CN103902421A - Basic performance test method for EDA (electronic design automation) design platform of enterprise - Google Patents

Basic performance test method for EDA (electronic design automation) design platform of enterprise Download PDF

Info

Publication number
CN103902421A
CN103902421A CN201410124575.4A CN201410124575A CN103902421A CN 103902421 A CN103902421 A CN 103902421A CN 201410124575 A CN201410124575 A CN 201410124575A CN 103902421 A CN103902421 A CN 103902421A
Authority
CN
China
Prior art keywords
test
file
design
testing
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201410124575.4A
Other languages
Chinese (zh)
Other versions
CN103902421B (en
Inventor
徐君怡
江石根
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU HUAXIN MICROELECTRONICS CO Ltd
Original Assignee
SUZHOU HUAXIN MICROELECTRONICS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU HUAXIN MICROELECTRONICS CO Ltd filed Critical SUZHOU HUAXIN MICROELECTRONICS CO Ltd
Priority to CN201410124575.4A priority Critical patent/CN103902421B/en
Publication of CN103902421A publication Critical patent/CN103902421A/en
Application granted granted Critical
Publication of CN103902421B publication Critical patent/CN103902421B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The invention discloses a basic performance test method for an EDA (electronic design automation) design platform of an enterprise. The method includes the steps: 1) two-directional bandwidth testing of basic read operation and write operation of an operating environment of the platform; 2) testing of designed operation throughput; 3) simulated testing of typical applications of integrated circuit design. The basic performance test method is used for assisting users in microscopically analyzing and understanding performances on certain characteristic aspect of file systems, and testing results are concise.

Description

A kind of EDA of enterprise design platform running environment basic property method of testing
Technical field
The present invention relates to a kind of EDA of enterprise design platform running environment basic property method of testing.
Background technology
At present, do not have separately the method for a standard for the performance test methods of EDA design platform system, the general similar method of testing for system applies platform property also mainly concentrates on reference test method, take to formulate and meet method, instrument and the system of certain theoretical validation rule, thereby the correlated performance index of a certain class testing object is carried out to quantitative test and can contrast test.Wherein, benchmark test can be divided into three kinds: microcosmic test, macro-test and tracking reappear method.
Microcosmic test is mainly for treating that the some or multiple concrete operating performance of examining system test, and its test load is made up of dissimilar operation conventionally, and carrys out authenticating documents system in a certain respect or the feature of some aspect with this.Its advantage is the performance that can help from the angle of microcosmic customer analysis and understanding some feature aspect of file system, and test result is short and sweet; But weak point is: easily cause test coverage low, and separately the microcosmic test on hardware reflect that performance is difficult to weigh the real work performance of total system comprehensively.
Macro-test is to treat that by simulation the real work load of examining system treats the combination property of examining system and assess.It adopts closing to reality load request as far as possible to carry out the Behavior modeling of system applies to be measured.Its advantage is the current demand that can simulate from the angle of similar actual loading typicalness; But the same existence of this method is single such as type, load departs from, configure the problems such as dumb.
Following the tracks of reproduction rule is by gathering the System Operation Log record to be measured under actual loading, and according to set format record in trace file, then when test according to the track record in collected trace file again to treating that examining system proposes read-write requests, treats thus the true application behavior of examining system and carries out Performance Evaluation.
Summary of the invention
The object of the present invention is to provide a kind of EDA of enterprise design platform running environment basic property method of testing, help the performance of customer analysis and understanding some feature aspect of file system for the angle from microcosmic, and test result is short and sweet.
For achieving the above object, the present invention has adopted following technical scheme:
A kind of EDA of enterprise design platform running environment basic property method of testing, it comprises the steps:
1) the basic read operation of platform running environment and write operation two are to bandwidth test, and the virtual scene operating by multiple data-interfaces that may occur in board design process is tested;
2) design operation testing throughput, tests the data file operation handling capacity of EDA design platform running environment by cross-circulation mode of operation;
3) integrated circuit (IC) design typical case application simulation test, tests effective application performance of this platform running environment under enterprise practical integrated circuit (IC) design working condition by building the extendible load module of multithreading.
Step 1) in read operation and write operation type be divided into:
Read operation: sequentially, at random, inverted order, jump, memory-mapped;
Write operation: sequentially, at random, covering, memory-mapped;
Read-write married operation;
Described order read operation is divided into: read, read again, " reading " is to carry out test performance by order read data file, and " reading again " is to carry out test performance by data in secondary file reading;
Described random read operation is to carry out test performance by random read data files somewhere reference point;
Described inverted order read operation is to carry out test performance by inverted order read data file;
Described jump read operation is to carry out test performance by each reference point of fixed intervals jump read data file;
Described memory-mapped read operation is to carry out test performance by memory-mapped mechanism read data files;
Described sequential write operation is divided into: write, rewrite, " writing " is to carry out test performance by sequential write data file, and " rewriting " is to write data in same file by secondary to carry out test performance;
Described random write operation is to carry out test performance by random writing data with existing file somewhere reference point data;
Described covering write operation is to carry out test performance by writing same position data in same file;
Described memory-mapped write operation is to carry out test performance by memory-mapped mechanism data writing file;
Described read-write married operation is by data file being read and write random mixed size (F n) equal the minimal value (F of file size size min), stopping testing samsara, test data file clears all.
Preferably, described step 2) in comprise successively:
(f) configuration testing parameter;
(g) service data files in batch generating run, starts test, record test start time (T start), and according to concurrent quantity of documents and the file mean size parameter of configuration, order creates file in batches, records random cross-circulation test operation start time (t start);
(h) move random cross-circulation test operation, taking all types of design operation proportions that configure as foundation, the random different design operation of crossing operation; Its concrete operation step comprises:
1. judge whether to need operation to read/add operation, if without operation, turn to step 2., if need operation, generate certain random value according to read/write operation ratio, then judge with this random value this time whether circulation needs to move read operation, if, carry out a read operation, otherwise, carry out and once add operation;
2. judge whether to move generation/clear operation, if without operation, turn to step 3., if need operation, generate certain random value according to generation/clear operation ratio, then judge with this random value this time whether circulation needs to move generating run, if, carry out generating run one time, otherwise, a clear operation carried out;
3. the number of run of design operation is accumulated once, judge whether design operation number of run reaches initial set value, if so, the random cross-circulation operational phase of design finishes, and starts the batch delete step of test data file; Otherwise turn to step 1..
(i) clear operation of operation batch documents, records random cross-circulation test operation end time (t end), then remove in batches all residue test data files record test end time (T end);
(j) add up every testing throughput index.
Particularly preferred, described handling capacity comprises the total amount of handling up, in batches handling capacity and the handling capacity of intersecting; Wherein, the total amount of handling up comprises design total amount and the Generating Data File/removing total amount of handling up of handling up, design the design operation number of times that the total amount of handling up refers to operation in the unit interval, design operation number of run (DAS) and design operation elapsed time (t that user carries out expend) ratio, and design operation elapsed time (t expend) be random cross-circulation test operation end time (t end) and random cross-circulation test operation start time (t start) poor, file generated/removing total amount of handling up refers in the unit interval total number of files amount that generates/remove, the i.e. total quantity (F of institute's generated data file in test process build) and test cumulative time (T expend) ratio, and test cumulative time (T expend) be test end time (T end) and test start time (T start) poor.
Handling capacity is removed handling capacity and is formed by data file Mass production handling capacity, data file batch in batches, and wherein Mass production handling capacity refers to the data file quantity of Mass production in the unit interval, i.e. the concurrent quantity of documents (f of configuration batch-build) and Mass production process cumulative time (t alter1) ratio, and Mass production process cumulative time (t alter1) be random cross-circulation test operation start time (t start) and test start time (T start) poor; Remove in batches handling capacity and refer to the data file quantity of removing in batches in the unit interval, be i.e. the data file quantity (f that removes of the files in batch stage of removing batch-del) and batch reset procedure cumulative time (t alter2) ratio, and reset procedure cumulative time (t in batches alter2) be test end time (T end) and random cross-circulation test operation end time (t end) poor.
Intersect the read operation handling capacity of handling capacity while comprising design operation crossing operation, test performance while adding file operation.
Preferably, described step 1) in comprise successively:
(a) choose test reference point, the generation rule that the real-time data-interface of statistical basis environment operates, the IO operation model of structure test reference point;
(b) configuration testing data file, with file size size (F n), data block size (B n) be foundation, apportion Various types of data file, and make the maximum value (B of data block size max) be less than or equal to the minimal value (F of file size size min);
(c) initialization data, differentiation and the generation of the generation of test file content, the selection of reference mode and generation and data to be written;
(d) move and add up one and take turns testing process, start/stop test monitoring, file size and the data block size of taking turns test according to each are carried out corresponding test operation, the then amount of reading and writing data, corresponding document size and the data block size in record statistical unit time;
(e) the autonomous flow process of going forward one by one that doubles, differentiation and the generation of the generation of test file content, the selection of reference mode and generation and data to be written, wherein:
If data block size (B n) be less than the maximum value (B of data block size max), keep test data file capacity constant, and data block size (B n) double, rebound step (d) starts next round test;
If data block size (B n) be less than the maximum value (B of data block size max), file size size (F n) be less than the minimal value (F of file size size min), file size size (F n) double, data block size (B n) reset to the minimal value (B of data block size min), rebound step (d) starts next round test;
If data block size (B n) equal the maximum value (B of data block size max), file size handling capacity, spanned file handling capacity and remove file handling capacity, file reading times when wherein read operation handling capacity refers to design operation crossing operation in the unit interval, reads the number of times (f of file in test process read) and design operation elapsed time (t expend) ratio; Add file handling capacity and refer to that in the unit interval, file adds number of times, the i.e. number of times (f of written document in test process append) and design operation elapsed time (t expend) ratio; Spanned file handling capacity refers to file generated number, i.e. Generating Data File sum (F in test operating procedure in the unit interval build) with configuration concurrent quantity of documents (f batch-build) difference and design operation elapsed time (t expend) ratio; Remove file handling capacity and refer to that in the unit interval, file is removed number, the file in test operating procedure is removed sum (f rid) remove the data file quantity (f that removes of stage with files in batch batch-del) difference and design operation elapsed time (t expend) ratio.
Preferably, described step 3) in comprise successively:
(k) the load properties analysis of integrated circuit (IC) design typical case application;
(I) initial simulation flow figure formulates;
(m) initial testing parameter is selected;
(n) initial testing load is selected;
(o) operation testing process, monitoring real-time testing process, multithreading synchro control also records the information of test operation.
Preferably, in step (o), operation testing process comprises:
(I) operation main thread test, and according to the averaging circuit quantity under initial circuit map file quantity, the single project folder of specifying and averaging circuit size allocation for test original document collection;
(II) operation test monitoring, opens multiple test emulation threads according to initial concurrent number of threads of specifying, and imitates multiple terminals EDA design platform server is carried out to the situation of Concurrency Access and circuit simulation simultaneously;
(III) operation of setting in the concurrent execution simulation flow of multiple circuit simulation threads figure, is respectively and removes historical simulation waveform file, operation post-simulation process, generates simulation waveform file, reads post-simulation wave file, adds later stage emulation content, carries out continuously the post-simulation operation of set point number to simulation document;
(IV) when (III) step is carried out, main thread is monitored all circuit simulation threads, until all emulation thread end of runs.
Compared with prior art, beneficial effect of the present invention is:
1. for microcosmic test, expand the acquisition range of conventional readwrite tests reference point, greatly promoted the Efficient Coverage Rate of test.
2. operate the test of handling capacity for simulation system to be measured, formulate multi-level load configuration parameter, and take recycling cross mode of operation to carry out the operation behavior in simulating reality application, greatly promote referential and the authenticity of test load and test result.
3. for the simulation test of typical case's application, taked to simulate based on the extensible load module building mode of multithreading the daily real work load for the treatment of examining system, guaranteed comparability and extensibility that in test process, load is selected.
Brief description of the drawings
Fig. 1 is the process flow diagram of design operation testing throughput in the EDA of enterprise design platform running environment basic property method of testing in the embodiment of the present invention;
Fig. 2 is the process flow diagram of integrated circuit (IC) design typical case application simulation test in Fig. 1 embodiment;
Fig. 3 is the process flow diagram of multiple test post-simulation threads in Fig. 1 embodiment.
Embodiment
Below in conjunction with a preferred embodiment, technical scheme of the present invention is further described.
A kind of EDA of enterprise design platform running environment basic property method of testing that the preferred embodiment is related, it comprises the steps:
1) the basic read operation of platform running environment and write operation two are to bandwidth test, and the virtual scene operating by multiple data-interfaces that may occur in board design process is tested;
2) design operation testing throughput, tests the data file operation handling capacity of EDA design platform running environment by cross-circulation mode of operation;
3) integrated circuit (IC) design typical case application simulation test, tests effective application performance of this platform running environment under enterprise practical integrated circuit (IC) design working condition by building the extendible load module of multithreading.
Described step 1) in comprise successively:
(a) choose test reference point, need the generation rule of the real-time data-interface running of statistical basis environment, contain read operation and write operation position and select, whether the existence of service data, and build thus the IO operation model of test reference point; The present invention chooses read operation (inverted order, jump, memory-mapped sequentially, at random), write operation (covering sequentially, at random,, memory-mapped) and read-write married operation three class Access Models and treats the read-write operation performance of examining system and test; And design thus 12 test reference points and from different angles, the readwrite performance of EDA design platform running environment has been tested; As shown in table 1:
Figure BSA0000102491330000101
Table 1
As shown in table 1, read operation and write operation type are divided into:
Read operation: sequentially, at random, inverted order, jump, memory-mapped;
Write operation: sequentially, at random, covering, memory-mapped;
Read-write married operation;
Order read operation is divided into: read, read again, " reading " is to carry out test performance by order read data file, and " reading again " is to carry out test performance by data in secondary file reading; Random read operation is to carry out test performance by random read data files somewhere reference point; Inverted order read operation is to carry out test performance by inverted order read data file; Jump read operation is to carry out test performance by each reference point of fixed intervals jump read data file; Memory-mapped read operation is to carry out test performance by memory-mapped mechanism read data files;
Sequential write operation is divided into: write, rewrite, " writing " is to carry out test performance by sequential write data file, and " rewriting " is to write data in same file by secondary to carry out test performance; Random write operation is to carry out test performance by random writing data with existing file somewhere reference point data; Covering write operation is to carry out test performance by writing same position data in same file; Memory-mapped write operation is to carry out test performance by memory-mapped mechanism data writing file; Read-write married operation is test performance when data file being read and write random married operation.
(b) configuration testing data file, before test run, needs nominative testing data file amount of capacity F nbound and data block size B nbound, the wherein maximum value B of data block size maxbe less than or equal to the minimal value F of file size size min; The process of test is carried out the autonomous multiplication test of going forward one by one according to the bound of set file size and data block size, in order to the file size of reflection variation and data block size for the impact of readwrite performance;
(c) initialization data, completes data initialization according to the test file size of epicycle test, generates test file (comprising generation, the selection of reference mode and differentiation and the generation of generation and data to be written of test file content);
(d) move and add up one and take turns testing process, comprise start/stop test monitoring, file size and the data block size of taking turns test according to each are carried out corresponding test operation, the then amount of reading and writing data, corresponding document size and the data block size in record statistical unit time;
(e) the autonomous flow process of going forward one by one that doubles, differentiation and the generation of the generation of test file content, the selection of reference mode and generation and data to be written, wherein:
If data block size B nbe less than the maximum value B of data block size max, keep test data file capacity constant, and data block size B ndouble, rebound step (d) starts next round test;
If data block size B nbe less than the maximum value B of data block size max, file size size F nbe less than the minimal value F of file size size min, file size size F ndouble, data block size B nreset to the minimal value B of data block size min, rebound step (d) starts next round test;
If data block size B nequal the maximum value B of data block size max, file size size F nequal the minimal value F of file size size min, stopping testing samsara, test data file clears all.
Described step 2) in comprise successively:
(f) configuration testing parameter, as table 2;
Configuration parameter title Concise and to the point description
F max,F min The maximum value of file size size and minimal value
F a The number of test data file set
D a Sub-directory number
B nr The data block size of read operation
B nw The data block size of write operation
Read/add Read/add the blending ratio of operation
Generate/remove The blending ratio of generation/clear operation
D r Design operation number of times
Table 2
(g) service data files in batch generating run, starts test, record test start time T start, and according to concurrent quantity of documents and the file mean size parameter of configuration, order creates file in batches, records random cross-circulation test operation start time t start;
(h) move random cross-circulation test operation, this stage is taking all types of design operation proportions of configuration as foundation, the random different design operation of crossing operation; In the circulation of single design operation, as shown in Figure 1, concrete steps comprise;
1. judge whether to need operation to read/add operation, if without operation, turn to step 2., if need operation, generate certain random value according to read/write operation ratio, then judge with this random value this time whether circulation needs to move read operation, if, carry out a read operation, otherwise, carry out and once add operation;
2. judge whether to move generation/clear operation, if without operation, turn to step 3., if need operation, generate certain random value according to generation/clear operation ratio, then judge with this random value this time whether circulation needs to move generating run, if, carry out generating run one time, otherwise, a clear operation carried out;
3. the number of run of design operation is accumulated once, judge whether design operation number of run reaches initial set value, if so, the random cross-circulation operational phase of design finishes, and starts the batch delete step of test data file; Otherwise turn to step 1..
(i) clear operation of operation batch documents, records random cross-circulation test operation end time (t end), then remove in batches all residue test data files record test end time (T end);
(j) add up every testing throughput index, the control point of test process is divided into four: test start time T start, test end time T end, random cross-circulation test operation start time t start, random cross-circulation test operation end time t end;
In test process, also need real time record and upgrade quantity, the data file of the quantity of generated data file, the file that clears data reading times, data file write indegree etc., then after test finishes, complete the inductive statistics of test index according to above-mentioned data; The test index of design operation testing throughput is as shown in table 3:
Figure BSA0000102491330000141
File reading times when design operation crossing operation in the unit interval, reads the number of times f of file in test process readwith design operation elapsed time t expendratio; Add file handling capacity and refer to that in the unit interval, file adds number of times, i.e. the number of times f of written document in test process appendwith design operation elapsed time t expendratio; Spanned file handling capacity refers to file generated number in the unit interval, i.e. the sum of Generating Data File in test operating procedure F buildconcurrent quantity of documents f with configuration batch-builddifference and design operation elapsed time t expendratio; Remove file handling capacity and refer to that in the unit interval, file is removed number, the file in test operating procedure is removed total f ridremove the data file quantity f that removes of stage with files in batch batch-deldifference and design operation elapsed time t expendratio.
Described step 3) in comprise successively:
(k) the load properties analysis of integrated circuit (IC) design typical case application;
In integrated circuit (IC) design, circuit diagram spectre post-simulation is very common a kind of system applies, Main Function be for the circuit diagram of user design carry out in function and performance on analog simulation, make deviser can by computer virtualized mode realize for the checking of existing product circuit design achievement and with the comparison of design object in early stage; Circuit diagram spectre post-simulation has following features conventionally: simulation process is long, simulation process generated data amount is large, processor occupancy is high;
(I) initial simulation flow figure formulates;
Comprise emulation thread type, emulation thread ratio and the performed action type of different emulation threads formulated in simulation test scene; According to spectre post-simulation load properties, formulate a kind of post-simulation thread type, simulate the daily real running environment of EDA design platform by the spectre post-simulation thread of multiple terminal concurrences;
Figure BSA0000102491330000161
Table 3
The total amount of handling up comprises design total amount and Generating Data File/removings total amount of handling up of handling up, and the design total amount of handling up refers to the design operation number of times of operation in the unit interval, i.e. design operation number of run DAS and the design operation elapsed time t of user's execution expendratio, and design operation elapsed time t expendfor random cross-circulation test operation end time t endwith random cross-circulation test operation start time t startpoor, file generated/removing total amount of handling up refers in the unit interval total number of files amount that generates/remove, i.e. the total quantity F of institute's generated data file in test process buildwith test cumulative time T expendratio, and test cumulative time T expendfor test end time T endwith test start time T startpoor.
Handling capacity is removed handling capacity and is formed by data file Mass production handling capacity, data file batch in batches, and wherein Mass production handling capacity refers to the data file quantity of Mass production in the unit interval, i.e. the concurrent quantity of documents f of configuration batch-buildwith Mass production process cumulative time t alter1ratio, and Mass production process cumulative time t alter1for random cross-circulation test operation start time t startwith test start time T startpoor; Remove in batches handling capacity and refer to the data file quantity of removing in batches in the unit interval, be i.e. the data file quantity f that removes of the files in batch stage of removing batch-delwith batch reset procedure cumulative time t alter2ratio, and reset procedure cumulative time t in batches alter2for test end time T endwith random cross-circulation test operation end time t endpoor.
Read operation handling capacity, interpolation file handling capacity, spanned file handling capacity and removing file handling capacity when the handling capacity of intersecting comprises design operation crossing operation, wherein read operation handling capacity refers to
(m) initial testing parameter is selected;
Comprise emulation thread type, emulation thread ratio and the performed action type of different emulation threads formulated in simulation test scene; According to spectre post-simulation load properties, formulate a kind of post-simulation thread type, simulate the daily real running environment of EDA design platform by the spectre post-simulation thread of multiple terminal concurrences;
(n) initial testing load is selected;
According to the load properties of circuit diagram spectre post-simulation application, acquiescence test load that can definition circuit figure spectre post-simulation is: terminal initial quantity is eight, concurrent number of threads is two, the contained components and parts door of circuit diagram is counted 10,000 of average out to, and single appends 1,000 of the data volume mean sizes of circuit diagram content;
(o) operation testing process, monitoring real-time testing process, multithreading synchro control also records the information of test operation;
Operation testing process enters shown in Fig. 2-3, specifically comprises:
(I) operation main thread test, and according to the averaging circuit quantity under initial circuit map file quantity, the single project folder of specifying and averaging circuit size allocation for test original document collection;
(II) operation test monitoring, opens multiple test emulation threads according to initial concurrent number of threads of specifying, and imitates multiple terminals EDA design platform server is carried out to the situation of Concurrency Access and circuit simulation simultaneously;
(III) operation of setting in the concurrent execution simulation flow of multiple circuit simulation threads figure, is respectively and removes historical simulation waveform file, operation post-simulation process, generates simulation waveform file, reads post-simulation wave file, adds later stage emulation content, carries out continuously the post-simulation operation of set point number to simulation document;
(IV) when (III) step is carried out, main thread is monitored all circuit simulation threads, until all emulation thread end of runs.
(V) according to the operation information statistics file operation of real time record in the test process total amount (Generating Data File completing of handling up, remove, the merging number of times that reads and write, obtain divided by test run T.T. by calculating file operation total degree in test operating procedure), test macro total bandwidth (file data transmission total amount, obtain T.T. divided by test by calculating data transmission total amount in test operating procedure) and processor or the overall rate of load condensate of cluster (Single document operates shared processor or cluster time, obtain divided by number of operations by the processor or the overall holding time of cluster that calculate test run process).
Below be only concrete exemplary applications of the present invention, protection scope of the present invention is not constituted any limitation.All employing equivalents or equivalence are replaced and the technical scheme of formation, within all dropping on rights protection scope of the present invention.

Claims (7)

1. the EDA of an enterprise design platform running environment basic property method of testing, is characterized in that, it comprises the steps:
1) the basic read operation of platform running environment and write operation two are to bandwidth test, and the virtual scene operating by multiple data-interfaces that may occur in board design process is tested;
2) design operation testing throughput, tests the data file operation handling capacity of EDA design platform running environment by cross-circulation mode of operation;
3) integrated circuit (IC) design typical case application simulation test, tests effective application performance of this platform running environment under enterprise practical integrated circuit (IC) design working condition by building the extendible load module of multithreading.
2. the EDA of enterprise design platform running environment basic property method of testing according to claim 1, is characterized in that described step 1) in comprise successively:
(a) choose test reference point, the generation rule that the real-time data-interface of statistical basis environment operates, the IO operation model of structure test reference point;
(b) configuration testing data file, with file size size (F n), data block size (B n) be foundation, apportion Various types of data file, and make the maximum value (B of data block size max) be less than or equal to the minimal value (F of file size size min);
(c) initialization data, differentiation and the generation of the generation of test file content, the selection of reference mode and generation and data to be written;
(d) move and add up one and take turns testing process, start/stop test monitoring, file size and the data block size of taking turns test according to each are carried out corresponding test operation, the then amount of reading and writing data, corresponding document size and the data block size in record statistical unit time;
(e) the autonomous flow process of going forward one by one that doubles, differentiation and the generation of the generation of test file content, the selection of reference mode and generation and data to be written.
3. the EDA of enterprise design platform running environment basic property method of testing according to claim 1, is characterized in that described step 2) in comprise successively:
(f) configuration testing parameter;
(g) service data files in batch generating run, starts test, record test start time (T start), and according to concurrent quantity of documents and the file mean size parameter of configuration, order creates file in batches, records random cross-circulation test operation start time (t start);
(h) move random cross-circulation test operation, taking all types of design operation proportions that configure as foundation, the random different design operation of crossing operation;
(i) clear operation of operation batch documents, records random cross-circulation test operation end time (t end), then remove in batches all residue test data files record test end time (T end);
(j) add up every testing throughput index.
4. according to the EDA of the enterprise design platform running environment basic property method of testing described in claim 1 or 3, it is characterized in that, described handling capacity comprises the total amount of handling up, in batches handling capacity and the handling capacity of intersecting.
5. the EDA of enterprise design platform running environment basic property method of testing according to claim 3, is characterized in that, in described step (h), moves random cross-circulation test operation and comprises:
1. judge whether to need operation to read/add operation, if without operation, turn to step 2., if need operation, generate certain random value according to read/write operation ratio, then judge with this random value this time whether circulation needs to move read operation, if, carry out a read operation, otherwise, carry out and once add operation;
2. judge whether to move generation/clear operation, if without operation, turn to step 3., if need operation, generate certain random value according to generation/clear operation ratio, then judge with this random value this time whether circulation needs to move generating run, if, carry out generating run one time, otherwise, a clear operation carried out;
3. the number of run of design operation is accumulated once, judge whether design operation number of run reaches initial set value, if so, the random cross-circulation operational phase of design finishes, and starts the batch delete step of test data file; Otherwise turn to step 1..
6. the EDA of enterprise design platform running environment basic property method of testing according to claim 1, is characterized in that described step 3) in comprise successively:
(k) the load properties analysis of integrated circuit (IC) design typical case application;
(I) initial simulation flow figure formulates;
(m) initial testing parameter is selected;
(n) initial testing load is selected;
(o) operation testing process, monitoring real-time testing process, multithreading synchro control also records the information of test operation.
7. the EDA of enterprise design platform running environment basic property method of testing according to claim 6, is characterized in that, in step (o), operation testing process comprises:
(I) operation main thread test, and according to the averaging circuit quantity under initial circuit map file quantity, the single project folder of specifying and averaging circuit size allocation for test original document collection;
(II) operation test monitoring, opens multiple test emulation threads according to initial concurrent number of threads of specifying, and imitates multiple terminals EDA design platform server is carried out to the situation of Concurrency Access and circuit simulation simultaneously;
(III) operation of setting in the concurrent execution simulation flow of multiple circuit simulation threads figure, is respectively and removes historical simulation waveform file, operation post-simulation process, generates simulation waveform file, reads post-simulation wave file, adds later stage emulation content, carries out continuously the post-simulation operation of set point number to simulation document;
(IV) when (III) step is carried out, main thread is monitored all circuit simulation threads, until all emulation thread end of runs.
CN201410124575.4A 2014-03-31 2014-03-31 A kind of enterprise EDA design platform running environment basic property method of testing Active CN103902421B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410124575.4A CN103902421B (en) 2014-03-31 2014-03-31 A kind of enterprise EDA design platform running environment basic property method of testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410124575.4A CN103902421B (en) 2014-03-31 2014-03-31 A kind of enterprise EDA design platform running environment basic property method of testing

Publications (2)

Publication Number Publication Date
CN103902421A true CN103902421A (en) 2014-07-02
CN103902421B CN103902421B (en) 2016-08-31

Family

ID=50993757

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410124575.4A Active CN103902421B (en) 2014-03-31 2014-03-31 A kind of enterprise EDA design platform running environment basic property method of testing

Country Status (1)

Country Link
CN (1) CN103902421B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105912639A (en) * 2016-04-08 2016-08-31 浪潮(北京)电子信息产业有限公司 Automatic test method and apparatus for data write-in file system
CN111737109A (en) * 2020-05-20 2020-10-02 山东鲸鲨信息技术有限公司 Cluster file system testing method and device
CN112349340A (en) * 2020-11-08 2021-02-09 北京工业大学 Waste equipment overwriting scheme library building method based on cycle test

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1506823A (en) * 2002-12-13 2004-06-23 英业达股份有限公司 Test method of overall server performance
CN102567158A (en) * 2011-12-31 2012-07-11 曙光信息产业股份有限公司 Testing method and testing device for memory bandwidth
US20130226535A1 (en) * 2012-02-24 2013-08-29 Jeh-Fu Tuan Concurrent simulation system using graphic processing units (gpu) and method thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1506823A (en) * 2002-12-13 2004-06-23 英业达股份有限公司 Test method of overall server performance
CN102567158A (en) * 2011-12-31 2012-07-11 曙光信息产业股份有限公司 Testing method and testing device for memory bandwidth
US20130226535A1 (en) * 2012-02-24 2013-08-29 Jeh-Fu Tuan Concurrent simulation system using graphic processing units (gpu) and method thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105912639A (en) * 2016-04-08 2016-08-31 浪潮(北京)电子信息产业有限公司 Automatic test method and apparatus for data write-in file system
CN105912639B (en) * 2016-04-08 2020-05-29 浪潮(北京)电子信息产业有限公司 Automatic test method and device for data write-in file system
CN111737109A (en) * 2020-05-20 2020-10-02 山东鲸鲨信息技术有限公司 Cluster file system testing method and device
CN112349340A (en) * 2020-11-08 2021-02-09 北京工业大学 Waste equipment overwriting scheme library building method based on cycle test
CN112349340B (en) * 2020-11-08 2023-10-10 北京工业大学 Method for constructing waste equipment overwriting scheme library based on cyclic test

Also Published As

Publication number Publication date
CN103902421B (en) 2016-08-31

Similar Documents

Publication Publication Date Title
CN102750221B (en) Performance test method for Linux file system
Woodring et al. In‐situ Sampling of a Large‐Scale Particle Simulation for Interactive Visualization and Analysis
Zhu et al. TBBT: Scalable and accurate trace replay for file server evaluation
He et al. Reducing file system tail latencies with chopper
CN104850480B (en) The method and device of high density storage server hard disk performance test
CN108388509B (en) Software testing method, computer readable storage medium and terminal equipment
CN105893230A (en) Method and device for detecting IOPS performance of hard disks
Dayan et al. EagleTree: Exploring the design space of SSD-based algorithms
CN103902421A (en) Basic performance test method for EDA (electronic design automation) design platform of enterprise
CN113868987A (en) System-level chip verification platform and verification method thereof
CN114518981A (en) eMMC test method, device, readable storage medium and electronic equipment
US20130013283A1 (en) Distributed multi-pass microarchitecture simulation
CN103198001A (en) Storage system capable of self-testing peripheral component interface express (PCIE) interface and test method
CN115171771A (en) Solid state disk testing method, device, equipment and storage medium
CN108628734A (en) A kind of function program adjustment method and terminal
US20200074040A1 (en) Hierarchical expression coverage clustering for design verification
CN115794570A (en) Pressure testing method, device, equipment and computer readable storage medium
US20130318499A1 (en) Test script generation
CN116028327B (en) File system read-write performance test method and device, readable storage medium and equipment
CN117331846A (en) Internet-based software development, operation, test and management system
CN111679600B (en) Comparison method of control system, control terminal and computer readable storage medium
CN108334521B (en) Database capacity prediction method and device
CN108255477A (en) A kind of method and system by SQL compiler simulative optimization database performances
Tarnawski et al. Real-time simulation in non real-time environment
CN106610873A (en) Method for predicting application energy consumption on Android equipment

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant