that including:
Test circuit plate is connected by a plurality of data lines and board units, a plurality of data lines include data line with Test mode sets line;
Test data is transferred to the board units by the test circuit plate by the data line;
The level value of line is set by adjusting the test mode makes the board units enter the test mode specified, the car Carrier unit obtains the corresponding test program of the test mode specified from the test data, and performs the test journey Sequence.
2. the method that board units are tested according to claim 1, it is characterised in that the test circuit plate leads to Cross before test data is transferred to the board units by the data line, also include:
The test circuit plate is connected by USB interface with host computer, the host computer passes through USB interface by the test number According to being transferred to the test circuit plate.
3. the method that board units are tested according to claim 1, it is characterised in that described described by regulation The level value that test mode sets line makes the board units enter the test mode specified, including:
The quantity that the test mode sets line is a plurality of, and a plurality of test mode sets every kind of combination point of the level value of line A kind of test mode of other and board units is uniquely corresponded to;
The unique corresponding a plurality of test mode of the test mode specified for obtaining the board units for needing test sets the level of line The given combination of value, the level value of line is set according to the given combination regulation a plurality of test mode.
4. the method that board units are tested according to claim 3, it is characterised in that a plurality of test mode The every kind of combination for setting the level value of line is uniquely corresponded to a kind of test mode of board units respectively, including:
The quantity that the test mode sets line is 2, and respectively the first test mode sets line and the second test mode is set Line, first test mode sets line and second test mode sets line by being arranged on the test circuit plate Switch adjusts level value for high or low;
The level value that the level value of the first test mode setting line is set to high and described second test mode setting line is set to Gao Shi, board units enter wake-up test mode;
The level value that the level value of the first test mode setting line is set to high and described second test mode setting line is set to When low, board units enter physical layer test mode;
The level value that the level value of the first test mode setting line is set to low and described second test mode setting line is set to Gao Shi, board units enter Autonomous test state;
The level value that the level value of the first test mode setting line is set to low and described second test mode setting line is set to When low, board units enter stateful transaction.
5. the method that board units are tested according to claim 4, it is characterised in that the friendship of the board units Easy state is the acquiescence original state of the board units, and the acquiescence original state is the normal operation shape of the board units State.
6. the method that board units are tested according to any one of claim 1 to 5, it is characterised in that the car Carrier unit obtains the corresponding test program of the test mode specified from the test data, and performs the test journey Sequence, including:
After the board units receive the test data that the test circuit plate is transmitted, bag in the test data is extracted Various test modes of the board units for containing distinguish corresponding test program, test mode is associated with corresponding test program and is deposited Storage is in storage medium;
After the board units enter the test mode specified, the storage medium is inquired about according to the test mode specified, The corresponding test program of the test mode specified is obtained, and performs the test program.
7. a kind of device that board units are tested, it is characterised in that including:Board units, test circuit plate,
The test circuit plate, for being connected by a plurality of data lines and the board units, a plurality of data lines includes Data line and test mode set line, and test data is transferred into the board units by the data line;It is logical The level value for overregulating the test mode setting line makes the board units enter the test mode specified;
The board units, for obtaining the corresponding test program of the test mode specified from the test data, and Perform the test program.
8. the device that board units are tested according to claim 7, it is characterised in that described device also includes:
Host computer, for being connected with the test circuit plate by USB interface, is transmitted the test data by USB interface To the test circuit plate.
9. the device that board units are tested according to claim 7, it is characterised in that:
Described test circuit plate, when the quantity specifically for setting line when the test mode is a plurality of, is set described a plurality of Every kind of combination that test mode sets the level value of line is uniquely corresponded to a kind of test mode of board units respectively;Obtaining needs The unique corresponding a plurality of test mode of the test mode specified of the board units of test sets the given combination of the level value of line, The level value of line is set according to the given combination regulation a plurality of test mode.
10. the device that board units are tested according to claim 9, it is characterised in that:
Described test circuit plate, the quantity specifically for setting line when the test mode is 2, the respectively first test shape When state sets line and the second test mode setting line, by being arranged on the switch on the test circuit plate by the described first test The level value of state setting line and second test mode setting line is adjusted to high or low;
The level value that the level value that first test mode sets line is set to high and described second test mode setting line is set For it is high when, board units enter wake up test mode;
The level value that first test mode sets line level value is set to the electricity that high and described second test mode sets line When level values are set to low, board units enter physical layer test mode;
The level value that the level value that first test mode sets line is set to low and described second test mode setting line is set For it is high when, board units enter Autonomous test state;
The low and described second test mode setting line level value that is set to that first test mode sets line level value is set to When low, board units enter stateful transaction.
11. device that board units are tested according to any one of claim 7 to 10, it is characterised in that:
Described board units, after receiving the test data that the test circuit plate is transmitted, extract described Various test modes of the board units included in test data distinguish corresponding test program, by test mode and corresponding survey Examination program associated storage is in storage medium;
After the board units enter the test mode specified, the storage medium is inquired about according to the test mode specified, The corresponding test program of the test mode specified is obtained, and performs the test program.
CN201310395611.6A 2013-09-03 2013-09-03 The method and apparatus that board units are tested Active CN104423375B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310395611.6A CN104423375B (en) 2013-09-03 2013-09-03 The method and apparatus that board units are tested

