CN103926215A - Method for quickly detecting asphalt penetration - Google Patents

Abstract

The invention discloses a method for quickly detecting asphalt penetration. The method is based on a near infrared spectral database of asphalt, a near infrared technology is combined with a topology technology, and quick detection of the asphalt penetration is achieved. The method comprises the following steps: firstly, scanning a plurality of asphalt samples by adopting a near infrared spectrometer to obtain near infrared spectrums of asphalt; obtaining sample spectrum data; building a near infrared spectral database of the asphalt; scanning a to-be-tested asphalt sample by adopting the near infrared spectrometer to obtain a spectral vector; calculating the distances between the to-be-tested spectrum and the sample spectrums in the database; looking up the asphalt penetration data of which the spectrum distance to the to-be-tested spectrum is smaller than a threshold in a spectral library; calculating the penetration of the to-be-tested asphalt. The method is used for quickly determining the asphalt penetration on the basis of the near infrared detection technology and the topology modeling technology, meanwhile, the sample points in the spectral library can be increased by processing the existing samples in the asphalt spectral library, and the detection adaptability is improved.

Description

A kind of method for quick of pitch pen.

Technical field

The present invention relates to pitch pen. detection technique, especially the pitch pen. Fast Evaluation of petrochemical industry.

Background technology

In petroleum refining process, the normal operation of reliever is important step, and after lightweight oil is extracted, what under vacuum distillation tower, flow out is straight asphalt or residual oil.In the JTG F40-2004 < < standard specification for construction and acceptance of highway asphalt pavement > > of Ministry of Communications revision using penetration index as a new index, in order to reflect the quality of pitch, so whether pen. analysis accurately can cause direct impact to the classification of pitch.That the detection of pitch pen. generally adopts at present is GB/T4509-2010 < < pitch penetration test method > >, enters the depth representing of pitch sample with standard pin at the sagging direct puncture of certain load, time and temperature conditions.In mensuration process, there is more influence factor in the method, such as standard pin weight, injection time and test operation gimmick etc. all affects greatly the mensuration of pitch pen., in addition, its detection time is longer, is difficult to meet the requirement of in process, pitch pen. being analyzed real-time.In order to address this problem, the present invention proposes a kind of pitch pen. method for quick, adopt near infrared detection technology in conjunction with topology modeling technique, realize the fast detecting of pitch pen..

Summary of the invention

The present invention seeks to for traditional pitch pen. detection method length consuming time, artifical influence factor is more, be difficult to meet Petrochemical Enterprises analyzes the requirement of real-time and accuracy to pitch pen., propose a kind of applicable commercial Application, quick, accurate and eco-friendly pitch pen. method for quick.The method, based on pitch near infrared spectrum and pitch pen. database, adopts topology predicting means, has realized the fast detecting to pitch pen..The method can be measured pitch pen. in 10 minutes, had good real-time and economy.

The method that the present invention proposes comprises the following steps:

A method for quick for pitch pen., the near infrared spectrum data storehouse of the method based on pitch, by by near infrared technology and the combination of topology technology, realizes the fast detecting to pitch pen.;

Method of the present invention comprises the following steps:

(1), adopt near infrared spectrometer to scan to several pitch sample the near infrared spectrum that obtains each pitch, obtaining the spectrum vector that the absorbance of various pitch under different characteristic wave number form is sample spectroscopic data; Set up pitch near infrared spectrum data storehouse, record sample title, sample spectroscopic data and the specimen needle in-degree attribute of aforementioned several pitch;

(2), adopt near infrared spectrometer to scan to pitch sample to be measured the near infrared spectrum that obtains this pitch, obtain the spectrum vector that the absorbance of this pitch under different characteristic wave number forms;

(3), calculate the distance between each sample spectrum in spectrum to be measured and pitch near infrared spectrum data storehouse, search the pitch penetration number certificate that is less than a certain threshold value in pitch Near-infrared spectrum database with the spectrum intervals of this spectrum to be measured, calculate the pen. of pitch to be measured.

Total sample number in pitch near infrared spectrum data of the present invention storehouse should be not less than 150 groups, and the specimen needle in-degree in pitch near infrared spectrum data storehouse adopts traditional evaluation method to obtain.

In step of the present invention (3),

The formula that calculates each sample spectrum spacing in spectrum to be measured and pitch near infrared spectrum data storehouse is as follows:

$d_{\mathrm{ij}}=\sqrt{{(X_i-Y_j)}^T\&CenterDot;S^{-1}\&CenterDot;\left(X_i{-Y}_j\right)}$

$X_i=\left[\begin{array}{c}{x}_{1i}\\ x_{2i}\\ .\\ .\\ .\\ x_{\mathrm{pi}}\end{array}\right]Y_j=\left[\begin{array}{c}{y}_{1j}\\ y_{2k}\\ .\\ .\\ .\\ y_{\mathrm{pj}}\end{array}\right]$

S is X _i ^tand Y _j ^tcovariance matrix, its element s _ijrepresent:

$s_{\mathrm{ij}}=\frac{\underset{k=1}{\overset{p}{\mathrm{\&Sigma;}}}(x_{\mathrm{ki}}-\stackrel{\&OverBar;}{x_i})(y_{\mathrm{kj}}-\stackrel{\&OverBar;}{y_j})}{p-1}$

$\stackrel{\&OverBar;}{x_i}=\frac{1}{p}\underset{a=1}{\overset{p}{\mathrm{\&Sigma;}}}{x}_{\mathrm{ai}},\stackrel{\&OverBar;}{y_j}=\frac{1}{p}\underset{a=1}{\overset{p}{\mathrm{\&Sigma;}}}{y}_{\mathrm{aj}}$

In formula, i represents the numbering of pitch to be measured, and j represents the pitch numbering in pitch near infrared spectrum data storehouse, d _ijspectrum intervals for a certain pitch in pitch to be measured and near infrared spectrum data storehouse; X _iand Y _jbe respectively the spectrum vector that the library of spectra sample that is compared in pitch to be measured and the near infrared spectrum data storehouse absorbance under different characteristic wave number forms; X _i ^tand Y _j ^tbe respectively vector X _iand Y _jtransposition; S is X _i ^tand Y _jcovariance matrix, S is the capable p column matrix of p; P is for participating in the sum of the feature wave number of calculating; A is pitch spectrum sample feature wave number numbering, a=1,2,3 ... p; for spectroscopic data x _1i, x _2i, x _3ix _piaverage; for spectroscopic data y _1j, y _2j, y _3jy _pjaverage; (X _i-Y _j) ^tfor matrix X _i-Y _jtransposed matrix; S ^-1inverse matrix for matrix S.

In step of the present invention (3), when the pitch sample number that is less than a certain threshold value with the spectrum intervals of this spectrum to be measured in pitch Near-infrared spectrum database is greater than the preset ratio of the total sample number of library of spectra, by following formula, calculate pitch pen. to be measured:

$\lg \left({\mathrm{PI}}_i\right)=\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}(\frac{1}{d_{\mathrm{ij}}}\&times;\lg \left({\mathrm{PI}}_j\right)/\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}\frac{1}{d_{\mathrm{ij}}})$

In formula, i represents the numbering of pitch to be measured, and j represents the pitch numbering in pitch near infrared spectrum data storehouse, i, and j gets the integer that is greater than zero; d _ijspectrum intervals for a certain pitch in pitch to be measured and near infrared spectrum data storehouse; PI _ifor pitch pen. to be measured; PI _jbe the pen. of j kind pitch sample; M is less than the pitch total sample number of threshold value with pitch distance to be measured in pitch Near-infrared spectrum database.

In step of the present invention (3), when the pitch sample number that is less than a certain threshold value with the spectrum intervals of this spectrum to be measured in pitch Near-infrared spectrum database is less than the preset ratio of the total sample number of library of spectra, think predict the outcome unreliable, increase sample size in pitch Near-infrared spectrum database, repeating step (3).

In the present invention, threshold value is 5, and preset ratio is 5%.

In increase pitch Near-infrared spectrum database of the present invention, the method for sample size is as follows, adopts linearity to add and calculates the spectroscopic data that newly increases sample, and adopting blending rule to calculate the pen. that newly increases sample, and wherein, pen. mixing rule is as follows:

lg(C _D)＝C _1f×lg(C _1p)+C _2f×lg(C _2p)+…+C _qf×lg(C _qp)

In formula, C _dfor newly increasing mix asphalt specimen needle in-degree, the library of spectra sample number of q for participate in to mix calculating, for being greater than 1 and be less than the integer of total sample number in pitch near infrared spectrum data storehouse, C ₁, C ₂c _qfor participating in mixing the library of spectra sample calculating; C _1p, C _2pc _qpfor participating in mixing the library of spectra sample C calculating ₁, C ₂c _qpen.; C _1f, C _2fc _qffor participating in mixing the library of spectra sample C calculating ₁, C ₂c _qblending ratio.

The invention has the beneficial effects as follows:

The present invention proposes a kind of pitch pen. method for quick, the method is based near infrared detection technology and topology modeling technique, in order to Fast Measurement pitch pen., simultaneously, can increase sample point in library of spectra by available sample in pitch library of spectra being processed process, improve and detect adaptability.

In recent years, near infrared spectrum has been widely used in crude oil and finished product wet goods light-end products property analysis process.Near infrared spectrum mainly reflects the characteristic information of hydric group, in near infrared spectrum region, various hydric groups have certain times spectral band ownership, therefore, the present invention adopts near infrared technology to measure the composition of hydrocarbon compound in pitch and structural information, the advantages such as combination model calculates pitch pen., and it is quick, accurate, reproducible, pollution-free that the method has.

For pitch pen., be difficult to find out a character and spectrogram correlativity is very high and the scope of application is very wide fitting formula.Therefore, the present invention introduces topology modeling, and associated with between topological method research structure and character set up topology model, thereby reached the object of predicting of substance character.In recent years, topological development and to the infiltration of chemical field for the research of Structure-Property Relationship provides strong help.

Accompanying drawing explanation

Fig. 1 is pitch pen. fast detecting process overall procedure block diagram.

Fig. 2 is the pitch spectrogram to be measured of embodiment mono-.

Fig. 3 is the pitch spectrogram to be measured of embodiment bis-.

Specific implementation process

Below in conjunction with accompanying drawing and concrete example, provide detailed computation process and concrete operations flow process, so that the present invention will be further described.Implement the pitch near infrared spectrum data storehouse in example, include 150 groups of different pitches spectroscopic datas.This enforcement example is implemented take technical solution of the present invention under prerequisite, but protection scope of the present invention is not limited to following enforcement example.

Embodiment 1

Specific implementation process is as follows:

1) gather a pitch sample to be measured, through near infrared spectrometer scanning, obtain pitch spectrogram to be measured, as shown in Figure 2.Horizontal ordinate is spectrum wave number, and scope is from 4000cm ^-1to 4800cm ^-1; Ordinate is absorbance.

2) spectroscopic data in above-mentioned pitch near infrared spectrum to be measured and database is compared one by one, the spectrum intervals between calculating between two, spectrum intervals computation process is as follows:

According to the size of feature wave number reflection pitch pen. difference ability, to choose and select the absorbance participation spectrum intervals calculating of feature wave number in 4000～4500 scopes, feature wave number is spaced apart 25, and feature wave number adds up to 21.The library of spectra medium pitch sample spectrum Sphalt_001 of take is example, calculates the spectrum intervals be numbered sample spectrum Sphalt_001 in 1 pitch spectrum Sphalt_dc to be measured and library of spectra.Absorbance under pitch sample to be measured and library of spectra medium pitch sample characteristics wave number is as shown in table 1:

Absorbance under table 1. pitch sample to be measured and library of spectra medium pitch sample (Sphalt_001) feature wave number

SampleID	4000	4025	4050	4075	4100
						Sphalt_dc	0.03268563	0.03802782	0.04971625	0.05482151	0.05214073
Sphalt_001	0.03450295	0.03874355	0.04889621	0.05299251	0.0515429
						SampleID	4125	4150	4175	4200	4225
Sphalt_dc	0.05376484	0.05502375	0.05699742	0.05544399	0.05716617
						Sphalt_001	0.05419647	0.05687382	0.05841867	0.05723312	0.05882526
SampleID	4250	4275	4300	4325	4350
						Sphalt_dc	0.07496396	0.06748891	0.06300468	0.09211791	0.06530404
Sphalt_001	0.07665316	0.06595442	0.06124319	0.09341353	0.06682604
						SampleID	4375	4400	4425	4450	4475
Sphalt_dc	0.05051042	0.04377439	0.01988578	0.00851298	0.00502607
						Sphalt_001	0.04892384	0.03994466	0.01889637	0.00819711	0.00458475
SampleID	4500
						Sphalt_dc	0.00362275
Sphalt_001	0.0031375

The spectrum vector that the absorbance of pitch sample Sphalt_dc to be measured under different characteristic wave number forms adopts X ₁be expressed as:

X ₁＝[0.03268563 0.03802782 0.04971625 0.05482151 0.05214073 0.05376484 0.05502375

0.05699742 0.05544399 0.05716617 0.07496396 0.06748891 0.06300468

0.09211791 0.06530404 0.05051042 0.04377439 0.01988578 0.00851298

0.00502607] ^T

The spectrum vector that the absorbance of library of spectra medium pitch sample spectrum Sphalt_001 under different characteristic wave number forms adopts Y ₁be expressed as:

Y ₁＝[0.03450295 0.03874355 0.04889621 0.05299251 0.0515429 0.05419647 0.05687382

0.05841867 0.05723312 0.05882526 0.07665316 0.06595442 0.06124319

0.09341353 0.06682604 0.04892384 0.03994466 0.01889637 0.00819711

0.00458475] ^T

Therefore, (X ₁-Y ₁) ^t

＝[-0.00181732 -0.00071572 0.00082005 0.00182899 0.00059783 -0.00043163 -0.00185007

-0.00142125 -0.00178912 -0.00165909 -0.00168920 0.00153448 0.00176150 -0.00129562

-0.00152200 0.00158659 0.00382974 0.00098941 0.00031588 0.00044133 0.00048525] adopt MATLAB to calculate X ₁ ^tand Y ₁ ^tcovariance matrix S, method is as follows:

A＝(X _i ^T；Y ₁ ^T)

S＝cov(A)

Calculate S and be the symmetric matrix of 21 row 21 row, as shown in table 2.

Table 2 covariance matrix S

Adopt formula calculate the spectrum intervals of sample spectrum Sphalt_001 in pitch spectrum Sphalt_dc to be measured and library of spectra, adopt MATLAB computing method as follows:

$d_{11}^2={(X_1-Y_1)}^{\&prime;\&CenterDot;}\mathrm{inv}\left(S\right)\&CenterDot;(X_1-Y_1)$

Calculate: d ₁₁=3.6616

With reference to above-mentioned computation process, calculate one by one the spectrum intervals of library of spectra medium pitch near infrared spectrum and pitch spectrum to be measured, and interpretation is less than the sample point quantity of effective spectrum intervals.By above formula, calculate, can in library of spectra, find 10 (are greater than the total sample number of library of spectra 5%) and pitch sample spectrum intervals to be measured to be less than the sample point of threshold value 5.As shown in table 3:

Table 3 and pitch sample spectrum intervals to be measured are less than the library of spectra sample point of threshold value

Pitch sample number	Spectrum intervals	Pitch sample number	Spectrum intervals
				Sphalt_001	3.6616	Sphalt_145	0.7240
Sphalt_010	2.2166	Sphalt_121	1.1162
				Sphalt_012	1.2721	Sphalt_105	2.7909
Sphalt_025	1.3287	Sphalt_029	1.6706
				Sphalt_038	1.6567	Sphalt_069	2.0568

Therefore, do not need to increase sample, can directly pass through above-mentioned pitch sample, calculate pitch pen. numerical value to be measured.

3) be calculated as follows pitch pen. to be measured:

$\lg \left({\mathrm{PI}}_i\right)=\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}(\frac{1}{d_{\mathrm{ij}}}\&times;\lg \left({\mathrm{PI}}_j\right)/\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}\frac{1}{d_{\mathrm{ij}}})$

Computation process is as follows:

The pen. of above-mentioned 10 kinds of pitches is as shown in table 4:

Table 4 and pitch sample spectrum intervals to be measured are less than the library of spectra sample point pen. of threshold value

Pitch sample number	Pen.	Pitch sample number	Pen.
				Sphalt_001	95	Sphalt_145	87
Sphalt_010	99	Sphalt_121	88
				Sphalt_012	96	Sphalt_105	91
Sphalt_025	90	Sphalt_029	85
				Sphalt_038	98	Sphalt_069	87

Therefore, the pen. of pitch to be measured is:

${\mathrm{PI}}_1={10}^{\underset{j=1}{\overset{10}{\mathrm{\&Sigma;}}}(\frac{1}{d_{1j}}\&times;\lg \left({\mathrm{PI}}_j\right)/\underset{j=1}{\overset{10}{\mathrm{\&Sigma;}}}\frac{1}{d_{1j}})}=90.634$

Embodiment 2:

1) gather a pitch sample to be measured and be numbered 2.Through near infrared spectrometer scanning, obtain pitch spectrogram to be measured, as shown in Figure 3.Horizontal ordinate is spectrum wave number, and scope is from 4000cm ^-1to 4800cm ^-1; Ordinate is absorbance.

2) spectroscopic data in pitch spectrum to be measured and near infrared spectrum data storehouse is compared one by one to the spectrum intervals (computation process is identical with the step 2 in embodiment 1) between calculating between two.By calculating, the sample point that can only find 5 (are less than the total sample number of library of spectra 5%) and pitch sample spectrum threshold to be measured to be less than 5 in library of spectra.As shown in table 5:

Table 5 and pitch sample spectrum intervals to be measured are less than the library of spectra sample point of threshold value

Pitch sample number	Spectrum intervals	Pitch sample number	Spectrum intervals
				Sphalt_015	1.6848	Sphalt_009	0.9641
Sphalt_103	3.6471	Sphalt_075	2.3156
				Sphalt_066	3.0245

Therefore, predict the outcome unreliable, need to increase sample size in library of spectra;

3) increase existing pitch spectrum samples in library of spectra, adopt linearity add and calculate the spectroscopic data that newly increases sample, and adopt following blending rule to calculate the pen. that newly increases sample.

lg(C _D)＝C _1f×lg(C _1p)+C _2f×lg(C _2p)+…+C _qf×lg(C _qp)

With Sphalt_008, Sphalt_015, tri-pitch samples of Sphalt_20 in library of spectra, by 0.2,0.6,0.2 blending ratio, be mixed into example, list calculating detailed process, as follows:

The spectrum vector that the absorbance of library of spectra medium pitch sample Sphalt_008 under different characteristic wave number forms adopts Y ₈be expressed as:

Y ₈＝[0.03454343 0.03876472 0.04891891 0.05301028 0.05154569 0.05419553

0.05688159 0.0584288 0.05724228 0.05881272 0.07665679 0.06594097

0.0612307 0.09339508 0.06681824 0.04888785 0.03992409 0.01888973

0.00819002 0.00458349 0.00313908] ^T

The spectrum vector that the absorbance of library of spectra medium pitch sample Sphalt_015 under different characteristic wave number forms adopts Y ₁₅be expressed as:

Y ₁₅＝[0.03310126 0.03769716 0.04845486 0.05510251 0.05115978 0.05264836 0.05442039

0.05720746 0.05579442 0.05723187 0.07437372 0.06706857 0.06288219

0.09373545 0.06700707 0.0504078 0.04385249 0.02015411 0.00870699

0.00522539 0.00376815] ^T

The spectrum vector that the absorbance of library of spectra medium pitch sample Sphalt_20 under different characteristic wave number forms is used

Y ₂₀be expressed as:

Y ₂₀＝[0.03309589 0.03764875 0.04838402 0.05504122 0.05117614 0.05267337 0.05446153

0.05724254 0.05582455 0.05725101 0.07439601 0.06708532 0.06288583

0.09377839 0.06701277 0.05039995 0.043845 0.02013723 0.00869096 0.00521371

0.0037558] ^T

After library of spectra medium pitch sample Sphalt_008, Sphalt_015, Sphalt_020 mix by 0.2,0.6,0.2 blending ratio respectively, the spectrum vector Y that the absorbance of the mixing sample Sphalt_d01 obtaining under different characteristic wave number forms _d01adopt following formula to calculate:

Y _d01＝0.2·Y ₈+0.6·Y ₁₅+0.2·Y ₂₀

＝[0.03338862 0.037900993 0.048533504 0.054671805 0.051240234 0.052962796

0.054920859 0.057458744 0.056090019 0.057551865 0.074834793 0.066846401

0.062552622 0.093675964 0.066970443 0.050102241 0.043065312 0.019897856

0.008600392 0.005094674 0.003639863] ^T

The pen. of library of spectra pitch sample Sphalt_008, Sphalt_015, Sphalt_020 is respectively 87,89,91, sample Sphalt_008, Sphalt_015, Sphalt_020 are undertaken after proportioning by 0.2,0.6,0.2 blending ratio respectively, and it is as follows that the pen. of newly-increased sample Sphalt_d01 is calculated process:

lg(C _D)＝C _1f×lg(C _1p)+C _2f×lg(C _2p)+…+C _qf×lg(C _qp)

lg(PI _d01)＝0.2×lg87+0.6×lg89+0.2×lg91＝1.9493

Calculate: PI _d01=88.9910

Equally, in this way the sample in library of spectra is calculated with different proportionings, increase library of spectra medium pitch number of samples and be increased to 200 groups.

4) pitch spectrum to be measured and the spectroscopic data in the near infrared spectrum data storehouse increasing after sample point are compared one by one to the spectrum intervals between calculating between two.By calculating, the sample point that can find 12 (are greater than the total sample number of library of spectra 5%) and pitch sample spectrum threshold to be measured to be less than 5 in library of spectra.As shown in table 6:

Therefore, sample size increases, and predicts the outcome reliable, can pass through above-mentioned pitch sample, calculates pitch pen. numerical value to be measured.

5) be calculated as follows pitch pen. to be measured:

$\lg \left({\mathrm{PI}}_i\right)=\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}(\frac{1}{d_{\mathrm{ij}}}\&times;\lg \left({\mathrm{PI}}_j\right)/\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}\frac{1}{d_{\mathrm{ij}}})$

Computation process is as follows:

The pen. of above-mentioned 12 kinds of pitches is as shown in table 7:

Table 7 and pitch sample spectrum intervals to be measured are less than the library of spectra sample point pen. of threshold value

Pitch sample number	Pen.	Pitch sample number	Pen.
				Sphalt_015	89	Sphalt_009	95
Sphalt_103	90	Sphalt_075	93
				Sphalt_066	88	Sphalt_d07	87
Sphalt_d28	90	Sphalt_d176	91
				Sphalt_d141	92	Sphalt_d322	90
Sphalt_d264	87	Sphalt_d227	86

Therefore, the pen. of pitch to be measured is:

${\mathrm{PI}}_2={10}^{\underset{j=1}{\overset{12}{\mathrm{\&Sigma;}}}(\frac{1}{d_{2j}}\&times;\lg \left({\mathrm{PI}}_j\right)/\underset{j=1}{\overset{12}{\mathrm{\&Sigma;}}}\frac{1}{d_{2j}})}=90.22093$

Claims (8)

1. a method for quick for pitch pen., is characterized in that the near infrared spectrum data storehouse of the method based on pitch, by by near infrared technology and the combination of topology technology, realizes the fast detecting to pitch pen.;

2. the method for quick of a kind of pitch pen. according to claim 1, is characterized in that the method comprises the following steps:

(1), adopt near infrared spectrometer to scan to several pitch sample the near infrared spectrum that obtains each pitch, obtaining the spectrum vector that the absorbance of various pitch under different characteristic wave number form is sample spectroscopic data; Set up pitch near infrared spectrum data storehouse, record sample title, sample spectroscopic data and the specimen needle in-degree attribute of aforementioned several pitch;

(2), adopt near infrared spectrometer to scan to pitch sample to be measured the near infrared spectrum that obtains this pitch, obtain the spectrum vector that the absorbance of this pitch under different characteristic wave number forms;

(3), calculate the distance between each sample spectrum in spectrum to be measured and pitch near infrared spectrum data storehouse, search the pitch penetration number certificate that is less than a certain threshold value in pitch Near-infrared spectrum database with the spectrum intervals of this spectrum to be measured, calculate the pen. of pitch to be measured.

3. the method for quick of a kind of pitch pen. according to claim 2, it is characterized in that the total sample number in pitch near infrared spectrum data storehouse should be not less than 150 groups, the specimen needle in-degree in pitch near infrared spectrum data storehouse adopts traditional evaluation method to obtain.

4. the method for quick of a kind of pitch pen. according to claim 2, is characterized in that in step (3), and the formula that calculates each sample spectrum spacing in spectrum to be measured and pitch near infrared spectrum data storehouse is as follows:

$d_{\mathrm{ij}}=\sqrt{{(X_i-Y_j)}^T\&CenterDot;S^{-1}\&CenterDot;\left(X_i{-Y}_j\right)}$

$X_i=\left[\begin{array}{c}{x}_{1i}\\ x_{2i}\\ .\\ .\\ .\\ x_{\mathrm{pi}}\end{array}\right]Y_j=\left[\begin{array}{c}{y}_{1j}\\ y_{2k}\\ .\\ .\\ .\\ y_{\mathrm{pj}}\end{array}\right]$

S is X _i ^tand Y _j ^tcovariance matrix, its element s _ijrepresent:

$s_{\mathrm{ij}}=\frac{\underset{k=1}{\overset{p}{\mathrm{\&Sigma;}}}(x_{\mathrm{ki}}-\stackrel{\&OverBar;}{x_i})(y_{\mathrm{kj}}-\stackrel{\&OverBar;}{y_j})}{p-1}$

$\stackrel{\&OverBar;}{x_i}=\frac{1}{p}\underset{a=1}{\overset{p}{\mathrm{\&Sigma;}}}{x}_{\mathrm{ai}},\stackrel{\&OverBar;}{y_j}=\frac{1}{p}\underset{a=1}{\overset{p}{\mathrm{\&Sigma;}}}{y}_{\mathrm{aj}}$

In formula, i represents the numbering of pitch to be measured, and j represents the pitch numbering in pitch near infrared spectrum data storehouse, d _ijspectrum intervals for a certain pitch in pitch to be measured and near infrared spectrum data storehouse; X _iand Y _jbe respectively the spectrum vector that the library of spectra sample that is compared in pitch to be measured and the near infrared spectrum data storehouse absorbance under different characteristic wave number forms; X _i ^tand Y _j ^tbe respectively vector X _iand Y _jtransposition; S is X _i ^tand Y _jcovariance matrix, S is the capable p column matrix of p; P is for participating in the sum of the feature wave number of calculating; A is pitch spectrum sample feature wave number numbering, a=1,2,3 ... p; for spectroscopic data x _1i, x _2i, x _3ix _piaverage; for spectroscopic data y _1j, y _2j, y _3jy _pjaverage; (X _i-Y _j) ^tfor matrix X _i-Y _jtransposed matrix; S ^-1inverse matrix for matrix S.

5. the method for quick of a kind of pitch pen. according to claim 2, it is characterized in that in step (3), when the pitch sample number that is less than a certain threshold value with the spectrum intervals of this spectrum to be measured in pitch Near-infrared spectrum database is greater than the preset ratio of the total sample number of library of spectra, by following formula, calculate pitch pen. to be measured:

$\lg \left({\mathrm{PI}}_i\right)=\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}(\frac{1}{d_{\mathrm{ij}}}\&times;\lg \left({\mathrm{PI}}_j\right)/\underset{j=1}{\overset{m}{\mathrm{\&Sigma;}}}\frac{1}{d_{\mathrm{ij}}})$

In formula, i represents the numbering of pitch to be measured, and j represents the pitch numbering in pitch near infrared spectrum data storehouse, i, and j gets the integer that is greater than zero; d _ijspectrum intervals for a certain pitch in pitch to be measured and near infrared spectrum data storehouse; PI _ifor pitch pen. to be measured; PI _jbe the pen. of j kind pitch sample; M is less than the pitch total sample number of threshold value with pitch distance to be measured in pitch Near-infrared spectrum database.

6. the method for quick of a kind of pitch pen. according to claim 5, it is characterized in that in step (3), when the pitch sample number that is less than a certain threshold value with the spectrum intervals of this spectrum to be measured in pitch Near-infrared spectrum database is less than the preset ratio of the total sample number of library of spectra, think predict the outcome unreliable, increase sample size in pitch Near-infrared spectrum database, repeating step (3).

7. according to the method for quick of a kind of pitch pen. described in claim 5 or 6, it is characterized in that threshold value is 5, preset ratio is 5%.

8. the method for quick of a kind of pitch pen. according to claim 6, the method that it is characterized in that increasing sample size in pitch Near-infrared spectrum database is as follows, adopt linearity to add and calculate the spectroscopic data that newly increases sample, and adopt blending rule to calculate the pen. that newly increases sample, wherein, pen. mixing rule is as follows:

lg(C _D)＝C _1f×lg(C _1p)+C _2f×lg(C _2p)+…+C _qf×lg(C _qp)

In formula, C _dfor newly increasing the pen. of mix asphalt sample, the library of spectra sample number of q for participate in to mix calculating, for being greater than 1 and be less than the integer of total sample number in pitch near infrared spectrum data storehouse, C ₁, C ₂c _qfor participating in mixing the library of spectra sample calculating; C _1p, C _2pc _qpfor participating in mixing the library of spectra sample C calculating ₁, C ₂c _qpen.; C _1f, C _2fc _qffor participating in mixing the library of spectra sample C calculating ₁, C ₂c _qblending ratio.