CN104236725A - Precision laser wavelength measurement device and precision laser wavelength measurement method - Google Patents
Precision laser wavelength measurement device and precision laser wavelength measurement method Download PDFInfo
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- CN104236725A CN104236725A CN201410512204.3A CN201410512204A CN104236725A CN 104236725 A CN104236725 A CN 104236725A CN 201410512204 A CN201410512204 A CN 201410512204A CN 104236725 A CN104236725 A CN 104236725A
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Abstract
The invention relates to wavelength measurement techniques, in particular to a precision laser wavelength measurement device and a precision laser wavelength measurement method. The precision laser wavelength measurement device comprises a femtosecond pulse laser, a PPLN (periodically poled lithium niobate) crystal, photonic crystal fibers, a first convex lens, a first attenuator, a first half-wave plate, a diaphragm, a second attenuator, a second half-wave plate, a first polarization beam splitter, a third half-wave plate and a second polarization beam splitter. The PPLN crystal, the photonic crystal fibers, the first convex lens, the first attenuator and the first half-wave plate are sequentially positioned on an emergent light path of the femtosecond pulse laser; the diaphragm, the second attenuator, the second half-wave plate, the first polarization beam splitter, the third half-wave plate and the second polarization beam splitter are sequentially positioned on a to-be-measured laser path. An emergent light path of the second polarization beam splitter is provided with a reflection grating, and a second convex lens, an optical filter, a third convex lens, a third attenuator and an avalanche diode detector are sequentially arranged on a reflection light path of the reflection grating; a spectrometer is connected to a signal output end of the avalanche diode detector. The precision laser wavelength measurement device and the precision laser wavelength measurement method have the advantages of simple structure, simplicity and convenience in operation, easiness in adjustment, low external disturbance, high stability and extremely high precision.
Description
Technical field
The present invention relates to wavelength measurement technology, specifically a kind of device and method of accurate measurement optical maser wavelength.
Background technology
Along with the development of modern science and technology, the measurement of optical maser wavelength occupies more and more consequence in fields such as metrology, information science, communication, astronomy, be the focus paid close attention to both at home and abroad always, improve laser wavelength measurement accuracy and have very important significance.Optical maser wavelength is as measuring basis value, be widely used in the measurement of length, angle, flatness, linearity and verticality etc., be the important measurement standard of precision optical machinery and microelectronics industry, and measure the size of wavelength accurately and stability is the key ensureing measurement accuracy and magnitude tracing.Therefore, the research of laser wavelength measurement equipment has applicability and development prospect widely, and the raising of laser wavelength measurement precision also will promote the precision of associated art.Meanwhile, the requirement of development to the degree of accuracy of optical maser wavelength standard of science and technology is more and more higher.Therefore, on the basis of prior art means, the degree of accuracy improving wavelength measurement is extremely urgent.Domestic and international for laser wavelength measurement technology mainly following several method at present.
The first is the measurement of the optical maser wavelength based on harmonic wave optical frequency chain.The party's ratio juris is through the microwave harmonic oscillator of a series of maintenance PGC demodulation and particular laser from Cs atom microwave frequency marking, tested optical frequency and microwave frequency standard is coupled together, thus realizes the accurate measurement of optical maser wavelength.Although but achieve the absolute measurement of optical frequency due to this method, instead of directly measure, if and the excesssive gap (more than 10GHz) in actual measurement process in chain between optical frequency, determine that contacting between known optical frequency and arbitrary unknown optical frequency is very difficult.So the measuring method of this optical maser wavelength not easily realizes.
The second is the optical frequency measurement based in optical frequency interval point of frequency chain.Nineteen ninety, the people such as Telle propose and measure optical frequency with optical frequency interval dichotomy.Its ultimate principle is based on three laser instruments, utilize nonlinear crystal by frequency f 1 frequency multiplication of a wherein laser instrument, and be locked in all the other two laser frequency with the center (f2+f3)/2 of frequency signal, namely constitute point laser instrument in optical frequency interval.If take n above-mentioned one point of process to the new optical frequency interval formed, the optical frequency interval so finally obtained only has f/2
n, this frequency interval can directly be measured.But in order to there be suitable microwave frequency standard to carry out beat frequency measurement as a reference, the last optical frequency interval of this technical requirement is enough little.One can cover a point frequency chain in microwave section to the optical frequency interval of the hundreds of THz of optical frequencies is that extremely complexity realizes with being difficult to.
The third is the measuring method of the optical maser wavelength based on principle of interference.Laser wavelength measurement is based on principle of interference mostly, and typical commercialization wavelength measurement instrument (wavemeter) has Michelson interference type, cloud tints rope interfere type and F-P interfere type.Michaelson wavemeter is applicable to measuring continuous laser wavelength, and measuring accuracy reaches as high as 10
-7.Fizeau interference is a kind of film two-beam interference, and striking rope type wavemeter structure is simple, do not need built-in reference laser instrument, but measuring accuracy is lower than Michaelson and F-P type wavemeter, the Fizeau interference type wavemeter that New Focus company of the U.S. produces, and precision is 10
-5.F-P interfere type wavemeter is the measurement utilizing light beam to be carried out testing laser wavelength with the phenomenon producing multiple-beam interference during the glass plate that high reflectance, spacing are certain by two pieces of platings.But wavemeter is suitable for the preliminary surveying carrying out wavelength mostly, its precision not high (precision that the degree of accuracy of common wavelengths meter reaches is 30-60MHz magnitude) measured, error is comparatively large, and also larger by the impact of external environment.
Summary of the invention
The present invention, in order to technical matterss such as the accuracy solving present stage inner laser wavelength measurement is low, error large, the poor stabilities of measurement, provides a kind of device and method of accurate measurement optical maser wavelength.
The device of a kind of accurate measurement optical maser wavelength of the present invention realizes by the following technical solutions: a kind of device of accurate measurement optical maser wavelength, comprises femtosecond pulse laser, is positioned at PPLN crystal, photonic crystal fiber, the first convex lens, the first attenuator and the first half-wave plate on femtosecond pulse laser emitting light path in turn; Also comprise the diaphragm be positioned in turn in testing laser light path, the second attenuator, the second half-wave plate, the first polarization beam apparatus, the 3rd half-wave plate and the second polarization beam apparatus; First polarization beam apparatus is also positioned on the emitting light path of the first half-wave plate; The position of the first half-wave plate and the first polarization beam apparatus should ensure by the light path of the laser of the first half-wave plate outgoing after the first polarization beam apparatus reflects with coincided by the light path of laser after the first polarization beam apparatus transmission of the second half-wave plate outgoing; The emitting light path of the second polarization beam apparatus is provided with reflection grating, the reflected light path of reflection grating is provided with in turn the second convex lens, optical filter, the 3rd convex lens, the 3rd attenuator and avalanche diode detector; The signal output part of avalanche diode detector is connected with frequency spectrograph.
Based on the relative merits of existing several wavelength measurement method, present applicant proposes one and utilize femtosecond pulse laser and testing laser to be concerned with, optical maser wavelength is realized to the device accurately measured.Femtosecond pulse laser volume is little, light, and has high reliability and high stability, the pointolite of its only near ideal exported, and the circularity of output beam and intensity distributions are easier to obtain close to desirable high-quality output beam.What femtosecond pulse laser exported is the pulse of the equifrequent spacing of 100MHz to 1GHz, broadened by light beam after PPLN crystal and photonic crystal fiber, and its total frequency bandspread is 1 to 100THz.Super continuous spectrum in frequency field after broadening is that a series of equally spaced frequency content combines, and its side frequency is spaced apart pulse repetition rate, and zero point correction frequency is offset frequency.So the continuous spectrum after broadening can be considered that has high degree of accuracy and the laser frequency scale that can trace to the source, can be used for measuring the optical maser wavelength in any coverage, also lock the frequency of operating laser by rrequency-offset-lock mode, as bridge, measurement result is traced to the source to frequency reference by it.
Through the Laser coherent combining of femtosecond pulse laser and target (to be measured) laser instrument, the optical maser wavelength of target laser can be obtained.By the repetition frequency of locking femtosecond mode-locked laser and offset frequency to microwave frequency benchmark, time domain obtains the femtosecond pulse that repetition frequency is stable, frequency domain obtains the laser frequency comb that frequency interval is stable.Interference signal is gathered by detection, the spectral line profile that what the signal collected showed on frequency spectrograph is about different frequency, can be read the frequency difference of testing laser and femtosecond laser coherent signal by frequency spectrograph, the frequency values of the femtosecond laser be concerned with according to testing laser can obtain the exact value of testing laser frequency.
Further, the emitting light path of described femtosecond pulse laser is provided with first completely reflecting mirror; Described PPLN crystal is positioned on the reflected light path of the first completely reflecting mirror; The beam collimation structure be made up of the second completely reflecting mirror, the 3rd completely reflecting mirror and the 4th completely reflecting mirror is also provided with between first attenuator and the first half-wave plate; Also comprise the 5th catoptron be positioned on the second polarization beam apparatus emitting light path; Described reflection grating is positioned on the reflected light path of the 5th completely reflecting mirror.
Beam collimation structure is used for the laser alignment after expanding and is incident to the first half-wave plate, makes whole device take up space reduction simultaneously; First completely reflecting mirror and the 5th catoptron are also for the collimation of laser, and optimization device taken up space simultaneously.
Further, a cavity shell having the first through hole and the second through hole is also comprised; Described 3rd completely reflecting mirror, the second attenuator, diaphragm, the second half-wave plate, first polarization beam apparatus, avalanche diode detector, frequency spectrograph, the 3rd attenuator, 3rd convex lens, optical filter, the second convex lens, grating, 5th completely reflecting mirror, the second polarization beam apparatus, the 3rd half-wave plate, the first half-wave plate, 4th completely reflecting mirror, the first completely reflecting mirror, PPLN crystal, photonic crystal fiber, first convex lens, the first attenuator, the second completely reflecting mirror is all positioned at cavity; The laser of femtosecond pulse laser outgoing is injected by the first through hole and is positioned on the first completely reflecting mirror of cavity; Testing laser is incident on diaphragm through the second through hole; Avalanche diode detector is connected with frequency spectrograph by BNC line.
During work, cavity plays the effect of insulation blocking.All parts after cavity is fixing by position, can make an intensive portable device, convenient mobile, eliminates the complicated procedures of forming of assembling simultaneously, has saved the time.
The method of a kind of accurate measurement optical maser wavelength of the present invention adopts following technical scheme to realize: a kind of method of accurate measurement optical maser wavelength, comprise the following steps: the laser that (a), femtosecond pulse laser are launched realizes expanding after PPLN crystal and photonic crystal fiber, laser after expanding is after the first convex lens focus, the first half-wave plate is arrived through beam collimation structure through the first attenuator, after the first half-wave plate adjustment laser polarization direction, enter the first polarization beam apparatus, then output to the 3rd half-wave plate after the first polarization beam apparatus reflection; The laser that testing laser device exports simultaneously passes through diaphragm, through the second attenuator, after the second half-wave plate adjustment laser polarization direction, enters the first polarization beam apparatus; Meet the Laser output of the first polarization beam apparatus polarization direction to the 3rd half-wave plate, behind the femtosecond pulse laser laser input to which through the adjustment of the 3rd half-wave plate and the polarization direction of testing laser device laser, output to the second polarization beam apparatus; B (), above-mentioned two light beams incide the second polarization beam apparatus after, the polarized light meeting the second polarization beam apparatus outbound course exports and completes optics coherence tomography; C (), synthesis light incide in reflection grating after the 5th completely reflecting mirror reflection, after reflection grating diffraction also reflection, then become continuous light bands of a spectrum by the second convex lens focus; Continuous light bands of a spectrum, through after optical filter, incide the 3rd convex lens, and light beam, after the 3rd convex lens focus, through the 3rd attenuator, incides avalanche diode detector; D (), avalanche diode detector convert the light signal collected to corresponding electric signal, and are inputed to frequency spectrograph; The frequency of testing laser can be obtained according to the frequency difference of testing laser shown on frequency spectrograph and femtosecond laser coherent signal and the frequency values of femtosecond laser that is concerned with testing laser.
During work, avalanche diode detector gathers spectral signal, collection signal is input to frequency spectrograph and can be further analyzed process.Be shown in Fig. 2 and utilize the relevant experimental result and the notional result comparison diagram that record optical maser wavelength.Measure gained optical maser wavelength degree of accuracy as shown in Figure 2 very high, if repeatedly duplicate measurements can obtain the test result of more coincideing with actual wavelength.In above-mentioned test macro, the laser instrument of subtest is femtosecond pulse laser (laser frequency is 1560nm).After ultra-short pulse laser frequency is broadened, its spectral coverage is 300-1200nm, is equivalent to the combination of numerous general single mode laser instrument, by the screening of optical filter, can obtain required frequency band.In time domain, the output of locked mode femtosecond pulse laser is a series of equally spaced ultrashort pulses, and pulse width is a few to tens of femtoseconds, and repetition frequency is that hundreds of MHz is to a few GHz; In frequency field, the light comb that its spectrum is made up of the equally spaced continuous wave spectrum line of series of rules, the interval between each comb accurately equals the pulse repetition rate of femto-second laser.Based on above some, the problems such as the accuracy that present invention efficiently solves present stage inner laser wavelength measurement is low, error large, the poor stability measured.
The invention provides a kind of structure based on femtosecond laser simple, easy and simple to handle, be easy to regulate, external interference is little, stability is strong, degree of accuracy is high experimental provision and method, this device and method based on the particular advantages of the pulsed laser of locked mode, the problems such as the accuracy efficiently solving present stage inner laser wavelength measurement is low, error large, the poor stability measured, efficiency are low.Whole device and method have structure simple, easy and simple to handle, be easy to regulate, external interference is little, stability is strong, degree of accuracy is high advantage.
Accompanying drawing explanation
Fig. 1 is the structural representation of device of the present invention.
Fig. 2 is laser wavelength measurement experiment and theoretical comparison diagram.
The signal graph that the coherent light that Fig. 3 frequency spectrograph of the present invention obtains produces.
In figure: 1-the 3rd completely reflecting mirror, 2-second attenuator, 3-diaphragm, 4-second through hole, 5-second half-wave plate, 6-first polarization beam apparatus, 7-avalanche diode detector, 8-BNC line, 9-frequency spectrograph, 10-the 3rd attenuator, 11-the 3rd convex lens, 12-optical filter, 13-second convex lens, 14-reflection grating, 15-the 5th completely reflecting mirror, 16-second polarization beam apparatus, 17-the 3rd half-wave plate, 18-first half-wave plate, 19-the 4th completely reflecting mirror, 20-first completely reflecting mirror, 21-first through hole, 22-PPLN crystal, 23-photonic crystal fiber, 24-first convex lens, 25-first attenuator, 26-second completely reflecting mirror, 27-cavity, 28-femtosecond pulse laser.
Embodiment
A device for accurate measurement optical maser wavelength, comprises femtosecond pulse laser 28, is positioned at PPLN crystal 22, photonic crystal fiber 23, first convex lens 24, first attenuator 25 and the first half-wave plate 18 on femtosecond pulse laser 28 emitting light path in turn; Also comprise diaphragm 3, second attenuator 2, second half-wave plate 5, first polarization beam apparatus 6, the 3rd half-wave plate 17 and the second polarization beam apparatus 16 that are positioned in turn in testing laser light path; First polarization beam apparatus 6 is also positioned on the emitting light path of the first half-wave plate 18; The position of the first half-wave plate 18 and the first polarization beam apparatus 6 should ensure by the light path of the laser of the first half-wave plate 18 outgoing after the first polarization beam apparatus 6 reflects with coincided by the light path of laser after the first polarization beam apparatus 6 transmission of the second half-wave plate 5 outgoing; The emitting light path of the second polarization beam apparatus 16 is provided with reflection grating 14, the reflected light path of reflection grating 14 is provided with in turn the second convex lens 13, optical filter 12, the 3rd convex lens 11, the 3rd attenuator 10 and avalanche diode detector 7; The signal output part of avalanche diode detector 7 is connected with frequency spectrograph 9.
The emitting light path of described femtosecond pulse laser 28 is provided with first completely reflecting mirror 20; Described PPLN crystal 22 is positioned on the reflected light path of the first completely reflecting mirror 20; The beam collimation structure be made up of the second completely reflecting mirror 26, the 3rd completely reflecting mirror 1 and the 4th completely reflecting mirror 19 is also provided with between first attenuator 25 and the first half-wave plate 18; Also comprise the 5th catoptron 15 be positioned on the second polarization beam apparatus 16 emitting light path; Described reflection grating 14 is positioned on the reflected light path of the 5th completely reflecting mirror 15.
Also comprise the cavity 27 shell having the first through hole 21 and the second through hole 4; Described 3rd completely reflecting mirror 1, second attenuator 2, diaphragm 3, second half-wave plate 5, first polarization beam apparatus 6, avalanche diode detector 7, frequency spectrograph 9, the 3rd attenuator the 10, three convex lens 11, optical filter 12, second convex lens 13, grating 14, the 5th completely reflecting mirror 15, second polarization beam apparatus 16,3rd half-wave plate 17, first half-wave plate the 18, four completely reflecting mirror 19, first completely reflecting mirror 20, PPLN crystal 22, photonic crystal fiber 23, the first convex lens 24, first attenuator 25, second completely reflecting mirror 26 is all positioned at cavity 27; The laser of femtosecond pulse laser 28 outgoing is injected by the first through hole 21 and is positioned on the first completely reflecting mirror 20 of cavity 27; Testing laser is incident on diaphragm 3 through the second through hole 4; Avalanche diode detector 7 is connected with frequency spectrograph 9 by BNC line 8.
A kind of method of accurate measurement optical maser wavelength, comprise the following steps: the laser that (a), femtosecond pulse laser 28 is launched realizes expanding after PPLN crystal 22 and photonic crystal fiber 23, laser after expanding is after the first convex lens 24 focus on, the first half-wave plate 18 is arrived through beam collimation structure through the first attenuator 25, after the first half-wave plate 18 adjusts laser polarization direction, enter the first polarization beam apparatus 6, then output to the 3rd half-wave plate 17 after the first polarization beam apparatus 6 reflects; The laser that testing laser device exports simultaneously passes through diaphragm 3, through the second attenuator 2, after the second half-wave plate 5 adjusts laser polarization direction, enters the first polarization beam apparatus 6; Meet the Laser output of the first polarization beam apparatus 6 polarization direction to the 3rd half-wave plate 17, behind the femtosecond pulse laser laser input to which through the adjustment of the 3rd half-wave plate 17 and the polarization direction of testing laser device laser, output to the second polarization beam apparatus 16; B (), above-mentioned two light beams incide the second polarization beam apparatus 16 after, the polarized light meeting the second polarization beam apparatus 16 outbound course exports and completes optics coherence tomography; C (), synthesis light incide in reflection grating 14 after the 5th completely reflecting mirror 15 reflects, after reflection grating 14 diffraction also reflection, then be focused into continuous light bands of a spectrum by the second convex lens 13; Continuous light bands of a spectrum, through after optical filter 12, incide the 3rd convex lens 11, and light beam, after the 3rd convex lens 11 focus on, through the 3rd attenuator 10, incides avalanche diode detector 7; D (), avalanche diode detector 7 convert the light signal collected to corresponding electric signal, and inputed to frequency spectrograph 9; The frequency of testing laser can be obtained according to testing laser shown on frequency spectrograph 9 and femtosecond laser coherent signal frequency difference and the frequency values of femtosecond laser that is concerned with testing laser.
2. and 3. 1. and being 4. the coherent signal between femtosecond laser comb in Fig. 3, is the signal of the laser that will measure and femtosecond laser coherent.The frequency of testing laser can be measured according to this.
During concrete enforcement, the laser instrument used is for mixing bait laser instrument FC1500.The first described completely reflecting mirror 20, second completely reflecting mirror 26, the 3rd completely reflecting mirror 1, the 4th completely reflecting mirror 19, the 5th completely reflecting mirror 15 are the completely reflecting mirror of plating high-reflecting film.Described first convex lens 24, second convex lens 13, the 3rd convex lens 11 are the convex lens of plating anti-reflection film.Avalanche diode detector 7 model is APD210.Frequency spectrograph also can connect computing machine, is analyzed gained frequency spectrum by computing machine, and analysis speed is fast, and result is accurate.
Claims (5)
1. accurately measure the device of optical maser wavelength for one kind, it is characterized in that, comprise femtosecond pulse laser (28), be positioned at PPLN crystal (22), photonic crystal fiber (23), the first convex lens (24), the first attenuator (25) and the first half-wave plate (18) on femtosecond pulse laser (28) emitting light path in turn; Also comprise the diaphragm (3) be positioned in turn in testing laser light path, the second attenuator (2), the second half-wave plate (5), the first polarization beam apparatus (6), the 3rd half-wave plate (17) and the second polarization beam apparatus (16); First polarization beam apparatus (6) is also positioned on the emitting light path of the first half-wave plate (18); The position of the first half-wave plate (18) and the first polarization beam apparatus (6) should ensure by the light path of the laser of the first half-wave plate (18) outgoing after the first polarization beam apparatus (6) reflect and be coincided by the light path of laser after the first polarization beam apparatus (6) transmission of the second half-wave plate (5) outgoing; The emitting light path of the second polarization beam apparatus (16) is provided with reflection grating (14), the reflected light path of reflection grating (14) is provided with in turn the second convex lens (13), optical filter (12), the 3rd convex lens (11), the 3rd attenuator (10) and avalanche diode detector (7); The signal output part of avalanche diode detector (7) is connected with frequency spectrograph (9).
2. the device of a kind of accurate measurement optical maser wavelength as claimed in claim 1, is characterized in that, the emitting light path of described femtosecond pulse laser (28) is provided with first completely reflecting mirror (20); Described PPLN crystal (22) is positioned on the reflected light path of the first completely reflecting mirror (20); The beam collimation structure be made up of the second completely reflecting mirror (26), the 3rd completely reflecting mirror (1) and the 4th completely reflecting mirror (19) is also provided with between first attenuator (25) and the first half-wave plate (18); Also comprise the 5th catoptron (15) be positioned on the second polarization beam apparatus (16) emitting light path; Described reflection grating (14) is positioned on the reflected light path of the 5th completely reflecting mirror (15).
3. the device of a kind of accurate measurement optical maser wavelength as claimed in claim 2, is characterized in that, also comprises the cavity (27) shell having the first through hole (21) and the second through hole (4), described 3rd completely reflecting mirror (1), second attenuator (2), diaphragm (3), second half-wave plate (5), first polarization beam apparatus (6), avalanche diode detector (7), frequency spectrograph (9), 3rd attenuator (10), 3rd convex lens (11), optical filter (12), second convex lens (13), grating (14), 5th completely reflecting mirror (15), second polarization beam apparatus (16), 3rd half-wave plate (17), first half-wave plate (18), 4th completely reflecting mirror (19), first completely reflecting mirror (20), PPLN crystal (22), photonic crystal fiber (23), first convex lens (24), first attenuator (25), second completely reflecting mirror (26) is all positioned at cavity (27), the laser of femtosecond pulse laser (28) outgoing is injected by the first through hole (21) and is positioned on first completely reflecting mirror (20) of cavity (27), testing laser is incident on diaphragm (3) through the second through hole (4), avalanche diode detector (7) is connected with frequency spectrograph (9) by BNC line (8).
4. the device of a kind of accurate measurement optical maser wavelength as claimed in claim 2 or claim 3, it is characterized in that, described first completely reflecting mirror (20), the second completely reflecting mirror (26), the 3rd completely reflecting mirror (1), the 4th completely reflecting mirror (19), the 5th completely reflecting mirror (15) are the completely reflecting mirror plating high-reflecting film; Described first convex lens (24), the second convex lens (13), the 3rd convex lens (11) are the convex lens plating anti-reflection film.
5. one kind adopts device as claimed in claim 2 accurately to measure the method for optical maser wavelength, it is characterized in that, comprise the following steps: (a), the laser that femtosecond pulse laser (28) is launched realizes expanding after PPLN crystal (22) and photonic crystal fiber (23), laser after expanding is after the first convex lens (24) focus on, the first half-wave plate (18) is arrived through beam collimation structure through the first attenuator (25), after the first half-wave plate (18) adjustment laser polarization direction, enter the first polarization beam apparatus (6), the 3rd half-wave plate (17) is outputted to again after the first polarization beam apparatus (6) reflection, the laser that testing laser device exports simultaneously passes through diaphragm (3), through the second attenuator (2), after the second half-wave plate (5) adjustment laser polarization direction, enters the first polarization beam apparatus (6), meet the Laser output of the first polarization beam apparatus (6) polarization direction to the 3rd half-wave plate (17), behind the femtosecond pulse laser laser input to which through the adjustment of the 3rd half-wave plate (17) and the polarization direction of testing laser device laser, output to the second polarization beam apparatus (16), b (), above-mentioned two light beams incide the second polarization beam apparatus (16) after, the polarized light meeting the second polarization beam apparatus (16) outbound course exports and completes optics coherence tomography, c (), synthesis light incide in reflection grating (14) after the 5th completely reflecting mirror (15) reflection, after reflection grating (14) diffraction also reflection, then be focused into continuous light bands of a spectrum by the second convex lens (13), continuous light bands of a spectrum, through after optical filter (12), incide the 3rd convex lens (11), and light beam, after the 3rd convex lens (11) focus on, through the 3rd attenuator (10), incides avalanche diode detector (7), d (), avalanche diode detector (7) convert the light signal collected to corresponding electric signal, and inputed to frequency spectrograph (9), the testing laser upper shown according to frequency spectrograph (9) and the frequency difference of femtosecond laser frequency coherent signal and the frequency values of femtosecond laser be concerned with testing laser can obtain the frequency of testing laser.
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| CN111007525B (en) * | 2019-12-24 | 2022-08-30 | 合肥工业大学 | Arbitrary absolute distance measuring device based on single-flying-second optical frequency comb balance cross correlation |
| CN111007525A (en) * | 2019-12-24 | 2020-04-14 | 合肥工业大学 | Arbitrary absolute distance measuring device based on single-flying-second optical frequency comb balance cross correlation |
| CN111289124A (en) * | 2020-03-31 | 2020-06-16 | 北京科益虹源光电技术有限公司 | Laser wavelength measuring device and method |
| CN111289124B (en) * | 2020-03-31 | 2021-03-05 | 北京科益虹源光电技术有限公司 | Laser wavelength measuring device and method |
| US11971307B2 (en) | 2020-03-31 | 2024-04-30 | Beijing RSLaserOpto-Electronics Technology Co. Ltd | Device and method for measuring wavelength for laser device |
| CN111609999B (en) * | 2020-05-12 | 2021-10-22 | 浙江理工大学 | Beat frequency signal detection device and method for wide wavelength range in laser offset frequency locking |
| CN111609999A (en) * | 2020-05-12 | 2020-09-01 | 浙江理工大学 | Beat frequency signal detection device and method for wide wavelength range in laser offset frequency locking |
| CN113686453A (en) * | 2021-09-08 | 2021-11-23 | 中国矿业大学(北京) | Radio wave wavelength measuring device and radio wave wavelength measuring method |
| CN113686453B (en) * | 2021-09-08 | 2022-09-16 | 中国矿业大学(北京) | Radio wave wavelength measuring device and radio wave wavelength measuring method |
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