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310395611.6A CN104423375B (en) 2013-09-03 2013-09-03 The method and apparatus that board units are tested

Publications (2)

Publication Number Publication Date
CN104423375A CN104423375A (en) 2015-03-18
CN104423375B true CN104423375B (en) 2017-07-04

Family

ID=52972702

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310395611.6A Active CN104423375B (en) 2013-09-03 2013-09-03 The method and apparatus that board units are tested

Country Status (1)

Country Link
CN (1) CN104423375B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105652859B (en) * 2016-03-31 2019-10-18 北京经纬恒润科技有限公司 A kind of early stage production suppression system of controller product
CN110648425B (en) * 2019-09-20 2021-05-14 天地融科技股份有限公司 Detection method and system for vehicle-mounted unit

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08322101A (en) * 1995-05-25 1996-12-03 Mitsubishi Electric Corp Test method and instruments on-board rolling stock of train
CN1905589A (en) * 2006-08-01 2007-01-31 武汉龙安集团有限责任公司 Automatic tester of adapter based on virtual apparatus
CN101022634A (en) * 2007-03-16 2007-08-22 烟台麦特电子有限公司 Testing method based on remote control vehicular device
CN102073319A (en) * 2011-01-25 2011-05-25 武汉理工大学 Multifunctional comprehensive type electric control automobile fault diagnosis system
CN202213547U (en) * 2011-09-08 2012-05-09 中国汽车技术研究中心 Vehicle-mounted vehicle state monitoring and data acquisition system
CN103033652A (en) * 2012-12-27 2013-04-10 江苏省电力公司电力科学研究院 Tester wiring concentration conversion device for vehicle
CN103064018A (en) * 2012-12-27 2013-04-24 江苏省电力公司电力科学研究院 Vehicle-mounted circuit resistance integrated test system for switch dynamic characteristics

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08322101A (en) * 1995-05-25 1996-12-03 Mitsubishi Electric Corp Test method and instruments on-board rolling stock of train
CN1905589A (en) * 2006-08-01 2007-01-31 武汉龙安集团有限责任公司 Automatic tester of adapter based on virtual apparatus
CN101022634A (en) * 2007-03-16 2007-08-22 烟台麦特电子有限公司 Testing method based on remote control vehicular device
CN102073319A (en) * 2011-01-25 2011-05-25 武汉理工大学 Multifunctional comprehensive type electric control automobile fault diagnosis system
CN202213547U (en) * 2011-09-08 2012-05-09 中国汽车技术研究中心 Vehicle-mounted vehicle state monitoring and data acquisition system
CN103033652A (en) * 2012-12-27 2013-04-10 江苏省电力公司电力科学研究院 Tester wiring concentration conversion device for vehicle
CN103064018A (en) * 2012-12-27 2013-04-24 江苏省电力公司电力科学研究院 Vehicle-mounted circuit resistance integrated test system for switch dynamic characteristics

Also Published As

Publication number Publication date
CN104423375A (en) 2015-03-18

Similar Documents

Publication Publication Date Title
CN104569653B (en) A kind of password card Auto-Test System
CN103516551B (en) Utilize passive pair of RFID tag to optical fiber physical port intelligent management system
CN106841975A (en) A kind of test system
CN103197625A (en) Remote temperature and humidity monitoring system based on cloud storage
CN205768730U (en) Charging pile location, a kind of city equipment, city charging pile
CN104299316B (en) Method for automatically detecting card types through financial terminal
CN106094802A (en) A kind of automobile electronic controller communication test system and method
CN205751223U (en) Power information acquisition system failure diagnosis apparatus
CN104423375B (en) The method and apparatus that board units are tested
CN113890830A (en) IEC104 main station simulation system
CN102355378B (en) Carrier channel testing system
CN106390451A (en) Method and device for testing capacity of game server
CN208077394U (en) A kind of the communication test plate and communication test system of concentrator communication module
CN107479511A (en) Textile manufacturing managing device and system
CN106776195A (en) A kind of SOC adjustment method and equipment
CN104731702B (en) Test system and its service end
CN201773405U (en) Remote electrocardio-signal diagnosis device
CN207281247U (en) Circuit board detection equipment
CN106066956A (en) A kind of user terminal screen unlocking method, device and user terminal
CN104268109A (en) Data interface communication method and device
CN114826993A (en) Electric energy meter module simulation test system
CN107590871A (en) A kind of network segmentation work attendance supervisory systems
CN208954124U (en) Pre-payment radio-frequency card and electric energy meter data exchange process detection device
CN207968072U (en) A kind of high Prudential Master system for starting sensitivity
CN105279085A (en) Rule self-defining based smart substation configuration file test system and method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant