CN104324449B - Particle ray irradiating device and particle ray treatment device - Google Patents
Particle ray irradiating device and particle ray treatment device Download PDFInfo
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- CN104324449B CN104324449B CN201410648274.1A CN201410648274A CN104324449B CN 104324449 B CN104324449 B CN 104324449B CN 201410648274 A CN201410648274 A CN 201410648274A CN 104324449 B CN104324449 B CN 104324449B
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Abstract
The invention aims at obtaining a particle ray irradiating device which can eliminate magnetic hysteresis influences and achieve high-accuracy beam irradiation. The particle ray irradiating device comprises a magnetic field sensor (20) which is used for measuring a magnetic field of a scanning electromagnet (3) and an irradiation control device (5) which controls the ejection amount of charged particle beams (1b) of the scanning electromagnet (3). For every rectangular area (Si, J), the irradiation control device (5) obtains an integrated value of the amount of the charged particle beams (1b) passing the plurality of rectangular areas (Si, J) and controls the ejection amount of the charged particle beams (1b) based on the integrated value of every rectangular area (Si, J).
Description
The present patent application is international application no for PCT/JP2009/064969, and international filing date is August in 2009 27,
Into the Application No. 200980160948.0 of National Phase in China, entitled " particle-beam exposure apparatus, particle-beam therapeutic
The divisional application of the application for a patent for invention of device and particle-beam exposure method ".
Technical field
The present invention relates to it is used for the particle-beam therapeutic apparatus of medical application or research purposes, more particularly to so-called spot scan
Or the particle-beam exposure apparatus and particle-beam therapeutic apparatus of the sweep type of raster scanning.
Background technology
In general, particle-beam therapeutic apparatus include：Beam generator, the beam generator produces charged particle
Beam；Accelerator, the accelerator is connected with beam generator, and produced charged particle beam is accelerated；Beam is defeated
System is sent, the charged particle that the beam delivery system is projected after conveying till accelerating to set energy in accelerator
Beam；And particle-beam exposure apparatus, the particle-beam exposure apparatus are arranged on the downstream of beam delivery system, and for by band
Charged particle beam is to irradiation object.Particle-beam exposure apparatus are roughly divided into wide area irradiation mode and scanning radiation modality, and (point is swept
Retouch, raster scanning etc.), wide area irradiation mode is scattered amplification to charged particle beam using scattering object, makes amplified powered
Particle beam is consistent with the shape of irradiation object forming irradiation field, and scans radiation modality and be scanned with thin pencil beam
To form irradiation field so that it is consistent with the shape of irradiation object.
Wide area irradiation mode forms the irradiation field consistent with affected part shape using collimator and agglomerate (borus).Wide area
Radiation modality forms the irradiation field consistent with affected part shape, prevents from carrying out unwanted irradiation to normal structure, therefore becomes
Most widely used, excellent radiation modality.However, it is necessary to being directed to each patient makes agglomerate, with affected part cooperatively
Deformed collimator.
On the other hand, it is the radiation modality for not needing collimator and agglomerate, degree of freedom high to scan radiation modality.However,
Due to not using these parts for preventing the normal structure to beyond affected part to be irradiated, therefore it is required that more than wide area irradiation mode
, high beam irradiation position precision.
For particle-beam therapeutic apparatus, carry out for improving various of the precision of irradiation position or exposure dose
It is bright.The purpose of patent documentation 1 is to provide exactly irradiate the particle-beam therapeutic apparatus of affected part, and discloses to issue
It is bright.The scanning amount of the charged particle beam that the invention of patent documentation 1 is carried out scanning means and now using beam spot detect
The beam spot of the charged particle beam that device is detected is stored in storage device, using the scanning amount and beam spot of the storage,
According to the beam spot based on treatment plan information, the scanning amount of scanning means is set using control device.It is actual due to inciting somebody to action
Relation between the scanning amount and beam spot of irradiation acquisition is stored in the storage device, therefore can expect exactly to enter affected part
Row irradiation.
The purpose of patent documentation 2 is to provide guarantee high security, can penetrate with the particle of high accuracy irradiation charged particle beam
Beam therapeutic apparatus, and disclose following invention.Patent documentation 2 carries the charged particle beam projected from charged particle beam generator
The scanning electro-magnet that supply is scanned on the shadow surface perpendicular with beam direction of advance, based on by the scanning electro-magnet
Charged particle beam the position on shadow surface and dosage controlling the charged particle beam from charged particle beam generator
Shot.Specifically, split on shadow surface in multiple regions of formation, stop the region to reaching target dose and supply
Charged particle beam, other the region supply charged particle beams to miss the mark dosage.So, to the exposure dose in each region
It is compared with target dose, ON/OFF (open/close) controls (supply/stop) being carried out to the shot of charged particle beam,
So as to high security can be expected.
In patent documentation 3, the hysteresis characteristic for existing between the electric current of scanning electro-magnet and magnetic field shines beam
Penetrating the precision of position reduces this problem, discloses invention below.The invention of patent documentation 3 includes：First arithmetic element, should
First arithmetic element calculates the scanning electro-magnet for not considering that magnetic hysteresis affects corresponding to the beam exposure position based on irradiation plan
Current value；And second arithmetic element, second arithmetic element considers that magnetic hysteresis affects what the first arithmetic element was calculated
The current value of scanning electro-magnet is corrected computing, and irradiation control device controls to sweep based on the operation result of the second arithmetic element
Retouch the electric current of electric magnet.So, magnetic hysteresis impact is eliminated by implementing correction calculation in the second arithmetic element, i.e., by making the
Two arithmetic elements possess the mathematical model for representing hysteresis characteristic, can expect the precision that beam exposure position is improved by computing.
Prior art literature
Patent documentation
Patent documentation 1：Japanese Patent Laid-Open 2005-296162 publication
Patent documentation 2：Japanese Patent Laid-Open 2008-272139 publication
Patent documentation 3：Japanese Patent Laid-Open 2007-132902 publication
Invent technical problem to be solved
In the disclosed invention of patent documentation 1, based on by carrying out sweeping for the charged particle beam that actual irradiation is obtained
The real data of the amount of retouching and beam spot calculates the setting electricity of scanning electro-magnet using the conversion table making conversion table
Flow valuve.
However, practical situation is as shown in patent documentation 3, there is magnetic hysteresis between the electric current of scanning electro-magnet and magnetic field special
Property, when current value increases and when current value reduces, different magnetic fields can be formed.In other words, even if knowing that certain is flashy
The current value of scanning electro-magnet, only by the information, not can determine that the exact value in magnetic field.Thus, sending out disclosed in patent documentation 1
There are the following problems in bright：Affected part can not be irradiated exactly because the magnetic hysteresis of electric magnet affects.
In the disclosed invention of patent documentation 2, ON/OFF control is carried out to the shot of charged particle beam and (is supplied/is stopped
Only), so that the exposure dose in defined each region reaches target dose.
However, the multiple regions for being formed of splitting on shadow surface described in the disclosed invention of patent documentation 2 are roots
According to corresponding scanning electro-magnet exciting current scope come the region (excitation region) in the exciting current space that defines, and with
Region (irradiation area) in actual irradiation space is inconsistent.This is due to discounting for the magnetic hysteresis of scanning electro-magnet, being somebody's turn to do
Excitation region and irradiation area will not be corresponded exactly.Thus, even if wanting to be compareed so in units of excitation region
Penetrate dosage to be managed in the device or method to improve safety, affect if not eliminating the magnetic hysteresis of scanning electro-magnet, also deposit
In the problem that improve can not the precision of beam exposure position.
In the disclosed invention of patent documentation 3, in the mathematical model of arithmetic element internal production magnetic hysteresis, by computing pair
The current value of scanning electro-magnet is corrected.
Even if however, considering magnetic hysteresis, there is also some problem.First problem is：Using computing method accurately
Hysteresis characteristic is corrected as good as difficulty.For example, represent electric current and magnetic field hysteresis characteristic curve not only according to
The amplitude of input (electric current), always according to making the speed of input (electric current) change and making the pattern of input (electric current) change, forms
For various forms.Although in multiple fields for a long time to representing the complicated magnetic using operation method, i.e. using mathematical model
Stagnant phenomenon has carried out various researchs, but reality is still considerably difficult.Additionally, Second Problem is beam exposure position
The detection method put.In conventional multiple technologies, as the disclosed invention of patent documentation 3, it is desirable to merely with 1 or
Multiple stage beam spot monitor is detecting beam exposure position.And only charged particle beam is irradiated to beam spot monitor,
Beam spot monitor can just know beam exposure position.Thus, there are the following problems：Irradiate normal when beam deviates target
During tissue etc., can only only stop beam, and can not be by beam exposure position control to the correct irradiation for wanting to irradiate originally
Position.
The content of the invention
The present invention is completed to solve the above problems, it is intended that obtain that the magnetic of scanning electro-magnet can be eliminated
Stagnant impact and the particle-beam exposure apparatus of achievable high accuracy beam exposure.
For solving the technological means of technical problem
Including：Magnetic field sensor, the magnetic field sensor is measured to the magnetic field of scanning electro-magnet；And irradiation control dress
Put, the irradiation control device irradiates control device pair to being controlled by the shot of the charged particle beam of scanning electro-magnet
In multiple rectangular areas each obtain charged particle beam by multiple rectangular areas dosage aggregate-value, wherein rectangle
X-direction that region is determined by magnetic field sensor and the magnetic field of Y-direction are defining.
The technique effect of invention
Because particle-beam exposure apparatus involved in the present invention are determined based on the magnetic field determined by magnetic field sensor
Each of multiple rectangular areas in multiple rectangular areas, the space that do not affected by the magnetic hysteresis of scanning electro-magnet of justice is tired out
Evaluation can eliminate the magnetic hysteresis of scanning electro-magnet and affect controlling the shot of charged particle beam, and can realize high-precision
Beam exposure.
Description of the drawings
Fig. 1 is the brief configuration figure of the particle-beam therapeutic apparatus in embodiments of the present invention 1.
Fig. 2 is the structure chart of the irradiation control device of Fig. 1.
Fig. 3 is the figure for representing the multiple regions defined in magnetic field space.
Fig. 4 is the figure for representing other magnetic field sensors.
Specific embodiment
Embodiment 1.
Fig. 1 is the brief configuration figure of the particle-beam therapeutic apparatus in embodiments of the present invention 1.Particle-beam therapeutic is filled
Put including：Beam generator 51；Accelerator 52；Beam delivery device 53；Particle-beam exposure apparatus 54；Therapy planning device
55；And data server 56.It is powered to produce that beam generator 51 carries out acceleration to the charged particle produced in ion source
Particle beam.Accelerator 52 is connected with beam generator 51, and produced charged particle beam is accelerated.Beam delivery is filled
The charged particle beam projected after putting till 53 conveyings accelerate to the energy set in accelerator 52.Particle-beam exposure apparatus
54 downstreams for being arranged on beam delivery device 53, to irradiation object 15 charged particle beam is irradiated.Therapy planning device 55 generates pin
It is target illumination position coordinateses Pi and target dose Di etc. to the treatment plan data of the irradiation object 15 of patient.Data server
56 is stored be directed to the treatment plan data that each patient generates using therapy planning device 55.
Particle-beam exposure apparatus 54 include：Beam delivery pipeline 2, the beam delivery pipeline 2 is conveyed from beam delivery dress
Put the incoming charged particles beam 1a of 53 incidences；Scanning electro-magnet 3a, 3b, scanning electro-magnet 3a, 3b with incoming charged particles
Beam 1a perpendicular direction is to be scanned with incoming charged particles beam 1a in X-direction and Y-direction；Magnetic field sensor 20a, 20b,
The magnetic field sensor 20a, 20b detect the magnetic field produced by scanning electro-magnet 3a, 3b；Magnetic field data transducer 21；Beam position
Put monitor 7；Position data transducer 8；Dose monitor 11；Dose data transducer 12；Irradiation control device 5；And sweep
Retouch power supply 4.Magnetic field sensor 20a, 20b are such as magnetic field sensors with pick-up winding.In addition, as shown in figure 1, incident band
The direction of advance of electrochondria beamlet 1a is Z-direction.
Scanning electro-magnet 3a is the X-direction scanning electro-magnet being scanned to incoming charged particles beam 1a in X direction, scanning
Electric magnet 3b is the Y-direction scanning electro-magnet being scanned to incoming charged particles beam 1a along Y-direction.Magnetic field sensor 20a is
The X-direction magnetic field sensor in the magnetic field of X-direction is detected, magnetic field sensor 20b is the Y-direction magnetic in the magnetic field for detecting Y-direction
Field sensor.The magnetic field detected by magnetic field sensor 20a, 20b is converted into numerical data by magnetic field data transducer 21, is generated
Determine magnetic field Bs.Beam spot monitor 7 detects the injection charged particle beam 1b entered after horizontal deflection by scanning electro-magnet 3a, 3b
By position.Position data transducer 8 is converted into numerical data by what is detected by beam spot monitor 7 by position,
Generation locates coordinate Ps.Dose monitor 11 detects the dosage for projecting charged particle beam 1b.Dose data transducer 12
The dosage detected by dose monitor 11 is converted into into numerical data, is generated and is determined dosage Ds.
Control device 5 is irradiated based on the irradiation position in determining magnetic field Bs to control irradiation object 15, if determining dosage Ds
Target dose Di is reached, then to the output beam halt instruction Sspo of beam generator 51, stops charged particle beam.Scanning electricity
Source 4 is instruction current Io based on the control input to scanning electro-magnet 3 from the irradiation output of control device 5, is exported to scanning electricity
The exciting current that Magnet 3a, 3b are driven.
Fig. 2 is the structure chart for irradiating control device 5.Irradiation control device 5 has：Scanning electro-magnet command value maker 6；
Inverse mapping maker 30；Inverse mapping arithmetical unit 22；Error op device 24；Scanning electro-magnet command value compensator 23；Command value is defeated
Go out device 25；Beam supply sign on follower 26；And Dose Manager 10.
Action to irradiating control device 5 is illustrated.When the irradiation of particle-beam therapeutic apparatus is roughly divided into calibration
Formal irradiation when examination irradiation and treatment.In general, examination irradiation during calibration is the so-called irradiation for being corrected, do not having
In the state of having patient, examination irradiation is only carried out when needing to be corrected.By the control input to X-direction scanning electro-magnet 3a
(electric current Ixo) and the control input (electric current Iyo) to Y-direction scanning electro-magnet 3b change over various values to carry out examination irradiation, and
Determine beam exposure position now.The examination irradiation during calibration in embodiment 1 is carried out in the same manner as prior art, but in examination
During irradiation, the coordinate Ps (xs, ys) that locates of beam is not only determined, also using magnetic field sensor 20a, 20b to determining magnetic field
Bs (Bxs, Bys) is measured.By measure magnetic field Bs (Bxs, Bys) of scanning electro-magnet 3 now and locating for beam
Relational implementation between coordinate Ps (xs, ys) is into the mathematics as the inverse mapping arithmetical unit 22 generated by inverse mapping maker 30
Formula model.
By the serial data of the target illumination position coordinateses Pi of the examination irradiation made by therapy planning device 55 and target agent
The serial data of amount Di is sent to the irradiation control device 5 (step S001) of particle-beam exposure apparatus 54.The target of examination irradiation
Irradiation position coordinate Pi be particle-beam exposure apparatus 54 can range of exposures coordinate, try irradiation target dose Di be appoint
The dosage of meaning.Scanning electro-magnet command value maker 6 is directed to each target illumination position coordinateses Pi, the instruction based on generation
Electric current Ig (Ixg, Iyg) (step S002).Instruction current Ig of the command value follower 25 using based on is used as instruction current Io
(Ixo, Iyo) output is to scanning power supply 4.Scanning power supply 4 is controlled (step according to instruction current Io to scanning electro-magnet 3
S003)。
Beam supply sign on follower 26 is received and represents that command value follower 25 outputs this feelings of instruction current Io
The output signal of condition, is used for producing the beam supply instruction Ssto of beam to the output of beam generator 51.Beam generator
51 proceed by charged particle beam irradiation.Using magnetic field sensor 20a, 20b, the scanning electro-magnet to being controlled by instruction current Io
3 magnetic field is measured, and via magnetic field data transducer 21 to inverse mapping maker 30 input determine magnetic field Bs (Bxs,
Bys).Using locating for 7 couples of injection charged particle beam 1b scanned with scanning electro-magnet 3 of beam spot monitor
Coordinate Ps (xs, ys) is measured, and locate coordinate Ps via position data transducer 8, to the input of inverse mapping maker 30.
Inverse mapping maker 30 will determine magnetic field Bs (Bxs, Bys) and the coordinate Ps that locates (xs, ys) storages to depositing as built-in
In the memorizer of storage device (step S004).
Using the measure dosage of 11 couples of injection charged particle beam 1b scanned with scanning electro-magnet 3 of dose monitor
Ds is measured, and determines dosage Ds (step S005) to the input of Dose Manager 10 via dose data transducer 12.Dosage
Manager 10 is compared to target dose Di and measure dosage Ds, when dosage Ds is determined more than target dose Di, to beam
The output of generator 51 makes the beam halt instruction Sspo that beam stops.Beam generator 51 receives beam halt instruction
Sspo, stops charged particle beam 1a.Then, step S002 is returned to.Be altered to next target illumination position coordinateses Pi, start into
Row charged particle beam irradiation, until trying the irradiation object model of irradiation the step of repeat from step S002 to step S006
Till enclosing end (step S006).
A series of measure magnetic field Bs (Bxs, Bys) and locate coordinate Ps of the inverse mapping maker 30 based on storage
The mathematical expression model of making is stored in (step S007) in inverse mapping arithmetical unit 22 making mathematical expression model by (xs, ys).
As a preferred example, the mathematical expression model of inverse mapping arithmetical unit 22 is realized using multinomial.Pair with
Past conversion table is different and illustrate the reason for using inverse mapping arithmetical unit 22.It is assumed that specification, the scanning of scanning electro-magnet 3
On the basis of the specification of power supply 4 and the specification (irradiation energy, Incident beams position etc.) of irradiation beam are certain, if scanning
The magnetic field B (Bx, By) of electric magnet 3 determines that then irradiation position coordinate P (x, y) of beam is just uniquely determined, it can thus be assumed that and magnetic
Field B related to the relation of the irradiation position coordinate P of beam physical phenomenon is the just mapping of the output of 2 input 2.However, in treatment
In formal irradiation when, be provided previously by target illumination position coordinateses Pi (xi, yi) of beam, it is necessary to by the magnetic of scanning electro-magnet 3
Field B (Bx, By) controls into target illumination position coordinateses Pi (xi, yi) for causing to realize the beam.Formal photograph i.e., in the treatment
Hit, it is necessary to according to target illumination position coordinateses Pi (xi, yi) of beam, calculate the magnetic field B (Bx, By) of scanning electro-magnet 3
Presumed value so that realizing target illumination position coordinateses Pi (xi, yi).Thus, in order to obtain the presumption of magnetic field B (Bx, By)
Value, needs inverse mapping arithmetical unit 22.
Method to being realized the mathematical expression model of inverse mapping arithmetical unit 22 using multinomial is briefly described.Based in school
The coordinate Ps (xs, ys) and multiple measure magnetic field Bs (Bxs, Bys) that locates of the multiple beams determined in punctual examination irradiation,
Obtain the matrix of unknown parameters Ac of the inverse mapping for meeting PscAc=Bsc.Herein, matrix Psc is to arrange multiple in the row direction
The row element calculated according to the coordinate Ps (xs, ys) that locates of beam, [1, xs, the xs for example with 6 elements2,ys,
xsys,ys2] irradiation position coordinates matrix, matrix B sc be will determine magnetic field Bs (Bxs, Bys) as row element, in line direction
The upper magnetic field matrix for arranging multiple row elements.
The formula of the method for least square that can be represented using following (1) formula is obtaining the matrix of unknown parameters Ac of inverse mapping.
Ac=(PscTPsc)-1PscTBsc…(1)
In formula, PscTIt is the transposed matrix of matrix Psc.
The parameter matrix Ac that obtains as described above can be utilized, obtained according to following (2) formula magnetic field of the goal Bi (Bxi,
Byi), magnetic field of the goal Bi (Bxi, Byi) is the magnetic field B needed for for realizing target illumination position coordinateses Pi (xi, yi).
Bi=PipAc ... (2)
In formula, Pip is the row element calculated according to target illumination position coordinateses Pi (xi, yi) of beam, is to obtain
The element adopted during parameter matrix Ac, is in these cases matrix [1, xi, the xi with 6 elements2,yi,xiyi,
yi2]。
In the prior art, by the control input (electric current Ixo, electric current Iyo) to scanning electro-magnet 3 of calibration and beam
The relation of coordinate Ps (xs, ys) of locating is fabricated to conversion table, and in scanning electro-magnet command value maker 6 this is prestored
Conversion table.Separately, obtained according to the x coordinate (xi) of the target illumination position coordinateses Pi of beam and electromagnetism is scanned to X-direction
The control input (electric current Ixo) of ferrum 3a, obtains according to the y-coordinate (yi) of the target illumination position coordinateses Pi of beam and Y-direction is swept
Retouch the control input (electric current Iyo) of electric magnet 3b.But, in fact, the control input (electric current to X-direction scanning electro-magnet 3a
Ixo) impact is all produced on the xi and yi of the target illumination position coordinateses Pi of beam, and to the control of Y-direction scanning electro-magnet 3b
System input (electric current Iyo) also all produces impact to the xi and yi of beam exposure position, that is, there is interference term, therefore, using independence
Irradiation position precision is poor in the method for the conversion table obtained.
Each Bxi of the particle-beam exposure apparatus 54 of embodiment 1 in inverse mapping arithmetical unit 22 to magnetic field of the goal Bi and
Byi realizes the mathematical expression model after the interference term of the xi and yi that consider target illumination position coordinateses Pi, thus with not in the past
Together, the irradiation position precision for projecting charged particle beam 1b can be improved.
Then, the formal irradiation during treatment in the particle-beam therapeutic apparatus of embodiment 1 is illustrated.According to
Formal irradiation when lower order is to be treated.
For each irradiation object 15, by the serial data of the target illumination position coordinateses Pi made by therapy planning device 55
With the irradiation control device 5 (step S101) that the serial data of target dose Di is sent to particle-beam exposure apparatus 54.Scanning electricity
Magnet command value maker 6 is directed to each target illumination position coordinateses Pi, the instruction current Ig (Ixg, Iyg) based on generation
(step S102).Instruction current Ig of the command value follower 25 using based on is arrived as instruction current Io (Ixo, Iyo) outputs
Scanning power supply 4.Scanning power supply 4 is controlled (step S103) according to instruction current Io to scanning electro-magnet 3.
Inverse mapping arithmetical unit 22 is gone out for leading to beam according to target illumination position coordinateses Pi using mathematical expression model calculation
The magnetic field of the goal Bi (Bxi, Byi) of target illumination position coordinateses Pi is crossed, and exports magnetic field of the goal Bi (Bxi, Byi) (step
S104)。
Using magnetic field sensor 20a, 20b, the magnetic field of the scanning electro-magnet 3 to being controlled by instruction current Io is measured,
And determine magnetic field Bs (Bxs, Bys) (step S105) to the input of error op device 24 via magnetic field data transducer 21.Error is transported
Calculate device 24 to be compared magnetic field of the goal Bi and measure magnetic field Bs, calculate magnetic field error Be (step S106).
Scanning electro-magnet command value compensator 23 according to the magnetic field error Be exported from error op device 24, with PID (ratios
Example integral differential) compensator identical mode to be generating current correction values Ie.For example, (step is generated using following (3) formula
S107)。
Ie=KpBe ... (3)
In formula, Kp is proportional gain.
Command value follower 25 the instruction current Ig based on current correction values Ie pair is corrected after instruction
Electric current Ig-Ie is as instruction current Io (Ixo, Iyo) outputs to scanning power supply 4.Scanning power supply 4 according to instruction current Io, to sweeping
Retouch electric magnet 3 to be controlled (step S108).When the magnetic field error Be exported from error op device 24 become specify threshold value with
When lower, beam supply sign on follower 26 is used for producing the beam supply instruction of beam to the output of beam generator 51
Ssto.Beam generator 51 proceeds by charged particle beam irradiation (step S109).
Using dose monitor 11, the measure agent of the injection charged particle beam 1b to being scanned with scanning electro-magnet 3
Amount Ds is measured, and via dose data transducer 12, to the input of Dose Manager 10 dosage Ds (step S110) is determined.Dosage
Manager 10 is compared to target dose Di and measure dosage Ds, when dosage Ds is determined more than target dose Di, to beam
The output of generator 51 makes the beam halt instruction Sspo that beam stops.Beam generator 51 receives beam halt instruction
Sspo, stops charged particle beam 1a.Then, step S102 is returned to.Be altered to next target illumination position coordinateses Pi, start into
Row charged particle beam irradiation, repeat from step S102 to the step S111 the step of until irradiation object end of extent (EOE)
(step S111).
By the energy for changing incoming charged particles beam 1a, so as to the depth direction (Z-direction) in irradiation object 15
Position coordinateses are controlled.If all of irradiation object that the depth direction (Z-direction) in irradiation object 15 is also included
Scope all at the end of, then treat when formal irradiation terminate.
In step S111, each area of the multiple zonules for defining in magnetic field space as shown in Figure 3
Domain, carries out the dosage management of charged particle beam.Fig. 3 is to represent the magnetic field zonule S defined in magnetic field space (Bx, By)i,j's
Figure.(the B of table left column0,B1) briefly express magnetic field B X-component Bx meet B0≤ Bx ＜ B1Relation, equally, (Bm-1,Bm) briefly
Represent that Bx meets Bm-1≤ Bx ＜ BmRelation.(the B of table epimere0,B1) briefly express magnetic field B Y-component By meet B0≤ By ＜ B1
Relation, equally, (Bm-1,Bm) briefly express By meet Bm-1≤ By ＜ BmRelation.Region S0,0It is to meet B0≤ Bx ＜ B1And B0
≤ By ＜ B1Relation region, region Sm-1,m-1It is to meet Bm-1≤ Bx ＜ BmAnd Bm-1≤ By ＜ BmRelation region.
Because the region defined in magnetic field space is the magnetic of the generation between the electric current comprising scanning electro-magnet 3 and magnetic field
Defined in the stagnant magnetic field in the state of interior, therefore, the region defined in magnetic field space is by the magnetic hysteresis of scanning electro-magnet 3
Impact, the magnetic field obtained by the utilization magnetic field sensor 20 that charged particle beam irradiation is obtained is carried out during calibration and beam is utilized
The relation between magnetic field and beam spot when the relation between beam spot obtained by position monitor 7 and formal irradiation
It is extremely well consistent, wherein, the formal irradiation is carries out charged particle scanning in the case of just identical with during calibration
Formula is irradiated.Can according to charged particle beam project position, in beam spot monitor 7 by position, particle-beam exposure
The position relationship of device 54 and irradiation object 15 obtaining actual irradiation space, therefore, the region in actual irradiation space with magnetic
Region defined in the space of field has mapping relations, and in formal irradiation, the mapping relations are also basically unchanged.Thus, in step
In S111, for the multiple magnetic field zonule S defined in magnetic field spacei,jEach region carry out the agent of charged particle beam
Buret is managed, accordingly, it is capable to the dosage management in actually irradiation space being accurately irradiated in object 15.
The particle-beam exposure apparatus 54 of embodiment 1 are based on the magnetic field produced by scanning electro-magnet 3, to incident band electrochondria
Beamlet 1a carries out feedback control, i.e. directly to the shape of the magnetic hysteresis of generation between the electric current comprising scanning electro-magnet 3 and magnetic field
State detected and is controlled, accordingly, it is capable to eliminate the magnetic hysteresis of scanning electro-magnet 3 affect, can realize high-precision beam exposure.
Further, since the basic physical quantity being corrected as the control input (instruction current Io) to scanning electro-magnet 3 is set to
The magnetic field of scanning electro-magnet 3, therefore, even if not supplying incident charged particle beam 1a, also can be to the irradiation position of charged particle beam 1a
Put and be controlled.Thus, the irradiation position of incoming charged particles beam 1a is made in the case where incident charged particle beam 1a is not supplied
Supply charged particle beam after coordinate is consistent with target illumination position coordinateses Pi, accordingly, it is capable to accurately to irradiation object 15
The safe particle ray of irradiation.
Particle-beam exposure apparatus 54 utilize the magnetic field that magnetic field sensor 20 is determined to the multiple areas defined in magnetic field
Domain carries out feedback control, and dosage management is carried out in the field region, therefore, with survey in conventional utilization dose monitor 11
Elapsed time is different in the feedback control that fixed position coordinateses are carried out, and can at high speed carry out feedback control.Thus, control can be shortened
Penetrate the irradiation time of the entirety of object 15.
Particle-beam exposure apparatus 54 adopt the magnetic field sensor with pick-up winding using as magnetic field sensor 20, because
This, even if there is magnetic fluctuation drastically, also can accurately determine the magnetic field of scanning electro-magnet 3.Thus, can be passed using magnetic field
The measure magnetic field Bs that sensor 20 is determined, carries out feedback control with carrying out high-speed, high precision, and the high speed that can carry out charged particle beam is swept
Retouch.Thus, the irradiation time to the entirety of irradiation object 15 can be shortened.
As magnetic field sensor 20, the magnetic field sensor for possessing pick-up winding as shown in Figure 4 may also be employed.Fig. 4 is table
Show the figure of other magnetic field sensors 20, be the figure that scanning electro-magnet 3 and magnetic field sensor 20 are amplified.Scanning electro-magnet 3
With iron core 17 and winding 16.Magnetic field sensor 20 shown in Fig. 4 possesses pick-up winding, and the length of the pick-up winding is to utilize to sweep
Retouch the iron core 17 of scanning electro-magnet 3 in the direction of advance (Z-direction) of the charged particle beam 1a before electric magnet 3 is scanned
More than core length L.Thus, can be to the space of the Z-direction in the magnetic field of the scanning electro-magnet 3 for being scanned charged particle beam
Integrated value is measured.By using the integrated value in magnetic field, enter so as to the magnetic field accurately to making charged particle beam steering
Row is determined, and further high-precision feedback control can be carried out to charged particle beam.In addition, configure multiple magnetic fields in z-direction passing
Sensor 20, so as to constitute the magnetic field sensor 20b of the magnetic field sensor 20a of X-direction, Y-direction.
In the case where slowly charged particle beam scanning is carried out, magnetic field sensor 20 can also be the magnetic with Hall element
Field sensor.By using Hall element, so as to be measured to the absolute value in the magnetic field produced by scanning electro-magnet 3, and
Without the need for the computing such as be integrated to the voltage measured by pick-up winding.Thus, simplify can magnetic field data transducer 21, small-sized
Change.Additionally, magnetic field sensor 20 can also be the magnetic field sensor with pick-up winding and Hall element.By using Hall unit
Part is measured to the initial value for determining magnetic field Bs, variable quantity is measured using pick-up winding, so as in arbitrary timing
Magnetic field measuring is carried out, the magnetic field measuring time can be shortened.Thus, can at high speed carry out feedback control.Thus, can shorten right to irradiating
As the irradiation time of 15 entirety.
Conventional particle-beam exposure apparatus detect beam exposure position merely with 1 or multiple stage beam spot monitor
Put, using locating, coordinate pair charged particle beam carries out feedback control.Configure multiple position monitors etc. and block charged particle
The object of beam can bring following problem：As beam divergence amplifies, desired beam spot diameter can cannot be obtained.
The particle-beam exposure apparatus 54 of embodiment 1 in formal irradiation, using what is determined by magnetic field sensor 20
Determining magnetic field Bs carries out feedback control to charged particle beam, therefore, also can be in formal irradiation, using mobile device (not shown)
Carry out moving beam position monitor 7, make injection charged particle beam 1b not pass through beam spot monitor 7.By so, preventing
Only project charged particle beam 1b and scatter amplification because of beam spot monitor 7.Thus, beam spot diameter can be reduced.Thus, when with
When little beam diameter is to be irradiated preferable, can be treated with appropriate spot diameter.
As described above, according to the particle-beam exposure apparatus 54 of embodiment 1, including：Magnetic field sensor 20, the magnetic field passes
Sensor 20 is measured to the magnetic field of scanning electro-magnet 3；And irradiation control device 5, the irradiation control device 5 is based on by magnetic field
The target illumination position coordinateses Pi of the measure magnetic field Bs and charged particle beam 1b that sensor 20 is determined is carried out to scanning electro-magnet 3
Control, irradiation control device 5 has：Inverse mapping arithmetical unit 22, inverse mapping arithmetical unit 22 target according to charged particle beam 1b
Irradiation position coordinate Pi calculates magnetic field of the goal Bi；And compensator 23, the compensator 23 exports the control to scanning electro-magnet
Input Io, wherein, the magnetic field of the goal Bi and magnetic field error Be for determining magnetic field Bs is controlled the control input Io threshold value in regulation
Hereinafter, affect accordingly, it is capable to eliminate the magnetic hysteresis of scanning electro-magnet, high-precision beam exposure can be realized.
According to the particle-beam therapeutic apparatus of embodiment 1, including：Beam generator 51, the beam generator 51
Produce charged particle beam；Accelerator 52,52 pairs of charged particle beams produced by beam generator 51 of the accelerator accelerate；
Beam delivery device 53, the charged particle beam that the beam delivery device conveying is accelerated using accelerator 52；And particle
Beam exposure apparatus 54, the particle-beam exposure apparatus 54 with scanning electro-magnet 3 pairs by beam delivery device 53 convey it is powered
Particle beam is scanned to be irradiated to irradiation object 15, and particle-beam exposure apparatus 54 have：Magnetic field sensor 20, the magnetic
Field sensor 20 is measured to the magnetic field of scanning electro-magnet 3；And irradiation control device 5, the irradiation control device 5 be based on by
The target illumination position coordinateses Pi of the measure magnetic field Bs and charged particle beam 1b that magnetic field sensor 20 is determined, to scanning electro-magnet
3 are controlled, and irradiation control device 5 has：Inverse mapping arithmetical unit 22, inverse mapping arithmetical unit 22 is according to charged particle beam 1b's
Target illumination position coordinateses Pi calculates magnetic field of the goal Bi；And compensator 23, the compensator 23 exported to scanning electro-magnet 3
Control input Io, control input Io by magnetic field of the goal Bi with determine magnetic field Bs magnetic field error Be control regulation threshold value with
Under, accordingly, it is capable to eliminate the magnetic hysteresis of scanning electro-magnet affect, can realize that high-precision particle is penetrated using high-precision beam exposure
Line is treated.
Although in addition, in embodiment 1, carrying out by taking spot scan as an example as the particle-beam therapeutic apparatus of sweep type
Illustrate, but utilizing the measure magnetic field Bs determined by magnetic field sensor 20 to carry out feedback control to charged particle beam also can apply
In raster scanning.
Industrial practicality
Particle-beam exposure apparatus and particle-beam therapeutic apparatus involved in the present invention can be suitably applied to for curing
The particle-beam therapeutic apparatus treated or study.
Label declaration
1a incoming charged particles beams
1b projects charged particle beam
3 scanning electro-magnets
3a X-direction scanning electro-magnets
3b Y-direction scanning electro-magnets
7 beam spot monitors
11 dose monitors
15 irradiation objects
20 magnetic field sensors
20a X-direction electric magnet magnetic field sensors
20b Y-direction electric magnet magnetic field sensors
22 inverse mapping arithmetical units
23 scanning electro-magnet command value compensators
30 inverse mapping makers
51 beam generators
52 accelerators
53 beam delivery devices
54 particle-beam exposure apparatus
Bi magnetic field of the goal
Bs determines magnetic field
Pi target illumination position coordinateses
Ps locates coordinate
Di target doses
Ds determines dosage
Io instruction currents
Si,jMagnetic field zonule
Be magnetic field errors
Claims (4)
1. a kind of particle-beam exposure apparatus, it is scanned to the charged particle beam accelerated by accelerator, possesses and have
The scanning electro-magnet of magnetic hysteresis, by, to irradiation object, its feature exists by the charged particle beam irradiation of the scanning electro-magnet
In the particle-beam exposure apparatus include：
Magnetic field sensor, the magnetic field sensor is measured to the magnetic field of the scanning electro-magnet；And
Irradiation control device, the irradiation control device by the shot of the charged particle beam of the scanning electro-magnet to being entered
Row control,
The X-direction that determined by the magnetic field sensor and the magnetic field of Y-direction are defining multiple rectangular areas, the irradiation control
Device processed obtains the aggregate-value of the dosage of the charged particle beam by each rectangular area, and based on described in each rectangular area
Aggregate-value is controlling the shot of the charged particle beam.
2. particle-beam exposure apparatus as claimed in claim 1, it is characterised in that
When the rectangular area for reaching target dose in the aggregate-value is located at course of the beam, the irradiation control device stops
The charged particle beam from the accelerator is projected, and the rectangle of the target dose is not up in the aggregate-value
When region is located at the course of the beam, the irradiation control device projects the charged particle beam.
3. particle-beam exposure apparatus as claimed in claim 1 or 2, it is characterised in that
Including dose monitor, the dose monitor is measured to the dosage of the charged particle beam,
The irradiation control device has Dose Manager, and the Dose Manager is based on the survey determined by the dose monitor
Determine dosage and target dose, for rectangular area each described, be irradiated the management of dosage.
4. a kind of particle-beam therapeutic apparatus, it is characterised in that include：
Beam generator, the beam generator produces charged particle beam；
Accelerator, the accelerator accelerates to the charged particle beam by produced by the beam generator；
Beam delivery device, the charged particle beam that the beam delivery device conveying is accelerated by the accelerator；And
Particle-beam exposure apparatus, the particle-beam exposure apparatus scanning electro-magnet is to being conveyed by the beam delivery device
Charged particle beam is scanned, to be irradiated to irradiation object,
The particle-beam exposure apparatus are particle-beam exposure apparatus as claimed any one in claims 1 to 3.
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| CN201410648274.1A CN104324449B (en) | 2009-08-27 | 2009-08-27 | Particle ray irradiating device and particle ray treatment device |
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| CN200980160948.0A CN102470255B (en) | 2009-08-27 | 2009-08-27 | Particle beam irradiation apparatus, particle beam therapy apparatus and particle beam irradiation method |
| CN201410648274.1A CN104324449B (en) | 2009-08-27 | 2009-08-27 | Particle ray irradiating device and particle ray treatment device |
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| CN107427694B (en) * | 2015-03-30 | 2020-01-07 | 住友重机械工业株式会社 | Charged particle beam therapy device |
| US10837943B2 (en) * | 2017-05-26 | 2020-11-17 | Allegro Microsystems, Llc | Magnetic field sensor with error calculation |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2007132902A (en) * | 2005-11-14 | 2007-05-31 | Hitachi Ltd | Particle beam irradiation system |
| CN101002978A (en) * | 2006-01-16 | 2007-07-25 | 三菱电机株式会社 | Particle-beam exposure apparatus and particle-beam therapeutic apparatus |
| CN101371161A (en) * | 2006-01-12 | 2009-02-18 | 皇家飞利浦电子股份有限公司 | Improved indication of patient skin dose in radiology |
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| JP3801938B2 (en) * | 2002-03-26 | 2006-07-26 | 株式会社日立製作所 | Particle beam therapy system and method for adjusting charged particle beam trajectory |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007132902A (en) * | 2005-11-14 | 2007-05-31 | Hitachi Ltd | Particle beam irradiation system |
| CN101371161A (en) * | 2006-01-12 | 2009-02-18 | 皇家飞利浦电子股份有限公司 | Improved indication of patient skin dose in radiology |
| CN101002978A (en) * | 2006-01-16 | 2007-07-25 | 三菱电机株式会社 | Particle-beam exposure apparatus and particle-beam therapeutic apparatus |
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